CN108458658A - A kind of micropore apparatus for measuring three-dimensional profile and method based on illumination reflection model - Google Patents

A kind of micropore apparatus for measuring three-dimensional profile and method based on illumination reflection model Download PDF

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Publication number
CN108458658A
CN108458658A CN201810361225.8A CN201810361225A CN108458658A CN 108458658 A CN108458658 A CN 108458658A CN 201810361225 A CN201810361225 A CN 201810361225A CN 108458658 A CN108458658 A CN 108458658A
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micropore
hole
light source
internal surface
illumination
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Chinese (zh)
Inventor
叶明�
应徐超
孙世凡
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Wuxi Research Institute Of Nanjing University Of Aeronautics & Astronautics
Nanjing University of Aeronautics and Astronautics
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Wuxi Research Institute Of Nanjing University Of Aeronautics & Astronautics
Nanjing University of Aeronautics and Astronautics
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Priority to CN201810361225.8A priority Critical patent/CN108458658A/en
Publication of CN108458658A publication Critical patent/CN108458658A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608—Height gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention discloses a kind of micropore apparatus for measuring three-dimensional profile and method based on illumination reflection model, is related to technical field of object three-dimensional measurement.It includes movement traction module and measurement sensor module, and operation traction module realizes that the acquisition of the internal surface of hole defect image under different illumination modes is completed in movement and positioning of the measurement sensor module in micropore, measurement sensor module.Pass through the measurement sensor module designed and developed out, internal surface of hole illumination reflection model is obtained based on reflection model construction method, utilize the sequence image under the particular light pattern of imaging system acquisition, complete the reconstruct of internal surface of hole defect three-dimension curved surface, realize the micropore defect in inner surface geometric sense based on illumination reflection model, the especially measurement of flaw height or depth dimensions.The present invention solves the active demand that the industrial circles such as aerospace, automobile, chemical industry measure defect three-dimensional information in micropore inner surface, is promoted for above-mentioned field product quality, safe handling provides key technology and supports.

Description

A kind of micropore apparatus for measuring three-dimensional profile and method based on illumination reflection model
Technical field
The present invention relates to technical field of object three-dimensional measurement, especially a kind of micropore based on illumination reflection model is three-dimensional Topography measurement device and method.
Background technology
With development in science and technology, the design of part in industrial circle is increasingly complicated, and microtubule or small size features endoporus exist Using more and more extensive in the important component of the fields such as aerospace, automobile, chemical industry, such as the aerospace craft in aerospace field Chemistry in the cylinder head of automobile engine and cylinder block and chemical field in all kinds of oil pipes, automotive field in heat-dissipating pipe, aircraft All there are many various sizes of fine pores in the heat-exchange tube and condenser of reaction unit.
In the process of above-mentioned apertures part, microcapillary internal surface of hole easy tos produce all kinds of defects, such as cut, sand Eye, loose, stomata, fleshiness and surface hair check etc.；Even if there is no a defect in part processing, but still can be due to being used for a long time The defects of inner surface of this some holes cracks, cut, hole, especially these severe markings, crackle or abrasion may produce Raw stress changes, cause the leakage of transmission gas or liquid, or even lead to serious accident.Therefore, it realizes in fine pore The measurement of the defects detection geometric sense on surface has very the safety guarantee for promoting industrial processes manufacture level and related field Important meaning.
Over the past decade, microtubule detection technique oneself become domestic and international detection field research hot and difficult issue.Due to In manufacture view particular/special requirement, the detection of micropore defect in inner surface is even more for small space limitation and micro mechanism inside micropore One of very difficult research topic in the class detection of hole.
General measure be micropore is detected after detection sensor micromation, such as using miniature endoscope or CCD camera, which enters, acquires inner surface image in micropore, defect, but these methods are being identified by artificial or image processing algorithm It can only judge that whether there is or not can not obtain its three-dimensional information to defect.Pore internal flaw information can only be qualitatively judged, it can not be in pore Wall defect realizes quantitative detection.However, many engineer application occasions are highly desirable to the depth of defect information for obtaining hole surface, example again If, if scratch depth value reaches a certain level, must just replaced and scrap in aviation oil pipe, the safety of leakage otherwise may be caused Accident；The information such as cut or loose depth, the fleshy height of casting in vehicle turbine shell runner hole are required to carry out Quantitative measurment detects.
Therefore, there is an urgent need to a kind of new theories and Xin Fang that can measure micropore defect in inner surface three dimension scale information Method, for this method to the quality-improving of Related product in many industrial circles such as aerospace, automobile, chemical industry, safety guarantee has weight Want meaning.
Invention content
Endoscopic imaging system to solve to apply in current industrial circle is difficult to accurately measure the defect ruler of internal surface of hole The problems such as very little and location information, the present invention provide a kind of micropore apparatus for measuring three-dimensional profile based on illumination reflection model, and Corresponding method is devised, can be by a kind of special light channel structure, measured surface builds different illumination modes in hole, so The image under different illumination modes, then the inverse process based on imaging process are acquired using endoscopic imaging system afterwards, using being adopted The two dimensional image of collection realizes the accurate extraction of micropore defect in inner surface three-dimensional information.
To achieve the above object, the present invention uses following technical proposals：
A kind of micropore apparatus for measuring three-dimensional profile based on illumination reflection model, it includes movement traction module and measurement Sensor assembly, operation traction module realize movement and positioning of the measurement sensor module in micropore, measurement sensor mould Block completes the acquisition of the internal surface of hole defect image under different illumination modes；
Movement traction module is connected with power sources such as motors；The LED array light source of measurement sensor module and light source control Molding block is connected；The CCD camera of measurement sensor module passes through line transmission data to host computer；The image procossing of host computer Module is under the premise of inner surface illumination reflection model determines, according to same internal surface of hole position n (n>3) secondary different illumination modes Under image reconstruction internal surface of hole three-dimensional appearance.
A kind of micropore 3 D measuring method based on illumination reflection model, it includes the following steps：
Step 1, is positioned by manual identified and the automatic positioning two ways based on machine vision completes measurement sensor Positioning of the module to defect area：
Under manual identified station-keeping mode, survey crew opens LED illumination light source, judges defect by artificial observation mode Position, and measurement sensor module is fixed on and needs the defect area that measures；In the automatic positioning die based on machine vision Under formula, measurement sensor module is driven to be moved in micropore by moving traction module, while passing through image processing algorithm, profit Feature with fine internal surface of hole image includes texture, gray difference and shape, judges defective locations and guiding measuring sensing Device module realizes positioning；
Step 2 proceeds by the measurement of defect geometry amount after completing positioning：
By the light source control module of measurement sensor module, n (n are opened successively>3) a LED array light source, by special The light channel structure of design obtains the image under the secondary different illumination modes of same internal surface of hole position n and is transmitted to image procossing mould Block carries out three-dimensional reconstruction.
Further, the light channel structure of special designing includes imaging system in step 2, if being equipped with around imaging system The LED light source and laser light source of dry circumference equal dividing cloth；The optical axis front end of imaging system is equipped with multi-angle light source reflector and CCD Speculum；Multi-angle light source reflector is used to change light source route in small space, it is made to be irradiated to hole wall by different angle Surface；The image that CCD speculums are used to internal surface of hole being observed region reflexes to imaging system.
Further, the key of the measuring technique of defect geometry amount is to obtain accurately fine internal surface of hole in step 2 Illumination reflection model：
It is theoretical based on photometric stereo three-dimensionalreconstruction, using multi-angle light source reflector and CCD speculums, pass through light source control The multi-angle illumination scene of the fine internal surface of hole regional area of module construction, and obtain table in the micropore under different illumination modes Face local area image, the fine internal surface of hole illumination obtained in conjunction with fine internal surface of hole illumination reflection model scaling method are anti- Model is penetrated, finally realizes the reconstruction of fine internal surface of hole three-dimensional appearance.
Further, in step 2 when the measurement of defect geometry amount, by two kinds of approach come realize inner surface bloom, repeatedly The elimination of the disturbing factors such as reflection：
(1) the high light and shade of fine internal surface of hole image is removed based on image processing algorithm；
(2) optimize light channel structure, increase a kind of photomask structure using linear diffuser plate, which, which is located at, is observed The normal orientation in region and in the top of light source emitting light path；The exhausted big portion in multiple reflections component is eliminated using the photomask structure It is divided into point, that is, comes from the secondary reflection component caused by the mirror-reflection of observation area normal orientation, it is real on light channel structure The elimination of existing secondary reflection component.
Advantageous effect：
1. the present invention is by the light channel structure of special designing, in conjunction with the fine internal surface of hole image under different illumination modes, Internal surface of hole three-dimensional information is obtained using photometric stereo three-dimensional reconstruction method, that is, is based on illumination reflection model, it is proposed that Yi Zhongneng The new theory and new method for enough measuring micropore defect in inner surface three dimension scale information realize the detection of micropore defect in inner surface Under the breakthrough of conventional thought, the wherein structure of multi-angle illumination system, near point light field illumination reflection model structure, hole surface this The photoemission model construction of kind of Fei Langbo body surfaces be all and other traditional photometric stereo methods in different from.
2. the present invention is by the measurement sensor module designed and developed out, in the hole obtained based on reflection model construction method Illumination reflection model in surface completes internal surface of hole using the sequence image under the particular light pattern of monocular imaging system acquisition The reconstruct of defect three-dimension curved surface realizes that the micropore defect in inner surface geometric sense based on illumination reflection model, especially defect are high The measurement of degree or depth dimensions.
Description of the drawings
Fig. 1 is the measuring device functional block diagram of the present invention；
Fig. 2 is the movement traction module structure diagram of the present invention；
Fig. 3 is the light channel structure schematic diagram of the present invention；
In figure：1- move traction module, 2- measurement sensors module, 3- imaging systems, 4-LED light sources, 5- laser light sources, 6- multi-angles light source reflector, 7-CCD speculums, 8- nylon wheels, 9- connecting rods, 10- conical blocks, 11- positioning mandrils.
Specific implementation mode
Present invention will be further explained below with reference to the attached drawings and examples.
The present invention provides a kind of micropore apparatus for measuring three-dimensional profile based on illumination reflection model, as shown in Figure 1, packet Include the measurement sensor module 2 (Fig. 3) of front end and the movement traction module 1 (Fig. 2) of rear end.
As shown in Fig. 2, the movement and locating scheme that movement traction module 1 uses are as follows：
First in each one mobile nylon wheel 8 of installation of cylinder movement traction module 1 exterior circumference trisection posistion, totally three It is a.In moving process, connecting rod 9 is under the spring-force driven dual of lower end so that nylon wheel 8 is close to hole inner wall, rubs to play reduction Wiping and Self-centering Action；When being moved to the position for needing to measure, conical blocks 10 are driven to move traction along cylinder by motor The axial movement of module 1 pushes 11 radially movable compression nylon wheel 8 of positioning mandril by conical blocks 10, is measured to realize Positioning of the sensor assembly 2 inside micropore.
Measurement sensor module 2 completes internal surface of hole three-dimensionalreconstruction by imaging as shown in Figure 3 and light channel structure model The acquisition of required more illumination mode lower inner surface illumination reflected intensity distributed intelligences.The light channel structure of special designing is as follows：At LED light source 4 and laser light source 5 as being equipped with several circumference equal dividing cloth around system 3, the optical axis front end installation of imaging system 3 Two kinds of speculum, one kind are that multi-angle light source reflector 6 can for changing light source route in small space It is enough to be irradiated to hole wall surface by different angle；Another kind is CCD speculums 7, the image for internal surface of hole to be observed to region Reflex to imaging system 3.Before measurement, first with ripe CCD scaling methods, formed in hole surface using laser light source 5 Laser dot-matrix image completes CCD parameter calibrations.
When practical measurement, it can be positioned by manual identified and the automatic positioning two ways based on machine vision is completed to survey Positioning of the quantity sensor module 2 to defect area.Under the pattern that is positioned manually, survey crew opens LED illumination light source, passes through people Work observed pattern judges the position of defect, and measurement sensor module 2 is fixed on to the defect area for needing to measure；Automatically fixed Under bit pattern, measurement sensor module 2 is driven to be moved in hole by moving traction module 1, while by image processing algorithm, The features such as texture, gray difference and shape using hole surface image judge defective locations and guiding measuring sensor assembly 2 Realize positioning.
After completing positioning, the measurement of defect geometry amount is proceeded by.Pass through the light source control mould of measurement sensor module 2 Block, first triggering open the first LED light source 4, and the light of the first LED light source 4 is irradiated to the multi-angle light source reflection specially designed On mirror 6, expose to after reflection on the defect area of internal surface of hole, meanwhile, the illumination reflected intensity point under current light pattern Cloth can be sent to imaging system 3 by CCD speculums 7, obtain the hole surface image under the illumination mode；Then, first is closed LED light source 4 opens the second LED light source 4, and imaging system 3 can obtain same hole surface position, and the second LED light source 4 is in illumination Hole surface image under pattern；It recycles successively, obtains same hole surface position n (n>3) image under secondary different illumination modes, according to According to video camera imaging luminosity principle, under the premise of hole surface illumination reflection model determines, so that it may to be calculated by this n sub-picture Go out the vectorial field data of measured surface, the direct correspondence between method of reutilization vector and gradient utilizes gradient fields to height The reconstruction technique of field is completed, and the calculating of tested region three-dimensional height field information is completed；Finally, in conjunction with CCD calibrating parameters, hole is obtained The three-dimensional appearance geometric sense information on surface.
The present invention realizes the elimination of the disturbing factors such as surface bloom, multiple reflections by two kinds of approach：(1) it is based on image Processing Algorithm removes the high light and shade of fine internal surface of hole image；(2) optimize light channel structure, by a kind of using linear diffusion The photomask structure of plate, which, which is located at, is observed the normal orientation in region and in the top of light source emitting light path, utilizes this Photomask structure eliminates most ingredients in multiple reflections component, that is, comes from the mirror-reflection institute of observation area normal orientation Caused by secondary reflection.
Since the basic thought of the present invention is to reflect distribution by the internal surface of hole illumination under several multi-angle illumination modes State, i.e. two dimensional image under several internal surface of hole difference illumination modes, obtain the three-dimensional appearance parameter of hole surface.Detailed analysis It is as follows：
Assuming that testee surface itself does not shine, then object is because it can be by vision by light irradiation generation reflection Systematic observation is arrived.The global coordinate system centered on imaging system 3 is selected, the optical axis of wherein 1 reference axis and imaging system 3 is made Alignment, then object surface shape parameter available functions Z=F (x, y) descriptions indicate that certain puts vertical range (the Z seats from lens plane Mark) with the situation of point coordinates variation, therefore its surface normal can be expressed as N=(p, q, -1), whereinWith fixed vector come the direction (p of regulation light sources,qs), if the surface reflectance properties and light of given object According to condition, then the relational expression that can be established between surface reflection light distribution and surface normal, light source incidence direction is R= G(p,q,ps,qs, c), wherein R is surface reflection light distribution, and c is light irradiation degree constant.According to two-dimensional imaging principle, if light Source direction and light irradiation degree are fixed, then the illumination reflection distribution of body surface point is represented by R (p, q), but due to I (x, Y) ∝ R (p, q), I (x, y) are the gray value of images of body surface, so as to establish object surface shape parameter (surface normal Amount) relationship between two dimensional image half-tone information.That is, the inverse process realization using imaging process restores object from two dimensional image The shape information on surface.
Such as：In the parallel illumination mode in infinity and ignore the mutual reflection between object, is reflected for meeting bright glass The body surface of characteristic, surface reflection distribution can be indicated by surface normal and the angle of light source direction, just traded In the case of shadow, the illumination reflection model of body surface can be expressed as：
Wherein ρ is the reflectance factor of body surface, related with object materials and rough surface state.It can be seen that using single It is a underconstrained problem that width image, which solves surface normal p (x, y) and q (x, y), because only there are one half-tone information R for equation (p, q) is known quantity, and it needs to be determined that 3 parameter ρ (x, y), p (x, y) and q (x, y).If body surface reflectance factor ρ (x, Y) it is known that constraints can then be added to solve other 2 parameters, therefore theoretically it can restore tested by single image The normal vector of body surface, but some constraintss that need to rely on solve equation, but theoretically it is difficult to ensure that the solution is deposited In property and uniqueness.
Therefore, it is necessary to the three-dimensional information of body surface is extracted using several gray level image informations.Specific practice is：For Same body surface, under conditions of relative position remains unchanged between camera and object, with n (n>3) a light source is distinguished never Body surface is irradiated in 3 coplanar directions, obtains n width image under different direction of illuminations, can be by this n based on above-mentioned (1) formula Width image obtains the normal vector on surface.The assumed condition of this three-dimensional rebuilding method is：Light source is to have identical radiation in all directions The radiation source of degree, body surface scatter light to all directions homogeneous radiation, known to all light source directions.
Calculating process is as follows by taking 3 sub-pictures as an example：
If the light source direction of 3 width images is respectively ni=[ni1,ni2,ni3], wherein nij, i, j=1,2,3 are light source and seat Parameter angle parameter, then N=[n1,n2,n3] constitute 1 third-order plant.
Enable I=[Ι1,I2,I3] indicate the vector that the gray scale of same point in 3 width images forms, the surface normal scale of the point It is shown as M=[m1,m2,m3].If the reflectance factor of the point is a, then I=aNM.In N-1Under the conditions of existing, M is normalized vector, There is a=| N-1I|；Then M=N-1I/|N-1I|.Wherein | g | modulo operation is indicated, it is possible thereby to obtain the surface normal of testee Amount.
It is unrelated with path according to Green's theorem integral if body surface integrability condition meets, arbitrary 2 point height can be acquired DifferenceWherein L is the free routing between 2 points, to realize object surface three-dimensional morphology Acquisition.That is, using surface normal field data, normal direction field is completed to gradient fields, then arrive the reconstruction of height field.
Limiting the scope of the invention, those skilled in the art should understand that, in technical scheme of the present invention On the basis of, the various modifications or variations that can be made by those skilled in the art with little creative work still the present invention's Within protection domain.

Claims (6)

1. a kind of micropore apparatus for measuring three-dimensional profile based on illumination reflection model, which is characterized in that it includes that movement is drawn Module (1) and measurement sensor module (2), the operation traction module (1) realize measurement sensor module (2) in micropore Movement and positioning, the measurement sensor module (2) completes the acquisition of the internal surface of hole defect image under different illumination modes；
The movement traction module (1) is connected with power source；The LED array light source and light of the measurement sensor module (1) Source control module is connected；The CCD camera of the measurement sensor module (1) passes through line transmission data to host computer；It is described The image processing module of host computer is under the premise of inner surface illumination reflection model determines, according to same internal surface of hole position n (n> 3) three-dimensional appearance of the image reconstruction internal surface of hole under secondary different illumination modes.
2. a kind of micropore 3 D measuring method based on illumination reflection model, which is characterized in that it includes the following steps：
Step 1, under manual identified station-keeping mode, survey crew opens LED illumination light source, is judged by artificial observation mode The position of defect, and the measurement sensor module (2) is fixed on to the defect area for needing to measure；Based on machine vision Under automatic positioning pattern, the measurement sensor module (2) is driven to be moved in micropore by the movement traction module (1) Dynamic, while by image processing algorithm, the feature using fine internal surface of hole image includes texture, gray difference and shape, Judge defective locations and the measurement sensor module (2) is guided to realize positioning；
Step 2 after completing positioning, by the light source control module of the measurement sensor module (1), opens n (n successively>3) A LED array light source is obtained by the light channel structure of special designing under the secondary different illumination modes of same internal surface of hole position n Image is simultaneously transmitted to image processing module progress three-dimensional reconstruction.
3. the micropore 3 D measuring method according to claim 2 based on illumination reflection model, which is characterized in that The light channel structure of special designing includes imaging system (3) in the step 2, and several circles are equipped with around the imaging system (3) The LED light source (4) and laser light source (5) of all equal distributions；It is anti-that the optical axis front end of the imaging system (3) is equipped with multi-angle light source Penetrate mirror (6) and CCD speculums (7)；The multi-angle light source reflector (6) is used to change light source route in small space, makes It is irradiated to hole wall surface by different angle；The image that the CCD speculums (7) are used to internal surface of hole being observed region reflects To the imaging system (3).
4. the micropore 3 D measuring method according to claim 2 based on illumination reflection model, which is characterized in that The multi-angle light source reflector (6) and the CCD speculums (7) in the light channel structure of special designing are utilized in the step 2, The multi-angle illumination scene of fine internal surface of hole regional area is built by light source control module, and is obtained under different illumination modes Fine internal surface of hole local area image, in conjunction with fine internal surface of hole illumination reflection model scaling method obtain micropore Inner surface illumination reflection model finally realizes the reconstruction of fine internal surface of hole three-dimensional appearance.
5. the micropore 3 D measuring method according to claim 2 based on illumination reflection model, which is characterized in that The high light and shade of fine internal surface of hole image is removed in the step 2 based on image processing algorithm.
6. the micropore 3 D measuring method according to claim 3 based on illumination reflection model, which is characterized in that The light channel structure of special designing further includes the photomask structure using linear diffuser plate in the step 2, and the photomask structure is located at It is observed the normal orientation in region and in the top of light source emitting light path；The photomask structure is eliminated from the method for being observed region Secondary reflection component caused by mirror-reflection to direction.
CN201810361225.8A 2018-04-20 2018-04-20 A kind of micropore apparatus for measuring three-dimensional profile and method based on illumination reflection model Pending CN108458658A (en)

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Application publication date: 20180828