CN108362668A - A kind of surface plasma resonance sensing system - Google Patents
A kind of surface plasma resonance sensing system Download PDFInfo
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- CN108362668A CN108362668A CN201810060764.8A CN201810060764A CN108362668A CN 108362668 A CN108362668 A CN 108362668A CN 201810060764 A CN201810060764 A CN 201810060764A CN 108362668 A CN108362668 A CN 108362668A
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- refractive index
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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Abstract
The invention discloses a kind of surface plasma resonance sensing system, which includes：Dielectric layer container, the medium of varying refractive index, plasmasphere, testing liquid, light source and reflection light-receiving and processor, there are three layers of dielectric structure in dielectric layer container, the bottom of the dielectric layer container is the medium of varying refractive index, and middle level is plasmasphere, and upper layer is testing liquid.The light that light source is sent out is incident in testing liquid, is totally reflected on the interface of testing liquid and the medium of varying refractive index, and the reflected light back of the total reflection is received to reflected light in processor, and reflected light receives processor and receives and processes reflected light.Testing liquid is optical waveguide medium, when the refractive index for changing optical waveguide medium makes it be unsatisfactory for the operating condition of the system, correspondingly change the refractive index of the medium of varying refractive index again, it is set to meet the operating condition of the system again, the system can detect a new refractive index detection interval, to make the system external world refractive index detection interval variation.
Description
Technical field
The present invention relates to test equipment technology more particularly to a kind of surface plasma resonance sensing systems.
Background technology
Existing surface plasma resonance sensor is by depositing nano level gold on the surface of optical waveguide medium
Belong to sensing layer and it is manufactured.The light conducted in optical waveguide medium meets when reaching the interface of medium and metal in metal layer
The part light of plasma resonance condition can be absorbed by metal layer, and be converted to the oscillation energy of metal layer plasma,
Light will appear the missing of the part light by the spectrum after sensor, as shown in Figure 1, spectrum will appear the form of formant,
And the position of the formant can be moved with extraneous variations in refractive index, sensor can be according to resonant positions and extraneous refractive index
One-to-one relationship extraneous refractive index detected.
Existing surface plasma resonance sensor conducts light due to the use of fixed optical waveguide medium, reflects
Rate is fixed so that the extraneous refractive index detection interval of the sensor is also fixed, and in fact many refractive index detections are answered
Can be more than the detection interval with range.In industrial production, the concentration for detecting chemical solution is needed, it can be first to the concentration of chemical solution
It is then converted into solution concentration with sensor measurement refractive index, but some solution refractive index are higher, is more than existing surface plasma
The refractive index detection range of resonance body sensor, the solution of high refractive index cannot be detected using the sensor.Existing surface etc. from
Daughter resonance sensor can not detect the solution that refractive index is close to and above the optical waveguide medium refraction index of itself, and light works
Window is fixed, and sensitivity is fixed.
Invention content
The main purpose of the present invention is to provide a kind of surface plasma resonance sensing systems, for solving existing surface
The extraneous refractive index detection interval of plasma resonance sensor is fixed, and extraneous refractive index is more than that detection interval is then undetectable
Technical problem.
To achieve the above object, the present invention provides a kind of surface plasma resonance sensing system, the system comprises：It is situated between
Matter layer container, testing liquid, plasmasphere, the medium of varying refractive index, light source and reflection light-receiving and processor；
There are three layers of dielectric structure in the dielectric layer container, the bottom of the dielectric structure is the medium of varying refractive index,
The middle level of the dielectric structure is plasmasphere, and the upper layer of the dielectric structure is testing liquid；
The light that the light source is sent out is incident in the testing liquid, is situated between in the testing liquid and the changeable refractive index
It is totally reflected on the interface of matter, it is described anti-in the reflected light back to the reflection light-receiving and processor of the total reflection
It penetrates light-receiving and processor receives and processes the reflected light.
From the surface plasma resonance sensing system of above-mentioned offer it is found that in a first aspect, the system, which uses, has three layers
Testing liquid, is positioned over the upper layer of dielectric layer container by the dielectric layer container of dielectric structure, and the light of light source is incident on testing liquid
In, the testing liquid in the system is as optical waveguide medium, due to changing the refraction that testing liquid is changeable optical waveguide medium
Rate, when the refractive index for changing optical waveguide medium makes it be unsatisfactory for the operating condition of the surface plasma resonance sensing system,
The refractive index that the medium of varying refractive index can correspondingly be changed according to the refractive index of the optical waveguide medium, makes it meet surface again
The operating condition of plasma resonance sensing system, which will can detect a new refractive index detection interval, to make
The system external world refractive index detection interval variation；Second aspect, incident light is at the interface of testing liquid and the medium of varying refractive index
It is upper to be totally reflected, the refractive index of the medium of varying refractive index is finely tuned, incident light activated plasma resonance optical wavelength will change,
Light operation wavelength changes, that is, the light operation window of surface plasma resonance sensing system is changed, simultaneously as system is not
The sensitivity for operating wave strong point of sharing the same light is different, therefore also changes the sensitivity of the system.
Description of the drawings
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those skilled in the art without creative efforts, can also basis
These attached drawings obtain other attached drawings.
Fig. 1 is the normalization light spectrogram of surface plasma resonance sensor；
Fig. 2 is a kind of surface plasma resonance sensing system provided in an embodiment of the present invention.
Specific implementation mode
In order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below in conjunction with the present invention
Attached drawing in embodiment, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described reality
It is only a part of the embodiment of the present invention to apply example, and not all embodiments.Based on the embodiments of the present invention, people in the art
The every other embodiment that member is obtained without making creative work, shall fall within the protection scope of the present invention.
In the prior art since the extraneous refractive index detection interval of surface plasma resonance sensor is fixed, external world's refraction
Rate, which is more than detection interval, can not then detect.In order to solve the above-mentioned technical problem, the present invention proposes a kind of surface plasma body resonant vibration
Sensor-based system.
Referring to Fig. 2, Fig. 2 is a kind of surface plasma resonance sensing system provided in an embodiment of the present invention, the surface
Plasma resonance sensing system includes：Dielectric layer container 1, testing liquid 2, plasmasphere 3, the medium of varying refractive index 4, light
Source 5 and reflection light-receiving and processor 6, there are in dielectric layer container 1 three layers of dielectric structure, the bottom of three layers of dielectric structure to be
The medium of varying refractive index 4, middle level are plasmasphere 3, and upper layer is testing liquid 2.
Wherein, the medium of varying refractive index 4 that 1 bottom of dielectric layer container is placed is nanoporous dielectric material, Uniform Doped
Other materials changes the material of itself refractive index to change the material of itself refractive index and by applying voltage or changing temperature
Any one of material, the nanoporous dielectric material be known refractive index pure medium material uniformly fill it is of the same size
Air spherical pore is made, and can change the folding of the nanoporous dielectric material by changing size and the density of the air spherical pore
Penetrate rate.
Wherein, a diameter of nanoscale of the air spherical pore, can be with by the size and density that change the air spherical pore
Modulate the effective refractive index of nanoporous dielectric material.
As shown in Fig. 2, the light that light source 5 is sent out is incident in testing liquid 2, in testing liquid 2 and the medium of varying refractive index 4
Interface on be totally reflected, in the reflected light back of the total reflection to reflection light-receiving and processor 6, reflect light-receiving and place
Reason device 6 receives and processes the reflected light, exports the refractive index information of testing liquid 2.
Wherein, 3 thickness of plasmasphere is tens nanometers.Plasmasphere 3 is placed on the middle level of dielectric layer container 1, light
The light that source is sent out is incident in testing liquid 2, when by plasmasphere 3, since the thickness of plasmasphere only has tens to receive
Rice, the influence that plasmasphere 3 is totally reflected incident light on the interface of testing liquid 2 and the medium of varying refractive index 4 can
To ignore.Incident light is in the incident angles more than critical angle to the medium of varying refractive index 4, in testing liquid 2 and to roll over
It penetrates rate and can be changed and be totally reflected on the interface of medium 4, wherein in total reflection process, incident light is being incident on testing liquid 2 and is rolling over
When penetrating rate and can be changed on the interface of medium 4, evanescent waves are will produce.
Further, there are plasma in plasmasphere 3, which is like charges charged particle, when etc.
When gas ions resonate with evanescent waves, plasma wave 7 will be generated, and excitating surface plasma resonance detects signal, it should
Evanescent waves are the light wave that the light that light source is sent out is generated in the total reflection of the interface of testing liquid 2 and the medium of varying refractive index 4.
Wherein, there are plasma, plasma and the evanescent waves phases generated during light total reflection in plasmasphere 3
Chance resonates, and for the portion of energy of incident light by plasma absorption, the part light of absorbed energy is converted to plasma
Oscillation energy, to make the spectrum of reflected light will appear part light missing, as shown in Figure 1, the spectrum of reflected light will produce altogether
Shake peak, wherein the light that the surface plasma body resonant vibration detection signal that resonance generates later is reflected beam portion wavelength occurs
Missing, the i.e. reflected light carry surface plasma body resonant vibration and detect signal.
Further, the refractive index of the medium of varying refractive index 4 is less than the refractive index of testing liquid 2, so that incident optical energy exists
Testing liquid 2 can be totally reflected on the interface of the medium of varying refractive index 4.
Further, plasmasphere 3 is metallic plasma layer or for the semi-conducting material with abundant charged particle.
Metallic plasma layer all has abundant like charges charged particle with the semi-conducting material with abundant charged particle, so that
Under conditions of meeting total reflection in plasmasphere 3 plasma resonance can occur for incident light.
Further, it reflects light-receiving and processor 6 receives the reflection for carrying surface plasma body resonant vibration detection signal
Light, and the reflected light is handled, export 2 refractive index information of testing liquid.
Wherein, it reflects light-receiving and processor 6 receives the reflected light, and handle and obtain spectrogram as shown in Figure 1, from figure
It can be analyzed according to refractive index and the one-to-one relationship of resonant positions in 1, obtain the refractive index of testing liquid 2, output is to be measured
The refractive index information of liquid.
It should be noted that present invention could apply to monitor the production process of the solution of different refractivity range, the table
Surface plasma resonance sensor-based system only need to may make the present invention to be suitable for by the refractive index of the adjusting medium of varying refractive index
The detection of high and low refractive index solution.The present invention can be additionally used in the gasoline for distinguishing different model.
The surface plasma resonance sensing system provided from Fig. 2 is it is found that in a first aspect, the system, which uses, has three layers of Jie
Testing liquid is positioned over the upper layer of dielectric layer container by the dielectric layer container of matter structure, and the light of light source is incident in testing liquid,
Testing liquid in the system is as optical waveguide medium, due to changing the refractive index that testing liquid is changeable optical waveguide medium,
It, can root when the refractive index for changing optical waveguide medium makes it be unsatisfactory for the operating condition of the surface plasma resonance sensing system
The refractive index for correspondingly changing the medium of varying refractive index according to the refractive index of the optical waveguide medium, make its meet again surface etc. from
The operating condition of daughter resonance sensing system, which will can detect a new refractive index detection interval, to make this be
The extraneous refractive index detection interval variation of system；Second aspect, incident light are sent out on the interface of testing liquid and the medium of varying refractive index
The refractive index of the medium of varying refractive index is finely tuned in raw total reflection, and incident light activated plasma resonance optical wavelength will change, light work
Make wavelength change, that is, change the light operation window of surface plasma resonance sensing system, simultaneously as system is not being shared the same light
The sensitivity of operating wave strong point is different, therefore also changes the sensitivity of the system.
It is to a kind of description of surface plasma resonance sensing system provided by the present invention, for this field above
Technical staff, the thought of embodiment according to the present invention, there will be changes in the specific implementation manner and application range, comprehensive
On, the content of the present specification should not be construed as limiting the invention.
Claims (10)
1. a kind of surface plasma resonance sensing system, which is characterized in that the system comprises：Dielectric layer container, prepare liquid
Body, plasmasphere, the medium of varying refractive index, light source and reflection light-receiving and processor；
There are three layers of dielectric structure, the bottom of the dielectric structure is the medium of varying refractive index, described in the dielectric layer container
The middle level of dielectric structure is plasmasphere, and the upper layer of the dielectric structure is testing liquid；
The light that the light source is sent out is incident in the testing liquid, in the testing liquid and the medium of varying refractive index
It is totally reflected on interface, in the reflected light back to the reflection light-receiving and processor of the total reflection, the reflected light
It receives and processor receives and processes the reflected light.
2. system according to claim 1, which is characterized in that the medium of varying refractive index is nanoporous medium material
Material, Uniform Doped other materials change itself folding to change the material of itself refractive index and by applying voltage or changing temperature
Penetrate any one of the material of rate material.
3. system according to claim 2, which is characterized in that the nanoporous dielectric material is the pure of known refractive index
Net dielectric material is uniformly filled air spherical pore of the same size and is made.
4. system according to claim 3, which is characterized in that by changing the sky in the nanoporous dielectric material
The size and density of gas spherical pore change the refractive index of the nanoporous dielectric material.
5. system according to claim 2, which is characterized in that the refractive index of the medium of varying refractive index is waited for less than described
Survey the refractive index of liquid.
6. system according to claim 1, which is characterized in that the plasma layer thickness is tens nanometers.
7. system according to claim 1, which is characterized in that there are plasmas in the plasmasphere, described etc.
Gas ions are like charges charged particle.
8. system according to claim 7, which is characterized in that the plasma in the plasmasphere and disappearance
Wave resonates, and generates plasma wave and excitating surface plasma resonance detects signal, the evanescent waves are the light source
The light wave that the light sent out is generated in the total reflection of the interface of the testing liquid and the medium of varying refractive index.
9. system according to claim 8, which is characterized in that the plasmasphere is metallic plasma layer or has
The semi-conducting material of abundant charged particle.
10. system according to claim 8, which is characterized in that the reflection light-receiving and processor are received and carried
The reflected light of surface plasma body resonant vibration detection signal is stated, and handles the reflected light, exports testing liquid refractive index information.
Priority Applications (1)
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| CN201810060764.8A CN108362668A (en) | 2018-01-22 | 2018-01-22 | A kind of surface plasma resonance sensing system |
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| CN201810060764.8A CN108362668A (en) | 2018-01-22 | 2018-01-22 | A kind of surface plasma resonance sensing system |
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Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792212A (en) * | 2014-02-18 | 2014-05-14 | 深圳大学 | Optical fiber surface plasma resonance sensor, detection system and method |
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- 2018-01-22 CN CN201810060764.8A patent/CN108362668A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792212A (en) * | 2014-02-18 | 2014-05-14 | 深圳大学 | Optical fiber surface plasma resonance sensor, detection system and method |
Non-Patent Citations (2)
| Title |
|---|
| ZHIXIN TAN 等: ""Angular characteristics of a multimode fibre surface plasmon resonance sensor under wavelength interrogation"", 《JOURNAL OF PHYSICS D: APPLIED PHYSICS》 * |
| 陈郁芝: ""新型结构的光纤表面等离子体共振传感器及其生化应用研究"", 《中国博士学位论文全文数据库 信息科技辑》 * |
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