CN108344916B - Thin film capacitor experiment mechanism - Google Patents
Thin film capacitor experiment mechanism Download PDFInfo
- Publication number
- CN108344916B CN108344916B CN201710956795.7A CN201710956795A CN108344916B CN 108344916 B CN108344916 B CN 108344916B CN 201710956795 A CN201710956795 A CN 201710956795A CN 108344916 B CN108344916 B CN 108344916B
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- CN
- China
- Prior art keywords
- movable seat
- detected
- experiment table
- capacitors
- front side
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 37
- 239000010409 thin film Substances 0.000 title claims abstract description 10
- 238000001514 detection method Methods 0.000 claims abstract description 17
- 239000002390 adhesive tape Substances 0.000 claims abstract description 5
- 239000000463 material Substances 0.000 claims description 3
- 230000000694 effects Effects 0.000 abstract description 4
- 239000010408 film Substances 0.000 description 4
- 230000002457 bidirectional effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000010355 oscillation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
- G01R31/016—Testing of capacitors
Abstract
The invention provides a thin film capacitor experiment mechanism, which comprises a rectangular experiment table, wherein a limit guide rail is arranged at the top of the experiment table along the length direction, a movable seat is movably arranged on the limit guide rail, a reciprocating cylinder connected with the movable seat is arranged at one end of the limit guide rail, a detector is arranged at the top of the movable seat, a detection circuit is arranged in the detector, a display screen UP connected with the detection circuit is arranged in the middle of the front side wall of the detector, a plurality of squeeze casters are arranged at the bottom of the front side wall of the movable seat, capacitors CX to be detected are sequentially arranged, the outer ends of the pole legs are adhered to the front side of the table top of the experiment table through adhesive tapes, the main body of the adhered capacitors CX to be detected is suspended at the outer side of the experiment table, and the squeeze casters are matched with the pole legs of the adhered capacitors CX to be detected. The structure is reasonable after the scheme is adopted, the operation is convenient, and the experimental effect is good.
Description
Technical Field
The invention relates to the technical field of capacitors, in particular to a thin film capacitance experimental mechanism.
Background
The thin film capacitor is also called a plastic thin film capacitor, and takes a plastic thin film as a dielectric. The film capacitor is mainly applied to a plurality of industries such as electronics, household appliances, communication, electric power, electrified railway, hybrid electric vehicles, wind power generation, solar power generation and the like, and the stable development of the industries promotes the growth of the film capacitor market. Various test experiments need to be carried out on the film capacitor during production, the conventional test is carried out on the capacitors, the experiments are replaced by one another, the test speed is low, and the efficiency is low.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides the thin film capacitor experimental mechanism which is reasonable in structure, convenient to operate and good in experimental effect.
In order to achieve the above purpose, the technical scheme provided by the invention is as follows: the utility model provides a film electric capacity experiment mechanism, it is including rectangular laboratory bench, the laboratory bench top is equipped with spacing guide along length direction, movable mounting has movable seat on the spacing guide, spacing guide one end is equipped with the reciprocal cylinder that is connected with movable seat, movable seat top is equipped with the detector, be equipped with detection circuitry in the detector, detector front wall middle part is equipped with the display screen UP that is connected with detection circuitry, movable seat front wall bottom is equipped with the pinch roller, the presser foot wheel adopts rubber materials preparation to take shape, the presser foot wheel bottom is pressed on the laboratory bench mesa, the electric capacity CX that awaits measuring is a plurality of that arrange in proper order, the utmost point foot outer end bonds in laboratory bench mesa front side through the sticky tape, the electric capacity CX main part that awaits measuring after bonding is unsettled in the laboratory bench outside, the pinch roller cooperatees with the electric capacity CX that awaits measuring after bonding, the fixed block is installed to fixed block to movable seat front wall lower part one end, the fixed block bottom is equipped with detection branch, detection branch one end is fixed in the fixed block bottom, the other end extends to presser foot wheel top level, its extension end movable mounting has the lift adjustment pole, the lifter pole bottom is equipped with the fixed plate, the fixed plate that is located the electric capacity CX one end of awaiting measuring is equipped with the hinge, the sensing fork arm, the hinge is located on the hinge of each arm of the electric capacity CX that awaits measuring, the electric capacity CX is equipped with the hinge rod, the hinge arm is located the two pieces of the articulated arm of each arm, and the hinge arm that is located the hinge rod is articulated, and the other end is located the arm of each arm is articulated.
After the scheme is adopted, the structure which is not described in detail can adopt a conventional mode, after capacitors to be detected are sequentially arranged, the outer ends of pole feet are adhered to the front side of the table top of the experiment table through adhesive tapes, a reciprocating cylinder drives a movable seat to reciprocate on the experiment table, the position of the capacitors to be detected is sensed through an inductor, and then a clamping plate is driven by a bidirectional cylinder to enable a contact piece to be in contact with the pole feet of the capacitors, so that a detection experiment is carried out; the structure is reasonable after the scheme is adopted, the operation is convenient, and the experimental effect is good.
Drawings
Fig. 1 is a schematic diagram of the overall structure of the present invention.
Fig. 2 is a schematic view of the hinge rod structure of the present invention.
Fig. 3 is a diagram of a detection circuit according to the present invention.
Detailed Description
The invention is further described below with reference to all drawings, in which preferred embodiments of the invention are: referring to fig. 1 to 3, the thin film capacitor experimental mechanism of the embodiment comprises a rectangular experiment table 1, a limit guide rail 2 is arranged at the top of the experiment table 1 along the length direction, a movable seat 3 is movably arranged on the limit guide rail 2, a reciprocating cylinder 4 connected with the movable seat 3 is arranged at one end of the limit guide rail 2, a detector is arranged at the top of the movable seat 3, a detection circuit is arranged in the detector, a display screen UP connected with the detection circuit is arranged in the middle of the front side wall of the detector, a caster wheel 6 is arranged at the bottom of the front side wall of the movable seat 3, the caster wheel 6 is made of rubber materials, the bottom of the caster wheel 6 is pressed on the table surface of the experiment table 1, a plurality of capacitors CX to be detected are sequentially arranged, the outer ends of the polar feet are adhered to the front side of the experiment table 1 through adhesive tapes, the main body of the capacitors CX to be detected after adhesion is suspended outside the experiment table 1, the caster wheel 6 is matched with the polar feet of the adhered capacitors CX to be detected, a fixed block 8 is arranged at one end of the lower side wall of the movable seat 3, a detection block 8 is arranged at the bottom of the fixed block 8, one end of the fixed block 9 is fixed at the bottom of the fixed block, a display screen UP, the other end is fixed at the bottom of the fixed block 8, a caster wheel 6 is horizontally extends to the upper side of the detection block, a caster wheels 6, a caster wheel 6 is provided with a caster wheels 6, a hinge rod 11 is arranged at the bottom of the two-shaped hinge rod 11, two hinge rods 11 are arranged at the two-shaped hinge rods 11, two hinge rods 11 are arranged at the two ends of the hinge rods 11, and one end 12 are respectively, one end of the two hinge rod 13 are arranged, and two hinge rods 11 are arranged, respectively, and one end 12.
The detection circuit comprises a first integrated circuit IC1, a second integrated circuit IC2, a first potentiometer RP1 and a second potentiometer RP2, wherein a 6 th pin and a 2 nd pin of the first integrated circuit IC1 are connected with one end of a second resistor R2 and one end of a first capacitor C1 respectively after being connected, the other end of the second resistor R2 is connected with a 7 th pin of the first integrated circuit IC1 and then one end of the first resistor R1, and the other end of the first resistor R1 is connected with a 4 th pin and an 8 th pin of the first integrated circuit IC1 and a 4 th pin and an 8 th pin of the second integrated circuit IC2 and then connected with one end of a gear shifting resistor and one end of a second switch K2, and the other end of the second switch K2 is connected with the positive electrode of a power supply; the shift resistor is composed of a plurality of parallel resistors, a fifth resistor R5 is connected to the connecting end of the second switch K2 and the shift resistor, and the other end of the shift resistor is matched with the first switch K1; the other end of the fifth resistor R5 is respectively connected with the first potentiometer RP1, the second potentiometer RP2 and the display screen UP, the first potentiometer RP1 is connected with one end of the display screen UP and one end of the third resistor R3, the other end of the third resistor R3 is connected with the 3 rd pin of the second integrated circuit IC2, the second potentiometer RP2 is connected with the display screen UP and the negative electrode of the power supply, and the capacitor CX to be tested is connected between the 6 th pin and the 7 th pin of the second integrated circuit IC2 and the other end of the first switch K1; the other end of the first capacitor C1 is sequentially connected with the 1 st pin of the first integrated circuit IC1, the second capacitor C2, the 1 st pin of the second integrated circuit IC2 and the third capacitor C3, then is connected with the power supply cathode, the second capacitor C2 is connected with the 5 th pin of the first integrated circuit IC1, the third capacitor C3 is connected with the 5 th pin of the second integrated circuit IC2, and the 3 rd pin of the first integrated circuit IC1 is connected with the 2 nd pin of the second integrated circuit IC 2. A controllable oscillator is formed by the first integrated circuit, the second integrated circuit, various measuring range resistors and the like, the capacitance is converted into a corresponding voltage value by utilizing the proportional relation between the oscillation period and the capacitance of the capacitor to be measured, the voltage value is displayed on a display screen, RP1 is used for adjusting the full measuring range, and RP2 is used for adjusting the zero head of the meter.
The structure which is not described in detail in the embodiment can adopt a conventional mode, after the capacitors to be detected are sequentially arranged, the outer ends of the pole feet are adhered to the front side of the table top of the experiment table through adhesive tapes, the reciprocating cylinder drives the movable seat to reciprocate on the experiment table, the position of the capacitors to be detected is sensed through the sensor, and then the contact piece is contacted with the pole feet of the capacitors through the clamping plate driven by the bidirectional cylinder, so that a detection experiment is carried out; the experimental device has reasonable structure, convenient operation and good experimental effect.
The above-mentioned embodiments are only preferred embodiments of the present invention, and are not intended to limit the scope of the present invention, so that all changes made in the shape and principles of the present invention are covered by the scope of the present invention.
Claims (1)
1. The thin film capacitance experiment mechanism comprises a rectangular experiment table (1), and is characterized in that: the top of the experiment table (1) is provided with a limit guide rail (2) along the length direction, a movable seat (3) is movably arranged on the limit guide rail (2), one end of the limit guide rail (2) is provided with a reciprocating cylinder (4) connected with the movable seat (3), the top of the movable seat (3) is provided with a detector, a detection circuit is arranged in the detector, the middle part of the front side wall of the detector is provided with a display screen (UP) connected with the detection circuit, the bottom of the front side wall of the movable seat (3) is provided with a foot pressing wheel (6), the foot pressing wheel (6) is made of rubber materials, the bottom of the foot pressing wheel (6) is pressed on the table surface of the experiment table (1), the Capacitors (CX) to be detected are sequentially arranged, the outer ends of the foot pressing wheels are adhered to the front side of the table surface of the experiment table (1) through adhesive tapes, the main body of the Capacitors (CX) to be detected after adhesion is suspended outside the experiment table (1), the foot pressing wheel (6) is matched with the poles of the adhered Capacitors (CX) to be detected, one end of the lower part of the front side wall of the movable seat (3) is provided with a fixed block (8), the bottom of the fixed block (8) is provided with a detection supporting rod (9), one end of the fixed block (9) is fixed at the bottom of the fixed block (8) is fixedly arranged on the bottom of the fixed block (8) and is fixedly arranged on the bottom of the lifting rod (10) and extends to the lifting rod (10), the bottom of a fixed plate (11) positioned at one end of a Capacitor (CX) to be detected is provided with a hinge shaft, an X-shaped hinge rod (12) is sleeved on the hinge shaft, two fork arms at one end of the hinge rod (12) are respectively provided with a sensing piece (13), the two sensing pieces (13) are respectively positioned above and below the pole feet of the Capacitor (CX) to be detected, two fork arms at the other end of the hinge rod (12) are respectively hinged with a connecting rod, and the connecting rod is hinged with a hinge rod cylinder (14) at the bottom of the fixed plate (11).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710956795.7A CN108344916B (en) | 2017-10-16 | 2017-10-16 | Thin film capacitor experiment mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201710956795.7A CN108344916B (en) | 2017-10-16 | 2017-10-16 | Thin film capacitor experiment mechanism |
Publications (2)
Publication Number | Publication Date |
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CN108344916A CN108344916A (en) | 2018-07-31 |
CN108344916B true CN108344916B (en) | 2023-10-24 |
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Family Applications (1)
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CN201710956795.7A Active CN108344916B (en) | 2017-10-16 | 2017-10-16 | Thin film capacitor experiment mechanism |
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CN (1) | CN108344916B (en) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107656164A (en) * | 2017-10-16 | 2018-02-02 | 东莞市杰发电子有限公司 | Capacitor detecting system |
Citations (8)
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---|---|---|---|---|
CN2773698Y (en) * | 2005-01-28 | 2006-04-19 | 唐军 | Insulating resistance tester of 30 loop thin-membrane capacitor |
JP2008175540A (en) * | 2007-01-16 | 2008-07-31 | Nec Corp | Method and system for inspecting thin-film capacitor |
JP2011108510A (en) * | 2009-11-18 | 2011-06-02 | Victor Co Of Japan Ltd | Electrostatic capacity type switch inspection device |
JP2013069830A (en) * | 2011-09-22 | 2013-04-18 | Kojima Press Industry Co Ltd | Aging device for film capacitor |
CN203275586U (en) * | 2013-03-26 | 2013-11-06 | 珠海格力新元电子有限公司 | Withstand voltage testing device for thin-film capacitor |
CN103545107A (en) * | 2013-10-15 | 2014-01-29 | 四川大学 | Cascaded plane-parallel capacitor used for thin film electricity performance test and production method thereof |
CN105866583A (en) * | 2016-04-14 | 2016-08-17 | 广东明阳龙源电力电子有限公司 | Testing tool for ripple current resistance of multi-specification thin-film capacitor |
CN205645559U (en) * | 2016-03-22 | 2016-10-12 | 东莞市仟泰电子科技有限公司 | Film capacitor check out test set |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7102367B2 (en) * | 2002-07-23 | 2006-09-05 | Fujitsu Limited | Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof |
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2017
- 2017-10-16 CN CN201710956795.7A patent/CN108344916B/en active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2773698Y (en) * | 2005-01-28 | 2006-04-19 | 唐军 | Insulating resistance tester of 30 loop thin-membrane capacitor |
JP2008175540A (en) * | 2007-01-16 | 2008-07-31 | Nec Corp | Method and system for inspecting thin-film capacitor |
JP2011108510A (en) * | 2009-11-18 | 2011-06-02 | Victor Co Of Japan Ltd | Electrostatic capacity type switch inspection device |
JP2013069830A (en) * | 2011-09-22 | 2013-04-18 | Kojima Press Industry Co Ltd | Aging device for film capacitor |
CN203275586U (en) * | 2013-03-26 | 2013-11-06 | 珠海格力新元电子有限公司 | Withstand voltage testing device for thin-film capacitor |
CN103545107A (en) * | 2013-10-15 | 2014-01-29 | 四川大学 | Cascaded plane-parallel capacitor used for thin film electricity performance test and production method thereof |
CN205645559U (en) * | 2016-03-22 | 2016-10-12 | 东莞市仟泰电子科技有限公司 | Film capacitor check out test set |
CN105866583A (en) * | 2016-04-14 | 2016-08-17 | 广东明阳龙源电力电子有限公司 | Testing tool for ripple current resistance of multi-specification thin-film capacitor |
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CN108344916A (en) | 2018-07-31 |
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