CN108311418A - High temperature automatic fraction collector heat insulation test device and heat insulation test method - Google Patents
High temperature automatic fraction collector heat insulation test device and heat insulation test method Download PDFInfo
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- CN108311418A CN108311418A CN201810019339.4A CN201810019339A CN108311418A CN 108311418 A CN108311418 A CN 108311418A CN 201810019339 A CN201810019339 A CN 201810019339A CN 108311418 A CN108311418 A CN 108311418A
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- 238000012360 testing method Methods 0.000 title claims abstract description 117
- 238000009413 insulation Methods 0.000 title claims abstract description 53
- 238000010998 test method Methods 0.000 title claims abstract description 12
- 238000010438 heat treatment Methods 0.000 claims abstract description 20
- 230000006835 compression Effects 0.000 claims description 44
- 238000007906 compression Methods 0.000 claims description 44
- 238000004321 preservation Methods 0.000 claims description 16
- 230000000694 effects Effects 0.000 claims description 15
- 238000000465 moulding Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 7
- 239000000203 mixture Substances 0.000 claims description 7
- 239000011094 fiberboard Substances 0.000 claims description 5
- 239000011521 glass Substances 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 4
- 239000000463 material Substances 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/34—Sorting according to other particular properties
- B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/02—Measures preceding sorting, e.g. arranging articles in a stream orientating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
- B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
- B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
- B07C5/36—Sorting apparatus characterised by the means used for distribution
- B07C5/361—Processing or control devices therefor, e.g. escort memory
- B07C5/362—Separating or distributor mechanisms
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The object of the present invention is to provide a kind of high temperature automatic fraction collector heat insulation test device and heat insulation test methods.A kind of high temperature automatic fraction collector heat insulation test device, including：Thermal-insulating body equipped with heater, several are in thermal-insulating body and vertical upper rail and number of the lower end equipped with gradation mechanism are identical as vertical upper rail number and feeding drawer is tested in vertical lower railway, the drawer hole through thermal-insulating body front-end and back-end correspondingly；Testing feeding drawer includes：It is arranged in drawer hole and equipped with the drawer body of number test feed mechanism identical with vertical upper rail number, equipped with the test end plate tested connector correspondingly with test feed mechanism and connect with drawer body front end；Thermal-insulating body upper end is stretched out in the upper end vertically got on the right track；Thermal-insulating body lower end is stretched out in the lower end of vertical lower railway.The high temperature automatic fraction collector heat insulation test device enables the integrated circuit after heating effectively to keep the temperature, and integrated circuit internal and external temperature is uniform, high temperature test precision is higher.
Description
Technical field
The present invention relates to integrated circuits to sort field, especially a kind of high temperature automatic fraction collector heat insulation test device and heat preservation
Test method.
Background technology
High temperature automatic fraction collector is used for the integrated circuit that testing, sorting need to use under high temperature environment；Traditional high temperature is automatic
Sorting machine is deposited integrated circuit after the heating and cannot effectively be kept the temperature, and leads to that integrated circuit internal and external temperature is uneven, high temperature test is smart
Spend lower deficiency；Therefore, designing the integrated circuit after a kind of heating can effectively keep the temperature, integrated circuit internal and external temperature uniformly, it is high
The higher high temperature automatic fraction collector heat insulation test device of warm measuring accuracy and heat insulation test method, become urgent problem to be solved.
Invention content
The purpose of the invention is to the integrated circuits for overcoming the high temperature automatic fraction collector after mesh to deposit after the heating to have
Effect heat preservation, leads to that integrated circuit internal and external temperature is uneven, the lower deficiency of high temperature test precision, provides integrated after a kind of heating
Circuit can effectively be kept the temperature, integrated circuit internal and external temperature uniformly, the higher high temperature automatic fraction collector heat insulation test of high temperature test precision
Device and heat insulation test method.
The specific technical solution of the present invention is：
A kind of high temperature automatic fraction collector heat insulation test device, including：Thermal-insulating body equipped with heater；The high temperature divides automatically
The machine heat insulation test device is selected to further include：Several are set in thermal-insulating body and lower end and are equipped with the vertical upper rail of gradation mechanism and a
Number is identical as vertical upper rail number and one-to-one vertical lower railway, be set between vertical upper rail and vertically lower railway and
Feeding drawer is tested in drawer hole through thermal-insulating body front-end and back-end；Testing feeding drawer includes：It is arranged in drawer hole and is equipped with number
The drawer body of test feed mechanism identical with vertical upper rail number, connect equipped with being tested correspondingly with test feed mechanism
Head and the test end plate being connect with drawer body front end；It is a pair of with vertical upper rail and vertical lower railway one respectively to test feed mechanism
It answers；Thermal-insulating body upper end is stretched out in the upper end vertically got on the right track；Thermal-insulating body lower end is stretched out in the lower end of vertical lower railway.The height
Warm automatic fraction collector heat insulation test device in use, integrated circuit after heating from vertical upper rail fall through into thermal-insulating body into
Row heat preservation；Integrated circuit after gradation mechanism gradation falls into test feed mechanism and carries out feeding, and make integrated circuit connects electric foot
It is electrically connected with test connector, the test machine being electrically connected with test connector tests integrated circuit；Complete the collection of test
It is fallen through vertical lower railway at circuit and is transferred to next procedure；The high temperature automatic fraction collector heat insulation test device makes integrated after heating
Circuit can effectively be kept the temperature, and integrated circuit internal and external temperature is uniform, high temperature test precision is higher.
Preferably, the vertical upper rail is equipped with feed well；Vertical lower railway, which is equipped with, is located at going out on front side of feed well
Hopper；Testing feed mechanism includes：The feeding track that upper end is equipped with the chute feeder opposite with feed well lower end and is connect with drawer body,
The charging ram of chute feeder rear end is inserted into the pusher cylinder connecting on rear side of thermal-insulating body and with drawer body, front end；Pusher cylinder
The rear end of piston rod and charging ram connects；The front end of chute feeder is opposite with test connector rear end；Feeding groove bottom is equipped with and send
Expect the perforation of track lower end and the discharge hole opposite with blow tank upper end.Feed mechanism is tested to align by pusher cylinder, charging ram
Integrated circuit in feed well carries out feeding, so that the electric foot that connects of integrated circuit is electrically connected with test connector, after completing test
Integrated circuit fallen from blow tank through discharge hole and be transferred to next procedure, it is simple and practical in structure.
Preferably, the test feeding drawer further includes：Two front ends and drawer body two side ends correspond hinged interior
Connecting rod, two front ends correspond hinged outside connecting rod with thermal-insulating body；Behind the rear end of two inner links and two outside connecting rods
End corresponds hinged.Drawer body is hinged with thermal-insulating body by two inner links and two outside connecting rods, is conducive to test feeding drawer water
Horizontal drawing goes out observation repair and keeps test feeding drawer.
Preferably, the gradation mechanism includes：Set on vertical upper rail rear end and the vertical slot that is connected to feed well, after
The gradation seat that end is connect equipped with upper hopper chute and gliding groove and with vertical upper rail rear end, two are arranged above and below and front end is inserted into respectively
Compression leg in vertical slot is set to the ceiling molding that in upper hopper chute and one end is connect with a compression leg rear end positioned at upside, and two are set to
Gradation base rear end blocks the upper blend stop of ceiling molding, is set to what in gliding groove and one end was connect with a compression leg rear end positioned at downside
Lower press strip, two are set to the lower blend stop that gradation base rear end blocks lower press strip, and two correspond the compression spring being sleeved on outside two compression legs,
Two gradation cylinders being connect with thermal-insulating body rear end；The piston rod of one gradation cylinder stretches into thermal-insulating body and and ceiling molding
The other end it is opposite；The piston rod of another gradation cylinder stretches into thermal-insulating body and opposite with the lower other end of press strip.Gradation
Mechanism realizes that integrated circuit gradation is compact-sized by two compression legs, ceiling molding and lower press strip, two gradation cylinders, two compression springs
Reliably.
Preferably, the thermal-insulating body includes：Medial surface is the whole inner casing of minute surface, and shell is filled in entirety
Insulating between shell and shell；Heater is the heating plate being connect with whole inner casing front end；The front end vertically got on the right track
It is connect with heating plate.The material of whole inner casing is stainless steel, and the medial surface of whole inner casing is minute surface, can prevent outside heat radiation；
Thermal-insulating body can keep integrated circuit internal and external temperature uniform the effective heat-insulation and heat-preservation of integrated circuit, improve high temperature test precision.
Preferably, the thermal-insulating body rear end is equipped with insulated door and is connect respectively with insulated door and thermal-insulating body rear end
Locking door handle；The two side ends of thermal-insulating body are equipped with cable-through hole.Insulated door maintains easily guarantee, locking door handle be conducive to every
Hot topic switch and good airproof performance.
Preferably, the insulating includes；Glass fiberboard and high temperature resistant spongy layer.Heat insulation and preservation effect
It is good.
A kind of heat insulation test method of high temperature automatic fraction collector heat insulation test device, high temperature automatic fraction collector heat preservation
Test device has the limiting structure of above-mentioned high temperature automatic fraction collector heat insulation test device, and step 1, integrated circuit is from charging
Slot falls through into thermal-insulating body and is heated to set temperature and is kept the temperature, and is located at a compression leg of downside under gradation cylinder action
Push down first integrated circuit；Step 2, a compression leg positioned at upside push down second integrated electricity under gradation cylinder action
Road, a compression leg positioned at downside reset under compression spring effect, and first integrated circuit is fallen into chute feeder, meanwhile, it is located at upper
One compression leg of side resets under compression spring effect, and second integrated circuit is fallen, and is located at a compression leg of downside in gradation cylinder
Second integrated circuit is pushed down under effect；Step 3, under pusher cylinder effect, charging ram pushes first integrated circuit forward
Movement makes the electric foot that connects of integrated circuit be electrically connected with test connector, the test machine pair first being electrically connected with test connector
Integrated circuit is tested；Step 4, charging ram reset, and first integrated circuit for completing test is fallen through discharge hole from blow tank
Under be transferred to next procedure；It repeats Step 2: step 3, heat insulation test is carried out to integrated circuit one by one.High temperature automatic fraction collector is protected
The integrated circuit that the heat insulation test method of warm test device can meet after heating can effectively be kept the temperature, and integrated circuit internal and external temperature is equal
Even, the higher needs of high temperature test precision.
Compared with prior art, the beneficial effects of the invention are as follows：The high temperature automatic fraction collector heat insulation test device makes heating
Integrated circuit afterwards can effectively be kept the temperature, and integrated circuit internal and external temperature is uniform, high temperature test precision is higher.Test feed mechanism passes through
Pusher cylinder, charging ram carry out feeding to the integrated circuit in feed well, and the electric foot that connects of integrated circuit is made to be connected with test
Head electrical connection, the integrated circuit after completion test, which is fallen through discharge hole from blow tank, is transferred to next procedure, simple and practical in structure.Drawer
Body is hinged with thermal-insulating body by two inner links and two outside connecting rods, is conducive to test feeding drawer level and pulls out observation repair and protect
Hold test feeding drawer.Gradation mechanism realizes collection by two compression legs, ceiling molding and lower press strip, two gradation cylinders, two compression springs
It is compact-sized reliable at circuit gradation.Thermal-insulating body can keep integrated circuit internal and external temperature equal the effective heat-insulation and heat-preservation of integrated circuit
It is even, improve high temperature test precision.The material of whole inner casing is stainless steel, and the medial surface of whole inner casing is minute surface, can be prevented outward
Heat radiation；Thermal-insulating body can keep integrated circuit internal and external temperature uniform the effective heat-insulation and heat-preservation of integrated circuit, improve high temperature test essence
Degree.Insulated door maintains easily guarantee, and locking door handle is conducive to heat-insulated door switch and good airproof performance.Insulating includes glass fibers
It ties up plate layer and high temperature resistant spongy layer, heat insulation and preservation effect is good.The heat insulation test method of high temperature automatic fraction collector heat insulation test device
Can meet heating after integrated circuit can effectively keep the temperature, integrated circuit internal and external temperature uniformly, the higher needs of high temperature test precision.
Description of the drawings
Fig. 1 is a kind of structural schematic diagram of the present invention；
Fig. 2 is the rearview of Fig. 1；
Fig. 3 is the structural schematic diagram of vertical upper rail, vertical lower railway；
Fig. 4 is the structural schematic diagram for testing feeding drawer；
Fig. 5 is the structural schematic diagram of gradation mechanism；
Fig. 6 is the A-A views of Fig. 5.
In figure：Integrated circuit 1, thermal-insulating body 2, drawer hole 21, whole inner casing 22, shell 23, heating plate 24, insulated door 25,
Lock door handle 26, cable-through hole 27, glass fiberboard 28, high temperature resistant spongy layer 29, gradation mechanism 3, vertical slot 31, upper hopper chute
32, gliding groove 33, gradation seat 34, compression leg 35, ceiling molding 36, upper blend stop 37, lower press strip 38, lower blend stop 39, compression spring 310, gradation
Cylinder 311, vertically upper rail 4, feed well 41, vertical lower railway 5, blow tank 51, test feeding drawer 6, drawer body 61, test connection
First 62, end plate 63, chute feeder 64, feeding track 65, pusher cylinder 66, charging ram 67, discharge hole 68, inner link 69, outer is tested
Connecting rod 610.
Specific implementation mode
The present invention is described further shown in below in conjunction with the accompanying drawings.
As shown in attached drawing 1 to attached drawing 6：A kind of high temperature automatic fraction collector heat insulation test device, including：Guarantor equipped with heater
Incubator body 2, four are set to vertical upper rail 4 and number and vertical upper rail of in the thermal-insulating body 2 and lower end equipped with gradation mechanism 3
4 numbers are identical and one-to-one vertical lower railway 5, are set between vertical upper rail 4 and vertical lower railway 5 and run through incubator
The drawer hole 21 of 2 front-end and back-end of body, test feeding drawer 6；Testing feeding drawer 6 includes：Be arranged in drawer hole 21 and equipped with number with
The vertically drawer body 61 of the identical test feed mechanism of 4 numbers of upper rail, equipped with test the feed mechanism company of test correspondingly
Connector 62 and the test end plate 63 being spirally connected with 61 front end of drawer body；Test feed mechanism respectively with vertical upper rail 4 and vertical lower rail
Road 5 corresponds；2 upper end of thermal-insulating body is stretched out in the upper end of vertical upper rail 4；Thermal-insulating body 2 is stretched out in the lower end of vertical lower railway 5
Lower end.
The vertical upper rail 4 is equipped with feed well 41；Vertical lower railway 5 is equipped with the blow tank for being located at 41 front side of feed well
51；Testing feed mechanism includes：The feeding that upper end is equipped with the chute feeder 64 opposite with 41 lower end of feed well and is spirally connected with drawer body 61
Track 65, positioned at the pusher cylinder 66 thermal-insulating body 2 rear side and be spirally connected with drawer body 61, the pusher of 64 rear end of chute feeder is inserted into front end
Bar 67；The piston rod of pusher cylinder 66 and the rear end of charging ram 67 are spirally connected；The front end of chute feeder 64 and 62 rear end of test connector
Relatively；64 bottom surface of chute feeder is equipped with and the perforation of 65 lower end of feeding track and the discharge hole 68 opposite with 51 upper end of blow tank.
The test feeding drawer 6 further includes：Two front ends correspond hinged by articulated shaft with 61 two side ends of drawer body
Inner link 69, two front ends pass through the hinged outside connecting rod 610 of articulated shaft with the one-to-one correspondence of thermal-insulating body 2；Two inner links 69
Rear end and two outside connecting rods 610 rear end correspond it is hinged by articulated shaft.
The gradation mechanism 3 includes：Set on vertically 4 rear ends of upper rail and the vertical slot 31 being connected to feed well 41, rear end
The gradation seat 34 being spirally connected equipped with upper hopper chute 32 and gliding groove 33 and with 4 rear ends of vertical upper rail, two are arranged above and below and front end point
Compression leg 35 that Cha Ru be in vertical slot 31, in upper hopper chute 32 and one end be spirally connected with 35 rear end of compression leg positioned at upside it is upper
Press strip 36, two are set to 34 rear end of gradation seat and block the upper blend stops 37 of ceiling molding 36, in gliding groove 33 and one end be located at
The lower press strip 38 that one 35 rear end of compression leg of downside is spirally connected, two are set to the lower blend stop that lower press strip 38 is blocked in 34 rear end of gradation seat
39, two correspond the compression spring 310 being sleeved on outside two compression legs 35, two gradation cylinders being spirally connected with 2 rear end of thermal-insulating body
311；The piston rod of one gradation cylinder 311 stretches into thermal-insulating body 2 and opposite with the other end of ceiling molding 36；Another gradation
The piston rod of cylinder 311 stretches into thermal-insulating body 2 and opposite with the other end of lower press strip 38.
In the present embodiment, the thermal-insulating body 2 includes：Whole inner casing 22, shell 23 are filled in whole inner casing 22 and outer
Insulating between shell 23；Heater is the heating plate 24 being spirally connected with 22 front end of whole inner casing；The front end of vertical upper rail 4
It is spirally connected with heating plate 24.Heating plate 24 is the air dividing plate equipped with hot gas runner, and the hot gas by flowing through hot gas runner is heated.
2 rear end of thermal-insulating body is equipped with insulated door 25 and is respectively spirally connected with insulated door 25 and 2 rear end of thermal-insulating body
Lock door handle 26；The two side ends of thermal-insulating body 2 are equipped with cable-through hole 27.
The insulating includes；Glass fiberboard 28 and high temperature resistant spongy layer 29.
A kind of heat insulation test method of high temperature automatic fraction collector heat insulation test device, high temperature automatic fraction collector heat preservation
Test device has the limiting structure of above-mentioned high temperature automatic fraction collector heat insulation test device, and step 1, integrated circuit 1 is from charging
Slot 41 falls through into thermal-insulating body 2 and is heated to set temperature and is kept the temperature, and is located at a compression leg 35 of downside in gradation cylinder
First integrated circuit is pushed down under 311 effects；Step 2, a compression leg 35 for being located at upside act on pushing in gradation cylinder 311
Firmly second integrated circuit, a compression leg 35 positioned at downside reset under the effect of compression spring 310, and first integrated circuit falls into and send
In hopper 64, meanwhile, a compression leg 35 positioned at upside resets under the effect of compression spring 310, and second integrated circuit is fallen, and is located at
One compression leg 35 of downside pushes down second integrated circuit under the effect of gradation cylinder 311；Step 3 is acted in pusher cylinder 66
Under, charging ram 67 pushes first integrated circuit to travel forward, and the electric foot that connects of integrated circuit is made to be electrically connected with test connector 62,
First integrated circuit of test machine pair being electrically connected with test connector 62 is tested；Step 4, charging ram 67 reset, and complete
First integrated circuit of test, which is fallen through discharge hole 68 from blow tank 51, is transferred to next procedure；It repeats Step 2: step 3, right
Integrated circuit carries out heat insulation test one by one.
The beneficial effects of the invention are as follows：The high temperature automatic fraction collector heat insulation test device enables the integrated circuit after heating to have
Effect heat preservation, integrated circuit internal and external temperature is uniform, high temperature test precision is higher.Test feed mechanism passes through pusher cylinder, charging ram
Feeding is carried out to the integrated circuit in feed well, so that the electric foot that connects of integrated circuit is electrically connected with test connector, completes to survey
Integrated circuit after examination, which is fallen through discharge hole from blow tank, is transferred to next procedure, simple and practical in structure.Drawer body in two by connecting
Bar and two outside connecting rods are hinged with thermal-insulating body, are conducive to test feeding drawer level and pull out observation repair and keep test feeding drawer.
Gradation mechanism realizes integrated circuit gradation structure by two compression legs, ceiling molding and lower press strip, two gradation cylinders, two compression springs
It is compact reliable.Thermal-insulating body can keep integrated circuit internal and external temperature uniform the effective heat-insulation and heat-preservation of integrated circuit, improve high temperature test
Precision.The material of whole inner casing is stainless steel, and the medial surface of whole inner casing is minute surface, can prevent outside heat radiation；Thermal-insulating body
Integrated circuit internal and external temperature can be kept uniform the effective heat-insulation and heat-preservation of integrated circuit, improve high temperature test precision.Insulated door facilitates dimension
Shield guarantee, locking door handle are conducive to heat-insulated door switch and good airproof performance.Insulating includes glass fiberboard and high temperature resistant
Spongy layer, heat insulation and preservation effect are good.After the heat insulation test method of high temperature automatic fraction collector heat insulation test device can meet heating
Integrated circuit can effectively be kept the temperature, integrated circuit internal and external temperature uniformly, the higher needs of high temperature test precision.
The present invention can be changed apparent to one skilled in the art for various ways, and such change is not considered as
It departs from the scope of the present invention.The technical staff in the field is obviously changed as all, is included within this right
Within the scope of it is required that.
Claims (8)
1. a kind of high temperature automatic fraction collector heat insulation test device, including：Thermal-insulating body equipped with heater；It is characterized in that described
High temperature automatic fraction collector heat insulation test device further include：Several are set in thermal-insulating body and lower end and are equipped with the perpendicular of gradation mechanism
Upward trajectory and number be identical as vertical upper rail number and one-to-one vertical lower railway, is set to vertical upper rail and vertical
Feeding drawer is tested in drawer hole between lower railway and through thermal-insulating body front-end and back-end；Testing feeding drawer includes：It is arranged in drawer hole
In and equipped with the drawer body of number test feed mechanism identical with vertical upper rail number, be equipped with and one a pair of test feed mechanism
The test connector answered and the test end plate being connect with drawer body front end；Test feed mechanism respectively with vertical upper rail and vertically under
Track corresponds；Thermal-insulating body upper end is stretched out in the upper end vertically got on the right track；The lower end of vertical lower railway is stretched out under thermal-insulating body
End.
2. high temperature automatic fraction collector heat insulation test device according to claim 1, characterized in that the vertical upper rail
Equipped with feed well；Vertical lower railway is equipped with the blow tank being located on front side of feed well；Testing feed mechanism includes：Upper end be equipped with into
Feeding track hopper lower end opposite chute feeder and connect with drawer body is located at the pusher connecting on rear side of thermal-insulating body and with drawer body
The charging ram of chute feeder rear end is inserted into cylinder, front end；The piston rod of pusher cylinder and the rear end of charging ram connect；Before chute feeder
End is opposite with test connector rear end；Feeding groove bottom is equipped with and the perforation of feeding track lower end and opposite with blow tank upper end goes out
Expect hole.
3. high temperature automatic fraction collector heat insulation test device according to claim 2, characterized in that the test feeding drawer
Further include：Two front ends correspond hinged inner link with drawer body two side ends, and two front ends correspond with thermal-insulating body and cut with scissors
The outside connecting rod connect；The rear end of two inner links and the rear end of two outside connecting rods correspond hinged.
4. high temperature automatic fraction collector heat insulation test device according to claim 1 or 2 or 3, characterized in that the gradation
Mechanism includes：Set on vertical upper rail rear end and the vertical slot that be connected to feed well, rear end be equipped with upper hopper chute and gliding groove and with erect
The gradation seat of upward trajectory rear end connection, two are arranged above and below and compression leg in vertical slot is inserted into front end respectively, are set in upper hopper chute
And the ceiling molding that one end is connect with a compression leg rear end positioned at upside, two are set to the upper gear that gradation base rear end blocks ceiling molding
Item is set to the lower press strip that in gliding groove and one end is connect with a compression leg rear end positioned at downside, and two are set to gradation base rear end
Block the lower blend stop of lower press strip, two correspond the compression spring being sleeved on outside two compression legs, and two connect with thermal-insulating body rear end
Gradation cylinder；The other end that the piston rod of one gradation cylinder stretches into thermal-insulating body and with ceiling molding is opposite；Another gradation
The piston rod of cylinder stretches into thermal-insulating body and opposite with the lower other end of press strip.
5. high temperature automatic fraction collector heat insulation test device according to claim 1 or 2 or 3, characterized in that the heat preservation
Babinet includes：Whole inner casing, shell, the insulating being filled between whole inner casing and shell；Heater be in entirety
The heating plate of shell front end connection；The front end vertically got on the right track is connect with heating plate.
6. high temperature automatic fraction collector heat insulation test device according to claim 5, characterized in that after the thermal-insulating body
End is equipped with insulated door and the locking door handle being connect respectively with insulated door and thermal-insulating body rear end；The two side ends of thermal-insulating body are all provided with
There is cable-through hole.
7. high temperature automatic fraction collector heat insulation test device according to claim 5, characterized in that the insulating
Including；Glass fiberboard and high temperature resistant spongy layer.
8. a kind of heat insulation test method of high temperature automatic fraction collector heat insulation test device, high temperature automatic fraction collector heat preservation is surveyed
The limiting structure to any high temperature automatic fraction collector heat insulation test device of claim 7 with claim 1 is set in trial assembly,
It is characterized in that step 1, integrated circuit falls through into thermal-insulating body from feed well and is heated to set temperature and is kept the temperature, and is located at
One compression leg of downside pushes down first integrated circuit under gradation cylinder action；Step 2, a compression leg for being located at upside exist
Second integrated circuit is pushed down under gradation cylinder action, a compression leg positioned at downside resets under compression spring effect, first collection
It is fallen into chute feeder at circuit, meanwhile, a compression leg positioned at upside resets under compression spring effect, and second integrated circuit is fallen
Under, a compression leg positioned at downside pushes down second integrated circuit under gradation cylinder action；Step 3 is acted in pusher cylinder
Under, charging ram pushes first integrated circuit to travel forward, and so that the electric foot that connects of integrated circuit is electrically connected with test connector, with survey
First integrated circuit of test machine pair of examination connector electrical connection is tested；Step 4, charging ram reset, and complete the of test
One integrated circuit falls from blow tank through discharge hole and is transferred to next procedure；It repeats Step 2: step 3, one by one to integrated circuit
Carry out heat insulation test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810019339.4A CN108311418B (en) | 2018-01-09 | 2018-01-09 | Heat preservation testing device and heat preservation testing method for high-temperature automatic sorting machine |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810019339.4A CN108311418B (en) | 2018-01-09 | 2018-01-09 | Heat preservation testing device and heat preservation testing method for high-temperature automatic sorting machine |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108311418A true CN108311418A (en) | 2018-07-24 |
| CN108311418B CN108311418B (en) | 2020-05-05 |
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ID=62894859
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810019339.4A Active CN108311418B (en) | 2018-01-09 | 2018-01-09 | Heat preservation testing device and heat preservation testing method for high-temperature automatic sorting machine |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109801854A (en) * | 2019-01-11 | 2019-05-24 | 杭州长川科技股份有限公司 | Chip high temperature side presses separation system and high temperature side to press method for separating |
| CN116559633A (en) * | 2023-07-10 | 2023-08-08 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
| WO2024207823A1 (en) * | 2023-04-04 | 2024-10-10 | 华为技术有限公司 | Feeding bin of sorting machine and sorting machine |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US20030085160A1 (en) * | 2001-10-12 | 2003-05-08 | Shim Jae-Gyun | Test handler |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| WO2024207823A1 (en) * | 2023-04-04 | 2024-10-10 | 华为技术有限公司 | Feeding bin of sorting machine and sorting machine |
| CN116559633A (en) * | 2023-07-10 | 2023-08-08 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
| CN116559633B (en) * | 2023-07-10 | 2023-09-29 | 华羿微电子股份有限公司 | Semiconductor chip high temperature test box |
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| CN108311418B (en) | 2020-05-05 |
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