CN108267467A - 一种便携式多用途x射线分析仪 - Google Patents
一种便携式多用途x射线分析仪 Download PDFInfo
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- CN108267467A CN108267467A CN201810253549.XA CN201810253549A CN108267467A CN 108267467 A CN108267467 A CN 108267467A CN 201810253549 A CN201810253549 A CN 201810253549A CN 108267467 A CN108267467 A CN 108267467A
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- 229910052790 beryllium Inorganic materials 0.000 claims description 7
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- 238000010521 absorption reaction Methods 0.000 description 1
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- PWOSZCQLSAMRQW-UHFFFAOYSA-N beryllium(2+) Chemical compound [Be+2] PWOSZCQLSAMRQW-UHFFFAOYSA-N 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Dispersion Chemistry (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
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CN201810253549.XA CN108267467A (zh) | 2018-03-26 | 2018-03-26 | 一种便携式多用途x射线分析仪 |
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CN201810253549.XA CN108267467A (zh) | 2018-03-26 | 2018-03-26 | 一种便携式多用途x射线分析仪 |
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CN108267467A true CN108267467A (zh) | 2018-07-10 |
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CN201810253549.XA Pending CN108267467A (zh) | 2018-03-26 | 2018-03-26 | 一种便携式多用途x射线分析仪 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111426712A (zh) * | 2019-12-27 | 2020-07-17 | 江苏兴华胶带股份有限公司 | 一种基于x射线成图的自动锚链检测系统 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101669024B (zh) * | 2007-03-06 | 2012-10-31 | 赛默飞世尔科技公司 | X射线分析仪器 |
CN102128845B (zh) * | 2009-10-22 | 2016-02-24 | 帕纳科有限公司 | Xrd和xrf的组合装置 |
CN107228871A (zh) * | 2017-07-21 | 2017-10-03 | 中国地质大学(武汉) | 一种便携式x射线分析装置 |
CN107238620A (zh) * | 2017-07-26 | 2017-10-10 | 中国地质大学(武汉) | 一种可旋转试样的x射线荧光衍射集成分析仪 |
CN206729104U (zh) * | 2017-04-16 | 2017-12-12 | 孙又来 | 一种低发酵红茶的发酵装置 |
-
2018
- 2018-03-26 CN CN201810253549.XA patent/CN108267467A/zh active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101669024B (zh) * | 2007-03-06 | 2012-10-31 | 赛默飞世尔科技公司 | X射线分析仪器 |
CN102128845B (zh) * | 2009-10-22 | 2016-02-24 | 帕纳科有限公司 | Xrd和xrf的组合装置 |
CN206729104U (zh) * | 2017-04-16 | 2017-12-12 | 孙又来 | 一种低发酵红茶的发酵装置 |
CN107228871A (zh) * | 2017-07-21 | 2017-10-03 | 中国地质大学(武汉) | 一种便携式x射线分析装置 |
CN107238620A (zh) * | 2017-07-26 | 2017-10-10 | 中国地质大学(武汉) | 一种可旋转试样的x射线荧光衍射集成分析仪 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111426712A (zh) * | 2019-12-27 | 2020-07-17 | 江苏兴华胶带股份有限公司 | 一种基于x射线成图的自动锚链检测系统 |
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CB03 | Change of inventor or designer information | ||
CB03 | Change of inventor or designer information |
Inventor after: Zhang Weimin Inventor after: Xiong Deyun Inventor after: Wang Dianhong Inventor after: Ni Xiaoyong Inventor after: Yang Yongqi Inventor after: Xu Chaoyu Inventor before: Zhang Weimin Inventor before: Wang Dianhong Inventor before: Ni Xiaoyong Inventor before: Xiong Deyun Inventor before: Yang Yongqi Inventor before: Xu Chaoyu |
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Application publication date: 20180710 |