CN108254158A - A kind of device and method for monitoring optical element integrality - Google Patents
A kind of device and method for monitoring optical element integrality Download PDFInfo
- Publication number
- CN108254158A CN108254158A CN201810032397.0A CN201810032397A CN108254158A CN 108254158 A CN108254158 A CN 108254158A CN 201810032397 A CN201810032397 A CN 201810032397A CN 108254158 A CN108254158 A CN 108254158A
- Authority
- CN
- China
- Prior art keywords
- value
- optical element
- electrical signals
- light beam
- integrality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
Abstract
The present invention proposes a kind of device for monitoring optical element integrality, including light source, emits light beam；Optical element receives the light beam；First beam sensor receives the modulated light beam of the optical element and first environment light beam, generates the first value of electrical signals；Second beam sensor receives second environment light beam, generates the second value of electrical signals；Control circuit receives and calculates first value of electrical signals with second value of electrical signals integrality to monitor the optical element and performs relevant control operation according to integrality.The present invention also proposes a kind of method for monitoring optical element integrality.The device and method of present invention monitoring optical element integrality, can be effectively prevented from interference of the too strong environment light beam to optical element Integrity Verification, and improve the security performance of optical element.
Description
Technical field
The present invention relates to optics and opto-electronics more particularly to a kind of device for monitoring optical element integrality and sides
Method.
Background technology
Diffraction optical element (DOE) has high-diffraction efficiency and can realize a variety of optical functions such as beam splitting, collimation,
It is small convenient for integrating additionally, due to its, it is therefore widely used in the fields such as beam shaping, optical imagery.It is imaged and leads in 3D
Domain, DOE is commonly used for generation coding or structured bundle of light beams, for example, the projection module based on lasing light emitter, lens and DOE composition
The codings such as striped, two-dimensional pattern and spot or fabrication patterning light beam can be generated.
Core components of the DOE as projection module, integrality directly decide the working performance and safety of projection module
Index.However, extreme working environment, at a temperature of, the problem of DOE inevitably will appear damage, aging；In addition, artificial knocks
Touching, staggering along is also an important factor for accelerating DOE.The DOE of damage would generally be along with single beam of intensive light or Zero-order diffractive problem, such as
Fruit cannot find, handle in time, it is most likely that induce laser safety problem.
In order to avoid because inducing laser safety problem when DOE agings, damage, can generally use beam sensor monitoring by
The energy variation of the diffracted beam of DOE longitudinal terminal surfaces outgoing, to evaluate the integrality of DOE.Here diffracted beam refers to light
After DOE diffraction the high order diffraction light beam being emitted after multiple total reflection from longitudinal terminal surface occurs inside DOE for the light beam of source transmitting
And/or Zero-order diffractive light beam.However, in practical application, the stronger environment light beam of energy can directly inversely enter in DOE
Portion, and pass through multiple total reflection by DOE longitudinal terminal surface directive beam sensor beam reception face, it is faint so as to cause energy
Diffracted beam directly bury in oblivion in the stronger environment light beam of energy.In other words, the too strong environment light beam of energy is it is possible that meeting
Interfere judgement of the beam sensor to DOE integralities.
Invention content
The purpose of the present invention is to solve environment light beam of the prior art interference beam sensor is complete to optical element
The problem of judgement of whole property, proposes a kind of device and method for monitoring optical element integrality.
The device of the monitoring optical element integrality of the present invention, including：Light source emits light beam；Optical element, described in reception
Light beam；First beam sensor receives the modulated light beam of the optical element and first environment light beam, generates the first telecommunications
Number it is worth and transmits it in control circuit；Second beam sensor receives second environment light beam, and the second value of electrical signals of generation is simultaneously
It transmits it in the control circuit；The control circuit, it receives and calculates first value of electrical signals and the described second electricity
Signal value performs relevant control operation with the integrality that monitors the optical element and according to integrality.
In a preferred embodiment, the control circuit calculates first value of electrical signals and second value of electrical signals
Included with the integrality for monitoring the optical element：The control circuit is preset with reference formula and secure threshold section, according to
The reference formula, the first value of electrical signals, the second electric signal calculate judgment value, and by comparing the judgment value and the peace
The relationship of full threshold interval judges the integrality of the optical element, when the judgment value exceeds the secure threshold section
When, the control circuit performs relevant control operation.
In a preferred embodiment, the reference formula, including A2/A1=kA/B-1 or A2=A-B/k or A2/A1
=k1A/B or A1/A2=B/ (kA-B) one or more combinations；Wherein, A is first value of electrical signals；A1It is described first
Value of electrical signals corresponding to environment light beam；A2The light source received for first beam sensor emits and through the light
Learn the value of electrical signals corresponding to the light beam after elements modulate；B is second value of electrical signals；K or k1For be greater than or equal to 1 it is normal
Amount.
In a preferred embodiment, deviation index is additionally provided in the control circuit, the control circuit is according to
The size of deviation index performs relevant control operation；The calculation formula of the deviation index is S=(L-Q)/L or S=(Q-
M)/M；Wherein, S is the deviation index, and the ranging from 0 ＜ S ＜ 1 of the deviation index S；Q is the judgment value；L and M
The lower limiting value and upper limit value in respectively described secure threshold section.In preferred embodiment, the luminous work(of the light source
Rate is controlled by the following formula：P=P0*(1-S)；Wherein, P0For the normal luminous power of the light source, P is passed through for the light source
Practical luminous power after adjustment.
In a preferred embodiment, the relevant control operation includes, and closes the light source or reduces the light source
Luminous power；Or it further includes and sends out relevant risk prompting.In a preferred embodiment, second beam sensor
Quantity is 2 or more, and for receiving the second environment light beam of multiple directions and seeking the mean value of its intensity, institute is captured to improve
State the accurate rate of second environment light beam.
The present invention also proposes a kind of method for monitoring optical element integrality, includes the following steps：Point bright light source；Open the
One beam sensor obtains light source transmitting and through the modulated light beam of optical element and first environment light beam, and the of generation
One value of electrical signals is simultaneously transmitted it in control circuit；It opens the second beam sensor, obtains second environment light beam, the of generation
Two value of electrical signals are simultaneously transmitted it in the control circuit；The control circuit receive and calculate first value of electrical signals with
Second value of electrical signals performs relevant control operation with the integrality that monitors the optical element and according to integrality.
In a preferred embodiment, the control circuit calculates first value of electrical signals and second value of electrical signals
Included with the integrality for monitoring the optical element：The control circuit presets reference formula and with reference to first value of electrical signals
Judgment value is calculated with the second value of electrical signals, and is judged by comparing the relationship in the judgment value and default secure threshold section
The integrality of the optical element；When the judgment value exceeds the secure threshold section, the control circuit performs correlation
Control operation.
In a preferred embodiment, the control circuit also is able to calculate the judgment value deviation secure threshold
The departure degree in section obtains deviation index, and controls the luminous power of the light source according to the deviation index or close light
Source.
The present invention proposes a kind of monitoring device again, including：Module is projected, contains light source, optical element and the first light beam
Sensor, for emitting patterned beam；Image Acquisition module, for acquiring target object after patterned beam irradiation
Light pattern；First beam sensor receives light source and emits and through the modulated light beam of the optical element and first
Environment light beam generates the first value of electrical signals；Ambient light sensor, for receiving the second electric signal of second environment light beam and generation
Value；Processor is used for：It receives the light pattern and calculates depth image and receive and calculate first value of electrical signals
With second value of electrical signals relevant control operation is performed with the integrality that monitors the optical element and according to integrality.
Compared with prior art, beneficial effects of the present invention have：
The device and method of the monitoring optical element integrality of the present invention, in addition to the longitudinal terminal surface in optical element is provided with
Outside first beam sensor, one or more second beam sensors are additionally provided with, obtained respectively by optical element longitudinal end
The beam energy intensity and environment beam energy intensity of face outgoing, and generate associated electrical signals and be transmitted in control circuit, it controls
Specific reference formula is preset in circuit processed, judgment value can be obtained, and by comparing the judgment value by logical operation
With the relationship in preset secure threshold section, to judge the integrality of DOE and carry out corresponding security control, so as to effective
Ground avoids interference of the too strong environment light beam to optical element Integrity Verification, and improves the security performance of optical element.
Description of the drawings
Fig. 1 is the projection module structure schematic diagram containing DOE monitoring functions in the prior art.
Fig. 2 is the projection module structure schematic diagram of the monitoring optical element integrality of an embodiment of the present invention.
Fig. 3 is the method flow diagram of the monitoring optical element integrality of an embodiment of the present invention.
Fig. 4 is the apparatus structure schematic diagram for monitoring DOE integralities in mobile phone depth camera of an embodiment of the present invention.
Specific embodiment
With reference to embodiment and compare attached drawing the present invention is described in further details.Wherein identical attached drawing
Label represents identical component, unless stated otherwise.It is emphasized that the description below is only exemplary, without
It is to limit the scope of the invention and its apply.
In addition, it is necessary to illustrate, the diagram provided in following embodiments only illustrates the base of the present invention in a schematic way
This design, only the display component related with the present invention rather than component count, shape and ruler during according to actual implementation in attached drawing
Very little drafting, shape, quantity and the ratio of each component can be a kind of random change during actual implementation, and its assembly layout form
It may also be increasingly complex.
Fig. 1 is the projection module structure schematic diagram containing DOE monitoring functions in the prior art.It projects module 100 and includes light
Source 10, DOE30, beam sensor 40 and control circuit 50, light source 10 further include in some embodiments for emitting light beam
Lens system 20.Wherein, the light beam that light source 10 emits is after lens system 20 is converged, collimated, directive DOE30；DOE30 will enter again
The beam diffraction penetrated is patterned beam, invests object space.Wherein, beam sensor 40 is arranged on the longitudinal terminal surface of DOE30
Near, for measuring the energy of light beam being emitted by DOE30 longitudinal terminal surfaces, to generate corresponding electric signal and be transmitted to control electricity
In road 50；Control circuit 50 by comparing, analyzing the relationship of the electric signal and preset electric signal secure threshold section, is sentenced
The integrality of disconnected DOE and the luminance for controlling light source 10.
It is understood that when ignoring environment light beam factor, the light beam that beam sensor 40 obtains mainly includes：High-order
One or more combinations in diffracted beam, Zero-order diffractive light beam, deflecting light beams.Specifically, since DOE30 is etched or is embossed with
Diffraction pattern, therefore on the surface of diffraction pattern, incident light beam can occur diffraction and/or refraction effect or also occur that
Reflection effect.Wherein, diffraction and/deflecting light beams can be with any angles in DOE30 internal transmissions.Again due to the density of DOE30
More than atmospheric density, therefore it is more than the diffracted beam of DOE30 beam exit critical angles there are fraction deflection and/or reflects light
Beam (only schematically showing some diffracted light beam and/or deflecting light beams with light beam 11) is retained in the inside of DOE30, and through excessive
Secondary total reflection is projected from the longitudinal terminal surface of DOE30, into the beam reception face of beam sensor 40.When DOE becomes
When shape, damage, the diffracting power of DOE can be changed, so as to change the energy intensity for the light beam being emitted from DOE longitudinal terminal surfaces, therefore
Based on the beam information that beam sensor obtains, the integrality of DOE theoretically can be effectively judged.
However, in practical applications, environment light beam factor be can not ignore, because environment light beam 60 can be by projective module
The beam exit transverse end surface of group 100 enters inside DOE30, and total reflection occurs inside DOE30 and (is only shown with environment light beam 61
Meaning property earth's surface is shown into the component environment light beam penetrated and be totally reflected in DOE30).Similarly, environment light beam 61 can also lead to
Multiple total reflection is crossed, is emitted from the longitudinal terminal surface of DOE30, into the beam reception face of beam sensor 40.In addition, at some
In the case of other, environment light beam 60 directly can also enter beam sensor from the gap between beam sensor 40 and DOE
In 40 beam reception face.It should be understood that the energy (especially in outdoor) of environment light beam 60 is often sent out much larger than light source 10
The energy for the light beam penetrated, therefore environment light beam 60 or environment light beam 61 are it is possible that the high-order that can directly bury in oblivion energy relative weak spreads out
Irradiating light beam/Zero-order diffractive light beam and/or deflecting light beams (light beam 11), can not directly, accurately so as to cause beam sensor 40
Judge the integrality of DOE.In order to make it easy to understand, the beam sensor 40 in projection module shown in FIG. 1 is defined as the first light
The environment light beam for entering the first beam sensor beam reception face is defined as first environment light beam by beam sensor.
In order to solve this problem, the present invention proposes the Integrity Verification device based on multiple beam sensors, passes through
Multiple beam sensors are set, receive and calculate the intensity information of multiple beam sensors to judge the integrality of DOE.
Fig. 2 is a kind of projection module structure schematic diagram according to embodiments of the present invention.In the embodiment, module 200 is projected
Including light source 10, lens system 20, DOE30, the first beam sensor 40, the second beam sensor 41 and control circuit 51.
Similarly, projection module 200 projects the mode of patterned beam and sets 40 mode of the first beam sensor and Fig. 1 projective modules
Group 100 is essentially identical, is not repeated to describe herein.Difference lies in projection module 200 is additionally provided with one or more second light beams
Sensor 41 for receiving environment light beam 60, is transmitted to by plain conductor in control circuit 51 with generating relevant electric signal.
In order to make it easy to understand, the environment light beam for entering 41 beam reception face of the second beam sensor is defined as second environment light beam.
Substantially, due to the projection module after encapsulation, the position of each optical element and first, second beam sensor
It puts and is relatively fixed, certain proportionate relationship can be met between second environment light beam and first environment light beam, control circuit 51 passes through
The collected luminous intensity of the proportionate relationship and first, second beam sensor institute, can be accurately judged to the complete of DOE30
Property, and accordingly control the luminance of light source 10.
Further, the optical projection module referred to according to embodiments of the present invention.Light source 10 is generally fixed in substrate, and
Transmitting light beam outward.Light source 10 can be vertical cavity surface emitting laser or edge-emitting laser, for emitting outward
The light beam of infrared, ultraviolet equiwavelength.In some embodiments, light source 10 can also be the VCSEL chips of two dimension, which includes
At least one VCSEL light source can project the infrared beam that wavelength is 830nm or 940nm, and can be according to correlation outward
Control circuit realizes at least two different luminances.VCSEL array chip can be that bare die can also be by encapsulation
The chip of reason, difference lies in bare die possesses smaller volume and thickness to the two, and encapsulating chip then has better stability
And it more easily connects.It should be noted that the light source employed in the present invention, it is laser light source not limit, because only
It is more than certain value to want the beam energy emitted by light source, and relevant optical element is once damage, and there may be safety problems.
Lens system 20 is generally embedded in inside microscope base, the light beam of the transmitting of light source 10 is received and converge, in some embodiments
In, collimated light beam is projected outward.Lens system 20 can only include a piece of lens, and it is identical and/or different can also to include multi-disc
The lens of curvature.The material of lens working 20 can be transparent glass substrate or resin substrate or plastic base.
DOE30 is process by glass or plastic, transparent substrate, etches or be embossed with diffraction pattern, is received, beam splitting is passed through
Light beam after the convergence of lens system 20, to project the patterned beam that Energy distribution is uniform, contrast is high outward.When light source 10 wraps
When including multiple sub-light sources, DOE30 is used to the pattern that sub-light source is arranged projecting patterning outward in a manner that mirror image is superimposed
Light beam.In some embodiments, DOE30 can include two pieces or two pieces or more of transparent substrate, each piece of transparent substrate
Incidence and/or outgoing beam surface etch or be embossed with diffraction pattern.
First beam sensor 40, the second beam sensor 41 can be photodiode, sensitive component, image sensing
One or more combinations in device.In a kind of embodiment, the first beam sensor 40 is arranged near the longitudinal terminal surface of DOE30,
And by the longitudinal terminal surface of its beam reception end face alignment DOE30, the light beam being emitted for reception by DOE30 longitudinal terminal surfaces.Into one
Step ground, can also be in the longitudinal terminal surface and/or beam sensor of DOE30 in order to improve the efficiency that beam sensor 40 captures light beam
One layer of optical glue is coated on 40 beam reception face.Second beam sensor 41 is arranged on the upper of the first beam sensor 40
Side, against the first beam sensor, beam reception face can be towards arbitrary orientation, for receiving current environment light beam.It can
With understanding, the second beam sensor 41 should be only used for receiving environment light beam, therefore, the light beam of the second beam sensor 41
Receiving plane should fully consider its reception to environment light beam, for example, as shown in Fig. 2, the light beam of the second beam sensor
Receiving plane can be set back to light source 10.In some equivalent embodiments, the second beam sensor 41, DOE30 and first
Beam sensor 40 can be arranged on same level baseline, and the beam reception of the second beam sensor 41 is set up
(setting upward here refers to that the receiving plane of the second beam sensor is set back to light source 10), more preferably to receive ambient light
Beam.In some other alternative embodiments, it is provided in 40 attachment of the first beam sensor or other feasible locations multiple
Second beam sensor 41, more accurately to monitor the intensity of the environment light beam of different orientations.Divide equally for example, can count
The energy intensity of environment light beam that multiple second beam sensors 41 monitor, to obtain one relatively closer to actual environment light
The mean value of beam intensity.It is to be appreciated that the set-up mode of above-mentioned first, second cited beam sensor is only used for illustrating
Explanation, it is impossible to be interpreted as limitation of the invention, specific set-up mode can make corresponding adjustment according to actual conditions.
Control circuit 51 includes, and logical operation module, light source control module or further includes CPU/ microcontrollers, register
Components are waited, are electrically connected by plain conductor with light source, the first beam sensor, the second beam sensor, can be realized simple
Logical operation, for example, plus subtract, the functions such as multiplication and division, and relevant control operational order is generated according to operation result, realize control
The function of related elements working condition, for example, closing light source or reducing the luminous power of light source.In some equivalent embodiments
In, logical operation module, light source control module can also use logical operation circuit, control circuit for light source to substitute.Control circuit
51 can be embedded by chip manufacture technique in the rigid PCB circuit board where light source 11, can also with independent module,
With the discrete setting of PCB circuit board.
First, second beam sensor is to the monitoring process and its judgment method of DOE integralities, vacation in order to better understand
If environment light beam 61 that is reverse incident and being totally reflected inside DOE, energy intensity A1；Light source emits and in DOE
The light beam 11 that portion is totally reflected, energy intensity A2；The environment light beam 60 that second beam sensor captures, energy is strong
It spends for B；The light beam that then the first beam sensor captures, gross energy A=A1+A2.In addition, environment light beam 60 and ambient light
Between beam 61, also meet certain proportionate relationship, i.e. B=k*A1.Usually, the specific value of k and the material of DOE, ambient light
The installation position in the incident angle of beam and first, second beam sensor beam reception face is related.It should be understood that due to throwing
Shadow module after packaging is accomplished, light source, lens system, DOE and first, second beam sensor position be to be relatively fixed
Constant, it can be considered that the value of k is a constant.It specifically,, can be in a kind of embodiment for the measure of k values
In the case where closing light source, first, second beam sensor is opened, measures the energy intensity A of environment light beam 61 respectively1With
The energy intensity B of environment light beam 60, and then determine the standard value k=B/A of k1。
Further, according to above-mentioned equation：A=A1+A2, B=kA1, it is known that A/B meets A/B=1/k+A2/(kA1), i.e.,
A2/A1=k*A/B-1.Since k values are constant, and A, B value can be measured directly by first, second beam sensor, therefore
One judgment value can be calculated, and can determine the first beam sensor according to the judgment value by formula (k*A/B-1)
Light beam (light beam 11), environment light beam (the environment light beam of proportion in the light beam captured between different light beams, i.e. light source transmitting
61) proportion between and its proportion for each accounting for total beam energy.In a kind of embodiment, the integrality of DOE can be by dividing
The proportion in the light beam that the first beam sensor is captured between different light beams is analysed to judge.It should be understood that when DOE keeps good
During the integrality got well, the proportion of each light beam may remain in relatively steady state；When DOE is damaged, due to DOE's
Diffracting power changes, and a degree of variation will necessarily occur for the proportion between each light beam.Further, safety is preset
Threshold interval [L, M] is deposited in the memory of control circuit, control circuit is by calculating, analytical judgment value (kA/B-1) with it is pre-
If the relationship between secure threshold section, and then judge the integrality of DOE.Specifically, when judgment value (kA/B-1) less than L or is sentenced
When disconnected value (kA/B-1) is more than M, assert that DOE is damaged.In a preferred embodiment, there is situation about damaging for DOE,
Control circuit generates relevant source control instruction by deviation index S=[L- (kA/B-1)]/L or S=[(kA/B-1)-M]/M,
To change the luminance of light source.Wherein, ranging from 0≤S≤1 of deviation index S.In a kind of embodiment, the reality of light source
Luminous power meets P=P0* the variation relation of (1-S), wherein P0Normal luminous power for light source.
According to above-mentioned equation：A=A1+A2, B=kA1, the light source transmitting that the first beam sensor is received can be extrapolated
The energy intensity A of light beam (light beam 11)2=A-B/k.In alternative another embodiment, control circuit can be directly light
The energy intensity (A-B/k) of beam 11 compares the [L of the judgment value and default secure threshold section as judgment value1,M1] pass
System, and calculate its deviation index S1=[L1-(A-B/k)]/L1Or S1=[(A-B/k)-M1]/M1, relevant control instruction is generated, is changed
The luminance of changing light.Wherein, deviation index S1Ranging from 0≤S1≤1.In a kind of embodiment, the reality of light source shines
Power meets P=P0*(1-S1) variation relation, wherein P0Normal luminous power for light source.
Alternatively, in another embodiment, control circuit can be directly by k1A/B compares this as judgment value
Judgment value and the [L in default secure threshold section2,M2] relationship, and calculate its deviation index S2=(L2-k1A/B)/L2Or S2=
(k1A/B-M2)/M2, relevant control instruction is generated, changes the luminance of light source.Wherein, deviation index S2Ranging from 0≤S2
≤1.In a kind of embodiment, the practical luminous power of light source meets P=P0*(1-S2) variation relation, wherein P0For light source
Normal luminous power.It should be understood that parameter k herein1It is in the above-described embodiments on the basis of judgment value (kA/B-1), does
The constant parameter that further approximate processing obtains, that is, think k1A/B is approximately equal to (kA/B-1).
Similarly, in some other embodiments, control circuit can be by equation A1/A2The value of=B/ (kA-B) is made
For judgment value, by analyzing the judgment value and default secure threshold section [L3,M3] relationship, and calculate its deviation index S3=
[L3-B/(kA-B)]/L3Or S3=[B/ (kA-B)-M3]/M3, relevant source control instruction is generated, to change the luminous shape of light source
State.Wherein, deviation index S3Ranging from 0≤S3≤1.In a kind of embodiment, the practical luminous power of light source meets P=P0*
(1-S3) variation relation, wherein P0Normal luminous power for light source.It should be understood that since the first beam sensor obtains
Light beam to be much smaller than the energy of the environment light beam that the second beam sensor obtains, i.e. the order of magnitude of B be significantly larger than the quantity of A
Grade, therefore, the result of calculation of B/ (kA-B) possesses the order of magnitude of bigger, can realize the amplification of signal.The benefit designed in this way
It is, on the one hand, possess the result of calculation of order of magnitude bigger, be conducive to control circuit and judge, analyze itself and default secure threshold area
Between relationship；On the other hand, the order of magnitude of bigger is also beneficial to control circuit and calculates its deviation index, more rational to generate
Light source control instructs.
Further, refering to Fig. 3, the optical projection module referred to according to embodiments of the present invention, to DOE integralities
Monitoring, judgment step include：Step 1 S01 opens optical projection module and puts bright light source.Step 2 S02 opens the first light beam
Sensor receives the light beam being emitted by DOE longitudinal terminal surfaces, and generates relevant electric signal M according to the energy intensity of the light beam,
It is transmitted in control circuit by plain conductor.Specifically, the first beam sensor can be opened after light stability shines,
Light source unlatching can be prior to or subsequent to, can also be opened together with light source.Step 3 S03 opens the second beam sensor, receives
Environment light beam, and relevant electric signal N is generated according to the energy intensity of the environment light beam, control is transmitted to by plain conductor
In circuit.Specifically, the second beam sensor can be opened together with the first beam sensor；It can also be prior to or after
One beam sensor is opened.Step 4 S04, the logical calculated module of control circuit calculate electric signal M according to preset formula
With the ratio between electric signal N, and using the ratio as judgment value.Step 5 S05, the analysis of control circuit simultaneously judge electric signal
Whether the ratio of M and electric signal N has exceeded preset secure threshold section；When the ratio of electric signal M and electric signal N is not crossed
During secure threshold section, assert that DOE keeps good integrality and two S02 of return to step, step 3 S03, i.e. first, second light
Beam sensor continues to keep the acquisition of beam information, and for generated associated electrical signals to be transmitted in control circuit；As electric signal M
When crossing secure threshold section with the ratio of electric signal N, assert that DOE can occur damaging and into step 6 S06, control
The light source control module of circuit deviates the degree in secure threshold section according to the ratio of electric signal M and electric signal N, and generation is relevant
Control instruction controls the luminance of light source, can specifically reduce the luminous power of light source or close light source.In some embodiments
In, control instruction can also include sending out relevant risk prompting, such as send out relevant warning sound or warning light.
Above-mentioned projection module can be integrated into smart machine to realize the function of such as 3D imagings, be used to implement to light
It can be the part for projecting module to learn the beam sensor that element is monitored, can also be independently of projection module, control electricity
Road is similary either a part for projection module can also be independent computing module.Fig. 4 is according to a kind of implementation of the present invention
The monitoring device schematic diagram of example, which can be mobile phone, tablet, computer etc..Monitoring device 300 includes, projective module
Group 100, Image Acquisition module 70, ambient light sensor 42, processor (not shown).Wherein, projection module 100 can be
Projection module in embodiment illustrated in fig. 1, control circuit therein are integrated in above-mentioned processor；Image Acquisition module
70, for the patterned beam that acquired projections module 100 is projected, the target after patterning light irradiation is provided for processor
The light pattern of object, so that processor obtains the depth information of target object；Ambient light sensor 42, for real-time monitoring of environmental
The strength signal of acquisition is transmitted in processor by the intensity of light beam, in some embodiments, the ambient light sensor, to locate
Manage brightness of the device according to screen on the strong and weak dynamic regulation device of environment light beam.
In a kind of embodiment, projection module 100, ambient light sensor 42 are arranged on same benchmark with Image Acquisition module 70
In plane, and it is connect with processor.For the Integrity Verification of DOE in projection module 100, method and process be similar to Fig. 2-
3 embodiments.Difference lies in 42 independent built-in of environment light beam monitoring device is in mobile phone, for directly acquiring the energy of environment light beam
Measure intensity.Assuming that projection module 100 beam sensor obtain beam energy intensity for A (including first environment light beam A1With
Light source emits through the modulated segment beam A of DOE2), the environment light beam that environment light beam monitoring device 42 obtains is B1, then B1=
k2A1, similar to the technical solution that Fig. 2-3 embodiments refer to, A2/A1=k2A/B1-1.Wherein, k2Value and environment Beam Monitoring
Installation position, the orientation angle of device 42 etc. are related, but it is understood that, when projection module 100, environment light beam monitoring device
After 42 fix, k2Value is relatively-stationary constant.Similarly, a constant k can also be defined from new3, assert A2/A1It is approximate
Equal to k3A/B1.Incorporating parametric A, B1And k3(or k2) value, it can realize the DOE of projection module being integrated in mobile phone depth camera
Integrity Verification, to avoid interference of the too strong environment light beam to DOE Integrity Verifications.
Traditional technical solution is different from, DOE Integrity Verification method advantage that the present invention refers to is：In addition to
The longitudinal terminal surface of DOE is provided with outside the first beam sensor, one or more second beam sensors is additionally provided with, to obtain respectively
The beam energy intensity being emitted by DOE longitudinal terminal surfaces and environment beam energy intensity are taken, and generates associated electrical signals and is transmitted to
In control circuit.Specific reference formula is preset in control circuit, can first, second light beam be obtained by logical operation and passed
Sensor generates the ratio of electric signal, and analyzes the relationship of the ratio and preset secure threshold section, judges that DOE's is complete
Property and control light source luminance.This method can have the interference for avoiding too strong environment light beam to DOE Integrity Verifications.This
Outside, this method can also be applied to the DOE Integrity Verifications of mobile phone depth camera.
It should be understood that the above-mentioned DOE Integrity Verification schemes referred to, can also extend to the complete of other optical elements
Property monitoring, such as：Applied to refraction optical element, reflective optical devices, diffraction optical element, polarization optical element, phase shift light
The Integrity Verification of element is learned, the Integrity Verification of its a variety of optical element combination module can also be applied to.Its mode of texturing,
It is not specifically limited herein, because being obvious for a person skilled in the art.
It may be noted that according to the needs of implementation, each step/component described in this application can be split as more multistep
The part operation of two or more step/components or step/component can be also combined into new step/component by suddenly/component,
To achieve the object of the present invention, the simple deformation to this case or transformation are belonged to, falls into the protection domain of this case.
The method of the above-mentioned monitoring optical element integrality of the present invention can be realized or be implemented as in hardware, firmware can
The software or computer code that are stored in recording medium (such as CD ROM, RAM, floppy disk, hard disk or magneto-optic disk) or by reality
The original storage now downloaded by network is in long-range recording medium or nonvolatile machine readable media and will be stored in local
Computer code in recording medium, so as to which method described here can be stored in using all-purpose computer, application specific processor
Or such software processing in the programmable or recording medium of specialized hardware (such as ASIC or FPGA).It is appreciated that meter
Calculation machine, processor, microprocessor controller or programmable hardware include to store or receiving the storage of software or computer code
Component (for example, RAM, ROM, flash memory etc.), when the software or computer code by computer, processor or hardware access and are held
During row, processing method described here is realized.In addition, when all-purpose computer access is used to implement the code for the processing being shown here
When, the execution of code is converted to all-purpose computer to perform the special purpose computer of processing being shown here.
The above content is a further detailed description of the present invention in conjunction with specific preferred embodiments, it is impossible to assert
The specific implementation of the present invention is confined to these explanations.For those skilled in the art to which the present invention belongs, it is not taking off
Under the premise of from present inventive concept, several equivalent substitute or obvious modifications can also be made, and performance or use is identical, all should
When being considered as belonging to protection scope of the present invention.
Claims (10)
1. a kind of device for monitoring optical element integrality, which is characterized in that including：
Light source emits light beam；
Optical element receives and modulates the light beam；
First beam sensor receives the modulated light beam of the optical element and first environment light beam, generates the first telecommunications
Number value；
Second beam sensor receives second environment light beam, generates the second value of electrical signals；
Control circuit receives and calculates first value of electrical signals with second value of electrical signals to monitor the optical element
Integrality and according to integrality perform relevant control operation.
2. the device of monitoring optical element integrality according to claim 1, which is characterized in that the control circuit calculates
First value of electrical signals is included with second value of electrical signals with monitoring the integrality of the optical element：
The control circuit presets reference formula and secure threshold section, according to the reference formula, the first value of electrical signals, second
Electric signal calculates judgment value, and judges the optics by comparing the judgment value and the relationship in the secure threshold section
The integrality of element, when the judgment value exceeds the secure threshold section, the control circuit performs relevant control operation.
3. the device of monitoring optical element integrality according to claim 2, which is characterized in that the reference formula, packet
Include A2/A1=kA/B-1 or A2=A-B/k or A2/A1=k1A/B or A1/A2=B/ (kA-B) one or more combinations；Its
In, A is first value of electrical signals；A1For the value of electrical signals corresponding to the first environment light beam；A2It is passed for first light beam
The light source that sensor receives emits and the value of electrical signals corresponding to through the modulated light beam of the optical element；B is described
Second value of electrical signals；K or k1To be greater than or equal to 1 constant.
4. the device of monitoring optical element integrality according to claim 2, which is characterized in that in the control circuit also
Equipped with deviation index, the control circuit performs relevant control operation according to the size of the deviation index；The deviation index
Calculation formula be S=(L-Q)/L or S=(Q-M)/M；Wherein, S is the deviation index, and the deviation index S
Ranging from 0 ＜ S ＜ 1；Q is the judgment value；L and M is respectively the lower limiting value and upper limit value in the secure threshold section.
5. the device of monitoring optical element integrality according to claim 4, which is characterized in that the luminous work(of the light source
Rate is controlled by the following formula：
P=P0*(1-S)
Wherein, P0For the normal luminous power of the light source, P is the practical luminous power after the light source is adjusted.
6. according to the device of any monitoring optical element integralities of claim 1-5, which is characterized in that the related control
System operation includes, and closes the light source or reduces the luminous power of the light source；Or it further includes and sends out relevant risk prompting.
7. according to the device of any monitoring optical element integralities of claim 1-5, which is characterized in that second light
The quantity of beam sensor is 2 or more, for receiving the second environment light beam of multiple directions and seeking the mean value of its intensity, with
Improve the accurate rate for capturing the second environment light beam.
A kind of 8. method for monitoring optical element integrality, which is characterized in that include the following steps：
Point bright light source；
The first beam sensor is opened, obtains the light source transmitting and through the modulated light beam of optical element and first environment light
Beam, the first value of electrical signals of generation are simultaneously transmitted it in control circuit；
The second beam sensor is opened, obtains second environment light beam, the second value of electrical signals of generation simultaneously transmits it to the control
In circuit processed；
The control circuit receives and calculates first value of electrical signals with second value of electrical signals to monitor the optics member
The integrality of part and according to integrality perform relevant control operation.
9. the method for monitoring optical element integrality according to claim 8, which is characterized in that the control circuit calculates
First value of electrical signals is included with second value of electrical signals with monitoring the integrality of the optical element：
The control circuit is preset with reference formula and secure threshold section, according to the reference formula, the first value of electrical signals,
Two electric signals calculate judgment value, and judge the light by comparing the judgment value and the relationship in the secure threshold section
The integrality of element is learned, when the judgment value exceeds the secure threshold section, the control circuit performs relevant control behaviour
Make.
10. a kind of monitoring device, which is characterized in that including：
Module is projected, containing light source, optical element and the first beam sensor, for emitting patterned beam；
Image Acquisition module, for acquiring light pattern of the target object after patterned beam irradiation；
First beam sensor receives light source and emits and through the modulated light beam of the optical element and first environment
Light beam generates the first value of electrical signals；
Ambient light sensor, for receiving the second value of electrical signals of second environment light beam and generation；
Processor is used for：
Receive the light pattern and calculate depth image and,
It receives and calculates first value of electrical signals with second value of electrical signals to monitor the integrality of the optical element, with
And relevant control operation is performed according to integrality.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810032397.0A CN108254158B (en) | 2018-01-12 | 2018-01-12 | A kind of device and method monitoring optical element integrality |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810032397.0A CN108254158B (en) | 2018-01-12 | 2018-01-12 | A kind of device and method monitoring optical element integrality |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108254158A true CN108254158A (en) | 2018-07-06 |
| CN108254158B CN108254158B (en) | 2019-09-24 |
Family
ID=62726371
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810032397.0A Active CN108254158B (en) | 2018-01-12 | 2018-01-12 | A kind of device and method monitoring optical element integrality |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108254158B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109269772A (en) * | 2018-09-13 | 2019-01-25 | 深圳阜时科技有限公司 | A kind of detection unit |
| CN109445231A (en) * | 2018-11-20 | 2019-03-08 | 深圳奥比中光科技有限公司 | A kind of depth camera and depth camera guard method |
| CN113167902A (en) * | 2018-12-04 | 2021-07-23 | ams国际有限公司 | Patterned illumination for three-dimensional imaging |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06130438A (en) * | 1992-10-20 | 1994-05-13 | Canon Inc | Light sensing device with diffraction grating and optical communication network |
| JP2000088760A (en) * | 1998-09-16 | 2000-03-31 | Sharp Corp | Work-inspecting device |
| CN1806168A (en) * | 2003-04-15 | 2006-07-19 | 医药及科学传感器公司 | System and method for attenuating the effect of ambient light on an optical sensor |
| CN201615890U (en) * | 2009-10-10 | 2010-10-27 | 曹丽娟 | Non-contact plate glass surface crack detection device |
| CN103018256A (en) * | 2012-12-13 | 2013-04-03 | 清华大学深圳研究生院 | LED (light-emitting diode) defect detecting system |
| CN204679412U (en) * | 2015-05-27 | 2015-09-30 | 深圳世绘林科技有限公司 | A kind of bias light compensation device for water quality monitoring |
| CN205005324U (en) * | 2015-10-22 | 2016-01-27 | 中国计量学院 | Eliminate photoelectricity receiving sensor background light influences's circuit |
| CN107223207A (en) * | 2015-02-09 | 2017-09-29 | 微软技术许可有限责任公司 | The quality evaluation of optical module |
-
2018
- 2018-01-12 CN CN201810032397.0A patent/CN108254158B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06130438A (en) * | 1992-10-20 | 1994-05-13 | Canon Inc | Light sensing device with diffraction grating and optical communication network |
| JP2000088760A (en) * | 1998-09-16 | 2000-03-31 | Sharp Corp | Work-inspecting device |
| CN1806168A (en) * | 2003-04-15 | 2006-07-19 | 医药及科学传感器公司 | System and method for attenuating the effect of ambient light on an optical sensor |
| CN201615890U (en) * | 2009-10-10 | 2010-10-27 | 曹丽娟 | Non-contact plate glass surface crack detection device |
| CN103018256A (en) * | 2012-12-13 | 2013-04-03 | 清华大学深圳研究生院 | LED (light-emitting diode) defect detecting system |
| CN107223207A (en) * | 2015-02-09 | 2017-09-29 | 微软技术许可有限责任公司 | The quality evaluation of optical module |
| CN204679412U (en) * | 2015-05-27 | 2015-09-30 | 深圳世绘林科技有限公司 | A kind of bias light compensation device for water quality monitoring |
| CN205005324U (en) * | 2015-10-22 | 2016-01-27 | 中国计量学院 | Eliminate photoelectricity receiving sensor background light influences's circuit |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109269772A (en) * | 2018-09-13 | 2019-01-25 | 深圳阜时科技有限公司 | A kind of detection unit |
| CN109445231A (en) * | 2018-11-20 | 2019-03-08 | 深圳奥比中光科技有限公司 | A kind of depth camera and depth camera guard method |
| CN109445231B (en) * | 2018-11-20 | 2022-03-29 | 奥比中光科技集团股份有限公司 | Depth camera and depth camera protection method |
| CN113167902A (en) * | 2018-12-04 | 2021-07-23 | ams国际有限公司 | Patterned illumination for three-dimensional imaging |
Also Published As
| Publication number | Publication date |
|---|---|
| CN108254158B (en) | 2019-09-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN207456385U (en) | Projection module with Beam Monitoring unit | |
| CN107783361B (en) | Optical projection device containing light beam monitoring unit | |
| CN108254158B (en) | A kind of device and method monitoring optical element integrality | |
| US9606237B2 (en) | Spatially coded structured light generator | |
| KR102568462B1 (en) | A detector for determining the position of at least one object | |
| CN106773489B (en) | A kind of optical projection apparatus and depth camera | |
| US20220373814A1 (en) | Optical component | |
| CN103091071B (en) | To the detection of the configuration change of illuminator | |
| CN111399245A (en) | Laser emission module and 3D imaging device | |
| US20230244014A1 (en) | Optical element and optical module | |
| US6265240B1 (en) | Method and apparatus for passively aligning components on semiconductor dies | |
| CN103368063B (en) | Laser module | |
| CN208432844U (en) | Projective module group, electrooptical device and electronic equipment | |
| CN210923959U (en) | Time-of-flight projector, time-of-flight depth module and electronic equipment | |
| CN108088656A (en) | A kind of monitoring device and method of optical element integrality | |
| CN110389357B (en) | Camera using light source with object eye protection function | |
| CN207798379U (en) | A kind of device of monitoring optical element integrality | |
| CN103557937A (en) | Laser power monitoring assembly, laser emission module with laser power monitoring assembly used and optical amplifier with laser power monitoring assembly used | |
| CN108121133A (en) | Optical projection apparatus and its control method | |
| CN103557936A (en) | Laser power monitoring assembly, laser emission module with laser power monitoring assembly used and optical amplifier with laser power monitoring assembly used | |
| CN112769039A (en) | Light source, emission module, optical sensing device and electronic equipment | |
| KR102053935B1 (en) | System and method for detecting cracks in an optical device of a beam projector module | |
| CN109445231B (en) | Depth camera and depth camera protection method | |
| US10184793B2 (en) | Measuring device and method for triangulation measurement | |
| WO2020130937A1 (en) | Light emitting modules with irregular and/or aperiodic conductive traces |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |