CN108233173A - Unsymmetric structure phase-shifted grating and DFB semiconductor laser - Google Patents

Unsymmetric structure phase-shifted grating and DFB semiconductor laser Download PDF

Info

Publication number
CN108233173A
CN108233173A CN201611201528.0A CN201611201528A CN108233173A CN 108233173 A CN108233173 A CN 108233173A CN 201611201528 A CN201611201528 A CN 201611201528A CN 108233173 A CN108233173 A CN 108233173A
Authority
CN
China
Prior art keywords
grating
phase
chirp
shift structure
shifted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN201611201528.0A
Other languages
Chinese (zh)
Inventor
郑俊守
孙雨舟
王祥忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Innolight Technology Suzhou Ltd
Original Assignee
Innolight Technology Suzhou Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Innolight Technology Suzhou Ltd filed Critical Innolight Technology Suzhou Ltd
Priority to CN201611201528.0A priority Critical patent/CN108233173A/en
Publication of CN108233173A publication Critical patent/CN108233173A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/12Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
    • H01S5/124Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers incorporating phase shifts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01SDEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00Semiconductor lasers
    • H01S5/10Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
    • H01S5/12Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region the resonator having a periodic structure, e.g. in distributed feedback [DFB] lasers
    • H01S5/125Distributed Bragg reflector [DBR] lasers

Abstract

This application discloses a kind of unsymmetric structure phase-shifted grating and DFB semiconductor lasers, the phase-shifted grating includes the phase-shift structure positioned at phase-shifted grating non-central location and the first grating and the second grating positioned at phase-shift structure both sides, the etching depth of first grating and the second grating is equal, and grating duty ratio is equal or the sum of grating duty ratio is equal to 1, the length of first grating and the second grating is different, neighbouring phase-shift structure both sides are the first chirp grating and the second chirp grating of certain length in first grating and the second grating, first chirp grating and the second chirp grating are symmetrical along phase-shift structure, and first chirp grating and the second chirp grating screen periods along being gradually changed towards phase-shift structure direction.The application can realize the asymmetric output of luminous power, improve the Output optical power of laser;Reduce the index modulation near phase-shift structure, effectively weaken the influence of effects of spatial, improve the single mode stability of laser.

Description

Unsymmetric structure phase-shifted grating and DFB semiconductor laser
Technical field
The application belongs to semiconductor laser field, and in particular to a kind of unsymmetric structure phase-shifted grating and DFB half Conductor laser.
Background technology
Distributed feed-back (DFB) semiconductor laser, has become essential light source in optical communication network, in DWDM and It plays an important role in the various wavelength-division multiplex systems such as CWDM.
For active optic communication device, either in optical communication network still in photon integrated chip, distributed feed-back (DFB) semiconductor laser is favored due to its good unimodular property.The DFB semiconductor laser of early stage, refractive index It is by periodically homogeneous modulation, this laser is in bragg wavelength both sides, and symmetrically there are two loss of resonator phases Same and minimum pattern, referred to as both of which degeneracy, if introducing a quarter-wave (λ/4) at the center of grating Phase shift, it is possible to eliminate bimodulus degeneracy.The great advantage of this method is that its mode threshold gain inequality is big, can realize true Positive dynamic single mode work, this is the effective ways for realizing single mode laser operation, is widely used in optical communication system.
In DFB semiconductor laser, in the case of same external Injection Current, needing to obtain as much as possible larger has Luminous power is imitated, improves the utilization rate to Injection Current.In order to increase effective Output optical power of DFB semiconductor laser, usually Unsymmetric structure is introduced into phase-shifted grating DFB semiconductor laser, common unsymmetric structure has:
1) the reflectivity size of two light output ends is asymmetric, i.e., highly reflecting films (HR) are plated on laser end face, another The mode of coating anti reflection film (AR) realizes the asymmetry of both ends of the surface reflectivity on end face, reaches change DFB semiconductor laser The purpose of the ratio between the output power of both ends of the surface;
2) grating phase shift is deviateed into filters center position, is biased to laser output.
It is that can plate highly reflecting films (HR) in laser end face if laser is discrete device for structure 1, Another end face plates the mode of anti-reflective film (AR) to distribute the output laser power of two end faces of laser, but highly reflecting films The influence of random phase can be brought, leads to laser mode hopping, the negative effect that random phase generates laser is unable to control, mesh Preceding not yet find effectively solves the method that random phase influences.In addition, for following photon integrated chip, i.e., various photonic devices The chip integrated by selection region growth technology or docking growing technology, can not be realized by the method for plated film The asymmetric output of Distributed Feedback Laser both ends of the surface laser.For structure 2, phase shift deviates center and is biased to laser output, though energy Improve the luminous power of output terminal, but phase shift deviates center can aggravate the influence of effects of spatial, reduce single mode stability and into Product rate.
Invention content
A kind of unsymmetric structure phase-shifted grating of the application, the phase-shifted grating are included positioned at phase-shifted grating non-central location The etching of phase-shift structure and the first grating and the second grating positioned at phase-shift structure both sides, first grating and the second grating is deep It spends that equal and grating duty ratio is equal or the sum of grating duty ratio is equal to 1, the length of first grating and the second grating is not Together, in the first grating and the second grating neighbouring phase-shift structure both sides be certain length the first chirp grating and the second chirped light Grid, the first chirp grating and the second chirp grating are symmetrical along phase-shift structure, and the first chirp grating and the second chirp grating Screen periods along being gradually changed towards phase-shift structure direction.
In one embodiment, the phase-shift phase of the phase-shift structure is 0, λ/4, λ/8 or output wavelength that λ, λ are phase-shifted grating.
In one embodiment, the duty ratio of first grating and the second grating is the arbitrary value and the two in the range of (0,1) Duty ratio is equal or the duty ratio of the first grating and the second grating is respectively in (0,0.5) and (0.5,1) range and sum of the two etc. In 1.
In one embodiment, the length ratio of first grating and the second grating meets 1<L1:L2≤ 3, L1And L2Respectively The length of first grating and the second grating.
In one embodiment, the length of first chirp grating and the second chirp grating is the grating of the first chirp grating Period edge is towards phase-shift structure direction by Λ1Gradually increase to Λ0, the screen periods of the second chirp grating are along towards phase-shift structure Direction is by Λ2Gradually increase to Λ0, wherein, Λ12≠Λ0
Another embodiment of the application provides a kind of DFB semiconductor laser, and the DFB semiconductor laser swashs including DFB Optical cavity and several epitaxial layers above and below DFB laser cavities, DFB laser cavities include the grating set gradually etching and prevent Layer, phase-shifted grating, grating coating, the phase-shifted grating include being located at the phase-shift structure of phase-shifted grating non-central location and be located at The etching depth of the first grating and the second grating of phase-shift structure both sides, first grating and the second grating is equal and grating Duty ratio is equal or the sum of grating duty ratio is equal to 1, and the length of first grating and the second grating is different, the first grating and the Neighbouring phase-shift structure both sides are the first chirp grating and the second chirp grating of certain length in two gratings, the first chirp grating and Second chirp grating is symmetrical along phase-shift structure, and the screen periods of the first chirp grating and the second chirp grating are along towards phase It moves structure direction to gradually change, the output power of DFB semiconductor laser both ends of the surface is unequal, to increase dfb semiconductor laser Effective Output optical power of device.
In one embodiment, the length ratio of first grating and the second grating meets 1<L1:L2≤ 3, L1And L2Respectively The length of first grating and the second grating.
In one embodiment, the length of first chirp grating and the second chirp grating is the grating of the first chirp grating Period edge is towards phase-shift structure direction by Λ1Gradually increase to Λ0, the screen periods of the second chirp grating are along towards phase-shift structure Direction is by Λ2Gradually increase to Λ0, wherein, Λ12≠Λ0
In one embodiment, the both sides of the face of the DFB semiconductor laser are coated with anti-reflective film.
In one embodiment, the DFB semiconductor laser is buried heterostructure type laser or ridge waveguide lasers.
Compared with prior art, the application has the advantages that:
The length of the first grating and the second grating is different in phase-shifted grating, to realize the different coefficients of coup, realizes luminous power Asymmetric output improves the Output optical power of laser;
Neighbouring phase-shift structure both sides are the chirp grating of certain length in first grating and the second grating, and screen periods are along direction Phase-shift structure direction gradually changes, and can reduce the index modulation near phase-shift structure, effectively weakens the shadow of effects of spatial It rings, improves the single mode stability of laser.
Description of the drawings
Fig. 1 is the structure diagram of unsymmetric structure phase-shifted grating in the prior art;
Fig. 2 is the curve graph of the grating coefficient of coup and duty cycle relationship;
Fig. 3 is the structure diagram of unsymmetric structure phase-shifted grating in the application first embodiment;
Fig. 4 is the dimensional structure diagram of DFB semiconductor laser in the application second embodiment;
Fig. 5 is the side structure schematic view of DFB semiconductor laser in the application second embodiment.
Specific embodiment
The application is described in detail below with reference to specific embodiment shown in the drawings.But these embodiments are simultaneously The application is not limited, structure that those of ordinary skill in the art are made according to these embodiments, method or functionally Transformation is all contained in the protection domain of the application.
In each diagram of the application, for the ease of illustration, structure or partial certain sizes can be relative to other knots Therefore structure or partial enlargement, are only used for the basic structure of the theme of diagram the application.
The term of the representation space relative position used herein such as "left", "right", " left side ", " right side " is for just A unit as shown in the drawings or feature are described relative to another unit or the relationship of feature in the purpose of explanation.It is empty Between the term of relative position can be intended to include different direction of the equipment in using or working other than orientation shown in figure. If for example, the equipment in figure is overturn, other will be located at by being described as being located at the unit of other units or feature " right side " Unit or feature " left side ".Therefore, exemplary term " right side " can include left side and both orientation of right side.Equipment can be with Other modes are directed(It is rotated by 90 ° or other directions), and correspondingly explain used herein and space correlation description.
Join shown in Fig. 1, introduce unsymmetric structure phase-shifted grating 10 ' of the prior art.The phase-shifted grating 10 ' is including being located at The phase-shift structure 11 ' of phase-shifted grating non-central location and the first grating 12 ' and the second grating 13 ' positioned at phase-shift structure both sides.
The first grating 12 ' and the second grating 13 ' are along the asymmetric setting of phase-shift structure 11 ', the first grating 12 ' in the prior art With the length L of the second grating 13 '1' and L2' different, phase-shift structure 11 ' is biased to the second grating 13 ' of right side laser output, i.e., L1’>L2', etching depth H1' and H2' identical, periods lambda1' and Λ2' equal, duty ratio γ1' and γ2' also equal.
Wherein, the duty ratio ratio shared in a cycle Λ for grating tooth width degree b, as shown in Figure 1, the first grating 12 ' duty ratio γ1’=b1’/Λ1', the duty ratio γ of the second grating 13 '2’=b2’/Λ2', wherein, grating tooth width degree b1’= b2', periods lambda1’=Λ2', and H1’=H2', therefore, the duty ratio of the duty ratio of the first grating 12 ' and the second grating 13 ' is equal, That is γ1’=γ2’。
Fig. 2 show the curve graph of the grating coefficient of coup and duty cycle relationship, it can be seen that the coefficient of coup and duty ratio have Correspondence, for pure index-coupled type DFB semiconductor laser, coefficient of coup κ is proportional to sin (π γ), wherein, κ For the coefficient of coup of phase-shifted grating, the power of grating feedback is represented, γ is the duty ratio of phase-shifted grating.In identical etching depth Under the conditions of, if the duty ratio γ of the first grating 12 ' and the second grating 13 '1' and γ2' equal, the first grating 12 ' and the second grating 13 ' coefficient of coup κ1' and κ2' also equal;In addition, under the conditions of identical etching depth, the first grating 12 ' and the second grating 13 ' duty ratio γ1' and γ2' meet γ1’+γ2During '=1, the coefficient of coup κ of the first grating 12 ' and the second grating 13 '1' and κ2' also equal.
Based on the DFB semiconductor laser of phase-shifted grating 10 ' in the prior art, in DFB semiconductor laser both ends of the surface all Coating anti reflection film(AR, reflectivity are less than 1%)Or not in the case of plated film, pass through the first grating 12 ' and the second grating 13 ' Length L1' and L2' different, two end face Output optical power P1' and P2' differ, and P1' < P2', it is defeated can effectively to increase right side Light power, but the phase-shift structure 11 ' deviateed behind center exacerbates influence of the effects of spatial to unimodular property, so as to The single mode stability for leading to the laser is poor.
Join the first embodiment for shown in Fig. 3, introducing the application unsymmetric structure phase-shifted grating 10.The phase-shifted grating 10 wraps Include the phase-shift structure 11 positioned at phase-shifted grating center and the first grating 12 and the second grating 13 positioned at phase-shift structure both sides. Phase-shift structure 11 is true phase shift, and phase-shift phase can be 0(Uniform grating), λ/4, λ/8 or λ, or other numerical value Phase-shift phase, wherein λ are the output wavelength of phase-shifted grating.The phase-shift structure of phase-shifted grating is true phase shift in the application, with taking Equivalent phase shift in sample grating is different, and the phase-shifted grating based on true phase shift is applied to the dfb semiconductor laser of unsymmetric structure During device, coupling efficiency is applied to the dfb semiconductor laser of unsymmetric structure than the sampled-grating based on equivalent phase shift in laser cavity The coupling efficiency of device is big, chamber length, and the DFB semiconductor laser modulating performance is more preferable.Preferably, the phase shift in present embodiment Amount is illustrated by taking λ/4 as an example.
First grating 12 and the second grating 13 along 11 asymmetric setting of phase-shift structure, the first grating 12 and the second grating 13 Etching depth H1And H2It is equal, duty ratio γ1And γ2Equal or duty ratio γ1、γ2The sum of be equal to 1, but the first grating 12 and the The length L of two gratings 131And L2Neighbouring 11 both sides of phase-shift structure are certain length in difference, the first grating 12 and the second grating 13 The first chirp grating 121 and the second chirp grating 131, the first chirp grating 121 and the second chirp grating 132 are along phase-shift structure Symmetrical, length is L0, and the grating period A of the first chirp grating 121 and the second chirp grating 131 is along towards phase It moves structure direction to gradually change, the first chirp grating 121 and the second chirp grating is removed in the first grating 12 and the second grating 13 Grating part other than 131, grating tooth and screen periods are equal.
Wherein, duty ratio is grating tooth width degree shared ratio in one cycle, as shown in figure 3, the first grating 12 Duty ratio γ1=b11, the duty ratio γ of the second grating 132=b22, γ in present embodiment12.In the first chirp grating In 121, screen periods edge is towards phase-shift structure direction by Λ1Gradually increase to Λ0, by designing grating tooth width degree, make the first Zhou Sing grating 121 duty ratio be equal to remaining grating section duty ratio;In second chirp grating 131, screen periods are along towards phase shift Structure direction is by Λ2Gradually increase to Λ0, by designing grating tooth width degree, the duty ratio of the second chirp grating 131 is made to be equal to it The duty ratio of remaining light grid section.
Since coefficient of coup κ is proportional to sin (π γ), wherein, κ is the coefficient of coup of phase-shifted grating, represents grating feedback Power, γ are the duty ratio of phase-shifted grating, meanwhile, coefficient of coup κ is also proportional to the etching depth H of grating.In present embodiment Under conditions of sin (π γ) and etching depth are equal, by length and the grating week for controlling the first grating 12 and the second grating 13 Phase, to realize two end face Output optical power P1And P2Differ.
Present invention contemplates that influence of the grating length to the grating coefficient of coup, therefore it need to ensure that the value of sin (π γ) is fixed It is worth and etching depth is equal, i.e. sin (π γ1)= sin(πγ2)、H1=H2.As seen from Figure 2, sin (π γ1)= sin(π γ2) including following two kinds of situations:
1), the first grating 12 duty ratio γ1With the duty ratio γ of the second grating 132Meet γ12, i.e. b11=b22, For example, γ12=0.5, in Λ12In the case of, the thickness b of the first grating 12 need to be controlled1Equal to the thickness of the second grating 13 Spend b2
2), the first grating 12 duty ratio γ1With the duty ratio γ of the second grating 132Meet γ12=1, i.e. b11+b2/ Λ2=1, for example, γ1=0.4, γ2=0.6, in Λ12In the case of, the thickness b of the first grating 12 need to be controlled1With the second light The thickness b of grid 132The sum of be equal to the first grating periods lambda1(That is the periods lambda of the second grating2);
Therefore, in above-mentioned sin (π γ1)= sin(πγ2) under conditions of, by designing the first grating of phase-shift structure both sides and The length of two gratings, you can the different coefficient of coup of phase-shift structure both sides grating is realized, using the dfb semiconductor of the phase-shifted grating Laser can realize that the Output optical power at both ends is different.
Preferably, in present embodiment the first grating 12 length L1More than the length L of the second grating 132, and meet 1< L1:L2≤ 3, in this way, the Output optical power P of 13 1 side end face of the second grating2More than the output light work(of 12 1 side end face of the first grating Rate P1, i.e. P2:P1> 1, by designing L1:L2Value can adjust the asymmetry of both sides Output optical power, increase effective output light Power.
Meanwhile the screen periods of the first grating 12 and the second grating 13 are non-constant in present embodiment.Specifically, first Grating 12 adjacent to 11 side of phase-shift structure be the first chirp grating 121, the length of L0, screen periods are along towards phase-shift structure side To by Λ1Gradually increase to Λ0, the first chirp grating 121 is constant for Λ with outer portion screen periods in the first grating 121;Second Grating 13 adjacent to 11 side of phase-shift structure be the second chirp grating 131, the length of L0, screen periods are along towards phase-shift structure side To by Λ2Gradually increase to Λ0, the second chirp grating 131 is constant for Λ with outer portion screen periods in the second grating 132;And this Λ in embodiment12< Λ0
Since phase-shift structure both sides introduce the chirp grating that screen periods gradually change, chirp grating edge in present embodiment Gradually increase towards phase-shift structure direction, index modulation is gradually reduced by two lateral phase shifts, so as to reduce near phase-shift structure Index modulation, effectively weaken effects of spatial influence.
It should be understood that in present embodiment the first grating 12 length L1With the length L of the second grating 132, the first Zhou It sings 121 and second chirp grating of grating, 131 length L0, the first chirp grating 121 and the second chirp grating 131 period profile can To be designed as needed, however it is not limited to the range protected in present embodiment.
By designing the length of the first grating of phase-shift structure both sides and the second grating in present embodiment, you can realize phase shift The grating different coefficient of coup in structure both sides can realize the output light at both ends using the DFB semiconductor laser of the phase-shifted grating Power is different, meanwhile, by introducing the chirp grating that the phase-shift structure both sides period gradually changes, can reduce near phase-shift structure Index modulation effectively weakens the influence of effects of spatial.
Join the second embodiment for shown in Fig. 4, Fig. 5, introducing the application DFB semiconductor laser 100.The dfb semiconductor Laser includes DFB laser cavities and several epitaxial layers above and below DFB laser cavities, and DFB laser cavities include setting successively Grating etching barrier layer 20, phase-shifted grating 10, the grating coating 30 put, the interior grating for playing modeling of DFB laser cavities is phase Shifted raster 10, wherein, phase-shifted grating 10 is identical with the unsymmetric structure phase-shifted grating 10 in second embodiment, herein not It is repeated again.The length of first grating and the second grating is different in phase-shifted grating 10, to realize the different coefficients of coup, DFB The Output optical power at semiconductor laser both ends is different, meanwhile, neighbouring phase-shift structure both sides one in the first grating and the second grating The chirp grating of measured length can reduce the index modulation near phase-shift structure, effectively weaken the influence of effects of spatial.
Formation of the DFB semiconductor laser above and below DFB laser cavities has several epitaxial layers, such as present embodiment In, the epitaxial layer below DFB laser cavities includes substrate 31, buffer layer 32, lower limit layer 33, multiple quantum well layer 34 and upper limiting layer Epitaxial layer above 35, DFB laser cavities includes vallum etching barrier layer 41, vallum layer 42 and ohmic contact layer 43, in addition, DFB Semiconductor laser further includes the N electrode 51 below substrate and the P electrode above ohmic contact layer 43 52.
The epitaxial material of epitaxial layer be III-V race's compound semiconductor material and IV-VI race's compound semiconductor material, such as InGaAsP/InP, InAlGaAs/InP, AlGaAs/GaAs, InGaAs/InGaP, GaAsP/InGaP etc..
DFB semiconductor laser in present embodiment is according only to the length for needing design phase-shift structure or so two sections of gratings And screen periods, and the techniques such as DFB semiconductor laser epitaxial structure and electrode preparation are same as the prior art, below to this The preparation process of DFB semiconductor laser is described in detail in embodiment.
Pass through MOCVD epitaxy technology, in N-shaped InP substrate 31, epitaxial growth successively:
N-shaped InP is as buffer layer 32;
InAlGaAs graded indexs detach lower limit layer 33;
InAlGaAs multiple quantum well layers 34;
InAlGaAs graded indexs detach upper limiting layer 35;
P-type InP gratings etching barrier layer 20;
P-type InGaAsP phase-shifted gratings 10;
P-type InP gratings coating 30;
P-type InGaAsP vallums etching barrier layer 41;
P-type InP vallums layer 42, it is preferable that illustrated by taking double ditch vallums as an example in present embodiment;
InGaAsP ohmic contact layers 43.
Finally P electrode 52 and N electrode 51 are respectively formed with 31 back side of InP substrate on InGaAsP ohmic contact layers 43.
In above-mentioned 100 both ends of the surface of DFB semiconductor laser all coating anti reflection films(AR, reflectivity are less than 1%)In the case of, Two end face Output optical power P1And P2It differs, you can realize the asymmetry of Output optical power, increase DFB semiconductor laser Effective Output optical power.The chirp grating gradually changed additionally by screen periods are introduced, can reduce the folding near phase-shift structure Rate modulation is penetrated, effectively weakens the influence of effects of spatial.
DFB semiconductor laser in present embodiment is illustrated by taking ridge waveguide structure as an example, in other embodiment party Buried heterostructure type structure can also be designed in formula, no longer citing is described in detail herein.
It should be understood that DFB semiconductor laser is applied to unsymmetric structure phase-shifted grating in the above embodiment For illustrate, such DFB semiconductor laser can both ends of the surface carry out plated film.Photon collection in other embodiments Into chip, such as detector array, laser array, modulator array and multiplexer photonic device, such photonic device are logical Cross selection region growth technology or dock growing technology prepare, in integrating process, can not by plate highly reflecting films or Anti-reflective film increases effective Output optical power, can be applied to height by the phase-shifted grating of the coefficient of coup asymmetric in the application In the integrated photon integrated chip of degree, to improve the effective Output optical power in end face.
The application is had the advantages that by the above embodiment:
The length of the first grating and the second grating is different in phase-shifted grating, to realize the different coefficients of coup, realizes luminous power Asymmetric output improves the Output optical power of laser;
Neighbouring phase-shift structure both sides are the chirp grating of certain length in first grating and the second grating, and screen periods are along direction Phase-shift structure direction gradually changes, and can reduce the index modulation near phase-shift structure, effectively weakens the shadow of effects of spatial It rings, improves the single mode stability of laser.
It should be appreciated that although this specification is described in terms of embodiments, but not each embodiment only includes one A independent technical solution, this description of the specification is merely for the sake of clarity, and those skilled in the art should will say For bright book as an entirety, the technical solution in each embodiment may also be suitably combined to form those skilled in the art can With the other embodiment of understanding.
Those listed above it is a series of be described in detail only for the application feasibility embodiment specifically Bright, they are not limiting the protection domain of the application, all equivalent implementations made without departing from the application skill spirit Or change should be included within the protection domain of the application.

Claims (10)

1. a kind of unsymmetric structure phase-shifted grating, which is characterized in that the phase-shifted grating includes being located at the non-central position of phase-shifted grating The quarter of the phase-shift structure and the first grating and the second grating positioned at phase-shift structure both sides put, first grating and the second grating It loses deep equality and grating duty ratio is equal or the sum of grating duty ratio is equal to 1, the length of first grating and the second grating Neighbouring phase-shift structure both sides are the first chirp grating and the second chirped light of certain length in difference, the first grating and the second grating Grid, the first chirp grating and the second chirp grating are symmetrical along phase-shift structure, and the first chirp grating and the second chirp grating Screen periods along being gradually changed towards phase-shift structure direction.
2. unsymmetric structure phase-shifted grating according to claim 1, which is characterized in that the phase-shift phase of the phase-shift structure is 0th, λ/4, λ/8 or λ, λ are the output wavelength of phase-shifted grating.
3. unsymmetric structure phase-shifted grating according to claim 1, which is characterized in that first grating and the second grating Duty ratio is the arbitrary value in the range of (0,1) and the two duty ratio is equal or the duty score of the first grating and the second grating It is not equal to 1 in (0,0.5) and (0.5,1) range and sum of the two.
4. the unsymmetric structure phase-shifted grating according to any one of claim 1 ~ 3, which is characterized in that first grating Meet 1 with the length ratio of the second grating<L1:L2≤ 3, L1And L2The respectively length of the first grating and the second grating.
5. unsymmetric structure phase-shifted grating according to claim 4, which is characterized in that first chirp grating and second The length of chirp grating is ^, the screen periods of the first chirp grating along towards phase-shift structure direction by Λ1Gradually increase to Λ0, The screen periods edge of second chirp grating is towards phase-shift structure direction by Λ2Gradually increase to Λ0, wherein, Λ12≠Λ0
6. a kind of DFB semiconductor laser, the DFB semiconductor laser includes DFB laser cavities and above DFB laser cavity With several epitaxial layers of lower section, DFB laser cavities include the grating etching barrier layer, phase-shifted grating, the grating coating that set gradually, It is characterized in that, the phase-shifted grating is included positioned at the phase-shift structure of phase-shifted grating non-central location and positioned at phase-shift structure both sides The first grating and the second grating, the etching depth of first grating and the second grating is equal and grating duty ratio is equal or For the sum of grating duty ratio equal to 1, the length of first grating and the second grating is different, neighbouring in the first grating and the second grating Phase-shift structure both sides are the first chirp grating and the second chirp grating of certain length, the first chirp grating and the second chirp grating It is symmetrical along phase-shift structure, and the screen periods of the first chirp grating and the second chirp grating along towards phase-shift structure direction by Gradual change, the output power of DFB semiconductor laser both ends of the surface is unequal, to increase effective output of DFB semiconductor laser Luminous power.
7. DFB semiconductor laser according to claim 6, which is characterized in that first grating and the second grating Length ratio meets 1<L1:L2≤ 3, L1And L2The respectively length of the first grating and the second grating.
8. DFB semiconductor laser according to claim 7, which is characterized in that first chirp grating and the 2nd Zhou The length of grating of singing is, the screen periods of the first chirp grating along towards phase-shift structure direction by Λ1Gradually increase to Λ0, second The screen periods edge of chirp grating is towards phase-shift structure direction by Λ2Gradually increase to Λ0, wherein, Λ12≠Λ0
9. DFB semiconductor laser according to claim 6, which is characterized in that the both sides of the DFB semiconductor laser End face is coated with anti-reflective film.
10. DFB semiconductor laser according to claim 6, which is characterized in that the DFB semiconductor laser is covers Bury heterojunction type laser or ridge waveguide lasers.
CN201611201528.0A 2016-12-22 2016-12-22 Unsymmetric structure phase-shifted grating and DFB semiconductor laser Withdrawn CN108233173A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611201528.0A CN108233173A (en) 2016-12-22 2016-12-22 Unsymmetric structure phase-shifted grating and DFB semiconductor laser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611201528.0A CN108233173A (en) 2016-12-22 2016-12-22 Unsymmetric structure phase-shifted grating and DFB semiconductor laser

Publications (1)

Publication Number Publication Date
CN108233173A true CN108233173A (en) 2018-06-29

Family

ID=62657179

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201611201528.0A Withdrawn CN108233173A (en) 2016-12-22 2016-12-22 Unsymmetric structure phase-shifted grating and DFB semiconductor laser

Country Status (1)

Country Link
CN (1) CN108233173A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108768526A (en) * 2018-07-16 2018-11-06 深圳太辰光通信股份有限公司 Production method, direction tracing device and the passive network of bidirectional optical fiber grating
WO2020014814A1 (en) * 2018-07-16 2020-01-23 深圳太辰光通信股份有限公司 Method for manufacturing bidirectional fiber grating, bidirectional tracker, and passive network
CN111600198A (en) * 2020-05-26 2020-08-28 陕西源杰半导体技术有限公司 Ultra-high-power laser for communication and preparation method thereof
TWI822178B (en) * 2022-07-13 2023-11-11 華星光通科技股份有限公司 A method for manufacturing distributed feedback laser light emitting structure

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103337788A (en) * 2013-04-24 2013-10-02 南京大学 DFB semiconductor laser based on asymmetric structure of reconstruction-equivalent chirp and preparation method thereof
CN103762500A (en) * 2013-11-27 2014-04-30 南京大学 Asymmetric equivalent apodization sampling optical grating and laser based on reconstruction-equivalent chirp
CN104917051A (en) * 2015-05-29 2015-09-16 江苏微宁科技有限公司 Distributed coupling coefficient DFB laser based on reconstruction-equivalent chirp technology and array thereof

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103337788A (en) * 2013-04-24 2013-10-02 南京大学 DFB semiconductor laser based on asymmetric structure of reconstruction-equivalent chirp and preparation method thereof
CN103762500A (en) * 2013-11-27 2014-04-30 南京大学 Asymmetric equivalent apodization sampling optical grating and laser based on reconstruction-equivalent chirp
CN104917051A (en) * 2015-05-29 2015-09-16 江苏微宁科技有限公司 Distributed coupling coefficient DFB laser based on reconstruction-equivalent chirp technology and array thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
郑俊守: ""基于重构等效啁啾技术的取样光栅在DFB半导体激光器及其阵列中的应用"", 《万方学位论文》 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108768526A (en) * 2018-07-16 2018-11-06 深圳太辰光通信股份有限公司 Production method, direction tracing device and the passive network of bidirectional optical fiber grating
WO2020014814A1 (en) * 2018-07-16 2020-01-23 深圳太辰光通信股份有限公司 Method for manufacturing bidirectional fiber grating, bidirectional tracker, and passive network
CN111600198A (en) * 2020-05-26 2020-08-28 陕西源杰半导体技术有限公司 Ultra-high-power laser for communication and preparation method thereof
TWI822178B (en) * 2022-07-13 2023-11-11 華星光通科技股份有限公司 A method for manufacturing distributed feedback laser light emitting structure

Similar Documents

Publication Publication Date Title
US8705583B2 (en) Semiconductor laser
JP2001308451A (en) Semiconductor light emitting element
CN108233173A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser
JP2967737B2 (en) Optical semiconductor device and its manufacturing method
JP2008294124A (en) Optical semiconductor element
JPH1075009A (en) Optical semiconductor device and its manufacture
JP2004273993A (en) Wavelength variable distribution reflecting type semiconductor laser device
JP6425631B2 (en) Semiconductor laser and optical integrated light source having the same
JP2017107958A (en) Semiconductor laser
CN105981239A (en) Integrated semiconductor laser element and semiconductor laser module
US20090267195A1 (en) Semiconductor element and method for manufacturing semiconductor element
CN109616870A (en) The mutual injection type narrow linewidth semiconductor laser of single-chip integration
CN113140965B (en) Semiconductor laser epitaxial structure and preparation method thereof
US20040013144A1 (en) Complex-coupled distributed feedback semiconductor laser device
JP2016219614A (en) Semiconductor laser
CN108233172A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser
CN107332105A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser
US20240030686A1 (en) Light-Emitting Semiconductor Chip and Method for Manufacturing Light-Emitting Semiconductor Chip
US6552358B2 (en) High power single mode laser and method of fabrication
CN107516817A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser
CN107623250B (en) Short-cavity long-surface emitting laser and manufacturing method thereof
CN107332104A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser
CN110112650B (en) High-power semiconductor chip and preparation method thereof
JP2013168513A (en) Semiconductor laser and optical semiconductor device
CN108233171A (en) Unsymmetric structure phase-shifted grating and DFB semiconductor laser

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
WW01 Invention patent application withdrawn after publication
WW01 Invention patent application withdrawn after publication

Application publication date: 20180629