CN108229223A - A kind of electronic product prevents disassembling the method and device of operation - Google Patents
A kind of electronic product prevents disassembling the method and device of operation Download PDFInfo
- Publication number
- CN108229223A CN108229223A CN201611160067.7A CN201611160067A CN108229223A CN 108229223 A CN108229223 A CN 108229223A CN 201611160067 A CN201611160067 A CN 201611160067A CN 108229223 A CN108229223 A CN 108229223A
- Authority
- CN
- China
- Prior art keywords
- temperature
- electronic product
- test point
- operating status
- preset
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/86—Secure or tamper-resistant housings
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3013—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system is an embedded system, i.e. a combination of hardware and software dedicated to perform a certain function in mobile devices, printers, automotive or aircraft systems
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3058—Monitoring arrangements for monitoring environmental properties or parameters of the computing system or of the computing system component, e.g. monitoring of power, currents, temperature, humidity, position, vibrations
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computing Systems (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- Computer Security & Cryptography (AREA)
- Software Systems (AREA)
- Mathematical Physics (AREA)
- Power Sources (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
The present invention relates to the method and devices that electronic device field more particularly to a kind of electronic product prevent disassembling operation, and this method is, when determining that electronic product is in operating status, detect the temperature of preset each test point in electronic product;Respectively according to the normal temperature of preset each test point, judge whether the temperature of each test point is abnormal;Wherein, normal temperature is to be in temperature when not disassembling operating status in electronic product;When determining that the situation of the temperature anomaly of each test point meets preset protection condition; judgement electronic product, which is in, disassembles operating status; and protect electronic product using preset safeguard procedures; in this way; it is based only upon the existing component of electronic product itself; it does not need to increase any additional support circuit; without dependent on any extraneous physical link or internal special hardware circuit; according only to the temperature change of different test points; it can determine whether electronic product is in using software algorithm and disassemble operating status; it realizes simply, reduces cost of implementation.
Description
Technical field
The present invention relates to the method and devices that electronic device field more particularly to a kind of electronic product prevent disassembling operation.
Background technology
After one new electronic product listing, the opponent that often constitutes competition is disassembled to obtain the technology of this aspect
Analysis, therefore, manufacturer is often in order to guard one's interest, it is undesirable to which rival can disassemble and test easily the production of oneself
Product, it will usually set certain safeguard procedures.For example, shell linked switch, product detect in place, with monitoring system communication signal
Confirm etc., once the protection condition of setting is triggered, then according to product itself control algolithm, determine that product is in misoperation shape
State can take self-lock protection.
In the prior art, prevent that two categories below can be divided by disassembling operation method:1) must connect by the physics other than product
Offer reference signal is connect, for example, monitoring, in place to detect;2) reference signal is provided by the hardware circuit of itself, for example, casing
Linked switch, it is in place to detect connection signal etc..
Anti- disassemble that running technology needs to rely on extraneous physical connection or itself is special it can be seen that of the prior art
Hardware circuit, the method for this foundation that must rely on extraneous input condition, increases cost.It is meanwhile of the prior art
It is anti-to disassemble operation method, the communication normal signal of false detection signal in place or vacation can also be inputted, is cheated, so as to
Operating status is disassembled so that electronic product cannot be distinguished and whether be in.
Invention content
The embodiment of the present invention provides the method and device that a kind of electronic product prevents disassembling operation, further to reduce electronics production
Product prevent disassembling the cost of running technology.
Specific technical solution provided in an embodiment of the present invention is as follows:
A kind of method that electronic product prevents disassembling operation, including:
When determining that electronic product is in operating status, the temperature of preset each test point in the electronic product is detected;
Respectively according to the normal temperature of preset each test point, judge whether the temperature of each test point is different
Often;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product;
When determining that the situation of the temperature anomaly of each test point meets preset protection condition, the electronics production is judged
Product, which are in, disassembles operating status, and protect the electronic product using preset safeguard procedures.
Preferably, the normal temperature of each test point, is to be in not disassemble operating status according to the electronic product
When the temperature set that obtains determine.
Preferably, the temperature set, is by actually detected acquisition;Or,
The temperature set is to calculate acquisition according to preset operating parameter and preset operation mode, wherein, it is described
Operating parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
Preferably, judge whether the temperature of each test point is abnormal, specifically includes:
The temperature of each test point detected and the normal temperature of each test point are compared respectively,
And when determining the temperature of any one the and/or multiple test points detected and any one and/or multiple test points
When normal temperature differs, the temperature anomaly of any one and/or multiple test points is determined.
Preferably, when determining that the situation of the temperature anomaly of each test point meets preset protection condition, institute is judged
Electronic product is stated in operating status is disassembled, is specifically included:
If only there are one test points, it is determined that during the temperature anomaly of one test point, judge at the electronic product
In disassembling operating status;Or,
When the number of the test point of temperature exception reaches the first predetermined threshold value, judge that the electronic product is in and disassemble
Operating status;Or,
The number of the test point of temperature exception reaches the second predetermined threshold value, and the number of the test point of temperature anomaly reaches
To the second predetermined threshold value number be not less than third predetermined threshold value when, judge the electronic product be in disassemble operating status.
Preferably, the preset safeguard procedures are following any one or combination:Self-locking shutdown protection limits product
Service ability or function.
A kind of electronic product prevents disassembling the device of operation, including:
Detection unit during for determining that electronic product is in operating status, detects preset each in the electronic product
The temperature of test point;
Judging unit, for according to the normal temperature of preset each test point, judging each detection respectively
Whether the temperature of point is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product
Degree;
Processing unit, when the situation for determining the temperature anomaly of each test point meets preset protection condition,
Judge that the electronic product is in and disassemble operating status, and the electronic product is protected using preset safeguard procedures.
Preferably, the normal temperature of each test point, is to be in not disassemble operating status according to the electronic product
When the temperature set that obtains determine.
Preferably, the temperature set, is by actually detected acquisition;Or,
The temperature set is to calculate acquisition according to preset operating parameter and preset operation mode, wherein, it is described
Operating parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
Preferably, when judging whether the temperature of each test point is abnormal, judging unit is specifically used for:
The temperature of each test point detected and the normal temperature of each test point are compared respectively,
And when determining the temperature of any one the and/or multiple test points detected and any one and/or multiple test points
When normal temperature differs, the temperature anomaly of any one and/or multiple test points is determined.
Preferably, when determining that the situation of the temperature anomaly of each test point meets preset protection condition, institute is judged
Electronic product is stated in when disassembling operating status, processing unit is specifically used for:
If only there are one test points, it is determined that during the temperature anomaly of one test point, judge at the electronic product
In disassembling operating status;Or,
When the number of the test point of temperature exception reaches the first predetermined threshold value, judge that the electronic product is in and disassemble
Operating status;Or,
The number of the test point of temperature exception reaches the second predetermined threshold value, and the number of the test point of temperature anomaly reaches
To the second predetermined threshold value number be not less than third predetermined threshold value when, judge the electronic product be in disassemble operating status.
Preferably, the preset safeguard procedures are following any one or combination:Self-locking shutdown protection, limitation electronics production
The service ability or function of product.
In the embodiment of the present invention, when determining that electronic product is in operating status, detect preset each in the electronic product
The temperature of a test point;Respectively according to the normal temperature of preset each test point, the temperature of each test point is judged
Whether degree is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product;It determines
When the situation of the temperature anomaly of each test point meets preset protection condition, judge that the electronic product is in and disassemble fortune
Row state, and the electronic product is protected using preset safeguard procedures, in this way, being based only upon the existing portion of electronic product itself
Part does not need to increase any additional support circuit, without dependent on any extraneous physical link or internal special hardware electricity
Road only according to the temperature change of different test points, can determine whether electronic product is in using software algorithm and disassemble operation
State, and then realize the anti-protection for disassembling operation to electronic product, also, temperature data is nor special newly-increased parameter,
But the work parameter of electronic product inherently, realization difficulty is further reduced, reduces cost of implementation.
Description of the drawings
Fig. 1 is in the embodiment of the present invention, and electronic product prevents disassembling the method flow diagram of operation;
Fig. 2 is the mapping relations schematic diagram between varying environment temperature and the temperature of test point in the embodiment of the present invention;
Fig. 3 is the appearance diagram of certain electronic product in the embodiment of the present invention;
Fig. 4 is the internal structure schematic diagram of certain electronic product in the embodiment of the present invention;
Fig. 5 is in the embodiment of the present invention, and in the case where not disassembling operating status, the internal temperature emulation of certain electronic product is distributed
Figure;
Fig. 6 is in the embodiment of the present invention, and the upper cover of certain electronic product opens the structure diagram of half;
Fig. 7 is in the embodiment of the present invention, and under the operating status for opening half in upper cover, the internal temperature of certain electronic product is imitated
True distribution map;
Fig. 8 is the completely open structure diagram of upper cover of certain electronic product in the embodiment of the present invention;
Fig. 9 is in the embodiment of the present invention, and under the completely open operating status of upper cover, the internal temperature of certain electronic product is imitated
True distribution map;
Figure 10 be the embodiment of the present invention in, in the case where not disassembling operating status, the side anemobiagraph of certain electronic product;
Figure 11 is in the embodiment of the present invention, and in the case where not disassembling operating status, the tail portion air outlet wind speed of certain electronic product is imitated
True figure;
Figure 12 be the embodiment of the present invention in, upper cover open half operating status under, the side wind speed of certain electronic product
Figure;
Figure 13 be the embodiment of the present invention in, upper cover open half operating status under, the tail portion outlet air of certain electronic product
One's intention as revealed in what one says speed analogous diagram;
Figure 14 be the embodiment of the present invention in, under the completely open operating status of upper cover, the side wind speed of certain electronic product
Figure;
Figure 15 be the embodiment of the present invention in, under the completely open operating status of upper cover, the tail portion outlet air of certain electronic product
One's intention as revealed in what one says speed analogous diagram;
Figure 16 is in the embodiment of the present invention, and electronic product prevents disassembling the apparatus structure schematic diagram of operation.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, is not whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
In order to further reduce the cost that electronic product prevents disassembling running technology, in the embodiment of the present invention, electronics production is obtained
The temperature of preset each test point in product, and be according to preset each test point in electronic product and do not disassemble operating status
Under temperature, judge whether the temperature of each test point abnormal, determine electronic product whether in disassembling operating status, and then adopt
The electronic product is protected with preset safeguard procedures, needs not rely upon the connection of any external physical, it is special hard without increasing
Part designs, and reduces cost.
The present invention program is described in detail below by specific embodiment, certainly, the present invention is not limited to following realities
Apply example.
What deserves to be explained is in practice, the anti-operation method of disassembling of electronic product is generally required dependent on extraneous physics company
It connects or hardware circuit that itself is special, increases cost, without additionally increasing cost, calculated based on software in present example
Method is in disassembling operating status, and then realize the guarantor to electronic product to judge electronic product in operating status is not disassembled
Shield, therefore, the electronic product in the embodiment of the present invention need to have following basic condition:
1) software control is included, pure hardware is not suitable for.
2) electronic product has apparent casing, air-cooled naturally cold unlimited.
3) temperature at element or inner space position in environment temperature and machine is needed to refer to when electronic product is run to be transported
Row management.
As shown in fig.1, in the embodiment of the present invention, electronic product prevents disassembling that the idiographic flow of the method for operation is as follows:
Step 100:When determining that electronic product is in operating status, preset each test point in the electronic product is detected
Temperature.
In practice, electronic product is not in the case where disassembling operating condition, in environment temperature (for example, being set as A points) and electronic product
Mapping relations between the temperature of each element or each space position (for example, wherein any one is set as B points) must be
Know, for example, when A points are 25 degree, the temperature range of B points is 30 degree~90 degree, that is to say, that be 25 in A points during stable operation
When spending, the value one of the temperature of B points is scheduled between 30 degree~90 degree, for example, the temperature for detecting B points is 50 degree, then in electronics
When all constant, the temperature of B points will not change for the service condition of product, workload.And when electronic product is disassembled
When, i.e. the casing of electronic product is run after being opened, then the radiating condition of the electronic product will significantly change, for example, A points
At 25 degree, the temperature range of B points is likely to that 30 degree~70 degree will be become, i.e. the temperature of B points will change, exact, for
Each determining operating status, B point temperature can completely change in casing with when casing removal, for example, when having casing, B
Point temperature is known 50 degree, removes casing, and B points temperature becomes for 60 degree.I.e. under determining operating status, B point temperature
No longer it is known 50 degree.
In this way, in the embodiment of the present invention, it is possible to according to the temperature of currently detected B points and the positive room temperature of the B points of record
Whether degree is consistent, so as to judge that electronic product whether in operating status is disassembled, can further take corresponding safeguard procedures.
Wherein, above-mentioned preset each test point, can temperature measuring point or use of the electronic product when running in itself
The temperature measuring point that family increases newly according to demand in the embodiment of the present invention, is not defined, improves the flexibility of thermometric.
Also, the number of preset each test point,, can be according to reality also without limiting in the embodiment of the present invention
Situation is set, and can be one, or and it is multiple, preferably, disassembling shape to further improve follow-up determine whether
The accuracy of state, using the existing test point of multiple electronic products itself, for example, using 4 test points, respectively A points, B points,
C points, D points.
This is because if in case of a fault, electronic product has been not normally functioning, whether no matter opening shell, it is then
It is no to be disassembled, it is likely that the temperature of B points does not change at this time, but as long as still there is the C points of partial duty in electronic product, then examines
Measuring the temperature of C points can also have any different, it is possible to be judged according to the temperature change of C points, therefore, set multiple detections
Point can improve judgement precision.
Certainly, if whole circuits do not work in electronic product, electronic product also need not just be protected, this
In the case of can not consider in the embodiment of the present invention.
Step 110:Respectively according to the normal temperature of preset each test point, the temperature of each test point is judged
Whether degree is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product.
When performing step 110, specifically include:
First, the normal temperature of above-mentioned each test point is determined respectively.
Wherein, the normal temperature of above-mentioned preset each test point is to be in not disassemble operating status according to electronic product
When the temperature set that obtains determine.
Wherein, the acquisition pattern of above-mentioned temperature set, can there is following two modes:
First way:Pass through actually detected acquisition.
That is, in the embodiment of the present invention, it can be when the casing of electronic product not be dismantled, by actually detected, directly
It obtains under the determining operating status of a certain kind, the normal temperature of each test point.
For example, as shown in fig.2, A1, A2 ..., An is different environment temperature, such as respectively 25 degree, and -40 spend ...
45 degree, B1, B2 ..., the B3 value ranges for the normal temperature of B points at different ambient temperatures.
In the embodiment of the present invention, the normal temperature of each test point can be obtained, and preserve acquisition beforehand through actually detected
B points normal temperature at different ambient temperatures, for example, under a certain determining operating status, B1 is 40 when A1 is 25 degree
Degree, when A2 is spent for -40, B2 is 10 degree etc., if in this way, when to get current environment temperature be 25 degree, it is possible to directly determining B
The normal temperature of point is 40 degree.
The second way:Acquisition is calculated according to preset operating parameter and preset operation mode.
Wherein, the operating parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
Certainly, in the embodiment of the present invention, it is not limited in above-mentioned several operating parameters, can be selected according to actual conditions
It selects and sets.
For example, the mapping pass that operating parameter is environment temperature, operation mode is environment temperature and the normal temperature of test point
System, then, specially:According to the current environment temperature and preset environment temperature detected and the positive room temperature of each test point
What the mapping relations of degree obtained.
According to above-mentioned first way it is found that the data in this temperature set by actually detected acquisition preserved are got over
It is more, it is possible to more accurately determine the normal temperature of each test point, but institute's data to be saved will be very much, in practice,
General disassemble usually all carries out indoors, therefore, need to only preserve the normal temperature of corresponding B points when A points are 5~30 degree i.e.
It can.But in this case, the data of preservation cannot include the value condition of all A, accordingly it is also possible to according to having protected certainly
The data deposited, statistics obtain its changing rule, obtain the mapping relations of environment temperature and the normal temperature of test point, and then according to
The mapping relations extrapolate the normal temperature of B points at different ambient temperatures.
In another example the mapping for the normal temperature that operating parameter is loading condition, operation mode is loading condition and test point
Relationship, then, specially:According to the mapping of the current loading condition and preset loading condition detected and each test point
What relationship obtained.
That is, electronic product can also be preserved in different loads, and the normal temperature of each test point, example
When such as, for semi-load, the normal temperature of each test point;For full load, the normal temperature of each test point, and then according to determining
The mapping relations of loading condition and test point, to extrapolate the normal temperature of test point.
Then, judge whether the temperature of above-mentioned each test point is abnormal, specially:
The temperature of the above-mentioned each test point detected and the normal temperature of above-mentioned each test point are compared respectively,
And when determining the temperature of any one the and/or multiple test points detected and above-mentioned any one and/or multiple test points
When normal temperature differs, the temperature anomaly of above-mentioned any one and/or multiple test points is determined.
What deserves to be explained is the normal temperature and the temperature of currently detected test point that are compared, it should be except
It is obtained under the same conditions except the condition whether electronic equipment is disassembled, to prevent from judging by accident.
Further, the variation of the temperature of each test point can be detected and sentenced by the software of electronic product itself
It is disconnected, it can also be judged by the way that the data of the temperature of each test point are reported to monitoring by monitoring.
Step 120:When determining that the situation of the temperature anomaly of each test point meets preset protection condition, institute is judged
It states electronic product and is in and disassemble operating status, and the electronic product is protected using preset safeguard procedures.
When performing step 120, specifically include:
First, when determining that the situation of the temperature anomaly of above-mentioned each test point meets preset protection condition, judgement is above-mentioned
Electronic product is in and disassembles operating status, is specifically divided into following several situations:
The first situation:If only there are one test points, it is determined that during the temperature anomaly of said one test point, judgement is above-mentioned
Electronic product is in and disassembles operating status.
The second situation:When the number of the test point of temperature exception reaches the first predetermined threshold value, above-mentioned electronics is judged
Product is in and disassembles operating status.
The third situation:The number of the test point of temperature exception reaches the second predetermined threshold value, and the inspection of temperature anomaly
When the number that the number of measuring point reaches the second predetermined threshold value is not less than third predetermined threshold value, judges that above-mentioned electronic product is in and disassemble
Operating status.
For example, there is 4 test points, respectively A points, B points, C points, D points continuously have detected 8 times, and the second predetermined threshold value is 2,
Third predetermined threshold value is 5, then at the end of this 8 times are detected, if during at least 5 times detections, the test point of temperature anomaly has reached 2
It is a, then judge that electronic product is in and disassemble operating status.
Wherein, the first predetermined threshold value, the second predetermined threshold value, the value of third predetermined threshold value, in the embodiment of the present invention, not
It is defined, can be set according to actual demand, improve electronic product and prevent disassembling the intelligent and flexible of operation method
Property.
Then, above-mentioned electronic product is protected using preset safeguard procedures.
Wherein, above-mentioned preset safeguard procedures are following any one or combination:Self-locking shutdown protection (locks the electronics
Product), limitation electronic product service ability or function.
For example, if electronic product is in steady operational status, there are 4 test points, respectively A points, B points, C points, D points, often
It detects the temperature of one-time detection point at any time, continuously has detected 10 days, and the second predetermined threshold value is 3, third predetermined threshold value
It is 5, then in each detection, if the test point of temperature anomaly has reached 3, current detection is denoted as 1 time, if having remembered at least 5
It is secondary, then judge that electronic product is in and disassemble operating status, i.e., the electronic product is in and opens shell operating status, then is protected using self-locking
Shield locks the electronic product.
In another example if electronic product, which is in, frequently switches on machine state, there are 4 test points, respectively A points, B points, C points, D
Point is more than certain time, such as during half an hour in each be switched on, and detects the temperature of primary each test point, and continuous detect 5 times is opened
Machine, the second predetermined threshold value are 2, third predetermined threshold value 3, then in each detection, if the test point of temperature anomaly has reached 2
It is a, and in this 5 times detections, the number for having the test point of 2 temperature anomaly has reached 3 times, then judges that electronic product is in
Operating status is disassembled, i.e., the electronic product is in and opens shell operating status, then using self-lock protection, locks the electronic product.
Further description is made to above-described embodiment using a specific application scenarios below.Using electronic product as
Power supply electronic product, there is a shell of closure, for wind-cooling heat dissipating, illustrates.
As shown in fig.3, the appearance diagram for the electronic product, as shown in fig.4, the internal junction for the electronic product
Structure schematic diagram.
In practice, electronic product at runtime, can adjust the electronic product according to the temperature of tetra- test points of A, B, C, D
Operating status, for example, output current limits, output power limit etc., it is ensured that the electronic product is in safe work state, no
Electronic product can be caused to damage because of high temperature.
1) as shown in fig.5, being the electronic product in the case where not disassembling operating status (i.e. under the complete operating status of shell)
Internal temperature emulation distribution map.
2) as shown in fig.6, under same service condition, for example, environment temperature is constant, workload is constant, defeated
It is constant etc. to enter output signal, the upper cover of the electronic product is opened to the structure diagram of half;
As shown in fig.7, for be powered operation when, when the upper cover of the electronic product opens half, obtained internal temperature
Emulate distribution map.
3) as shown in fig.8, under same service condition, for example, environment temperature is constant, workload is constant, defeated
It is constant etc. to enter output signal, by the completely open schematic diagram of the upper cover of the electronic product;
As shown in fig.9, for the operation that is powered, when the upper cover of the electronic product is opened completely, obtained internal temperature is imitated
True distribution map.
From above-mentioned analogous diagram, it is known that, refering to shown in table 1, in above-mentioned A, B, C, D three kinds, emulated tetra-
The temperature change of test point, wherein, A points are environment temperature, and 3 points of B, C, D is the electronic product internal element or space position.
Temperature change of the 1 each test point of table under different operating statuses
(degree Celsius) | A | B | C | D |
Shell is complete | 25 | 115 | 124 | 124 |
Upper cover opens half | 25 | 110 | 124 | 134 |
Upper cover is opened completely | 25 | 140 | 191 | 199 |
The temperature difference | / | 5/25 | 0/67 | 10/75 |
From above-mentioned Fig. 5, Fig. 7, Fig. 9 and table 1 it is found that whether complete enclosure and incomplete shell, i.e. electronic product are disassembled,
The temperature of 3 test points is substantially change inside electronic product, in this way, can be readily possible to detect this variation and then sentence
Whether the disconnected electronic product, which is in, is opened shell operating status.
Further, by emulation it is found that the main reason for causing temperatures above difference, which is air duct change, causes device
The wind speed of surrounding changes, referring particularly to Figure 10-Figure 15.
Wherein, 1) as shown in fig.10, being the electricity in the case where not disassembling operating status (i.e. under the complete operating status of shell)
The side anemobiagraph of sub- product;
It is the electronic product in the case where not disassembling operating status (i.e. under the complete operating status of shell) refering to shown in Figure 11
Tail portion air outlet wind speed analogous diagram.
2) it is the side anemobiagraph of the electronic product when the upper cover of the electronic product opens half refering to shown in Figure 12;
It is the tail portion outlet air one's intention as revealed in what one says of the electronic product when the upper cover of the electronic product opens half refering to shown in Figure 13
Fast analogous diagram.
3) it is the side anemobiagraph of the electronic product when the upper cover of the electronic product is opened completely refering to shown in Figure 14;
Refering to shown in Figure 15, when the upper cover of the electronic product is opened completely, the tail portion air outlet wind speed of the electronic product
Analogous diagram.
From Figure 10-Figure 15 it is found that whether complete enclosure and incomplete shell, i.e. electronic product are disassembled, in electronic product
The wind speed of 3 test points in portion is also substantially change, and therefore, in the embodiment of the present invention, is not limited according to electronic product
In the temperature change of each test point judge whether electronic product is disassembled, can also according to test point each in electronic product
Wind speed change and judged, the method in the embodiment of the present invention can also be used, also belong to the embodiment of the present invention to be protected
The range of shield.
Based on above-described embodiment, refering to shown in Figure 16, in the embodiment of the present invention, electronic product prevents disassembling the device of operation,
It specifically includes:
Detection unit 20 during for determining that electronic product is in operating status, detects preset each in the electronic product
The temperature of a test point;
Judging unit 21, for according to the normal temperature of preset each test point, judging each inspection respectively
Whether the temperature of measuring point is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product
Degree;
Processing unit 22, the situation for determining the temperature anomaly of each test point meet preset protection condition
When, judge that the electronic product is in and disassemble operating status, and the electronic product is protected using preset safeguard procedures.
Preferably, the normal temperature of each test point, is to be in not disassemble operating status according to the electronic product
When the temperature set that obtains determine.
Preferably, the temperature set, is by actually detected acquisition;Or,
The temperature set is to calculate acquisition according to preset operating parameter and preset operation mode, wherein, it is described
Operating parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
Preferably, when judging whether the temperature of each test point is abnormal, judging unit 21 is specifically used for:
The temperature of each test point detected and the normal temperature of each test point are compared respectively,
And when determining the temperature of any one the and/or multiple test points detected and any one and/or multiple test points
When normal temperature differs, the temperature anomaly of any one and/or multiple test points is determined.
Preferably, when determining that the situation of the temperature anomaly of each test point meets preset protection condition, institute is judged
Electronic product is stated in when disassembling operating status, processing unit 22 is specifically used for:
If only there are one test points, it is determined that during the temperature anomaly of one test point, judge at the electronic product
In disassembling operating status;Or,
When the number of the test point of temperature exception reaches the first predetermined threshold value, judge that the electronic product is in and disassemble
Operating status;Or,
The number of the test point of temperature exception reaches the second predetermined threshold value, and the number of the test point of temperature anomaly reaches
To the second predetermined threshold value number be not less than third predetermined threshold value when, judge the electronic product be in disassemble operating status.
Preferably, the preset safeguard procedures are following any one or combination:Self-locking shutdown protection, limitation electronics production
The service ability or function of product.
In conclusion in the embodiment of the present invention, when determining that electronic product is in operating status, detect in the electronic product
The temperature of preset each test point;Respectively according to the normal temperature of preset each test point, each inspection is judged
Whether the temperature of measuring point is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product
Degree;When determining that the situation of the temperature anomaly of each test point meets preset protection condition, judge at the electronic product
In disassembling operating status, and the electronic product is protected using preset safeguard procedures, in this way, it is existing in itself to be based only upon electronic product
Some components do not need to increase any additional support circuit, without dependent on any extraneous physical link or internal special
Hardware circuit only according to the temperature change of different test points, can determine whether electronic product is in using software algorithm and tear open
Operating status is solved, and then realizes the anti-protection for disassembling operation to electronic product, also, temperature data is nor specially newly-increased
Parameter, but the work parameter of electronic product inherently, further reduced realization difficulty, reduce cost of implementation.
It should be understood by those skilled in the art that, the embodiment of the present invention can be provided as method, system or computer program
Product.Therefore, the reality in terms of complete hardware embodiment, complete software embodiment or combination software and hardware can be used in the present invention
Apply the form of example.Moreover, the computer for wherein including computer usable program code in one or more can be used in the present invention
The computer program production that usable storage medium is implemented on (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.)
The form of product.
The present invention be with reference to according to the method for the embodiment of the present invention, the flow of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that it can be realized by computer program instructions every first-class in flowchart and/or the block diagram
The combination of flow and/or box in journey and/or box and flowchart and/or the block diagram.These computer programs can be provided
The processor of all-purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices is instructed to produce
A raw machine so that the instruction performed by computer or the processor of other programmable data processing devices is generated for real
The device of function specified in present one flow of flow chart or one box of multiple flows and/or block diagram or multiple boxes.
These computer program instructions, which may also be stored in, can guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works so that the instruction generation being stored in the computer-readable memory includes referring to
Enable the manufacture of device, the command device realize in one flow of flow chart or multiple flows and/or one box of block diagram or
The function of being specified in multiple boxes.
These computer program instructions can be also loaded into computer or other programmable data processing devices so that counted
Series of operation steps are performed on calculation machine or other programmable devices to generate computer implemented processing, so as in computer or
The instruction offer performed on other programmable devices is used to implement in one flow of flow chart or multiple flows and/or block diagram one
The step of function of being specified in a box or multiple boxes.
Although preferred embodiments of the present invention have been described, but those skilled in the art once know basic creation
Property concept, then additional changes and modifications may be made to these embodiments.So appended claims be intended to be construed to include it is excellent
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, those skilled in the art can carry out the embodiment of the present invention various modification and variations without departing from this hair
The spirit and scope of bright embodiment.In this way, if these modifications and variations of the embodiment of the present invention belong to the claims in the present invention
And its within the scope of equivalent technologies, then the present invention is also intended to include these modifications and variations.
Claims (12)
1. a kind of method that electronic product prevents disassembling operation, which is characterized in that including:
When determining that electronic product is in operating status, the temperature of preset each test point in the electronic product is detected;
Respectively according to the normal temperature of preset each test point, judge whether the temperature of each test point is abnormal;
Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product;
When determining that the situation of the temperature anomaly of each test point meets preset protection condition, judge at the electronic product
In disassembling operating status, and the electronic product is protected using preset safeguard procedures.
2. the method as described in claim 1, which is characterized in that the normal temperature of each test point is according to the electricity
Sub- product is in what the temperature set do not disassembled and obtained during operating status determined.
3. method as claimed in claim 2, which is characterized in that the temperature set is by actually detected acquisition;Or,
The temperature set is to calculate acquisition according to preset operating parameter and preset operation mode, wherein, the operation
Parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
4. method as claimed in claim 2, which is characterized in that judge whether the temperature of each test point is abnormal, specifically
Including:
The temperature of each test point detected and the normal temperature of each test point are compared respectively, and worked as
Determine the normal of the temperature of any one the and/or multiple test points detected and any one and/or multiple test points
When temperature differs, the temperature anomaly of any one and/or multiple test points is determined.
5. the method as described in claim 1,2,3 or 4, which is characterized in that determine the temperature anomaly of each test point
When situation meets preset protection condition, judge that the electronic product is in and disassemble operating status, specifically include:
If only there are one test points, it is determined that during the temperature anomaly of one test point, judge that the electronic product is in and tear open
Solve operating status;Or,
When the number of the test point of temperature exception reaches the first predetermined threshold value, judge that the electronic product is in and disassemble operation
State;Or,
The number of the test point of temperature exception reaches the second predetermined threshold value, and the number of the test point of temperature anomaly reaches
When the number of two predetermined threshold values is not less than third predetermined threshold value, judges that the electronic product is in and disassemble operating status.
6. method as claimed in claim 5, which is characterized in that the preset safeguard procedures are following any one or group
It closes:Self-locking shutdown protection, the service ability or function of limitation electronic product.
7. a kind of electronic product prevents disassembling the device of operation, which is characterized in that including:
Detection unit during for determining that electronic product is in operating status, detects preset each detection in the electronic product
The temperature of point;
Judging unit, for according to the normal temperature of preset each test point, judging each test point respectively
Whether temperature is abnormal;Wherein, the normal temperature is to be in temperature when not disassembling operating status in the electronic product;
Processing unit, when the situation for determining the temperature anomaly of each test point meets preset protection condition, judgement
The electronic product, which is in, disassembles operating status, and protect the electronic product using preset safeguard procedures.
8. device as claimed in claim 7, which is characterized in that the normal temperature of each test point is according to the electricity
Sub- product is in what the temperature set do not disassembled and obtained during operating status determined.
9. device as claimed in claim 8, which is characterized in that the temperature set is by actually detected acquisition;Or,
The temperature set is to calculate acquisition according to preset operating parameter and preset operation mode, wherein, the operation
Parameter is following any one or arbitrary combination:Environment temperature, loading condition, input condition.
10. device as claimed in claim 8, which is characterized in that when judging whether the temperature of each test point is abnormal, sentence
Disconnected unit is specifically used for:
The temperature of the test point detected and the normal temperature of the test point are compared respectively, and when determining detection
To any one either the temperature of multiple test points and the normal temperature of any one or multiple test points differ
When, the temperature anomaly of determining any one test point.
11. the device as described in claim 7,8,9 or 10, which is characterized in that determine the temperature anomaly of each test point
Situation when meeting preset protection condition, judge that the electronic product is in when disassembling operating status, processing unit is specifically used
In:
If only there are one test points, it is determined that during the temperature anomaly of one test point, judge that the electronic product is in and tear open
Solve operating status;Or,
When the number of the test point of temperature exception reaches the first predetermined threshold value, judge that the electronic product is in and disassemble operation
State;Or,
The number of the test point of temperature exception reaches the second predetermined threshold value, and the number of the test point of temperature anomaly reaches
When the number of two predetermined threshold values is not less than third predetermined threshold value, judges that the electronic product is in and disassemble operating status.
12. device as claimed in claim 11, which is characterized in that the preset safeguard procedures are following any one or group
It closes:Self-locking shutdown protection, the service ability or function of limitation electronic product.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611160067.7A CN108229223B (en) | 2016-12-15 | 2016-12-15 | Method and device for preventing electronic product from being disassembled |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201611160067.7A CN108229223B (en) | 2016-12-15 | 2016-12-15 | Method and device for preventing electronic product from being disassembled |
Publications (2)
Publication Number | Publication Date |
---|---|
CN108229223A true CN108229223A (en) | 2018-06-29 |
CN108229223B CN108229223B (en) | 2021-07-13 |
Family
ID=62651396
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611160067.7A Active CN108229223B (en) | 2016-12-15 | 2016-12-15 | Method and device for preventing electronic product from being disassembled |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN108229223B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111750907A (en) * | 2019-03-27 | 2020-10-09 | 北京外号信息技术有限公司 | Anti-cracking method for electronic product and corresponding electronic product |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080204218A1 (en) * | 2007-02-28 | 2008-08-28 | Apple Inc. | Event recorder for portable media device |
CN102597967A (en) * | 2009-08-06 | 2012-07-18 | 苹果公司 | System and method for accessing diagnostic information |
CN103270517A (en) * | 2011-01-14 | 2013-08-28 | 西门子公司 | Method and device for providing a cryptographic key for a field device |
CN103778392A (en) * | 2012-12-13 | 2014-05-07 | 深圳市证通电子股份有限公司 | Data safety device and temperature sensing circuit thereof |
US8896455B2 (en) * | 2011-08-18 | 2014-11-25 | Microsoft Corporation | Intrusion detection and communication |
CN204795913U (en) * | 2015-07-18 | 2015-11-18 | 柴俊沙 | Protection device is prevented destroying by circuit |
US9818004B1 (en) * | 2016-08-31 | 2017-11-14 | Square, Inc. | Anti-tamper circuit with internal local oscillator |
-
2016
- 2016-12-15 CN CN201611160067.7A patent/CN108229223B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20080204218A1 (en) * | 2007-02-28 | 2008-08-28 | Apple Inc. | Event recorder for portable media device |
CN102597967A (en) * | 2009-08-06 | 2012-07-18 | 苹果公司 | System and method for accessing diagnostic information |
CN103270517A (en) * | 2011-01-14 | 2013-08-28 | 西门子公司 | Method and device for providing a cryptographic key for a field device |
US8896455B2 (en) * | 2011-08-18 | 2014-11-25 | Microsoft Corporation | Intrusion detection and communication |
CN103778392A (en) * | 2012-12-13 | 2014-05-07 | 深圳市证通电子股份有限公司 | Data safety device and temperature sensing circuit thereof |
CN204795913U (en) * | 2015-07-18 | 2015-11-18 | 柴俊沙 | Protection device is prevented destroying by circuit |
US9818004B1 (en) * | 2016-08-31 | 2017-11-14 | Square, Inc. | Anti-tamper circuit with internal local oscillator |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111750907A (en) * | 2019-03-27 | 2020-10-09 | 北京外号信息技术有限公司 | Anti-cracking method for electronic product and corresponding electronic product |
Also Published As
Publication number | Publication date |
---|---|
CN108229223B (en) | 2021-07-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US8155922B2 (en) | Electrical device cooling efficiency monitoring | |
US10108168B2 (en) | Industrial control system smart hardware monitoring | |
KR101355585B1 (en) | Apparatus and method for diagnosing deterioration of distributing board | |
WO2018004598A1 (en) | Apparatus for power distribution, environment monitoring and fire protection for rack-mounted equipment | |
MX2014003067A (en) | Intelligent cyberphysical intrusion detection and prevention systems and methods for industrial control systems. | |
Sheikh et al. | Cyber attack and fault identification of hvac system in building management systems | |
WO2015130439A1 (en) | Contingency-based load shedding | |
Ashok et al. | Testbed-based performance evaluation of attack resilient control for AGC | |
CA2927826C (en) | Industrial control system smart hardware monitoring | |
CN108229223A (en) | A kind of electronic product prevents disassembling the method and device of operation | |
Azzam et al. | Grounds for suspicion: Physics-based early warnings for stealthy attacks on industrial control systems | |
WO2019240020A1 (en) | Improper communication detector, improper communication detection method, and manufacturing system | |
Krotofil et al. | Are you threatening my hazards? | |
US20210397702A1 (en) | Risk analyzer and risk analysis method | |
CN105281295A (en) | Method and safety device for protecting an electric motor and/or a work device coupled to it against malfunction | |
Meliopoulos et al. | Data attack detection and command authentication via cyber-physical comodeling | |
CN114279072B (en) | Operation control method and device, electronic equipment and storage medium | |
CN105074833A (en) | Device and method for detecting unauthorised manipulations of the system state of an open-loop and closed-loop control unit of a nuclear plant | |
Lingasubramanian et al. | Study of hardware trojans based security vulnerabilities in cyber physical systems | |
CN108736455B (en) | Relay protection simulation method and system | |
CN110307619A (en) | Method and device for accurately testing unit equipment, unit equipment and storage medium | |
US20220317670A1 (en) | Server rack predictive maintenance method | |
CN203561984U (en) | Equipment status monitoring device | |
CN109697151A (en) | A kind of method and system that the anti-short circuit of server dorsulum is burnt | |
CN115729333A (en) | Cooling control method, controller and server |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20201010 Address after: Ohio, USA Applicant after: Dimension Corp. Address before: 1510 Kansas Avenue, Loren, Ohio, USA Applicant before: Emerson Energy Systems, AB |
|
GR01 | Patent grant | ||
GR01 | Patent grant |