CN108226729B - High-precision film electric weak point tester - Google Patents
High-precision film electric weak point tester Download PDFInfo
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- CN108226729B CN108226729B CN201810104242.3A CN201810104242A CN108226729B CN 108226729 B CN108226729 B CN 108226729B CN 201810104242 A CN201810104242 A CN 201810104242A CN 108226729 B CN108226729 B CN 108226729B
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- electrode
- copper
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- copper roll
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Abstract
The invention relates to a high-precision film electric weakness tester which comprises a rack (1), a copper roller (2) arranged on the rack (1) through a copper roller shaft (3), and an electrode assembly arranged on one side of the rack (1) and slidably and electrically connected with the copper roller shaft (3); the copper roll shaft (3) is in insulated rotatable connection with a copper roll bearing seat (6) through a copper roll bearing (4) and a copper roll bearing insulating seat (5), and the copper roll bearing seat (6) is fixedly connected with the rack (1) through a copper roll bearing seat fixing screw (7); the electrode assembly comprises a metal base (8), and an electrode guide sleeve (9), a pressure spring clamping pin (10) and a binding post (11) which are symmetrically and fixedly arranged on the metal base (8). One end of the sampling resistor is electrically connected with a binding post (11) of the electrode assembly, and the other end of the sampling resistor is grounded, so that the testing precision is high.
Description
Technical Field
The invention relates to an electrical weakness tester for testing electrical performance of an electrical plastic film, in particular to a high-precision film electrical weakness tester.
Background
The existing electrical plastic film electrical weakness tester generally comprises a sample roller, a conductive rubber plate (connected with a high-voltage anode), an electrode copper roller (a high-voltage cathode is grounded), a winding roller, at least one flattening roller arranged at the front end of the electrode roller, at least one guide roller arranged at the rear end of the electrode roller and a control part. The working principle is that when the winding roller drives a film with a certain width on the sample roller to pass through the electrode roller, the equipotential conductive rubber plate with a certain width arranged at the upper end of the electrode roller is in horizontal line contact with the film, and voltage is applied to the film. The conductive rubber plate (high voltage positive electrode), the moving film, and the electrode roller (high voltage negative electrode, i.e. ground) form a high voltage loop, the leakage current of the high voltage loop varies with the moving film, when there is a weak point (flaw) at a certain position of the film, the leakage current of the high voltage loop becomes large suddenly, and the leakage current which becomes large suddenly is collected in the high voltage loop, i.e. the electrical weak point of the film is tested, so CN201017020Y discloses a film electrical weak point tester. The electrode copper roller is directly grounded (high-voltage cathode) with a frame through a rotating shaft and a bearing, a current sensor is connected to a high-voltage output circuit, a weak voltage signal induced by the current sensor is input into a single chip microcomputer or a PLC or other processors and used for judging whether a thin film has an electric weak point, and the testing precision of an instrument is directly influenced due to the low precision and sensitivity of the current sensor.
Disclosure of Invention
The invention aims to provide a high-precision film electrical weakness tester aiming at the defects of the prior art, wherein an electrode copper roller is isolated from a rack through a bearing insulating seat and is not directly grounded, the electrode roller is grounded through a sampling resistor (a high-voltage negative electrode), a voltage signal meeting the precision requirement is generated on the sampling resistor by leakage current generated by a high-voltage loop during testing, and the voltage signal meeting the precision requirement is input into a processor such as a singlechip or a PLC (programmable logic controller) and the like for judging whether a film has an electrical weakness point or not, so that the testing precision is improved.
The technical scheme is as follows:
in order to achieve the purpose, the invention adopts the following technical scheme: the device comprises a rack, a copper roller arranged on the rack through a copper roller shaft, and an electrode assembly arranged on one side of the rack and connected with the copper roller shaft in a sliding and electric manner; the copper roller shaft is insulated and rotatably connected with the copper roller bearing seat through the copper roller bearing and the copper roller bearing insulation seat, and the copper roller bearing seat is fixedly connected with the rack through a copper roller bearing seat fixing screw.
Furthermore, the electrode assembly comprises a metal base, and an electrode guide sleeve, a pressure spring clamping pin and a binding post which are symmetrically and fixedly arranged on the metal base; an electrode fixedly connected with an electrode lead is arranged in the electrode guide sleeve, and the electrode guide sleeve are in clearance fit; and the pressure spring bayonet lock is provided with an electrode pressure spring which is used for jacking the electrode to enable the electrode to be in close contact with the copper roller shaft, and the electrode lead is fixedly connected to the binding post.
Furthermore, the metal base is in a circular ring shape and is fixedly connected to the insulating base through metal base fixing screws.
Furthermore, the insulating base is in a circular ring shape and is fixedly connected to the copper roller bearing seat through insulating base fixing screws.
Furthermore, the metal base is symmetrically provided with U-shaped grooves for the insulating base fixing screws to pass through.
Furthermore, the metal base fixing screw and the insulating base fixing screw are arranged at a certain included angle.
Preferably, the contact surface of the electrode and the copper roller shaft is arranged into an arc profile which is consistent with the radial direction of the copper roller shaft.
Preferably, the electrode material is graphite.
Preferably, the electrode compression spring is a flat spiral spring.
Compared with the prior art, the invention has the beneficial effects that:
the invention 1. the copper roller shaft is insulated with the frame (frame grounding) through the bearing insulating seat, 2. the electrode assembly is also insulated with the frame (frame grounding) through the insulating seat; the copper roller shaft is in intimate slidable electrical contact with the electrode assembly. One end of the sampling resistor is electrically connected with the wiring terminal of the electrode assembly, and the other end of the sampling resistor is grounded. During testing, leakage current generated by a high-voltage loop generates a voltage signal at a sampling resistor, and according to a formula: u (voltage) = R (resistance) × I (current), select the sampling resistor of suitable resistance, can produce the voltage signal that satisfies the required precision, input this voltage signal that satisfies the required precision to processors such as singlechip or PLC, be used for judging whether the film has the existence of weak point, this kind of leakage current sampling mode improves the test accuracy greatly.
Description of the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a right side view of the present invention;
FIG. 3 is a top view of the present invention;
FIG. 4 is a schematic diagram of a leakage current sampling loop according to the present invention
The device comprises a machine frame 1, a copper roller 2, a copper roller shaft 3, a copper roller bearing 4, a copper roller bearing 5, a copper roller bearing insulating seat 6, a copper roller bearing seat fixing screw 7, a metal base 8, an electrode guide sleeve 9, a pressure spring clamping pin 10, a binding post 11, an insulating base 12, a metal base fixing screw 81, an electrode 90, an electrode lead 91, an electrode pressure spring 101 and an insulating base fixing screw 121, wherein 200 is the device.
The specific implementation mode is as follows:
as shown in figures 1-3, the high-precision film electrical weakness tester comprises a frame (1), a copper roller (2) arranged on the frame (1) through a copper roller shaft (3), and an electrode assembly arranged on one side of the frame (1) and slidably and electrically connected with the copper roller shaft (3); the copper roll shaft (3) is in insulated rotatable connection with a copper roll bearing seat (6) through a copper roll bearing (4) and a copper roll bearing insulating seat (5), and the copper roll bearing seat (6) is fixedly connected with the rack (1) through a copper roll bearing seat fixing screw (7); the electrode assembly comprises a metal base (8), an electrode guide sleeve (9), a pressure spring clamping pin (10) and a binding post (11), wherein the electrode guide sleeve (9), the pressure spring clamping pin (10) and the binding post (11) are symmetrically and fixedly arranged on the metal base (8), an electrode (90) fixedly connected with an electrode lead (91) is arranged in the electrode guide sleeve (9), the electrode (90) and the electrode guide sleeve (9) are in clearance fit, an electrode pressure spring (101) which is used for jacking the electrode (90) to enable the electrode to be in close contact with a copper roll shaft (3) is arranged on the pressure spring clamping pin (10), and the electrode lead (91).
The metal base (8) is annular and is fixedly connected to the insulating base (12) through a metal base fixing screw (81); the insulating base (12) is in a circular ring shape and is fixedly connected to the copper roller bearing seat (6) through an insulating base fixing screw (121).
And U-shaped grooves for allowing insulating base fixing screws (121) to pass through are symmetrically formed in the metal base (8).
The metal base fixing screw (81) and the insulation base fixing screw (121) are arranged at a certain included angle.
In order to increase the contact surface between the electrode (90) and the copper roller shaft (3), the contact surface between the electrode (90) and the copper roller shaft (3) is set into an arc profile which is consistent with the radial direction of the copper roller shaft (3).
In order to reduce the abrasion of the copper roller shaft (3), the electrode (90) is made of graphite.
The electrode compression spring (101) is a flat spiral spring.
The high-precision film electric weakness tester works as follows:
the voltage generated by the high-voltage generator is output to the conductive rubber plate through the internal current-limiting resistor, the conductive rubber plate is in flexible contact with the film, the voltage is applied to one side of the film, the other side of the film is in contact with the electrode copper roller (2), the electrode copper roller (2) is in close contact with the electrode assembly through the copper roller shaft (3), one end of the sampling resistor is electrically connected with a wiring terminal (11) of the electrode assembly, and the other end of the sampling resistor is grounded (high-voltage negative electrode). The high-voltage positive electrode passes through the current-limiting resistor, the film equivalent resistor and the sampling resistor to the high-voltage negative electrode to form a voltage loop, the tested film moves between the upper electrode (conductive rubber plate) and the lower electrode (electrode copper roller) applied with voltage, and the normal film (without weak point) has a large insulation resistance value (10)3M omega level), the leakage current in the voltage loop is microampere level, the voltage generated on the sampling resistor can reach millivolt level, when a weak point (flaw) exists at a certain position of the film, the leakage current of the high-voltage loop can suddenly change to milliampere level, the voltage generated on the sampling resistor can reach volt level, and the sampling voltage can sufficiently meet the precision requirement of a single chip microcomputer or a PLC (programmable logic controller) and other processors, so the electric weak point detection precision is greatly improved.
Claims (6)
1. A high-precision film electric weakness tester is characterized in that: the tester comprises a rack (1), a copper roller (2) arranged on the rack (1) through a copper roller shaft (3), and an electrode assembly arranged on one side of the rack (1) and connected with the copper roller shaft (3) in a sliding and electric manner; the copper roll shaft (3) is in insulated rotatable connection with a copper roll bearing seat (6) through a copper roll bearing (4) and a copper roll bearing insulating seat (5), and the copper roll bearing seat (6) is fixedly connected with the rack (1) through a copper roll bearing seat fixing screw (7); the electrode assembly comprises a metal base (8), an electrode guide sleeve (9), a pressure spring clamping pin (10) and a binding post (11), wherein the electrode guide sleeve (9), the pressure spring clamping pin (10) and the binding post (11) are symmetrically and fixedly arranged on the metal base (8), an electrode (90) fixedly connected with an electrode lead (91) is arranged in the electrode guide sleeve (9), the electrode (90) is in clearance fit with the electrode guide sleeve (9), an electrode pressure spring (101) which presses the electrode (90) to be in close contact with a copper roll shaft (3) is arranged on the pressure spring clamping pin (10), and the electrode lead (91) is fixedly connected to the binding post (; the metal base (8) is annular and is fixedly connected to the insulating base (12) through a metal base fixing screw (81); the insulating base (12) is in a circular ring shape and is fixedly connected to the copper roller bearing seat (6) through an insulating base fixing screw (121).
2. The high precision thin film electrical weakness tester of claim 1, wherein: and U-shaped grooves for allowing insulating base fixing screws (121) to pass through are symmetrically formed in the metal base (8).
3. The high precision thin film electrical weakness tester of claim 1, wherein: the metal base fixing screw (81) and the insulation base fixing screw (121) are arranged at a certain included angle.
4. The high precision thin film electrical weakness tester of claim 1, wherein: the contact surface of the electrode (90) and the copper roll shaft (3) is set to be an arc-shaped surface which is consistent with the radial direction of the copper roll shaft (3).
5. The high precision thin film electrical weakness tester of claim 1, wherein: the electrode (90) is made of graphite.
6. The high precision thin film electrical weakness tester of claim 1, wherein: the electrode compression spring (101) is a flat spiral spring.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201810104242.3A CN108226729B (en) | 2018-02-02 | 2018-02-02 | High-precision film electric weak point tester |
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CN201810104242.3A CN108226729B (en) | 2018-02-02 | 2018-02-02 | High-precision film electric weak point tester |
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CN108226729A CN108226729A (en) | 2018-06-29 |
CN108226729B true CN108226729B (en) | 2020-02-18 |
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CN201810104242.3A Active CN108226729B (en) | 2018-02-02 | 2018-02-02 | High-precision film electric weak point tester |
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Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2789576B2 (en) * | 1993-08-06 | 1998-08-20 | 日本軽金属株式会社 | Conductive jig for plating printing rolls |
KR101217955B1 (en) * | 2008-04-23 | 2013-01-02 | 현대중공업 주식회사 | Device reducing electric contact defeats of plasma cutting machine's slip ring |
CN201707420U (en) * | 2010-06-09 | 2011-01-12 | 四川东材科技集团股份有限公司 | Electroweak point test device capable of adjusting width of capacitance film |
CN103056503B (en) * | 2012-12-17 | 2016-02-17 | 广州松兴电器有限公司 | Seam welder circular electrode base device |
CN203170747U (en) * | 2013-04-12 | 2013-09-04 | 大连理工(营口)新材料工程中心有限公司 | Rolling electrode device |
CN203798968U (en) * | 2014-04-10 | 2014-08-27 | 安徽铜峰电子股份有限公司 | AD module output-based electric weakness point testing statistical system of thin film |
CN107364156A (en) * | 2017-08-10 | 2017-11-21 | 合肥科烨电物理设备制造有限公司 | A kind of electrode system for film surface coating film treatment |
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