CN108195473A - A kind of multichannel impact temperature diagnostic method for shock-wave experiment - Google Patents

A kind of multichannel impact temperature diagnostic method for shock-wave experiment Download PDF

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CN108195473A
CN108195473A CN201711434626.3A CN201711434626A CN108195473A CN 108195473 A CN108195473 A CN 108195473A CN 201711434626 A CN201711434626 A CN 201711434626A CN 108195473 A CN108195473 A CN 108195473A
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multichannel
shock
experiment
impact temperature
target
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CN108195473B (en
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贾果
贺芝宇
张帆
谢志勇
黄秀光
曹兆栋
涂昱淳
熊俊
王琛
方智恒
舒桦
叶君建
郭尔夫
董佳钦
安红海
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SHANGHAI LASER PLASMA INSTITUTE OF CHINA ACADEMY OF ENGINEERING PHYSICS
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SHANGHAI LASER PLASMA INSTITUTE OF CHINA ACADEMY OF ENGINEERING PHYSICS
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/03Arrangements for indicating or recording specially adapted for radiation pyrometers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/02Constructional details
    • G01J5/08Optical arrangements
    • G01J5/0801Means for wavelength selection or discrimination
    • G01J5/0802Optical filters
    • G01J5/08021Notch filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J5/00Radiation pyrometry, e.g. infrared or optical thermometry
    • G01J5/52Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
    • G01J5/54Optical arrangements

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Radiation Pyrometers (AREA)

Abstract

The invention discloses a kind of multichannel impact temperature diagnostic method for shock-wave experiment, this method includes the following steps:Step 1, shock-wave experiment diagnosis light path is built;Step 2, carry out the experiment of shock wave state equation on device of high power laser:Step 3, the SOP systems in the shock wave state equation experiment in the step 2 are demarcated:Step 4, target spontaneous radiation intensity to be measured is calculated:Step 5, multichannel fitting impact temperature.The present invention is based on Planck grey-body radiation theory and the thermometric diagnostic means of leucoscope system, by taking transparent material impact temperature measurement experiment under Laser shock loading as an example, the impact temperature realized under conditions of multichannel optical fiber using multi-channel measurement material is not being consumed without using spectrometer and, and provide impact temperature and emissivity that multichannel is fitted.This method compare single channel measure impact temperature method it is more reliable, the method to compare using other multi-channel measurement impact temperatures is more easy, efficient.

Description

A kind of multichannel impact temperature diagnostic method for shock-wave experiment
Technical field
The invention belongs to leucoscope system diagnostics fields, and in particular to a kind of multichannel for shock-wave experiment rushes Hit temperature diagnostic method.
Background technology
The research of materials behavior equation is to astrophysics and geophysics, inertial confinement fusion (ICF), height under high temperature and pressure The research important in inhibiting of warm high pressure plasma physics, high-energy density physics and material characteristic under extreme conditions.Shape State equation refers to the relationship of substance pressure, volume and temperature, and the measurement of impact temperature is to form the complete equation of state, high-voltage melting Wait the Basic Ways of high pressure properties research.At present in the shock wave loading experiment of research state equation, for shock velocity, pressure The measurement of the mechanical quantities such as strong is more mature, and for thermodynamic parameters such as temperature due to the complexity of itself and to instrument High request, it is accurate measure it is also extremely difficult.However when material is by impact compress, material temperature drastically increases, so as to cause The entropy of material increases, and the variations such as division, ionization or phase transformation occur, these changes of variation on thermal property are compared in mechanical property Change in matter will significantly much.Therefore accurate measure of material impact temperature will provide for materials behavior equation and physical property research Very important information is structure and verifies the significant data of the complete equation of state of material.
For the impact temperature measurement experiment that transient state occurs, current widely used light radiation method measures.This method is led to The radiation spectrum of high density compressed layer at measuring shock waves front is crossed, the temperature of compression layer is calculated using Planck radiation law Degree.For transparent material, the radiation of impact compress layer can be by the material transmission that is not hit out and detected during measurement It arrives, the leucoscope (streaked optical pyrometry --- SOP) of generally use time resolution and spatial discrimination The spontaneous radiation for measuring the material to be measured that is hit shines, and impact temperature is obtained by Planck grey-body radiation formula.Profit at present There are single channel and multichannel thermometric diagnostic method with the mode that SOP thermometrics diagnose.Single channel SOP methods need to combine narrow band filter slice and Velocity interferometer (velocity interferometer system for any reflector --- VISAR), shone by the spontaneous radiation of diagnostic materials some channels and calculate impact temperature with absolute reflectance, the drawback is that Estimate that the precision of method of emissivity is low by the reflectivity of material under Impulsive load, error is larger.Multichannel SOP systems are current Generally use spectrometer or multichannel optical fiber are realized, spectrometer or optical fiber are added in specifically in single channel SOP systems, incite somebody to action from Send out radioluminescence carry out open score, based on Planck theory compose be fitted multichannel radiation intensity spectrum, so as to obtain impact temperature and Emissivity.This method is high relative to single channel diagnosis reliability, but the easy consumption of the calibration of spectrometer and multichannel optical fiber Increase the cost and complexity of experiment.Therefore, it is necessary to study it is a kind of it is reliable, be easy to handling for shock-wave experiment Multichannel impact temperature diagnostic method.
Invention content
For problems of the prior art, the present invention provides a kind of multichannel impact temperature for shock-wave experiment Diagnostic method, it is theoretical that this method is based on Planck grey-body radiation.This method is not consuming without using spectrometer and multichannel optical fiber Under the premise of, multichannel diagnosis is realized using dismountable multichannel transmission filter, and provide that multichannel is fitted rushes Temperature and emissivity are hit, its main feature is that simple light, easily prepared.
To achieve the above object, the present invention uses following technical scheme:
A kind of multichannel impact temperature diagnostic method for shock-wave experiment, this method include the following steps:
Step 1, the foundation of light path:The light path include target to be measured, half wave plate, the first imaging system, the first lens, Second lens, the second imaging system, multichannel spike filter, streak camera, the half wave plate, the first imaging system System, the first lens, the second lens, the second imaging system, multichannel spike filter, streak camera are sequentially placed composition SOP systems It unites, multichannel spike filter is placed before the slit of the streak camera, SOP system diagnostics target spontaneous radiation to be measured is utilized to send out Light records experimental image using streak camera;
Step 2, carry out the experiment of shock wave state equation on device of high power laser:High power driving laser-impact is to be measured After target, the spontaneous radiation intensity that target to be measured is recorded by the streak camera counts CT,
Step 3, the SOP systems in the shock wave state equation experiment in the step 2 are demarcated:By known spectra The standard sources of radiance is placed in the position of target to be measured, and the target to be measured in experiment is made to pass through identical light path system with standard sources System and identical multichannel spike filter count C by the radiation intensity of the streak camera record standard light sourceS,
Step 4, target spontaneous radiation intensity to be measured is calculated:According to planck formulaIt obtains The impact temperature of target to be measuredWherein, h, c, k are respectively Planck's constant, vacuum light speed and Boltzmann Constant, ε are emissivity, and λ is the corresponding wavelength of multichannel, it is known that the spontaneous radiation intensity of target to be measured counts CTCalculation formula be:The radiation intensity of standard sources counts CSCalculation formula be: Wherein, subscript S represents standard sources, and subscript T represents target to be measured, and C is that the spontaneous radiation intensity of single pixel counts, and L (λ) is spoke Intensity is penetrated, t is effective fluorescent lifetime, and η is constant, and η is with collecting solid angle, light-emitting area, streak camera gain and radiation characteristic Correlation, Φ (λ) are system spectrum receptance function, when the wave-length coverage undergone in single pixel is no more than 1nm, and standard sources Illumination mode is identical with shock wave heat radiation illumination mode, then optical transfer function is identical, then Φ (λ)T=Φ (λ)S, ηTS, By CTCalculation formula divided by CSCalculation formula, can obtainSince calibration in experiment with recording data Shi Caiyong be streak camera dynamic scan pattern, so effective fluorescent lifetime of each pixel byIt gives Go out, SM represents camera scanning shelves journey, and P represents the number of pixels corresponding to shelves journey, due to calibration and experimentation middle-grade journey and picture Element is determining value, then it is assumed that tSWith tTFor constant, therefore calculate LT(λ), multichannel spike filter correspond to multiple logical Road then obtains multiple LTValue;
Step 5, multichannel fitting impact temperature:Radiation intensity L is established by the radiation intensity value of multiple channelsTWith wavelength X Relationship, useNonlinear fitting is carried out to it, impact temperature T joins with emissivity ε for fitting Number, the value of impact temperature and emissivity is obtained by least square fitting.
The thickness a of the multichannel spike filter is no more than 1mm, length, the size of width and streak camera slit Size match.
The narrow channel area of the multichannel spike filter is located at the centre position of multichannel spike filter, described narrow Tape channel sector width d is that narrow channel area both sides described in 14mm are no film egative film, and multiple narrow channels are partially plated in more successively On multi-channel narrow band optical filter, the half-breadth of each channel is less than 20nm.
The transmissivity of the multichannel spike filter is higher than 80%.
The target to be measured is transparent material target.
Compared with prior art, beneficial effects of the present invention are:
1. multichannel diagnosis is realized using dismountable multichannel transmission filter, its main feature is that simple light, being easy to make It is standby, and impact temperature and emissivity that multichannel is fitted can be provided, relative to other multichannels using spectrometer, optical fiber The method for measuring impact temperature, this method are more easy, efficient;2. the method for impact temperature, the party are measured relative to single channel Method is fitted to obtain emissivity rather than estimates emissivity by measuring the reflectivity of material under Impulsive load by multi-site data, The accuracy of temperature is improved, increases the reliability of data;3. the present invention is based on Planck grey-body radiation theory and light Learn pyrometer system thermometric diagnostic means, this method by under Laser shock loading transparent material impact temperature measure experiment for, The impact temperature realized under conditions of multichannel optical fiber using multi-channel measurement material is not being consumed without using spectrometer and, and Provide impact temperature and emissivity that multichannel is fitted.This method compare single channel measure impact temperature method more Reliably, the method for other multi-channel measurement impact temperatures to compare using spectrometer, optical fiber is more easy, efficient.
Description of the drawings
The invention will be further described referring to the drawings, wherein:
Fig. 1 is the index path that multi-channel light radiation method measures impact temperature laboratory diagnosis in the present invention.
Fig. 2 is the structure diagram of multichannel spike filter in the present invention.
The matched curve of multichannel fitting impact temperature and emissivity in Fig. 3 present invention.
Specific embodiment
We to impact the present invention for the multichannel of shock-wave experiment with reference to attached drawing and specific calculated examples below Temperature diagnostic method is further elaborated, in the hope of providing a clearer understanding of the diagnosis of the impact temperature and calculating side Method, but be not intended to limit the protection scope of the present invention.
As shown in Figure 1, Figure 2 and Figure 3, the present embodiment is used for the multichannel impact temperature diagnostic method of shock-wave experiment, base In the shock wave state equation experiment carried out on device of high power laser God Light-II, examined using quartz crystal as target material to be measured Its disconnected impact temperature, specific diagnostic method and calculating step are as follows:
Step 1, shock-wave experiment diagnosis light path is built:The light path includes target 2 to be measured, half wave plate 3, first is imaged System 4, the first lens 5, the second lens 6, the second imaging system 7, multichannel spike filter 8, streak camera 9, described two points One of wave plate 3, the first imaging system 4, the first lens 5, the second lens 6, the second imaging system 7, multichannel spike filter 8, Streak camera 9 is sequentially placed composition SOP systems 10, is shone, adopted using leucoscope SOP system diagnostics target spontaneous radiation to be measured Experimental image is recorded with the streak camera of high time, spatial discrimination, multichannel narrow-band-filter is placed before the slit of the streak camera Piece, the multichannel spike filter are rectangular tab, and the thickness a of rectangular tab is 0.5mm, and length b is 30mm, and height c is 15mm, length, the size of width and the size of streak camera slit match, which includes four narrow Tape channel, the wavelength X of four narrow channels1、λ2、λ3、λ4Respectively 406nm, 447nm, 496nm and 598nm, the Multichannel narrow Narrow channel area with optical filter is located at the centre position of multichannel spike filter, and the narrow channel sector width d is 14mm, It is x that both ends are equal away from end respectively, and narrow channel area both sides are no film egative film 11, and four narrow channels are partially plated in successively On multichannel spike filter, the half-breadth of each channel is less than 20nm, and the transmissivity of multichannel spike filter is higher than 80%;
Step 2, carry out the experiment of shock wave state equation on device of high power laser God Light-II:9th tunnel light laser list After Secondary Shocks quartz crystal target to be measured, C is counted by the spontaneous radiation intensity of the streak camera record targetT
Step 3, the SOP systems in the shock-wave experiment are demarcated using standard sources:Specifically by known to The standard sources of spectral radiance is placed in target position to be measured, make experiment target to be measured and standard sources by identical light path system with The multichannel narrow band filter slice, used is NIST canonical product bulb separation light source OL455, which meets Planck Grey-body radiation, spectrum radiation curve are counted it is known that colour temperature 3000K by the radiation intensity of the streak camera record standard light source CS,
Step 4, formula is utilized:The quartzy spontaneous radiation intensity of four channels is calculated respectively, by What is used when recording data in calibration and experiment is all the dynamic scan pattern of streak camera, and each pixel effectively shines Time can be byIt provides, the camera scanning shelves journey SM=20ns used in experiment, the camera scanning shelves journey used in calibration SM=20ms, the number of pixels P=1400 corresponding to shelves journey, it is known that tSWith tTIt is constant, the L of four channelsTIt can directly calculate, Acquired results as shown in figure 3,
Step 5, as Fig. 3 establishes four channel radiation intensity LTWith the relational graph of wavelength X, using Planck formulaNonlinear fitting is carried out to it, using impact temperature T and emissivity ε as fitting parameter, is passed through After least square fitting, emissivity ε=0.64 of the quartz crystal in shock-wave experiment, impact temperature T=are obtained 8315K。
Although above-described embodiment makes the present invention specific descriptions, those of ordinary skill in the art are come It says, it is understood that can be modified within the spirit and scope for not departing from the present invention based on present disclosure Or improve, these modification and improvement are all within the spirit and scope of the present invention.

Claims (5)

1. a kind of multichannel impact temperature diagnostic method for shock-wave experiment, which is characterized in that this method includes following step Suddenly:
Step 1, the foundation of light path:The light path includes target to be measured (2), half wave plate (3), the first imaging system (4), first Lens (5), the second lens (6), the second imaging system (7), multichannel spike filter (8), streak camera (9), described two points One of wave plate (3), the first imaging system (4), the first lens (5), the second lens (6), the second imaging system (7), Multichannel narrow Band optical filter (8), streak camera (9) are sequentially placed composition SOP systems (10), are placed before the slit of the streak camera (9) more Multi-channel narrow band optical filter (8) is diagnosed target (2) spontaneous radiation to be measured using SOP systems (10) and shone, remembered using streak camera (9) Record experimental image;
Step 2, carry out the experiment of shock wave state equation on device of high power laser:High power driving laser (1) impacts to be measured After target (2), the spontaneous radiation intensity that target to be measured is recorded by the streak camera counts CT,
Step 3, the SOP systems in the shock wave state equation experiment in the step 2 are demarcated:Known spectra is radiated The standard sources of brightness is placed in the position of target to be measured (2), and the target to be measured (2) in experiment is made to pass through identical light path with standard sources System and identical multichannel spike filter (8) are counted by the radiation intensity of the streak camera (9) record standard light source CS,
Step 4, target spontaneous radiation intensity to be measured is calculated:According to planck formulaObtain target to be measured Impact temperatureWherein, h, c, k are respectively that Planck's constant, vacuum light speed and Boltzmann are normal Number, ε are emissivity, and λ is the corresponding wavelength of multichannel, it is known that the spontaneous radiation intensity of target to be measured counts CTCalculation formula be:
The radiation intensity of standard sources counts CSCalculation formula be:
Wherein, subscript S represents standard sources, and subscript T represents target to be measured, and C is single pixel Spontaneous radiation intensity counts, and L (λ) is radiation intensity, and t is effective fluorescent lifetime, and η is constant, and Φ (λ) responds letter for system spectrum Number, when the wave-length coverage undergone in single pixel is no more than 1nm, and the illumination mode of standard sources shines with shock wave heat radiation Mode is identical, then optical transfer function is identical, then Φ (λ)T=Φ (λ)S, ηTS, by CTCalculation formula divided by CSCalculating Formula can obtainWhat is used when recording data due to calibration and in testing is the dynamic of streak camera Scan pattern, thus effective fluorescent lifetime of each pixel byIt provides, SM represents camera scanning shelves journey, and P is represented Number of pixels corresponding to shelves journey, since calibration and experimentation middle-grade journey and pixel are determining value, then it is assumed that tSWith tTFor Constant, therefore calculate LT(λ), multichannel spike filter correspond to multiple channels, then obtain multiple LTValue;
Step 5, multichannel fitting impact temperature:Radiation intensity L is established by the radiation intensity value of multiple channelsTWith the pass of wavelength X System usesNonlinear fitting is carried out to it, impact temperature T is fitting parameter with emissivity ε, is led to It crosses least square fitting and obtains the value of impact temperature and emissivity.
2. the multichannel impact temperature diagnostic method according to claim 1 for shock-wave experiment, which is characterized in that institute The thickness a for stating multichannel spike filter (8) is no more than 1mm, length, the size of width and the ruler of streak camera (9) slit It is very little to match.
3. the multichannel impact temperature diagnostic method according to claim 1 for shock-wave experiment, which is characterized in that institute The narrow channel area for stating multichannel spike filter (8) is located at the centre position of multichannel spike filter (8), the narrow bandpass Dao Qu both sides are no film egative film (11), and multiple narrow channels are partially plated on multichannel spike filter successively, each channel Half-breadth be less than 20nm.
4. the multichannel impact temperature diagnostic method according to claim 1 for shock-wave experiment, which is characterized in that institute The transmissivity for stating multichannel spike filter (8) is higher than 80%.
5. the multichannel impact temperature diagnostic method according to claim 1 for shock-wave experiment, which is characterized in that institute Target to be measured is stated as transparent material target.
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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110715740A (en) * 2019-11-13 2020-01-21 西安工业大学 Calibration system for multi-channel pyrometer
CN111230309A (en) * 2020-02-20 2020-06-05 中国航空制造技术研究院 Novel coating cleaning method
CN111562019A (en) * 2020-04-08 2020-08-21 太原理工大学 Multispectral radiation temperature measurement method and system
CN114088238A (en) * 2021-11-18 2022-02-25 中国工程物理研究院流体物理研究所 Picosecond time resolution impact temperature measurement system and method based on wide radiation spectrum
CN114509166A (en) * 2022-01-27 2022-05-17 重庆大学 High transient high temperature plasma temperature measurement system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105489253A (en) * 2015-12-01 2016-04-13 中国工程物理研究院上海激光等离子体研究所 Cryogenic targeting system for liquid deuterium state equation research and operation method thereof
CN106841200A (en) * 2017-01-23 2017-06-13 中国工程物理研究院上海激光等离子体研究所 For Laser shock loading dynamic high pressure research novel diamond pressure chamber and its assembly method
CN106952668A (en) * 2017-04-07 2017-07-14 中国工程物理研究院激光聚变研究中心 Multifunction laser fusion diagnoses interferometer

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105489253A (en) * 2015-12-01 2016-04-13 中国工程物理研究院上海激光等离子体研究所 Cryogenic targeting system for liquid deuterium state equation research and operation method thereof
CN106841200A (en) * 2017-01-23 2017-06-13 中国工程物理研究院上海激光等离子体研究所 For Laser shock loading dynamic high pressure research novel diamond pressure chamber and its assembly method
CN106952668A (en) * 2017-04-07 2017-07-14 中国工程物理研究院激光聚变研究中心 Multifunction laser fusion diagnoses interferometer

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
贺芝宇 等: "激光加载下铝材料的冲击温度测量", 《强激光与粒子束》 *

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110715740A (en) * 2019-11-13 2020-01-21 西安工业大学 Calibration system for multi-channel pyrometer
CN111230309A (en) * 2020-02-20 2020-06-05 中国航空制造技术研究院 Novel coating cleaning method
CN111230309B (en) * 2020-02-20 2022-06-10 中国航空制造技术研究院 Novel coating cleaning method
CN111562019A (en) * 2020-04-08 2020-08-21 太原理工大学 Multispectral radiation temperature measurement method and system
CN114088238A (en) * 2021-11-18 2022-02-25 中国工程物理研究院流体物理研究所 Picosecond time resolution impact temperature measurement system and method based on wide radiation spectrum
CN114088238B (en) * 2021-11-18 2023-08-01 中国工程物理研究院流体物理研究所 Picosecond time-resolved impact temperature measurement system and method based on wide radiation spectrum
CN114509166A (en) * 2022-01-27 2022-05-17 重庆大学 High transient high temperature plasma temperature measurement system
CN114509166B (en) * 2022-01-27 2024-02-23 重庆大学 High-transient high-temperature plasma temperature measurement system

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