CN108169657B - Intelligent power module and testing method thereof - Google Patents
Intelligent power module and testing method thereof Download PDFInfo
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- CN108169657B CN108169657B CN201711141313.9A CN201711141313A CN108169657B CN 108169657 B CN108169657 B CN 108169657B CN 201711141313 A CN201711141313 A CN 201711141313A CN 108169657 B CN108169657 B CN 108169657B
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Abstract
The application discloses an intelligent power module and a test method of the intelligent power module. The module comprises: the at least one main control chip is used for receiving the control signal by each main control chip, converting the control signal and outputting the converted control signal; the test control unit is connected with at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when at least one main control chip is tested, outputting a control signal converted by each main control chip; and the power chip is connected with the test control unit and used for receiving the test control signal output by the test control unit. By the method and the device, the problem that the process of analyzing the chip failure in the intelligent power module is complex in the related technology is solved.
Description
Technical Field
The application relates to the technical field of intelligent power modules, in particular to an intelligent power module and a test method of the intelligent power module.
Background
The intelligent power module improves the integration level and stability by means of an internal integrated chip. Because the chips of the intelligent power module are all packaged in the resin in a plastic mode, the conventional method cannot directly test internal devices (mainly a power chip and a main control chip) of the intelligent power module under the condition of not damaging the structure of the intelligent power module. Once a product fails, the existing method judges and analyzes the failure reason through X-ray, polishing, using strong acid to corrode resin and the like by visual observation, and the process is complex and the accuracy of judging the failed chip cannot be ensured.
Aiming at the problem that the process of analyzing the chip failure in the intelligent power module in the related technology is complex, an effective solution is not provided at present.
Disclosure of Invention
The application mainly aims to provide an intelligent power module and a testing method of the intelligent power module so as to solve the problem that the process of analyzing the failure of a chip in the intelligent power module is complex in the related technology.
To achieve the above object, according to one aspect of the present application, there is provided a smart power module. The module comprises: the at least one main control chip is used for receiving a control signal by each main control chip, converting the control signal and outputting the converted control signal, wherein the converted control signal is a signal for driving the corresponding power chip to work; the test control unit is connected with the at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when the at least one main control chip is tested, outputting a control signal converted by each main control chip, wherein whether the corresponding main control chip fails or not is judged according to the converted control signal; and the power chips are connected with the test control unit and used for receiving the test control signals output by the test control unit, and whether each power chip is started after receiving the test control signals is detected so as to judge whether each power chip is invalid or not.
Further, each master control chip comprises a plurality of ports, and each port is used for receiving a corresponding control signal.
Further, the smart power module includes: the first judgment module is used for judging whether the control signal output by the test control unit and converted by each main control chip is a preset signal or not; the first judgment module is used for judging that the target main control chip is normal under the condition that the control signal output by the test control unit and converted by the target main control chip is a preset signal; and the second judgment module is used for judging that the target main control chip fails under the condition that the control signal output by the test control unit and converted by the target main control chip is not a preset signal.
Further, the smart power module includes: the detection module is used for detecting whether each power chip starts to work after receiving the test control signal; the third judging module is used for judging that the target power chip is normal under the condition that the target power chip starts to work after receiving the test control signal; and the fourth judging module is used for judging that the target power chip fails under the condition that the target power chip does not start to work after receiving the test control signal.
Further, the smart power module includes: and the test control switching module is used for controlling the test control unit to switch into a test mode when outputting a low level to the test control unit.
Further, the intelligent power module is used for driving a three-phase motor.
Further, the intelligent power module is used for driving a compressor in the air conditioner.
In order to achieve the above object, according to one aspect of the present application, there is provided a test method of a smart power module. The method comprises the following steps: inputting a control signal into at least one main control chip; acquiring a control signal converted by each main control chip; judging whether the corresponding main control chip fails or not based on the converted control signal; and/or inputting a test control signal into at least one power chip, wherein the test control signal is used for indicating to start the at least one power chip; and detecting whether each power chip is started after receiving the test control signal so as to judge whether each power chip is invalid or not.
In order to achieve the above object, according to another aspect of the present application, there is provided a storage medium including a stored program, wherein the program performs the testing method of the smart power module as described in any one of the above.
In order to achieve the above object, according to another aspect of the present application, there is provided a processor for executing a program, wherein the program executes a method for testing an intelligent power module according to any one of the above methods.
The intelligent power module of the present application includes: the at least one main control chip is used for receiving the control signal by each main control chip, converting the control signal and outputting the converted control signal; the test control unit is connected with at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when at least one main control chip is tested, outputting a control signal converted by each main control chip; the power chip is connected with the test control unit and used for receiving the test control signal output by the test control unit, and the problem that the failure process of the chip in the intelligent power module is analyzed in the related technology is complex is solved. Whether the main control chip or the power chip fails or not is analyzed according to the signals output by the test control unit, so that the effects of simple chip failure process in the intelligent power module and improvement of accuracy of chip failure analysis are achieved.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the application and, together with the description, serve to explain the application and are not intended to limit the application. In the drawings:
FIG. 1 is a schematic diagram of a smart power module provided in accordance with an embodiment of the present application;
FIG. 2 is a first schematic diagram of an alternative smart power module provided in accordance with an embodiment of the present application;
FIG. 3 is a second schematic diagram of an alternative smart power module provided in accordance with an embodiment of the present application;
FIG. 4 is a third schematic diagram of an alternative smart power module provided in accordance with an embodiment of the present application;
FIG. 5 is a fourth schematic diagram of an alternative smart power module provided in accordance with an embodiment of the present application; and
fig. 6 is a flowchart of a testing method of a smart power module according to an embodiment of the present application.
Detailed Description
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an embodiment of the present application, a smart power module is provided.
Fig. 1 is a schematic diagram of a smart power module according to an embodiment of the present application. As shown in fig. 1, the module includes the following:
and the at least one main control chip 10 is configured to receive the control signal, convert the control signal, and output the converted control signal, where the converted control signal is a signal for driving the corresponding power chip 30 to operate.
The main function of the main control chip is to receive control input signals, convert the signals into signals capable of directly controlling the action of the rear-end power chip, and integrate the functions of overcurrent, overheat, low-voltage protection, upper and lower bridge direct connection prevention and the like.
The test control unit 20 is connected with at least one main control chip 10, and is used for outputting a test control signal corresponding to each power chip 30 when each power chip 30 is tested, so as to drive each power chip 30 to work; when testing at least one main control chip 10, outputting the control signal converted by each main control chip 10, wherein whether the corresponding main control chip 10 fails is judged according to the converted control signal.
And at least one power chip 30 connected to the test control unit 20 and configured to receive the test control signal output by the test control unit 20, wherein whether each power chip 30 is started after receiving the test control signal is detected to determine whether each power chip 30 fails.
The power chip can comprise power electronic devices such as MOSFET and IGBT.
The intelligent power module provided by the embodiment of the application comprises at least one main control chip 10, wherein each main control chip 10 receives a control signal, converts the control signal and outputs the converted control signal; the test control unit 20 is connected with at least one main control chip 10, and outputs a test control signal corresponding to each power chip 30 when testing each power chip 30 so as to drive each power chip 30 to work; when at least one main control chip 10 is tested, outputting the control signal converted by each main control chip 10; at least one power chip 30 is connected with the test control unit 20 and receives the test control signal output by the test control unit 20, so that the problem that the process of analyzing the chip failure in the intelligent power module in the related art is complex is solved. Whether the main control chip or the power chip fails or not is analyzed according to the signals output by the test control unit, so that the effects of simple chip failure process in the intelligent power module and improvement of accuracy of chip failure analysis are achieved.
As shown in fig. 2, fig. 2 is a schematic diagram of an optional intelligent power module according to an embodiment of the present application, where the main control chip and the test control unit may serve as a new main control chip, and the new main control chip converts a control signal into an output driving signal by inputting the control signal into the new main control chip, and outputs the output driving signal to the power chip to drive the power chip to start. The test control unit can output the control signal converted by the main control chip and also can directly receive the test control signal and input the test control signal to the power chip. Through the intelligent power module that this application embodiment provided, according to the signal of test the control unit output, whether analysis main control chip or power chip became invalid, and then reached among the analysis intelligent power module chip failure process simple, promoted the effect of the accuracy of analysis chip inefficacy.
Optionally, in the intelligent power module provided in the embodiment of the present application, each master control chip 10 includes a plurality of ports, and each port is configured to receive a corresponding control signal.
As shown in fig. 3, fig. 3 is a second schematic diagram of an optional smart power module provided according to an embodiment of the present application, and for the main control chip in fig. 3, the main control chip includes a plurality of ports, such as UP，VP，WP，UN，VN，WNWherein, UPThe received control signal drives the power chip V between P, U through the signal converted and output by the main control chipPReceived control signals, signals converted and output by the master control chip drive V, U power chips, and the like.
Optionally, in the intelligent power module provided in the embodiment of the present application, the intelligent power module includes: a first judging module, configured to judge whether a control signal output by the test control unit 20 and converted by each main control chip 10 is a preset signal; a first determining module, configured to determine that the target main control chip 10 is normal when the control signal output by the test control unit 20 and converted by the target main control chip 10 is a preset signal; and a second determining module, configured to determine that the target main control chip 10 is invalid when the control signal output by the test control unit 20 and converted by the target main control chip 10 is not a preset signal.
As shown in fig. 4, fig. 4 is a schematic diagram three of an optional intelligent power module provided according to the embodiment of the present application, and in a test mode, a control signal is sequentially input item by item, and a "test control signal" end detects an output of a certain path of a control chip. And judging that the main control chip is normal if the test control signal end is a preset signal or not by detecting whether the test control signal end is the preset signal or not, and judging that the main control chip is invalid or damaged if the test control signal end is not the preset signal. For example, the main control chip receives a 3.3V signal, and after the signal is converted by the main control chip, a 15V signal should be output, if the signal output by the "test control signal" end is a 15V signal, it is determined that the main control chip is normal, and if the signal output by the "test control signal" end is not a 15V signal, it is determined that the main control chip is failed or damaged.
Optionally, in the intelligent power module provided in the embodiment of the present application, the intelligent power module includes: the detection module is used for detecting whether each power chip 30 starts to work after receiving the test control signal; the third determination module is configured to determine that the target power chip 30 is normal when the target power chip 30 is started to operate after receiving the test control signal; and a fourth determining module, configured to determine that the target power chip 30 is disabled when it is detected that the target power chip 30 does not start to operate after receiving the test control signal.
As shown in fig. 5, fig. 5 is a schematic diagram of an optional intelligent power module according to an embodiment of the present disclosure, in a test mode, a "test control signal" end may be used as a control input of a back-end power chip, the control end does not input a signal, the "test control signal" end inputs a power chip start signal, so that all the back-end power chips receive the control signal, and detect whether the back-end power chip operates (where the operation corresponds to the above start operation), if the power chip operates, it is proved that the power chip is normal, and if the power chip does not operate, it is proved that the power chip fails or is damaged.
Optionally, in the intelligent power module provided in the embodiment of the present application, the intelligent power module includes: and a test control switching module, configured to control the test control unit 20 to switch to the test mode when outputting the low level to the test control unit 20.
When the "test control switching" terminal is at a low level or is suspended (corresponding to the above-mentioned test switching module outputting a low level), the control terminals of the power chip are all shorted to the "test control signal" terminal for the mode of testing the intelligent power module (corresponding to the above-mentioned test mode). It should be noted that, if the "test control switching" pin is at a high level, the connection in the test control unit is cut off, which is a normal operating mode of the intelligent power module.
Optionally, in the intelligent power module provided in the embodiment of the present application, the intelligent power module is configured to drive a three-phase motor.
Optionally, in the intelligent power module provided in the embodiment of the present application, the intelligent power module is used for driving a compressor in an air conditioner.
The embodiment of the present application further provides a testing method for an intelligent power module, and it should be noted that the intelligent power module according to the embodiment of the present application may be used to execute the testing method for an intelligent power module provided in the embodiment of the present application. The following describes a method for testing an intelligent power module provided in an embodiment of the present application.
Fig. 6 is a flowchart of a testing method of a smart power module according to an embodiment of the present application. As shown in fig. 6, the method includes:
step S101, inputting a control signal into at least one main control chip;
step S102, obtaining a control signal after each main control chip converts the control signal;
step S103, judging whether the corresponding main control chip is invalid or not based on the converted control signal;
and/or step S104, inputting a test control signal into at least one power chip, wherein the test control signal is used for indicating to start the at least one power chip;
step S105, detecting whether each power chip is started after receiving the test control signal so as to judge whether each power chip is invalid.
According to the testing method of the intelligent power module, the control signal is input into the at least one main control chip; acquiring a control signal converted by each main control chip; judging whether the corresponding main control chip fails or not based on the converted control signal; and/or inputting a test control signal into at least one power chip, wherein the test control signal is used for indicating to start the at least one power chip; and detecting whether each power chip is started after receiving the test control signal so as to judge whether each power chip is invalid or not. The problem of complicated chip failure process in the analysis intelligence power module among the correlation technique is solved. Whether the main control chip or the power chip fails or not is analyzed according to the signals output by the test control unit, so that the effects of simple chip failure process in the intelligent power module and improvement of accuracy of chip failure analysis are achieved.
It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.
An embodiment of the present invention provides a storage medium having a program stored thereon, the program implementing a method of testing an intelligent power module when executed by a processor.
The embodiment of the invention provides a processor, which is used for running a program, wherein a test method of an intelligent power module is executed when the program runs.
The embodiment of the invention provides equipment, which comprises a processor, a memory and a program which is stored on the memory and can run on the processor, wherein the processor executes the program and realizes the following steps: the at least one main control chip is used for receiving the control signal by each main control chip, converting the control signal and outputting the converted control signal, wherein the converted control signal is a signal for driving the corresponding power chip to work; the test control unit is connected with at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when at least one main control chip is tested, outputting a control signal converted by each main control chip, wherein whether the corresponding main control chip fails or not is judged according to the converted control signal; and the power chips are connected with the test control unit and used for receiving the test control signals output by the test control unit, wherein whether each power chip is started after receiving the test control signals is detected so as to judge whether each power chip is invalid or not. The device herein may be a server, a PC, a PAD, a mobile phone, etc.
The present application further provides a computer program product adapted to perform a program for initializing the following method steps when executed on a data processing device: the at least one main control chip is used for receiving the control signal by each main control chip, converting the control signal and outputting the converted control signal, wherein the converted control signal is a signal for driving the corresponding power chip to work; the test control unit is connected with at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when at least one main control chip is tested, outputting a control signal converted by each main control chip, wherein whether the corresponding main control chip fails or not is judged according to the converted control signal; and the power chips are connected with the test control unit and used for receiving the test control signals output by the test control unit, wherein whether each power chip is started after receiving the test control signals is detected so as to judge whether each power chip is invalid or not.
It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). The memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in the process, method, article, or apparatus that comprises the element.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The above are merely examples of the present application and are not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (7)
1. A smart power module, comprising:
the at least one main control chip is used for receiving a control signal by each main control chip, converting the control signal and outputting the converted control signal, wherein the converted control signal is a signal for driving the corresponding power chip to work;
the test control unit is connected with the at least one main control chip and used for outputting a test control signal corresponding to each power chip when each power chip is tested so as to drive each power chip to work; when the at least one main control chip is tested, outputting a control signal converted by each main control chip, wherein whether the corresponding main control chip fails or not is judged according to the converted control signal;
the power chips are connected with the test control unit and used for receiving the test control signals output by the test control unit, and whether each power chip is started after receiving the test control signals is detected so as to judge whether each power chip is invalid or not;
wherein the smart power module comprises: the first judgment module is used for judging whether the control signal output by the test control unit and converted by each main control chip is a preset signal or not; the first judgment module is used for judging that the target main control chip is normal under the condition that the control signal output by the test control unit and converted by the target main control chip is a preset signal; the second judgment module is used for judging that the target main control chip fails under the condition that the control signal output by the test control unit and converted by the target main control chip is not a preset signal;
the smart power module includes: the detection module is used for detecting whether each power chip starts to work after receiving the test control signal; the third judging module is used for judging that the target power chip is normal under the condition that the target power chip starts to work after receiving the test control signal; the fourth judging module is used for judging that the target power chip fails under the condition that the target power chip does not start to work after receiving the test control signal;
the smart power module includes: the test control switching module is used for controlling the test control unit to switch into a test mode when outputting a low level to the test control unit; and when the high level is output to the test control unit, controlling the test control unit to switch to a working mode.
2. The smart power module of claim 1 wherein each master chip includes a plurality of ports, each port for receiving a corresponding control signal.
3. The smart power module of claim 1 wherein the smart power module is configured to drive a three-phase motor.
4. The smart power module of claim 1, wherein the smart power module is configured to drive a compressor in an air conditioner.
5. A testing method of an intelligent power module is characterized by comprising the following steps:
inputting a control signal into at least one main control chip;
acquiring a control signal converted by each main control chip;
judging whether the corresponding main control chip fails or not based on the converted control signal;
inputting a test control signal into at least one power chip, wherein the test control signal is used for indicating to start the at least one power chip;
detecting whether each power chip is started after receiving the test control signal so as to judge whether each power chip is invalid or not;
wherein the method comprises the following steps: judging whether the control signal output by the test control unit and converted by each main control chip is a preset signal or not; under the condition that the control signal output by the test control unit and converted by the target main control chip is a preset signal, judging that the target main control chip is normal; under the condition that a control signal output by the test control unit and converted by the target main control chip is not a preset signal, judging that the target main control chip is invalid;
the method comprises the following steps: detecting whether each power chip starts to work after receiving the test control signal; under the condition that the target power chip starts working after receiving the test control signal, judging that the target power chip is normal; under the condition that the target power chip is detected not to start working after receiving the test control signal, judging that the target power chip is invalid;
the method comprises the following steps: when a low level is output to the test control unit, controlling the test control unit to switch into a test mode; and when the high level is output to the test control unit, controlling the test control unit to switch to a working mode.
6. A storage medium comprising a stored program, wherein the program performs the method of testing the smart power module of claim 5.
7. A processor, characterized in that the processor is configured to run a program, wherein the program is configured to execute the method for testing the smart power module of claim 5 when running.
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| CN111193404A (en) * | 2020-01-15 | 2020-05-22 | 辽宁百思特达半导体科技有限公司 | Three-phase full-bridge circuit of gallium nitride chip, intelligent power module and control method of intelligent power module |
| CN113655843B (en) * | 2021-07-01 | 2022-11-18 | 济南安时能源科技有限公司 | Power chip management system and method |
| CN114123834B (en) * | 2021-10-29 | 2024-03-29 | 广东汇芯半导体有限公司 | Semiconductor circuit with a high-voltage power supply |
| CN115166407A (en) * | 2022-09-06 | 2022-10-11 | 广东汇芯半导体有限公司 | Test circuit and tester applying same |
| CN117200546B (en) * | 2023-07-28 | 2024-04-02 | 海信家电集团股份有限公司 | Intelligent power module IPM, control method, chip and electronic equipment |
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