CN108169089A - A kind of laser dust sensor and dust concentration sampling zero formula measuring method of school - Google Patents
A kind of laser dust sensor and dust concentration sampling zero formula measuring method of school Download PDFInfo
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- CN108169089A CN108169089A CN201711496220.8A CN201711496220A CN108169089A CN 108169089 A CN108169089 A CN 108169089A CN 201711496220 A CN201711496220 A CN 201711496220A CN 108169089 A CN108169089 A CN 108169089A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
- G01N15/06—Investigating concentration of particle suspensions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
- G01N21/51—Scattering, i.e. diffuse reflection within a body or fluid inside a container, e.g. in an ampoule
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Abstract
The present invention relates to dust sensor field, spy is related to a kind of laser dust sensor and dust concentration sampling zero formula measuring method of school.The present invention detects dust concentration in the structural member of darkroom using laser light scattering principle, acquisition primary dusts concentration value per second, and it is per second in two periods be divided to acquire, first, there are the acquisition of laser irradiation and the acquisition without laser irradiation, using the signal of unglazed irradiation acquisition as mark zero-signal, it is considered as no dust atmosphere, then every time compares the signal for having light irradiation acquisition with mark zero-signal, it is achieved thereby that the real time correction of sensor.Present invention can assure that use for a long time or ambient humidity, temperature etc. form the variation of circuit element parameter, caused by measurement error calibrated in time, greatly improve the accuracy of measurement of real-time dust concentration value.
Description
Technical field
The present invention relates to dust sensor field, spy is related to a kind of laser dust sensor and dust concentration sampling zero formula of school
Measuring method.
Background technology
The method of suspended particulate substance quality concentration of the general dust sensor in air is detected mainly is adopted in principle
With Michaelis (Mie) theory and its approximate conclusion.As the light scattering method based on theory, generic way is with a monochromic beam
It is radiated in sampled air, and the channel design (such as elongated pipeline) for passing through the flowing of air enables the particle in sampled air
Object is approximate single by light beam, and at the same time, photosensitive element is arranged in (being usually 180 degree or 90 on some scattering angle
Degree) collect scattered light intensity.
But some differences of ambient humidity, temperature and electronic component inherently, the precision of sensor is affected, is needed
It is verified.Chinese invention patent《A kind of powder concentration measurement method of laser dust sensor》(application number：
201510053394.1) disclose a kind of method demarcated at normal temperatures, Chinese invention patent《A kind of integrated capacitive-
The device of laser measurement dust concentration》It discloses and complementation is carried out to sensor environment by capacitance chromatography imaging device to verify,
Although both the above method of calibration can improve sensor accuracy to a certain extent, all exist need increase additional circuit or
Component, it is impossible to implement corrected deficiency.
Invention content
In view of the deficiencies of the prior art, the present invention provides a kind of laser dust sensor and dust concentration sampling zero formulas of school
Measuring method.The present invention detects dust concentration in the structural member of darkroom using laser light scattering principle, and acquisition primary dusts per second are dense
Angle value, and it is per second in two periods be divided to acquire, first, having the acquisition of laser irradiation and the acquisition without laser irradiation, by unglazed irradiation
The signal of acquisition is considered as no dust atmosphere, then every time by the signal for having light irradiation acquisition and mark zero-signal as mark zero-signal
It is compared, it is achieved thereby that the real time correction of sensor.Present invention can assure that long-time uses or ambient humidity, temperature
Etc. the variation for forming circuit element parameter, caused by measurement error calibrated in time, greatly improve real-time dust concentration value
Accuracy of measurement.
The technical scheme is that：A kind of zero formula measuring method of laser dust concentration sample school, it is characterised in that：One
Section the time in light splitting open and light close two periods be acquired, include the following steps：
Step 1：It is opened in the period in light, MCU units control laser emitting diode shines, MCU units acquisition silicon light two
Pole pipe signal acquires initial value PM1 for real time environment dust concentration；
Step 2：It is closed in the period in light, MCU units close laser emitting diode, and MCU units are closing Laser emission
The silicon photo diode signal of diode acquisition is mark zero PM0；
Step 3：It is done according to what step 2 obtained without the real time environment dust concentration of dust zero and step 1 acquisition initial value
Compare, correct benchmark zero, obtain real time environment dust concentration collection value PM=PM1-PM0.
According to zero formula measuring method of laser dust concentration sample school as described above, it is characterised in that：When one section described
Between in 1s, it is 900ms that wherein light, which opens the period, and it is 100m that light, which closes the period,.
According to zero formula measuring method of laser dust concentration sample school as described above, it is characterised in that：When one section described
Between in 1s, it is 800ms that wherein light, which opens the period, and it is 200ms that light, which closes the period,.
According to zero formula measuring method of laser dust concentration sample school as described above, it is characterised in that：When one section described
Between in 0.5s, it is 400ms that wherein light, which opens the period, and it is 100ms that light, which closes the period,.
The invention also discloses a kind of laser dust sensor, including MCU units, control circuit, conversion circuit, laser hair
Penetrate diode and silicon photo diode, MCU units connected by control circuit laser emitting diode and by conversion circuit plate with
It is connected with silicon photo diode, laser emitting diode and silicon photo diode are set in acquisition darkroom, laser emitting diode hair
Irradiating light beam is vertical with silicon photo diode receiving surface not in same level, it is characterised in that：Within the 1s times, the control of MCU units
Laser emitting diode, which is powered, opens luminance 900ms, and control laser emitting diode closes 100ms；MCU units are by laser
The value of electrical signals that emitting diode acquires when closing is considered no dust zero PM0；Laser emitting diode is powered by MCU units
Value of electrical signals when opening luminance is considered to acquire initial value PM1；Initial value PM1 and no dust zero PM0 will be acquired in MCU journeys
Sequence processing logic is compared to obtain real time environment dust concentration collection value PM.
The beneficial effects of the invention are as follows：First, it may insure that use or ambient humidity, temperature etc. form circuit for a long time
The variation of component parameters, caused by measurement error calibrated in time, improve the accuracy of measurement of real-time dust concentration value；Two
It is that measurement method is simple and reliable, it is of low cost without increasing new hardware；Third, without correcting in particular circumstances, corrected
Journey is easy, and since the smaller period can be used to complete mark zero.
Description of the drawings
Fig. 1 is the circuit connecting relation figure of inventive sensor.
Specific embodiment
Technical scheme of the present invention is described further below in conjunction with attached drawing.
As shown in Figure 1, the laser dust sensor of the present invention includes MCU units, control circuit, conversion circuit, laser hair
Penetrate diode and silicon photo diode, MCU units connected by control circuit laser emitting diode and by conversion circuit plate with
It is connected with silicon photo diode, laser emitting diode and silicon photo diode are set in acquisition darkroom, make laser emitting diode
It is vertical with silicon photo diode receiving surface not in same level to emit light beam, it is ensured that light beam direct irradiation connects less than silicon photo diode
Do not passed through darkroom specular scattering to silicon photo diode receiving surface, within the 1s times, MCU units control Laser emission by face and light beam
Diode, which is powered, opens luminance 900ms, then laser emitting diode is controlled to close 100ms.
The inventive sensor course of work is：MCU units control laser emitting diode shines 900ms, silicon photo diode
Receiving surface scatters light caused by receiving dust particles, scattering light is switched to electric signal, converted circuit conversion by silicon photo diode
Amplification, MCU units obtain acquiring initial value PM1 under perfect condition (absolute status of noiseless influence)；
Then when the power-off of MCU units control laser emitting diode is closed, the not luminous 100ms of laser emitting diode, silicon
Optical diode does not receive any scattering light, i.e., without dust, silicon photo diode is conveyed to MCU units without dust electric signal, and MCU is mono-
The value of electrical signals acquired at this time is considered no dust zero PM0 by member；
Then MCU units will acquire initial value PM1 and no dust zero PM0 and be compared to obtain in MCU programs processing logic
Accurate real time environment dust concentration collection value PM is equivalent to acquisition dust concentration every time and has carried out mark zero, so that passing
Sensor uses for a long time in use or ambient humidity, temperature etc. form the variation of circuit element parameter, caused by measured value
Error is calibrated in time, is improved the precision of the present invention, is made the accuracy of laser dust sensor, can be in industrial site
Accurate response goes out the dust concentration value of environment.
The invention also discloses a kind of zero formula measuring method of laser dust concentration sample school, interior light splitting per second is opened and light closes
Closing two periods is acquired,
Step 1：It is opened in the period in light, MCU units control laser emitting diode shines, and MCU units acquire this period
Interior silicon photo diode signal acquires initial value PM1 for real time environment dust concentration；
Dust particles in the time opened in laser emitting diode energization in the component of darkroom cause Laser emission two
The light scattering that pole pipe is sent out, silicon photo diode receive scattering light and are converted to electric signal, and conversion circuit is converted through I/V to be amplified, MCU
Unit receives voltage signal V, MCU unit and calculates acquisition initial value according to the formula of general optic scattering calculation dust concentration；
Acquire initial value：PM1=V*P
P:The real time environment dust concentration collection value PM of laser sensor and standard substance dust concentration value PM2 during calibration
Ratio coefficient, laser sensor P values are assumed to 1 during calibration, you can first obtain PM；
Ratio coefficient P=PM2/PM；
Step 2：It is closed in the period in light, MCU units close laser emitting diode, and MCU units are closing Laser emission
The silicon photo diode signal of diode acquisition is mark zero PM0, that is, thinks to be now in no dust atmosphere；
Step 3：It is done according to what step 2 obtained without the real time environment dust concentration of dust zero and step 1 acquisition initial value
Compare, correct benchmark zero, obtain accurate real time environment dust concentration collection value.
Real time environment dust concentration collection value：PM=PM1-PM0；
In the present invention, light unlatching period and light closing period can adjust according to actual conditions, in the present embodiment, when light is opened
Section is 900ms, and light closes the period as 100ms；It may also set up light and open the period as 800ms, light closes the period as 200ms, ability
Domain personnel can carry out the setting challenge of time according to demand.Its period may be 0.5s, then can set the light opening time to be
400ms, light close the period as 100ms.
In the present invention, MCU units can also use other cpu chips, and such as DSP, PLC, those skilled in the art can be according to design
Demand is selected.
Apparatus and method of the present invention is by real time environment dust concentration collection value with no dust zero in the processing of MCU programs
Logic is compared and (is equivalent to acquisition dust concentration every time and has all carried out mark zero) so that sensor is in long-time use or ring
Border humidity, temperature etc. formed circuit element parameter variation, caused by measurement error calibrated in time, greatly improve in real time
The accuracy of measurement of dust concentration value, precision reach 1ug.
Claims (5)
1. a kind of zero formula measuring method of laser dust concentration sample school, it is characterised in that：Light splitting unlatching and light whithin a period of time
Two periods of closing are acquired, and include the following steps：
Step 1：It is opened in the period in light, MCU units control laser emitting diode shines, MCU units acquisition silicon photo diode
Signal acquires initial value PM1 for real time environment dust concentration；
Step 2：It is closed in the period in light, MCU units close laser emitting diode, and MCU units are closing two pole of Laser emission
The silicon photo diode signal of pipe acquisition is mark zero PM0；
Step 3：According to what step 2 obtained ratio is done without the real time environment dust concentration of dust zero and step 1 acquisition initial value
Compared with correction benchmark zero obtains real time environment dust concentration collection value PM=PM1-PM0.
2. zero formula measuring method of laser dust concentration sample school according to claim 1, it is characterised in that：Described one section
Time is in 1s, and wherein light opens the period as 900ms, and light closes the period as 100m.
3. zero formula measuring method of laser dust concentration sample school according to claim 1, it is characterised in that：Described one section
Time is in 1s, and wherein light opens the period as 800ms, and light closes the period as 200ms.
4. zero formula measuring method of laser dust concentration sample school according to claim 1, it is characterised in that：Described one section
Time is in 0.5s, and wherein light opens the period as 400ms, and light closes the period as 100ms.
5. a kind of laser dust sensor, including MCU units, control circuit, conversion circuit, laser emitting diode and silicon light two
Pole pipe, MCU units connected by control circuit laser emitting diode and by conversion circuit plate with and silicon photo diode connect,
Laser emitting diode and silicon photo diode are set in acquisition darkroom, laser emitting diode transmitting light beam and silicon photo diode
Receiving surface is not vertically in same level, it is characterised in that：Within the 1s times, MCU units control laser emitting diode is powered
Luminance 900ms is opened, control laser emitting diode closes 100ms；MCU units are adopted when laser emitting diode is closed
The value of electrical signals of collection is considered no dust zero PM0；The electricity that laser emitting diode is powered when opening luminance by MCU units
Signal value is considered to acquire initial value PM1；Acquisition initial value PM1 and no dust zero PM0 is compared in MCU programs processing logic
Obtain real time environment dust concentration collection value PM.
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| CN201711496220.8A CN108169089A (en) | 2017-12-31 | 2017-12-31 | A kind of laser dust sensor and dust concentration sampling zero formula measuring method of school |
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| CN201711496220.8A CN108169089A (en) | 2017-12-31 | 2017-12-31 | A kind of laser dust sensor and dust concentration sampling zero formula measuring method of school |
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Cited By (4)
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| CN109883912A (en) * | 2019-02-28 | 2019-06-14 | 河海大学 | A kind of water body sediment concentration measuring device and method |
| CN110021137A (en) * | 2019-03-28 | 2019-07-16 | 赛特威尔电子股份有限公司 | A kind of smog alarm method, apparatus, smoke alarm device and storage medium |
| CN111766185A (en) * | 2020-07-13 | 2020-10-13 | 恒天益科技（深圳）有限公司 | Laser dust concentration detection method and device |
| CN113670785A (en) * | 2021-09-27 | 2021-11-19 | 北京伟瑞迪科技有限公司 | Particulate matter concentration monitoring method, device, equipment and storage medium |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN109883912A (en) * | 2019-02-28 | 2019-06-14 | 河海大学 | A kind of water body sediment concentration measuring device and method |
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| CN113670785A (en) * | 2021-09-27 | 2021-11-19 | 北京伟瑞迪科技有限公司 | Particulate matter concentration monitoring method, device, equipment and storage medium |
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Application publication date: 20180615 |