CN108152204B

CN108152204B - Phase imaging method and device based on single pixel

Info

Publication number: CN108152204B
Application number: CN201711402494.6A
Authority: CN
Inventors: 戴琼海; 邓超; 索津莉
Original assignee: Tsinghua University
Current assignee: Tsinghua University
Priority date: 2017-12-22
Filing date: 2017-12-22
Publication date: 2020-06-02
Anticipated expiration: 2037-12-22
Also published as: CN108152204A

Abstract

The invention provides a quantitative phase imaging method and a quantitative phase imaging device based on a single pixel, wherein the method comprises the following steps: building a single-pixel imaging light path; performing single-pixel imaging of different wavelengths on an object; and obtaining the phase of the object according to the imaging difference of the single-pixel imaging of different wavelengths. The invention simplifies the light path of the single-pixel technology for phase imaging, improves the speed of single-pixel phase imaging, reduces the measurement times and promotes the development of the single-pixel imaging technology.

Description

Phase imaging method and device based on single pixel

Technical Field

The invention relates to the technical field of computational photography, in particular to a phase imaging method and device based on a single pixel.

Background

The phase imaging is not only a difficulty of the traditional area array CCD imaging mode, but also a difficulty of single-pixel imaging. Neither area array nor single pixel detector can directly measure the object phase. The single-pixel imaging mode needs to utilize an interference mode for measuring the phase, so that the difficulty of an imaging light path is increased, and the imaging time is greatly reduced.

Disclosure of Invention

The present invention is directed to solving, at least to some extent, one of the technical problems in the related art. Therefore, an aspect of the present invention is to provide a single-pixel based phase imaging method that improves imaging speed, reduces the number of measurements, and improves imaging efficiency.

Another aspect of the present invention is directed to a single-pixel based phase imaging apparatus.

In order to achieve the above object, an embodiment of an aspect of the present invention provides a phase imaging method based on a single pixel, including the following steps: building a single-pixel imaging light path; performing single-pixel imaging of different wavelengths on an object; and obtaining the phase of the object by an intensity propagation equation according to the imaging difference of the single-pixel imaging of different wavelengths.

According to the phase imaging method based on the single pixel, the single pixel light path is built, the single pixel imaging with different wavelengths is carried out on the object, and the phase of the object is obtained according to the imaging difference of the single pixel imaging with different wavelengths, so that the purposes of improving the single pixel phase imaging speed, reducing the measurement times and improving the imaging efficiency are achieved.

In some examples, the constructing a single-pixel imaging light path includes: and constructing the single-pixel imaging light path by using a multi-color light source.

In some examples, the single pixel imaging of the object at different wavelengths includes: and carrying out single-pixel imaging of different wavelengths on the object by using a single-pixel imaging principle.

An embodiment of another aspect of the present invention provides a single-pixel based phase imaging apparatus, including: the single-pixel imaging light path building module is used for building a single-pixel imaging light path; the imaging module is used for carrying out single-pixel imaging on the object with different wavelengths; and the phase calculation module is used for obtaining the phase of the object according to the imaging aberration of the single-pixel imaging with different wavelengths by using an intensity propagation equation.

According to the phase imaging device based on the single pixel, the single pixel light path is built, the single pixel imaging with different wavelengths is carried out on the object, and the phase of the object is obtained according to the imaging difference of the single pixel imaging with different wavelengths, so that the purposes of improving the single pixel phase imaging speed, reducing the measurement times and improving the imaging efficiency are achieved.

In some examples, the single-pixel imaging light path construction module constructs the single-pixel imaging light path using a polychromatic light source.

In some examples, the imaging module utilizes single pixel imaging principles to image the object at different wavelengths.

Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.

Drawings

FIG. 1 is a flow chart of a single-pixel based phase imaging method according to an embodiment of the invention;

FIG. 2 is a schematic optical path diagram of a single-pixel based phase imaging method according to an embodiment of the present invention; and

fig. 3 is a schematic diagram of a single-pixel based phase imaging device according to one embodiment of the invention.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.

Fig. 1 is a flowchart of a single-pixel based phase imaging method according to an embodiment of the present invention and fig. 2 is a schematic optical path diagram of the single-pixel based phase imaging method according to the embodiment of the present invention, which is shown in fig. 1 and fig. 2, and the method includes the following steps:

and S1, constructing a single-pixel imaging optical path.

In a specific example, a single pixel imaging optical path is constructed using a polychromatic light source.

And S2, performing single-pixel imaging of different wavelengths on the object.

In a specific example, the object is imaged in different wavelength bands by using a single-pixel imaging principle

And S3, obtaining the phase of the object according to the imaging difference of the single-pixel imaging of different wavelengths.

In a specific example, the phase information of the object is calculated from the intensity propagation equation based on the imaging results of the different wavelength bands.

According to the phase imaging method based on the single pixel, the single pixel light path is built, the single pixel imaging with different wavelengths is carried out on the object, and the phase of the object is obtained according to the imaging difference of the single pixel imaging with different wavelengths, so that the aims of improving the ghost imaging speed, reducing the measurement times and improving the imaging efficiency are achieved.

In addition, an embodiment of the present invention discloses a single-pixel based phase imaging apparatus, as shown in fig. 3, which is a schematic diagram of a single-pixel based phase imaging apparatus according to an embodiment of the present invention, the single-pixel based phase imaging apparatus 10 includes: the device comprises a single-pixel imaging light path building module 101, an imaging module 102 and a phase calculation module 103.

The single-pixel imaging light path building module 101 is used for building a single-pixel imaging light path; the imaging module 102 is used for performing single-pixel imaging on the object with different wavelengths; and the phase calculation module 103 is configured to obtain the phase of the object according to the imaging difference of the single-pixel imaging of different wavelengths. ,

it should be noted that the foregoing explanation of the embodiment of the phase imaging method based on single pixel is also applicable to the phase imaging apparatus based on single pixel, and is not repeated here.

In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be considered limiting of the invention.

Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.

In the present invention, unless otherwise expressly stated or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can, for example, be fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; they may be directly connected or indirectly connected through intervening media, or they may be connected internally or in any other suitable relationship, unless expressly stated otherwise. The specific meanings of the above terms in the present invention can be understood by those skilled in the art according to specific situations.

In the present invention, unless otherwise expressly stated or limited, the first feature "on" or "under" the second feature may be directly contacting the first and second features or indirectly contacting the first and second features through an intermediate. Also, a first feature "on," "over," and "above" a second feature may be directly or diagonally above the second feature, or may simply indicate that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature may be directly under or obliquely under the first feature, or may simply mean that the first feature is at a lesser elevation than the second feature.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.

Claims

1. A phase imaging method based on single pixel is characterized by comprising the following steps:

setting up a single-pixel imaging light path, wherein the setting up of the single-pixel imaging light path comprises: building the single-pixel imaging light path by using a multicolor light source;

performing single-pixel imaging of different wavelengths on an object, wherein the performing of the single-pixel imaging of the different wavelengths on the object comprises performing the single-pixel imaging of the different wavelengths on the object by using a single-pixel imaging principle;

and obtaining the phase of the object according to the imaging difference of single-pixel imaging of different wavelengths, wherein the phase information of the object is calculated by an intensity propagation equation according to the imaging results of different wave bands.

2. A single-pixel based phase imaging apparatus, comprising:

the single-pixel imaging light path building module is used for building a single-pixel imaging light path, wherein the single-pixel imaging light path building module utilizes a multicolor light source to build the single-pixel imaging light path;

the imaging module is used for carrying out single-pixel imaging on the object at different wavelengths, wherein the imaging module carries out single-pixel imaging on the object at different wavelengths by utilizing a single-pixel imaging principle;

and the phase calculation module is used for obtaining the phase of the object according to the imaging difference of the single-pixel imaging of different wavelengths, wherein the phase information of the object is calculated by an intensity propagation equation according to the imaging results of different wave bands.