CN108151902A - Temperature collecting device and method based on platinum resistance - Google Patents
Temperature collecting device and method based on platinum resistance Download PDFInfo
- Publication number
- CN108151902A CN108151902A CN201711332131.XA CN201711332131A CN108151902A CN 108151902 A CN108151902 A CN 108151902A CN 201711332131 A CN201711332131 A CN 201711332131A CN 108151902 A CN108151902 A CN 108151902A
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- Prior art keywords
- temperature
- acquisition
- voltage
- value
- platinum resistance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K2219/00—Thermometers with dedicated analog to digital converters
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention belongs to intelligent temperature acquisition technique fields, and in particular to a kind of temperature collecting device and method based on platinum resistance.Described device includes：Platinum resistance temperature electric pressure converter, A/D acquisition chips, A/D acquisition chips control module, voltage temperature conversion table, processor；Compared with prior art, the present invention is obtained by platinum resistance, and voltage value is sent in FPGA, FPGA can be handled collected real-time voltage value, and by way of tabling look-up, conversion of the voltage value to temperature value, the final real-time acquisition function of realizing to environment temperature are completed.
Description
Technical field
The invention belongs to intelligent temperature acquisition technique fields, and in particular to a kind of temperature collecting device based on platinum resistance and
Method.
Background technology
Platinum resistance temperature sensor has the features such as accuracy of measurement is high, measurement range is big and stability is good, extensive use
In the commercial measurement of medium temperature (- 200 DEG C~650 DEG C) range.
Invention content
(1) technical problems to be solved
The technical problem to be solved by the present invention is to：How a kind of temperature collecting device and method based on platinum resistance are provided.
(2) technical solution
In order to solve the above technical problems, the present invention provides a kind of temperature collecting device based on platinum resistance, described device packet
It includes：Platinum resistance temperature electric pressure converter, A/D acquisition chips, A/D acquisition chips control module, voltage temperature conversion table, processing
Device；
The platinum resistance temperature electric pressure converter is used to also therewith change based on platinum resistance self-resistance value in temperature change
Ambient temperature value is converted to voltage value by the characteristic of change using platinum resistance；
The processor sends acquisition instructions to A/D acquisition chip control modules, and A/D acquisition chip control modules are by matching
A/D acquisition chips are put to be acquired；
The A/D acquisition chips are sent for being acquired in real time to voltage value to voltage temperature conversion table；
Whether the voltage value that the voltage temperature conversion table judgement acquires in real time has been more than that the permission of voltage temperature conversion table is defeated
The range of voltage values entered, the report and alarm mark if going beyond the scope represent that temperature range is abnormal；If the voltage value of acquisition exists
Voltage temperature conversion table is then inquired in allowed band, the corresponding temperature value of current voltage value is obtained, the temperature value of acquisition is provided
It is inquired to processor.
Wherein, the A/D acquisition chips control module is realized by FPGA.
Wherein, the voltage temperature conversion table is realized by FPGA.
Wherein, the processor is dsp processor.
Wherein, the voltage temperature conversion table is environment temperature to be sampled, and more in the range of specified total temperature
It is secondary to measure the preset table for being averaged acquisition, by inputting collection voltages value, then export corresponding temperature value.
In addition, the present invention also provides a kind of temperature acquisition method based on platinum resistance, this method based on the device come
Implement, the method includes：
Step 1：A/D acquisition chip control modules are configured by processor, control A/D acquisition chips control module starts
Temperature transition, A/D acquisition chips control module is by being configured A/D acquisition chips, the sampling of acquisition present input voltage value at this time
Value；
Step 2：After A/D acquisitions is waited for convert, judge whether A/D collection voltages value has been more than voltage temperature conversion
Table allows the range of voltage values of input, and the report and alarm mark if going beyond the scope represents that temperature range is abnormal；If A/D is adopted
Collecting voltage value then inquires voltage temperature conversion table in allowed band, obtains the corresponding temperature value of current voltage value；
Step 3：Voltage temperature conversion table is inquired, and updates transformed temperature value, processor is supplied to inquire, at this time
Temperature acquisition terminates.
Wherein, the A/D acquisition chips control module is realized by FPGA.
Wherein, the voltage temperature conversion table is realized by FPGA.
Wherein, the processor is dsp processor.
Wherein, the voltage temperature conversion table is environment temperature to be sampled, and more in the range of specified total temperature
It is secondary to measure the preset table for being averaged acquisition, by inputting collection voltages value, then export corresponding temperature value.
(3) advantageous effect
Compared with prior art, the present invention is obtained by platinum resistance, and voltage value is sent in FPGA, and FPGA can be to acquisition
To real-time voltage value handled, and by way of tabling look-up, complete the conversion that voltage value arrives temperature value, final realization is to ring
The real-time acquisition function of border temperature.
Description of the drawings
Fig. 1 is platinum resistance temperature harvester schematic diagram.
Fig. 2 is temperature transition flow chart.
Specific embodiment
To make the purpose of the present invention, content and advantage clearer, with reference to the accompanying drawings and examples, to the present invention's
Specific embodiment is described in further detail.
To solve problem of the prior art, the present invention provides a kind of temperature collecting device based on platinum resistance, such as Fig. 1-Fig. 2
Shown, described device includes：Platinum resistance temperature electric pressure converter, A/D acquisition chips, A/D acquisition chips control module, voltage temperature
Spend conversion table, processor；
The platinum resistance temperature electric pressure converter is used to also therewith change based on platinum resistance self-resistance value in temperature change
Ambient temperature value is converted to voltage value by the characteristic of change using platinum resistance；
The processor sends acquisition instructions to A/D acquisition chip control modules, and A/D acquisition chip control modules are by matching
A/D acquisition chips are put to be acquired；
The A/D acquisition chips are sent for being acquired in real time to voltage value to voltage temperature conversion table；
Whether the voltage value that the voltage temperature conversion table judgement acquires in real time has been more than that the permission of voltage temperature conversion table is defeated
The range of voltage values entered, the report and alarm mark if going beyond the scope represent that temperature range is abnormal；If the voltage value of acquisition exists
Voltage temperature conversion table is then inquired in allowed band, the corresponding temperature value of current voltage value is obtained, the temperature value of acquisition is provided
It is inquired to processor.
Wherein, the A/D acquisition chips control module is realized by FPGA.
Wherein, the voltage temperature conversion table is realized by FPGA.
Wherein, the processor is dsp processor.
Wherein, the voltage temperature conversion table is environment temperature to be sampled, and more in the range of specified total temperature
It is secondary to measure the preset table for being averaged acquisition, by inputting collection voltages value, then export corresponding temperature value.
In addition, the present invention also provides a kind of temperature acquisition method based on platinum resistance, this method based on the device come
Implement, the method includes：
Step 1：A/D acquisition chip control modules are configured by processor, control A/D acquisition chips control module starts
Temperature transition, A/D acquisition chips control module is by being configured A/D acquisition chips, the sampling of acquisition present input voltage value at this time
Value；
Step 2：After A/D acquisitions is waited for convert, judge whether A/D collection voltages value has been more than voltage temperature conversion
Table allows the range of voltage values of input, and the report and alarm mark if going beyond the scope represents that temperature range is abnormal；If A/D is adopted
Collecting voltage value then inquires voltage temperature conversion table in allowed band, obtains the corresponding temperature value of current voltage value；
Step 3：Voltage temperature conversion table is inquired, reports and converts mark, and update transformed temperature value, provide
It is inquired to processor, temperature acquisition terminates at this time.
Wherein, the A/D acquisition chips control module is realized by FPGA.
Wherein, the voltage temperature conversion table is realized by FPGA.
Wherein, the processor is dsp processor.
Wherein, the voltage temperature conversion table is environment temperature to be sampled, and more in the range of specified total temperature
It is secondary to measure the preset table for being averaged acquisition, by inputting collection voltages value, then export corresponding temperature value.
Wherein, voltage value is sent in FPGA, and FPGA can be handled, and pass through and table look-up collected real-time voltage value
The mode of (voltage temperature conversion table) completes conversion of the voltage value to temperature value, the final real-time acquisition realized to environment temperature
Function.
The above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the technical principles of the invention, several improvement and deformation can also be made, these are improved and deformation
Also it should be regarded as protection scope of the present invention.
Claims (10)
1. a kind of temperature collecting device based on platinum resistance, which is characterized in that described device includes：Platinum resistance temperature voltage is converted
Device, A/D acquisition chips, A/D acquisition chips control module, voltage temperature conversion table, processor；
The platinum resistance temperature electric pressure converter is in temperature change, self-resistance value also to be changed correspondingly based on platinum resistance
Ambient temperature value is converted to voltage value by characteristic using platinum resistance；
The processor sends acquisition instructions to A/D acquisition chip control modules, and A/D acquisition chip control modules are by being configured A/
D acquisition chips are acquired；
The A/D acquisition chips are sent for being acquired in real time to voltage value to voltage temperature conversion table；
Whether the voltage value that the voltage temperature conversion table judgement acquires in real time has been more than that voltage temperature conversion table allows input
Range of voltage values, the report and alarm mark if going beyond the scope represent that temperature range is abnormal；If the voltage value of acquisition is allowing
In the range of then inquire voltage temperature conversion table, obtain the corresponding temperature value of current voltage value, the temperature value of acquisition be supplied to place
Manage device inquiry.
2. the temperature collecting device based on platinum resistance as described in claim 1, which is characterized in that the A/D acquisition chips control
Molding block is realized by FPGA.
3. the temperature collecting device based on platinum resistance as described in claim 1, which is characterized in that the voltage temperature conversion table
It is realized by FPGA.
4. the temperature collecting device based on platinum resistance as described in claim 1, which is characterized in that the processor is at DSP
Manage device.
5. the temperature collecting device based on platinum resistance as described in claim 1, which is characterized in that the voltage temperature conversion table
It is that environment temperature is sampled in the range of specified total temperature, and repeatedly measures the preset table for being averaged acquisition, leads to
Input collection voltages value is crossed, then exports corresponding temperature value.
6. a kind of temperature acquisition method based on platinum resistance, which is characterized in that this method based on device described in claim 1 come
Implement, the method includes：
Step 1：A/D acquisition chip control modules are configured by processor, control A/D acquisition chip control module start-up temperatures
Conversion, A/D acquisition chips control module is by being configured A/D acquisition chips, the sampled value of acquisition present input voltage value at this time；
Step 2：After A/D acquisitions is waited for convert, judge whether A/D collection voltages value has been more than that voltage temperature conversion table is permitted
Perhaps the range of voltage values inputted, the report and alarm mark if going beyond the scope represent that temperature range is abnormal；If A/D acquisition electricity
Pressure value then inquires voltage temperature conversion table in allowed band, obtains the corresponding temperature value of current voltage value；
Step 3：Voltage temperature conversion table is inquired, and updates transformed temperature value, processor is supplied to inquire, at this time temperature
Acquisition terminates.
7. the temperature acquisition method based on platinum resistance as claimed in claim 6, which is characterized in that the A/D acquisition chips control
Molding block is realized by FPGA.
8. the temperature acquisition method based on platinum resistance as claimed in claim 6, which is characterized in that the voltage temperature conversion table
It is realized by FPGA.
9. the temperature acquisition method based on platinum resistance as claimed in claim 6, which is characterized in that the processor is at DSP
Manage device.
10. the temperature acquisition method based on platinum resistance as claimed in claim 6, which is characterized in that the voltage temperature conversion
Table is that environment temperature is sampled in the range of specified total temperature, and repeatedly measures the preset table for being averaged acquisition,
By inputting collection voltages value, then corresponding temperature value is exported.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711332131.XA CN108151902A (en) | 2017-12-13 | 2017-12-13 | Temperature collecting device and method based on platinum resistance |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711332131.XA CN108151902A (en) | 2017-12-13 | 2017-12-13 | Temperature collecting device and method based on platinum resistance |
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| Publication Number | Publication Date |
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| CN108151902A true CN108151902A (en) | 2018-06-12 |
Family
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| CN201711332131.XA Pending CN108151902A (en) | 2017-12-13 | 2017-12-13 | Temperature collecting device and method based on platinum resistance |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110440944A (en) * | 2019-08-19 | 2019-11-12 | 无锡台翔电子技术发展有限公司 | Motor temperature measurement method of the electric machine controller based on Hall sensor temperature profile |
| CN111398659A (en) * | 2020-04-03 | 2020-07-10 | 一诺仪器（中国）有限公司 | Voltage and temperature measuring method |
| CN111780380A (en) * | 2020-06-15 | 2020-10-16 | 珠海格力电器股份有限公司 | Method and device for controlling running state of compressor |
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| US20130128922A1 (en) * | 2011-11-23 | 2013-05-23 | Emerson Electric Co. | Temperature Measuring Devices and Related Methods |
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| US20130128922A1 (en) * | 2011-11-23 | 2013-05-23 | Emerson Electric Co. | Temperature Measuring Devices and Related Methods |
| CN102809443A (en) * | 2011-11-28 | 2012-12-05 | 凯迈（洛阳）环测有限公司 | Method and circuit for measuring temperature |
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| CN110440944A (en) * | 2019-08-19 | 2019-11-12 | 无锡台翔电子技术发展有限公司 | Motor temperature measurement method of the electric machine controller based on Hall sensor temperature profile |
| CN110440944B (en) * | 2019-08-19 | 2021-02-02 | 无锡台翔电子技术发展有限公司 | Motor temperature measuring method of motor controller based on Hall sensor temperature characteristics |
| CN111398659A (en) * | 2020-04-03 | 2020-07-10 | 一诺仪器（中国）有限公司 | Voltage and temperature measuring method |
| CN111780380A (en) * | 2020-06-15 | 2020-10-16 | 珠海格力电器股份有限公司 | Method and device for controlling running state of compressor |
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Application publication date: 20180612 |