CN108107032A - A kind of Atomic Fluorescence Spectrometer - Google Patents
A kind of Atomic Fluorescence Spectrometer Download PDFInfo
- Publication number
- CN108107032A CN108107032A CN201810083178.5A CN201810083178A CN108107032A CN 108107032 A CN108107032 A CN 108107032A CN 201810083178 A CN201810083178 A CN 201810083178A CN 108107032 A CN108107032 A CN 108107032A
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- CN
- China
- Prior art keywords
- light source
- excitation light
- atomic fluorescence
- photoelectric detector
- atomizer
- Prior art date
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- 230000005284 excitation Effects 0.000 claims abstract description 65
- 238000001514 detection method Methods 0.000 abstract description 20
- 230000035945 sensitivity Effects 0.000 abstract description 10
- 238000012937 correction Methods 0.000 abstract description 5
- 230000003287 optical effect Effects 0.000 abstract description 5
- 239000013307 optical fiber Substances 0.000 description 7
- 238000012360 testing method Methods 0.000 description 4
- 230000005622 photoelectricity Effects 0.000 description 3
- 238000000889 atomisation Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000002798 spectrophotometry method Methods 0.000 description 2
- 238000010183 spectrum analysis Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000003814 drug Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
- G01N21/6404—Atomic fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
Abstract
The present invention provides a kind of Atomic Fluorescence Spectrometer, including excitation light source, convergence reflection unit, atomizer, plus lens, the first photoelectric detector, device for extracting light and the second photoelectric detector；The light beam that excitation light source is launched converges to atomizer through converging reflection unit, and the atomic fluorescence generated in atomizer is accumulated lens and converges to the first photoelectric detector；The light beam that device for extracting light acquisition excitation light source is launched, and by the transmitting beam intensity of the second photoelectric detector detection excitation light source.The present invention provides a kind of Atomic Fluorescence Spectrometer, places excitation light source according to predetermined angle, reduces the volume of Atomic Fluorescence Spectrometer；By setting convergence reflection unit in the optical path so that the light of all different wave lengths can be accurately converged into the center of atomizer, improve the detection sensitivity of atomizer；By detecting the transmitting beam intensity of excitation light source, the energy jitter correction of excitation light source is realized, improves the accuracy of detection and long-time stability of instrument.
Description
Technical field
The present invention relates to field of optical measuring technologies more particularly to a kind of Atomic Fluorescence Spectrometer.
Background technology
Atomic Fluorescence Spectrometer carries out the quantification and qualification of substance, tool using the wavelength and intensity of atomic fluorescence spectral line
Have that spectra1 interfer- is small, high sensitivity, the range of linearity it is wide and can multielement simultaneous determination the advantages that, in food, medicine and environment
The fields of grade are widely applied.
Atomic Fluorescence Spectrometer of the prior art, generally include excitation light source, the first plus lens group, atomizer,
Second plus lens group and photoelectric detector, the light launched from excitation light source enter atomization by the first plus lens group
Device, then, the second plus lens group receive the atomic fluorescence that atomizer is launched, and atomic fluorescence is converged to Photoelectric Detection
In device.
Atomic Fluorescence Spectrometer of the prior art, excitation light source is horizontal positioned, occupies volume greatly and dismounts and replace not
Convenient, excitation light source launches light beam and converges to atomizer through lens, and lens to the convergence focus of different wave length light beam not
Unanimously, so as to cause Atomic Fluorescence Spectrometer detection sensitivity reduction.With Atomic Fluorescence Spectrometer usage time increase or
Person is influenced by factors such as temperature, vibrations, and energy jitter can occur for excitation light source, causes the accuracy of detection of Atomic Fluorescence Spectrometer
It reduces.
The content of the invention
(1) technical problems to be solved
The object of the present invention is to provide a kind of Atomic Fluorescence Spectrometer, solve Atomic Fluorescence Spectrometer body of the prior art
The technical issues of product is big, detection sensitivity is inconsistent low with accuracy of detection.
(2) technical solution
In order to solve the above technical problem, the present invention provides a kind of Atomic Fluorescence Spectrometer, including：
Excitation light source, convergence reflection unit, atomizer, plus lens and the first photoelectric detector；
The light beam that the excitation light source is launched after the convergence reflection unit reflection, converges to the atomizer,
The atomic fluorescence generated in the atomizer converges to first photoelectric detector by the plus lens.
Further, further include：Second photoelectric detector；
Second photoelectric detector is used to detect the transmitting beam intensity of the excitation light source.
Further, further include：
Device for extracting light and the second photoelectric detector；
The light beam that the device for extracting light is launched from the back side acquisition excitation light source of the convergence reflection unit reflecting surface,
And by the beam Propagation collected to second photoelectric detector, second photoelectric detector is used to detect the exciting light
The transmitting beam intensity in source realizes the energy jitter correction of excitation light source.
Further, the angle of the central ray for the light beam that the excitation light source is sent and horizontal plane is more than zero degree.
Further, the flame kernel of the atomizer is located at the focus of the reflection light of the convergence reflection unit
On.
(3) advantageous effect
Atomic Fluorescence Spectrometer provided by the invention places excitation light source according to predetermined angle, reduces atomic fluorescence light
The volume of spectrometer by setting convergence reflection unit in the optical path, makes the light of all different wave lengths can be accurately converged into
The center of atomizer ensure that the uniformity of light sources with different wavelengths detection sensitivity, so as to improve the detection of instrument spirit
Sensitivity by setting device for extracting light and the second photoelectric detector, compensates for excitation light source and shadow of the energy jitter to testing result occurs
It rings, improves the accuracy of detection and long-time stability of Atomic Fluorescence Spectrometer.
Description of the drawings
Fig. 1 is the structure diagram of the Atomic Fluorescence Spectrometer according to the embodiment of the present invention.
Specific embodiment
In order to make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, implement below in conjunction with the present invention
Attached drawing in example, is clearly and completely described the technical solution in the embodiment of the present invention, it is clear that described embodiment
It is part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiment of the present invention, those of ordinary skill in the art
All other embodiments obtained without making creative work belong to the scope of protection of the invention.
Fig. 1 is the structure diagram of the Atomic Fluorescence Spectrometer according to the embodiment of the present invention, as shown in Figure 1, the present invention is real
It applies example and a kind of Atomic Fluorescence Spectrometer is provided, including：
Excitation light source 1, convergence reflection unit 2, atomizer 5,6 and first photoelectric detector 7 of plus lens；
The light beam that the excitation light source 1 is launched after the convergence reflection unit 2 reflects, converges to the atomization
Device 5, the atomic fluorescence generated in the atomizer 5 converge to first photoelectric detector 7 by the plus lens 6.
Specifically, Atomic Fluorescence Spectrometer provided in an embodiment of the present invention, including excitation light source 1, convergence reflection unit 2,
Atomizer 5,6 and first photoelectric detector 7 of plus lens.
The light beam that excitation light source 1 is launched after convergence reflection unit 2 reflects, converges to atomizer 5, the atom
Change the atomic fluorescence generated in device 5 and first photoelectric detector 7 is converged to by the plus lens 6.
Convergence reflection unit 2 can be convergence speculum, also can be made of or can be made of other modes optical fiber group,
It can depend on the circumstances in practical application.
In use, according to the species of article to be detected, the excitation light source of specific wavelength is selected, after opening excitation light source 1, is swashed
Light emitting source 1 launches light beam, and light beam reflects after inciding on convergence reflection unit 2, then forms converged light, converge to original
On sonization device 5, the atom of substance to be detected is stimulated after light beam irradiates in atomizer 5, sends atomic fluorescence, and atom is glimmering
Light is incided on plus lens 6, and convergence transmitted light is formed after plus lens 6, and convergence transmitted light incides into the inspection of the first photoelectricity
It surveys in device 7.
By placing excitation light source according to predetermined angle, and convergence reflection unit is set in the optical path, it is glimmering to reduce atom
The volume of photothermal spectroscopic analyzer, and avoid the problem of plus lens is inconsistent to the convergence focus of different wave length light beam so that institute
The light for having different wave length can be accurately converged into the center of atomizer, improve the detection of Atomic Fluorescence Spectrometer
Sensitivity.
On the basis of above example, further, further include：Second photoelectric detector；
Second photoelectric detector is used to detect the transmitting beam intensity of the excitation light source.
Specifically, after in order to avoid long-time service, energy jitter occurs for the excitation light source of Atomic Fluorescence Spectrometer, causes original
The accuracy of detection of sub- Fluorescence Spectrometer reduces.The embodiment of the present invention also sets up the second photoelectric detector, and the second photoelectric detector is adopted
A part for the light beam that collection excitation light source is launched, and the transmitting beam intensity of the excitation light source collected is detected, and then calculate
Go out the drift value of excitation light source.Second photoelectric detector can be embedded in convergence reflection unit or on convergence reflection unit
A micro through hole is opened, the second photoelectric detector is arranged on the back side of convergence reflection unit reflecting surface, gathers and excites by micro through hole
The transmitting light beam of light source, to avoid the loss of the excitation light source incident laser energy caused by gathering light beam.
When carrying out spectrum analysis, according to the drift value of excitation light source as offset data, it is achieved thereby that excitation light source
Energy jitter correction, avoid excitation light source and influence of the drift to testing result occur, improve Atomic Fluorescence Spectrometer
Accuracy of detection and long-time stability.It should be noted that the second photoelectric detector only gathers the light beam that excitation light source is launched
A seldom part, the ratio of light beam is gathered in practical application to depend on the circumstances, so can be to avoid for example, only gather 0.1%
The loss of excitation light source incident laser energy caused by gathering light beam.
On the basis of above example, further, the Atomic Fluorescence Spectrometer further includes：
3 and second photoelectric detector 4 of device for extracting light；
The light that the device for extracting light 3 is launched from the back side acquisition excitation light source 1 of convergence 2 reflecting surface of reflection unit
Beam, and by the beam Propagation collected to second photoelectric detector 4, second photoelectric detector 4 detects the excitation
The transmitting beam intensity of light source.
Specifically, the growth with the usage time of Atomic Fluorescence Spectrometer or the shadow by factors such as temperature, vibrations
It rings, excitation light source can occur energy jitter, cause the accuracy of detection of Atomic Fluorescence Spectrometer to reduce.Also, it prevents from floating because of energy
The loss that light beam causes excitation light source incident laser energy is gathered during shift correction.Atomic fluorescence spectrophotometry provided in an embodiment of the present invention
Instrument, including device for extracting light and the second photoelectric detector, the light beam launched by device for extracting light acquisition excitation light source, and by the second photoelectricity
Detector is detected the transmitting beam intensity of excitation light source, and then calculates the drift value of excitation light source.
When carrying out spectrum analysis, according to the drift value of excitation light source as offset data, it is achieved thereby that excitation light source
Energy jitter correction, avoid excitation light source and influence of the drift to testing result occur, improve Atomic Fluorescence Spectrometer
Accuracy of detection and long-time stability.It should be noted that device for extracting light only gathers seldom one of the light beam that excitation light source is launched
Point, the ratio of light beam is gathered in practical application to depend on the circumstances, for example, 0.1% is only gathered, it so can be to avoid because gathering light
The loss of Shu Zaocheng excitation light source incident laser energies.
Preferably, the device for extracting light is optical fiber；
One end of the optical fiber is converged embedded in described in reflection unit 2, the optical fiber in the convergence reflection unit 2
End face is on the reflecting surface of the convergence reflection unit 2.The other end of the optical fiber and 4 phase of the second photoelectric detector
Even.The light beam launched by one end acquisition excitation light source 1 for the optical fiber being embedded in the convergence reflection unit 2.
The device for extracting light 3 takes light from the back side of convergence 2 reflecting surface of reflection unit, and excitation is only gathered by optical fiber
A seldom part for the light beam that light source is launched, and existing Atomic Fluorescence Spectrometer need to be taken using plus lens from its front
Light causes the loss of excitation light source incident laser energy so as to avoid the front acquisition light beam from plus lens.
Further, the angle of the central ray for the light beam that the excitation light source 1 is sent and horizontal plane is more than zero degree.
The central light beam for the light beam that excitation light source 1 is sent and the angle of horizontal plane are more than zero degree, i.e. ensure excitation light source 1
Non-aqueous placing flat can extend its service life, and reduce the volume of Atomic Fluorescence Spectrometer.
Preferably, excitation light source 1 sends light beam straight up, so can further extend its service life.
Further, the center of 5 flame of atomizer is located at the focus of the reflection light of the convergence reflection unit 2
On.
By in the focus of the reflection light for being centrally disposed in convergence reflection unit 2 of 5 flame of atomizer, atom can be made
It is most strong to change the energy for the reflection light that device 5 receives, improves detection sensitivity.
Further, the center of first photoelectric detector 7 is located at the focus of the transmitted ray of the plus lens 6
On.
The center of first photoelectric detector 7 is located in the focus of the transmitted ray of plus lens 6, the first photoelectricity can be made
The energy for the transmitted ray that detector 7 receives is most strong, improves detection sensitivity.
Atomic Fluorescence Spectrometer provided by the invention by setting convergence reflection unit in the optical path, makes all different ripples
Long light can be accurately converged into the center of atomizer, and avoid plus lens to different wave length light beam
The problem of focus is inconsistent is converged, improves the detection sensitivity of Atomic Fluorescence Spectrometer.And by setting device for extracting light and
Two photoelectric detectors avoid influence of the energy jitter to testing result of excitation light source, further improve atomic fluorescence light
The stability and accuracy of detection of spectrometer and by the way that excitation light source is placed according to predetermined angle, reduce atomic fluorescence spectrophotometry
The volume of instrument extends the service life of Atomic Fluorescence Spectrometer, is also applied for two pass suitable for single track measurement and multiple tracks measures.
Finally it should be noted that：The above embodiments are merely illustrative of the technical solutions of the present invention, rather than its limitations；Although
The present invention is described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that：It still may be used
To modify to the technical solution recorded in foregoing embodiments or carry out equivalent substitution to which part technical characteristic；
And these modification or replace, do not make appropriate technical solution essence depart from various embodiments of the present invention technical solution spirit and
Scope.
Claims (5)
1. a kind of Atomic Fluorescence Spectrometer, which is characterized in that including：
Excitation light source, convergence reflection unit, atomizer, plus lens and the first photoelectric detector；
The light beam that the excitation light source is launched after the convergence reflection unit reflection, converges to the atomizer, described
The atomic fluorescence generated in atomizer converges to first photoelectric detector by the plus lens.
2. Atomic Fluorescence Spectrometer according to claim 1, which is characterized in that further include：Second photoelectric detector；
Second photoelectric detector is used to detect the transmitting beam intensity of the excitation light source.
3. Atomic Fluorescence Spectrometer according to claim 1, which is characterized in that further include：
Device for extracting light and the second photoelectric detector；
The light beam that the device for extracting light is launched from the back side acquisition excitation light source of the convergence reflection unit reflecting surface, and will
To second photoelectric detector, second photoelectric detector is used to detect the excitation light source beam Propagation collected
Emit beam intensity.
4. Atomic Fluorescence Spectrometer according to claim 1, which is characterized in that in the light beam that the excitation light source is sent
The angle of heart light and horizontal plane is more than zero degree.
5. Atomic Fluorescence Spectrometer according to claim 1, which is characterized in that the center of the atomizer flame is located at
In the focus of the reflection light of the convergence reflection unit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810083178.5A CN108107032B (en) | 2018-01-29 | 2018-01-29 | Atomic fluorescence spectrometer |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810083178.5A CN108107032B (en) | 2018-01-29 | 2018-01-29 | Atomic fluorescence spectrometer |
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| Publication Number | Publication Date |
|---|---|
| CN108107032A true CN108107032A (en) | 2018-06-01 |
| CN108107032B CN108107032B (en) | 2024-03-15 |
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|---|---|---|---|
| CN201810083178.5A Active CN108107032B (en) | 2018-01-29 | 2018-01-29 | Atomic fluorescence spectrometer |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110361365A (en) * | 2019-02-03 | 2019-10-22 | 北京理工大学 | A kind of scanning fluoroscopic imaging device and the portable QPCR device using it |
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| JPH01207663A (en) * | 1988-02-15 | 1989-08-21 | Canon Inc | Method and instrument for sample inspection |
| US5590660A (en) * | 1994-03-28 | 1997-01-07 | Xillix Technologies Corp. | Apparatus and method for imaging diseased tissue using integrated autofluorescence |
| CN104597011A (en) * | 2014-12-31 | 2015-05-06 | 北京博晖创新光电技术股份有限公司 | Excitation light source drift correction device and fluorescence spectrograph |
| CN105628662A (en) * | 2015-12-31 | 2016-06-01 | 北京博晖创新光电技术股份有限公司 | Atomic fluorescence spectrophotometer |
| CN205317672U (en) * | 2016-01-25 | 2016-06-15 | 北京宝德仪器有限公司 | A optical system for atomic fluorescence spectrometer |
-
2018
- 2018-01-29 CN CN201810083178.5A patent/CN108107032B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01207663A (en) * | 1988-02-15 | 1989-08-21 | Canon Inc | Method and instrument for sample inspection |
| US5590660A (en) * | 1994-03-28 | 1997-01-07 | Xillix Technologies Corp. | Apparatus and method for imaging diseased tissue using integrated autofluorescence |
| CN104597011A (en) * | 2014-12-31 | 2015-05-06 | 北京博晖创新光电技术股份有限公司 | Excitation light source drift correction device and fluorescence spectrograph |
| CN105628662A (en) * | 2015-12-31 | 2016-06-01 | 北京博晖创新光电技术股份有限公司 | Atomic fluorescence spectrophotometer |
| CN205317672U (en) * | 2016-01-25 | 2016-06-15 | 北京宝德仪器有限公司 | A optical system for atomic fluorescence spectrometer |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110361365A (en) * | 2019-02-03 | 2019-10-22 | 北京理工大学 | A kind of scanning fluoroscopic imaging device and the portable QPCR device using it |
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| CN108107032B (en) | 2024-03-15 |
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