CN108078580B - Radiation imaging method and system thereof - Google Patents
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- 238000003384 imaging method Methods 0.000 title claims abstract description 22
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- 230000005540 biological transmission Effects 0.000 claims description 26
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Abstract
The invention discloses a radiation imaging method, which comprises the following steps of radiating beams onto an object through a radiation source; detecting the beam passing through the object by a detector and outputting projection data; obtaining the scattering intensity without an object; obtaining a scattering transmittance with an object; calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; correcting the projection data based on the scattering intensity with an object; and generating an image using the corrected projection data.
Description
Technical Field
The invention relates to a radiation imaging technology, in particular to a radiation imaging method and a radiation imaging system.
Background
Non-invasive imaging techniques, such as Computed Tomography (CT), can obtain images of internal structures of an object without performing destructive operations on the object. In CT imaging systems, scatter signals in X-ray measurements can cause shadowing artifacts, reducing image resolution, and causing all other artifacts that reduce image quality. Meanwhile, scatter signals from the background are one of the main sources of deviation in quantitative measurements of reconstructed images of CT imaging systems.
During a CT scan, the background (e.g., a butterfly filter, gantry, or other component in a CT system) generates scatter upon receiving X-rays, even when an anti-scatter grid is used. X-ray scatter in CT scans is the root cause of many types of image artifacts and reduced image resolution, which can lead to misdiagnosis in clinical CT and thus needs to be corrected.
Disclosure of Invention
In one embodiment, the present disclosure provides a radiological imaging method including the steps of radiating a beam onto an object through a radiation source; detecting the beam passing through the object by a detector and outputting projection data; obtaining the scattering intensity without an object; obtaining a scattering transmittance with an object; calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; correcting the projection data based on the scattering intensity with an object; and generating an image using the corrected projection data.
In another embodiment, the present disclosure provides a radiological imaging system including a radiation source for radiating a beam onto an object; a detector for detecting the beam passing through the object; a data processing system for outputting projection data; and a controller configured to obtain a scattering intensity in the absence of an object; obtaining a scattering transmittance with an object; calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; correcting the projection data based on the scattering intensity with an object; and generating an image using the corrected projection data.
Drawings
These and other features, aspects, and advantages of the present invention will become better understood when the following detailed description is read with reference to the accompanying drawings, wherein:
FIG. 1 is a perspective view of a radiological imaging system in accordance with an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of a radiological imaging system showing how background scatter intensity is obtained in the absence of an object;
FIG. 3 is a schematic diagram of a radiological imaging system showing how a primary beam is sought along a scatter beam in different views;
FIG. 4 is a schematic diagram of a radiological imaging system showing how adjacent primary beams of scattered beams are sought;
FIG. 5 is a diagram illustrating the calculation of the incident efficiency of a scattered beam;
FIG. 6 is a flow chart of a radiological imaging method according to an embodiment of the present disclosure;
fig. 7 is a block diagram of a radiological imaging system according to an embodiment of the present disclosure.
Detailed Description
To assist those skilled in the art in understanding the claimed subject matter, a detailed description of the invention is provided below along with accompanying figures. In the following detailed description of the embodiments, well-known functions or constructions are not described in detail in order to avoid unnecessarily obscuring the present disclosure.
Unless otherwise defined, technical or scientific terms used in the claims and the specification should have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The use of "first," "second," and similar terms in the description and claims of the present application do not denote any order, quantity, or importance, but rather the terms are used to distinguish one element from another. Also, the use of the terms a, an, etc. do not denote a limitation of quantity, but rather denote the presence of at least one. The word "or" and the like are meant to be inclusive and mean one or all of the listed items. The word "comprising", "including" or "having", and the like, means that the element or item appearing before "comprises" or "having" covers the element or item listed after "comprising" or "having" and its equivalent, and does not exclude other elements or items.
Embodiments of the invention may be described in terms of functional components and various processing steps. It should be appreciated that such functional components may be realized by any number of hardware, software, and/or firmware components configured to perform the specified functions. For example, embodiments of the invention may employ various integrated circuit components, e.g., memory elements, digital signal processing elements, logic elements, look-up tables, or the like, which may carry out a variety of functions as a "controller" under the control of one or more microprocessors or other control devices. Further, the system described herein illustrates only one exemplary embodiment.
Referring to FIG. 1 of the drawings, in a Computed Tomography (CT) imaging system 10, a radiation source 14, such as an X-ray source, emits a fan beam or beams through a bowden filter 15 onto an object, which may be a patient 22 or an item of baggage. Hereinafter, the term "object" shall include anything that can be imaged. The beam, or beams, after being attenuated by the object, impinges upon a detector array 18 having a plurality of detectors 20 on the other side of gantry 12. The intensity of the attenuated beam radiation received by the detector array is typically dependent upon the attenuation of the X-ray beam or beams through the object. Each detector of the detector array corresponds to each beam, which produces a separate electrical signal that represents the attenuated beam received via each detector. The electrical signals are transmitted to a data processing system 30 to generate projection data, which ultimately generates an image.
Typically, the X-ray source and the detector array rotate about the gantry 12 and rotate about the object in the imaging plane. Table 46 moves patient 22 fully or partially through gantry opening 48 of fig. 1. The X-ray source typically comprises an X-ray tube which emits an X-ray beam at a focal spot. In a typical application, an X-ray detector generally includes a collimator 32 for collimating an X-ray beam received by the detector, a scintillator for converting X-rays to light energy adjacent the collimator, and a photodiode for receiving light energy from the adjacent scintillator and producing an electrical signal. Typically, each scintillator in a scintillator array converts X-rays to light energy. Each scintillator discharges light energy onto its adjacent photodiode, and each photodiode detects the light energy and generates a corresponding electrical signal. The output of the photodiode is then transmitted to a data processing system for image reconstruction.
Referring to fig. 2-6 of the drawings, a radiological imaging method is disclosed. The method includes the steps of, 110) radiating a beam onto the object by a radiation source 14; 120) detecting the beam passing through the object by the detector 20 and outputting projection data; 130) obtaining the scattering intensity without an object; 140) obtaining a scattering transmittance with an object; 150) calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; 160) correcting the projection data based on the scattering intensity with an object; 170) and generating an image using the corrected projection data.
Wherein obtaining the scattering intensity in the absence of an object comprises measuring a first projected intensity of the beam in the absence of an object; measuring a second projection intensity of the beam in the absence of the object and in the absence of scattering; and obtaining the scattering intensity without the object according to the second projection intensity and the first projection intensity. The first and second projection intensities of the beam are received and detected by the same detector along the beam. The scattering intensity in the absence of an object is calculated by taking the projection intensity of the beam in the absence of an object and without scattering and the projection intensity of the beam in the absence of an object as a pair of differences.
Referring to fig. 2, scattering including at least one scattered beam is blocked by a scattering baffle 34 having an opening 35 therethrough, whereby the scattered beam can be removed. The openings of the scattering baffle are narrow slits or pinholes. The narrow slit allows a narrow beam, such as a row of beams, to pass through, thereby blocking most of the scattered beam. Since the pinhole allows only one beam to pass, this makes the result more accurate and thus the pinhole can block the scattering more ideally than a narrow slit. Scattering in this embodiment means the above-mentioned background scattering. In another example, the X-ray source is adjusted to emit a narrow beam onto the detector, so that a second projection intensity of said beam in the absence of the object and without scattering is obtained.
Referring to fig. 3 and 4 of the drawings, obtaining the scattering transmittance with an object includes dividing the scattering into at least one scattering beam by dividing a reception angle of the scattering; separately finding each primary beam along each scattered beam; obtaining the scattering transmittance with an object based on the transmittance of each primary beam.
Referring to fig. 4 of the drawings, the reception angle is the range of angles over which the scattered beam can be received. The angle range is equally divided into at least one portion, or at least two portions, such as 10 portions, representing 10 scattered beams, so that the angles of incidence of the 10 scattered beams can be determined and analyzed. In another example, the reception angle may also be divided unequally. In a special case the reception angle is divided into parts, which means that the reception angle is not divided, and a scatter beam with a certain angle is used to represent the scatter in this case.
In one embodiment, separately finding each primary beam along each scatter beam comprises separately finding each primary beam passing through said each scatter beam in a different view.
As described above, the X-ray source and the detector array are rotated about the gantry 12 and about the object in the imaging plane. When the source and detector are rotated to another angle, a different view is created. In these views, the primary beam of the scattered beam through a predetermined angle of incidence can be found. As shown in fig. 3, when the radiation source and the detector are rotated, the primary beam 51 overlaps the scatter beam 52, so that the primary beam 51 may be used as a primary beam along the scatter beam.
Finding each primary beam passing through said each scatter beam in a different view comprises determining a position of said each scatter beam, respectively, and obtaining each primary beam in a different view according to said position of each scatter beam, respectively. The position of the beam is determined by the gamma angle and the viewing angle of the beam. Separately determining the position of each of the scattered beams includes separately calculating a gamma angle and a view angle of each of the scattered beams. The gamma angle is the angle between the scattered beam and the ISO-centre and the line connecting the focal points of the radiation sources, and the view angle is the angle of rotation between the radiation source and the detector.
Obtaining each primary beam in a different view includes establishing a database of primary beams relative to the gamma angle and the view angle, and obtaining each primary beam by interpolation and from the gamma angle and the view angle of each scattered beam. The relationship of the primary beam and gamma angle to the viewing angle can be obtained by simulation and a database of this relationship is built up. Thus, when the gamma angle and view angle are known, the primary beam with this gamma angle and view angle can be determined. In practice, two primary beams of opposite directions can be found, but only primary beams adjacent to the scatter beam or primary beams having the same direction of incidence are the best implementations to employ as primary beams.
In another embodiment, separately finding each primary beam along each scatter beam comprises separately finding each primary beam adjacent to said each scatter beam. Separately finding each primary beam adjacent to said each scatter beam comprises finding a primary beam that passes through a midpoint of an object along the scatter beam.
Referring to fig. 4, a scattered beam 52 passes through an object. The length of a to b is the portion of the scattered beam 52 that passes through the object. The primary beam passing through the center o of the length a-b is the neighboring primary beam 51 sought. This is a specific method, but not the only method. A similar method may also be used to find scattered beams adjacent to the primary beam. The adjacent primary beam corresponds to the adjacent detector next to detector 20, and said detector 20 corresponds to scatter beam 52 in fig. 4. In another example, the detector corresponding to the adjacent primary beam may also be not next to the detector 20 corresponding to the scatter beam 52.
Obtaining the scattering transmittance with an object based on the transmittance of each primary beam comprises weighting the transmittance of each primary beam along each scattering beam separately, calculating an average transmittance based on the transmittance of each primary beam and the weights, and adjusting the average transmittance to the scattering transmittance in accordance with a transmittance ratio between primary beams and scattering.
The transmissivity of the primary beam is obtained by dividing the transmitted primary beam by the initially emitted primary beam. The transmitted primary beam is represented by IscanIs shown in the formula IscanDetected data scanned by the detector along the primary beam in the presence of an object; initial primary beam with IairIs shown in the formula IairIs the detected data of the scan of the detector along the primary beam without the object. Thus, the primary beam has a transmission of Iscan/IairThe transmission of each primary beam along each scatter beam can thus be calculated separately. The weights are determined based on the angle of incidence of each scattered beam, respectively. The angle of incidence is defined as the angle between the scattered beam and the detector, and the angle of incidence is less than 90 degrees. The smaller the angle of incidence of the scattered beam, the less weight is given to the transmission of the primary beam along the scattered beam. When the angle of incidence is close to 90 degrees, the weight will be high.
The weight is related to the efficiency of the scattered beam. Efficiency is determined bydetectedIs divided by IincidentTo be defined. I isdetectedIs the intensity detected by the scattered beam. I isincidentIs the intensity of the scattered beam emission. Specifically, the weights are determined by calculating efficiencies of each of the scattered beams, respectively, and normalizing each of the efficiencies, wherein the efficiencies are obtained by enabling the scattered beams having a certain angle to reach the probeThe width of the detector is divided by the width of the detector.
As shown in FIG. 5, the efficiency rate is a value that determines the efficiency by dividing the distance L1 by the distance L. Where L1 is the width at which a scattered beam with a certain angle of incidence can reach the detector. In fig. 5, L1 is the distance between the leftmost point on the detector where a scattered beam with an angle of incidence can strike the detector and the right edge of the detector. L is the width of the detector. For example, when the angle of incidence of the scattered beam is 90 degrees, L1 is equal to L, and the efficiency is 1; when the angle of incidence of the scattered beam is 45 degrees, the scattered beam will not reach the detector, so the efficiency is 0. Normalizing the efficiency of each scattered beam yields a weight for each transmission along the primary beam of each scattered beam.
The method of calculating an average transmission from each transmission and weight of each primary beam comprises multiplying each transmission of each primary beam by its weight, respectively, and summing the results to obtain the average transmission.
Adjusting the average transmission to the scattering transmission based on a transmission ratio between the primary beam and the scattering comprises establishing a database of transmission ratios related to object thickness, filter thickness, primary beam spectrum and scattering beam spectrum, calculating the object thickness and filter thickness through which the beam passes, and the primary beam spectrum and scattering spectrum, determining the transmission ratio from the database, and multiplying the transmission ratio by the average transmission to obtain the scattering transmission.
As shown in fig. 3, for a certain beam, the thickness of the object through which the beam passes and the thickness of a filter, such as a bowtie filter, are known, and the primary beam spectrum and the scattered spectrum are also available. Thus, a database of transmittance ratios related to the thickness of the object and the thickness of the butterfly filter, as well as the primary beam spectrum and the scattered spectrum, is built up by simulations (e.g., monte carlo simulations). Therefore, when these values and spectra are calculated, the transmittance ratio between the primary beam and the scatter can be obtained from the database by interpolation. The obtained transmittance ratio is multiplied by the average transmittance, and the scattering transmittance can be finally obtained.
Calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object includes multiplying the scattering with no object by the scattering transmittance with an object, and finally obtaining the scattering intensity with an object.
Corrected projection data are obtained by removing the scatter intensity from the total intensity of the projection data, and a clearer image can be generated from the corrected projection data.
When there is a detector array comprising a plurality of detectors, and the plurality of detectors correspond to a plurality of beams, respectively, the scatter intensity of each beam can be obtained by the above method. All scatter intensities corresponding to all detectors respectively can be obtained. All scatter intensities are subtracted from the total projection data and a corrected image can be obtained.
Referring to FIG. 7 of the drawings, the present invention also discloses a radiological imaging system including a radiation source 14 for radiating a beam onto an object; a detector 20 for detecting the beam passing through the object; a data processing system 30 for outputting projection data; and a controller 40 configured to obtain a scattering intensity in the absence of an object; obtaining a scattering transmittance with an object; calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; correcting the projection data based on the scattering intensity in the presence of the object; and generating an image using the corrected projection data. The functions of the other controllers are as described previously.
This written description uses examples to describe the disclosure, including the best mode, and to enable any person skilled in the art to practice the disclosure, including making and using any devices or systems and performing any incorporated methods. The patentable scope of the disclosure is defined by the claims, and may include other examples that occur to those skilled in the art. Such other examples are intended to be within the scope of the claims if they have structural elements that do not differ from the literal language of the claims, or if they include equivalent structural elements with insubstantial differences from the literal languages of the claims.
Claims (15)
1. A radiological imaging method, characterized in that it comprises:
radiating a beam onto the object by a radiation source;
detecting the beam passing through the object by a detector and outputting projection data;
obtaining the scattering intensity without an object;
obtaining a scattering transmittance with an object;
calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object;
correcting the projection data based on the scattering intensity with an object; and
an image is generated using the corrected projection data.
2. The method of claim 1, wherein: wherein obtaining the scattering intensity in the absence of an object comprises measuring a first projected intensity of the beam in the absence of an object; measuring a second projection intensity of the beam in the absence of the object and in the absence of scattering; and obtaining the scattering intensity without the object according to the second projection intensity and the first projection intensity.
3. The method of claim 1, wherein: obtaining the scattering transmittance with an object includes dividing the scattering into at least one scattering beam by dividing a reception angle of the scattering; separately finding each primary beam along each scattered beam; obtaining the scattering transmittance with an object based on the transmittance of each primary beam.
4. The method of claim 3, wherein: separately finding each primary beam along each scatter beam comprises separately finding each primary beam adjacent to said each scatter beam.
5. The method of claim 4, wherein: separately finding each primary beam adjacent to said each scatter beam comprises finding a primary beam that passes through a midpoint of an object along each scatter beam.
6. The method of claim 3, wherein: separately finding each primary beam along each scatter beam comprises separately finding each primary beam passing through said each scatter beam in a different view.
7. The method of claim 6, wherein: finding each primary beam passing through said each scatter beam in a different view comprises determining a position of said each scatter beam, respectively, and obtaining each primary beam in a different view according to said position of each scatter beam, respectively.
8. The method of claim 7, wherein: separately determining the position of each of the scattered beams includes separately calculating a gamma angle and a view angle of each of the scattered beams.
9. The method of claim 8, wherein: obtaining each primary beam in a different view includes establishing a database of primary beams relative to the gamma angle and the view angle, and obtaining each primary beam by interpolation and from the gamma angle and the view angle of each scattered beam.
10. The method of claim 3, wherein: obtaining the scattering transmittance with the object based on the transmittance of each primary beam comprises weighting the transmittance of each primary beam along each scattering beam separately, calculating an average transmittance based on the transmittance of each primary beam and the weights, and adjusting the average transmittance to the scattering transmittance in accordance with a transmittance ratio between a primary beam spectrum and a scattering spectrum.
11. The method of claim 10, wherein: the weights are determined based on the angle of incidence of each scattered beam, respectively.
12. The method of claim 10, wherein: the weights are determined by calculating the efficiency of each scattered beam, respectively, and normalizing each efficiency, wherein the efficiency is calculated by dividing the width of the detector that can be reached by the scattered beam with a certain angle by the width of the detector.
13. The method of claim 10, wherein: calculating the average transmission includes multiplying each transmission of each of the primary beams by its weight, respectively, and summing the results to obtain the average transmission.
14. The method of claim 10, wherein: adjusting the average transmission to the scattering transmission includes establishing a database of transmission ratios related to object thickness, filter thickness, and primary beam spectrum and scattering spectrum, calculating object thickness and filter thickness, and primary beam spectrum and scattering spectrum through which the beam passes, determining a transmission ratio from the database, and multiplying the transmission ratio by the average transmission to obtain the scattering transmission.
15. A radiological imaging system, characterized by comprising:
a radiation source for radiating a beam to the object;
a detector for detecting the beam passing through the object;
a data processing system for outputting projection data; and
a controller configured to obtain a scattering intensity in the absence of an object; obtaining a scattering transmittance with an object; calculating the scattering intensity with an object based on the scattering intensity without an object and the scattering transmittance with an object; correcting the projection data based on the scattering intensity with an object; and generating an image using the corrected projection data.
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CN1720860A (en) * | 2004-06-03 | 2006-01-18 | 西门子公司 | Method for compensating image interference in radiation photograph |
CN101401125A (en) * | 2006-03-16 | 2009-04-01 | 佳能株式会社 | Imaging system, method for processing thereof and program |
CN101810488A (en) * | 2009-01-29 | 2010-08-25 | 皇家飞利浦电子股份有限公司 | Detection value correction apparatus |
CN101987021A (en) * | 2010-12-06 | 2011-03-23 | 中国科学院深圳先进技术研究院 | Scattering correction method of CT system and CT system |
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CN1720860A (en) * | 2004-06-03 | 2006-01-18 | 西门子公司 | Method for compensating image interference in radiation photograph |
CN101401125A (en) * | 2006-03-16 | 2009-04-01 | 佳能株式会社 | Imaging system, method for processing thereof and program |
CN101810488A (en) * | 2009-01-29 | 2010-08-25 | 皇家飞利浦电子股份有限公司 | Detection value correction apparatus |
CN101987021A (en) * | 2010-12-06 | 2011-03-23 | 中国科学院深圳先进技术研究院 | Scattering correction method of CT system and CT system |
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