CN108065944B - Method and device for adapting flat panel detector and grid and medical imaging system - Google Patents
Method and device for adapting flat panel detector and grid and medical imaging system Download PDFInfo
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- CN108065944B CN108065944B CN201611032685.3A CN201611032685A CN108065944B CN 108065944 B CN108065944 B CN 108065944B CN 201611032685 A CN201611032685 A CN 201611032685A CN 108065944 B CN108065944 B CN 108065944B
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- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
- A61B6/5205—Devices using data or image processing specially adapted for radiation diagnosis involving processing of raw data to produce diagnostic data
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/52—Devices using data or image processing specially adapted for radiation diagnosis
- A61B6/5258—Devices using data or image processing specially adapted for radiation diagnosis involving detection or reduction of artifacts or noise
Abstract
The invention provides a method and equipment for adapting a flat panel detector and a grid and a medical imaging system. The method is used for a combination of a flat panel detector and a grid, comprising: acquiring an exposed first image; acquiring basic information of the flat panel detector; acquiring the theoretical frequency of grid lines of the grid; determining the actual sampling frequency of the flat panel detector according to the basic information of the flat panel detector, and calculating the estimated frequency of grid line artifacts in a first image caused by the grid lines according to the theoretical frequency of the grid lines and the actual sampling frequency of the flat panel detector; setting a maximum allowable deviation interval by taking the estimated frequency of the grating artifact as a center; and searching the actual frequency of the grid line artifact in the maximum allowable deviation interval, and removing the grid line artifact in the first image to obtain a second image. The method can achieve an ideal grid line artifact removing effect aiming at different combinations of the flat panel detector and the grid.
Description
Technical Field
The invention relates to the field of image processing, in particular to a method and a device for adapting a flat panel detector and a grid, and also relates to a medical imaging system.
Background
The grid is a key component of an X-ray imaging diagnosis system and plays a decisive role in removing scattered rays and increasing image contrast. The system is commonly used with a high-frequency static grid (high-frequency static grid) and a low-frequency dynamic grid (low-frequency dynamic grid), and due to the defects that the high-frequency static grid is high in price and large in attenuation, the low-frequency dynamic grid can increase the complexity of the system and the like, the low-frequency static grid is applied to the system by more and more products at present, and artifacts generated by the grid are removed by adopting an image post-processing algorithm.
The combination of the grid and the flat panel detector plays an important role in the artifact removal effect, in many X-ray products, one medical imaging system can adopt two or more flat panel detectors (flat panel detector shielding) of different types, and the existing scheme cannot achieve the good artifact removal effect aiming at the combination of different flat panel detectors and the grid.
Disclosure of Invention
In view of the above, an aspect of the present invention provides a method for adapting a flat panel detector to a grid. A method of adapting a flat panel detector and a grid according to an embodiment is used for a combination of a flat panel detector and a grid, the method comprising: a) acquiring an exposed first image; b) acquiring basic information of the flat panel detector; c) obtaining a grid line theoretical frequency f of the grid lineg(ii) a d) Determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAccording to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in the first image caused by the gridestimate(ii) a e) Using the estimated frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; and f) searching the actual frequency of the grid line artifact in the maximum allowable deviation interval, and removing the grid line artifact in the first image to obtain a second image.
Optionally, the method for adapting a flat panel detector to a grid further includes: g) and judging whether the second image reaches a preset artifact removal standard, and if the second image reaches the preset artifact removal standard, outputting the second image.
Optionally, the method for adapting a flat panel detector to a grid further includes: and if the second image does not reach the preset artifact removing standard, performing the steps b) to g) again.
Optionally, if the second image does not reach the preset artifact removal standard and is accumulated to a predetermined number of times, an error is reported.
Optionally, wherein the basic information of the flat panel detector acquired in step b) includes: the size, pixel value and pixel shape of the flat panel detector; and wherein in step d) the actual sampling frequency f of the flat panel detector is calculated from the pixel valuess。
Optionally, wherein the step d) further comprises calculating the estimated frequency f of the grating artifact byestimate：
Judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
optionally, in step g), it is determined whether the second image meets a preset artifact removal criterion based on the one-dimensional fourier spectrogram of the first image and the second image manually or automatically.
The invention also provides a device for adapting the flat panel detector and the grid. An adaptation device of a flat panel detector and a grid according to an embodiment for use in combination of a flat panel detector and a grid, the adaptation device comprising: an acquisition device for acquiring the exposed first image; an acquisition device for acquiring basic information of the flat panel detector and acquiring a grid line theoretical frequency f of the grid lineg(ii) a A calculation device for determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAccording to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in the first image caused by the gridestimate(ii) a Setting means for using the estimated frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; and an artifact removing device, configured to search an actual frequency where the grid line artifact is located within the maximum allowable deviation interval, and remove the grid line artifact in the first image to obtain a second image.
Optionally, the apparatus for adapting a flat panel detector to a grid further comprises: and the judging device is used for judging whether the second image reaches a preset artifact removing standard or not.
Optionally, the apparatus for adapting a flat panel detector to a grid further comprises: and the output device is used for outputting the second image when the second image reaches the preset artifact removing standard.
Optionally, the apparatus for adapting a flat panel detector to a grid further comprises: and the control device is used for controlling the acquisition device to perform acquisition again when the second image does not reach the preset artifact removal standard, the calculation device to perform calculation again, the setting device to perform setting again, the artifact removal device to perform artifact removal again, and the judgment device to perform judgment again.
Optionally, the apparatus for adapting a flat panel detector to a grid further comprises: and the error reporting device is used for reporting an error when the second image does not reach the preset artifact removal standard and is accumulated to a preset number of times.
Optionally, wherein the computing means is further configured to compute the estimated frequency f of the grating artifacts byestimate：
Judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
in yet another aspect, the present invention provides a medical imaging system, which includes any one of the flat panel detectors and a grid adapting device.
In practice, the operator will use different combinations of flat panel detectors and grids according to different usage needs. The invention provides a method and equipment for adapting a flat panel detector and a grid wire grid, which can realize ideal grid wire artifact removal effect aiming at different hardware combinations, and a medical imaging system.
Drawings
The above and other features and advantages of the present invention will become more apparent to those of ordinary skill in the art by describing in detail embodiments thereof with reference to the attached drawings, in which:
fig. 1 is a flow chart of a method for adapting a flat panel detector to a grid according to an embodiment of the invention.
Fig. 2 is a flow chart of a method for adapting a flat panel detector to a grid according to another embodiment of the invention.
Fig. 3 is a one-dimensional fourier energy spectrum of a first image and a second image obtained by applying the method of adapting a flat panel detector to a grid shown in fig. 2.
Fig. 4 is a flow chart of a method for adapting a flat panel detector to a grid according to a further embodiment of the invention.
Fig. 5 is a block schematic diagram of an adaptation device of a flat panel detector and a grid according to an embodiment of the invention.
Wherein the reference numbers are as follows:
100. method for adapting 200, 400 flat panel detector and grid
Adapting device of 500 flat panel detector and grid
S101-S106 steps
S201-S208 steps
S401-S410 steps
501 collecting device
502 acquisition device
503 computing device
504 setting device
505 artifact removing device
Detailed Description
In order to more clearly understand the technical features, objects, and effects of the present invention, embodiments of the present invention will now be described with reference to the accompanying drawings, in which like reference numerals refer to like parts throughout.
"exemplary" means "serving as an example, instance, or illustration" herein, and any illustration, embodiment, or steps described as "exemplary" herein should not be construed as a preferred or advantageous alternative.
For the sake of simplicity, the drawings only schematically show the parts relevant to the present invention, and they do not represent the actual structure as a product. In addition, in order to make the drawings concise and understandable, components having the same structure or function in some of the drawings are only schematically illustrated or only labeled.
In this document, "a" or "an" means not only "but also" more than one ". In this document, "first", "second", and the like are used only for distinguishing one from another, and do not indicate the degree of importance and order thereof, and the premise that each other exists, and the like.
Referring first to fig. 1, fig. 1 is a flowchart of a method for adapting a flat panel detector to a grid according to an embodiment of the present invention. As shown in fig. 1, the method 100 is used for a combination of a flat panel detector and a grid, comprising the steps of:
step S101: acquiring an exposed first image;
step S102: acquiring basic information of the flat panel detector;
step S103: obtaining a grid line theoretical frequency f of a gridg；
Step S104: determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAnd according to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in a first image caused by gridsestimate；
Step S105: by estimated frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; and
step S106: and searching the actual frequency of the grid line artifact in the maximum allowable deviation interval, and removing the grid line artifact in the first image to obtain a second image.
The following describes the flow and the contents of the steps of the method 100:
collecting the exposed first image (step S101), and respectively acquiring basic information of the flat panel detector and a grid line theoretical frequency f of the grid lineg(step S102 and step S103). The grid is taken as a low-frequency static grid for example, but the invention is not limited thereto. It is easily understood by those skilled in the art that the concept of "theoretical frequency of grid lines" appearing herein is sometimes also referred to as "grid line interval information", and thus the "theoretical frequency of grid lines" appearing herein is understood to cover the meaning of "theoretical frequency of grid lines", "grid line interval information" or "calculation/knowledge of theoretical frequency of grid lines from grid line interval information" and the like. The basic information of the flat panel detector may include, but is not limited to, the size, pixel value, and pixel shape of the flat panel detector. And, the maximum sampling frequency of the flat panel detector can be calculated according to the acquired basic information (such as pixel values) of the flat panel detector. The maximum sampling Frequency is the maximum sampling Frequency at which the flat panel detector can operate, i.e., the Nyquist Frequency (Nyquist Frequency).
Determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAnd according to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in a first image caused by gridsestimate(step 104). Wherein the actual sampling frequency f of the flat panel detectorsIs obtained by inverting the acquired pixel values of the flat panel detector, and the actual sampling frequency fsNot exceeding the maximum sampling frequency of the flat panel detector.
The above-mentioned contents of calculating the maximum sampling frequency and the actual sampling frequency of the flat panel detector are common knowledge in the art, and do not belong to the key improvement content of the present invention, so that no further description is given here, and only the estimated frequency f for calculating the grid line artifact is givenestimateThe related explanations of (1).
Specifically, inIn step S104 of the method 100, the method further includes calculating an estimated frequency f of the grating artifact as followsestimate：
Judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating line artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
continuing with the flow of the method 100, the estimated frequency f of the grid line artifact in the first image caused by the grid lines is calculatedestimateThen, passing the estimated frequency festimateDetermining the extent to which the first image is to be de-ghosted, i.e. at the estimated frequency f of the streak artifactestimateSetting a maximum allowable deviation interval for the center, searching the actual frequency of the grating artifact in the maximum allowable deviation interval, and removing the grating artifact in the first image to obtain a second image (step S105 and step S106). The operator may set the maximum allowable deviation interval according to the performance parameters of the used grid and the operation experience, or may configure a table corresponding to the performance parameters of the grid and the maximum allowable deviation interval, so as to automatically implement the setting of the maximum allowable deviation interval in a table look-up manner or the like.
It should be noted that, in step S106 of the method 100, the first image may be processed by using a plurality of artifact removal methods. For example, the artifact removal method disclosed in the chinese invention patent application with application No. 201410275968.5 and publication No. CN 105335936a, which is entitled "method and apparatus for removing static grid artifacts in X-ray images by an X-ray machine", as proposed by the present applicant at 19/6/2014, may be used, and therefore, the artifact removal method will not be described herein. However, the present invention is not limited in this respect, and a person skilled in the art may select different artifact removal methods according to actual needs.
Referring to fig. 2, fig. 2 is a flowchart of a method for adapting a flat panel detector to a grid according to another embodiment of the present invention. As shown in fig. 2, the method 200 is a variation of the method 100 shown in fig. 1, and the method 200 includes steps S201 to S208, where the steps S201 to S206 are the same as the steps S101 to S106 of the method 100, and thus are not repeated. Only step S207 to step S208 will be described in detail below. In the method 200, further comprising: and judging whether the second image meets a preset artifact removal standard or not (step 207), and outputting the second image if the second image meets the preset artifact removal standard (step 208). In the embodiment shown in fig. 2, if the second image does not meet the preset artifact removal criteria, S202-S207 are repeated.
When judging whether the second image reaches a preset artifact removing standard, if the second image reaches the preset artifact removing standard, outputting the second image to perform a subsequent flaking process; if the second image does not reach the preset artifact removing standard, the steps S202 to S207 are performed again to prevent the judgment result from being influenced by errors in the data acquisition and calculation processes. If the operator manually determines whether the second image meets the preset artifact removal standard, the operator may input a determination result (Y or N) to perform the subsequent steps of the method 200, and if the operator automatically determines whether the second image meets the preset artifact removal standard, the method 200 may automatically perform the subsequent steps without operator intervention. How to output the second image and the subsequent process of performing the sheeting are not important improvements of the present invention, and will not be described in detail herein.
Optionally, whether the second image meets a preset artifact removal standard may be determined manually or automatically based on the one-dimensional fourier energy spectrograms of the first image and the second image. Referring to fig. 3, fig. 3 is a one-dimensional fourier energy spectrum of a first image and a second image obtained by applying the method for adapting a flat panel detector and a grid shown in fig. 2. As shown in fig. 3, the fourier spectrum of the first image (i.e., the image without artifact removal processing) is shown above, and the fourier spectrum of the second image (i.e., the image with artifact removal processing) is shown below, wherein the abscissa of the upper and lower fourier spectrums represents the frequency value, and the ordinate represents the energy amplitude of the fourier spectrum. By comparing the two Fourier energy spectrograms, an operator can clearly judge whether the artifact removing effect meets the required standard.
In addition, whether the second image subjected to artifact removal processing meets a preset artifact removal standard or not can also be judged in an automatic mode. Specifically, in one embodiment, an effective analysis range is defined on a fourier energy spectrum in advance, and the difference between two energy spectrums is compared in the range, so that the artifact removal effect of the image can be judged by comparing the following two aspects: one of which is to detect whether the grating artifacts are completely removed and the other is to detect whether there is a loss of useful information. Further, regarding whether the grid line artifact is completely removed or not, a method of calculating a secondary derivative of each energy amplitude value in an effective analysis range on a Fourier energy spectrum diagram can be adopted to obtain a maximum peak value of the grid line artifact, a grid line artifact frequency range is marked near the peak value, and therefore the difference of the two energy spectrum diagrams is compared to judge the removal condition of the grid line artifact. With respect to detecting whether there is a loss of the useful signal, a peak range portion may be removed within the effective analysis range, a similarity coefficient of the previous and subsequent energy spectrum matrices may be calculated, and when the similarity coefficient is greater than a threshold value, it may be further determined whether the loss of the useful signal is in an acceptable range. Wherein, a person skilled in the art can set a specific value of the threshold of the aforementioned similarity coefficient and a measurement range of an acceptable degree according to an application environment and experience.
Referring to fig. 4, fig. 4 is a flowchart of a method for adapting a flat panel detector to a grid according to a further embodiment of the present invention. As shown in fig. 4, the method 400 is a variation of the method 200 shown in fig. 2, and the method 400 includes steps S401 to S410, where the steps S401 to S408 are the same as the steps S201 to S208 of the method 200, and thus are not repeated. Only steps S409 to S410 will be described in detail below. In the method 400, when it is determined whether the second image meets the preset artifact removal standard, if the second image does not meet the preset artifact removal standard, the steps S402 to S407 are performed again, and at this time, a further determination step S409 is added in the process, that is, the operator may set the predetermined number of times according to actual needs, and if the second image does not meet the preset artifact removal standard and accumulates to the predetermined number of times, an error is reported (step S410).
Referring to fig. 5, fig. 5 is a block schematic diagram of an apparatus for adapting a flat panel detector to a grid according to an embodiment of the present invention. The adaptation device 500 as shown in fig. 5 may be used in a combination of a flat panel detector and a grid for performing the adaptation method 100 in the embodiment as shown in fig. 1. The adapting device 500 may comprise acquisition means 501, acquisition means 502, calculation means 503, setting means 504, artifact removal means 505. Wherein, the collecting device 501 is used for collecting the exposed first image; the obtaining device 502 is used for obtaining basic information of the flat panel detector and obtaining a grid line theoretical frequency f of the grid lineg(ii) a The computing means 503 is used for determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAnd according to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in a first image caused by gridsestimate(ii) a The setting device 504 is used for estimating the frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; the artifact removing device 505 is configured to find an actual frequency where the streak artifact is located within the maximum allowable deviation interval, and remove the streak artifact in the first image to obtain a second image.
In another embodiment, the adapting device 500 may further include a determining device (not shown) for determining whether the second image meets a preset artifact removal criterion. Optionally, the determining device may determine, manually or automatically, whether the second image meets a preset artifact removal criterion based on the one-dimensional fourier energy spectrograms of the first image and the second image. When the artifact removal effect is determined in an automatic manner, as described above in connection with the method embodiments, corresponding functional modules may be provided in the adapting device of the flat panel detector and the grid to implement corresponding functions. It is easily conceivable that the second image may be determined whether the second image meets the preset artifact removal criterion in a manner of combining manual and automatic manners, that is, the determination process is implemented in a semi-automatic manner. For example, the determination device may give parameter values (such as energy amplitude, frequency value, etc.) of each item in the one-dimensional fourier energy spectrograms of the first image and the second image, and the operator may perform related determination according to the given parameter values.
In a further embodiment, the calculating means 503 is further configured to calculate the estimated frequency f of the grating line artifact byestimate: judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
in a variant embodiment, the adapting device 500 may further comprise an output means, not shown in the figure, for outputting the second image when it reaches a preset artifact removal criterion. In other embodiments, the adapting device 500 may further comprise a control means and an error reporting means, which are not shown in the figure. The control device is used for controlling the acquisition device 502 to perform acquisition again, the calculation device 503 to perform calculation again, the setting device 504 to perform setting again, the artifact removal device 505 to perform artifact removal again and the judgment device to perform judgment again when the second image does not reach the preset artifact removal standard. The error reporting device is used for reporting an error when the second image does not reach the preset artifact removal standard and is accumulated to the preset times.
In various embodiments of the adapting device of the flat panel detector and the grid, the acquired basic information of the flat panel detector may include: the size, pixel value and pixel shape of the flat panel detector; and wherein the calculating means 503 may calculate the actual sampling frequency f of the flat panel detector from the pixel valuess。
In a specific implementation, the adapting device of the flat panel detector and the grid may have other internal structures, for example, the above functional modules may be recombined or further refined. And each functional module can be located in different entities, or can be located in the same entity, and can be configured according to actual needs.
In addition, when the flat panel detector and the grid adaptation device are specifically implemented, part of the functional modules of all or any combination of the flat panel detector and the grid adaptation device in the embodiment of the present invention may be implemented by hardware circuits, and may also be computer executable instructions stored in a computer readable medium.
When any one or any combination of the functional modules of the flat panel detector and the grid adapting device in the embodiment of the present invention is a computer executable instruction, the flat panel detector and grid adapting device in the embodiment of the present invention may further include: a processor (not shown) and a computer-readable storage medium (not shown). Wherein the processor is configured to execute computer-executable instructions in the computer-readable storage medium.
Any one or any combination of the functional modules of the flat panel detector and the grid adapting device in the embodiment of the present invention is a computer executable instruction stored in the computer readable storage medium.
The invention also provides a medical imaging system, which comprises the flat panel detector and the adapting device of the grid. The medical imaging system may be, for example, an X-ray machine or other suitable medical imaging system, but the invention is not limited thereto.
In practice, the operator will use different combinations of flat panel detectors and grids according to different usage needs. For example, one medical imaging system can employ two or more different types of flat panel detectors to replace the hardware combination of different flat panel detectors and grids for different uses. The adaptation method and the device of the flat panel detector and the grid and the medical imaging system provided by the invention can realize ideal grid line artifact removing effect aiming at different hardware combinations.
In summary, the present invention provides a method and an apparatus for adapting a flat panel detector to a grid, and a medical imaging system. The method is used for a combination of a flat panel detector and a grid, comprising: acquiring an exposed first image; acquiring basic information of the flat panel detector; acquiring the theoretical frequency of grid lines of the grid; determining the actual sampling frequency of the flat panel detector according to the basic information of the flat panel detector, and calculating the estimated frequency of grid line artifacts in a first image caused by the grid lines according to the theoretical frequency of the grid lines and the actual sampling frequency of the flat panel detector; setting a maximum allowable deviation interval by taking the estimated frequency of the grating artifact as a center; searching the actual frequency of the grid line artifact in the maximum allowable deviation interval, and removing the grid line artifact in the first image to obtain a second image; and judging whether the second image reaches a preset artifact removing standard or not. The method can achieve an ideal grid line artifact removing effect aiming at different combinations of the flat panel detector and the grid.
Furthermore, the invention also proposes a machine-readable storage medium storing instructions for causing a machine to perform the method of adapting a flat panel detector to a grid as described herein. Specifically, a system or an apparatus equipped with a storage medium on which a software program code that realizes the functions of any one of the above-described embodiments is stored may be provided, and a computer (or a CPU or MPU) of the system or the apparatus is caused to read out and execute the program code stored in the storage medium.
In this case, the program code itself read from the storage medium can realize the functions of any of the above-described embodiments, and thus the program code and the storage medium storing the program code constitute a part of the present invention.
Examples of the storage medium for supplying the program code include a floppy disk, a hard disk, a magneto-optical disk, an optical disk (e.g., CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD + RW), a magnetic tape, a nonvolatile memory card, and a ROM. Alternatively, the program code may be downloaded from a server computer by a communications network.
Further, it should be clear that the functions of any of the above-described embodiments can be implemented not only by executing the program code read out by the computer, but also by causing an operating system or the like operating on the computer to perform a part or all of the actual operations based on instructions of the program code.
Further, it is to be understood that the functions of any of the above-described embodiments are realized by writing the program code read out from the storage medium into a memory provided in an expansion board inserted into the computer or into a memory provided in an expansion unit connected to the computer, and then causing a CPU or the like mounted on the expansion board or the expansion unit to perform part or all of the actual operations based on the instructions of the program code.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (14)
1. A method of adapting a flat panel detector to a grid for use in combination with a flat panel detector and a grid, the method comprising:
a) acquiring an exposed first image;
b) acquiring basic information of the flat panel detector;
c) obtaining a grid line theoretical frequency f of the grid lineg；
d) Determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAccording to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in the first image caused by the gridestimate；
e) Using the estimated frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; and
f) searching the actual frequency of the grid line artifact in the maximum allowable deviation interval, and removing the grid line artifact in the first image to obtain a second image;
wherein the basic information of the flat panel detector acquired in step b) includes: size, pixel value, pixel shape of the flat panel detector.
2. The method of adapting a flat panel detector to a grid according to claim 1, further comprising:
g) and judging whether the second image reaches a preset artifact removal standard, and if the second image reaches the preset artifact removal standard, outputting the second image.
3. The method of adapting a flat panel detector to a grid according to claim 2, further comprising:
and if the second image does not reach the preset artifact removing standard, performing the steps b) to g) again.
4. The method of adapting a flat panel detector to a grid according to claim 3, wherein an error is reported if the second image fails to meet a predetermined artifact removal criterion and accumulates to a predetermined number of times.
5. Method for adapting a flat panel detector to a grid according to claim 1, wherein in step d) the calculated values are calculated from the pixel valuesActual sampling frequency f of the flat panel detectors。
6. The method of adapting a flat panel detector to a grid as claimed in claim 1, wherein in step d) further comprises calculating the estimated frequency f of the grid line artifact byestimate：
Judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
7. the method of adapting a flat panel detector to a grid according to claim 2 or 3, wherein in step g) it is determined whether the second image meets a preset artifact removal criterion based on the one-dimensional Fourier energy spectra of the first and second images by manual or automatic means.
8. An adaptation device of a flat panel detector and a grid for a combination of a flat panel detector and a grid, the adaptation device comprising:
an acquisition device for acquiring the exposed first image;
an acquisition device for acquiring basic information of the flat panel detector and acquiring a grid line theoretical frequency f of the grid lineg；
A calculation device for determining the actual sampling frequency f of the flat panel detector according to the basic information of the flat panel detectorsAccording to the theoretical frequency f of the grid linegAnd the actual sampling frequency f of the flat panel detectorsCalculating an estimated frequency f of grid line artifacts in the first image caused by the gridestimate；
Setting means for using the estimated frequency f of the grating artifactestimateSetting a maximum allowable deviation interval for the center; and
an artifact removing device, configured to search an actual frequency where the grid line artifact is located within the maximum allowable deviation interval, and remove the grid line artifact in the first image to obtain a second image;
wherein the acquired basic information of the flat panel detector comprises: size, pixel value, pixel shape of the flat panel detector.
9. The flat panel detector grid to grid adaptation device of claim 8, further comprising:
and the judging device is used for judging whether the second image reaches a preset artifact removing standard or not.
10. The flat panel detector grid-to-grid adaptation device of claim 9, further comprising:
and the output device is used for outputting the second image when the second image reaches the preset artifact removing standard.
11. The flat panel detector grid-to-grid adaptation device of claim 9, further comprising:
and the control device is used for controlling the acquisition device to perform acquisition again when the second image does not reach the preset artifact removal standard, the calculation device to perform calculation again, the setting device to perform setting again, the artifact removal device to perform artifact removal again, and the judgment device to perform judgment again.
12. The flat panel detector grid to grid adaptation device of claim 11, further comprising:
and the error reporting device is used for reporting an error when the second image does not reach the preset artifact removal standard and is accumulated to a preset number of times.
13. The flat panel detector and grid adapting device according to claim 8, wherein the calculating means is further adapted to calculate the estimated frequency f of the grid line artifact byestimate：
Judging the actual sampling frequency f of the flat panel detectorsWhether the Nyquist sampling rate is satisfied such that fs≥2fgIf yes, determining the estimated frequency f of the grating artifactestimate＝fg(ii) a Otherwise, determining the estimated frequency of the grating artifact according to the following expression:
wherein k is1And k2Is an integer, and k1、k2The following inequalities are satisfied:
14. a medical imaging system comprising an adaptation device of a flat panel detector according to any of claims 8 to 13 with a grid.
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