CN108037371A - A kind of test device of chip capacitor - Google Patents
A kind of test device of chip capacitor Download PDFInfo
- Publication number
- CN108037371A CN108037371A CN201711233115.5A CN201711233115A CN108037371A CN 108037371 A CN108037371 A CN 108037371A CN 201711233115 A CN201711233115 A CN 201711233115A CN 108037371 A CN108037371 A CN 108037371A
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- China
- Prior art keywords
- sliding
- bar
- chip capacitor
- test device
- top side
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a kind of test device of chip capacitor, including base, the top side of the base is installed with two upright bars, the top of two upright bars is installed with limited block, the top of the base is equipped with rectangle platen, two sliding eyes are offered on the rectangle platen, the top of two upright bars extends through two sliding eyes, and extend respectively to outside two sliding eyes, the upright bar is slidably connected with sliding eye, the top side of the rectangle platen offers mounting groove, conductive plate is installed with the mounting groove, the top side centre position of the conductive plate is installed with conductive contact, the bottom side of the rectangle platen is installed with two sheet metals, two sheet metals are between two upright bars, and two sheet metals are located at the both sides of conductive contact.The present invention can be easy to the position of firm fixed rectangle platen, prevent chip capacitor from loosening, and enable to movable plate to have downward cushion effect, prevent chip capacitor from damaging.
Description
Technical field
The present invention relates to capacitor technology field, more particularly to a kind of test device of chip capacitor.
Background technology
Capacitor, it is capacitance that usually referred to as it, which accommodates the ability of electric charge, is represented with letter C.Define 1：Capacitor, Gu Mingsi
Justice, is ' container of dress electricity ', is a kind of device for accommodating electric charge；English name：Capacitor, capacitor are in electronic equipment
One of electronic component largely used, the separated by direct communication being widely used in circuit, couples, and bypasses, filtering, resonant tank, energy
Amount conversion, control etc.；Define 2：Capacitor, any two is insulated from each other and the conductor (including conducting wire) that is spaced closely together between all
Form a capacitor.
The patent of Application No. 201410775518.2 discloses heavy duty detergent capacitor pressure test device, it includes rectangle
Base and rectangular mesa, the rectangular mesa is affixed by lead and rectangular base, the upper surface middle part of the rectangular mesa
Conductive plate is connected with, some conductive contacts are connected with the middle part of the conductive plate, if the lower surface of the rectangular mesa is connected with
Dry rectangular metal sheet, the rectangular metal sheet and conductive contact, which correspond, to be electrically connected, the upper surface side of the rectangular base
Conductive layer is laid with, the conductive layer and rectangular metal sheet are located at same vertical plane.The beneficial effects of the invention are as follows will be to be tested
Cylinder capacitor be placed between rectangular metal sheet and conductive layer, pressure-resistant survey can be carried out by being powered to conductive contact and conductive layer
Examination, is completed power-off and takes out cylindrical shape capacitor, easy to operate, can disposably test multiple cylindrical shape capacitors, work effect
Rate is high, saves human cost.However, the device cannot effectively clamp capacitor in use, and in clamping process easily
Capacitor is caused to damage.
The content of the invention
Based on technical problem existing for background technology, the present invention proposes a kind of test device of chip capacitor.
A kind of test device of chip capacitor proposed by the present invention, including base, the top side of the base are fixedly mounted
There are two upright bars, the top of two upright bars is installed with limited block, and the top of the base is equipped with rectangle platen, the rectangle
Two sliding eyes are offered on platen, the top of two upright bars extends through two sliding eyes, and extends respectively to two slips
Outside hole, the upright bar is slidably connected with sliding eye, and the top side of the rectangle platen offers mounting groove, is fixed in the mounting groove
Conductive plate is installed, the top side centre position of the conductive plate is installed with conductive contact, and the bottom side of the rectangle platen is consolidated
Dingan County is equipped with two sheet metals, and two sheet metals are between two upright bars, and two sheet metals are located at the both sides of conductive contact,
The both sides of the rectangle platen are equipped with the fixed mechanism for fixing rectangle platen height and position, and the top side of the base opens up
It is fluted, movable plate is movably installed with the groove, the top side of the movable plate is laid with conductive layer, the bottom of the movable plate
Side is installed with two sliding bars, and two cavitys are offered on the base, and two cavitys are opposite with two sliding bars respectively
It should set, slide opening be offered on the top side inner wall of two cavitys, and the bottom of two sliding bars extends through two slide openings simultaneously
Extend in two cavitys, the buffer gear for being used for buffering movable plate is equipped with the cavity.
Preferably, the bottom side of the rectangle platen is installed with the first spring being socketed in upright bar, first bullet
The bottom of spring is fixedly mounted on the top side of base.
Preferably, the fixed mechanism includes the L-shaped sliding slot for being opened in rectangle platen top side, and two L-shaped sliding slots distinguish position
On the side that two sliding eyes are located remotely from each other, and L-shaped sliding slot is connected with sliding eye, and L is slidably fitted with the L-shaped sliding slot
Shape slide bar, the both ends of the L-shaped slide bar are all extended to outside L-shaped sliding slot, the equal equidistant intervals in side that two upright bars are located remotely from each other
Multiple locating slots are offered, one end of the L-shaped slide bar is extended in sliding eye, and is slidably mounted in locating slot.
Preferably, the first sliding groove is offered on the bottom side inner wall of the L-shaped sliding slot, is slidably fitted with the first sliding groove
First sliding block, the top side of the first sliding block are extended to outside the first sliding groove, and are fixedly mounted on the bottom side of L-shaped slide bar.
Preferably, second spring, two second springs are installed with the side inner wall that two L-shaped sliding slots are located remotely from each other
One end close to each other is respectively and fixedly installed on the side that two L-shaped slide bars are located remotely from each other.
Preferably, the buffer gear includes being opened in sliding recess on the inner wall of cavity both sides, in the sliding recess
Buffer bar is slidably fitted with, one end of the buffer bar is extended to outside sliding recess, and is rotatablely equipped with connecting rod by hinge,
The one end of the connecting rod away from buffer bar is rotatably installed on the bottom of sliding bar.
Preferably, the second sliding slot is offered on the inner wall of the sliding recess both sides, is slidably installed in second sliding slot
There is the second sliding block, the side of second sliding block is extended to outside the second sliding slot, and is fixedly mounted on buffer bar, and two slips are recessed
The 3rd spring is installed with the side inner wall that groove is located remotely from each other, two the 3rd spring one end close to each other are fixed respectively
On one end close to each other installed in two buffer bars, the buffer bar is installed with one end of connecting rod and is socketed in
The 4th spring on buffer bar, the 4th spring are fixedly connected with the inner wall of cavity.
Preferably, the bottom of the sliding bar both sides offers the rotation slot that both sides are opening, the rotation slot two
It is rotatablely equipped with same rotation axis on the inner wall of side, the connecting rod offers rotation hole close to one end of sliding bar, described turn
Moving axis is rotatably installed in rotation hole.
In the present invention, a kind of test device of chip capacitor, passes through base, connecting rod, limited block, rectangle platform
Plate, sliding eye, mounting groove, conductive plate, conductive contact, sheet metal, the first spring, groove, movable plate, conductive layer are used cooperatively,
Chip capacitor to be tested is placed between sheet metal and conductive layer, being powered to conductive contact and conductive layer, it is pressure-resistant to carry out
Test, is completed power-off and takes out chip capacitor, and easy to operate, work efficiency is high, passes through L-shaped sliding slot, L-shaped slide bar, positioning
Groove, second spring, the first sliding groove, the first sliding block are used cooperatively, and mobile L-shaped slide bar, L-shaped slide bar slides in L-shaped sliding slot, and L
Shape slide bar drives the first sliding block to be slided in the first sliding groove, and L-shaped slide bar is moved in locating slot, can be easy to firm fixed rectangle
The position of platen, prevents chip capacitor from loosening, and passes through cavity, slide opening, sliding bar, connecting rod, sliding recess, buffer bar,
Three springs, the second sliding slot, the second sliding block, hinge, the 4th spring, rotation slot, rotation axis, rotation hole, conductive layer are used cooperatively, piece
Formula capacitor is placed on movable plate, rectangle platen extruding chip capacitor, chip capacitor Compressive activities plate, movable plate extruding
Sliding bar, sliding bar slide in sliding block, and sliding bar is moved by rotation slot and rotation axis with the use of lower drive connecting rod,
Connecting rod drives buffer bar to be moved in sliding recess by hinge, and buffer bar drives the second sliding block to be slided in the second sliding slot,
And buffer bar extrudes the 3rd spring and the 4th spring, it can be easy to movable plate that there is downward cushion effect, prevent chip capacitor
Damage, the present invention can be easy to the position of firm fixed rectangle platen, prevent chip capacitor from loosening, and enable to movable plate
With downward cushion effect, prevent chip capacitor from damaging.
Brief description of the drawings
Fig. 1 is a kind of structure diagram of the test device of chip capacitor proposed by the present invention；
Fig. 2 is part A structure diagram in a kind of Fig. 1 of the test device of chip capacitor proposed by the present invention；
Fig. 3 is part B structure diagram in a kind of Fig. 1 of the test device of chip capacitor proposed by the present invention；
Fig. 4 is B1 part-structure schematic diagrams in a kind of Fig. 3 of the test device of chip capacitor proposed by the present invention；
Fig. 5 illustrates for a kind of sliding bar of the test device of chip capacitor proposed by the present invention and connecting rod connection structure
Figure.
In figure：1 base, 2 upright bars, 3 limited blocks, 4 rectangle platens, 5 sliding eyes, 6 mounting grooves, 7 conductive plates, 8 conductive contacts,
9 sheet metals, 10 first springs, 11 grooves, 12 movable plates, 13 cavitys, 14L shapes sliding slot, 15L shapes slide bar, 16 locating slots, 17 second
Spring, 18 the first sliding grooves, 19 first sliding blocks, 20 slide openings, 21 sliding bars, 22 connecting rods, 23 sliding recess, 24 buffer bars, 25
Three springs, 26 second sliding slots, 27 second sliding blocks, 28 hinges, 29 the 4th springs, 30 rotation slots, 31 rotation axis, 32 rotation holes, 33
Conductive layer.
Embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.
Embodiment.
With reference to Fig. 1-5, a kind of test device of chip capacitor, including base 1, the top side of base 1 are installed with two
A upright bar 2, the tops of two upright bars 2 are installed with limited block 3, and the top of base 1 is equipped with rectangle platen 4, on rectangle platen 4
Two sliding eyes 5 are offered, the top of two upright bars 2 extends through two sliding eyes 5, and extends respectively to two sliding eyes 5
Outside, upright bar 2 is slidably connected with sliding eye 5, and the top side of rectangle platen 4 offers mounting groove 6, is installed with and leads in mounting groove 6
Battery plate 7, the top side centre position of conductive plate 7 are installed with conductive contact 8, and the bottom side of rectangle platen 7 is installed with two
Sheet metal 9, two sheet metals 9 are between two upright bars 2, and two sheet metals 9 are located at the both sides of conductive contact 8, rectangle platform
The both sides of plate 7 are equipped with the fixed mechanism for fixing 4 height and position of rectangle platen, and the top side of base 1 opens up fluted 11, recessed
Movable plate 12 is movably installed with groove 11, the top side of movable plate 12 is laid with conductive layer 33, and the bottom side of movable plate 12 is fixedly mounted
There are two sliding bars 21, two cavitys 13 are offered on base 1, two cavitys 13 are corresponding with two sliding bars 21 respectively to be set
Put, slide opening 20 is offered on the top side inner wall of two cavitys 13, and the bottom of two sliding bars 21 extends through two slide openings
20 and extend in two cavitys 13, the buffer gear for being used for buffering movable plate 12, the bottom side of rectangle platen 4 are equipped with cavity 13
The first spring 10 being socketed in upright bar 2 is installed with, the bottom of the first spring 10 is fixedly mounted on the top side of base 1.
By base 1, upright bar 2, limited block 3, rectangle platen 4, sliding eye 5, mounting groove 6, conductive plate 7, conductive contact 8, sheet metal 9,
First spring 10, groove 11, movable plate 12, conductive layer 33 are used cooperatively, and chip capacitor to be tested is placed on 9 He of sheet metal
Between conductive layer 33, voltage-withstand test can be carried out by being powered to conductive contact 8 and conductive layer 33, be completed power-off and taken out chip electricity
Container, easy to operate, work efficiency is high.
Fixed mechanism includes the L-shaped sliding slot 14 for being opened in 4 top side of rectangle platen, and two L-shaped sliding slots 14 are located at two respectively
On the side that sliding eye 5 is located remotely from each other, and L-shaped sliding slot 14 is connected with sliding eye 5, and L-shaped cunning is slidably fitted with L-shaped sliding slot 14
Bar 15, the both ends of L-shaped slide bar 15 are all extended to outside L-shaped sliding slot 14, the equal equidistant apart in side that two upright bars 2 are located remotely from each other
Equipped with multiple locating slots 16, one end of L-shaped slide bar 15 is extended in sliding eye 5, and is slidably mounted in locating slot 16, and L-shaped is slided
The first sliding groove 18 is offered on the bottom side inner wall of groove 14, the first sliding block 19, the first sliding block 19 are slidably fitted with the first sliding groove 18
Top side extend to outside the first sliding groove 18, and be fixedly mounted on the bottom side of L-shaped slide bar 15, two L-shaped sliding slots 14 are located remotely from each other
Side inner wall on be installed with second spring 17, two one end close to each other of second spring 17 are respectively and fixedly installed to two
On the side that a L-shaped slide bar 15 is located remotely from each other.Pass through L-shaped sliding slot 14, L-shaped slide bar 15, locating slot 16, second spring 17, first
Sliding slot 18, the first sliding block 19 are used cooperatively, and mobile L-shaped slide bar 15, L-shaped slide bar 15 slides in L-shaped sliding slot 14, and L-shaped slide bar
15 drive the first sliding block 19 to be slided in the first sliding groove 18, and L-shaped slide bar 15 is moved in locating slot 16, can be easy to firm fix
The position of rectangle platen 4, prevents chip capacitor from loosening
Buffer gear includes the sliding recess 23 being opened on 13 both sides inner wall of cavity, is slidably fitted with sliding recess 23
Buffer bar 24, one end of buffer bar 24 are extended to outside sliding recess 23, and are rotatablely equipped with connecting rod 22 by hinge 28, connection
The one end of bar 22 away from buffer bar 24 is rotatably installed on the bottom of sliding bar 21, is offered on 23 both sides inner wall of sliding recess
Second sliding slot 26, is slidably fitted with the second sliding block 27 in the second sliding slot 26, the side of the second sliding block 27 extends to the second sliding slot 26
Outside, and it is fixedly mounted on buffer bar 24, the 3rd is installed with the side inner wall that two sliding recess 23 are located remotely from each other
Spring 25, two the 3rd spring 25 one end close to each other are respectively and fixedly installed to two one end close to each other of buffer bar 24
On, buffer bar 24 is installed with the 4th spring 29 being socketed on buffer bar 24, the 4th bullet on one end of connecting rod 22
Spring 29 is fixedly connected with the inner wall of cavity 13, and the bottom of 21 both sides of sliding bar offers the rotation slot 30 that both sides are opening,
Same rotation axis 31 is rotatablely equipped with 30 both sides inner wall of rotation slot, connecting rod 22 is offered close to one end of sliding bar 21 to be turned
Dynamic hole 32, rotation axis 31 are rotatably installed in rotation hole 32.Pass through cavity 13, slide opening 20, sliding bar 21, connecting rod 22, slip
Groove 23, buffer bar 24, the 3rd spring 25, the second sliding slot 26, the second sliding block 27, hinge 28, the 4th spring 29, rotation slot 30,
Rotation axis 31, rotation hole 32, conductive layer 33 are used cooperatively, and chip capacitor is placed on movable plate 12,4 extruding plate of rectangle platen
Formula capacitor, chip capacitor Compressive activities plate 12, movable plate 12 extrude sliding bar 21, and sliding bar 21 slides in slide opening 20,
And sliding bar 21 is moved by rotation slot 30 and rotation axis 31 with the use of lower drive connecting rod 22, connecting rod 22 passes through hinge 28
Buffer bar 24 is driven to be moved in sliding recess 23, buffer bar 24 drives the second sliding block 27 to be slided in the second sliding slot 26, and slow
Jumper bar 24 extrudes the 3rd spring 25 and the 4th spring 29, movable plate 12 can be easy to have downward cushion effect, prevents that chip is electric
Container damage, the present invention can be easy to the position of firm fixed rectangle platen 4, prevent chip capacitor from loosening, and enable to
Movable plate 12 has downward cushion effect, prevents chip capacitor from damaging.
The present invention：Chip capacitor to be tested is placed between sheet metal 9 and conductive layer 33, to conductive contact 8 and is led
Electric layer 33, which is powered, can carry out voltage-withstand test, be completed power-off and take out chip capacitor, easy to operate；Mobile L-shaped slide bar 15,
L-shaped slide bar 15 slides in L-shaped sliding slot 14, and L-shaped slide bar 15 drives the first sliding block 19 to be slided in the first sliding groove 18, and L-shaped is slided
Bar 15 is moved in locating slot 16, can be easy to the position of firm fixed rectangle platen 4, reaching prevents what chip capacitor from loosening
Purpose；Chip capacitor is placed on movable plate 12, and rectangle platen 4 extrudes chip capacitor, chip capacitor Compressive activities plate
12, movable plate 12 extrudes sliding bar 21, and sliding bar 21 slides in slide opening 20, and sliding bar 21 passes through rotation slot 30 and rotation axis
31 move with the use of lower drive connecting rod 22, and connecting rod 22 drives buffer bar 24 to be moved in sliding recess 23 by hinge 28
Dynamic, buffer bar 24 drives the second sliding block 27 to be slided in the second sliding slot 26, and buffer bar 24 extrudes the 3rd spring 25 and the 4th bullet
Spring 29 so that movable plate 12 has downward cushion effect, achievees the purpose that to prevent chip capacitor from damaging.
The foregoing is only a preferred embodiment of the present invention, but protection scope of the present invention be not limited thereto,
Any one skilled in the art the invention discloses technical scope in, technique according to the invention scheme and its
Inventive concept is subject to equivalent substitution or change, should be covered by the protection scope of the present invention.
Claims (8)
1. a kind of test device of chip capacitor, including base (1), it is characterised in that peace is fixed in the top side of the base (1)
Equipped with two upright bars (2), the top of two upright bars (2) is installed with limited block (3), and the top of the base (1) is equipped with square
Shape platen (4), offers two sliding eyes (5) on the rectangle platen (4), the top of two upright bars (2) extends through two
Sliding eye (5), and extend respectively to two sliding eyes (5) outside, the upright bar (2) is slidably connected with sliding eye (5), the rectangle
The top side of platen (4) offers mounting groove (6), and conductive plate (7), the conductive plate (7) are installed with the mounting groove (6)
Top side centre position be installed with conductive contact (8), the bottom side of the rectangle platen (7) is installed with two sheet metals
(9), two sheet metals (9) are between two upright bars (2), and two sheet metals (9) are located at the both sides of conductive contact (8), institute
The both sides for stating rectangle platen (7) are equipped with the fixed mechanism for being used for fixing rectangle platen (4) height and position, the base (1)
Top side opens up fluted (11), is movably installed with movable plate (12) in the groove (11), the top side of the movable plate (12) is applied
Equipped with conductive layer (33), the bottom side of the movable plate (12) is installed with two sliding bars (21), is opened up on the base (1)
There are two cavitys (13), the setting corresponding with two sliding bars (21) respectively of two cavitys (13), the top side of two cavitys (13)
Offer slide opening (20) on inner wall, and the bottom of two sliding bars (21) extends through two slide openings (20) and extends to two
The buffer gear for being used for buffering movable plate (12) is equipped with cavity (13), in the cavity (13).
A kind of 2. test device of chip capacitor according to claim 1, it is characterised in that the rectangle platen (4)
Bottom side be installed with the first spring (10) being socketed in upright bar (2), the bottom of first spring (10) is fixedly mounted
On the top side of base (1).
3. the test device of a kind of chip capacitor according to claim 1, it is characterised in that the fixed mechanism includes
The L-shaped sliding slot (14) of rectangle platen (4) top side is opened in, two L-shaped sliding slots (14) are mutually remote positioned at two sliding eyes (5) respectively
From side on, and L-shaped sliding slot (14) is connected with sliding eye (5), and L-shaped slide bar is slidably fitted with the L-shaped sliding slot (14)
(15), the both ends of the L-shaped slide bar (15) all extend to L-shaped sliding slot (14) outside, and the side that two upright bars (2) are located remotely from each other is impartial
Distance, which is spaced apart, is equipped with multiple locating slots (16), and one end of the L-shaped slide bar (15) is extended in sliding eye (5), and slides peace
In locating slot (16).
A kind of 4. test device of chip capacitor according to claim 3, it is characterised in that the L-shaped sliding slot (14)
Bottom side inner wall on offer the first sliding groove (18), be slidably fitted with the first sliding block (19) in the first sliding groove (18), first
The top side of sliding block (19) extends to the first sliding groove (18) outside, and is fixedly mounted on the bottom side of L-shaped slide bar (15).
A kind of 5. test device of chip capacitor according to claim 3, it is characterised in that two L-shaped sliding slots (14)
Second spring (17), two second springs (17) one end difference close to each other are installed with the side inner wall being located remotely from each other
It is fixedly mounted on the side that two L-shaped slide bars (15) are located remotely from each other.
6. the test device of a kind of chip capacitor according to claim 1, it is characterised in that the buffer gear includes
The sliding recess (23) being opened on the inner wall of cavity (13) both sides, the sliding recess (23) is interior to be slidably fitted with buffer bar
(24), one end of the buffer bar (24) extends to sliding recess (23) outside, and is rotatablely equipped with connecting rod by hinge (28)
(22), the one end of the connecting rod (22) away from buffer bar (24) is rotatably installed on the bottom of sliding bar (21).
A kind of 7. test device of chip capacitor according to claim 6, it is characterised in that the sliding recess (23)
The second sliding slot (26) is offered on the inner wall of both sides, the second sliding block (27) is slidably fitted with second sliding slot (26), it is described
The side of second sliding block (27) extends to the second sliding slot (26) outside, and is fixedly mounted on buffer bar (24), two sliding recess
(23) be installed with the 3rd spring (25) on the side inner wall being located remotely from each other, two the 3rd springs (25) it is close to each other one
End is respectively and fixedly installed on two buffer bar (24) one end close to each other, and the buffer bar (24) is close to connecting rod (22)
The 4th spring (29) being socketed on buffer bar (24), the inner wall of the 4th spring (29) and cavity (13) are installed with one end
It is fixedly connected.
A kind of 8. test device of chip capacitor according to claim 1, it is characterised in that the sliding bar (21) two
The bottom of side offers the rotation slot (30) that both sides are opening, is rotatablely equipped with the inner wall of rotation slot (30) both sides same
One rotation axis (31), the connecting rod (22) offer rotation hole (32), the rotation axis close to one end of sliding bar (21)
(31) it is rotatably installed in rotation hole (32).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711233115.5A CN108037371A (en) | 2017-11-30 | 2017-11-30 | A kind of test device of chip capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711233115.5A CN108037371A (en) | 2017-11-30 | 2017-11-30 | A kind of test device of chip capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108037371A true CN108037371A (en) | 2018-05-15 |
Family
ID=62094651
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711233115.5A Pending CN108037371A (en) | 2017-11-30 | 2017-11-30 | A kind of test device of chip capacitor |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108037371A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108750984A (en) * | 2018-08-14 | 2018-11-06 | 安吉明远锻造有限公司 | A kind of alloy steel forging hanging apparatus |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201242581Y (en) * | 2008-07-16 | 2009-05-20 | 福建国光电子科技股份有限公司 | Detection device for solid electrolyte capacitor |
| CN203465301U (en) * | 2013-09-25 | 2014-03-05 | 深圳市振华测试设备有限公司 | ICT needle bed jig |
| CN105116298A (en) * | 2014-12-16 | 2015-12-02 | 铜陵翔宇商贸有限公司 | High-efficiency type withstand voltage testing device for capacitor |
| CN204906496U (en) * | 2015-08-17 | 2015-12-23 | 惠州市升信电子有限公司 | Intelligent telephone set testing arrangement |
-
2017
- 2017-11-30 CN CN201711233115.5A patent/CN108037371A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN201242581Y (en) * | 2008-07-16 | 2009-05-20 | 福建国光电子科技股份有限公司 | Detection device for solid electrolyte capacitor |
| CN203465301U (en) * | 2013-09-25 | 2014-03-05 | 深圳市振华测试设备有限公司 | ICT needle bed jig |
| CN105116298A (en) * | 2014-12-16 | 2015-12-02 | 铜陵翔宇商贸有限公司 | High-efficiency type withstand voltage testing device for capacitor |
| CN204906496U (en) * | 2015-08-17 | 2015-12-23 | 惠州市升信电子有限公司 | Intelligent telephone set testing arrangement |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108750984A (en) * | 2018-08-14 | 2018-11-06 | 安吉明远锻造有限公司 | A kind of alloy steel forging hanging apparatus |
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Application publication date: 20180515 |