CN107870252B - Test fixture for electronic components - Google Patents
Test fixture for electronic components Download PDFInfo
- Publication number
- CN107870252B CN107870252B CN201711389823.8A CN201711389823A CN107870252B CN 107870252 B CN107870252 B CN 107870252B CN 201711389823 A CN201711389823 A CN 201711389823A CN 107870252 B CN107870252 B CN 107870252B
- Authority
- CN
- China
- Prior art keywords
- plate
- magnet
- circuit board
- shaped
- strip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 229910000831 Steel Inorganic materials 0.000 claims abstract description 14
- 239000010959 steel Substances 0.000 claims abstract description 14
- 239000011148 porous material Substances 0.000 claims abstract description 6
- 230000002349 favourable effect Effects 0.000 abstract description 8
- 230000000694 effects Effects 0.000 abstract description 5
- 241000276694 Carangidae Species 0.000 description 10
- 241000719178 Carangoides ruber Species 0.000 description 5
- 238000005457 optimization Methods 0.000 description 5
- 238000001514 detection method Methods 0.000 description 4
- TVEXGJYMHHTVKP-UHFFFAOYSA-N 6-oxabicyclo[3.2.1]oct-3-en-7-one Chemical compound C1C2C(=O)OC1C=CC2 TVEXGJYMHHTVKP-UHFFFAOYSA-N 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Supply And Installment Of Electrical Components (AREA)
Abstract
The invention discloses a test fixture for electronic components, which comprises a bearing plate, a strip-shaped jack, a push plate, a support plate, a guide pore plate, a round rod, a second magnet, a first fixed pulley, an electric push rod, a strip-shaped through hole, a second fixed pulley, a support plate, a test circuit board, an insulating plate, a U-shaped plate, a fixing plate and a reset spring. The invention has reasonable design, is favorable for carrying out dislocation clamping on pins of electronic components, is convenient for providing clamping force through repulsive force generated by mutual repulsion of magnetic poles with the same name, changes the mode of forming the traditional clamping force, achieves the effect that one clamping force acts on a plurality of clamping structures, is connected with a test circuit board through a thin steel wire by a first magnet driven by an electric push rod, is favorable for driving the test circuit board to move, and achieves the effect that thrust generated by one electric push rod acts on the plurality of clamping structures.
Description
Technical Field
The invention relates to a test fixture, in particular to a test fixture for electronic components, and belongs to the technical field of electronic component application.
Background
The most important device in the field of single photon detectors is an Avalanche Photodiode (APD), which is a photovoltaic detector element used in the field of optical detection, and has the main functions of converting optical signals into electric signals for output, and electronic components such as capacitors, resistors and the like are required to be subjected to burn-in test at high temperature before leaving factories, and the positioning and clamping of the electronic components are usually completed by adopting a traditional clamp so as to realize reliable power on.
Most of clamps used for detecting traditional electronic components do not have the function of dislocation mobile clamping electronic components, and clamping of the electronic components can be achieved when clamping is inconvenient, and the existing clamps are required to clamp the same electronic components through a plurality of facility structures for generating clamping force, so that the clamp structure is complex, and the effect that one clamping force acts on a plurality of clamping structures is inconvenient to achieve. Therefore, a test fixture for electronic components is proposed for the above-mentioned problems.
Disclosure of Invention
The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a test fixture for electronic components.
The invention realizes the aim through the following technical scheme that the test fixture for the electronic components comprises a bearing plate and a test circuit board, wherein one side of the top surface of the bearing plate is provided with an electric push rod, one end of the push rod of the electric push rod is provided with a first magnet, one side of the first magnet is provided with a second magnet, the top of one side of the second magnet is provided with a push plate, the middle position of the top of one side of the surface of the second magnet is vertically provided with a guide pore plate, a round rod is arranged in the guide pore of the guide pore plate, the middle position of one side of the top surface of the bearing plate is transversely provided with a strip-shaped through hole, two ends in the strip-shaped through hole are provided with second fixed pulleys, two ends of the test circuit board are respectively positioned in two U-shaped plates, the two U-shaped plates are symmetrically arranged on the bottom surface of the bearing plate, an insulating plate is arranged between the inner sides of the two U-shaped plates, the middle position of the side of the U-shaped plates positioned at one end of the test circuit board is provided with a support plate, one side of the top surface of the support plate and one side of the bottom surface of the electric push rod is provided with a first fixed pulley, the top surface of the test circuit board, the top surface of the insulating plate and seven strip-shaped jacks are transversely arranged on the top surface of the bearing plate.
Preferably, the other end of the test circuit board is elastically connected with the fixing plate through a reset spring, and the fixing plate is arranged at the middle position of one side of the top surface of the bearing plate.
Preferably, the supporting plates are respectively arranged at the two ends of the round rod, and the bottoms of the supporting plates are fixedly arranged on the top surface of the bearing plate.
Preferably, a thin steel wire is arranged at the bottom of the surface of the other side of the first magnet, one side of the thin steel wire penetrates through the first fixed pulley and the second fixed pulley, and one end of the thin steel wire is fixedly arranged at the middle position of one end of the test circuit board.
Preferably, seven hole grooves are longitudinally formed in the surface of one side of the push plate at equal intervals, and the groove width of the seven hole grooves is the same as that of the seven strip-shaped jacks at the corresponding positions.
Preferably, seven bar jacks are provided, the seven bar jacks integrally form a circular structure, and two bar jacks at symmetrical positions in the seven bar jacks have the same specification.
The beneficial effects of the invention are as follows:
1. this kind of a test fixture for electronic components reasonable in design is favorable to carrying out dislocation centre gripping to the pin of electronic components, is connected with test circuit board through thin steel wire through first magnet, is favorable to driving test circuit board and removes, and the push pedal of being convenient for is removed with test circuit board opposite direction dislocation, through the first magnet of removal and according to first magnet and the same name magnetic pole principle of repulsion of second magnet for the second magnet removes, is favorable to driving the push pedal.
2. This kind of a test fixture for electronic components reasonable in design is convenient for provide clamping force through the repulsion that the homonymy magnetic pole repulses each other and produces, changes the mode that traditional clamping force formed, reaches the effect that a clamping force acted on a plurality of clamping structures, and first magnet that drive through electric putter pass through thin steel wire and test circuit board to be connected, is favorable to driving test circuit board and removes, reaches the effect that the thrust that produces through an electric putter acted on a plurality of clamping structures.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the present invention;
FIG. 2 is a right side view of the overall structure of the present invention;
FIG. 3 is a top view of the overall structure of the present invention;
fig. 4 is a schematic structural view of the carrier plate of the present invention.
In the figure: 1. the bearing plate, 2, bar jack, 3, push pedal, 4, backup pad, 6, direction orifice plate, 5, round bar, 7, second magnet, 8, first magnet, 9, first fixed pulley, 10, electric putter, 11, bar through-hole, 12, second fixed pulley, 13, extension board, 14, test circuit board, 15, insulation board, 16, U template, 17, fixed plate, 18, reset spring.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
Referring to fig. 1-4, a test fixture for electronic components, including loading board 1 and test circuit board 14, electric putter 10 is installed to loading board 1 top surface one side, and first magnet 8 is installed to electric putter 10's push rod one end, first magnet 8 one side is provided with second magnet 7, and second magnet 7 one side surface top installs push pedal 3, through first magnet 8 and according to first magnet 8 and the principle of the same name magnetic pole repulsion of second magnet 7 that removes for second magnet 7 removes, is favorable to driving push pedal 3, second magnet 7 one side surface top intermediate position installs oriented orifice plate 6 perpendicularly, install round bar 5 in oriented orifice plate 6's the guiding hole, loading board 1 top surface one side intermediate position transversely has seted up bar through-hole 11, and the second fixed pulley 12 is installed at the both ends in bar through-hole 11, test circuit board 14 both ends are located two U16 respectively, and two U16 symmetry install at loading board 1 bottom surface, inboard two U16 and according to the principle of being repelled of first magnet 8 and second magnet 7 for second magnet 7 removes, the second magnet 7 side surface is equipped with guide orifice plate 6, installs oriented orifice plate 6 perpendicularly in the oriented orifice plate 6, the oriented orifice plate 1 is installed through-plate 13 to the top surface mounting 13, and the 13 side-mounted circuit board is equipped with the 13 through the 13 side-mounted side of side surface 13, and the 13 side-mounted circuit board is favorable to the top surface 13 is equipped with the test circuit board, and is equipped with a side-mounted 13, and side 13.
As a technical optimization scheme of the invention, the other end of the test circuit board 14 is elastically connected with the fixed plate 17 through the return spring 18, and the fixed plate 17 is arranged at the middle position of one side of the top surface of the bearing plate 1, so that the test circuit board 14 can return to the initial position.
As a technical optimization scheme of the invention, the two ends of the round rod 5 are respectively provided with the supporting plates 4, and the bottoms of the supporting plates 4 are fixedly arranged on the top surface of the bearing plate 1, so that the round rod 5 is conveniently installed and supported.
As a technical optimization scheme of the invention, a thin steel wire is arranged at the bottom of the surface of the other side of the first magnet 8, one side of the thin steel wire passes through the first fixed pulley 9 and the second fixed pulley 12, one end of the thin steel wire is fixedly arranged at the middle position of one end of the test circuit board 14, and the thin steel wire which is beneficial to traction drives the test circuit board 14 to move.
As a technical optimization scheme of the invention, seven hole slots are longitudinally and equidistantly formed in one side surface of the push plate 3, the slot width sizes of the seven hole slots are the same as the hole width sizes of the seven strip-shaped jacks 2 at corresponding positions, and the clamping of pins of electronic components is facilitated through dislocation of the hole slots and the strip-shaped jacks 2.
As a technical optimization scheme of the invention, seven strip-shaped jacks 2 are arranged, and the seven strip-shaped jacks 2 integrally form a circular structure, and two strip-shaped jacks 2 at symmetrical positions in the seven strip-shaped jacks 2 have the same specification, so that pins of electronic components with different distributions can be clamped conveniently.
When the electronic component is used, pins of the electronic component are correspondingly placed in the strip-shaped jacks 2, the pins pass through the insulating plate 15, the test circuit board 14 and the bearing plate 1 one by one, the electric push rod 10 is started at this time, the electric push rod 10 pushes the first magnet 8 to enable the first magnet 8 to be close to the second magnet 7, the second magnet 7 drives the push rod to move forwards according to the principle that the same-name magnetic poles of the first magnet 8 and the second magnet 7 repel each other, the first magnet 8 is connected with the test circuit board 14 through thin steel wires, the test circuit board 14 is favorably driven to move, the push plate 3 and the test circuit board 14 are moved in opposite dislocation, the reset spring 18 is in an extension state, the electronic component is clamped and fixed due to the fact that the tops of the pins exceed the strip-shaped jacks 2 on the bearing plate 1 and the push rod and the test circuit board 14 are moved in opposite dislocation, after the detection of the first magnet 8 and the test circuit board 14 are connected, the electronic component is detected, the electric push rod 10 is started again after the detection is finished, the first magnet 8 is driven to move to the initial position, and the electronic component is replaced by the electric push rod 14 under the action of the reset spring 18, and the electronic component can be replaced by a person to take the seven electronic component under the action of the reset spring to the detection by the personnel through the test circuit board.
It will be evident to those skilled in the art that the invention is not limited to the details of the foregoing illustrative embodiments, and that the present invention may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are, therefore, to be considered in all respects as illustrative and not restrictive, the scope of the invention being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present disclosure describes embodiments, not every embodiment is provided with a separate embodiment, and that this description is provided for clarity only, and that the disclosure is not limited to the embodiments described in detail below, and that the embodiments described in the examples may be combined as appropriate to form other embodiments that will be apparent to those skilled in the art.
Claims (3)
1. Test fixture for electronic components, including loading board (1) and test circuit board (14), its characterized in that: an electric push rod (10) is arranged on one side of the top surface of the bearing plate (1), a first magnet (8) is arranged at one end of the push rod of the electric push rod (10), a second magnet (7) is arranged on one side of the first magnet (8), a push plate (3) is arranged on the top of one side surface of the second magnet (7), a guide pore plate (6) is vertically arranged in the middle position of the top of one side surface of the second magnet (7), a round rod (5) is arranged in the guide pore plate (6), a strip-shaped through hole (11) is transversely formed in the middle position of one side of the top surface of the bearing plate (1), and second fixed pulleys (12) are arranged at two ends in the strip-shaped through hole (11);
the two ends of the test circuit board (14) are respectively positioned in two U-shaped plates (16), the two U-shaped plates (16) are symmetrically arranged on the bottom surface of the bearing plate (1), an insulating plate (15) is arranged between the inner sides of the two U-shaped plates (16), a support plate (13) is arranged in the middle of the side face of the U-shaped plate (16) positioned at one end of the test circuit board (14), a first fixed pulley (9) is arranged on one side of the top surface of the support plate (13) and one side of the bottom surface of the electric push rod (10), and seven strip-shaped jacks (2) are transversely formed in the top surface of the test circuit board (14), the top surface of the insulating plate (15) and the top surface of the bearing plate (1);
the other end of the test circuit board (14) is elastically connected with the fixed plate (17) through a return spring (18), and the fixed plate (17) is arranged at the middle position of one side of the top surface of the bearing plate (1);
the two ends of the round rod (5) are respectively provided with a supporting plate (4), and the bottom of the supporting plate (4) is fixedly arranged on the top surface of the bearing plate (1);
the bottom of the surface of the other side of the first magnet (8) is provided with a thin steel wire, one side of the thin steel wire penetrates through the first fixed pulley (9) and the second fixed pulley (12), and one end of the thin steel wire is fixedly arranged at the middle position of one end of the test circuit board (14).
2. A test fixture for electronic components as defined in claim 1, wherein: seven hole grooves are longitudinally formed in the surface of one side of the push plate (3) at equal intervals, and the groove width of the seven hole grooves is the same as that of the seven strip-shaped jacks (2) at the corresponding positions.
3. A test fixture for electronic components as defined in claim 1, wherein: seven strip-shaped jacks (2) are arranged, the seven strip-shaped jacks (2) integrally form a circular structure, and the specifications of the two strip-shaped jacks (2) at symmetrical positions in the seven strip-shaped jacks (2) are identical.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711389823.8A CN107870252B (en) | 2017-12-21 | 2017-12-21 | Test fixture for electronic components |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711389823.8A CN107870252B (en) | 2017-12-21 | 2017-12-21 | Test fixture for electronic components |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107870252A CN107870252A (en) | 2018-04-03 |
| CN107870252B true CN107870252B (en) | 2024-01-23 |
Family
ID=61756050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711389823.8A Active CN107870252B (en) | 2017-12-21 | 2017-12-21 | Test fixture for electronic components |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107870252B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108818405B (en) * | 2018-08-22 | 2023-11-17 | 苏州圆格电子有限公司 | Magnet press-fitting combined jig |
| CN109623433B (en) * | 2018-12-20 | 2023-09-29 | 中山火炬职业技术学院 | Clamping device for watchband surface grain processing |
| CN112285524B (en) * | 2019-07-24 | 2024-06-07 | 北京振兴计量测试研究所 | Hybrid integrated circuit aging test tool and method |
| CN112649983B (en) * | 2020-12-29 | 2021-09-07 | 深圳市韦德勋光电科技有限公司 | Detection device for preventing LCD logic board from electrostatic breakdown and use method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200817128A (en) * | 2006-10-13 | 2008-04-16 | Cedal Equipment S R L | Automatic machine for optical alignment and inductive bonding of the layers of a semi-finished multilayer printed circuit |
| CN101720269A (en) * | 2007-02-23 | 2010-06-02 | 英泰斯特股份有限公司 | Test head manipulator |
| CN205852621U (en) * | 2016-07-28 | 2017-01-04 | 徐州市陆博电子实业有限公司 | A kind of frock clamp of the circuit board for plug-in unit electronic component |
| CN206002649U (en) * | 2016-08-31 | 2017-03-08 | 科大国盾量子技术股份有限公司 | A kind of clamp for testing electronic device |
| CN106598248A (en) * | 2016-12-16 | 2017-04-26 | 龙云 | Apparatus for outputting interactive action for HCI parts |
| CN207571170U (en) * | 2017-12-21 | 2018-07-03 | 河南省林晓科技开发有限公司 | A kind of test fixture for electronic component |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080084014A1 (en) * | 2006-10-03 | 2008-04-10 | Mitek Holdings, Inc. | Retrofit Jig System for a Truss Assembly Table |
-
2017
- 2017-12-21 CN CN201711389823.8A patent/CN107870252B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200817128A (en) * | 2006-10-13 | 2008-04-16 | Cedal Equipment S R L | Automatic machine for optical alignment and inductive bonding of the layers of a semi-finished multilayer printed circuit |
| CN101720269A (en) * | 2007-02-23 | 2010-06-02 | 英泰斯特股份有限公司 | Test head manipulator |
| CN205852621U (en) * | 2016-07-28 | 2017-01-04 | 徐州市陆博电子实业有限公司 | A kind of frock clamp of the circuit board for plug-in unit electronic component |
| CN206002649U (en) * | 2016-08-31 | 2017-03-08 | 科大国盾量子技术股份有限公司 | A kind of clamp for testing electronic device |
| CN106598248A (en) * | 2016-12-16 | 2017-04-26 | 龙云 | Apparatus for outputting interactive action for HCI parts |
| CN207571170U (en) * | 2017-12-21 | 2018-07-03 | 河南省林晓科技开发有限公司 | A kind of test fixture for electronic component |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107870252A (en) | 2018-04-03 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107870252B (en) | Test fixture for electronic components | |
| CN106054011B (en) | The automatic detection of electrical leakage platform of leakage circuit breakers | |
| WO2014013350A1 (en) | Testing device | |
| CN107104487B (en) | Clamping mechanism of wireless charger | |
| CN218726130U (en) | Wiring harness tension testing device | |
| CN207571170U (en) | A kind of test fixture for electronic component | |
| CN204731002U (en) | A kind of OLED display and illuminating device measured material | |
| CN216771884U (en) | Automatic withstand voltage test device of circuit breaker | |
| CN208459585U (en) | A kind of electric instrument detection device | |
| CN215894907U (en) | Intelligent power distribution and utilization state detection device | |
| CN218098703U (en) | Automobile wire harness bending endurance test device | |
| CN211426713U (en) | Relay test tool | |
| CN204086318U (en) | loop resistance test fixture | |
| CN221550754U (en) | Circuit board test fixture | |
| CN216447732U (en) | Mounting structure for electrical mechanical equipment | |
| CN213905341U (en) | Battery piece detection device | |
| CN210465645U (en) | Protection device for LED backlight strip test | |
| CN209992588U (en) | Be used for common mode conduction to harass degree of disturbance testing arrangement | |
| CN214471364U (en) | Wireless temperature measuring device for hydropower station electromechanical equipment | |
| CN219420641U (en) | Wind-resistant type mounting frame | |
| CN215497429U (en) | Bus bar capable of being fixed in plug-in mode | |
| CN215833534U (en) | Plug-in type continuous testing device for leakage current characteristics of braid capacitor | |
| CN214311297U (en) | Positioning mechanism | |
| CN218675194U (en) | Triode centre gripping test fixture | |
| CN220066840U (en) | Cable protection device passes by way |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20231225 Address after: 518000, 401, 4th Floor, Building B, Diaoyutai Industrial Zone, Taoyuan Community, Dalang Street, Longhua District, Shenzhen City, Guangdong Province Applicant after: SHENZHEN XINQI TECHNOLOGY Co.,Ltd. Address before: 471000 Room 503, Tower D, Torch Park, Yanguang Road, High tech Zone, Luoyang City, Henan Province Applicant before: HENAN LINXIAO SCIENCE & TECHNOLOGY DEVELOPMENT CO.,LTD. |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |