CN107850425B - 用于测量制品的方法 - Google Patents
用于测量制品的方法 Download PDFInfo
- Publication number
- CN107850425B CN107850425B CN201680041034.2A CN201680041034A CN107850425B CN 107850425 B CN107850425 B CN 107850425B CN 201680041034 A CN201680041034 A CN 201680041034A CN 107850425 B CN107850425 B CN 107850425B
- Authority
- CN
- China
- Prior art keywords
- predetermined point
- image
- article
- images
- positioning device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
- G01B11/005—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates coordinate measuring machines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
- G06T7/75—Determining position or orientation of objects or cameras using feature-based methods involving models
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Quality & Reliability (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Image Analysis (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP15275170.7 | 2015-07-13 | ||
| EP15275170 | 2015-07-13 | ||
| PCT/GB2016/052079 WO2017009615A1 (en) | 2015-07-13 | 2016-07-11 | Method for measuring an artefact |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107850425A CN107850425A (zh) | 2018-03-27 |
| CN107850425B true CN107850425B (zh) | 2022-08-26 |
Family
ID=53762093
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680041034.2A Active CN107850425B (zh) | 2015-07-13 | 2016-07-11 | 用于测量制品的方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10591289B2 (https=) |
| EP (1) | EP3322959B1 (https=) |
| JP (2) | JP7353757B2 (https=) |
| CN (1) | CN107850425B (https=) |
| WO (1) | WO2017009615A1 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3345723A1 (de) * | 2017-01-10 | 2018-07-11 | Ivoclar Vivadent AG | Verfahren zur steuerung einer werkzeugmaschine |
| DE102017219407A1 (de) * | 2017-10-27 | 2019-05-02 | Robert Bosch Gmbh | Erfassungsvorrichtung |
| EP3486606A1 (de) * | 2017-11-20 | 2019-05-22 | Leica Geosystems AG | Stereokamera und stereophotogrammetrisches verfahren |
| DE102018213142A1 (de) * | 2018-08-06 | 2020-02-06 | Carl Zeiss Industrielle Messtechnik Gmbh | Anordnung und Verfahren zum Erfassen einer an einem Objekt angeordneten Markeranordnung |
| EP4282582A1 (fr) | 2022-05-25 | 2023-11-29 | Universo S.A. | Procédé de détermination de la position d'une pièce dans un repère orthonormé basé sur une structure d'une machine-outil à commande numérique |
| CN116051792B (zh) * | 2023-01-16 | 2025-09-12 | 深圳思谋信息科技有限公司 | 产品图生成方法、装置、计算机设备及存储介质 |
| US12577067B1 (en) * | 2024-09-13 | 2026-03-17 | Hand Held Products, Inc. | Robotic depalletization system and method |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101821578A (zh) * | 2007-08-17 | 2010-09-01 | 瑞尼斯豪公司 | 非接触式测量装置和方法 |
| CN101657767B (zh) * | 2007-02-19 | 2014-01-15 | 费劳恩霍弗应用技术研究院 | 用于控制焊接工件的机器人的方法和装置 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3274015D1 (en) * | 1981-07-14 | 1986-12-04 | Hitachi Ltd | Pattern detection system |
| US5251156A (en) | 1990-08-25 | 1993-10-05 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method and apparatus for non-contact measurement of object surfaces |
| JPH09184712A (ja) * | 1995-12-28 | 1997-07-15 | Ishikawajima Harima Heavy Ind Co Ltd | 3次元構造物の形状検査方法 |
| JP2971822B2 (ja) * | 1996-11-06 | 1999-11-08 | 株式会社ミツトヨ | 非接触画像計測システム |
| DE19882963T1 (de) * | 1998-12-22 | 2001-05-10 | Mitsubishi Electric Corp | Positionsfehler-Messverfahren und Einrichtung unter Verwendung einer Positionsmarke und Bearbeitungseinrichtung zum Korrigieren einer Position auf Grundlage eines Ergebnisses oder eines Messpositionsfehlers unter Verwendung einer Positionsmarke |
| US6615072B1 (en) * | 1999-02-04 | 2003-09-02 | Olympus Optical Co., Ltd. | Optical imaging device |
| SE516239C2 (sv) * | 2000-04-28 | 2001-12-03 | Mydata Automation Ab | Metod och anordning för bestämning av nominella data för elektroniska kretsar, genom att ta en digital bild och jämföra med lagrade nominella data. |
| TWI234658B (en) * | 2000-11-02 | 2005-06-21 | Tb Optical Co Ltd | Photosensor device and disk inspection apparatus using it |
| US6831738B2 (en) * | 2001-06-26 | 2004-12-14 | Adc Telecommunications, Inc. | Method and apparatus for inspecting end surfaces on optical connectors |
| US20030026567A1 (en) * | 2001-08-01 | 2003-02-06 | Schott Communications Technologies, Inc. | Graded index fiber, array and method of manufacture |
| US6954262B2 (en) * | 2002-03-18 | 2005-10-11 | Mike Buzzetti | Automated fiber optic inspection system |
| US6989895B2 (en) * | 2002-03-18 | 2006-01-24 | Mike Buzzetti | Automated fiber optic inspection system |
| JP3922085B2 (ja) * | 2002-04-25 | 2007-05-30 | ヤマハ株式会社 | 光ファイバ束の保持構造 |
| US6963062B2 (en) * | 2003-04-07 | 2005-11-08 | Eksigent Technologies, Llc | Method for multiplexed optical detection including a multimode optical fiber in which propagation modes are coupled |
| EP1633534B1 (en) * | 2003-04-28 | 2018-09-12 | Nikon Metrology NV | Cmm arm with exoskeleton |
| US7574067B2 (en) * | 2003-10-03 | 2009-08-11 | General Electric Company | Surface reconstruction and registration with a helmholtz reciprocal image pair |
| FI117086B (fi) * | 2004-03-12 | 2006-06-15 | Aker Finnyards Oy | Menetelmä ja järjestely profiiliaihioiden työstämiseksi |
| GB0508395D0 (en) * | 2005-04-26 | 2005-06-01 | Renishaw Plc | Method for scanning the surface of a workpiece |
| US7773797B2 (en) | 2006-02-06 | 2010-08-10 | Beijing University Of Aeronautics And Astronautics | Methods and apparatus for measuring the flapping deformation of insect wings |
| US7673551B2 (en) * | 2007-08-15 | 2010-03-09 | Heinrich Meurer | Aerial-supported procedure for the detection of landmines |
| GB0716218D0 (en) * | 2007-08-20 | 2007-09-26 | Renishaw Plc | Measurement path generation |
| EP2112465A1 (en) * | 2008-04-24 | 2009-10-28 | Snap-on Equipment Srl a unico socio. | Parameter detection system for wheels |
| JP5271031B2 (ja) * | 2008-08-09 | 2013-08-21 | 株式会社キーエンス | 画像のデータ圧縮方法、画像処理におけるパターンモデルの位置決め方法、画像処理装置、画像処理プログラム及びコンピュータで読み取り可能な記録媒体 |
| GB0909635D0 (en) * | 2009-06-04 | 2009-07-22 | Renishaw Plc | Vision measurement probe |
| CN101672637B (zh) * | 2009-09-24 | 2012-08-15 | 华东理工大学 | 一种复杂曲面的数字化检测方法 |
| JP2012068062A (ja) * | 2010-09-21 | 2012-04-05 | Fuji Xerox Co Ltd | 位置合わせ装置、位置合わせシステム及び位置合わせプログラム |
| US9230339B2 (en) | 2013-01-07 | 2016-01-05 | Wexenergy Innovations Llc | System and method of measuring distances related to an object |
| JP6150532B2 (ja) * | 2013-01-22 | 2017-06-21 | オリンパス株式会社 | 計測装置およびプログラム |
| CN104567812A (zh) * | 2013-10-12 | 2015-04-29 | 北京航天计量测试技术研究所 | 空间位置测量方法及装置 |
| WO2015085982A1 (de) | 2013-12-11 | 2015-06-18 | Api International Ag | Vorrichtung zur 3-d-vermessung einer oberfläche und projektionseinheit, sowie verfahren zur 3-d-vermessung |
| CN106170678A (zh) | 2014-02-24 | 2016-11-30 | 瑞尼斯豪公司 | 利用视觉探针检测物体的方法 |
| KR102082302B1 (ko) * | 2014-09-02 | 2020-02-27 | 삼성전자주식회사 | 엑스선 검출 장치 및 엑스선 장치 |
-
2016
- 2016-07-11 JP JP2018501266A patent/JP7353757B2/ja active Active
- 2016-07-11 EP EP16738530.1A patent/EP3322959B1/en active Active
- 2016-07-11 CN CN201680041034.2A patent/CN107850425B/zh active Active
- 2016-07-11 WO PCT/GB2016/052079 patent/WO2017009615A1/en not_active Ceased
- 2016-07-11 US US15/577,191 patent/US10591289B2/en active Active
-
2021
- 2021-10-01 JP JP2021162978A patent/JP2021193400A/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101657767B (zh) * | 2007-02-19 | 2014-01-15 | 费劳恩霍弗应用技术研究院 | 用于控制焊接工件的机器人的方法和装置 |
| CN101821578A (zh) * | 2007-08-17 | 2010-09-01 | 瑞尼斯豪公司 | 非接触式测量装置和方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20180156608A1 (en) | 2018-06-07 |
| CN107850425A (zh) | 2018-03-27 |
| JP2021193400A (ja) | 2021-12-23 |
| JP7353757B2 (ja) | 2023-10-02 |
| WO2017009615A1 (en) | 2017-01-19 |
| JP2018522240A (ja) | 2018-08-09 |
| EP3322959B1 (en) | 2024-04-03 |
| EP3322959A1 (en) | 2018-05-23 |
| US10591289B2 (en) | 2020-03-17 |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |