CN107817274A - The decision method of solar cell processing procedure defect - Google Patents
The decision method of solar cell processing procedure defect Download PDFInfo
- Publication number
- CN107817274A CN107817274A CN201711018456.0A CN201711018456A CN107817274A CN 107817274 A CN107817274 A CN 107817274A CN 201711018456 A CN201711018456 A CN 201711018456A CN 107817274 A CN107817274 A CN 107817274A
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- test
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- solar cell
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/20—Investigating the presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Photovoltaic Devices (AREA)
Abstract
The present invention relates to a kind of decision method of solar cell processing procedure defect, it is characterized in that, comprise the following steps：（1）Battery line resistance test sample is cut, sample covers back surface field and back electrode；（2）Bridge power supply access interface, other end access 220V power supplys are accessed into power supply adaptor one end；Voltage conductor, both sides access ampere wires are accessed in connecting test line, middle both ends；（3）Test fixture is fixed on to four test leads for drawing digital D. C. bridge on test platform and accesses test fixture, middle 2 probes access voltage conductor, both sides probe access ampere wires；（4）Sample to be tested is placed on testing stand, the probe of test fixture is overlapped with tested sample and selects test resistance precision；Resistance value is read to be judged；When tested sample line resistance test value should be less than 400m Ω.The present invention quickly judges to carry on the back silver back of the body aluminium contact resistance at battery manufacturing procedure end, and then batch EL is bad after preventing components welding.
Description
Technical field
The present invention relates to a kind of decision method of solar cell processing procedure defect, especially one kind passes through solar battery back
The test of silver and back aluminum slurry contact resistance is to define the method for grout material defect or processing procedure defect in battery manufacturing procedure.
Background technology
Quality has no effective decision method after judging back electrode and Al-back-surface-field (BSF) paste sintering for solar cell industry, leads to
Cross simple principle and identify that line resistance can effectively judge between back of the body electric field and electrode.
In the prior art, photovoltaic cell back of the body silver and back aluminum slurry material resistance test be limited to silver paste or aluminium paste and
Between silicon materials, and lack the simple and easy method to the test of silver-colored aluminium calmodulin binding domain CaM.Cell piece IV tests, EL tests are only to the whole of battery
Body contact resistance behavior is bound, and directly the electric current transmission abnormality of components welding can not be judged.And simulate welding and survey
Though examination widgets EL method can determine that, test period length, and need battery and assembly material more, material cost is high.
The content of the invention
The purpose of the present invention is to overcome the deficiencies in the prior art, there is provided a kind of solar cell processing procedure defect is sentenced
Determine method, quickly judge to carry on the back silver back of the body aluminium contact resistance at battery manufacturing procedure end, and then batch EL is bad after preventing components welding.
According to technical scheme provided by the invention, the decision method of the solar cell processing procedure defect, it is characterized in that, bag
Include following steps：
（1）Battery line resistance test sample is cut, sample covers back surface field and back electrode；
（2）Bridge power supply access interface, other end access 220V power supplys are accessed into power supply adaptor one end；Connecting test line, in
Between both ends access voltage conductor, both sides access ampere wires；
（3）Test fixture is fixed on to four test leads for drawing digital D. C. bridge on test platform and accesses test clip
Tool, the mode of connection are：Middle 2 probes access voltage conductor, both sides probe access ampere wires；
（4）Test sample and criterion：
A, sample to be tested is placed on testing stand, the probe of test fixture is overlapped with tested sample and select test resistance
Precision；
B, resistance value is read, is judged；It is normal when tested sample line resistance test value is less than 400m Ω, more than 400m Ω
When solar cell existing defects.
Further, the test fixture includes supporting plate, slide-and-guide groove is set on the supporting plate, in slide-and-guide groove
In be inserted with four needle guards, the upper and lower ends of needle guard expose the upper and lower surface of supporting plate, and the outer surface of needle guard is flank, in needle guard
On be arranged two locking nuts, two locking nuts are located at the upper and lower surface of supporting plate needle guard to be locked to required position
Put；There is probe receptacle, probe is inserted in the probe receptacle of needle guard, and the upper end of probe is thin head end, as survey in the needle guard
Line leading-in end is tried, lower end is butt end, for the contact solar cell back side.
Further, scale is set in the slide-and-guide groove side.
Further, the test sample along be cut between two back electrodes width be 2mm sample.
Further, in the step（1）During middle cutting test sample, 10 samples, back surface field are chosen among cell back field
Choose 10 samples in both sides.
The decision method of solar cell processing procedure defect of the present invention, quickly judge that carrying on the back silver back of the body aluminium connects at battery manufacturing procedure end
Get an electric shock resistance, and then batch EL is bad after preventing components welding.Method of testing of the present invention is simple, avoids simulation welding test group
Part EL method test period is long, the defects of needing battery and assembly material more, reduces material cost.
Brief description of the drawings
Fig. 1 is the structural representation of test fixture.
Fig. 2 is the test philosophy figure of the present invention.
Embodiment
With reference to specific embodiment, the invention will be further described.
The decision method of solar cell processing procedure defect of the present invention, comprises the following steps：
（1）Battery line resistance test sample is cut using laser：
Split requirement：Battery is generally 39mm along the sample that width is 2mm, length is cut between two back electrodes, sample must
Back surface field and back electrode must be covered；In order to ensure the accuracy of result of determination, every cell piece should choose 20 samples, selection principle
For：10 samples are randomly selected among back surface field, back surface field both sides randomly select 10 samples；
（2）Digital D. C. bridge application method：
A, bridge power supply access interface, other end access 220V power supplys are accessed into power supply adaptor one end；
B, red voltage conductor, both sides access black current wire are accessed in connecting test line, middle both ends；
C, bridge power supply switch is opened；
D, test switch is opened；
（3）Test fixture application method：
As shown in figure 1, the test fixture used includes supporting plate 1, slide-and-guide groove 2 is set in supporting plate 1, in slide-and-guide
Four needle guards 3 are inserted with groove 2, the upper and lower ends of needle guard 3 expose the upper and lower surface of supporting plate 1, and the outer surface of needle guard 3 is screw thread
Face, is arranged two locking nuts 4 on needle guard 3, and two locking nuts 4 are located at the upper and lower surface of supporting plate 1 needle guard 3 to be locked
Tightly in desired position；There is probe receptacle, probe 5 is inserted in the probe receptacle of needle guard 2, the upper end of probe 5 in the needle guard 3
For thin head end, as p-wire leading-in end, lower end is butt end, for the contact solar cell back side；In the slide-and-guide
The side of groove 2 sets scale, to determine the distance between four probes 5.
During test, test fixture is fixed on to four test leads for drawing digital D. C. bridge on test platform and accessed
Test fixture, the mode of connection are：Middle 2 probes（A2、A3）Access red voltage conductor, both sides probe（A1、A4）Access black
Color ampere wires；The distance between four probes are adjusted according to test sample；
（4）Test sample and criterion：
A, sample to be tested is placed on testing stand, the probe of test fixture is overlapped with tested sample and select test resistance
Precision, as shown in Figure 2；
B, resistance value is read, is judged；Criterion：Tested sample line resistance test value should be less than 400m Ω, more than 400m
During Ω, in time related personnel should be notified to be adjusted, and reaffirmed after the adjustment.
The standard judged in the present invention is 400m Ω, and the numerical value is that technical staff summarizes to obtain according to many experiments, is
Defect is not present in guarantee solar cell processing procedure, the line resistance value of silver-colored aluminium calmodulin binding domain CaM should be less than 400m Ω.The present invention surveys
Method for testing is simple, avoids simulation welding test widgets EL method test period length, needs battery and assembly material more
The defects of, reduce material cost.
Claims (5)
1. a kind of decision method of solar cell processing procedure defect, it is characterized in that, comprise the following steps：
（1）Battery line resistance test sample is cut, sample covers back surface field and back electrode；
（2）Bridge power supply access interface, other end access 220V power supplys are accessed into power supply adaptor one end；Connecting test line, in
Between both ends access voltage conductor, both sides access ampere wires；
（3）Test fixture is fixed on to four test leads for drawing digital D. C. bridge on test platform and accesses test clip
Tool, the mode of connection are：Middle 2 probes access voltage conductor, both sides probe access ampere wires；
（4）Test sample and criterion：
A, sample to be tested is placed on testing stand, the probe of test fixture is overlapped with tested sample and select test resistance
Precision；
B, resistance value is read, is judged；It is normal when tested sample line resistance test value is less than 400m Ω, more than 400m Ω
When solar cell existing defects.
2. the decision method of solar cell processing procedure defect as claimed in claim 1, it is characterized in that：The test fixture includes
Supporting plate（1）, in supporting plate（1）Upper setting slide-and-guide groove（2）, in slide-and-guide groove（2）In be inserted with four needle guards（3）, pin
Set（3）Upper and lower ends expose supporting plate（1）Upper and lower surface, needle guard（3）Outer surface be flank, in needle guard（3）Upper set
If two locking nuts（4）, two locking nuts（4）Positioned at supporting plate（1）Upper and lower surface to by needle guard（3）It is locked at institute
The position needed；The needle guard（3）In there is probe receptacle, probe（5）It is inserted in needle guard（2）Probe receptacle in, probe（5）It is upper
Hold as thin head end, as p-wire leading-in end, lower end is butt end, for the contact solar cell back side.
3. the decision method of solar cell processing procedure defect as claimed in claim 2, it is characterized in that：In the slide-and-guide groove
（2）Side sets scale.
4. the decision method of solar cell processing procedure defect as claimed in claim 1, it is characterized in that：The test sample is along two
The sample that width is 2mm is cut between individual back electrode.
5. the decision method of solar cell processing procedure defect as claimed in claim 1, it is characterized in that：In the step（1）In
When cutting test sample, 10 samples are chosen among cell back field, 10 samples are chosen in back surface field both sides.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711018456.0A CN107817274A (en) | 2017-10-27 | 2017-10-27 | The decision method of solar cell processing procedure defect |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711018456.0A CN107817274A (en) | 2017-10-27 | 2017-10-27 | The decision method of solar cell processing procedure defect |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107817274A true CN107817274A (en) | 2018-03-20 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711018456.0A Pending CN107817274A (en) | 2017-10-27 | 2017-10-27 | The decision method of solar cell processing procedure defect |
Country Status (1)
| Country | Link |
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| CN (1) | CN107817274A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109473366A (en) * | 2018-10-07 | 2019-03-15 | 江苏顺风新能源科技有限公司 | Method for detecting rear surface of solar cell silver paste and aluminium paste contact resistance |
| CN109520917A (en) * | 2018-12-30 | 2019-03-26 | 苏州阿特斯阳光电力科技有限公司 | The corrosion resistance test method of cell piece slurry |
| CN110672926A (en) * | 2019-10-24 | 2020-01-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203026517U (en) * | 2012-12-27 | 2013-06-26 | 浙江正泰太阳能科技有限公司 | Back electrode structure of solar battery |
| CN204882761U (en) * | 2015-08-27 | 2015-12-16 | 山东华芯富创电子科技有限公司 | Tool is surveyed to general electricity |
| CN105826409A (en) * | 2016-04-26 | 2016-08-03 | 泰州中来光电科技有限公司 | Local back field N type solar cell, preparation method thereof, assembly and system |
| CN206557291U (en) * | 2017-02-28 | 2017-10-13 | 无锡尚德太阳能电力有限公司 | solar battery back electric field line resistance detection device |
-
2017
- 2017-10-27 CN CN201711018456.0A patent/CN107817274A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203026517U (en) * | 2012-12-27 | 2013-06-26 | 浙江正泰太阳能科技有限公司 | Back electrode structure of solar battery |
| CN204882761U (en) * | 2015-08-27 | 2015-12-16 | 山东华芯富创电子科技有限公司 | Tool is surveyed to general electricity |
| CN105826409A (en) * | 2016-04-26 | 2016-08-03 | 泰州中来光电科技有限公司 | Local back field N type solar cell, preparation method thereof, assembly and system |
| CN206557291U (en) * | 2017-02-28 | 2017-10-13 | 无锡尚德太阳能电力有限公司 | solar battery back electric field line resistance detection device |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109473366A (en) * | 2018-10-07 | 2019-03-15 | 江苏顺风新能源科技有限公司 | Method for detecting rear surface of solar cell silver paste and aluminium paste contact resistance |
| CN109520917A (en) * | 2018-12-30 | 2019-03-26 | 苏州阿特斯阳光电力科技有限公司 | The corrosion resistance test method of cell piece slurry |
| CN110672926A (en) * | 2019-10-24 | 2020-01-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
| CN110672926B (en) * | 2019-10-24 | 2021-08-10 | 河北工业大学 | Electrical material conductivity measuring device and measuring system suitable for different working conditions |
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Application publication date: 20180320 |