CN107786993A - A kind of signal testing method and device - Google Patents
A kind of signal testing method and device Download PDFInfo
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- CN107786993A CN107786993A CN201610738261.2A CN201610738261A CN107786993A CN 107786993 A CN107786993 A CN 107786993A CN 201610738261 A CN201610738261 A CN 201610738261A CN 107786993 A CN107786993 A CN 107786993A
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/02—Arrangements for optimising operational condition
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- H—ELECTRICITY
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- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
- H04B17/30—Monitoring; Testing of propagation channels
- H04B17/309—Measuring or estimating channel quality parameters
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
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- H04W24/04—Arrangements for maintaining operational condition
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Abstract
The embodiment of the invention discloses a kind of signal testing method, sequential parameter corresponding with each index to be measured that receiving control apparatus is sent；The formal parameter included according to the sequential parameter, upward signal, and the test parameter included according to the sequential parameter are generated, generates descending cycle tests；The upward signal is sent to test equipment, the test equipment is triggered to test the upward signal according to the up cycle tests previously generated, tested according to the downstream signal that the descending cycle tests is sent to the test equipment, obtain the test result of each index to be measured.The embodiment of the present invention further simultaneously discloses a kind of signal-testing apparatus.
Description
Technical field
The present invention relates to the communications field, more particularly to a kind of signal testing method and device.
Background technology
At present, with the fast development of mobile terminal, it is imperative to improve the performance indications of mobile terminal, mobile terminal
The test of RF index is wherein essential step.
Now, it is still that typical terminal establishes letter with net side in the method for testing to the RF index of mobile terminal
Order link, then sees up-downgoing index again；However, using the above method, the index of measurement is established the link in terminal and network
The RF index of certain time afterwards, and the signal index under a variety of radio frequency operation scenes can not measure, no image of Buddha shows
Ripple device observation baseband signal can observe the feature of whole signal lifetime all moment points like that, also, with Long Term Evolution
The popularization of (LTE, Long Term Evolution), LTE RF index is very more, only runs basic RF index and tests, 1
Bandwidth is run down entirely carrys out the time, it is necessary to half an hour, is incremented by with the increase of bandwidth number, LTE signal forms also compare the second generation
GSM (2G, 2rd-Generation)/3-G (Generation Three mobile communication system) (3G, 3rd-Generation) is more multiple
It is miscellaneous, for example, bandwidth, modulation system, resource block (RB, Resource Block), frame format, channel form etc., wherein, it is existing
Method of testing the signal of some particular forms can not be tested, so as to which the test blindspot brought is more, in this way, existing
More test blindspot in the method for testing of the RF index of mobile terminal be present.
The content of the invention
In view of this, the embodiment of the present invention it is expected to provide a kind of signal testing method and device, eliminates to mobile terminal
RF index test present in test blindspot, meet testing requirement.
To reach above-mentioned purpose, the technical proposal of the invention is realized in this way：
In a first aspect, the embodiments of the invention provide a kind of signal testing method, including：Receiving control apparatus send with
Sequential parameter corresponding to each index to be measured；The formal parameter included according to the sequential parameter, generation upward signal, and according to
The test parameter that the sequential parameter includes, generate descending cycle tests；The upward signal is sent to test equipment, triggering
The test equipment is tested the upward signal according to the up cycle tests previously generated, according to the descending test
The downstream signal that test equipment described in sequence pair is sent is tested, and obtains the test result of each index to be measured.
In such scheme, the triggering test equipment is according to the up cycle tests previously generated to described up
Signal is tested, and is tested according to the downstream signal that the descending cycle tests is sent to the test equipment, including：Touch
It is described up according to time in the up cycle tests and the corresponding relation of index classification to be measured, test to send out test equipment described
Signal, according to time in the descending cycle tests and the corresponding relation of index classification to be measured, test the downstream signal.
In such scheme, after the up cycle tests to test equipment is sent, each finger to be measured is being obtained
Before target test result, methods described includes：The sequence ginseng is carried out to physical layer PHY or media control Access Layer MAC
Several configurations；And/or the configuration of the sequential parameter is carried out to logic channel or transmission channel；And/or radio frames are joined
Number is directly configured.
In such scheme, after the test result of each index to be measured is obtained, methods described also includes：Receive institute
The acquisition instruction of control device is stated, returns to the test result to the control device.
Second aspect, the embodiments of the invention provide a kind of signal testing method, including：Receive each index to be measured；According to
Each index to be measured is user equipment (UE) generation sequential parameter corresponding with each index to be measured and transmission to described
UE, and be test equipment generation sequential parameter corresponding with each index to be measured and transmission to the test equipment.
In such scheme, according to each index to be measured, generated and each finger to be measured for the user equipment (UE)
Sequential parameter corresponding to mark is simultaneously sent to the UE, for test equipment generation sequence ginseng corresponding with each index to be measured
Count and send to the test equipment, methods described also includes：Send respectively and obtain instruction to the UE and the test
Equipment；Respectively from the UE and the test equipment, the test result of each index to be measured is obtained.
The third aspect, the embodiments of the invention provide a kind of signal-testing apparatus, including：First receiving module, for connecing
Receive the sequential parameter corresponding with each index to be measured that control device is sent；First generation module, for according to the sequential parameter
The formal parameter included, upward signal, and the test parameter included according to the sequential parameter are generated, generates descending test
Sequence；Test module, for sending the upward signal to test equipment, it is upper according to what is previously generated to trigger the test equipment
Row cycle tests is tested the upward signal, the test equipment is sent according to the descending cycle tests descending
Signal is tested, and obtains the test result of each index to be measured.
In such scheme, the test module, it is specifically used for：The upward signal is sent to the test equipment, is touched
It is described up according to time in the up cycle tests and the corresponding relation of index classification to be measured, test to send out test equipment described
Signal, according to time in the descending cycle tests and the corresponding relation of index classification to be measured, the downstream signal is tested, is obtained
The test result of each index to be measured.
In such scheme, the test module, it is additionally operable to：Send the up cycle tests to test equipment it
Afterwards, before the test result of each index to be measured is obtained, Access Layer MAC is controlled to carry out institute physical layer PHY or media
State the configuration of sequential parameter；And/or the configuration of the sequential parameter is carried out to logic channel or transmission channel；It is and/or right
Wireless frame parameter is directly configured.
In such scheme, described device also includes：Module is returned to, for obtaining the test knot of each index to be measured
After fruit, the acquisition instruction of the control device is received, returns to the test result to the control device.
Fourth aspect, the embodiments of the invention provide a kind of signal-testing apparatus, including：Second receiving module, for connecing
Receive each index to be measured；Second generation module, for according to each index to be measured, being generated for the user equipment (UE) and described each
Sequential parameter corresponding to index to be measured is simultaneously sent to the UE, and corresponding with each index to be measured for test equipment generation
Sequential parameter and send to the test equipment.
In such scheme, described device also includes：Acquisition module, for being described according to each index to be measured
User equipment (UE) generates sequential parameter corresponding with the index to be measured and sent to the UE, for test equipment generation and
Sequential parameter corresponding to the index to be measured simultaneously send to after the test equipment, send respectively obtain instruction to the UE and
The test equipment；Respectively from the UE and the test equipment, the test result of each index to be measured is obtained.
The signal testing method and device that the embodiment of the present invention is provided, in order to meet the testing requirement of each index to be measured,
The sequential parameter of each index to be measured is issued by control device so that signal-testing apparatus can join according to the form in sequential parameter
Number and test parameter, upward signal corresponding with formal parameter and descending cycle tests corresponding with test parameter are generated respectively,
So, in signal-testing apparatus and test equipment, the upward signal to match each other and up cycle tests are just respectively present,
The descending cycle tests and downstream signal to match each other, then, the upward signal only issued when signal-testing apparatus and test
When up cycle tests in equipment matches each other, the descending survey in downstream signal and signal-testing apparatus that test equipment is sent
When examination sequence matches each other, signal-testing apparatus can test out each index to be measured with test equipment, so, work as signal testing
Device issues upward signal to test equipment so that signal-testing apparatus realizes sequence synchronization with test equipment, under performing respectively
Row cycle tests and up cycle tests, in this way, signal-testing apparatus can be according to the descending test to match with downstream signal
Sequence pair downstream signal is tested, and can also synchronously trigger test equipment according to the up test sequence to match with upward signal
Row are tested upward signal, so as to obtain the test result of each index to be measured, so, meet the survey to each index to be measured
Examination demand, so as to eliminate test blindspot present in the test to the RF index of mobile terminal, further meet survey
Examination demand.
Brief description of the drawings
Fig. 1 is the structural representation of the test system in the embodiment of the present invention；
Fig. 2 is a kind of optional structural representation of the test system in the embodiment of the present invention；
Fig. 3 is the schematic flow sheet of the signal testing method in the embodiment of the present invention；
Fig. 4 is the timing diagram of the LTE up-downgoing cycle tests in the embodiment of the present invention；
Fig. 5 is the structural representation of the WAP system in the embodiment of the present invention；
Fig. 6 is a kind of optional schematic flow sheet of the signal testing method in the embodiment of the present invention；
Fig. 7 is another optional schematic flow sheet of the signal testing method in the embodiment of the present invention；
Fig. 8 is a kind of optional structural representation of the signal-testing apparatus in the embodiment of the present invention；
Fig. 9 is another optional structural representation of the signal-testing apparatus in the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes.
The embodiment of the present invention provides a kind of signal test system, and Fig. 1 is the structure of the test system in the embodiment of the present invention
Schematic diagram, as shown in figure 1, the test system can include：One control device 11, user equipmenies 12 (UE, a User
Equipment) and a test equipment 13, control device 11 are respectively connecting to UE12 and test equipment 13, and UE12 is set with test
Standby 13 foundation has communication connection；
Wherein, in above-mentioned Fig. 1, control device 11 is mainly used in the test process of signal, and UE12 and test are set
Standby 13 are controlled, wherein, above-mentioned control device 11 can include personal computer (PC, Personal Computer) or
Server etc.；
In addition, UE12 is connected with test equipment by radio frequency line, the connection of wireless signal, UE12 and test equipment are established
13, by testing the wireless signal between UE12 and test equipment come to obtaining the test result of each index to be measured, wherein, UE12
Mobile phone and tablet personal computer etc. can be included, test equipment can be instrument；
For example, Fig. 2 is a kind of optional structural representation of the test system in the embodiment of the present invention, such as Fig. 2 institutes
To show, above-mentioned test system includes a PC, UE and instrument, wherein, pass through general purpose interface bus between PC and instrument
(GPIB, General-Purpose Interface Bus) or transmission control protocol/Internet Protocol (TCP/IP,
Transmission Control Protocol/Internet Protocol) connection, realize to the program control of instrument；PC with
Connected between UE by USB (USB, Universal Serial Bus), PC sends order to UE and realized to UE's
It is program control；UE antennal interface ANT0 and ANT1 by radio frequency line be respectively connecting to the radio frequency interface RF1COM of instrument and
RF3COM, so as to establish wireless signal connection.
With reference to the embodiment of the present invention, in above-mentioned test system, UE12 receiving control apparatus is sending with each index to be measured
Corresponding sequential parameter；The formal parameter included according to sequential parameter, upward signal is generated, and included according to sequential parameter
Test parameter, generate descending cycle tests；Upward signal is sent to test equipment, triggering test equipment 13 is according to previously generating
Up cycle tests upward signal is tested, entered according to the downstream signal that descending cycle tests is sent to test equipment 13
Row test, obtains the test result of each index to be measured.
Control device 11 receives each index to be measured；According to each index to be measured, generated for UE12 corresponding with each index to be measured
Sequential parameter is simultaneously sent to UE12, and for the generation of test equipment 13 sequential parameter corresponding with each index to be measured and is sent to test
Equipment 13.
Signal testing method provided in an embodiment of the present invention is illustrated with reference to said system.
Fig. 3 is the schematic flow sheet of the signal testing method in the embodiment of the present invention；As shown in figure 3, the signal testing side
Method includes：
S301：Control device receives each index to be measured；According to each index to be measured, generated for UE corresponding with each index to be measured
Sequential parameter is simultaneously sent to UE, and is set for test equipment generation sequential parameter corresponding with each index to be measured and transmission to test
It is standby；
Wherein, above-mentioned each index to be measured can include error vector magnitude EVM, monkey chatter than ACLR, power P ower,
Frequency error FrequencyError, automatic growth control AGC, intensity instruction (RSSI, the Received of reception signal
Signal Strength Indicator), Reference Signal Received Power (RSRP, Reference Signal Receiving
Power), block error rate BLER, systematic parameter N0 (being used to represent the noise received) etc., here, the present invention does not do specific limit
It is fixed；
Control device sequential parameter corresponding to each index to be measured of lookup, then obtains after each index to be measured is received
Sequential parameter corresponding to each index to be measured, wherein, above-mentioned sequential parameter can include：UE sequential parameter and the sequence of test equipment
Row parameter；
UE sequential parameter includes formal parameter and test parameter, wherein, formal parameter regulation UE is sent to test and set
The form of standby upward signal, the formal parameter can include modulation system, bandwidth, amount R B Number of resource block, resource
Original position RB offset, frame structure Frame Configure, channel form and data content of block etc., above-mentioned channel shape
Formula can include：Physical uplink control channel (PUCCH, Physical Uplink Control Channel) and physics
Uplink Shared Channel (PUSCH, Physical Uplink Shared Channel) etc., data content include full 0 (ALL0),
Complete 1 (ALL1) or random code (PN9) etc.；Test parameter provides the testing time of UE test downstream signals and the index of test
Classification, the index classification of the test can include AGC, RSSI, RSRP, BLER, N0, FrequencyError etc.；
The argument sequence of test equipment includes formal parameter and test parameter, wherein, the formal parameter defines descending letter
Number form, the formal parameter can be cell power cell power, frequency, bandwidth, modulation system etc.；The test parameter is advised
The testing time of test equipment testing uplink signal and the index classification of test are determined, the index classification of the test can include
EVM, ACLR, Power, FrequencyError etc.；
Control device is determining sequential parameter for UE and is being after test equipment determines sequential parameter, to be respectively sent to
UE and test equipment.
S302：UE is received as UE generations sequential parameter corresponding with each index to be measured, and UE includes according to sequential parameter
Formal parameter, upward signal, and the test parameter included according to sequential parameter are generated, generates descending cycle tests；
Test equipment is received as test equipment generation sequential parameter corresponding with each index to be measured, and test equipment is according to sequence
The formal parameter that parameter includes, downstream signal, and the test parameter included according to sequential parameter are generated, generates descending test
Sequence；
Specifically, UE is generated with test equipment after respective sequential parameter is received by control device
UE sequential parameter and the sequential parameter of test equipment are matched each other so that the upward signal of UE generations is given birth to test equipment
Into up cycle tests match each other, mutual of the descending cycle tests of downstream signal and the UE generation of test equipment generation
Match somebody with somebody；
Wherein, the testing time of each index to be measured is defined in above-mentioned up cycle tests and descending cycle tests, Fig. 4 is
The timing diagram of LTE up-downgoing cycle tests in the embodiment of the present invention, as shown in figure 4, cycle tests defines each moment point
Up-downgoing test index classification, while comprising corresponding up-downgoing formal parameter, for downlink traffic (RX), sequentially
The downstream signal of the good instrument of row parameter configuration, UE are in continuous measuring state, take the data of all moment points；Wherein, it is right
In RX, sequential parameter can include：RSRP, AGC, N0, BLER；For uplink traffic (TX), it is specified that each moment points of UE are up
The formal parameter of signal, corresponding instrument are measured by signal form using suitable up cycle tests, wherein, it is right
In TX, first base band, bandwidth is 20M, 10M, 5M over time, and channel is become by Gao Bianzhong over time
It is low, during test, the 1st test event (Test Item), in the preceding 20ms of up cycle tests, up test sequence
The index of row test includes：Whole resource block FULL RB, Maxpower, EVM, ACLR, Spectrum Emission Mask SEM, source point skew
IQ Offset, normalized spatial spectrum flatness ESF etc.；2nd Test Item, in subsequent 60ms, up cycle tests is surveyed
Try be：1 resource block 1RB, test index Maxpower when resource block original position is 0/49/99Offset 0/49/99,
EVM, ACLR, SEM, IQ Offset, ESF, the 3rd Test Item, in subsequent 60ms, 18 resource block 18RB, resource block
Test index Maxpower when original position is 0/32/82Offset 0/32/82, EVM, ACLR, SEM, IQ Offset, ESF,
4th Test Item, in subsequent 20ms, 1 resource block 1RB, test index when resource block original position is 0Offset 0
Maxpower, EVM, ACLR, SEM, IQ Offset, ESF, the 5th Test Item, in subsequent 40ms, up cycle tests
The index of test includes：Minimum power MinPower；6th Test Item, in subsequent 40ms, up cycle tests test
Index be IQ Offset；7th Test Item, in subsequent 20ms, the index of up cycle tests test is：Time mould
Plate Time Mask.
S303：UE sends upward signal to test equipment, triggering test equipment and sends downstream signal to UE；Test equipment root
Upward signal is tested according to up cycle tests, UE is tested downstream signal according to descending cycle tests, is obtained each
The test result of index to be measured；
In order to realize sequence synchronization, first, UE sends upward signal to test equipment, triggering test equipment and sends descending letter
Number to test equipment, start simultaneously at and perform up cycle tests and descending cycle tests, so, just complete series of simultaneous, protect
The correctness of test result is hindered；
Further, in order to obtain the test result of each index to be measured, in a kind of optional embodiment, test equipment root
Upward signal is tested according to up cycle tests, including：Test equipment is according to time in up cycle tests and finger to be measured
Mark the corresponding relation of classification, testing uplink signal；UE is tested downstream signal according to descending cycle tests, is obtained each to be measured
The test result of index, including：UE is descending according to time in descending cycle tests and the corresponding relation of index classification to be measured, test
Signal.
Based on what is be previously mentioned, upward signal matches with up cycle tests, downstream signal and existing realistic sequence phase
Matching, then, after UE realizes sequence synchronization with test equipment, UE performs descending cycle tests and up survey with test equipment
Sequence is tried, can all test out the test result of each index to be measured exactly.
In order to further get the test result of more accurate each index to be measured, in a kind of optional embodiment,
After up cycle tests to test equipment is sent, before the test result of each index to be measured is obtained, the above method includes：
The configuration of sequential parameter is carried out to physical layer PHY or media control Access Layer MAC；And/or logic channel or transmission are believed
Road carries out the configuration of sequential parameter；And/or wireless frame parameter is directly configured.
Fig. 5 is the structural representation of the WAP system in the embodiment of the present invention, as shown in figure 5, this wirelessly connects
Entering the architecture of agreement includes：First layer (Layer1) physical layer (PHY, Physical Layer), the second layer (Layer2)
Medium education (MAC, Media Access Control) and third layer wireless heterogeneous networks (RRC, Radio Resource
Control), it is transmission channel (Transport channels) between PHY layer and MAC layer, believes between MAC and RRC for logic
Road (Logical channels)；
Whole mobile communication framework is formed by three layers, due to RF index and rrc layer onrelevant, MAC layer and rrc layer it
Between interface, MAC layer, the interface between MAC layer and PHY layer be called, form non-signaling cycle tests, formation it is non-
Signaling test sequence can use instrument by rejecting Signalling exchange to determine the action of the radiofrequency signal of each moment point
The signal of each moment point of table scan, can also pour into various forms of downstream signals；Ensure MAC and PHY integrality, can be with
Ensure the uniformity of RF index test.
Wherein, the interface between PHY and MAC, RRC tectonic sequence process, realizes non-signaling test as point of penetration
Sequence.
Construction by hierarchical logic implement, specifically divide it is several layers of, be to rely on whole communication protocol stack software and hardware realize framework with
And think the point of observation and determine, here it is possible to consider that point three levels are realized.
First level be：The relevant parameter of the PHY layer process/MAC layer process defined to protocol specification configures, shape
The correctness and process realized into non-signaling cycle tests, the PHY/MAC processes for examining protocol specification to define perform institute
The specific radio-frequency performance index shown.For example, configuration ALL0/ALL1/PN9 data source；Configure different coded systems, filter
Wave system number；RB, debud mode, subframe proportioning, antenna etc. are configured, so, the sequential parameter is configured to PHY layer/MAC layer
In, then, when now testing index to be measured, the test result of the related index to be measured of the resulting hardware to having run code
It is more accurate.
Second level be：The relevant parameter of logic channel/transmission channel is configured, forms non-signaling test sequence
Row；For examine channel realize correctness and channel relevant parameter finally implement to shown in radiofrequency signal it is specific
Radio-frequency performance index；For example, destroying PUSCH channels, only retain PUCCH channels, observe the signal index of PUCCH channels；Individually
Observe the index of PCFICH channels；Specific UCI parameters, observation radiofrequency signal index etc. are configured to PUSCH or PUCCH, this
Sample has ensured the accuracy of the index to be measured for PUCCH；
Second level be：Radio frames relevant parameter is directly configured, forms non-signaling cycle tests；For examining hardware
Radio-frequency performance index；Now, the physical layer of protocol definition is no longer limited by, is the test mode based on radio frequency demonstration demo plates,
By self-defined frame length, modulation system, data source etc., the RF index of frequency domain/time domain can be tested.
Three levels are emphasized particularly on different fields, and the non-signaling cycle tests of first layer/second layer is laid particular stress on investigating protocol specification regulation
The whole complete behavior of PHY layer/MAC layer down；The non-signaling cycle tests of third layer is more heavily weighted toward the different fields of hardware
The inspection of scape.
S304：Control device obtains the test result of each index to be measured from UE and test equipment respectively.
In a kind of optional embodiment, after S305, the above method can include：Control device sends acquisition respectively
Instruction is to UE and test equipment, and UE sends test result to control device, and test equipment sends test result to control device.
In actual applications, up-downgoing cycle tests is that at the appointed time section performs, thus when finishing control equipment
It is foreseeable, after the sequence ends, control device inquiry instrument, determines virtual condition, then the measurement of inquiring instrument table side
Data, the measurement data of inquiry UE sides.
So far, the test to index to be measured is just completed, control device has obtained the test result of each index to be measured.
The signal testing method that the embodiment of the present invention is provided, in order to meet the testing requirement of each index to be measured, by controlling
Equipment issues the sequential parameter of each index to be measured so that signal-testing apparatus can be according to the formal parameter in sequential parameter and survey
Parameter is tried, generates upward signal corresponding with formal parameter and descending cycle tests corresponding with test parameter respectively, so,
In signal-testing apparatus and test equipment, the upward signal to match each other and up cycle tests are just respectively present, mutual
The descending cycle tests and downstream signal matched somebody with somebody, then, only when in the upward signal and test equipment that signal-testing apparatus issues
Up cycle tests when matching each other, the descending cycle tests in downstream signal and signal-testing apparatus that test equipment is sent
When matching each other, signal-testing apparatus can test out each index to be measured with test equipment, so, when under signal-testing apparatus
Upward signal is sent out to test equipment so that signal-testing apparatus realizes sequence synchronization with test equipment, performs descending test respectively
Sequence and up cycle tests, in this way, signal-testing apparatus can be according to the descending cycle tests pair to match with downstream signal
Downstream signal is tested, and can also synchronously trigger test equipment according to the up cycle tests to match with upward signal to upper
Row signal is tested, and so as to obtain the test result of each index to be measured, so, meeting the test to each index to be measured needs
Ask, so as to eliminate test blindspot present in the test to the RF index of mobile terminal, further meeting test needs
Ask.
Each equipment side in based on signal test system of standing below illustrates to above-mentioned communication means.
First, stand and signal testing method is described in UE sides.
Fig. 6 is a kind of optional schematic flow sheet of the signal testing in the embodiment of the present invention, as shown in fig. 6, this method
Including：
S601：The sequential parameter corresponding with each index to be measured that receiving control apparatus is sent；
S602：The formal parameter included according to sequential parameter, upward signal is generated, and included according to sequential parameter
Test parameter, generate descending cycle tests；
S603：Upward signal is sent to test equipment, triggering test equipment is according to the up cycle tests pair previously generated
Upward signal is tested, and is tested according to the downstream signal that descending cycle tests is sent to test equipment, is obtained each to be measured
The test result of index.
In a kind of optional embodiment, in order to obtain the test result of each index to be measured, in S603, test equipment is triggered
Up cycle tests according to previously generating is tested upward signal, and test equipment is sent according to descending cycle tests
Downstream signal is tested, including：It is corresponding with index classification to be measured according to the time in up cycle tests to trigger test equipment
Relation, testing uplink signal, according to time in descending cycle tests and the corresponding relation of index classification to be measured, test descending letter
Number.
In a kind of optional embodiment, in order to obtain more accurate test result, in S603, up survey is being sent
After trying sequence to test equipment, before the test result of each index to be measured is obtained, upper method includes：To physical layer PHY or
Person's media control Access Layer MAC carries out the configuration of sequential parameter；And/or sequence ginseng is carried out to logic channel or transmission channel
Several configurations；And/or wireless frame parameter is directly configured.
In a kind of optional embodiment, after S603, the above method can also include：The acquisition of receiving control apparatus refers to
Order, test result is returned to control device.
Secondly, stand and signal testing method is described in control device side.
Fig. 7 is another optional schematic flow sheet of the signal testing method in the embodiment of the present invention, as shown in fig. 7,
This method includes：
S701：Receive each index to be measured；
S702：According to each index to be measured, for user equipment (UE) generation sequential parameter corresponding with each index to be measured and send
To UE, and it is test equipment generation sequential parameter corresponding with each index to be measured and transmission to test equipment.
In a kind of optional embodiment, control device is in order to get test result, and after S702, the above method may be used also
With including：Send respectively and obtain instruction to UE and test equipment；Respectively from UE and test equipment, the survey of each index to be measured is obtained
Test result.
Based on same inventive concept, the embodiment of the present invention provides a kind of signal-testing apparatus, with said one or multiple
UE described in embodiment is consistent.
Fig. 8 is a kind of optional structural representation of the signal-testing apparatus in the embodiment of the present invention, as shown in figure 9, on
Stating signal-testing apparatus includes：First receiving module 81, the first generation module 82 and test module 83；
Wherein, the first receiving module 81, the sequential parameter corresponding with each index to be measured sent for receiving control apparatus；
First generation module 82, for the formal parameter included according to sequential parameter, upward signal is generated, and according in sequential parameter
Including test parameter, generate descending cycle tests；Test module 83, surveyed for sending upward signal to test equipment, triggering
Examination equipment is tested upward signal according to the up cycle tests previously generated, according to descending cycle tests to test equipment
The downstream signal of transmission is tested, and obtains the test result of each index to be measured.
In a kind of optional embodiment, in order to obtain the test result of each index to be measured, above-mentioned test module 83, specifically
For：Upward signal is sent to test equipment, triggering test equipment is according to time in up cycle tests and index classification to be measured
Corresponding relation, testing uplink signal, according to the corresponding relation of time in descending cycle tests and index classification to be measured, under test
Row signal, obtain the test result of each index to be measured.
In an alternative embodiment, in order to obtain more accurate test result, above-mentioned test module 83, also use
In：After up cycle tests to test equipment is sent, before the test result of each index to be measured is obtained, to physical layer
PHY or media control Access Layer MAC carries out the configuration of sequential parameter；And/or sequence is carried out to logic channel or transmission channel
The configuration of row parameter；And/or wireless frame parameter is directly configured.
In an alternative embodiment, said apparatus can also include：Module is returned to, for obtaining each finger to be measured
After target test result, the acquisition instruction of receiving control apparatus, test result is returned to control device.
In actual applications, the first receiving module 81, the first generation module 82, test module 83 and return to module can be by
Positioned at UE central processing unit (CPU, Central Processing Unit), microprocessor (MPU, Microprocessor
Unit), application specific integrated circuit (ASIC, Application Specific Integrated Circuit) or field-programmable
Gate array (FPGA, Field-Programmable Gate Array) etc. is realized.
Based on same inventive concept, the embodiment of the present invention provides a kind of signal-testing apparatus, with said one or multiple
Control device described in embodiment is consistent.
Fig. 9 is another optional structural representation of the signal testing in the embodiment of the present invention, as shown in figure 9, above-mentioned
Signal-testing apparatus includes：Second receiving module 91 and the second generation module 92；
Wherein, the second receiving module 91, for receiving each index to be measured；Second generation module 92, for according to each to be measured
Index, for user equipment (UE) generation sequential parameter corresponding with each index to be measured and send to UE, and for test equipment generation and
Sequential parameter corresponding to each index to be measured is simultaneously sent to test equipment.
In a kind of optional embodiment, in order to get test result, said apparatus also includes control device：Obtain mould
Block, for according to each index to be measured, generating sequential parameter corresponding with index to be measured for user equipment (UE) and sending to UE, be
Test equipment generates sequential parameter corresponding with index to be measured and sent to test equipment, sends obtain instruction to UE respectively
And test equipment；Respectively from UE and test equipment, the test result of each index to be measured is obtained.
In actual applications, the second receiving module 91, the second generation module 92 and acquisition module can be by setting positioned at control
Standby CPU, MPU, ASIC or FPGA etc. is realized.
The present embodiment records a kind of computer-readable medium, can be ROM (for example, read-only storage, FLASH memory,
Transfer device etc.), magnetic storage medium (for example, tape, disc driver etc.), optical storage medium is (for example, CD-ROM, DVD-
ROM, paper card, paper tape etc.) and other well-known types program storage；Computer is stored with computer-readable medium to be held
Row instruction, when executing an instruction, causes at least one computing device to include following operation：
The sequential parameter corresponding with each index to be measured that receiving control apparatus is sent；The form included according to sequential parameter
Parameter, upward signal, and the test parameter included according to sequential parameter are generated, generates descending cycle tests；Send up letter
Number to test equipment, triggering test equipment is tested upward signal according to the up cycle tests previously generated, under
The downstream signal that row cycle tests is sent to test equipment is tested, and obtains the test result of each index to be measured.
The signal testing method that the embodiment of the present invention is provided, in order to meet the testing requirement of each index to be measured, by controlling
Equipment issues the sequential parameter of each index to be measured so that signal-testing apparatus can be according to the formal parameter in sequential parameter and survey
Parameter is tried, generates upward signal corresponding with formal parameter and descending cycle tests corresponding with test parameter respectively, so,
In signal-testing apparatus and test equipment, the upward signal to match each other and up cycle tests are just respectively present, mutual
The descending cycle tests and downstream signal matched somebody with somebody, then, only when in the upward signal and test equipment that signal-testing apparatus issues
Up cycle tests when matching each other, the descending cycle tests in downstream signal and signal-testing apparatus that test equipment is sent
When matching each other, signal-testing apparatus can test out each index to be measured with test equipment, so, when under signal-testing apparatus
Upward signal is sent out to test equipment so that signal-testing apparatus realizes sequence synchronization with test equipment, performs descending test respectively
Sequence and up cycle tests, in this way, signal-testing apparatus can be according to the descending cycle tests pair to match with downstream signal
Downstream signal is tested, and can also synchronously trigger test equipment according to the up cycle tests to match with upward signal to upper
Row signal is tested, and so as to obtain the test result of each index to be measured, so, meeting the test to each index to be measured needs
Ask, so as to eliminate test blindspot present in the test to the RF index of mobile terminal, further meeting test needs
Ask.
It need to be noted that be：Apparatus above implements the description of item, is similar with above method description, has same
Embodiment of the method identical beneficial effect, therefore do not repeat.For the ins and outs not disclosed in apparatus of the present invention embodiment,
Those skilled in the art refer to the description of the inventive method embodiment and understand, to save length, repeat no more here.
It need to be noted that be：
It should be understood that " one embodiment " or " embodiment " that specification is mentioned in the whole text mean it is relevant with embodiment
During special characteristic, structure or characteristic are included at least one embodiment of the present invention.Therefore, occur everywhere in entire disclosure
" in one embodiment " or " in one embodiment " identical embodiment is not necessarily referred to.In addition, these specific feature, knots
Structure or characteristic can combine in one or more embodiments in any suitable manner.It should be understood that in the various implementations of the present invention
In example, the size of the sequence number of above-mentioned each process is not meant to the priority of execution sequence, and the execution sequence of each process should be with its work(
It can be determined with internal logic, the implementation process without tackling the embodiment of the present invention forms any restriction.The embodiments of the present invention
Sequence number is for illustration only, does not represent the quality of embodiment.
It should be noted that herein, term " comprising ", "comprising" or its any other variant are intended to non-row
His property includes, so that process, method, article or device including a series of elements not only include those key elements, and
And also include the other element being not expressly set out, or also include for this process, method, article or device institute inherently
Key element.In the absence of more restrictions, the key element limited by sentence "including a ...", it is not excluded that including this
Other identical element also be present in the process of key element, method, article or device.
In several embodiments provided herein, it should be understood that disclosed apparatus and method, it can be passed through
Its mode is realized.Apparatus embodiments described above are only schematical, for example, the division of the unit, is only
A kind of division of logic function, there can be other dividing mode when actually realizing, such as：Multiple units or component can combine, or
Another system is desirably integrated into, or some features can be ignored, or do not perform.In addition, shown or discussed each composition portion
Point mutual coupling or direct-coupling or communication connection can be the INDIRECT COUPLINGs by some interfaces, equipment or unit
Or communication connection, can be electrical, mechanical or other forms.
The above-mentioned unit illustrated as separating component can be or may not be physically separate, show as unit
The part shown can be or may not be physical location；Both a place can be located at, multiple network lists can also be distributed to
In member；Partly or entirely unit therein can be selected to realize the purpose of this embodiment scheme according to the actual needs.
In addition, each functional unit in various embodiments of the present invention can be fully integrated into a processing unit, also may be used
To be each unit individually as a unit, can also two or more units it is integrated in a unit；It is above-mentioned
Integrated unit can both be realized in the form of hardware, can also be realized in the form of hardware adds SFU software functional unit.
One of ordinary skill in the art will appreciate that：Realizing all or part of step of above method embodiment can pass through
Programmed instruction related hardware is completed, and foregoing program can be stored in computer read/write memory medium, and the program exists
During execution, execution the step of including above method embodiment；And foregoing storage medium includes：Movable storage device, read-only deposit
Reservoir (Read Only Memory, ROM), magnetic disc or CD etc. are various can be with the medium of store program codes.
Or if the above-mentioned integrated unit of the present invention is realized in the form of software function module and is used as independent product
Sale in use, can also be stored in a computer read/write memory medium.Based on such understanding, the present invention is implemented
The part that the technical scheme of example substantially contributes to prior art in other words can be embodied in the form of software product,
The computer software product is stored in a storage medium, including some instructions are causing a computer equipment (can be with
It is personal computer, server or network equipment etc.) perform all or part of each embodiment methods described of the present invention.
And foregoing storage medium includes：Movable storage device, ROM, magnetic disc or CD etc. are various can be with Jie of store program codes
Matter.
The foregoing is only a specific embodiment of the invention, but protection scope of the present invention is not limited thereto, any
Those familiar with the art the invention discloses technical scope in, change or replacement can be readily occurred in, should all be contained
Cover within protection scope of the present invention.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (12)
- A kind of 1. signal testing method, it is characterised in that including：The sequential parameter corresponding with each index to be measured that receiving control apparatus is sent；The formal parameter included according to the sequential parameter, upward signal is generated, and included according to the sequential parameter Test parameter, generate descending cycle tests；The upward signal is sent to test equipment, triggers the test equipment according to the up cycle tests previously generated to institute State upward signal to be tested, tested according to the downstream signal that the descending cycle tests is sent to the test equipment, Obtain the test result of each index to be measured.
- 2. according to the method for claim 1, it is characterised in that the triggering test equipment is upper according to what is previously generated Row cycle tests is tested the upward signal, the test equipment is sent according to the descending cycle tests descending Signal is tested, including：The test equipment is triggered according to time in the up cycle tests and the corresponding relation of index classification to be measured, tests institute Upward signal is stated, according to time in the descending cycle tests and the corresponding relation of index classification to be measured, tests the descending letter Number.
- 3. according to the method for claim 1, it is characterised in that send the up cycle tests to test equipment it Afterwards, before the test result of each index to be measured is obtained, methods described includes：The configuration of the sequential parameter is carried out to physical layer PHY or media control Access Layer MAC；And/or the configuration of the sequential parameter is carried out to logic channel or transmission channel；And/or wireless frame parameter is directly configured.
- 4. according to the method for claim 1, it is characterised in that after the test result of each index to be measured is obtained, Methods described also includes：The acquisition instruction of the control device is received, returns to the test result to the control device.
- A kind of 5. signal testing method, it is characterised in that including：Receive each index to be measured；It is concurrent for user equipment (UE) generation sequential parameter corresponding with each index to be measured according to each index to be measured Deliver to the UE, and be test equipment generation sequential parameter corresponding with each index to be measured and transmission to the test Equipment.
- 6. according to the method for claim 5, according to each index to be measured, for user equipment (UE) generation with it is described Sequential parameter corresponding to each index to be measured is simultaneously sent to the UE, is generated for the test equipment corresponding with each index to be measured Sequential parameter and send to after the test equipment, methods described also includes：Send respectively and obtain instruction to the UE and the test equipment；Respectively from the UE and the test equipment, the test result of each index to be measured is obtained.
- A kind of 7. signal-testing apparatus, it is characterised in that including：First receiving module, the sequential parameter corresponding with each index to be measured sent for receiving control apparatus；First generation module, for the formal parameter included according to the sequential parameter, upward signal is generated, and according to described The test parameter that sequential parameter includes, generate descending cycle tests；Test module, for sending the upward signal to test equipment, it is upper according to what is previously generated to trigger the test equipment Row cycle tests is tested the upward signal, the test equipment is sent according to the descending cycle tests descending Signal is tested, and obtains the test result of each index to be measured.
- 8. device according to claim 7, it is characterised in that the test module, be specifically used for：The upward signal is sent to the test equipment, triggers the test equipment according to the time in the up cycle tests With the corresponding relation of index classification to be measured, the upward signal is tested, according to time in the descending cycle tests and finger to be measured The corresponding relation of classification is marked, the downstream signal is tested, obtains the test result of each index to be measured.
- 9. device according to claim 7, it is characterised in that the test module, be additionally operable to：After the up cycle tests to test equipment is sent, before the test result of each index to be measured is obtained, The configuration of the sequential parameter is carried out to physical layer PHY or media control Access Layer MAC；And/or to logic channel or biography Defeated channel carries out the configuration of the sequential parameter；And/or wireless frame parameter is directly configured.
- 10. device according to claim 7, it is characterised in that described device also includes：Module is returned to, for after the test result of each index to be measured is obtained, the acquisition for receiving the control device to refer to Order, returns to the test result to the control device.
- A kind of 11. signal-testing apparatus, it is characterised in that including：Second receiving module, for receiving each index to be measured；Second generation module, for according to each index to be measured, being generated and each index to be measured for the user equipment (UE) Corresponding sequential parameter is simultaneously sent to the UE, and is test equipment generation sequence ginseng corresponding with each index to be measured Count and send to the test equipment.
- 12. device according to claim 11, described device also include：Acquisition module, for according to each index to be measured, being generated for the user equipment (UE) corresponding with the index to be measured Sequential parameter and send to the UE, for test equipment generation sequential parameter corresponding with the index to be measured and send After to the test equipment, send obtain instruction to the UE and the test equipment respectively；Respectively from the UE and described In test equipment, the test result of each index to be measured is obtained.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610738261.2A CN107786993B (en) | 2016-08-26 | 2016-08-26 | Signal testing method and device |
| PCT/CN2017/085632 WO2018036230A1 (en) | 2016-08-26 | 2017-05-24 | Signal testing method and device, and computer storage medium |
| RU2019108480A RU2710211C1 (en) | 2016-08-26 | 2017-05-24 | Method and apparatus for checking signals, as well as a computer data medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610738261.2A CN107786993B (en) | 2016-08-26 | 2016-08-26 | Signal testing method and device |
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| CN107786993A true CN107786993A (en) | 2018-03-09 |
| CN107786993B CN107786993B (en) | 2021-10-01 |
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| CN (1) | CN107786993B (en) |
| RU (1) | RU2710211C1 (en) |
| WO (1) | WO2018036230A1 (en) |
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| CN109526004A (en) * | 2018-07-27 | 2019-03-26 | 大唐联仪科技有限公司 | A kind of narrowband Internet of Things sequential test method and device |
| CN112203296A (en) * | 2019-07-08 | 2021-01-08 | 普天信息技术有限公司 | 230Mhz terminal EVM testing method, terminal and testing instrument |
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| CN108469552A (en) * | 2018-04-26 | 2018-08-31 | 深圳市华讯方舟微电子科技有限公司 | T assembly test methods, apparatus and system |
| CN110350987A (en) * | 2019-06-25 | 2019-10-18 | 成都九洲迪飞科技有限责任公司 | A kind of cross-platform RF index automatization test system and test method based on QT |
| CN115499350B (en) * | 2021-06-03 | 2023-10-20 | 大唐移动通信设备有限公司 | Method and device for testing downlink |
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Also Published As
| Publication number | Publication date |
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| WO2018036230A1 (en) | 2018-03-01 |
| CN107786993B (en) | 2021-10-01 |
| RU2710211C1 (en) | 2019-12-25 |
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