CN107766653B - Method and device for constructing simulation circuit of transient interference source of automobile power line - Google Patents

Method and device for constructing simulation circuit of transient interference source of automobile power line Download PDF

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CN107766653B
CN107766653B CN201710993546.5A CN201710993546A CN107766653B CN 107766653 B CN107766653 B CN 107766653B CN 201710993546 A CN201710993546 A CN 201710993546A CN 107766653 B CN107766653 B CN 107766653B
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童心
陈有锋
王显赫
时开斌
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Beijing Jingwei Hirain Tech Co Ltd
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Abstract

The application provides a method and a device for constructing a simulation circuit of an automobile power line transient interference source, wherein the method comprises the following steps: determining a voltage source model according to the waveform of the transient interference source to be simulated; determining parameters of a voltage source model based on the characteristics of the waveform, and obtaining the voltage source model with the parameters as a voltage source model for simulating the waveform; and constructing a simulation circuit of the transient interference source to be simulated through a voltage source model for simulating a waveform and a resistor for simulating the internal resistance of the transient interference source to be simulated. The method and the device can accurately simulate the transient interference of the power line of the automobile, so that the quantitative evaluation of the transient anti-interference performance of the product in the circuit design stage becomes possible, the risk is prevented from being left over to the later stage test stage, the research and development efficiency is improved, the design risk is reduced, and the time and the cost brought by the problem in the later stage test stage are reduced.

Description

Method and device for constructing simulation circuit of transient interference source of automobile power line
Technical Field
The invention relates to the technical field of simulation of automobile electronics, in particular to a method and a device for constructing a simulation circuit of an automobile power line transient interference source.
Background
The electrical network and electromagnetic environment inside the automobile are very complex, and various types of transient interferences may be generated on the power line during the operation of the automobile, for example, the on and off of a load, the on and off of a relay, and the transient interferences of the power line may be generated, and due to the fact that various electronic and electrical components on the automobile share the power network, the transient interferences may cause the failure or damage of other electronic and electrical components. Therefore, all the electrical and electronic components must satisfy respective normal operating conditions under various kinds of transient disturbances to ensure the reliability of the automobile.
For the design development of automotive electronic and electrical products, the products must be subjected to transient anti-interference tests to meet the standard requirements, at present, the most common test standard is international standard ISO7637-2, and the standardized power line transient interference source and the transient anti-interference test method defined by the standard can be used for testing whether the automotive electronic and electrical products meet the requirements.
At present, the transient anti-interference test of the automobile electronic product is carried out at the later stage of test, and once the automobile electronic product fails in the transient anti-interference test, the circuit design needs to be modified or redeveloped, so that the development progress of the automobile electronic product is influenced, and extra cost is brought.
Disclosure of Invention
In view of the above, the present invention provides a method and an apparatus for constructing a simulation circuit of a transient interference source of an automotive power line, so as to solve the problems that in the prior art, a transient anti-interference test of an automotive electronic product is performed at a later test stage, and if the automotive electronic product fails in the transient anti-interference test, a circuit design needs to be modified or redeveloped, which not only affects the development progress of the automotive electronic product, but also brings additional cost, and the technical scheme thereof is as follows:
a method for constructing a simulation circuit of an automobile power line transient interference source comprises the following steps:
determining a voltage source model according to the waveform of the transient interference source to be simulated;
determining parameters of the voltage source model based on the characteristics of the waveform, and obtaining the voltage source model with the parameters as a voltage source model for simulating the waveform;
and constructing a simulation circuit of the transient interference source to be simulated through the voltage source model for simulating the waveform and the resistance for simulating the internal resistance of the transient interference source to be simulated.
The method for constructing the simulation circuit of the transient interference source further comprises the following steps:
carrying out simulation test on the constructed simulation circuit;
and when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform, outputting the simulation circuit as a transient interference source.
Wherein, the determining a voltage source model according to the waveform of the transient interference source to be simulated comprises:
determining the type of a basic voltage source and the number of each type of basic voltage source according to the waveform of the transient interference source to be simulated;
when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one, taking the determined basic voltage source of the type as the voltage source model;
when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with determined types based on the waveform of the transient interference source to be simulated to serve as the voltage source model;
when the types of the basic voltage sources are at least two, all the basic voltage sources of at least two types are combined to be used as the voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
Wherein, the determining the type of the basic voltage source according to the waveform of the transient interference source to be simulated comprises:
if the waveform of the transient interference source to be simulated comprises a pulse waveform, determining that the type of a basic voltage source corresponding to the pulse waveform is a double-exponential-wave voltage source;
if the waveform of the transient interference source to be simulated comprises a step waveform, determining that the type of a basic voltage source corresponding to the step waveform is a square wave voltage source;
and if the waveform of the transient interference source to be simulated comprises a straight line, determining that the type of the basic voltage source corresponding to the straight line is a direct-current voltage source.
When the voltage source model comprises a dual exponential wave voltage source, the parameters of the basic voltage source model comprise: initial value, ripple value, start delay time, rise time constant, duration delay time, fall time constant, then determining parameters of the voltage source model based on characteristics of the waveform includes:
setting the initial value to 0, setting the pulsation value to a peak voltage of a pulse, and determining the initial delay time based on a delay time parameter of the pulse waveform;
determining the rising time constant and the duration delay time based on a time required for a rising edge of the pulse waveform to reach a second preset voltage value from a first preset voltage value, wherein the first preset voltage value is the peak voltage of a first preset multiple, and the second preset voltage value is the peak voltage of a second preset multiple;
determining the falling time constant based on a time required for a rising edge of the pulse waveform to go from the first preset voltage value to the first preset voltage value of a falling edge, and a time required for the rising edge to go from the first preset voltage value to the second preset voltage value;
when the voltage source model comprises a square wave voltage source, the parameters of the voltage source model comprise: high level voltage, low level voltage, rising edge time, and falling edge time, then determining parameters of the voltage source model based on the characteristics of the waveform includes:
determining a high level voltage of the square wave voltage source based on the high level voltage of the step waveform, and determining a low level voltage of the square wave voltage source based on the low level voltage of the step waveform;
determining a rising edge time of the square wave voltage source based on a rising edge time of the step waveform and determining a falling edge time of the square wave voltage source based on a falling edge time of the step waveform.
An apparatus for constructing a simulation circuit of a transient interference source, comprising: the simulation system comprises a model determining unit, a parameter determining unit and a simulation circuit constructing unit;
the model determining unit is used for determining a voltage source model according to the waveform of the transient interference source to be simulated;
the parameter determining unit is used for determining the parameters of the voltage source model based on the characteristics of the waveform;
the simulation circuit building unit is used for building the simulation circuit of the transient interference source to be simulated by using a voltage source model with parameters as a voltage source model for simulating the waveform and using the voltage source model for simulating the waveform and a resistor for simulating the internal resistance of the transient interference source to be simulated.
The device for constructing the simulation circuit of the transient interference source further comprises: the circuit comprises a simulation test unit and a circuit output unit;
the simulation test unit is used for carrying out simulation test on the constructed simulation circuit;
and the circuit output unit is used for outputting the simulation circuit as a transient interference source when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform.
Wherein the model determination unit includes: a first determining subunit and a second determining subunit;
the first determining subunit is configured to determine, according to the waveform of the transient interference source to be simulated, the type of the basic voltage source and the number of each type of basic voltage source;
the second determining subunit is configured to, when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one, use the basic voltage source of the determined type as the voltage source model; when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with determined types based on the waveform of the transient interference source to be simulated to serve as the voltage source model; when the types of the basic voltage sources are at least two, all the basic voltage sources of at least two types are combined to be used as the voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
The first determining subunit is specifically configured to determine, when the waveform of the transient interference source to be simulated includes a pulse waveform, that a basic voltage source corresponding to the pulse waveform is a dual-exponential-wave voltage source; when the waveform of the transient interference source to be simulated comprises a step waveform, determining a basic voltage source corresponding to the step waveform as a square wave voltage source; when the waveform of the transient interference source to be simulated comprises a straight line, determining that a basic voltage source corresponding to the straight line is a direct-current voltage source.
When the voltage source model comprises a dual exponential wave voltage source, the parameters of the basic voltage source model comprise: initial value, pulsation value, start delay time, rise time constant, duration delay time, fall time constant, then the parameter determination unit includes: the method comprises the steps of setting a subunit, a first calculating subunit and a second calculating subunit;
the setting subunit is configured to set the initial value to 0, set the ripple value to a peak voltage of a pulse, and determine the start delay time based on a delay time parameter of the pulse waveform;
the first calculating subunit is configured to determine the rising time constant and the duration delay time based on a time required for a rising edge of the pulse waveform to reach a first preset voltage value and a second preset voltage value, where the first preset voltage value is the peak voltage of a first preset multiple, and the second preset voltage value is the peak voltage of a second preset multiple;
the second calculating subunit is configured to determine the falling time constant based on a time required for a rising edge of the pulse waveform to reach the first preset voltage value of a falling edge from the first preset voltage value and a time required for the rising edge to reach the second preset voltage value from the first preset voltage value;
when the voltage source model comprises a square wave voltage source, the parameters of the voltage source model comprise: the parameter determining unit comprises a first determining subunit and a second determining subunit;
the first determining subunit is configured to determine a high-level voltage of the square-wave voltage source based on the high-level voltage of the step waveform, and determine a low-level voltage of the square-wave voltage source based on the low-level voltage of the step waveform;
the second determining subunit is configured to determine a rising edge time of the square-wave voltage source based on the rising edge time of the step waveform, and determine a falling edge time of the square-wave voltage source based on the falling edge time of the step waveform.
The technical scheme has the following beneficial effects:
the method and the device for constructing the simulation circuit of the transient interference source can construct various transient interference simulation circuits of an automobile power line, the simulation circuits can be used for simulating the waveform of the transient interference, and the simulation circuits are directly added to the input end of the power circuit of an automobile electronic product to carry out circuit simulation, so that the performance of the automobile electronic product under the transient interference of the power line can be quickly and accurately analyzed, thereby finding and solving risks in the early design stage, namely the method for constructing the simulation circuit of the transient interference source can accurately simulate the transient interference of the automobile power line, thereby enabling the quantitative evaluation of the transient interference resistance of the product in the circuit design stage to be possible, avoiding the risk from being left to the later test stage, improving the research and development efficiency, reducing the design risk, and reducing the time and cost brought by the problem in the later test stage, moreover, the process of constructing the simulation circuit is quick and simple, and the constructed simulation circuit can accurately simulate transient interference.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic flowchart of a method for constructing a simulation circuit of a transient interference source according to an embodiment of the present invention;
FIG. 2 is a waveform of pulse 1 in ISO 7637-2;
FIG. 3 is a schematic diagram of a simulation circuit of pulse 1 constructed by the method provided by the embodiment of the invention;
FIG. 4 is a waveform of pulse 2a in ISO 7637-2;
FIG. 5 is a schematic diagram of a simulation circuit of a pulse 2a constructed by the method provided by the embodiment of the invention;
FIG. 6 is a waveform of pulse 2b in ISO 7637-2;
FIG. 7 is a schematic diagram of a simulation circuit of a pulse 2b constructed by the method provided by the embodiment of the invention;
FIG. 8 is a waveform diagram of pulse 3a in ISO 7637-2;
FIG. 9 is a schematic diagram of a simulation circuit of a pulse 3a constructed by the method provided by the embodiment of the invention;
FIG. 10 is a waveform diagram of pulse 3b in ISO 7637-2;
FIG. 11 is a schematic diagram of a simulation circuit of a pulse 3b constructed by the method provided by the embodiment of the invention;
FIG. 12 is a waveform of pulse 4 in ISO 7637-2;
FIG. 13 is a schematic diagram of a simulation circuit of pulse 4 constructed using the method provided by the embodiments of the present invention;
FIG. 14 is a waveform of pulse 5a in ISO 7637-2;
FIG. 15 is a schematic diagram of a simulation circuit of a pulse 5a constructed by the method provided by the embodiment of the invention;
FIG. 16 is a waveform of pulse 5b in ISO 7637-2;
FIG. 17 is a schematic diagram of a simulation circuit of pulse 5b constructed using the method provided by the embodiments of the present invention;
fig. 18 is a schematic structural diagram of a device for constructing a simulation circuit of a transient interference source according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the present invention provides a method for constructing a simulation circuit of an automobile power line transient interference source, please refer to fig. 1, which shows a flow diagram of the method, and the method may include:
step S101: and determining a voltage source model according to the waveform of the transient interference source to be simulated.
The test standards of the transient interference of the power line of the automobile are various, for example, ISO7637-2 defines a standardized transient interference source of the power line in ISO7637-2, and the transient interference source in ISO7637-2 can be used as a transient interference source to be simulated and is simulated by a basic voltage source in a circuit simulation system. Specifically, determining a voltage source model according to a waveform of a transient interference source to be simulated includes: determining the type of a basic voltage source and the number of each type of basic voltage source according to the waveform of a transient interference source to be simulated; when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one, the basic voltage source of the determined type is used as a voltage source model; when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with the determined types based on the waveform of the transient interference source to be simulated to be used as a voltage source model; when the types of the basic voltage sources are at least two, all the basic voltage sources of the at least two types are combined to be used as a voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
Further, determining a basic voltage source according to the waveform of the transient interference source to be simulated, including: if the waveform of the transient interference source to be simulated comprises a pulse waveform, determining that the type of a basic voltage source corresponding to the pulse waveform is a double-exponential-wave voltage source; if the waveform of the transient interference source to be simulated comprises a step waveform, determining that the type of a basic voltage source corresponding to the step waveform is a square wave voltage source; and if the waveform of the transient interference source to be simulated comprises a straight line, determining the type of the basic voltage source corresponding to the straight line as a direct current voltage source.
Illustratively, the waveform of the transient interference source to be simulated includes five steps, and then, the voltage source model is obtained by combining five square wave voltage sources; the waveform of the transient interference source to be simulated comprises two pulses and three steps, and then the voltage source is obtained by combining two double-exponential-wave voltage sources and three square-wave voltage sources.
Step S102: and calculating parameters of the voltage source model based on the characteristics of the waveform of the transient interference source to be simulated, and obtaining the voltage source model with the parameters as a voltage source model for simulating the waveform.
The pulse waveform and the step waveform are two typical waveforms in the transient interference waveform, and assuming that the waveform of the transient interference source to be simulated comprises the pulse waveform, the voltage source model comprises a double exponential wave voltage source, the remarkable characteristics of the pulse waveform are a rising edge, a falling edge and a pulse width, and the definition of the waveform in the ISO7637-2 standard is as follows:
the time tr required for the rising edge to go from 0.1Us to 0.9Us, where Us is the peak voltage of the pulse;
the time td required for the rising edge to go from 0.1Us to 0.1Us of the falling edge.
Parameters of the dual exponential wave voltage source include:
v1: an initial value;
v2: a pulsation value;
TD 1: an initial delay time;
TC 1: a rise time constant;
TD 2: a duration delay time;
TC 2: a fall time constant.
In this embodiment, when the voltage source model includes a dual-exponential-wave voltage source, the process of calculating the parameters of the voltage source model based on the characteristics of the waveform of the transient interference source to be simulated includes: setting an initial value to 0, setting a pulsation value to a peak voltage of a pulse, and determining an initial delay time based on a delay time parameter of a pulse waveform; determining a rise time constant and a duration delay time based on a time required for a rising edge to travel from a first preset voltage value to a second preset voltage value, wherein the first preset voltage value is a first preset multiple of a peak voltage, such as 0.1Us, and the second preset voltage value is a second preset multiple of the peak voltage, such as 0.9 Us; the falling time constant is determined based on the time required for the rising edge to go from the first preset voltage value to the first preset voltage value of the falling edge and the time required for the rising edge to go from the first preset voltage value to the second preset voltage value.
Specifically, for a rising edge, the time at which the voltage is 0.1Us is denoted as t1, the time at which the voltage is 0.9Us is denoted as t2, and the falling edge is made to be not triggered before the time t2, the exponential part of the voltage at two times can be expressed as:
exp(t1/TC1)＝0.1Us (1)
exp(t2/TC1)＝0.9Us (2)
the rise time constant is obtained by dividing by two:
Figure BDA0001441935630000091
a large number of experimental results show that it is possible to set the falling edge to trigger at 2tr from the time t1 for the impulse interference, i.e. the duration delay time:
TD2＝2tr (4)
for a falling edge, the time when the voltage drops to 0.1Us is denoted as t3, and the voltage index portion between this time and the time of the highest voltage point can be expressed as:
exp((t1+2tr)/TC2)＝Us (5)
exp(t3/TC2)＝0.1Us (6)
the fall time constant is obtained by dividing by two:
Figure BDA0001441935630000092
all parameters of the dual-exponential voltage source are thus obtained.
It should be noted that, for a transient interference waveform having a plurality of pulses, the same number of dual-exponential voltage sources are used, and the parameters of the dual-exponential voltage sources are calculated from the pulse waveforms, respectively.
Assuming that the waveform of the transient interference source to be simulated includes a step waveform, the voltage source model includes a square wave voltage source, and when the voltage source model includes a square wave voltage source, the parameters of the voltage source model include a high level voltage, a low level voltage, a rising edge time and a falling edge time, the calculating the parameters of the voltage source model based on the characteristics of the waveform of the transient interference source to be simulated includes: determining the high level voltage of the square wave voltage source based on the high level voltage of the step waveform, and determining the low level voltage of the square wave voltage source based on the low level voltage of the step waveform; the rising edge time of the square wave voltage source is determined based on the rising edge time of the step waveform, and the falling edge time of the square wave voltage source is determined based on the falling edge time of the step waveform.
Specifically, the parameters of the square wave voltage source are identical to the parameters of the step waveform, that is, the high level voltage of the square wave voltage source is equal to the high level voltage of the step waveform, the low level voltage of the square wave voltage source is equal to the low level voltage of the step waveform, the rising edge time of the square wave voltage source is equal to the rising edge time of the step waveform, and the falling edge time of the square wave voltage source is equal to the falling edge time of the step waveform.
In addition, the parameters of the dc voltage source are vehicle-specific and system-specific. For the generator-powered operating mode, the 12V system Ua is 13.5V, the 24V system Ua is 27V, and for the battery-powered operating mode, the 12V system Ub is 12V, and the 24V system Ub is 24V.
Step S103: and constructing a simulation circuit of the transient interference source to be simulated through a voltage source model for simulating a waveform and a resistor for simulating the internal resistance of the transient interference source to be simulated.
In this embodiment, the voltage source model with the obtained parameters is used to simulate the waveform of the transient interference source to be simulated, and the resistor is used to simulate the internal resistance of the transient interference source to be simulated, and the two are connected in series to obtain the simulation circuit of the transient interference source to be simulated. For international standard ISO7637-2, it defines the internal resistance of various transient disturbances. It should be noted that, in the waveform 5b in ISO7637-2, since it is output after passing through the energy absorption unit on the real vehicle, one or more diodes are also required to be connected in parallel in the simulation circuit at two ends of the series-connected resistor and voltage source model, and the cutoff voltage parameter of the diode is equal to the voltage peak value output after passing through the energy absorption unit defined in ISO 7637-2.
The method for constructing the simulation circuit of the transient interference source provided by the embodiment of the invention can further comprise the following steps: after a simulation circuit of the transient interference source to be simulated is constructed, carrying out simulation test on the simulation circuit; and when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform, outputting the simulation circuit as a transient interference source so as to be connected to the input end of the power supply circuit of the automobile electronic product in a design environment for circuit simulation.
Specifically, the process of performing simulation test on the constructed simulation circuit is as follows: in circuit simulation software, a constructed simulation circuit is taken as a whole, the output of the simulation circuit is connected to an infinite pure resistive load, the open circuit condition is simulated, and time domain simulation is carried out. Wherein the time step setting for the circuit simulation should be less than 1/10 of the smallest rising edge time or falling edge time in the glitch waveform.
If the simulation result shows that the characteristics of the open-circuit output voltage waveform of the constructed simulation circuit are consistent with the characteristics of the standard transient interference source waveform, such as the transient interference source waveform defined by ISO7637-2, the constructed simulation circuit is used as the transient interference source to be output, the output transient interference source can be directly connected to the input end of the power circuit of the automobile electronic product under the design environment to carry out circuit simulation, and the transient anti-interference performance of the power line of the automobile electronic product is analyzed, for example, whether the voltage of a chip or a circuit under the transient interference exceeds the voltage-resistant grade of the chip or the circuit, whether the transient power can cause overheating damage or not and the like, and the performances can be quantitatively analyzed by using the simulation circuit constructed by the method. In addition, in the embodiment of the invention, the voltage source model is obtained by combining the basic voltage sources, so that the constructed simulation circuit has a simple structure and higher calculation efficiency.
The method for constructing the simulation circuit of the transient interference source of the automobile power line provided by the embodiment of the invention can construct various simulation circuits of the transient interference, the simulation circuit can be used for simulating the waveform of the transient interference, and the performance of the automobile electronic product under the transient interference of the power line can be quickly and accurately analyzed by directly adding the simulation circuit to the input end of the power circuit of the automobile electronic product for circuit simulation, so that the risk can be found and solved at the early stage of design, namely the method for constructing the simulation circuit of the transient interference source provided by the embodiment of the invention can accurately simulate the transient interference of the automobile power line, thereby enabling the quantitative evaluation of the transient interference resistance of the product at the stage of circuit design to be possible, avoiding the risk from being left to the stage of later test, improving the research and development efficiency, reducing the design risk, and reducing the time and cost brought by the problem at the stage of later test, moreover, the process of constructing the simulation circuit is quick and simple, and the constructed simulation circuit can accurately simulate transient interference.
On the basis of the method for constructing the simulation circuit of the transient interference source of the power line of the automobile provided by the embodiment of the invention, the process of constructing the simulation circuit is described by taking a plurality of transient interference sources in ISO7637-2 as an example.
Referring to fig. 2, a pulse 1 in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of pulse 1. From the waveforms shown in fig. 2, it can be determined that the voltage source model in this example is obtained by combining 1 double-exponential voltage source and 2 square-wave voltage sources.
Secondly, calculating parameters of the double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2 according to the provided calculating method of the double-exponential voltage source parameters, and respectively determining the parameters of the two square wave voltage sources according to the determining method of the square wave voltage source parameters, thereby obtaining the parameters of the voltage source model.
Finally, the voltage source model with the obtained parameters is connected in series with a resistor to obtain a simulation circuit of pulse 1 in ISO7637-2, the constructed simulation circuit is shown in fig. 3, in order to facilitate better testing of the simulation circuit, a 12V system and a 24V system are respectively constructed in the embodiment, where fig. 3(a) is a 12V system, and fig. 3(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 1, defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 1 has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 1, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 1 comparison table of simulation results of simulation circuit of pulse 1 with standard requirements
Figure BDA0001441935630000121
Referring to fig. 4, a pulse 2a in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 2 a. From the waveforms shown in fig. 4, it can be determined that the voltage source model in this example is obtained by combining 1 double-exponential voltage source and 1 dc voltage source.
Next, the parameters of the dual-exponential voltage sources, i.e., V1, V2, TD1, TC1, TD2 and TC2, were calculated according to the calculation method of the dual-exponential voltage source parameters provided above. The parameters of the direct-current voltage source are fixed and set by the system of the automobile, and for the working condition of power supply of the generator, a 12V system Ua is 13.5V, and a 24V system Ua is 27V.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of the pulse 2a in ISO7637-2, wherein the constructed simulation circuit is shown in figure 5, and figure 5(a) is a 12V system, and figure 5(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 2a defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 2a has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 2, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 2 simulation result of simulation circuit of pulse 2a and standard requirement comparison table
Figure BDA0001441935630000131
Referring to fig. 6, a pulse 2b in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 2 b. The waveform shown in fig. 6 can determine that the voltage source model in this example is obtained by combining 1 double-exponential voltage source and 1 square-wave voltage source.
Secondly, calculating parameters of the double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2 according to the calculation method of the double-exponential voltage source parameters, and determining the parameters of the square wave voltage source according to the determination method of the square wave voltage source parameters, so that the parameters of the voltage source model are obtained.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of the pulse 2b in ISO7637-2, wherein the constructed simulation circuit is shown in fig. 7, and fig. 7(a) is a 12V system and fig. 7(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 2b defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 2b has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 3, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 3 comparison table of circuit model simulation results of pulse 2b and standard requirements
Figure BDA0001441935630000141
Referring to fig. 8, a pulse 3a in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 3 a. From the waveforms shown in fig. 8, it can be determined that the voltage source model in this example can be obtained by combining several double-exponential voltage sources and 1 dc voltage source.
Secondly, parameters of each double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2, are calculated according to the calculation method of the double-exponential voltage source parameters, the parameters of the direct-current voltage source are fixed, and for the working condition of power supply of the generator, a 12V system Ua is 13.5V, and a 24V system Ua is 27V, so that the parameters of the voltage source model are obtained.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of the pulse 3a in ISO7637-2, wherein the constructed simulation circuit is shown in fig. 9, and fig. 9(a) is a 12V system and fig. 9(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 3a defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 3a has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 4, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 4 comparison table of circuit model simulation results of pulse 3a and standard requirements
Figure BDA0001441935630000151
Referring to fig. 10, a process of constructing a simulation circuit by using pulse 3b in ISO7637-2 as a transient interference source to be simulated is shown as follows:
first, a voltage source model is determined by the waveform of the pulse 3 b. From the waveforms shown in fig. 10, it can be determined that the voltage source model in this example can be obtained by combining several double-exponential voltage sources and 1 dc voltage source.
Secondly, parameters of each double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2, are calculated according to the calculation method of the double-exponential voltage source parameters, the parameters of the direct-current voltage source are fixed, and for the working condition of power supply of the generator, a 12V system Ua is 13.5V, and a 24V system Ua is 27V, so that the parameters of the voltage source model are obtained.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of the pulse 3b in ISO7637-2, wherein the constructed simulation circuit is shown in fig. 11, and fig. 11(a) is a 12V system and fig. 11(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 3b defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 3b has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 5, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 5 comparison table of circuit model simulation results of pulse 3b with standard requirements
Figure BDA0001441935630000161
Referring to fig. 12, pulse 4 in ISO7637-2 is shown as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 4. From the waveforms shown in fig. 12, it can be determined that the voltage source model in this example can be obtained by combining 3 square wave voltage sources.
Secondly, calculating the parameters of each square wave voltage source according to the provided square wave voltage source parameter calculation method, thereby obtaining the parameters of the voltage source model.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of pulse 4 in ISO7637-2, wherein the constructed simulation circuit is shown in fig. 13, and fig. 13(a) is a 12V system and fig. 13(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 4, defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, the simulation result of the simulation circuit of the pulse 4 has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 6, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 6 comparison table of circuit model simulation results of pulse 4 and standard requirements
Figure BDA0001441935630000171
Referring to fig. 14, a pulse 5a in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 5 a. From the waveforms shown in fig. 14, it can be determined that the voltage source model in this example can be obtained by combining 1 double-exponential voltage source and 1 dc voltage source.
Secondly, parameters of each double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2, are calculated according to the calculation method of the double-exponential voltage source parameters, the parameters of the direct-current voltage source are fixed, and for the working condition of power supply of the generator, a 12V system Ua is 13.5V, and a 24V system Ua is 27V, so that the parameters of the voltage source model are obtained.
And finally, connecting the voltage source model with the obtained parameters in series with a resistor to obtain a simulation circuit of the pulse 5a in ISO7637-2, wherein the constructed simulation circuit is shown in FIG. 15, and FIG. 15(a) is a 12V system and FIG. 15(b) is a 24V system. It should be noted that the resistance connected in series with the voltage source model is the internal resistance corresponding to the transient interference source, pulse 5a defined in ISO 7637-2.
The simulation test is carried out on the constructed simulation circuit, and the simulation result of the simulation circuit of the pulse 5a has very good conformity with the standard requirement, namely the simulation circuit can simulate the transient interference source more accurately, as shown in table 7, the simulation result of the simulation circuit is compared with the waveform parameter required by ISO 7637-2.
TABLE 7 comparison table of circuit model simulation results of pulse 5a and standard requirements
Figure BDA0001441935630000181
Referring to fig. 16, a pulse 5b in ISO7637-2 is shown, which is used as a transient interference source to be simulated, and a process of constructing a simulation circuit is as follows:
first, a voltage source model is determined by the waveform of the pulse 5 b. From the waveforms shown in fig. 16, it can be determined that the voltage source model in this example can be obtained by using 1 dual-exponential voltage source, 1 dc voltage source, 1 diode, or 2 diode combinations, and it should be noted that when 1 diode is used, a 12V system is corresponded, and when 2 diodes are used, a 24V system is corresponded.
Secondly, determining parameters of a voltage source model, specifically, calculating parameters of each double-exponential voltage source, namely V1, V2, TD1, TC1, TD2 and TC2 according to the calculation method of the double-exponential voltage source parameters, wherein the parameters of the direct current voltage source are fixed, for the working condition of power supply of the generator, a 12V system Ua is 13.5V, a 24V system Ua is 27V, and cutoff voltage parameters of the diode are equal to a voltage peak value output after passing through the energy absorption unit defined in ISO 7637-2.
And finally, connecting the voltage source model with the resistor in series to obtain the simulation circuit of the pulse 5b in ISO 7637-2. The simulation circuit was constructed as shown in fig. 17.
The simulation test is carried out on the constructed simulation circuit, and the comparison of the waveform parameters simulated by the simulation circuit and the waveform parameters required by ISO7637-2 is shown in Table 8, so that the conformity is very good.
TABLE 8 Circuit model simulation results of pulse 5b vs. Standard requirements look-up Table
Figure BDA0001441935630000191
Corresponding to the above method, an embodiment of the present invention further provides a device for constructing a simulation circuit of an automobile power line transient interference source, please refer to fig. 18, which shows a schematic structural diagram of the device, and the device may include: a model determination unit 1801, a parameter determination unit 1802, and a simulation circuit construction unit 1803.
The model determining unit 1801 is configured to determine a voltage source model according to a waveform of a transient interference source to be simulated.
A parameter determination unit 1802 for determining parameters of the voltage source model based on characteristics of the waveform.
The simulation circuit building unit 1803 is configured to use the voltage source model with the parameters as a voltage source model for simulating a waveform, and build a simulation circuit of the transient interference source to be simulated through the voltage source model for simulating the waveform and the resistor for simulating the internal resistance of the transient interference source to be simulated.
The device for constructing the simulation circuit of the transient interference source of the automobile power line provided by the embodiment of the invention can construct various simulation circuits of transient interference, the simulation circuit can be used for simulating the waveform of the transient interference, and the performance of the automobile electronic product under the transient interference of the power line can be quickly and accurately analyzed by directly adding the simulation circuit to the input end of the power circuit of the automobile electronic product for circuit simulation, so that risks can be found and solved at the early stage of design, namely the device for constructing the simulation circuit of the transient interference source of the automobile power line provided by the embodiment of the invention can accurately simulate the transient interference of the automobile power line, so that the quantitative evaluation of the transient interference resistance of the product at the stage of circuit design becomes possible, thereby avoiding the risk from being left to the stage of later test, improving the research and development efficiency, reducing the design risk, and reducing the time and cost brought by the problem at the stage of later test, moreover, the process of constructing the simulation circuit is quick and simple, and the constructed simulation circuit can accurately simulate transient interference.
The device for constructing the simulation circuit of the transient interference source of the power line of the automobile provided by the embodiment may further include: the circuit comprises a simulation test unit and a circuit output unit. Wherein:
and the simulation test unit is used for carrying out simulation test on the constructed simulation circuit.
And the circuit output unit is used for outputting the simulation circuit as the transient interference source when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform.
In the apparatus for constructing a simulation circuit of a transient interference source according to the above embodiment, the model determining unit includes: a first determining subunit and a second determining subunit. Wherein:
the first determining subunit is used for determining the types of the basic voltage sources and the number of the basic voltage sources of each type according to the waveform of the transient interference source to be simulated.
The second determining subunit is used for taking the determined type of the basic voltage source as a voltage source model when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one; when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with the determined types based on the waveform of the transient interference source to be simulated to be used as a voltage source model; when the types of the basic voltage sources are at least two, all the basic voltage sources of the at least two types are combined to be used as a voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
Further, the first determining subunit is specifically configured to determine, when the waveform of the transient interference source to be simulated includes a pulse waveform, that the type of the basic voltage source corresponding to the pulse waveform is a double-exponential-wave voltage source; when the waveform of the transient interference source to be simulated comprises a step waveform, determining the type of a basic voltage source corresponding to the step waveform as a square wave voltage source; when the waveform of the transient interference source to be simulated includes a straight line, it is determined that the type of the basic voltage source corresponding to the straight line is a direct current voltage source.
When the voltage source model comprises a dual exponential wave voltage source, the parameters of the basic voltage source model include: the initial value, the ripple value, the start delay time, the rise time constant, the duration delay time, and the fall time constant, the parameter determining unit in the apparatus for constructing the simulation circuit of the transient interference source according to the above embodiment includes: the device comprises a setting subunit, a first calculating subunit and a second calculating subunit. Wherein:
and a setting subunit, configured to set the initial value to 0, set the ripple value to a peak voltage of the pulse, and determine the start delay time based on a delay time parameter of the pulse waveform.
The first calculating subunit is configured to determine a rising time constant and a duration delay time based on a time required for the rising edge to reach a second preset voltage value from a first preset voltage value, where the first preset voltage value is a peak voltage of a first preset multiple, and the second preset voltage value is a peak voltage of a second preset multiple.
And a second calculation subunit for determining a falling time constant based on a time required for the rising edge to reach the first preset voltage value from the first preset voltage value and a time required for the rising edge to reach the second preset voltage value from the first preset voltage value.
When the voltage source model comprises a square wave voltage source, the parameters of the voltage source model comprise: high level voltage, low level voltage, rising edge time and falling edge time, the parameter determination unit comprises a first determination subunit and a second determination subunit.
And the first determining subunit is used for determining the high-level voltage of the square-wave voltage source based on the high-level voltage of the step waveform and determining the low-level voltage of the square-wave voltage source based on the low-level voltage of the step waveform.
And the second determining subunit is used for determining the rising edge time of the square-wave voltage source based on the rising edge time of the step waveform and determining the falling edge time of the square-wave voltage source based on the falling edge time of the step waveform.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
In the several embodiments provided in the present application, it should be understood that the disclosed method, apparatus, and device may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of devices or units through some communication interfaces, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment. In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (8)

1. A construction method of a simulation circuit of an automobile power line transient interference source is characterized by comprising the following steps:
determining a voltage source model according to the waveform of the transient interference source to be simulated, wherein the voltage source model comprises at least one type of basic voltage source or a combination of multiple types of basic voltage sources;
determining parameters of the voltage source model based on the characteristics of the waveform, and obtaining the voltage source model with the parameters as a voltage source model for simulating the waveform;
constructing a simulation circuit of the transient interference source to be simulated through the voltage source model for simulating the waveform and the resistance for simulating the internal resistance of the transient interference source to be simulated;
wherein the waveform of the transient interference source to be simulated comprises at least one of a pulse waveform, a step waveform and a straight line;
when the voltage source model comprises a dual exponential wave voltage source, the parameters of the basic voltage source model comprise: the simulation method comprises the following steps of (1) initializing a value, a pulsation value, starting delay time, a rising time constant, lasting delay time and a falling time constant, wherein the waveform of a transient interference source to be simulated corresponding to a voltage source model of the dual-exponential-wave voltage source comprises a pulse waveform;
then said determining parameters of said voltage source model based on characteristics of said waveform comprises:
setting the initial value to 0, setting the ripple value to a peak voltage of the pulse waveform, determining the start delay time based on a delay time parameter of the pulse waveform;
determining the rising time constant and the duration delay time based on a time required for a rising edge of the pulse waveform to reach a second preset voltage value from a first preset voltage value, wherein the first preset voltage value is the peak voltage of a first preset multiple, and the second preset voltage value is the peak voltage of a second preset multiple; in a case where the first preset voltage value is 0.1Us and the second preset voltage value is 0.9Us, Us representing the peak voltage, the rising time constant and the duration delay time are determined based on a time required for a rising edge of the pulse waveform to reach the second preset voltage value from the first preset voltage value, including:
taking the time of the first preset voltage value as t1, and the time of the second preset voltage value as t2, and making the falling edge of the pulse waveform not trigger before the time of t2, the exponential portions of the voltage at the time of t1 and the voltage at the time of t2 are expressed by the following formula (1) and formula (2):
exp(t1/TC1)＝0.1Us (1)
exp(t2/TC1)＝0.9Us (2)
wherein TC1 represents the rise time constant,
the formula (1) and the formula (2) are divided to obtain the following formula (3):
Figure FDF0000014415450000021
wherein, trRepresenting the time required for a rising edge to go from said first preset voltage value to said second preset voltage value,
the rising time constant is calculated by the formula (3),
setting the falling edge from the t12t of timerThe time is started to trigger, and the duration delay time is calculated by the following formula (4):
TD2＝2tr (4)
wherein TD2 represents the duration delay time;
determining the falling time constant based on a time required for a rising edge of the pulse waveform to go from the first preset voltage value to the first preset voltage value of a falling edge, and a time required for the rising edge to go from the first preset voltage value to the second preset voltage value; wherein determining the falling time constant based on a time required for a rising edge of the pulse waveform to go from the first preset voltage value to the first preset voltage value of a falling edge and a time required for the rising edge to go from the first preset voltage value to the second preset voltage value comprises:
in the falling edge, the time when the voltage value is reduced to 0.1Us is recorded as t3, and the voltage index parts of the time t3 and the voltage peak time can be expressed by the following formula (6) and formula (5), respectively:
exp((t1+2tr)/TC2)＝Us (5)
exp(t3/TC2)＝0.1Us (6)
the formula (1) and the formula (2) are divided to obtain the following formula (7):
Figure FDF0000014415450000022
where TC2 represents the fall time constant, tdRepresents the time required for the rising edge to go from 0.1Us to 0.1Us of the falling edge,
calculating the descending time constant by the formula (7);
when the voltage source model comprises a square wave voltage source, the parameters of the voltage source model comprise: the voltage source comprises a high level voltage, a low level voltage, rising edge time and falling edge time, wherein the waveform of a transient interference source to be simulated corresponding to a voltage source model comprising the square wave voltage source comprises a step waveform;
then said determining parameters of said voltage source model based on characteristics of said waveform comprises:
determining a high level voltage of the square wave voltage source based on the high level voltage of the step waveform, and determining a low level voltage of the square wave voltage source based on the low level voltage of the step waveform;
determining a rising edge time of the square wave voltage source based on a rising edge time of the step waveform and determining a falling edge time of the square wave voltage source based on a falling edge time of the step waveform.
2. The method for constructing the simulation circuit of the transient interference source of the power line of the automobile according to claim 1, wherein the method further comprises:
carrying out simulation test on the constructed simulation circuit;
and when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform, outputting the simulation circuit as a transient interference source.
3. The method for constructing the simulation circuit of the transient interference source of the power line of the automobile according to claim 1, wherein the determining the voltage source model according to the waveform of the transient interference source to be simulated comprises:
determining the type of a basic voltage source and the number of each type of basic voltage source according to the waveform of the transient interference source to be simulated;
when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one, the basic voltage source of the determined type is used as the voltage source model;
when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with determined types based on the waveform of the transient interference source to be simulated to serve as the voltage source model;
when the types of the basic voltage sources are at least two, all the basic voltage sources of at least two types are combined to be used as the voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
4. The method for constructing the simulation circuit of the transient interference source of the power line of the automobile according to claim 3, wherein the determining the type of the basic voltage source according to the waveform of the transient interference source to be simulated comprises:
if the waveform of the transient interference source to be simulated comprises a pulse waveform, determining that the type of a basic voltage source corresponding to the pulse waveform is a double-exponential-wave voltage source;
if the waveform of the transient interference source to be simulated comprises a step waveform, determining that the type of a basic voltage source corresponding to the step waveform is a square wave voltage source;
and if the waveform of the transient interference source to be simulated comprises a straight line, determining that the type of the basic voltage source corresponding to the straight line is a direct-current voltage source.
5. A device for constructing an emulation circuit of an automobile power line transient interference source is characterized by comprising: the simulation system comprises a model determining unit, a parameter determining unit and a simulation circuit constructing unit;
the model determining unit is used for determining a voltage source model according to the waveform of the transient interference source to be simulated, and the voltage source model comprises at least one type of basic voltage source or a combination of multiple types of basic voltage sources;
the parameter determining unit is used for determining the parameters of the voltage source model based on the characteristics of the waveform;
the simulation circuit building unit is used for building a simulation circuit of the transient interference source to be simulated by using a voltage source model with parameters as a voltage source model for simulating the waveform and a resistor for simulating the internal resistance of the transient interference source to be simulated, wherein the waveform of the transient interference source to be simulated comprises at least one of a pulse waveform, a step waveform and a straight line;
when the voltage source model comprises a dual exponential wave voltage source, the parameters of the basic voltage source model comprise: the simulation method comprises the following steps of (1) initializing a value, a pulsation value, starting delay time, a rising time constant, lasting delay time and a falling time constant, wherein the waveform of a transient interference source to be simulated corresponding to a voltage source model of the dual-exponential-wave voltage source comprises a pulse waveform;
the parameter determination unit includes: the method comprises the steps of setting a subunit, a first calculating subunit and a second calculating subunit;
the setting subunit is configured to set the initial value to 0, set the ripple value to a peak voltage of a pulse, and determine the start delay time based on a delay time parameter of the pulse waveform;
the first calculating subunit is configured to determine the rising time constant and the duration delay time based on a time required for a rising edge of the pulse waveform to reach a first preset voltage value and a second preset voltage value, where the first preset voltage value is the peak voltage of a first preset multiple, and the second preset voltage value is the peak voltage of a second preset multiple; in a case where the first preset voltage value is 0.1Us and the second preset voltage value is 0.9Us, Us representing the peak voltage, the rising time constant and the duration delay time are determined based on a time required for a rising edge of the pulse waveform to reach the second preset voltage value from the first preset voltage value, including:
taking the time of the first preset voltage value as t1, and the time of the second preset voltage value as t2, and making the falling edge of the pulse waveform not trigger before the time of t2, the exponential portions of the voltage at the time of t1 and the voltage at the time of t2 are expressed by the following formula (1) and formula (2):
exp(t1/TC1)＝0.1Us (1)
exp(t2/TC1)＝0.9Us (2)
wherein TC1 represents the rise time constant,
the formula (1) and the formula (2) are divided to obtain the following formula (3):
Figure FDF0000014415450000051
wherein, trRepresenting the time required for a rising edge to go from said first preset voltage value to said second preset voltage value,
the rising time constant is calculated by the formula (3),
setting the falling edge from the t12t of timerThe time is started to trigger, and the duration delay time is calculated by the following formula (4):
TD2＝2tr (4)
wherein TD2 represents the duration delay time;
the second calculating subunit is configured to determine the falling time constant based on a time required for a rising edge of the pulse waveform to reach the first preset voltage value of a falling edge from the first preset voltage value and a time required for the rising edge to reach the second preset voltage value from the first preset voltage value; wherein determining the falling time constant based on a time required for a rising edge of the pulse waveform to go from the first preset voltage value to the first preset voltage value of a falling edge and a time required for the rising edge to go from the first preset voltage value to the second preset voltage value comprises:
in the falling edge, the time when the voltage value is reduced to 0.1Us is recorded as t3, and the voltage index parts of the time t3 and the voltage peak time can be expressed by the following formula (6) and formula (5), respectively:
exp((t1+2tr)/TC2)＝Us (5)
exp(t3/TC2)＝0.1Us (6)
the formula (1) and the formula (2) are divided to obtain the following formula (7):
Figure FDF0000014415450000061
where TC2 represents the fall time constant, tdRepresents the time required for the rising edge to go from 0.1Us to 0.1Us of the falling edge,
calculating the descending time constant by the formula (7);
when the voltage source model comprises a square wave voltage source, the parameters of the voltage source model comprise: the voltage source comprises a high level voltage, a low level voltage, rising edge time and falling edge time, wherein the waveform of a transient interference source to be simulated corresponding to a voltage source model comprising the square wave voltage source comprises a step waveform;
the parameter determination unit comprises a first determination subunit and a second determination subunit;
the first determining subunit is configured to determine a high-level voltage of the square-wave voltage source based on the high-level voltage of the step waveform, and determine a low-level voltage of the square-wave voltage source based on the low-level voltage of the step waveform;
the second determining subunit is configured to determine a rising edge time of the square-wave voltage source based on the rising edge time of the step waveform, and determine a falling edge time of the square-wave voltage source based on the falling edge time of the step waveform.
6. The apparatus for constructing an emulation circuit of a source of transient interference on a power line of an automobile according to claim 5, further comprising: the circuit comprises a simulation test unit and a circuit output unit;
the simulation test unit is used for carrying out simulation test on the constructed simulation circuit;
and the circuit output unit is used for outputting the simulation circuit as a transient interference source when the test result of the simulation test shows that the characteristics of the waveform output by the simulation circuit are consistent with the characteristics of the standard transient interference source waveform.
7. The apparatus for constructing an emulation circuit of a source of transient interference on a power line of an automobile according to claim 5, wherein said model determining unit comprises: a first determining subunit and a second determining subunit;
the first determining subunit is configured to determine, according to the waveform of the transient interference source to be simulated, the type of the basic voltage source and the number of each type of basic voltage source;
the second determining subunit is configured to, when the type of the basic voltage source is one and the number of the basic voltage sources of the type is one, use the basic voltage source of the determined type as the voltage source model; when the type of the basic voltage source is one and the number of the basic voltage sources of the type is at least two, combining the at least two basic voltage sources with determined types based on the waveform of the transient interference source to be simulated to serve as the voltage source model; when the types of the basic voltage sources are at least two, all the basic voltage sources of at least two types are combined to be used as the voltage source model based on the waveform of the transient interference source to be simulated, the determined type of the basic voltage source and the number of the basic voltage sources of each type.
8. The apparatus for constructing a simulation circuit of a transient interference source on a power line of an automobile according to claim 7, wherein the first determining subunit is specifically configured to determine that the type of the basic voltage source corresponding to the pulse waveform is a dual-exponential-wave voltage source when the waveform of the transient interference source to be simulated includes the pulse waveform; when the waveform of the transient interference source to be simulated comprises a step waveform, determining a basic voltage source corresponding to the type of the step waveform as a square wave voltage source; when the waveform of the transient interference source to be simulated comprises a straight line, determining that the type of a basic voltage source corresponding to the straight line is a direct-current voltage source.
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