CN107765117B - A kind of test device and method of optical module self-healing - Google Patents
A kind of test device and method of optical module self-healing Download PDFInfo
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- CN107765117B CN107765117B CN201710862600.2A CN201710862600A CN107765117B CN 107765117 B CN107765117 B CN 107765117B CN 201710862600 A CN201710862600 A CN 201710862600A CN 107765117 B CN107765117 B CN 107765117B
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- 238000012360 testing method Methods 0.000 title claims abstract description 132
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- 230000002159 abnormal effect Effects 0.000 claims description 23
- 238000010998 test method Methods 0.000 claims description 10
- 230000005540 biological transmission Effects 0.000 claims description 4
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- 238000004891 communication Methods 0.000 abstract description 11
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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Abstract
The invention discloses the test devices and method of a kind of optical module self-healing, including power supply and signal generator, are related to field.This test device further include: test board which is provided with power interface, high-speed differential signal interface and indicator unit, power interface and connect to power supply, and high-speed differential signal interface is connect with signal generator；Optical module interface, it is set on test board, optical module interface is separately connected power interface, high-speed differential signal interface and indicator unit, optical module to be tested connects optical module interface, the high-speed differential signal that test voltage and signal generator of the optical module interface for respectively generating power supply generate inputs optical module to be tested, is also used to receive the output signal of the status-pin of optical module to be tested and is output to indicator unit.The self-healing of optical module after the present invention can sufficiently verify abnormity of power supply and restore, avoiding the problem that breaking down in practical applications can not restore, it is ensured that communication quality.
Description
Technical field
The present invention relates to field of communication technology, it is specifically related to test device and the side of a kind of optical module self-healing
Method.
Background technique
With the high speed development of optical communication technique, small pluggable device SFP (Small Form-factor
Pluggable)/SFP+ optical module is low in energy consumption with its, encapsulation is small and advantage succinct interface specification is received as various businesses light
The preferred packing forms for sending out integrated data communication optical module, are widely applied in telecommunications and field of data communication.SFP/SFP
+ optical module is made of receiving portion, emitting portion and control section, and transmitting terminal converts electrical signals into optical signal, passes through light
After fibre transmission, optical signal is converted into electric signal again by receiving end, and the major function of control section is to light-receiving and emission part
Divide the working condition done initial configuration and monitor real-time optical module, while being communicated with optical module host computer.
In order to before optical module batch application discovery early there are the problem of, reduce optical module event in practical applications
Barrier, the function and performance verification of optical module are not only to need to test optical module using preceding most important link and working normally ring
Performance indicator under border, it is also necessary to verify the fault-tolerance of optical module, to increase the robustness of optical module in the application, guarantee light
Module correctly can be worked and be communicated in the application scenarios of various complexity uninterruptedly.At present common light module test method be
Optical module performance test in optical module power supply (3.3V ± 5%) range.For power supply unexpected abnormality in optical module work
The common testing methods of situation are as follows: after the equipment complete machine power-down rebooting or optical module power-down rebooting of optical module adaptation, pass through
Whether optical module can restore to work normally to confirm optical module self-healing.But the laser of emitting portion drives core
The operating voltage range of piece (Laser Diode Driver, LD) and the micro-control unit chip (Micro of optical module control section
Control Unit, MCU) operating voltage range it is not quite identical.Which results in SFP/SFP+ optical modules in abnormal electrical power supply
Afterwards when self- recoverage, micro-control unit chip operation is normal and operation irregularity occurs in laser driving chip, to cause optical module
It can not restore to work normally.Therefore, existing test method has the working power environment of optical module power-down rebooting uncertain
Property, it can not accomplish the integrity verification to optical module power supply environment.
Summary of the invention
In view of the deficiencies in the prior art, the main purpose of the present invention is to provide a kind of optical module self-healings
Test device and method, can sufficiently verify abnormity of power supply and restore after optical module self-healing, avoid due to optical mode
Block test incomplete the problem of can not restoring of causing to break down in practical applications, it is ensured that communication quality.
The present invention provides a kind of test device of optical module self-healing, including power supply and signal generator, the survey
Trial assembly is set further include:
Test board which is provided with power interface, high-speed differential signal interface and indicator unit, the power interface and electricity
Source connection, the high-speed differential signal interface are connect with signal generator；
Optical module interface is set on the test board, and the optical module interface is separately connected the power interface, high speed
Differential signal interface and indicator unit, optical module to be tested connect the optical module interface, and the optical module interface is for dividing
The high-speed differential signal that the test voltage and signal generator that power supply is not generated generate inputs optical module to be tested, is also used to
It receives the output signal of the status-pin of optical module to be tested and is output to the indicator unit.
Based on the above technical solution, the test board is PCB circuit board；The indicator unit includes to be tested
Optical module is without receipts light LOS warning light, optical module to be tested indicator light not in place and power supply indicator.
Based on the above technical solution, the optical module interface is integrated device comprising:
Power supply circuit, input terminal connect power supply, and output end connects the power pin of optical module to be tested；
High-speed-differential circuit is connect with the high-speed differential signal pin of signal generator and optical module to be tested respectively；
Status signal circuit, input terminal are connect with the status-pin of optical module to be tested, the status signal circuit
Output end is connect with the indicator unit.
Based on the above technical solution, the status-pin of optical module to be tested includes that the transmission of optical module to be tested is closed
Close enabled Tx_disable pin, LOS pin and TX_Fault pin.
Based on the above technical solution, the test device further includes the test microcontroller on the test board
The micro-control unit of device, the test microcontroller and optical module to be tested is communicated to connect by I2C interface between integrated circuit.
Based on the above technical solution, the test microcontroller is connected by GPIO interface and the optical module interface
It connects, the output signal of the status-pin for receiving optical module to be tested.
Based on the above technical solution, the optical module interface is also connect with the control pin of optical module to be tested,
The test microcontroller is connect by GPIO interface with the optical module interface, is exported to the control pin of optical module to be tested
Control signal.
The present invention also provides a kind of tests of test device using optical module self-healing as described in claim 1
Method, the test method the following steps are included:
Optical module to be tested is connect with optical module interface；
Test voltage is adjusted to normal working voltage range, the normal work of optical module to be tested is determined by indicator unit
Make；
Test voltage is adjusted in abnormal work voltage range, in the abnormal work voltage range, light to be tested
The laser driving chip of module can not work normally, but micro-control unit work normally, by indicator unit show to
Test optical module operation irregularity；
Test voltage is restored to normal working voltage range, determines whether optical module to be tested works normally.
Based on the above technical solution, the method for the abnormal work voltage range is determined are as follows: adjustment test voltage
Voltage value, treat test optical module detected, when optical module operation irregularity to be tested, the voltage value of discriminating test voltage
In the abnormal work voltage range.
Based on the above technical solution, the test device further includes test microcontroller, in the abnormal work
In voltage range, the test microcontroller obtains the parameter value of the internal register of optical module to be tested.
Compared with prior art, advantages of the present invention is as follows:
(1) test optical module is treated by adjusting the voltage value of test voltage to be tested, can accurately determine to be tested
The laser driving chip of optical module can not work normally, but the abnormal work voltage range that micro-control unit works normally.
(2) by the way that first test voltage is adjusted in abnormal work voltage range, then test voltage is restored to normally
Operating voltage range, determines whether optical module to be tested works normally.Optical module after abnormity of power supply can sufficiently be verified and restored
Self-healing, avoid the problem that due to optical module test it is incomplete cause to break down in practical applications and can not restore,
Ensure communication quality.
(3) parameter value that optical module internal register to be tested is obtained by testing microcontroller, can be in test process
In its working condition confirmed by the special setting field of optical module, and analyze the reason of obtaining optical module operation irregularity and determination
Solution.
Detailed description of the invention
Fig. 1 is the test device schematic diagram of SFP optical module self-healing of the embodiment of the present invention；
Fig. 2 is the test method flow chart of SFP optical module self-healing of the embodiment of the present invention.
Appended drawing reference:
Test board 1, power interface 11, high-speed differential signal interface 12, indicator unit 13, optical module interface 2 are tested micro-
Controller 3, optical module 4 to be tested, power supply 5, signal generator 6.
Specific embodiment
With reference to the accompanying drawing and specific embodiment the present invention is described in further detail.
Shown in Figure 1, the embodiment of the present invention provides a kind of test device of optical module self-healing, this test device
Including test board 1, optical module interface 2, power supply 5 and signal generator 6.Optical module interface 2 is set on test board 1, and test board 1 divides
Not Lian Jie power supply 5 and signal generator 6, optical module 4 to be tested connects optical module interface 2.
Test board 1 can be printed circuit board (Printed Circuit Board, PCB), and test board 1 is equipped with power supply
Interface 11, high-speed differential signal interface 12 and indicator unit 13.Power interface 11 is connect with power supply 5, and power supply 5 is for generating survey
Voltage is tried, test voltage is no more than 4 normal working voltage of optical module to be tested, the normal working voltage of SFP and SFP+ optical module
For 3.3V ± 5%, corresponding test voltage range arrives 3.3V ± 5% for 0.High-speed differential signal interface 12 and signal generator 6
Connection, signal generator 6 are used to generate the high-speed differential signal suitable for optical module 4 to be tested, and optical mode to be tested may be implemented
Block 4 is by the connection of test board 1 and signal generator 6 or the high speed signal of realization optical module 4 to be tested from ring (optical module
Emission port and receiving port docking get up).In order to guarantee signal impedance and electrical level match, multi-source agreement (Multi- is selected
Source Agreement, MSA) head is as high-speed differential signal interface 12.Power switch can also be set on test board 1, just
The switch operation of test voltage is carried out in tester.Test board 1 is equipped with the instruction for showing 4 working condition of optical module to be tested
Lamp unit 13 facilitates tester quickly to judge the working condition of optical module 4 to be tested during the test.Indicator unit 13
It is not indicated in place including SFP/SFP+ optical module to be tested without receipts light LOS warning light (red), SFP/SFP+ optical module to be tested
Lamp (red), power supply indicator (green) and other status indicator lamps.
Optical module interface 2 is separately connected power interface 11, high-speed differential signal interface 12 and indicator unit 13, optical module
Interface 2 is for be tested by the test voltage that power supply 5 generates and the high-speed differential signal that signal generator 6 generates input respectively
Optical module 4 receives the output signal of the status-pin of optical module 4 to be tested and is output to indicator unit 13.
Optical module interface 2 includes power supply circuit, high-speed-differential circuit and status signal circuit, and the input terminal of power supply circuit connects
Power supply 5 is connect, output end is connected with the power pin of optical module 4 to be tested.High-speed-differential circuit is separately connected 6 He of signal generator
The high-speed differential signal pin of optical module 4 to be tested.The status-pin of the input terminal of status signal circuit and optical module 4 to be tested
Connection, the output end of status signal circuit are connect with indicator unit 13.
Optical module interface 2 is integrated device, the power supply circuit of optical module interface 2 according to SFP/SFP+ optical module power supply unit
Split-phase closes protocol requirement design, and high-speed-differential circuit is set according to the HW High Way relevant portion agreement of SFP/SFP+ optical module
Meter, status signal circuit are designed according to the control of SFP/SFP+ optical module and status sections related protocol.
The status-pin of optical module 4 to be tested include optical module 4 to be tested transmission close enabled Tx_disable pin,
LOS pin and TX_Fault pin.Such as send and close enabled Tx_disable pin, by monitoring and controlling the Tx_
The level value of disable pin obtains the luminance of optical module 4 to be tested.When laser fails, TX_Fault pin
Output signal is high level, and when normal work is low level.In addition, Tx_disable pin as control pin can also by with
In realizing the optical port switching function for controlling optical module 4 to be tested by the level state for operating the Tx_disable pin.To
The status-pin for testing optical module 4 can also include the first serial communication interface pin MOD-DEF1, the second serial communication interface
Pin MOD-DEF2 and ground connection MOD-DEF0.
By adjusting the voltage value of test voltage, it is not only able to determine that laser driving chip can not work normally, still
The abnormal work voltage range that micro-control unit works normally, and can sufficiently verify optical module after 5 exception of power supply and recovery
Self-healing, avoid the problem that due to optical module test it is incomplete cause to break down in practical applications and can not restore,
Ensure communication quality.
This test device can also include the test microcontroller 3 on test board 1, and test microcontroller 3 includes electricity
Source partial circuit, control section circuit and I2C interface, for realizing test microcontroller 3 and 4 microcontroller list of optical module to be tested
Member communication.Test microcontroller 3 be used for by I2C (Inter-Integrated Circuit, I2C) interface between integrated circuit with
The micro-control unit of optical module 4 to be tested communicates to connect.It is obtained by test microcontroller 3 and is deposited inside optical module 4 to be tested
The parameter value of device can confirm its working condition by the special setting field of optical module during the test, and analyze and obtain
The reason of optical module operation irregularity and determining solution.
USB interface can also be set on test board 1, and USB interface is connect with test microcontroller 3, so that tester can
To access each register value of optical module 4 to be tested by software by computer, can confirm to be measured in optical module certification
4 working condition of optical module is tried, while can be confirmed that the value in optical module 4 to be tested in special setting field is done and confirming, and analyzing
The reason of obtaining optical module operation irregularity and determining solution.In order to facilitate test, USB interface and power interface 11, power supply
Switch can be set in the same side of test board 1.
It tests microcontroller 3 and passes through general input/output port GPIO (General Purpose Input Output) interface
It is connect with optical module interface 2, specifically, the output end of status signal circuit is also connect with the GPIO interface of test microcontroller 3,
For receiving the output signal of the status-pin of optical module 4 to be tested.
Optical module interface 2 is also connect with the control pin of optical module 4 to be tested, and test microcontroller 3 passes through GPIO interface
It is connect with optical module interface 2, exports control signal to the control pin of optical module 4 to be tested.Specifically, status signal circuit
Input terminal is also connect with the control pin of optical module 4 to be tested.
Optical module 4 to be tested is connect by optical module interface 2 with test board 1, for optical module 4 to be tested provide working power,
High-speed differential signal and control signal and reception state signal.Testing microcontroller 3 is that single-chip microcontroller and its peripheral components form,
It is logical by I2C interface between integrated circuit and 4 inside micro-control unit of optical module to be tested as host computer to test microcontroller 3
Letter, while treating by GPIO interface the control pin of test optical module 4 and status-pin is managed.On test board 1 also
The reset switch of 4 inside micro-control unit of optical module to be tested can be provided, multiple power sources electricity can be tested using power switch
Press the robustness of optical module under abnormal environment.For test board 1, it will usually 1 bracket of test board is installed, to facilitate test to place.
In order to improve testing efficiency, multiple optical module interfaces 2 can be installed on test board 1, while to multiple to be tested
Optical module 4 is tested, each optical module interface 2 can configure corresponding test microcontroller 3.
Shown in Figure 2, the embodiment of the present invention also provides a kind of test method of optical module self-healing, this test side
Method the following steps are included:
S1. optical module 4 to be tested is connect with optical module interface 2.
S2. startup power supply 5 and signal generator 6, signal generator 6 generate the high speed difference for being suitable for optical module 4 to be tested
Test voltage is adjusted to the normal working voltage range of optical module 4 to be tested by sub-signal, by indicator unit 13 determine to
Optical module 4 is tested to work normally.
S3. power supply 5 is adjusted, test voltage is adjusted in abnormal work voltage range, in abnormal work voltage range,
The laser driving chip of optical module 4 to be tested can not work normally, but micro-control unit works normally, and passes through indicator light list
13 display 4 operation irregularity of optical module to be tested of member.
S4. adjust power supply 5, test voltage is restored to normal working voltage range, by indicator unit 13 determine to
Whether test optical module 4 works normally.
Before step S1, it is thus necessary to determine that abnormal work voltage range, the method for determining abnormal work voltage range are as follows: adjust
The voltage value of whole test voltage is treated test optical module 4 using optical detecting unit and is detected, when optical module 4 to be tested is not sent out
When light or luminous exception, the voltage value of discriminating test voltage is in abnormal work voltage range.
Test optical module 4 is treated when being tested, optical fiber company can be passed through using optical detecting unit and optical module 4 to be tested
Connect, optical detecting unit for determine optical module 4 to be tested under test voltage whether normal luminous.
This test method further include:
S5. in abnormal work voltage range, test microcontroller 3 obtains the internal register of optical module 4 to be tested
Parameter value, and it is output to computer.
The present invention is not limited to the above-described embodiments, for those skilled in the art, is not departing from
Under the premise of the principle of the invention, several improvements and modifications can also be made, these improvements and modifications are also considered as protection of the invention
Within the scope of.The content being not described in detail in this specification belongs to the prior art well known to professional and technical personnel in the field.
Claims (10)
1. a kind of test device of optical module self-healing, including power supply and signal generator, which is characterized in that the test
Device further include:
Test board, which is provided with power interface, high-speed differential signal interface and indicator unit, and the power interface and power supply connect
It connects, the high-speed differential signal interface is connect with signal generator；
Optical module interface is set on the test board, and the optical module interface is separately connected the power interface, high-speed-differential
Signaling interface and indicator unit, optical module to be tested connect the optical module interface, and the optical module interface will be for respectively will
The high-speed differential signal that the test voltage and signal generator that power supply generates generate inputs optical module to be tested, is also used to receive
The output signal of the status-pin of optical module to be tested is simultaneously output to the indicator unit；
The test device is treated test optical module by adjusting the voltage value of test voltage and is tested, and specifically includes:
Test voltage is adjusted to normal working voltage range, determines that optical module to be tested works normally by indicator unit；
The voltage value of test voltage is adjusted, to determine that optical module laser driving chip to be measured can not work normally, but micro-control
The abnormal work voltage range that unit processed works normally；
Test voltage is restored to normal voltage range, determines whether optical module to be tested works normally.
2. the test device of optical module self-healing as described in claim 1, it is characterised in that: the test board is PCB
Circuit board；The indicator unit includes optical module to be tested without receipts light LOS warning light, optical module to be tested indicator light not in place
And power supply indicator.
3. the test device of optical module self-healing as described in claim 1, which is characterized in that the optical module interface is
Integrated device comprising:
Power supply circuit, input terminal connect power supply, and output end connects the power pin of optical module to be tested；
High-speed-differential circuit is connect with the high-speed differential signal pin of signal generator and optical module to be tested respectively；
Status signal circuit, input terminal are connect with the status-pin of optical module to be tested, the output of the status signal circuit
End is connect with the indicator unit.
4. the test device of optical module self-healing as described in claim 1, it is characterised in that: the shape of optical module to be tested
State pin includes that enabled Tx_disable pin, LOS pin and TX_Fault pin are closed in the transmission of optical module to be tested.
5. such as the test device of the described in any item optical module self-healings of Claims 1-4, it is characterised in that: the survey
It further includes the test microcontroller on the test board that trial assembly, which is set, and the test microcontroller is micro- with optical module to be tested
I2C interface communicates to connect between control unit passes through integrated circuit.
6. the test device of optical module self-healing as claimed in claim 5, it is characterised in that: the test microcontroller
It is connect by GPIO interface with optical module interface to be tested, the output signal of the status-pin for receiving optical module to be tested.
7. the test device of optical module self-healing as claimed in claim 5, it is characterised in that: the optical module interface is also
It is connect with the control pin of optical module to be tested, the test microcontroller is connected by GPIO interface and the optical module interface
It connects, exports control signal to the control pin of optical module to be tested.
8. a kind of test method of the test device using optical module self-healing as described in claim 1, feature exist
In, the test method the following steps are included:
Optical module to be tested is connect with optical module interface；
Test voltage is adjusted to normal working voltage range, determines that optical module to be tested works normally by indicator unit；
Test voltage is adjusted in abnormal work voltage range, in the abnormal work voltage range, optical module to be tested
Laser driving chip can not work normally, but micro-control unit work normally, shown by indicator unit to be tested
Optical module operation irregularity；
Test voltage is restored to normal working voltage range, determines whether optical module to be tested works normally.
9. the test method of optical module self-healing as claimed in claim 8, which is characterized in that determine the abnormal work
The method of voltage range are as follows: the voltage value for adjusting test voltage is treated test optical module and detected, when optical module work to be tested
When making abnormal, the voltage value of discriminating test voltage is in the abnormal work voltage range.
10. the test method of optical module self-healing as claimed in claim 8, it is characterised in that: the test device is also
Including testing microcontroller, in the abnormal work voltage range, the test microcontroller obtains optical module to be tested
The parameter value of internal register.
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| CN108646169A (en) * | 2018-05-15 | 2018-10-12 | 深圳极智联合科技股份有限公司 | A kind of BOSA test methods and system |
| CN110121122B (en) * | 2019-05-10 | 2022-04-19 | 南京牛芯微电子有限公司 | Optical module control method and system |
| CN111740783B (en) * | 2020-05-12 | 2021-07-06 | 杭州兰特普光电子技术有限公司 | Automatic calibration system and method for adjustable laser with protection |
| CN118275744B (en) * | 2024-06-03 | 2024-07-30 | 成都光创联科技有限公司 | Optical device test protection circuit and optical device test system |
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| US8170829B1 (en) * | 2008-03-24 | 2012-05-01 | Cisco Technology, Inc. | Tester bundle |
| CN201976107U (en) * | 2011-03-02 | 2011-09-14 | 利尔达科技有限公司 | SFP (Small Formfactor Pluggable) + type optical communication testing device |
| CN103983821B (en) * | 2014-04-18 | 2016-08-24 | 烽火通信科技股份有限公司 | A kind of high frequency performance test structure of pluggable optical module adapter |
| CN105991184B (en) * | 2015-02-05 | 2018-05-25 | 四川泰瑞创通讯技术股份有限公司 | The self-recovery method of OTDR transmitting terminal optical module test failures |
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