CN107764746A - A kind of high polymer optics depolarization instrument - Google Patents

A kind of high polymer optics depolarization instrument Download PDF

Info

Publication number
CN107764746A
CN107764746A CN201711098593.XA CN201711098593A CN107764746A CN 107764746 A CN107764746 A CN 107764746A CN 201711098593 A CN201711098593 A CN 201711098593A CN 107764746 A CN107764746 A CN 107764746A
Authority
CN
China
Prior art keywords
high polymer
depolarization
signal
instrument
optics
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711098593.XA
Other languages
Chinese (zh)
Inventor
杨波
杨定海
陆建忠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHANGHAI DONGHUA KAILI NEW MATERIALS TECHNOLOGY Co Ltd
Shanghai Kailidixin Materials Polytron Technologies Inc
Original Assignee
SHANGHAI DONGHUA KAILI NEW MATERIALS TECHNOLOGY Co Ltd
Shanghai Kailidixin Materials Polytron Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHANGHAI DONGHUA KAILI NEW MATERIALS TECHNOLOGY Co Ltd, Shanghai Kailidixin Materials Polytron Technologies Inc filed Critical SHANGHAI DONGHUA KAILI NEW MATERIALS TECHNOLOGY Co Ltd
Priority to CN201711098593.XA priority Critical patent/CN107764746A/en
Publication of CN107764746A publication Critical patent/CN107764746A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The present invention is on a kind of high polymer optics depolarization instrument, including full-automatic closed loop light path detection, signal acquisition transformation system and Multistage Control reponse system.Full-automatic closed loop light path detection includes signal optical source, condenser, colour filter chip architecture, polarizer, crystal growing furnace, semi-transparent semi-reflecting lens, the first silicon photocell and the second silicon photocell.First silicon photocell is used to the optical signal transmitted through semi-transparent semi-reflecting lens being converted into the first electric signal;Second silicon photocell is used to the optical signal reflected through semi-transparent semi-reflecting lens being converted into the second electric signal.Signal acquisition transformation system is connected with the first silicon photocell, and the first electric signal is converted into digital data transmission to computer, draws high polymer sample crystallization speed data.Multistage Control reponse system is connected with the second silicon photocell, signal optical source respectively, and the second electric signal of regulation is strong and weak, controls the luminous intensity of light source.Present invention is mainly used for the volume for reducing high polymer optics depolarization instrument, improves the stability and precision of measuring system.

Description

A kind of high polymer optics depolarization instrument
Technical field
It is inclined more particularly to a kind of high polymer optics solution the present invention relates to a kind of superpolymer crystal speed measurement techniques field Vibration Meter.
Background technology
At present, typically using volume dilatometer method measure superpolymer crystal speed;But there is finding speed in this method Slowly the shortcomings that, heat balance time is long, it is not suitable for determining the fast high polymer of crystallization rate.And the measure crystallization of optics depolarization instrument is dynamic Mechanics speed parameter, it is that the principle changed based on high polymer optical property in crystallization process is set up, has quick, accurate Really, the advantages of suitable material is wide in variety.
The critical piece of existing optics depolarization instrument is mainly divided in two casings.One of casing is built with melting Stove, crystal growing furnace, optical measurement components (e.g., signal optical source, condenser, pellicle mirror, photomultiplier, analyzer, semi-transparent semi-reflecting Mirror);Another casing is built with temperature-controlling system, power supply, transformer, high voltage power supply, trimming circuit, light intensity automatic control circuit, wire.
But the inventors found that at least there is following technical problem in above-mentioned existing optics depolarization instrument:(1) The volume of the above-mentioned each parts of optics depolarization instrument is larger, takes the very big space of optics depolarization instrument;(2) due to above-mentioned light The critical piece for learning depolarization instrument is divided in two casings so that structure is not compact, easily causes the unstable of apparatus measures.
The content of the invention
In view of this, the present invention provides a kind of high polymer optics depolarization instrument, and main purpose is to reduce optics depolarization The volume of instrument, improve the stability of apparatus measures.
To reach above-mentioned purpose, present invention generally provides following technical scheme:
Embodiments of the invention provide a kind of high polymer optics depolarization instrument, wherein, the high polymer optics depolarization instrument Including:
Full-automatic closed loop light path detection, the full-automatic closed loop light path detection include signal optical source, colour filter Structure, polarizer, crystal growing furnace, semi-transparent semi-reflecting lens, the first silicon photocell and the second silicon photocell;Wherein, the light source is sent Filtered of light, after polarizer, expose in the crystal growing furnace on high polymer sample, and transmitted through the transmission of high polymer sample Light passes through the semi-transparent semi-reflecting lens;First silicon photocell is used to the optical signal transmitted through the semi-transparent semi-reflecting lens being converted into First electric signal;Second silicon photocell is used to the optical signal reflected through the semi-transparent semi-reflecting lens being converted into the second telecommunications Number;
Signal acquisition transformation system, the signal acquisition transformation system electrically connect with first silicon photocell, for inciting somebody to action First electric signal is converted into data signal, can be by digital data transmission to computer, so that computer software draws high gather Thing sample crystallization speed data;
Multistage Control reponse system, the Multistage Control reponse system are connected with second silicon photocell, light source respectively, For automatically adjusting the second electric signal power, the luminous intensity of the signal optical source is controlled.
The object of the invention to solve the technical problems can be also applied to the following technical measures to achieve further.
Preferably, the high polymer optical polarization instrument includes a housing;Wherein, the full-automatic closed loop light path detection system System, signal acquisition transformation system, Multistage Control reponse system are arranged in the housing;
Preferably, the length of the housing is 180-220mm, width 80-100mm, is highly 40-60mm;
Preferably, the colour filter chip architecture is formed by two panels colour filter bonding;Wherein, the external diameter of the colour filter is 10mm ± 0.1mm, thickness 1.5mm ± 0.1mm of the colour filter.
Preferably, the Multistage Control reponse system includes high-power compensation circuit;Wherein,
The high-power compensation circuit is connected with second silicon photocell, signal optical source, and according to second telecommunications Number compared with reference voltage, to automatically control the luminous intensity of the signal optical source.
Preferably, the crystal growing furnace includes the first sidepiece and the second sidepiece being oppositely arranged;Wherein, first sidepiece and Through hole is provided with the center of second sidepiece, for making polarization luminous energy transmitted through the high polymer sample in crystal growing furnace.
Preferably, the through hole is straight through being 2.5mm-3.0mm.
Preferably, the high polymer optics depolarization instrument also includes power-supply system, wherein the power-supply system includes:
First transformation voltage-stablizer, the first transformation voltage-stablizer is connected with exchange 220v power supplys, for the crystal growing furnace First voltage is provided;Preferably, the first voltage is direct current 36v;
Second transformation voltage-stablizer, the second transformation voltage-stablizer exchange 220v power supply connections, for the signal optical source, Multistage Control reponse system provides second voltage;Preferably, the second voltage is direct current 12v;
Wherein, the first transformation voltage-stablizer, the second transformation voltage-stablizer are arranged in the housing.
Preferably, the optics depolarization instrument also includes temperature control system, wherein, the temperature control system with it is described Crystal growing furnace connects, to control the heating-up temperature of the crystal growing furnace;
Preferably, the signal acquisition transformation system includes multi pass acquisition card.
Preferably, the signal acquisition transformation system is used to gather the electricity from the first silicon photocell, the second silicon photocell The heating-up temperature parameter of signal parameter, temperature control system control crystal growing furnace, and electric signal parameter, heating-up temperature can be joined Number is converted into data signal, and transmits to computer, under being run in computer software, draws high polymer sample crystallization speed Data and curve;
Wherein, the high polymer sample crystallization speed data and curve include curve of the depolarization light intensity to the time, difference Isothermal crystal parameter, flexible chain, crystallization rate constant and A Fu rummy indexes during isothermal crystal.
Compared with prior art, high polymer optics depolarization instrument of the invention at least has following beneficial effect:
High polymer optics depolarization instrument provided in an embodiment of the present invention substitutes prior art optics by using silicon photocell Photomultiplier in depolarization instrument, compared with the larger photomultiplier of volume, silicon photocell small volume, so as in entirety On reduce the volume of optics depolarization instrument.In addition, silicon photocell also has, stability is good, anticorrosion, durable and without dirt The advantages that dye, so as to improve the measurement performance and environmental-protecting performance of the optics depolarization instrument of the embodiment of the present invention.
Further, after high polymer starts crystallization, because crystalline phase and amorphous phase have different refractive indexes, thus in two-phase Interface has scattering light to produce, and with the progress of crystallization process, the transparency of sample constantly declines, and empirical curve is crystallized with actual Deviation occurs for situation.And the present embodiment provide high polymer optics depolarization instrument by Multistage Control reponse system can eliminate by Deviation caused by scattering, specifically, it is transformed to by the second silicon photocell after electric signal through Multistage Control reponse system, automatically Signal optical source voltage is raised, the light intensity through sample in crystallization process is linearly lifted from beginning to end, effectively subtracts The error of small experiment.
Further, the high polymer optics depolarization instrument that the present embodiment provides by full-automatic closed loop light path by detecting system System, Multistage Control reponse system, the first transformation voltage-stablizer, the second transformation voltage-stablizer and melting furnace are arranged in housing, are realized Reduction optics depolarization instrument machine volume, the structural compactness of optics depolarization instrument is improved, improve the stability of apparatus measures.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention, And can be practiced according to the content of specification, below with presently preferred embodiments of the present invention and coordinate accompanying drawing describe in detail as after.
Brief description of the drawings
Fig. 1 is a kind of measuring principle figure for high polymer optics depolarization instrument that embodiments of the invention provide;
Fig. 2 is a kind of internal structure schematic diagram for high polymer optics depolarization instrument that embodiments of the invention provide.
Embodiment
Further to illustrate the present invention to reach the technological means and effect that predetermined goal of the invention is taken, below in conjunction with Accompanying drawing and preferred embodiment, to embodiment, structure, feature and its effect according to the present patent application, describe in detail such as Afterwards.In the following description, what different " embodiment " or " embodiment " referred to is not necessarily the same embodiment.It is in addition, one or more Special characteristic, structure or feature in individual embodiment can be combined by any suitable form.
Embodiment 1
The present embodiment provides a kind of high polymer optics depolarization instrument, as depicted in figs. 1 and 2, the high polymer in the present embodiment Optics depolarization instrument includes:Full-automatic closed loop light path detection, signal acquisition transformation system 3 and Multistage Control reponse system 2. Wherein, full-automatic closed loop light path detection includes signal optical source 11, colour filter chip architecture 12, polarizer 13, crystal growing furnace 14, semi-transparent Semi-reflective mirror 17, the first silicon photocell 16 and the second silicon photocell 15.Wherein, the light that signal optical source 11 is sent passes through colour filter knot After structure 12, polarizer 13, expose on the sample of crystal growing furnace 14;First silicon photocell 16 is used to transmit through semi-transparent semi-reflecting lens 17 Light be converted into the first electric signal;Second silicon photocell 15 is used to the light reflected through semi-transparent semi-reflecting lens being converted into the second telecommunications Number.Signal acquisition transformation system 3 electrically connects with the first silicon photocell 16, for the first electric signal to be converted into data signal, energy By digital data transmission to computer, so that computer software draws high polymer sample crystallization speed data.Multistage Control is fed back System 2 is connected with the second silicon photocell 16, light source 11 respectively, for automatically adjusting the second electric signal power control signal light source 11 Luminous intensity.
On the one hand, the high polymer optics depolarization instrument that the present embodiment provides substitutes prior art light by using silicon photocell The photomultiplier in depolarization instrument is learned, compared with the larger photomultiplier of volume, silicon photocell small volume, so as to from whole The volume of optics depolarization instrument is reduced on body.In addition, silicon photocell also has, stability is good, anticorrosion, durable and nothing The advantages that pollution, so as to improve the measurement performance and environmental-protecting performance of the optics depolarization instrument of the present embodiment.
In addition, after high polymer starts crystallization, because crystalline phase and amorphous phase have different refractive indexes, thus at the interface of two-phase There is scattering light to produce, with the progress of crystallization process, the transparency of sample constantly declines, and makes empirical curve and actual crystallization situation Generation deviation.And the optics depolarization instrument that the present embodiment provides can be eliminated by Multistage Control reponse system and caused by scattering Deviation, specifically, be transformed to automatically raise flashlight through Multistage Control reponse system after electric signal by the second silicon photocell Source voltage, the light intensity through sample in crystallization process is linearly lifted from beginning to end, effectively reduce the mistake of experiment Difference.
It is preferred that the high polymer optics depolarization instrument in the present embodiment also includes:Analyzer 18;Wherein, analyzer 18 will Transmitted light through semi-transflective reflective 17 is sent into the first silicon photocell 16.
It is preferred that crystal growing furnace 14 includes the first sidepiece and the second sidepiece being oppositely arranged;Wherein, the first sidepiece and the second side Through hole is provided with the center in portion, for making polarization luminous energy transmitted through the high polymer sample in crystal growing furnace 14;Preferably, through hole Straight warp is 2.5mm-3.0mm.It is preferred that the through hole is located at the center of crystal growing furnace sidepiece.
It is preferred that the signal acquisition transformation system 3 in the present embodiment includes multi pass acquisition card.
It is preferred that colour filter chip architecture 12 is formed by two panels colour filter bonding;Wherein, the external diameter of colour filter be 10mm ± 0.1mm, thickness 1.5mm ± 0.1mm of colour filter.The present embodiment is by the way that colour filter chip architecture 12 by above-mentioned setting, can be improved Colour filter effect.
Embodiment 2
It is preferred that the present embodiment provides a kind of high polymer optics depolarization instrument, compared with a upper embodiment, such as Fig. 1 and Fig. 2 Shown, the Multistage Control reponse system 2 in the present embodiment includes high-power compensation circuit;Wherein, high-power compensation circuit and the Two silicon photocells 15 connect, light source 11 connects, and according to the second electric signal compared with reference voltage, to control the signal optical source Luminous intensity.
The Multistage Control reponse system that the present embodiment provides can be eliminated as caused by scattering well by above-mentioned setting Deviation, making high poly- field sample, the light intensity of signal optical source is linearly lifted from beginning to end, is effectively reduced in crystallization process The error of experiment.
Embodiment 3
It is preferred that the present embodiment provides a kind of high polymer optics depolarization instrument, compared with above-described embodiment, such as Fig. 1 and Fig. 2 Shown, the optics depolarization instrument in the present embodiment also includes power-supply system 6, and wherein power-supply system 6 includes:First transformation voltage-stablizer 61 and the second transformation voltage-stablizer 62;Wherein, the first transformation voltage-stablizer 61 is connected with AC power, for crystal growing furnace 14 (and The melting furnace 7 subsequently mentioned) first voltage is provided;Preferably, first voltage is direct current 36v.Second transformation voltage-stablizer 62 exchanges Power supply connects, for providing second voltage to light source 11, Multistage Control reponse system 2;Preferably, second voltage is direct current 12v.
The first transformation voltage-stablizer 61 in the present embodiment includes a transformer and a voltage-stablizer.Similarly, in the present embodiment Second transformation voltage-stablizer 62 includes a transformer and a voltage-stablizer.
Embodiment 4
It is preferred that the present embodiment provides a kind of optics depolarization instrument of high polymer, compared with above-described embodiment, such as Fig. 1 and Fig. 2 Shown, the optics depolarization instrument in the present embodiment also includes temperature control system 4, wherein, temperature control system 4 and the electricity of crystal growing furnace 14 Connection, to control the heating-up temperature of crystal growing furnace 14 respectively.
It is preferred that the optics depolarization instrument in the present embodiment also includes temperature detector, temperature detector is used to be placed in In crystal growing furnace, for detecting the temperature in crystal growing furnace.
It is preferred that the signal acquisition transformation system 3 in the present embodiment is additionally operable to gather the temperature in crystal growing furnace 14.Specifically adopt Mode set can be:Signal acquisition transformation system block 3 is connected with temperature control system 4 to be acquired;Or signal acquisition becomes Change system 3 to be connected with temperature control system 4, to carry out data acquisition.
Embodiment 5
It is preferred that the present embodiment provides a kind of high polymer optics depolarization instrument, compared with above-described embodiment, such as Fig. 1 and Fig. 2 Shown, the high polymer optical polarization instrument in the present embodiment also includes a housing 5;Wherein, full-automatic closed loop light path detection, more Level control reponse system 2, the first transformation voltage-stablizer 61, the second transformation voltage-stablizer 62, temperature control system 4 are arranged at housing 5 It is interior.It is preferred that the length of housing 5 is 180-220mm, width 80-100mm, is highly 40-60mm.
Compared with prior art, the high polymer optics depolarization instrument that the present embodiment provides is by the way that full-automatic closed loop light path is examined Examining system, Multistage Control reponse system 2, the first transformation voltage-stablizer 61, the second transformation voltage-stablizer 62 and melting furnace 7 are arranged at shell In body 5, while reduction optics depolarization instrument volume is realized, the structural compactness of optics depolarization instrument is further improved.
It is preferred that the signal acquisition transformation system in the embodiment of the present invention is used to gather from the first silicon photocell, second The heating-up temperature parameter of the electric signal parameter of silicon photocell, temperature control system control crystal growing furnace, and can by electric signal parameter plus Hot temperature parameter is converted into data signal, and transmits to computer, with the special purpose computer running software of autonomous Design, Draw high polymer sample crystallization data and curve.Correspondingly, the sample crystallization data in the embodiment of the present invention include depolarization light By force the curve to the time, during different isothermal crystals isothermal crystal parameter (To t isothermal crystal curve), half Crystallization time (1/t1/2To T curve), crystallization rate constant and A Fu rummies index (To logt A Fula Rice index map).
Embodiment 6
On the one hand, the high polymer optics depolarization instrument provided using above-described embodiment is mainly discussed in detail in the present embodiment The principle of the crystallization rate of high polymer is measured, it is specific as follows:
As depicted in figs. 1 and 2, after the filtered colour filter of chip architecture 12 of light that signal optical source 11 is sent, then by polarizer 13 Become polarised light, polarised light is radiated on high polymer sample by the through hole on crystal growing furnace 14.When high polymer sample starts to crystallize When, in high polymer sample birefringent phenomenon occurs for incident light, and a part of light from high polymer sample out is through semi-transparent semi-reflecting Mirror 17 is penetrated to reflex on the second silicon photocell 15.Another part light passes through semi-permeable and semi-reflecting mirror 17, is shone after the decomposition of analyzer 18 It is incident upon on the first silicon photocell 16.Wherein, the first silicon photocell 16 converts optical signals into the first electric signal.Signal acquisition converts System 3 electrically connects with the first silicon photocell 16, can be by digital data transmission extremely for the first electric signal to be converted into data signal Computer 31, so that the professional software 32 on computer 31 draws high polymer sample crystallization speed data.
After high polymer starts crystallization, because crystalline phase and amorphous phase have different refractive indexes, thus have at the interface of two-phase scattered Light generation is penetrated, with the progress of crystallization process, the transparency of sample constantly declines, and empirical curve is occurred with actual crystallization situation Deviation.Second electric signal is converted optical signals into by the second silicon photocell 15;Including in Multistage Control reponse system is high-power Compensation circuit 21;According to the second electric signal compared with reference voltage, light-source brightness regulation 22 is carried out according to comparative result, with control The luminous intensity of signal optical source 11, and indicate light source voltage instruction 23.Light source is automatically raised by light source voltage adjustment circuit Voltage, the light intensity through sample in crystallization process is linearly lifted from beginning to end, reduce the error of experiment, it is ensured that instrument The stability of device measurement and the accuracy for obtaining data
In addition, the temperature control system that above-described embodiment provides includes the first temperature controller 41 and second temperature controls Device;First temperature controller 41 is used to control the temperature in crystal growing furnace 14.Second temperature controller is used to control in melting furnace 7 Temperature
In addition, high polymer optics depolarization instrument in the present embodiment is by the first transformation voltage-stablizer 61 in power-supply system, For providing 36v DC voltage to crystal growing furnace 14, melting furnace 7, computer 31, display 33 and printer 34.Second transformation Voltage-stablizer 62 is used for the DC voltage that 12V is provided to Multistage Control reponse system, capture card 3 (capture card 3 includes trimming circuit).
On the other hand, the high polymer optics depolarization instrument provided using above-described embodiment measures the crystallization rate of high polymer When, concrete operation step is as follows:
First, start adjusts with instrument
1st, the power switch on high polymer optics depolarization instrument is opened.
It is preferred that the switch of the voltage-stabilized power supply on high polymer optics depolarization instrument is first opened, after voltage stabilization is 220V, It is separately turned on computer, the power switch and high-voltage switch gear of high polymer optics depolarization instrument.
2nd, the temperature control system on high polymer depolarization instrument is opened, the temperature in crystal growing furnace is maintained the first setting temperature Degree (for example, the first design temperature is 120 ± 0.1 DEG C).
3rd, the temperature of melting furnace is made to be maintained at the second design temperature (for example, the second design temperature is 280 DEG C).
4th, the signal optical source switch of high polymer optics depolarization instrument is opened, regulation reference voltage knob makes the first of signal optical source Beginning voltage-regulation such as in the range of 1v~3v, and makes in high polymer sample in the different magnitudes of voltage needed for different experiment materials In product crystallization process, voltage has the compensation range of certain amplitude.
2nd, sample preparation
1st, a cover glass is put into the sample preparation spoon of melting furnace, then puts a piece of centre on the cover slip and cut foraminate aluminium Paper tinsel is (it is preferred that a diameter of 5mm of aperture;O.1mm the thickness of aluminium foil is).
2nd, appropriate high polymer sample is cut with blade to be put into aluminium foil hole, then lid lastblock cover glass;Treat high polymer sample It is about thin slice O.1mm to be pressed into thickness with sample preparation depression bar after product softening.
3rd, sample after the melting time is set (setting time 30s) on melting furnace, the sample of constant temperature is moved into immediately Spoon, it is sent into crystal growing furnace.
3rd, test and record
1st, record the time after high polymer sample is pushed into crystal growing furnace, as the initial time of crystallization initiation time, pass through immediately Luminous intensity is I0
2nd, after high polymer sample crystallization starts, light intensity constantly increases, and to the last light intensity tends to be constant, is through light intensity For I.So as to obtain depolarization light intensity-time curve.
3rd, change the temperature of crystal growing furnace, by aforesaid operations step, separately take high polymer sample to carry out other temperature (e.g., respectively 122.5 DEG C, 125 DEG C, 127.5 DEG C, 130 DEG C) isothermal crystal curve.
To sum up, high polymer optics depolarization instrument provided in an embodiment of the present invention substitutes prior art by using silicon photocell Photomultiplier in optics depolarization instrument, compared with the larger photomultiplier of volume, silicon photocell small volume, so that from The volume of optics depolarization instrument is reduced on the whole.In addition, silicon photocell also has, stability is good, anticorrosion, durable and The advantages that pollution-free, so as to improve the measurement performance and environmental-protecting performance of the high polymer optics depolarization instrument of the embodiment of the present invention.Together When, on the high polymer optics depolarization instrument of the embodiment of the present invention by by full-automatic closed loop light path detection, Multistage Control Reponse system 2, the first transformation voltage-stablizer, the second transformation voltage-stablizer and melting furnace are arranged in housing, reduce high gather realizing While object light depolarization instrument volume, moreover it is possible to further improve the structural compactness of high polymer optics depolarization instrument.
To sum up, it will be readily appreciated by those skilled in the art that on the premise of not conflicting, above-mentioned each advantageous manner can be certainly Combined, be superimposed by ground.
The above described is only a preferred embodiment of the present invention, any formal limitation not is made to the present invention, according to Any simple modification, equivalent change and modification made according to the technical spirit of the present invention to above example, still falls within this hair In the range of bright technical scheme.

Claims (10)

1. a kind of high polymer optics depolarization instrument, it is characterised in that the high polymer optics depolarization instrument includes:
Full-automatic closed loop light path detection, the full-automatic closed loop light path detection include signal optical source, colour filter chip architecture, Polarizer, crystal growing furnace, semi-transparent semi-reflecting lens, the first silicon photocell and the second silicon photocell;Wherein, the signal optical source is sent After filtered of light, polarizer, expose in the crystal growing furnace on high polymer sample, and transmitted through the transmitted light of high polymer sample By the semi-transparent semi-reflecting lens;First silicon photocell is used to the optical signal transmitted through the semi-transparent semi-reflecting lens being converted into the One electric signal;Second silicon photocell is used to the optical signal reflected through the semi-transparent semi-reflecting lens being converted into the second electric signal;
Signal acquisition transformation system, the signal acquisition transformation system electrically connect with first silicon photocell, for by described in First electric signal is converted into data signal, can be by digital data transmission to computer, so that computer professional software draws high gather Thing sample crystallization speed data;
Multistage Control reponse system, the Multistage Control reponse system are connected with second silicon photocell, light source, are used for respectively The second electric signal power is automatically adjusted, controls the luminous intensity of the signal optical source.
2. high polymer optics depolarization instrument according to claim 1, it is characterised in that the high polymer optical polarization instrument is also Including a housing;Wherein, the full-automatic closed loop light path detection, signal acquisition transformation system, Multistage Control reponse system It is arranged in the housing;
Preferably, the length of the housing is 180-220mm, width 80-100mm, is highly 40-60mm.
3. high polymer optics depolarization instrument according to claim 1, it is characterised in that the colour filter chip architecture is filtered by two panels Color chips bonding forms;Wherein, the external diameter of the colour filter is 10mm ± 0.1mm, thickness 1.5mm ± 0.1mm of the colour filter.
4. high polymer optics depolarization light according to claim 1, it is characterised in that the Multistage Control reponse system bag Include high-power compensation circuit;Wherein,
The high-power compensation circuit is connected with second silicon photocell, signal optical source, and according to second electric signal with Reference voltage compares, to automatically control the luminous intensity of the signal optical source.
5. high polymer optics depolarization instrument according to claim 1, it is characterised in that the crystal growing furnace includes being oppositely arranged The first sidepiece and the second sidepiece;Wherein, through hole is provided with the center of first sidepiece and the second sidepiece, for making polarization The high polymer sample that energy transmissive is crossed in crystal growing furnace.
6. high polymer optics depolarization instrument according to claim 5, it is characterised in that the straight warp of the through hole is 2.5mm- 3.0mm。
7. high polymer optics depolarization instrument according to claim 2, it is characterised in that the high polymer optics depolarization instrument Also include power-supply system, wherein the power-supply system includes:
First transformation voltage-stablizer, the first transformation voltage-stablizer are connected with exchange 220v power supplys, for being provided to the crystal growing furnace First voltage;Preferably, the first voltage is direct current 36v;
Second transformation voltage-stablizer, the second transformation voltage-stablizer exchange 220v power supply connections, for the signal optical source, multistage Reponse system is controlled to provide second voltage;Preferably, the second voltage is direct current 12v;
Wherein, the first transformation voltage-stablizer, the second transformation voltage-stablizer are arranged in the housing.
8. optics depolarization instrument according to claim 2, it is characterised in that the optics depolarization instrument also includes temperature control System processed, wherein, the temperature control system is connected with the crystal growing furnace, to control the heating-up temperature of the crystal growing furnace.
9. high polymer optics solution depolarization instrument according to claim 1, it is characterised in that the signal acquisition transformation system Including multi pass acquisition card.
10. high polymer optics depolarization instrument according to claim 8, it is characterised in that the signal acquisition transformation system For gathering from the first silicon photocell, the electric signal parameter of the second silicon photocell, temperature control system control crystal growing furnace Heating-up temperature parameter, and electric signal parameter, heating-up temperature Parameter Switch can be transmitted to computer into data signal, Under being run in computer software, high polymer sample crystallization speed data and curve are drawn;
Wherein, the high polymer sample crystallization speed data and curve include curve, the different isothermals depolarization light intensity to the time Isothermal crystal parameter, flexible chain, crystallization rate constant and A Fu rummy indexes in crystallization process.
CN201711098593.XA 2017-11-09 2017-11-09 A kind of high polymer optics depolarization instrument Pending CN107764746A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711098593.XA CN107764746A (en) 2017-11-09 2017-11-09 A kind of high polymer optics depolarization instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711098593.XA CN107764746A (en) 2017-11-09 2017-11-09 A kind of high polymer optics depolarization instrument

Publications (1)

Publication Number Publication Date
CN107764746A true CN107764746A (en) 2018-03-06

Family

ID=61272309

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711098593.XA Pending CN107764746A (en) 2017-11-09 2017-11-09 A kind of high polymer optics depolarization instrument

Country Status (1)

Country Link
CN (1) CN107764746A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111610149A (en) * 2020-06-10 2020-09-01 上海乾勃仪器仪表有限公司 Crystallization melting furnace and high polymer optical polarization-resolving instrument

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2413280Y (en) * 2000-02-15 2001-01-03 苏州市光华电测技术研究所 Cotton fibre maturity polarization testing device
CN2695956Y (en) * 2004-05-28 2005-04-27 张志杰 Device for investigating maturity of cotton fibre
CN102692753A (en) * 2012-05-24 2012-09-26 宁波大学 Device and method for controlling intermediate state of polymer dispersed liquid crystal
JP2012208486A (en) * 2011-03-11 2012-10-25 Citizen Holdings Co Ltd Optical element, microscope equipped with optical element and method for assembly of optical element
CN106124416A (en) * 2016-07-14 2016-11-16 上海仪电物理光学仪器有限公司 The automatic polarimeter of manipulator without faraday based on silicon cell
CN208313807U (en) * 2017-11-09 2019-01-01 上海凯历迪新材料科技股份有限公司 A kind of high polymer optics depolarization instrument

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2413280Y (en) * 2000-02-15 2001-01-03 苏州市光华电测技术研究所 Cotton fibre maturity polarization testing device
CN2695956Y (en) * 2004-05-28 2005-04-27 张志杰 Device for investigating maturity of cotton fibre
JP2012208486A (en) * 2011-03-11 2012-10-25 Citizen Holdings Co Ltd Optical element, microscope equipped with optical element and method for assembly of optical element
CN102692753A (en) * 2012-05-24 2012-09-26 宁波大学 Device and method for controlling intermediate state of polymer dispersed liquid crystal
CN106124416A (en) * 2016-07-14 2016-11-16 上海仪电物理光学仪器有限公司 The automatic polarimeter of manipulator without faraday based on silicon cell
CN208313807U (en) * 2017-11-09 2019-01-01 上海凯历迪新材料科技股份有限公司 A kind of high polymer optics depolarization instrument

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
徐振淼 等: "光学解偏振法测定高聚物的结晶速度", 高分子通讯, no. 3, 30 June 1979 (1979-06-30), pages 129 - 134 *
李思滔: "解偏振光法测定装置的改进及高聚物结晶速度的测定", 分析测试通报, vol. 8, no. 02, 30 April 1989 (1989-04-30), pages 10 - 13 *
杜西亮;戴景民;: "光栅分振幅光偏振测量系统的研制", 光电工程, no. 07, 28 July 2006 (2006-07-28), pages 90 - 92 *
王铁, 曹明翠, 罗风光: "全光学偏振控制器", 半导体光电, no. 06, 30 December 2001 (2001-12-30) *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111610149A (en) * 2020-06-10 2020-09-01 上海乾勃仪器仪表有限公司 Crystallization melting furnace and high polymer optical polarization-resolving instrument

Similar Documents

Publication Publication Date Title
CN105391919A (en) camera having light emitting devices and method for imaging skin
CN107764746A (en) A kind of high polymer optics depolarization instrument
CN207163945U (en) Also retract rate measurement apparatus
CN208313807U (en) A kind of high polymer optics depolarization instrument
Ross et al. Quantitative image analysis of birefringent biological material
CN104535232A (en) Device and method for testing stress of infrared optical material
CN204255542U (en) A kind of infrared optical material stress test device
CN205374301U (en) Measure device of solution strength
CN207133552U (en) A kind of smooth alignment apparatus
CN105651732B (en) Extra electric field and the lower method for measuring liquid refractivity of temperature field synergistic effect
CN206470038U (en) A kind of test device of all-fiber current transformator reflectance of reflector stability
CN210604415U (en) Jadeite egg surface transparency effect grading instrument
CN108489629A (en) A kind of solution saturation temperature self-operated measuring unit and measurement method
JP2576781B2 (en) Method and apparatus for measuring cell gap of birefringent body
CN207457059U (en) A kind of observation device for examining mark liquid in pipe character
CN206818386U (en) Optoisolator test system
CN110487839A (en) Image method fuse salt melting point apparatus
CN117079618B (en) LED liquid crystal display screen brightness correction method and system
CN219891482U (en) Intelligent and practical background adjusting device
CN219266084U (en) Oil color measuring device based on Sibort color
Palarie et al. A new version of the Chang method for the determination of the optical birefringence of nematic liquid crystals
CN202012819U (en) Standard plane light source designed based on light-emitting diode (LED)
CN212903665U (en) Tension testing device for high-precision optical fiber coupling area
CN212871678U (en) Lens stress detector
RU2806195C1 (en) Photoelectric method for measuring the refractive index and average dispersion of motor fuels and device for its implementation

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination