CN107758610A - A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching - Google Patents

A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching Download PDF

Info

Publication number
CN107758610A
CN107758610A CN201710960835.5A CN201710960835A CN107758610A CN 107758610 A CN107758610 A CN 107758610A CN 201710960835 A CN201710960835 A CN 201710960835A CN 107758610 A CN107758610 A CN 107758610A
Authority
CN
China
Prior art keywords
ion beam
small size
array
polystyrene nanospheres
beam etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710960835.5A
Other languages
Chinese (zh)
Inventor
杨杰
杨宇
王荣飞
张明灵
兰栩
翁小康
王茺
邱锋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yunnan University YNU
Original Assignee
Yunnan University YNU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yunnan University YNU filed Critical Yunnan University YNU
Priority to CN201710960835.5A priority Critical patent/CN107758610A/en
Publication of CN107758610A publication Critical patent/CN107758610A/en
Pending legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82BNANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
    • B82B3/00Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
    • B82B3/0009Forming specific nanostructures
    • B82B3/0014Array or network of similar nanostructural elements
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y30/00Nanotechnology for materials or surface science, e.g. nanocomposites
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y40/00Manufacture or treatment of nanostructures

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Composite Materials (AREA)
  • Materials Engineering (AREA)
  • Drying Of Semiconductors (AREA)
  • Weting (AREA)
  • ing And Chemical Polishing (AREA)

Abstract

The present invention is ordered into the preparation method of silicon nanowire array, belongs to Fabrication Techniques of Nano-Structure field.First individual layer polystyrene nanospheres array is obtained in Si substrate surface solid matters, then ion beam etching technology is utilized, using argon gas as working gas, ar-ion beam vertical etch polystyrene nanospheres, line is 3 ~ 10 mA, line voltage is 0.5 ~ 1.1 KV, and etch period etches the nm polystyrene nanospheres of diameter 100 under conditions of being 60 ~ 550 s, obtains the polystyrene nanospheres array mould plate of period distances.By adjusting the regulation and control of line, beam pressure and etch period realization to polystyrene nanospheres size.Then evaporation golden film and ultrasound removal polystyrene nanospheres, use metal Assisted Chemical Etching Process method to prepare ordered silicon nano-wires array of the average diameter range for 50 ~ 81 nm, the height of nano wire is controlled by etch period.The present invention is a kind of low cost, the preparation method of simple, the efficient small size Si nano-wire arrays in order of technique.

Description

A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching
Technical field
The present invention relates to a kind of method that ordered silicon nano-wires array is prepared based on ion beam etching, belong to nano material system Standby technical field.
Background technology
Because silicon nanowires has excellent optics antireflection characteristic and sunken luminous effect, and the modification of good surface and life Thing compatibility, has been applied in solar cell and biology sensor.The silicon nanowire array of aligned orderly and size uniform, It is the favourable guarantee of device performance stable operation.Therefore, people prepare ordered silicon nano-wires using various templates etching silicon chip Array.The template used now mainly has:Aluminum oxide(AAO)Template, nanometer ball template and Lithographic template.Compared to aluminum oxide (AAO)Template and Lithographic template, nanometer ball template have the advantages of inexpensive high production.And the lithographic method of silicon chip be divided into it is dry Method etches and wet etching.Because wet etching does not need expensive etching apparatus, favored by people.Therefore, nanosphere Template combination wet etching method, which turns into, to be reduced ordered silicon nano-wires array production cost, simplifies technique, accelerates popularization and application Major technique.
Nanometer ball template is the key for preparing ordered silicon nano-wires array, and it decides size and the week of silicon nanowire array Phase.The technology of preparing of nanometer ball template mainly has plasma etching and reactive ion etching at present.Patent (CN201210142182.7)Using plasma cleaning machine etches double-deck polystyrene nanospheres and obtained initially under an argon Template, after annealing is then infiltrated in ferric nitrate and obtains di-iron trioxide secondary template, orderly silicon is etched after redeposited golden film Nano-wire array.Plasma etching technology belongs to chemical reaction etching, has the advantages of etch rate is fast, but due to transverse direction Undercutting acts on, there is also etching precision it is low the shortcomings that, be used for the polystyrene nanospheres for etching more than 500 nanometers of diameter, nothing Method obtains small size ordered silicon nano-wires array.Plasma washing machine can only adjust etch period, can not adjust etch rate, It is difficult to effectively control etching effect.Patent(CN200610089728.1)Using reactive ion etching technology(RIE)In oxygen atmosphere Under prepare the polystyrene nanospheres templates of period distances, reuse silver-colored Assisted Chemical Etching Process and go out ordered silicon nano-wires battle array Row.Reactive ion etching is that one kind combines chemical reaction etching and physical etchings method, and etching precision is carved better than plasma Erosion technology.But when the polystyrene nanospheres of 200 nanometers of diameter are etched into 50 nanometers, due to chemical reaction etching Horizontal undercutting, the shape of nanosphere become irregular, are unfavorable for preparing small size ordered silicon nano-wires array.In addition, reacting In ion etching, the density and energy of reactive ion can not independent control, be unfavorable for efficiently controllable etching.
Based on above two method, preparing ordered silicon nano-wires array of the size less than 100 nanometers becomes extremely difficult.Cause How simply this, efficiently reduce silicon nanowires size, increase etching precision, it is to prepare ordered silicon nano-wires to improve controllability Array urgent problem, and improve ordered silicon nano-wires array performance and increase the basis of its application potentiality.
By literature search, have no and disclose report with identical of the present invention.
The content of the invention
It is an object of the invention to provide a kind of low cost, the orderly small size silicon nanowires that technique is simple, efficiently controllable The preparation method of array.Compact arranged polystyrene nanospheres array is bombarded using ion beam etching technology, reduces nanosphere Diameter, obtaining has the nanometer ball templates of period distances, then using metal Assisted Chemical Etching Process method, it is orderly to prepare small size Silicon nanowire array.
The present invention uses following technical scheme:The individual layer polystyrene that 100 nanometers of diameter is first prepared in Si substrate surfaces is received Rice ball array, the substrate for sequencing nanometer ball array is dried, is put into ion beam etching vacuum chamber.Adjustment ion beam vertically bombards Polystyrene nanospheres array on Si substrates, that is, allow ion beam line incident direction and substrate normal angle be 0 °.With High-purity argon gas is working gas, and base vacuum is 2.0 × 10-4 Pa ~3.0×10-4 Pa.Discharge voltage is the V of 70 V ~ 80, beam Stream voltage is the KV of 0.5 KV ~ 1.1, and accelerating potential is the V of 100 V ~ 200, and line is the mA of 3 mA ~ 10, bombardment time be 60 s ~ Compact arranged polystyrene nanospheres array is etched under conditions of 550 s, so as to obtain the nanosphere mould of period distances Plate;Then 20 ~ 30 nano gold layers are grown using ion sputtering process, ultrasound removes pipe/polyhenylethylene nano in tetrahydrofuran solution Ball;Finally use hydrofluoric acid and hydrogen peroxide(Volume ratio is 4:1)Mixed solution, covered using metal inducement lithographic technique corrosion gold Silicon under lid, form the identical ordered silicon nano-wires array of the polystyrene nanospheres size gone out with Ar Ion Beam Etching, its height The time control etched by metal inducement.
First, in the scheme individual layer polystyrene nanospheres film preparation, concretely comprise the following steps:
(1), selection crystal orientation for(100)Si substrates and common slide, carry out ultrasonic vibration respectively using acetone and alcohol 5 min are cleaned, with deionized water rinsing 3 times;Then substrate is put into sulfuric acid and hydrogen peroxide(Volume ratio is 4:1)Mixing it is molten 10 min are boiled in liquid, use deionized water rinsing 3 times;Finally by Si substrates in hydrofluoric acid and hydrogen peroxide(Volume ratio is 1: 10)Mixed solution in soak 30 s, with deionized water rinsing 3 times;
(2), purchase polystyrene nanospheres be 2.5 wt%(Mass concentration), it is a diameter of 100 nanometers, by pipe/polyhenylethylene nano Ball solution and methanol solution are well mixed according to the ratio that volume ratio is 1: 1, then mixed by 40 microlitres using micro syringe Close solution to drop on slide, allow mixed liquor to flow slowly into deionized water;Surfactant is added, nanosphere film forming is stable Afterwards, deionized water is slowly excluded, obtains the compact arranged individual layer polystyrene nanospheres array of two-dimensional hexagonal on si substrates.
2nd, the nanometer ball template for there are period distances is prepared in the scheme using ion beam etching technology, is concretely comprised the following steps:
(1), the Si substrates for being covered with polystyrene nanospheres array are put into vacuum chamber, adjustment ion beam vertically bombards Si substrates On polystyrene nanospheres array, that is, allow ion beam line incident direction and substrate normal angle be 0 °.
(2), treat vacuum chamber background vacuum be 2.0 × 10-4 Pa ~3.0×10-4 Pa, pour the argon gas that purity is 5N and make For working gas, adjustment work pressure is 2.0 × 10-2 Pa~3.0×10-2 Pa;
(3), regulation discharge voltage be the V of 70 V ~ 80, line voltage is the KV of 0.5 KV ~ 1.1, and accelerating potential is 100 V ~ 200 V, ion beam current are the mA of 3 mA ~ 10, and etch period is the s of 60 s ~ 550.
3rd, ordered silicon nano-wires array is prepared using metal Assisted Chemical Etching Process in the scheme, concretely comprised the following steps:
(1), using ion sputtering process, deposit thickness is 20 ~ 30 nanometers of gold on the nanometer ball template for have period distances;
(2), using be cleaned by ultrasonic instrument nanometer ball template is removed in tetrahydrofuran solution;
(3), hydrofluoric acid and mixed solution of hydrogen peroxide etching silicon chip, prepare small size ordered silicon nano-wires array.
The present invention has following advantages compared with prior art:Ion beam etching technology belongs to physical etchings method, has Fabulous etching resolution ratio, superfinishing fining-off can be carried out;And ion beam etching technology intermediate ion density and ion energy can be with It is separately adjustable, it is to realize efficiently controlled etched condition.Using such scheme, received when polystyrene nanospheres diameter is reduced to 50 Meter Shi, nanosphere remain in that the spherical of rule, can prepare the ordered silicon nano-wires array of small size and size uniform, be A kind of low cost, the method for simple, the efficient orderly small size silicon nanowire array of controllable preparation of technique.
Brief description of the drawings
The present invention is further described with the example of implementation below in conjunction with the accompanying drawings.
Fig. 1 is the scanning electron microscope diagram of the individual layer polystyrene nanospheres array of two-dimensional hexagonal solid matter;
Fig. 2 be ion beam etching after the nanometer ball template for having period distances scanning electron microscope diagram;
Fig. 3 is the scanning electron microscope diagram of the orderly small size Si nano-wire arrays obtained after metal Assisted Chemical Etching Process.
Embodiment
Embodiment 1:
(1)The typesetting of individual layer pipe/polyhenylethylene nano bead
A, select crystal orientation for(100)P-type Si substrates and slide, be cleaned by ultrasonic 3 times successively with acetone and alcohol, every time 5 Min, with deionized water rinsing 3 times;Then they are used into H2SO4:H2O2=4:1 solution boils 10 min, is rushed with deionized water Wash 3 times;Finally by Si substrates HF:H2O=1:10 solution soaks 30 s, with deionized water rinsing 3 times;
B, by polystyrene nanospheres solution and methanol solution according to volume ratio 1:1 ratio is well mixed, then with micro note Emitter flows slowly into 40 microlitres of mixed solutions in deionized water along slide;Surfactant is added, nanosphere film forming is stable Afterwards, deionized water is slowly excluded, obtains the compact arranged individual layer polystyrene nanospheres array of two-dimensional hexagonal on si substrates. (as shown in Figure 1);
(2)Ion beam etching technology prepares the polystyrene nanospheres template for having period distances:
A, the silicon base that row there are polystyrene nanospheres is put into ion beam etching room, adjusts substrate position and ion beam incidence Direction is vertical, and it is 3.0 × 10 to treat background vacuum-4Pa, is then filled with the argon gas of purity to intracavitary, and adjustment work pressure is 2.0 ×10-2Pa;
B, at room temperature, discharge voltage is 70 V, and line voltage is 1 KV, and accelerating potential is 100 V, and ion current is 3 mA, Etch period uses ion beam etching polystyrene nanospheres under conditions of being 550 s.
The sample detection result of the present embodiment is as shown in Figure 2.The average diameter of polystyrene nanospheres in figure reduces For 50 nanometers, the polystyrene nanospheres template for there are period distances is obtained.
(3)Metal Assisted Chemical Etching Process prepares ordered silicon nano-wires array
A, the nanometer ball template for there are period distances is put into gold-plated film in ion sputtering instrument equipment, power is 30 mW, and vacuum is 0.1 Pa, golden film thick 20 nm of growth;
B, the nanometer ball template for being coated with golden film is put into ultrasound in tetrahydrofuran solution and removes nanosphere;
C, in HF:H2O2=4:1(Volume ratio)Mixed liquor in etch 120 s, finally remove remaining golden film, obtain in order Si nano-wire arrays.
As shown in Figure 3, the average diameter of Si nano wires is 50 to the orderly Si nano-wire arrays that the present embodiment is prepared Nanometer.
Embodiment 2:
Similar to Example 1, difference is that the line of ion beam etching is 3 mA, and background vacuum is 2.0 × 10-4 Pa, etch period are 300 s.The average diameter for obtaining Si nano wires is 81 nanometers.
Embodiment 3:
Similar to Example 1, difference is that the line of ion beam etching is 10 mA, and operating pressure is 3.0 × 10-2Pa, The KV of line voltage 1.1, etch period are 60 s.The average diameter for obtaining Si nano wires is 73 nanometers.
Embodiment 4:
Similar to Example 1, difference is the V of discharge voltage 80 of ion beam etching, the KV of line voltage 0. 5, during etching Between be 450 s, obtain Si nano wires average diameter be 75 nanometers.
Embodiment 5:
Similar to Example 1, difference is that the accelerating potential of ion beam etching is 200 V, obtains being averaged for Si nano wires A diameter of 56 nanometers.
Embodiment 6:
Similar to Example 1, difference is the KV of line voltage 0.7 of ion beam etching, obtains the average straight of Si nano wires Footpath is 69 nanometers.

Claims (6)

  1. A kind of 1. method that orderly small size silicon nanowire array is prepared based on ion beam etching, it is characterised in that:It is included in Si Solid matter polystyrene nanospheres, preparation nanometer ball template and etching silicon nano line array step on substrate;It is specific as follows:Background is true Sky is 2 × 10-4 Pa ~ 3×10-4 Pa, operating pressure are 2 × 10-2 Pa~3×10-2 Pa, discharge voltage are the V bars of 70 V ~ 80 Caused Ar ion beam currents under part, the polystyrene nanospheres of solid matter on Si substrates are etched, obtain the nanosphere mould of period distances Plate, and metal Assisted Chemical Etching Process technology is used, obtain the orderly small size silicon nanowire array that average diameter is 50 ~ 81 nm.
  2. A kind of 2. method that orderly small size silicon nanowire array is prepared based on ion beam etching, it is characterised in that:On Si substrates The polystyrene nanospheres of solid matter are individual layer, a diameter of 100 nm.
  3. 3. a kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching according to claim 1, It is characterized in that:Nanometer mean diameter of a ball is 50-81 nm in the nanometer ball template of the period distances of acquisition.
  4. 4. a kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching according to claim 1, It is characterized in that when preparing nanometer ball template on si substrates and preparing, the line incident direction of Ar ion beams and the method wire clamp of substrate Angle is 0 °.
  5. 5. a kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching according to claim 1, It is characterized in that when preparing nanometer ball template on si substrates and preparing, Ar ion beam currents operating voltage is the KV of 0.5 KV ~ 1.1, is added Fast voltage is the V of 100 V ~ 200, and line is the mA of 3 mA ~ 10.
  6. 6. according to claim 1 prepare orderly small size silicon nanowires method based on ion beam etching, it is characterised in that When preparing nanometer ball template on si substrates and preparing, the Ar ion beam etching times are the s of 60 s ~ 550.
CN201710960835.5A 2017-10-17 2017-10-17 A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching Pending CN107758610A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710960835.5A CN107758610A (en) 2017-10-17 2017-10-17 A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710960835.5A CN107758610A (en) 2017-10-17 2017-10-17 A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching

Publications (1)

Publication Number Publication Date
CN107758610A true CN107758610A (en) 2018-03-06

Family

ID=61269572

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710960835.5A Pending CN107758610A (en) 2017-10-17 2017-10-17 A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching

Country Status (1)

Country Link
CN (1) CN107758610A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108373136A (en) * 2018-03-14 2018-08-07 云南大学 A kind of preparation method of the orderly polystyrene nanospheres template of non-solid matter

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102173376A (en) * 2011-02-25 2011-09-07 复旦大学 Preparation method for small silicon-based nano hollow array with orderly heights
CN102530845A (en) * 2012-02-14 2012-07-04 中国人民解放军国防科学技术大学 Method for preparing triangular metal nano-pore array
CN102633230A (en) * 2012-04-26 2012-08-15 厦门大学 Method for preparing silicon nano-pillar array based on nanosphere etching technology
CN103956395A (en) * 2014-05-09 2014-07-30 中国科学院宁波材料技术与工程研究所 Array structure fabric surface and preparing method and application thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102173376A (en) * 2011-02-25 2011-09-07 复旦大学 Preparation method for small silicon-based nano hollow array with orderly heights
CN102530845A (en) * 2012-02-14 2012-07-04 中国人民解放军国防科学技术大学 Method for preparing triangular metal nano-pore array
CN102633230A (en) * 2012-04-26 2012-08-15 厦门大学 Method for preparing silicon nano-pillar array based on nanosphere etching technology
CN103956395A (en) * 2014-05-09 2014-07-30 中国科学院宁波材料技术与工程研究所 Array structure fabric surface and preparing method and application thereof

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
达道安主编.: "《真空设计手册(第3版)》", 31 July 2004 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108373136A (en) * 2018-03-14 2018-08-07 云南大学 A kind of preparation method of the orderly polystyrene nanospheres template of non-solid matter

Similar Documents

Publication Publication Date Title
Li et al. Metal-assisted chemical etching for designable monocrystalline silicon nanostructure
CN1312034C (en) Process for preparing monocrystalline silicon nano line array with single axial arranging
CN102173376B (en) Preparation method for small silicon-based nano hollow array with orderly heights
CN101734611B (en) Method for preparing black silicon based on mask-free deep reactive ion etching
CN105189821B (en) The manufacture method of nanoscale structures and the nanoscale structures manufactured using this method
JP2011523902A (en) Process for manufacturing nanowire arrays
CN107244649A (en) The method that one step template prepares orderly ferroelectric nano lattice array
CN102560687B (en) Diamond nanometer pit array and preparation method thereof
CN102856165A (en) Method for simply preparing ordered V-shaped nanometer silicon pore array
CN104762593A (en) Method for preparing ordered germanium quantum dot on silicon substrate by sputtering
CN105405927A (en) Method for preparing ordered silicon nanocluster based on combination of nanosphere etching technology and ion beam sputtering technology
CN106298450B (en) A kind of nano patterned Sapphire Substrate and its preparation method and application
CN107758610A (en) A kind of method that orderly small size silicon nanowire array is prepared based on ion beam etching
CN106185792A (en) A kind of population parameter controllable method for preparing of super-hydrophobic micro-nano compound structure
CN102765695B (en) Method of manufacturing wafer-level low-dimensional nano-structure based on self-focusing of electrostatic field singular-point
CN104310304A (en) Preparation method of nano column array with controllable size and surface structure
CN104724664A (en) Preparation method and application of monocrystal diamond nano-pillar array structure
CN102779747A (en) Machining method of nano column/needle forest structure
CN109087837A (en) A kind of preparation method of streak camera photocathode
CN102856434B (en) Preparation method for square silicon nano-porous array
CN111362225A (en) Nano needle tip structure, composite structure and preparation method thereof
CN109941959B (en) Manufacturing method of columnar coaxial circular ring nano structure
CN101759143A (en) Method for controlling growth of micro-nano pore structure on silicon surface
CN108373136A (en) A kind of preparation method of the orderly polystyrene nanospheres template of non-solid matter
Rao et al. Fabrication of 2D silicon nano-mold based on sidewall transfer

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20180306