CN107753045B - Scanning parameter determination method and system and X-ray scanning equipment - Google Patents
Scanning parameter determination method and system and X-ray scanning equipment Download PDFInfo
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- CN107753045B CN107753045B CN201610705070.6A CN201610705070A CN107753045B CN 107753045 B CN107753045 B CN 107753045B CN 201610705070 A CN201610705070 A CN 201610705070A CN 107753045 B CN107753045 B CN 107753045B
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/54—Control of apparatus or devices for radiation diagnosis
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment
- A61B6/40—Apparatus for radiation diagnosis, e.g. combined with radiation therapy equipment with arrangements for generating radiation specially adapted for radiation diagnosis
Abstract
The embodiment of the invention provides a scanning parameter determination method, a scanning parameter determination system and X-ray scanning equipment. The method comprises the following steps: acquiring a first input voltage when the X-ray scanning equipment scans under a first tube current condition and a second input voltage when the X-ray scanning equipment scans under a second tube current condition; calculating the current line impedance; comparing the current line impedance with a preset impedance threshold, and determining the configuration types of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment; and determining scanning parameters required by scanning according to the configuration types of the tube current and the scanning time length. The technical scheme in the embodiment of the invention can improve the applicability of the X-ray scanning equipment.
Description
Technical Field
The invention relates to the field of medical equipment, in particular to a scanning parameter determining method, a scanning parameter determining system and X-ray scanning equipment.
Background
When an X-ray scanning apparatus such as an X-ray Computed Tomography (CT) machine or an X-ray machine is used to perform X-ray scanning imaging on a human body, it is usually necessary to determine a set of scanning parameters related to scanning, for example, a scanning parameter set including a tube current (tube current for short), a scanning time period, and the like. Some applications also refer to the scan parameters as a "scan protocol" and initiate a formal scan check after the scan protocol is loaded.
In practical applications, in order to speed up a scanning process, a default scanning parameter is usually preset in a system before an X-ray scanning device leaves a factory, so that when a human body is scanned, the scanning parameter is directly used for scanning. However, in some application scenarios, for example, when the power supply voltage is unstable or the transformer is not equipped enough, such as the load is too much and the power of the transformer is small, the voltage input to the X-ray scanning device by the line may not meet the set requirement, which makes the system may not complete scanning according to the fixed set scanning parameters.
Disclosure of Invention
In view of this, embodiments of the present invention provide a method for determining scan parameters, and provide a system for determining scan parameters and an X-ray scanning apparatus, so as to improve the applicability of the X-ray scanning apparatus and make full use of the X-ray scanning apparatus.
The scanning parameter determining method provided by the embodiment of the invention comprises the following steps: acquiring a first input voltage when the X-ray scanning equipment scans under a first tube current condition and a second input voltage when the X-ray scanning equipment scans under a second tube current condition; wherein the first tube current is a determined lower value tube current and the second tube current is a determined higher value tube current; calculating the current line impedance according to the first tube current, the first input voltage, the second tube current and the second input voltage; comparing the current line impedance with a preset impedance threshold, and determining the configuration types of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment; and determining scanning parameters required by scanning according to the configuration types of the tube current and the scanning time length.
In one embodiment, the impedance threshold comprises a first threshold; determining the configuration types of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment correspondingly comprises the following steps: and when the current line impedance is larger than a preset first threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as the first configuration types of the low-value tube current and the high-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
In one embodiment, the determining the configuration type of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined corresponding to the X-ray scanning device further includes: and when the current line impedance is smaller than or equal to the first threshold, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
In one embodiment, the impedance threshold further comprises a second threshold; determining the configuration types of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment, further comprises: when the current line impedance is between a preset second threshold and the first threshold, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage; and when the current line impedance is smaller than the second threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of high-value tube current and low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
In one embodiment, the determining the scan parameters required for the scan according to the configuration types of the tube current and the scan duration includes: judging whether the tube current and the scanning time length in the default scanning parameters in the scanning protocol meet the configuration types of the determined tube current and the scanning time length, and if so, taking the default scanning parameters as the scanning parameters required by scanning; otherwise, according to the configuration types of the tube current and the scanning duration, the scanning parameters required by scanning are reselected.
In one embodiment, the acquiring a first input voltage when the X-ray scanning device performs scanning under a first tube current condition and a second input voltage when the X-ray scanning device performs scanning under a second tube current condition includes: when the X-ray scanning equipment is installed for the first time and/or in the daily quality inspection process of the X-ray scanning equipment, acquiring a first input voltage when the X-ray scanning equipment scans under the condition of a first tube current and a second input voltage when the X-ray scanning equipment scans under the condition of a second tube current; or when the X-ray scanning device performs dynamic scanning, acquiring a first input voltage when the X-ray scanning device performs scanning under a first tube current condition and a second input voltage when the X-ray scanning device performs scanning under a second tube current condition from the dynamic scanning data.
In one embodiment, the method further comprises: when the X-ray scanning equipment is installed for the first time, if the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the configuration type of the determined tube current and the determined scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters; and/or determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times during the daily quality inspection process of the X-ray scanning equipment and/or during the dynamic scanning of the X-ray scanning equipment; and when the variation trend reaches the required stable state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the determined configuration type of the tube current and the scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters.
In one embodiment, the method further comprises: determining the change trend of the line impedance according to the line impedance calculated in a preset time period or in a preset number of times; and selecting a period of time when the variation trend reaches the required steady state to perform scanning imaging according to the variation trend.
The scanning parameter determination system provided in the embodiment of the present invention includes: the input voltage acquisition module is used for acquiring a first input voltage when the X-ray scanning equipment scans under a first tube current condition and a second input voltage when the X-ray scanning equipment scans under a second tube current condition; wherein the first tube current is a determined lower value tube current and the second tube current is a determined higher value tube current; the circuit impedance calculation module is used for calculating the current circuit impedance according to the first tube current, the first input voltage, the second tube current and the second input voltage; the configuration type determining module is used for comparing the current line impedance with a preset impedance threshold value and determining the configuration types of the tube current and the scanning time length in the scanning parameters according to the comparison result and the capability relation between the tube current and the line impedance determined by the X-ray scanning equipment; and the parameter determining module is used for determining scanning parameters required by scanning according to the configuration types of the tube current and the scanning time length.
In one embodiment, the impedance threshold comprises a first threshold; and the configuration type determining module is used for determining the configuration type of the tube current and the scanning time length in the scanning parameters as the first configuration type of the low-value tube current and the high-value scanning time length according to the capability relation between the tube current and the line impedance determined by the X-ray scanning equipment and the required scanning dosage when the current line impedance is greater than a preset first threshold.
In an embodiment, the configuration type determining module is further configured to determine, when the current line impedance is less than or equal to the first threshold, a configuration type of the tube current and the scan duration in the scan parameter as a second configuration type of the median tube current and the median scan duration according to a capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning device and a required scan dose.
In one embodiment, the impedance threshold further comprises a second threshold; the configuration type determining module is further configured to determine, when the current line impedance is between a second preset threshold and the first threshold, a second configuration type in which the configuration types of the tube current and the scanning time duration in the scanning parameters are the median tube current and the median scanning time duration according to a capability relationship between the tube current and the line impedance determined by the X-ray scanning device and a required scanning dose; and when the current line impedance is smaller than the second threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of high-value tube current and low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
In one embodiment, the parameter determining module is configured to determine whether a tube current and a scan duration in a default scan parameter in a scan protocol satisfy a determined configuration type of the tube current and the scan duration, and if so, take the default scan parameter as a scan parameter required for scanning; otherwise, according to the configuration types of the tube current and the scanning duration, the scanning parameters required by scanning are reselected.
In one embodiment, the input voltage acquiring module is configured to acquire a first input voltage when the X-ray scanning device scans under a first tube current condition and a second input voltage when the X-ray scanning device scans under a second tube current condition when the X-ray scanning device is installed for the first time and/or during daily quality inspection of the X-ray scanning device; or, the input voltage obtaining module is configured to obtain, from the dynamic scanning data, a first input voltage when the X-ray scanning device performs scanning under a first tube current condition and a second input voltage when the X-ray scanning device performs scanning under a second tube current condition when the X-ray scanning device performs dynamic scanning.
In one embodiment, the system further comprises: a default scanning parameter management module, configured to, when the X-ray scanning device is installed for the first time, store, as a default scanning parameter, a scanning parameter required for scanning that is reselected if a tube current and a scanning duration in a default scanning parameter in a scanning protocol do not satisfy a configuration type of the determined tube current and the determined scanning duration; and/or determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times during the daily quality inspection process of the X-ray scanning equipment and/or during the dynamic scanning of the X-ray scanning equipment; and when the variation trend reaches the required stable state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the determined configuration type of the tube current and the scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters.
In one embodiment, the system further comprises: the data analysis module is used for determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times; and recommending and selecting a period of time when the variation trend reaches the required steady state for scanning and imaging according to the variation trend.
The invention provides an X-ray scanning device, comprising: the scan parameter determination system of any of the implementations described above.
It can be seen from the above solutions that, in the embodiments of the present invention, by measuring the line impedance, and according to the line impedance threshold and the configuration types of different tube currents and scanning durations determined corresponding to different line impedance intervals, the scan parameters that are most suitable for the hardware capability of the X-ray scanning device and the infrastructure of the user (for example, whether there is an enough transformer or not, whether the network power supply is stable, etc.) can be determined, thereby implementing adjustment of the scan parameters related to the hardware capability of the X-ray scanning device and the infrastructure of the user, enabling the X-ray scanning device to be adapted to more occasions, and improving the application flexibility of the X-ray scanning device.
In addition, by setting the second threshold and the third configuration type, the scanning efficiency of the X-ray scanning device can be optimized, and the throughput of the patient can be improved.
In addition, in the embodiment of the invention, the relevant parameters for measuring the linear impedance can be obtained when the X-ray scanning equipment is installed for the first time and/or in the daily quality inspection process of the X-ray scanning equipment, even when the X-ray scanning equipment performs dynamic scanning, so that the technical scheme of the application can be flexibly realized, and the application flexibility of the X-ray scanning equipment is improved.
In addition, the default scanning parameters are replaced as necessary, so that the use process of the X-ray scanning equipment is more convenient on one hand; and on the other hand, the inconvenience caused by frequent replacement is also avoided.
Finally, by analyzing the variation trend of the line impedance, the period of time that the variation trend reaches the required steady state can be selected for scanning and imaging, and the X-ray scanning equipment can be optimally used for scanning and imaging.
Drawings
The foregoing and other features and advantages of the invention will become more apparent to those skilled in the art to which the invention relates upon consideration of the following detailed description of a preferred embodiment of the invention with reference to the accompanying drawings, in which:
fig. 1 is an exemplary flowchart of a scan parameter determining method according to an embodiment of the present invention.
Fig. 2A and 2B are schematic diagrams of a circuit for measuring an input voltage according to an example of the present invention.
Fig. 3 is an exemplary block diagram of a scan information determination system according to an embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a control terminal of an X-ray scanning device in an embodiment of the present invention.
Wherein the reference numbers are as follows:
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail by referring to the following examples.
Fig. 1 is an exemplary flowchart of a scan parameter determining method according to an embodiment of the present invention. As shown in fig. 1, the method may include the steps of:
Fig. 2A and 2B show a schematic of a circuit for measuring an input voltage in an example of the present invention. As shown in FIG. 2A, the first tube current determined in this example is a negligibly small value current, when the first input voltage of the X-ray scanning device 20 measured using the AC power source AC with a voltage of U0 is U1. As shown in fig. 2B, the second tube current is determined to be a larger value current I in this example, and the first input voltage of the X-ray scanning apparatus 20 is measured to be U2.
This step 101 may be performed once when the X-ray scanning device is first installed and/or at each routine quality check of the X-ray scanning device. In both cases, step 101 is acquired while scanning independently of the X-ray human scan imaging.
Furthermore, when the X-ray scanning device performs a dynamic scan (such as a modulation scan), data of the dynamic scan may be acquired. In this case, step 101 does not need to perform a separate scan, but directly uses the dynamic scan data to obtain.
And 102, calculating the current line impedance according to the first tube current, the first input voltage, the second tube current and the second input voltage.
For the data measured in the example shown in fig. 2A and 2B, the current line impedance R can be calculated directly according to equation (1) in this step:
R＝(U1-U2)/I (1)
and 103, comparing the current line impedance with a preset impedance threshold, and determining the configuration types of the tube current and the scanning time length in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment.
In this step, corresponding to different X-ray scanning devices, according to the hardware capability of the X-ray scanning device, the capability relationship between the tube current and the line impedance can be obtained, which is generally an inverse proportional relationship. In addition, according to the hardware capability of the X-ray scanning device, an optimal impedance value range corresponding to the X-ray scanning device can be determined, and accordingly, at least one impedance threshold value can be obtained. For example, if a threshold is set, a first threshold corresponding to a higher impedance threshold may be obtained. If two thresholds are set, a first threshold corresponding to a higher impedance threshold and a second threshold corresponding to a lower impedance threshold may be obtained.
In addition, the product of the tube current and the scan duration can be determined based on the scan dose (typically expressed in milliamps seconds) required for the current scan.
For the above case where the first threshold and the second threshold are set, when the current line impedance calculated in step 102 is greater than the first threshold, it is known that the tube current at this time should be lower than the line impedance when the line impedance is less than or equal to the first threshold according to the capability relationship between the tube current and the line impedance, and accordingly, under the condition that the product of the tube current and the scanning time is not changed, the scanning time at this time should be longer than or equal to the first threshold time than the line impedance, and therefore, the configuration type of the tube current and the scanning time at this time may be the first configuration type of the low-value tube current and the high-value scanning time. Similarly, when the current line impedance calculated in step 102 is smaller than the second threshold, it is known that the current tube current should be higher than that when the line impedance is greater than or equal to the second threshold according to the capability relationship between the tube current and the line impedance, and accordingly, the scan duration should be shorter than that when the line impedance is greater than or equal to the second threshold under the condition that the product of the tube current and the scan duration is not changed, so that the configuration type of the current tube and the scan duration may be the third configuration type of the high-value tube current and the low-value scan duration. In contrast, when the present line impedance is between the second threshold and the first threshold, the type of configuration of the tube current and the scan duration at that time may be referred to as a second type of configuration of median tube current and median scan duration.
For the case where only the first threshold is set, the configuration types of the tube current and the scan duration when the current line impedance is less than or equal to the first threshold duration are collectively referred to as a second configuration type of the median tube current and the median scan duration.
In summary, the step 103 can include at least the following two cases:
case where only the first threshold value R1 is set: when the current line impedance R & gt, R1, determining the configuration type of the tube current and the scanning duration in the scanning parameters as a first configuration type of low-value tube current and high-value scanning duration according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage; and when the current line impedance R is less than or equal to R1, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
Case where the first threshold value R1 and the second threshold value R2 are set: when the current line impedance R & gt, R1, determining the configuration type of the tube current and the scanning duration in the scanning parameters as a first configuration type of low-value tube current and high-value scanning duration according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage; when the current line impedance is between a preset second threshold and the first threshold, namely R is greater than or equal to R2 and is less than or equal to R1, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relation between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dose; and when the current line impedance R < 2, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of a high-value tube current and a low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
And step 104, determining scanning parameters required by scanning according to the configuration types of the tube current and the scanning duration.
In this step, it may be determined whether the tube current and the scanning duration in the default scanning parameters in the scanning protocol satisfy the determined configuration type of the tube current and the scanning duration, and if so, the default scanning parameters are used as the scanning parameters required for scanning; otherwise, the scanning parameters required by scanning can be reselected according to the configuration types of the tube current and the scanning time.
For example, if the tube current and the scanning duration in the default scanning parameter configured in the scanning protocol belong to a second configuration type, if it is determined in step 103 that the current line impedance is not greater than the first threshold, the default scanning parameter may be adopted in step 104; if it is determined in step 103 that the current line impedance is greater than the first threshold, in step 104, the tube current value may be decreased based on the default scanning parameter, the scanning duration may be increased, and the adjusted scanning parameter may be determined as the scanning parameter required for scanning. Further, if it is determined in step 103 that the current line impedance is smaller than the second threshold, in step 104, the tube current value may be increased based on the default scanning parameter, the scanning duration may be reduced, and the adjusted scanning parameter may be determined as the scanning parameter required for scanning.
In this embodiment, if step 101 is executed when the X-ray scanning apparatus is first installed, and it is determined that the line impedance measured in step 102 can substantially reflect the infrastructure condition of the user, if it is determined in step 104 that the configuration type of the tube current and the scanning duration determined in step 103 does not match the default scanning parameter in the scanning protocol, the default scanning parameter may be further replaced with the scanning parameter required for the reselected scanning, that is, the scanning parameter required for the reselected scanning is stored as the default scanning parameter. Otherwise, when it cannot be completely determined that the line impedance measured in step 102 can reflect the user infrastructure condition, the default scan parameters may be left unchanged, and only the scan parameters required for the reselected scan may be used as the scan parameters required for the current scan.
Similarly, if step 101 is executed during daily quality inspection of the X-ray scanning device and/or during dynamic scanning of the X-ray scanning device, a time period, such as 3 days, 4 days, 5 days, … …, 10 days, … …, may be determined, or a time period, such as 3 times, 4 times, 5 times, … …, 10 times, … …, may be determined, and a variation trend of the line impedance may be determined according to the calculated line impedance within the set period; when the variation trend reaches a required steady state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not satisfy the configuration types of the tube current and the scanning time length determined in step 103, the scanning parameters required for the reselected scanning can be stored as the default scanning parameters. For example, if it is determined in step 104 that the configuration type of the tube current and the scan duration determined in step 103 does not match the default scan parameters in the scan protocol, and the line impedance measured for 5 consecutive days (or 3 days, 10 days, etc.) remains substantially unchanged, the scan parameters required for the reselected scan may be stored as the default scan parameters; otherwise, the default scanning parameters may be kept unchanged, and only the scanning parameters required by the reselected scanning may be used as the scanning parameters required by the current scanning.
In addition, in other embodiments, at least one set of scan parameters may be preset for each configuration type of the tube current and the scan duration, and then in step 104, an appropriate scan parameter may be selected from the set scan parameters according to the configuration type of the tube current and the scan duration determined in step 103.
In addition, in the embodiment of the application, the change trend of the line impedance can be determined according to the line impedance calculated in a preset time period or in a preset number of times; and further, according to the variation trend, the period of time when the variation trend reaches the required steady state is selected for scanning and imaging. Therefore, the X-ray scanning equipment can be used for scanning and imaging more reasonably and flexibly.
Fig. 3 is an exemplary block diagram of a scan information determination system according to an embodiment of the present invention. The scan parameter determining system may be used to implement the scan parameter determining method shown in fig. 1, and for details that are not disclosed in the embodiment of the present system, reference may be made to the description corresponding to the embodiment of the method shown in fig. 1. As shown in fig. 3, the system may include: an input voltage acquisition module 301, a line impedance calculation module 302, a configuration type determination module 303, and a parameter determination module 304.
The input voltage acquisition module 301 is configured to acquire a first input voltage when the X-ray scanning apparatus performs scanning under a first tube current condition and a second input voltage when the X-ray scanning apparatus performs scanning under a second tube current condition; wherein the first tube current is a determined lower value tube current and the second tube current is a determined higher value tube current.
The line impedance calculation module 302 is configured to calculate a current line impedance according to the first tube current, the first input voltage, the second tube current, and the second input voltage.
The configuration type determining module 303 is configured to compare the current line impedance with a preset impedance threshold, and determine a configuration type of the tube current and the scanning duration in the scanning parameter according to a comparison result and a capability relationship between the tube current and the line impedance determined by the X-ray scanning device.
The parameter determining module 304 is configured to determine a scan parameter required for scanning according to the configuration types of the tube current and the scan duration.
Corresponding to the method shown in fig. 1, when the impedance threshold includes a first threshold, the configuration type determining module 303 may be configured to determine, when the current line impedance is greater than a preset first threshold, the configuration types of the tube current and the scanning duration in the scanning parameter as the first configuration types of the low-value tube current and the high-value scanning duration according to the capability relationship between the tube current and the line impedance determined by the X-ray scanning device and the required scanning dose.
In an embodiment, the configuration type determining module 303 may be further configured to determine, when the current line impedance is less than or equal to the first threshold, a second configuration type in which the configuration types of the tube current and the scan duration in the scan parameter are the median tube current and the median scan duration according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning device and the required scan dose.
In addition, when the impedance threshold further includes a second threshold, the configuration type determining module 303 is further configured to determine, when the current line impedance is between the second threshold and the first threshold, that the configuration types of the tube current and the scanning time duration in the scanning parameter are the second configuration types of the median tube current and the median scanning time duration according to the capability relationship between the tube current and the line impedance determined by the X-ray scanning device and the required scanning dose; and when the current line impedance is smaller than the second threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of high-value tube current and low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
Corresponding to the method shown in fig. 1, in one embodiment, the parameter determining module 304 may be configured to determine whether the tube current and the scan duration in the default scan parameter in the scan protocol satisfy the determined configuration type of the tube current and the scan duration, and if so, take the default scan parameter as the scan parameter required for scanning; otherwise, according to the configuration types of the tube current and the scanning duration, the scanning parameters required by scanning are reselected.
Corresponding to the method shown in fig. 1, in one embodiment, the input voltage obtaining module 301 may be configured to obtain a first input voltage when the X-ray scanning apparatus performs scanning under a first tube current condition and a second input voltage when the X-ray scanning apparatus performs scanning under a second tube current condition when the X-ray scanning apparatus is first installed and/or during daily quality inspection of the X-ray scanning apparatus; and/or, the input voltage obtaining module 301 may be configured to obtain, from the dynamic scan data, a first input voltage when the X-ray scanning apparatus performs scanning under a first tube current condition and a second input voltage when the X-ray scanning apparatus performs scanning under a second tube current condition when the X-ray scanning apparatus performs dynamic scanning.
Corresponding to the method shown in fig. 1, in one embodiment, the scan parameter determining system in this embodiment may further include: a default scanning parameter management module 305, configured to, when the X-ray scanning device is installed for the first time, store, as a default scanning parameter, a scanning parameter required for scanning that is reselected if a tube current and a scanning duration in a default scanning parameter in a scanning protocol do not satisfy a configuration type of the determined tube current and the determined scanning duration; and/or determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times during the daily quality inspection process of the X-ray scanning equipment and/or during the dynamic scanning of the X-ray scanning equipment; and when the variation trend reaches the required stable state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the determined configuration type of the tube current and the scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters.
Corresponding to the method shown in fig. 1, in one embodiment, the scan parameter determining system in this embodiment further includes: the data analysis module 306 is used for determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times; and recommending the X-ray scanning equipment to select the time period of the steady state with the variation trend reaching the requirement for scanning and imaging according to the variation trend.
Fig. 4 is a schematic structural diagram of a control terminal of an X-ray scanning device in an embodiment of the present invention. The control terminal can be used to implement the method shown in fig. 1 and the system shown in fig. 3. As shown in fig. 4, the control terminal may include: a processor 401, a memory 402, a display unit 403, and a network communication interface 404. These components communicate over a bus 405.
In this embodiment, the memory 402 may be a non-volatile computer readable memory having stored therein a plurality of program modules, such as: an operating system 406, a network communication module 407, and an application 408.
The processor 401 may read various modules (not shown in the figure) included in the application 408 in the memory 402 to perform various functional applications of the user terminal and data processing. The processor 401 in this embodiment may be one or more, and may be a CPU, a processing unit/module, an ASIC, a logic module, a programmable gate array, or the like.
The application 408 may include various functional modules in the system shown in FIG. 3 and form a corresponding set of computer-executable instructions 409 and corresponding metadata and heuristics 410. These sets of computer-executable instructions may be executed by the processor 401 and perform the functions of the method shown in fig. 1 or the system shown in fig. 3.
In this embodiment, the network communication interface 404 cooperates with the network communication module 407 to complete the transceiving of various network signals of the control terminal.
The display unit 403 has a display panel for inputting and displaying related information, including presenting scanning parameters.
The invention also provides a storage medium, such as a non-volatile computer-readable storage medium, in which a data processing program is stored, the data processing program being adapted to perform any one of the embodiments of the above-described method of the invention.
In addition, an embodiment of the present invention further provides an X-ray scanning device, which may include any of the above-described scan parameter determination systems in specific implementation forms.
It can be seen from the above solutions that, in the embodiments of the present invention, by measuring the line impedance, and according to the line impedance threshold and the configuration types of different tube currents and scanning durations determined corresponding to different line impedance intervals, the scan parameters that are most suitable for the hardware capability of the X-ray scanning device and the infrastructure of the user (for example, whether there is an enough transformer or not, whether the network power supply is stable, etc.) can be determined, thereby implementing adjustment of the scan parameters related to the hardware capability of the X-ray scanning device and the infrastructure of the user, enabling the X-ray scanning device to be adapted to more occasions, and improving the application flexibility of the X-ray scanning device.
In addition, by setting the second threshold and the third configuration type, the scanning efficiency of the X-ray scanning device can be optimized, and the throughput of the patient can be improved.
In addition, in the embodiment of the invention, the relevant parameters for measuring the linear impedance can be obtained when the X-ray scanning equipment is installed for the first time and/or in the daily quality inspection process of the X-ray scanning equipment, even when the X-ray scanning equipment performs dynamic scanning, so that the technical scheme of the application can be flexibly realized, and the application flexibility of the X-ray scanning equipment is improved.
In addition, the default scanning parameters are replaced as necessary, so that the use process of the X-ray scanning equipment is more convenient on one hand; and on the other hand, the inconvenience caused by frequent replacement is also avoided.
Finally, by analyzing the variation trend of the line impedance, the period of time that the variation trend reaches the required steady state can be selected for scanning and imaging, and the X-ray scanning equipment can be optimally used for scanning and imaging.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.
Claims (17)
1. The scanning parameter determining method is characterized by comprising the following steps:
acquiring a first input voltage when the X-ray scanning device scans under a first tube current condition and a second input voltage when the X-ray scanning device scans under a second tube current condition (101); wherein the first tube current is a determined lower value tube current and the second tube current is a determined higher value tube current;
calculating a present line impedance (102) from the first tube current, the first input voltage, the second tube current and the second input voltage;
comparing the current line impedance with a preset impedance threshold, and determining the configuration type (103) of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment; and
and determining scanning parameters (104) required by scanning according to the configuration types of the tube current and the scanning duration.
2. The method of claim 1, wherein the impedance threshold comprises a first threshold;
determining a configuration type (103) of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined corresponding to the X-ray scanning device comprises: and when the current line impedance is larger than a preset first threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as the first configuration types of the low-value tube current and the high-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
3. The method of claim 2, wherein determining (103) a configuration type of tube current and scan duration in scan parameters based on the comparison and a capability relationship between tube current and line impedance determined for the X-ray scanning device further comprises: and when the current line impedance is smaller than or equal to the first threshold, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
4. The method of claim 2, wherein the impedance threshold further comprises a second threshold, the second threshold being less than the first threshold;
the determining a configuration type (103) of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined corresponding to the X-ray scanning device further comprises: when the current line impedance is between a preset second threshold and the first threshold, determining the configuration type of the tube current and the scanning time length in the scanning parameters as a second configuration type of the median tube current and the median scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage; and when the current line impedance is smaller than the second threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of high-value tube current and low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
5. The method according to any one of claims 1 to 4, wherein determining scan parameters (104) required for a scan according to the configuration type of the tube current and the scan duration comprises: judging whether the tube current and the scanning time length in the default scanning parameters in the scanning protocol meet the configuration types of the determined tube current and the scanning time length, and if so, taking the default scanning parameters as the scanning parameters required by scanning; otherwise, according to the configuration types of the tube current and the scanning duration, the scanning parameters required by scanning are reselected.
6. The method of claim 5, wherein acquiring a first input voltage while the X-ray scanning device is scanning under a first tube current condition and a second input voltage while scanning under a second tube current condition (101) comprises:
when the X-ray scanning equipment is installed for the first time and/or in the daily quality inspection process of the X-ray scanning equipment, acquiring a first input voltage when the X-ray scanning equipment scans under the condition of a first tube current and a second input voltage when the X-ray scanning equipment scans under the condition of a second tube current; alternatively, the first and second electrodes may be,
when the X-ray scanning device performs dynamic scanning, a first input voltage when the X-ray scanning device performs scanning under a first tube current condition and a second input voltage when the X-ray scanning device performs scanning under a second tube current condition are obtained from the dynamic scanning data.
7. The method of claim 6, further comprising: when the X-ray scanning equipment is installed for the first time, if the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the configuration type of the determined tube current and the determined scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters; and/or the presence of a gas in the gas,
determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times during the daily quality inspection process of the X-ray scanning equipment and/or during the dynamic scanning of the X-ray scanning equipment; and when the variation trend reaches the required stable state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the determined configuration type of the tube current and the scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters.
8. The method of claim 5, further comprising: determining the change trend of the line impedance according to the line impedance calculated in a preset time period or in a preset number of times;
and selecting a period of time when the variation trend reaches the required steady state to perform scanning imaging according to the variation trend.
9. A scan parameter determination system, comprising:
an input voltage acquisition module (301) for acquiring a first input voltage when the X-ray scanning device scans under a first tube current condition and a second input voltage when the X-ray scanning device scans under a second tube current condition; wherein the first tube current is a determined lower value tube current and the second tube current is a determined higher value tube current;
a line impedance calculation module (302) for calculating a current line impedance according to the first tube current, the first input voltage, the second tube current and the second input voltage;
a configuration type determining module (303) for comparing the current line impedance with a preset impedance threshold, and determining the configuration type of the tube current and the scanning duration in the scanning parameters according to the comparison result and the capability relationship between the tube current and the line impedance determined by the X-ray scanning equipment; and
and the parameter determination module (304) is used for determining scanning parameters required by scanning according to the configuration types of the tube current and the scanning time length.
10. The system of claim 9, wherein the impedance threshold comprises a first threshold;
the configuration type determining module (303) is configured to determine, when the current line impedance is greater than a preset first threshold, that the configuration type of the tube current and the scanning duration in the scanning parameter is a first configuration type of a low-value tube current and a high-value scanning duration according to a capability relationship between the tube current and the line impedance determined by the X-ray scanning device and a required scanning dose.
11. The system according to claim 10, wherein the configuration type determining module (303) is further configured to determine the configuration types of the tube current and the scan duration in the scan parameters as a second configuration type of the median tube current and the median scan duration according to the capability relationship between the tube current and the line impedance determined corresponding to the X-ray scanning device and the required scan dose when the current line impedance is less than or equal to the first threshold.
12. The system of claim 10, wherein the impedance threshold further comprises a second threshold, the second threshold being less than the first threshold;
the configuration type determining module (303) is further configured to determine, when the current line impedance is between a second preset threshold and the first threshold, that the configuration types of the tube current and the scanning time duration in the scanning parameters are a second configuration type of the median tube current and the median scanning time duration according to a capability relationship between the tube current and the line impedance determined by the X-ray scanning device and a required scanning dose; and when the current line impedance is smaller than the second threshold value, determining the configuration types of the tube current and the scanning time length in the scanning parameters as a third configuration type of high-value tube current and low-value scanning time length according to the capability relationship between the tube current and the line impedance determined by the corresponding X-ray scanning equipment and the required scanning dosage.
13. The system according to any one of claims 9 to 12, wherein the parameter determining module (304) is configured to determine whether a tube current and a scan duration in default scan parameters in a scan protocol satisfy the determined configuration type of the tube current and the scan duration, and if so, take the default scan parameters as scan parameters required for scanning; otherwise, according to the configuration types of the tube current and the scanning duration, the scanning parameters required by scanning are reselected.
14. The system according to claim 13, wherein the input voltage acquisition module (301) is configured to acquire a first input voltage when the X-ray scanning device scans under a first tube current condition and a second input voltage when the X-ray scanning device scans under a second tube current condition at a first installation of the X-ray scanning device and/or during routine quality inspection of the X-ray scanning device; alternatively, the first and second electrodes may be,
the input voltage acquisition module (301) is used for acquiring a first input voltage when the X-ray scanning device performs scanning under a first tube current condition and a second input voltage when the X-ray scanning device performs scanning under a second tube current condition from the dynamic scanning data when the X-ray scanning device performs dynamic scanning.
15. The system of claim 14, further comprising: a default scanning parameter management module (305) for storing scanning parameters required by scanning for re-selection as default scanning parameters when the X-ray scanning equipment is installed for the first time and if the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the configuration type of the determined tube current and the determined scanning time length; and/or the presence of a gas in the gas,
determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times during the daily quality inspection process of the X-ray scanning equipment and/or during the dynamic scanning of the X-ray scanning equipment; and when the variation trend reaches the required stable state and the tube current and the scanning time length in the default scanning parameters in the scanning protocol do not meet the determined configuration type of the tube current and the scanning time length, storing the scanning parameters required by the reselected scanning as the default scanning parameters.
16. The system of claim 13, further comprising: the data analysis module (306) is used for determining the change trend of the line impedance according to the line impedance calculated in a preset time period or a preset number of times; and recommending and selecting a period of time when the variation trend reaches the required steady state for scanning and imaging according to the variation trend.
An X-ray scanning device, comprising: the scan parameter determination system of any of claims 9 to 16.
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