CN107656101A - A kind of rotating mechanism for semiconductor test rotary frame - Google Patents
A kind of rotating mechanism for semiconductor test rotary frame Download PDFInfo
- Publication number
- CN107656101A CN107656101A CN201710892719.4A CN201710892719A CN107656101A CN 107656101 A CN107656101 A CN 107656101A CN 201710892719 A CN201710892719 A CN 201710892719A CN 107656101 A CN107656101 A CN 107656101A
- Authority
- CN
- China
- Prior art keywords
- reduction gear
- rotating mechanism
- semiconductor test
- planetary reduction
- keep plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16D—COUPLINGS FOR TRANSMITTING ROTATION; CLUTCHES; BRAKES
- F16D71/00—Mechanisms for bringing members to rest in a predetermined position
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Retarders (AREA)
Abstract
The present invention discloses a kind of rotating mechanism for semiconductor test rotary frame, including connecting bottom board, planetary reduction gear, rotary shaft, bearing and keep plate；Described connecting bottom board is laterally disposed, and the right-hand member that described keep plate is arranged on connecting bottom board forms a L shaped plate；Described planetary reduction gear is transversely mounted on the right side of keep plate, and a mounting hole is additionally provided with keep plate；Described bearing is arranged on connecting bottom board.The rotating mechanism of the present invention mainly is completed to rotate by planetary reducer, the input installation rotation hand wheel of planetary reduction gear, facilitate manual operation, the rotating shaft of output shaft connecting test machine can drive test machine to rotate, by the way that the present apparatus is arranged on semiconductor test rotary frame semiconductor test machine can be helped to realize artificial rotation, and by setting certain gearratio to planetary reduction gear, test machine is slowly rotated, stationarity when increase rotates；Reach the purpose of time saving and energy saving increase operating efficiency.
Description
Technical field
The invention belongs to semiconductor detection, and in particular to a kind of whirler for semiconductor test rotary frame
Structure.
Background technology
As shown in figure 1, existing semiconductor test machine, which is arranged in square tube frame, realizes fixed and mobile function.But
In semiconductor test machine during debugging and use, staff needs frequently to carry out patching operations to debug test machine.
And some Wiring ports of semiconductor test machine are arranged on the bottom of test machine, staff carries out patching operations and is required for every time
Bend over to operate, wiring debugging is very inconvenient, and also can be very inconvenient when maintenance, greatly reduces work people
The operating efficiency of member；Therefore a kind of rotary frame that can rotate semiconductor test machine is urgently studied, and installed in rotation
Rotating mechanism in frame.
The content of the invention
The purpose of the present invention is in view of the deficienciess of the prior art, offer is a kind of to be used for semiconductor test rotary frame
Rotating mechanism.
Technical scheme：It is of the present invention solve the problems, such as used by technical scheme be：One kind is used for semiconductor test rotary frame
Rotating mechanism, including connecting bottom board, planetary reduction gear, rotary shaft, bearing and keep plate；Described connecting bottom board is laterally put
Put, the right-hand member that described keep plate is arranged on connecting bottom board forms a L shaped plate；Described planetary reduction gear is transversely mounted on braking
The right side of plate, and a mounting hole is additionally provided with keep plate；Described bearing is arranged on connecting bottom board, described rotary shaft
Within the bearing, and the right side shaft end of rotary shaft is corresponding with the output shaft of planetary reduction gear for installation, the right side shaft end of rotary shaft from
Mounting hole stretches into integral with the output shaft abutting joint of planetary reduction gear.
Preferably, being additionally provided with a clamp ring in the mounting hole of described keep plate, described rotary shaft is arranged on lock
In collar, the side of described clamp ring is provided with opening, and the latch segment of two pieces of transverse directions is extended with from the opening, and upper strata
Latch segment and the upper hole wall of mounting hole be provided with corresponding through hole, and a tie down screw is installed on the latch segment of lower floor,
The through hole of the latch segment from upper strata and mounting hole reaches outside keep plate the tie down screw straight up, and in tie down screw
End is also equipped with locking nut.
Preferably, the left end end of described rotary shaft is also equipped with clutch disk, also set on described clutch disk
It is equipped with four kidney slots uniformly arranged.
Preferably, being also provided with an installing plate by kidney slot on described clutch disk, gone back on described installing plate
It is provided with threaded mounting hole.
Preferably, the output end of described planetary reduction gear is also equipped with rotation hand wheel.
Preferably, the output gearratio of described planetary reduction gear is 80:1.
Beneficial effect：The invention has the advantages that：
(1) rotating mechanism of the invention mainly is completed to rotate by planetary reducer, the input peace of planetary reduction gear
Rotation hand wheel is filled, facilitates manual operation, the rotating shaft of output shaft connecting test machine can drive test machine to rotate, by by the present apparatus
Semiconductor test machine can be helped to realize artificial rotation on semiconductor test rotary frame, and by planetary reduction gear
Device sets certain gearratio, test machine is slowly rotated, stationarity when increase rotates；Reach time saving and energy saving increase
The purpose of operating efficiency；
(2) present invention is provided with clamp ring and tie down screw also in keep plate, and the lower end of tie down screw is arranged on lower floor
Latch segment on, upper end is stretched out from the through hole of the latch segment on upper strata and mounting hole；And rotary shaft is mounted in clamp ring, when
When test machine needs fixed position after rotating to an angle, by locking nut screwing tie down screw, tie down screw just will
Upper and lower two latch segments locking, makes rotary shaft be locked in clamp ring, you can the position of rotary shaft is fixed, and when wiring is debugged
After the completion of locknut is unclamped and by rotating mechanism test machine can be made to set back, therefore the rotating mechanism of the present apparatus adds lock
Tight function, the rotation of test machine is set to fix enhanced convenience.
Brief description of the drawings
Fig. 1 is the rack of existing semiconductor test apparatus
Fig. 2 is the structure chart of the present invention；
Fig. 3 is the structure chart that the present invention is arranged on rotating mechanism
Fig. 4 is the structural representation of clamp ring in the present invention.
Embodiment
Below in conjunction with the accompanying drawings and specific embodiment, the present invention is furture elucidated, and the present embodiment is with technical solution of the present invention
Premised under implemented, it should be understood that these embodiments are only illustrative of the invention and is not intended to limit the scope of the invention.
As shown in Figure 2, Figure 3 and Figure 4, a kind of rotating mechanism for semiconductor test rotary frame, including connecting bottom board
1st, planetary reduction gear 2, rotary shaft 3, bearing 4 and keep plate 5；Described connecting bottom board 1 is laterally disposed, and described keep plate 5 is pacified
Right-hand member mounted in connecting bottom board 1 forms a L shaped plate；Described planetary reduction gear 2 is transversely mounted on the right side of keep plate 5, and
A mounting hole 51 is additionally provided with keep plate 5；Described bearing 4 is arranged on connecting bottom board 1, and described rotary shaft 3 is arranged on
In bearing 4, and the right side shaft end of rotary shaft 3 is corresponding with the output shaft of planetary reduction gear 2, and the right side shaft end of rotary shaft 3 is from peace
Dress hole 51 is stretched into integral with the output shaft abutting joint of planetary reduction gear 2.
Preferably, being additionally provided with a clamp ring 52 in the mounting hole 51 of described keep plate 5, described rotary shaft 3 is pacified
In clamp ring 52, the side of described clamp ring 52 is provided with opening, and the lock of two pieces of transverse directions is extended with from the opening
Tight block 53, and the latch segment 53 on upper strata and the upper hole wall of mounting hole 51 are provided with corresponding through hole 54, and the latch segment of lower floor
One tie down screw 55 is installed, the tie down screw 54 is straight up from the latch segment 53 on upper strata and the through hole 54 of mounting hole 51 on 53
Reach outside keep plate 5, and locking nut 55 is also equipped with the end of tie down screw 54.
The left end end of described rotary shaft 3 is also equipped with clutch disk 6, and four are additionally provided with described clutch disk 6
The individual kidney slot 7 uniformly arranged；An installing plate 8, described installation are also provided with by kidney slot 7 on described clutch disk 6
Threaded mounting hole is additionally provided with plate 8；The output end of described planetary reduction gear 2 is also equipped with rotation hand wheel 9.
The present invention is also calculated the diameter of axle and speed reducing ratio of planetary reduction gear, can using the weight that test machine is overall
To calculate
And the gearratio of planetary reduction gear is then according to being actually needed setting, using the engaged transmission of gear, planetary gear it is interior
The gearratio required for us is realized in engagement, and according to actual conditions, gearratio is arranged into 80:1.
The rotating mechanism of the present invention mainly is completed to rotate by planetary reducer, the input installation rotation of planetary reduction gear
Wheel is changed hands, facilitates manual operation, the rotating shaft of output shaft connecting test machine can drive test machine to rotate, by the way that the present apparatus is installed
Semiconductor test machine can be helped to realize artificial rotation on semiconductor test rotary frame, and by being set to planetary reduction gear
Certain gearratio is put, test machine is slowly rotated, stationarity when increase rotates；Reach time saving and energy saving increase work
The purpose of efficiency.
The present invention is provided with clamp ring and tie down screw also in keep plate, and the lower end of tie down screw is arranged on the lock of lower floor
On tight block, upper end is stretched out from the latch segment on upper strata and the through hole of mounting hole；And rotary shaft is mounted in clamp ring, work as test
When machine needs fixed position after rotating to an angle, by locking nut screwing tie down screw, tie down screw just will be up and down
Two latch segment lockings, make rotary shaft be locked in clamp ring, you can the position of rotary shaft is fixed, and when wiring debugging is completed
Locknut, which is unclamped, afterwards test machine is set back by rotating mechanism, therefore the rotating mechanism of the present apparatus adds locking work(
Can, the rotation of test machine is fixed enhanced convenience.
Described above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (6)
- A kind of 1. rotating mechanism for semiconductor test rotary frame, it is characterised in that：Subtract including connecting bottom board (1), planet Fast device (2), rotary shaft (3), bearing (4) and keep plate (5)；Laterally disposed, the described keep plate of described connecting bottom board (1) (5) right-hand member installed in connecting bottom board (1) forms a L shaped plate；Described planetary reduction gear (2) is transversely mounted on keep plate (5) Right side, and a mounting hole (51) is additionally provided with keep plate (5)；Described bearing (4) is arranged on connecting bottom board (1), Described rotary shaft (3) is arranged in bearing (4), and the right side shaft end of rotary shaft (3) and the output shaft phase of planetary reduction gear (2) Corresponding, the right side shaft end of rotary shaft (3) is stretched into the output shaft abutting joint of planetary reduction gear (2) into one from mounting hole (51) Body.
- A kind of 2. rotating mechanism for semiconductor test rotary frame according to claim 1, it is characterised in that：It is described Keep plate (5) mounting hole (51) in be additionally provided with a clamp ring (52), described rotary shaft (3) is arranged on clamp ring (52) In, the side of described clamp ring (52) is provided with opening, and the latch segment (53) of two pieces of transverse directions is extended with from the opening, and The latch segment (53) on upper strata and the upper hole wall of mounting hole (51) are provided with corresponding through hole (54), and the latch segment (53) of lower floor On a tie down screw (55) is installed, the tie down screw (54) is straight up from the latch segment (53) on upper strata and mounting hole (51) Through hole (54) reaches keep plate (5) outside, and is also equipped with locking nut (55) in the end of tie down screw (54).
- A kind of 3. rotating mechanism for semiconductor test rotary frame according to claim 1, it is characterised in that：It is described The left end end of rotary shaft (3) be also equipped with clutch disk (6), four are additionally provided with described clutch disk (6) uniformly The kidney slot (7) of arrangement.
- A kind of 4. rotating mechanism for semiconductor test rotary frame according to claim 3, it is characterised in that：It is described Clutch disk (6) on an installing plate (8) is also provided with by kidney slot (7), described installing plate is additionally provided with screw thread on (8) Mounting hole.
- A kind of 5. rotating mechanism for semiconductor test rotary frame according to claim 1, it is characterised in that：It is described The output end of planetary reduction gear (2) be also equipped with rotation hand wheel (9).
- A kind of 6. rotating mechanism for semiconductor test rotary frame according to claim 1, it is characterised in that：It is described Planetary reduction gear (2) output gearratio be 80:1.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710892719.4A CN107656101A (en) | 2017-09-27 | 2017-09-27 | A kind of rotating mechanism for semiconductor test rotary frame |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710892719.4A CN107656101A (en) | 2017-09-27 | 2017-09-27 | A kind of rotating mechanism for semiconductor test rotary frame |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107656101A true CN107656101A (en) | 2018-02-02 |
Family
ID=61117002
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710892719.4A Pending CN107656101A (en) | 2017-09-27 | 2017-09-27 | A kind of rotating mechanism for semiconductor test rotary frame |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107656101A (en) |
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| CN101955135A (en) * | 2009-07-20 | 2011-01-26 | 江苏赛富隆重工有限公司 | Portal crane rotation mechanism |
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| CN202076914U (en) * | 2011-05-28 | 2011-12-14 | 杭州双华科技有限公司 | Direct-current tube-shaped motor with hand-operated apparatus |
| KR20120087512A (en) * | 2011-01-28 | 2012-08-07 | 코리아테크 주식회사 | The combinational device of head for tester of semiconductor memory device |
| CN102668819A (en) * | 2012-05-24 | 2012-09-19 | 广西大学 | Planet-gear rattan cane harvester |
| CN204958255U (en) * | 2015-09-25 | 2016-01-13 | 力博重工科技股份有限公司 | Mining device of electrical winch at a slow speed |
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| US6771062B1 (en) * | 2003-05-14 | 2004-08-03 | Advantest Corporation | Apparatus for supporting and manipulating a testhead in an automatic test equipment system |
| TW200813659A (en) * | 2006-06-09 | 2008-03-16 | Canon Kk | Stage apparatus, exposure apparatus, and method for manufacturing device |
| TWM311156U (en) * | 2006-11-03 | 2007-05-01 | Chroma Ate Inc | Connection device for test apparatus |
| CN101071965A (en) * | 2007-02-14 | 2007-11-14 | 湖州南洋电机有限公司 | Tubular motor with manual rotating device |
| CN201374611Y (en) * | 2008-12-25 | 2009-12-30 | 周金华 | Silent tubular motor |
| CN101955135A (en) * | 2009-07-20 | 2011-01-26 | 江苏赛富隆重工有限公司 | Portal crane rotation mechanism |
| CN201867427U (en) * | 2010-11-08 | 2011-06-15 | 江阴格朗瑞科技有限公司 | Testing, printing and braiding integrated machine and separate type rotating disk |
| KR20120087512A (en) * | 2011-01-28 | 2012-08-07 | 코리아테크 주식회사 | The combinational device of head for tester of semiconductor memory device |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| CB02 | Change of applicant information |
Address after: 201306 Pudong New Area 6 new town, 66 Nanhui, Shanghai Applicant after: Shanghai semiconductor Semiconductor Co., Ltd. Address before: 200120 6 6, Fei Du Road, Lingang New Town, Pudong New Area, Shanghai. Applicant before: Shanghai min AI Mdt InfoTech Ltd |