CN107608838A - A kind of storage device method of testing, system, equipment and computer-readable storage medium - Google Patents
A kind of storage device method of testing, system, equipment and computer-readable storage medium Download PDFInfo
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Abstract
The invention discloses a kind of storage device method of testing, system, equipment and computer-readable storage medium, wherein this method includes：Obtain the predetermined N class testings parameter of span；A parameter combination is chosen from each class testing parameter into test parameter group, the performance test to storage device is completed based on the test parameter group, at least one parameter is different from the parameter in the test parameter group having been combined into the test parameter group of Combination nova；Whether the group number for judging to participate in the test parameter group of performance test is less than calculated value, a step of parameter combination is into test parameter group is chosen from each class testing parameter if so, then performing, if not, then terminate to test, calculated value is that the parameter item number of each class testing parameter is multiplied into obtained value.A kind of storage device method of testing provided by the invention realizes Automatic Combined test parameter, reduces the combination difficulty that user combines test parameter, the technical problem for solving the testing efficiency for how improving storage device test process.
Description
Technical field
The present invention relates to storage device technical field of measurement and test, more specifically to a kind of storage device method of testing, is
System, equipment and computer-readable storage medium.
Background technology
With the high speed development of internet, data also explosive growth therewith, usual user can select high-efficiency and low-cost
Storage device carry out data storage, this just needs to test the efficiency of storage device.
A kind of existing method for testing storage device is to be used as testing tool pair using fio (IOPS pressure tests instrument)
Storage device carries out efficiency test, and this instrument can be according to the speed of setting to disk and to writing or read a number of number
According to the speed of data input output being obtained, in this, as the index of evaluation storage device efficiency, still, read-write speed during test
The test parameters such as rate, read-write concurrency, document size need user's self assemble.
However, due to the complexity of test parameter, user, which is difficult to control oneself, is combined into suitable test parameter, and then to survey
The testing efficiency of examination process is relatively low.
In summary, how to improve the testing efficiency of storage device test process is that current those skilled in the art urgently solve
Certainly the problem of.
The content of the invention
It is an object of the invention to provide a kind of storage device method of testing, and it can solve how to improve to deposit to a certain extent
Store up the technical problem of the testing efficiency of equipment test process.Present invention also offers a kind of storage device testing system, equipment and
Computer-readable storage medium.
To achieve these goals, the present invention provides following technical scheme：
A kind of storage device method of testing, including：
Obtain the predetermined N class testings parameter of span；
A parameter combination is chosen from each class testing parameter into test parameter group, is completed based on the test parameter group
Performance test to storage device, at least one parameter and the test parameter group having been combined into the test parameter group of Combination nova
In parameter it is different；
Judge whether the group number for participating in the test parameter group of the performance test is less than calculated value, if so, described in then performing
A step of parameter combination is into test parameter group is chosen from each class testing parameter, if it is not, then terminating to test, the meter
Calculation value is that the parameter item number of each class testing parameter is multiplied into obtained value.
Preferably, judge that the group number for participating in the test parameter group of the performance test is equal to after calculated value, in addition to：
Performance evaluation is carried out to the storage device based on the test parameter and the performance index.
Preferably, it is described the storage device is carried out based on the test parameter and the performance index performance evaluation it
Before, in addition to：
Obtain the price of the storage device；
It is described that performance evaluation is carried out to the storage device based on the test parameter and the performance index, including：
Performance index divided by the price corresponding to each class testing parameter are obtained into corresponding ratio, based on the ratio
Performance evaluation is carried out to the storage device；
It is described based on the ratio to the storage device carry out performance evaluation after, in addition to：
Generate curve map of each class testing parameter with corresponding ratio.
Present invention also offers a kind of storage device testing system, including：
Acquisition module, for obtaining the predetermined N class testings parameter of span；
Composite module, for choosing a parameter combination from each class testing parameter into test parameter group, based on this
Test parameter group completes the performance test to storage device, and at least one parameter is with having combined in the test parameter group of Combination nova
Into test parameter group in parameter it is different；
Judge module, for judging to participate in whether the group number of test parameter group of the performance test is less than calculated value, if
It is then to prompt the composite module to choose a parameter combination from each class testing parameter into test parameter group, if it is not, then
Terminate test, the calculated value is that the parameter item number of each class testing parameter is multiplied into obtained value.
Preferably, in addition to：
Performance evaluation module, for judging to participate in the group number of the test parameter group of the performance test in the judge module
After calculated value, performance evaluation is carried out to the storage device based on the test parameter and the performance index.
Preferably, in addition to：
Price acquisition module, for being based on the test parameter and the performance index to institute in the performance evaluation module
Before stating storage device progress performance evaluation, the price of the storage device is obtained；
The performance evaluation module includes：
Computing unit, for performance index divided by the price corresponding to each class testing parameter to be obtained into corresponding ratio
Value, performance evaluation is carried out to the storage device based on the ratio；
Also include：
Generation module, performance evaluation is carried out to the storage device for being based on the ratio in the performance evaluation module
Afterwards, curve map of each class testing parameter with corresponding ratio is generated.
Present invention also offers a kind of storage device test equipment, including：
Memory, for storing computer program；
Processor, for performing the step of computer program is to realize above-mentioned storage device method of testing.
Present invention also offers a kind of computer-readable storage medium, computer journey is stored with the computer-readable storage medium
Sequence, when the computer program is executed by processor in realization the step of the storage device method of testing.
A kind of storage device method of testing provided by the invention includes：Obtain the predetermined N class testings ginseng of span
Number；A parameter combination is chosen from each class testing parameter into test parameter group, is completed based on the test parameter group to depositing
The performance test of equipment is stored up, in the test parameter group of Combination nova at least one parameter and the test parameter group having been combined into
Parameter is different；Whether the group number for judging to participate in the test parameter group of performance test is less than calculated value, if so, then performing from every one kind
A step of parameter combination is into test parameter group is chosen in test parameter, if it is not, then terminating to test, calculated value is will be each
The parameter item number of class testing parameter is multiplied obtained value.In a kind of storage device method of testing provided by the invention, due to test
The type and span of parameter are predetermined, can reduce the complexity of test parameter to a certain extent；And
A parameter combination is chosen in each class testing parameter into one group of test parameter, Automatic Combined test parameter is realized, with showing
There is user's combination test parameter in technology to compare, reduce the combination difficulty that user combines test parameter；Further, since Combination nova
Test parameter group at least one parameter and parameter in the test parameter group combined it is different, namely be combined into every time
Test parameter group is different so that the combination of test parameter group more diversity, disclosure satisfy that different testing requirements, has more preferable
Adaptability, and then can improve based on test parameter group to storage device carry out performance test when testing efficiency.To sum up institute
State, a kind of storage device method of testing provided by the invention solves how to improve storage device test process to a certain extent
Testing efficiency technical problem.A kind of storage device testing system, equipment and computer-readable storage medium provided by the invention
Solves corresponding technical problem.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
The embodiment of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis
The accompanying drawing of offer obtains other accompanying drawings.
Fig. 1 is a kind of flow chart of storage device method of testing provided in an embodiment of the present invention；
Fig. 2 is a kind of structural representation of storage device testing system provided in an embodiment of the present invention；
Fig. 3 is a kind of structural representation of storage device test equipment provided in an embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of protection of the invention.
Referring to Fig. 1, Fig. 1 is a kind of flow chart of storage device method of testing provided in an embodiment of the present invention.
A kind of storage device method of testing provided in an embodiment of the present invention may comprise steps of：
Step S101：Obtain the predetermined N class testings parameter of span.
In practical application, test parameter can be first obtained, test parameter is the parameter for influenceing storage device performance.Test ginseng
Several species and the span per class can be predetermined according to usual test experience, and these test parameters can be borrowed
C Plus Plus (a kind of computer programming language) is helped to be encapsulated into function library, when needing test parameter every time, calling is from function library
Can, naturally it is also possible to have other methods for obtaining test parameter, the present invention is not specifically limited herein.In practical application, survey
Test rate, concurrency and document size etc. can be included by trying the type of parameter, wherein, test rate sets for extraneous input storage
Standby data write rate and the maximum of data read rates, concurrency are the number for the visitor for accessing storage device simultaneously
Amount, document size is used for the size for the file for preserving data, such as 1M etc. for storage device itself, it is, of course, also possible to according to reality
Border needs to add other kinds of test parameter in a kind of storage device method of testing provided in an embodiment of the present invention, the present invention
It is not specifically limited herein.
Step S102：A parameter combination is chosen from each class testing parameter into test parameter group, based on the test
Parameter group completes performance test to storage device, at least one parameter and has been combined into the test parameter group of Combination nova
Parameter in test parameter group is different.
After test parameter is got, a parameter combination can be chosen from each class testing parameter into test parameter
Group, and at least one parameter is different from the parameter in the test parameter group having been combined into the test parameter group of Combination nova,
Namely the test parameter group being combined into is different two-by-two.After a test parameter group is obtained, the test parameter group can be based on
Complete the performance test to storage device.
Step S103：Judge whether the group number for participating in the test parameter group of performance test is less than calculated value, calculated value is will
The parameter item number of each class testing parameter is multiplied obtained value, and step S102 is performed if so, then returning；If it is not, then perform step
S104：Terminate test.
Whether the group number for judging to participate in the test parameter group of performance test here is less than calculated value, namely judges whether group
All types of test parameter groups are closed out, and judge whether all types of test parameter groups both participate in performance test, here
Described calculated value is that the parameter item number of each class testing parameter is multiplied into obtained value, if participating in the test parameter of performance test
The group number of group is less than calculated value, then returns to perform and a parameter combination is chosen from each class testing parameter into test parameter group
The step of, if the group number for participating in the test parameter group of performance test is equal to calculated value, can also may be used certainly with finish test procedure
To there is other operations, the present invention is not specifically limited herein.
Such as now with three class testing parameters, the respectively first kind, the second class and the 3rd class testing parameter, it is assumed that per a kind of
Test parameter has two test parameters, and the parameter in first kind test parameter is represented with A, B, the ginseng in the second class testing parameter
Number represents that the parameter in the 3rd class testing parameter is represented with E, F with C, D, then when being combined into test parameter group, test parameter group
The middle parameter necessarily included in each class testing parameter, the test parameter group after combination can be (A, C, E) etc., in addition,
Parameter in each class testing parameter can be with the parameter combination in other class testing parameters into test parameter group, that is to say, that
Parameter A and parameter B in a kind of test parameter were combined into test ginseng with each test parameter in second, third class
Array, then all types for the test parameter group being finally combined into are as follows：(A、C、E)、(A、C、F)、(A、D、E)、(A、D、
F), (B, C, E), (B, C, F), (B, D, E), (B, D, F), at this moment, calculated value are just 2*2*2=8, namely the test ginseng being combined into
The group number of array should be 8, because being often combined into a test parameter group, will be based on the test parameter group and complete to set storage
Standby performance test, if so the group number of test parameter group for participating in performance test is less than calculated value, that is to say, that can be with
Be combined into new test parameter group, for example, participate in the test parameter group of performance test type be (A, C, E), (A, C, F), (A,
D, E), at this moment the group number of test parameter group is 3, less than 8, it is necessary to which return to execution chooses a ginseng from each class testing parameter
Array synthesize test parameter group the step of, at this moment can also be combined into (A, D, F), (B, C, E), (B, C, F), (B, D, E), (B,
D, F) this 5 type test parameter group, after the test parameter group of this 5 set type both participates in performance test, can with terminate
Test process.
A kind of storage device method of testing provided by the invention includes：Obtain the predetermined N class testings ginseng of span
Number；A parameter combination is chosen from each class testing parameter into test parameter group, is completed based on the test parameter group to depositing
The performance test of equipment is stored up, in the test parameter group of Combination nova at least one parameter and the test parameter group having been combined into
Parameter is different；Whether the group number for judging to participate in the test parameter group of performance test is less than calculated value, if so, then performing from every one kind
A step of parameter combination is into test parameter group is chosen in test parameter, if it is not, then terminating to test, calculated value is will be each
The parameter item number of class testing parameter is multiplied obtained value.In a kind of storage device method of testing provided by the invention, due to test
The type and span of parameter are predetermined, can reduce the complexity of test parameter to a certain extent；And
A parameter combination is chosen in each class testing parameter into one group of test parameter, Automatic Combined test parameter is realized, with showing
There is user's combination test parameter in technology to compare, reduce the combination difficulty that user combines test parameter；Further, since Combination nova
Test parameter group at least one parameter and parameter in the test parameter group combined it is different, namely be combined into every time
Test parameter group is different so that the combination of test parameter group more diversity, disclosure satisfy that different testing requirements, has more preferable
Adaptability, and then can improve based on test parameter group to storage device carry out performance test when testing efficiency.To sum up institute
State, a kind of storage device method of testing provided by the invention solves how to improve storage device test process to a certain extent
Testing efficiency technical problem.
In a kind of storage device method of testing provided in an embodiment of the present invention, judge to participate in the test parameter group of performance test
Group number be equal to calculated value after, can also include：
Performance evaluation is carried out to storage device based on test parameter and performance index.
In practical application, after judging to participate in the group number of test parameter group of performance test and being equal to calculated value, may be used also
To carry out performance evaluation to storage device based on test parameter and corresponding performance index, it so can provide storage for the external world and set
Standby correlated performance evaluation information, it is easy to the extraneous selection suitable storage device of performance according to their needs.
In a kind of storage device method of testing provided in an embodiment of the present invention, based on test parameter and performance index to storage
Before equipment carries out performance evaluation, it can also include：
Obtain the price of storage device；
Performance evaluation is carried out to storage device based on test parameter and performance index, can be included：
Performance index divided by price corresponding to each class testing parameter are obtained into corresponding ratio, storage set based on ratio
It is standby to carry out performance evaluation；
After carrying out performance evaluation to storage device based on ratio, it can also include：
Generate curve map of each class testing parameter with corresponding ratio.
, can also be before performance evaluation be carried out to storage device based on test parameter and performance index in advance in practical application
The price of storage device is obtained, so, in performance impact of each class testing parameter of evaluation to storage device, this can be calculated
Performance index corresponding to class testing parameter and the ratio of price, the performance of storage device is evaluated according to obtained ratio,
Due to take into account the price of storage device in the evaluation procedure of storage device, the external world can be allowed directly to be selected according to evaluation result
Take suitable storage device, it is not necessary to individually consider the influence of storage device price, choosing storage device for the external world provides conveniently.
In practical application, based on ratio to storage device carry out performance evaluation after, can also generate each class testing parameter with it is right
The curve map for the ratio answered, such as can be using the parameter in each class testing parameter as abscissa, to compare corresponding to each parameter
It is worth and obtains coordinate diagram for ordinate, congener adjacent two coordinate points is being linked up into composition curve map, so can be very directly perceived
Find out performance impact of each class testing parameter to storage device.Because the performance index of storage device may have multiclass, institute
So that multiple curve maps can be generated in practical application, such as when performance index is data write rate and data read rates,
Each corresponding two ratios of parameter, one is data write rate and the ratio of price, and another is data read rates and valency
The ratio of lattice, so in formation curve figure, two curve maps can be generated, one be data write rate with price proportion with
The curve map of test parameter, another is curve map of the ratio with test parameter of data read rates and price, can also be
The two ratios are embodied in one width curve map, at this moment, need to distinguish the species of coordinate points, namely this seat in connection coordinate point
Punctuate is that the ratio for belonging to data write rate and price still falls within the ratio of data read rates and price, then will be of the same race
The coordinate points of class connect.Certainly other can also embody ratio and the method for test parameter relation, the present invention is herein
It is not specifically limited.
In a kind of storage device method of testing provided in an embodiment of the present invention, complete to set storage based on the test parameter group
Standby performance test, it can include：
The test parameter group is inputted to storage device；
The performance index of storage device under the test parameter group is tested, performance index includes data write rate and data are read
Take speed；
This group of test parameter is removed in storage device.
In practical application, after a test parameter group is obtained, can so that the test parameter group is inputted to storage device,
Mentioned here input the test parameter group to storage device also surveys the relative parameters setting in storage device for the group
Try the corresponding data in parameter.Inputted by the test parameter group to storage device, can test under the test parameter group and deposit
The performance indexs such as data write rate and the data read rates of equipment are stored up, after the completion of test, can be removed in storage device
The test parameter group.The performance test process to storage device can be so caused simply easily to realize.
In practical application, when testing the data write rate and data read rates of storage device, it can call fio will
Size is the storage device that 10G data are write under this group of test parameter, and writing rate is sampled with prefixed time interval,
After the completion of pending data write-in, the average value for the writing rate that sampling obtains is calculated and using the average value as data write rate；
Call fio to read data in storage device, reading rate is sampled with prefixed time interval, pending data, which is read, to be completed
Afterwards, the average value for the reading rate that sampling obtains is calculated and using the average value as data read rates.Call fio will be default
Size is 10G data write storage device, while writing rate is sampled at predetermined intervals, so can be real
When obtain multiple writing rates, after data whole write storage device, the average value of writing rate of sampling can be calculated simultaneously
As last data write rate, can so cause data write rate that test obtains more have real-time and
Accuracy, fio is called to write data into storage device or by data from the process that storage device is read and phase of the prior art
Pass process is identical, repeats no more here；Size is that 10G data can meet that testing requirement will not cause testing time mistake again
It is long, naturally it is also possible to data to be set to other sizes, the present invention is not specifically limited herein；The time interval of sampling can root
Set according to being actually needed, such as 0.1 second etc.；Test obtains the process of data read rates and principle obtains data with test
The process of writing rate is identical with principle, repeats no more here.
Present invention also offers a kind of storage device testing system, and there is a kind of storage provided in an embodiment of the present invention to set for it
The corresponding effect that standby method of testing has.Referring to Fig. 2, Fig. 2 is a kind of storage device test system provided in an embodiment of the present invention
The structural representation of system.
A kind of storage device testing system provided in an embodiment of the present invention can include：
Acquisition module A1, for obtaining the predetermined N class testings parameter of span；
Composite module A2, for choosing a parameter combination from each class testing parameter into test parameter group, it is based on
The test parameter group completes performance test to storage device, at least one parameter and group in the test parameter group of Combination nova
Parameter in the test parameter group of synthesis is different；
Judge module A3, for judging to participate in whether the group number of test parameter group of performance test is less than calculated value, if so,
Then prompting combination modules A 2 chooses a parameter combination into test parameter group from each class testing parameter, if it is not, then terminating
Test, calculated value are that the parameter item number of each class testing parameter is multiplied into obtained value.
In a kind of storage device testing system provided in an embodiment of the present invention, it can also include：
Performance evaluation module, calculated for judging that the group number for participating in the test parameter group of performance test is equal in judge module
After value, performance evaluation is carried out to storage device based on test parameter and performance index.
A kind of storage device testing system provided in an embodiment of the present invention, can also include：
Price acquisition module, for being based on test parameter and performance index to storage device progressive in performance evaluation module
Before evaluating, the price of storage device is obtained；
Performance evaluation module can include：
Computing unit, for performance index divided by price corresponding to each class testing parameter to be obtained into corresponding ratio, base
Performance evaluation is carried out to storage device in ratio；
It can also include：
Generation module, after being based on ratio to storage device progress performance evaluation in performance evaluation module, generation is every
The curve map of a kind of test parameter and corresponding ratio.
In a kind of storage device testing system provided in an embodiment of the present invention, composite module can include：
Input block, for inputting the test parameter group to storage device；
Test cell, for testing the performance index of storage device under the test parameter group, performance index is write including data
Enter speed and data read rates；
Clearing cell, for removing this group of test parameter in storage device.
The present invention has also carried a kind of storage device test equipment and computer-readable storage medium, is respectively provided with the embodiment of the present invention and carries
The corresponding effect that a kind of storage device method of testing supplied has.Referring to Fig. 3, Fig. 3 is one kind provided in an embodiment of the present invention
The structural representation of storage device test equipment.
A kind of storage device test equipment provided in an embodiment of the present invention can include：
Memory B1, for storing computer program；
Processor B2, the step of for performing computer program to realize storage device method of testing described above.
In a kind of computer-readable storage medium provided in an embodiment of the present invention, computer journey is stored with computer-readable storage medium
Sequence, the step of storage device method of testing said above is realized when computer program is executed by processor.
Relevant portion in a kind of storage device testing system provided in an embodiment of the present invention, equipment and computer-readable storage medium
Explanation refer to the detailed description of corresponding part in a kind of storage device method of testing provided in an embodiment of the present invention, herein not
Repeat again.In addition, with corresponding to technical scheme realization principle in the prior art in above-mentioned technical proposal provided in an embodiment of the present invention
Consistent part is simultaneously unspecified, in order to avoid excessively repeat.
The foregoing description of the disclosed embodiments, those skilled in the art are enable to realize or using the present invention.To this
A variety of modifications of a little embodiments will be apparent for a person skilled in the art, and generic principles defined herein can
Without departing from the spirit or scope of the present invention, to realize in other embodiments.Therefore, the present invention will not be limited
The embodiments shown herein is formed on, and is to fit to consistent with principles disclosed herein and features of novelty most wide
Scope.
Claims (8)
- A kind of 1. storage device method of testing, it is characterised in that including：Obtain the predetermined N class testings parameter of span；A parameter combination is chosen from each class testing parameter into test parameter group, is completed based on the test parameter group to depositing The performance test of equipment is stored up, in the test parameter group of Combination nova at least one parameter and the test parameter group having been combined into Parameter is different；Judge whether the group number for participating in the test parameter group of the performance test is less than calculated value, if so, then performing described from every A step of parameter combination is into test parameter group is chosen in a kind of test parameter, if it is not, then terminating to test, the calculated value For the parameter item number of each class testing parameter is multiplied into obtained value.
- 2. according to the method for claim 1, it is characterised in that judge to participate in the group of the test parameter group of the performance test Number is equal to after calculated value, in addition to：Performance evaluation is carried out to the storage device based on the test parameter and the performance index.
- 3. according to the method for claim 2, it is characterised in that described to be based on the test parameter and the performance index pair Before the storage device carries out performance evaluation, in addition to：Obtain the price of the storage device；It is described that performance evaluation is carried out to the storage device based on the test parameter and the performance index, including：Performance index divided by the price corresponding to each class testing parameter are obtained into corresponding ratio, based on the ratio to institute State storage device and carry out performance evaluation；It is described based on the ratio to the storage device carry out performance evaluation after, in addition to：Generate curve map of each class testing parameter with corresponding ratio.
- A kind of 4. storage device testing system, it is characterised in that including：Acquisition module, for obtaining the predetermined N class testings parameter of span；Composite module, for choosing a parameter combination from each class testing parameter into test parameter group, based on the test Parameter group completes performance test to storage device, at least one parameter and has been combined into the test parameter group of Combination nova Parameter in test parameter group is different；Judge module, for judging to participate in whether the group number of test parameter group of the performance test is less than calculated value, if so, then The composite module is prompted to choose a parameter combination from each class testing parameter into test parameter group, if it is not, then terminating Test, the calculated value are that the parameter item number of each class testing parameter is multiplied into obtained value.
- 5. system according to claim 4, it is characterised in that also include：Performance evaluation module, the group number for judging to participate in the test parameter group of the performance test in the judge module are equal to After calculated value, performance evaluation is carried out to the storage device based on the test parameter and the performance index.
- 6. system according to claim 5, it is characterised in that also include：Price acquisition module, for being deposited in the performance evaluation module based on the test parameter and the performance index to described Before storing up equipment progress performance evaluation, the price of the storage device is obtained；The performance evaluation module includes：Computing unit, for performance index divided by the price corresponding to each class testing parameter to be obtained into corresponding ratio, base Performance evaluation is carried out to the storage device in the ratio；Also include：Generation module, for the performance evaluation module be based on the ratio to the storage device carry out performance evaluation it Afterwards, curve map of each class testing parameter with corresponding ratio is generated.
- A kind of 7. storage device test equipment, it is characterised in that including：Memory, for storing computer program；Processor, for performing the computer program to realize any one of claims 1 to 3 storage device method of testing The step of.
- A kind of 8. computer-readable storage medium, it is characterised in that computer program is stored with the computer-readable storage medium, it is described Realized when computer program is executed by processor as described in any one of claims 1 to 3 the step of storage device method of testing.
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| CN110399257A (en) * | 2019-07-04 | 2019-11-01 | 上海创功通讯技术有限公司 | Detection method, electronic equipment and the computer readable storage medium of memory |
| CN112164417A (en) * | 2020-10-10 | 2021-01-01 | 上海威固信息技术股份有限公司 | Performance detection method and system of memory chip |
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| CN112164417A (en) * | 2020-10-10 | 2021-01-01 | 上海威固信息技术股份有限公司 | Performance detection method and system of memory chip |
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