CN107607851B - Voltage regulation system and method - Google Patents
Voltage regulation system and method Download PDFInfo
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- CN107607851B CN107607851B CN201710657743.XA CN201710657743A CN107607851B CN 107607851 B CN107607851 B CN 107607851B CN 201710657743 A CN201710657743 A CN 201710657743A CN 107607851 B CN107607851 B CN 107607851B
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Abstract
The invention discloses a voltage regulation system and a method. Wherein, this system includes: a chip to be tested; the power supply management chip is used for outputting voltage to the chip to be tested; the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output by the power management chip to the chip to be tested; one end of the power resistor is connected with the power management chip, and the other end of the power resistor is connected with the chip to be tested; the current detection chip is used for measuring a voltage difference value at two ends of the power resistor; and the microcontroller is connected with the programmable potentiometer through the first serial control interface and is used for setting the initial potential of the programmable potentiometer, and the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be detected. The invention solves the technical problems of low accuracy of voltage adjustment and low detection efficiency in chip detection in the prior art.
Description
Technical Field
The invention relates to the field of chip detection, in particular to a voltage adjusting system and method.
Background
In the related art, a new chip needs to be checked before it leaves a factory, a working voltage and a working current of the chip need to be detected when the new chip is checked, and an accurate value of the working voltage and the working current of the chip is needed in a verification stage of the chip, so that power consumption of the chip is determined. Fig. 1 is a schematic diagram of a voltage regulation system according to the prior art, as shown in fig. 1, a power management chip 11 outputs voltage and current to a chip 12 to be tested; detecting the current output to the chip 12 to be detected through an ammeter 15, and detecting the voltage output to the chip 12 to be detected through a voltmeter 16; the voltage and current values are received by the manual regulation potentiometer 13, so that the voltage and current output by the power management chip 11 are regulated; the adaptive resistor 14 may be a resistor that conducts the leaked electrical energy to ground. In the scheme shown in fig. 1, an ammeter is connected in series between the power management chip and the chip to be tested to measure current, and a voltmeter is used to measure voltage. In order to ensure that the voltage of the input end of the chip to be measured is kept at a rated voltage value, a manual regulation potentiometer is required to be adjusted to increase the output voltage of the power management chip, and in this case, the voltage change speed is higher than the manual regulation speed, so that the accuracy of voltage regulation is low; and the chip to be tested may have a plurality of power inputs, so the whole testing process is time-consuming and labor-consuming.
Aiming at the problems of low accuracy of voltage adjustment and low detection efficiency in chip detection in the prior art, no effective solution is provided at present.
Disclosure of Invention
The embodiment of the invention provides a voltage adjusting system and method, which at least solve the technical problems of low accuracy of voltage adjustment and low detection efficiency in chip detection in the prior art.
According to an aspect of an embodiment of the present invention, there is provided a voltage adjustment system including: a chip to be tested; the power management chip is used for outputting voltage to the chip to be tested; the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output by the power management chip to the chip to be tested; one end of the power resistor is connected with the power management chip, and the other end of the power resistor is connected with the chip to be tested; the current detection chip is used for measuring the voltage difference value of the power resistor; and the microcontroller is connected with the programmable potentiometer through a first serial control interface and is used for setting the initial potential of the programmable potentiometer, and the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be detected.
Further, the voltage regulation system further includes: the conversion unit is used for converting the voltage difference value into an analog voltage signal; and one end of the analog-to-digital conversion chip is connected with the conversion unit, and the other end of the analog-to-digital conversion chip is connected with the microcontroller and is used for converting the analog voltage signal into a digital voltage signal and sending the digital voltage signal to the microcontroller.
Further, the microcontroller comprises: the first calculation unit is used for calculating according to the digital voltage signal and the resistance value of the power resistor to obtain a current value; the second calculation unit is used for calculating based on the current value and the resistance value of the power resistor to obtain a voltage drop value of the voltage output to the chip to be tested; and the control unit is used for controlling the programmable potentiometer based on the voltage drop value so as to adjust the voltage output of the power management chip to the chip to be tested.
Further, the voltage regulation system further includes: the acquisition unit is used for acquiring a voltage value of the input end of the chip to be detected after the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be detected; the third calculation unit is used for calculating the power consumption value of the chip to be detected based on the voltage value of the input end of the chip to be detected; and the output unit is used for outputting the power consumption value of the chip to be tested.
According to another aspect of the embodiments of the present invention, there is also provided a voltage adjustment method, including: acquiring voltage values at two ends of a power resistor, wherein one end of the power resistor is connected with a power management chip, and the other end of the power resistor is connected with a chip to be tested, and the power management chip is used for outputting voltage to the chip to be tested; determining a voltage difference value flowing through two ends of the power resistor according to the voltage values of the two ends of the power resistor; and controlling a programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be detected, wherein the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output of the power management chip to the chip to be detected.
Further, controlling a programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be tested further comprises: determining a current value according to the voltage difference value and the resistance value of the power resistor; converting the current value into an analog voltage signal; converting the analog voltage signal to a digital voltage signal; and controlling a programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor so as to adjust the voltage output of the power management chip to the chip to be tested.
Further, controlling a programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested comprises: acquiring a digital voltage value represented by the digital voltage signal; determining a voltage drop value of the voltage output to the chip to be tested according to the digital voltage value and the resistance value of the power resistor; determining a voltage adjustment value output to the chip to be tested according to the voltage drop value and a preset output voltage value; and adjusting the voltage output of the power management chip to the chip to be tested according to the voltage adjustment value.
Further, the method further comprises: acquiring the current value; calculating the power consumption value of the chip to be tested based on the current value and a preset voltage output value; and outputting the power consumption value of the chip to be tested.
According to another aspect of the embodiments of the present invention, there is also provided a storage medium including a stored program, wherein the program executes the voltage adjustment method of any one of the above embodiments.
According to another aspect of the embodiments of the present invention, there is also provided a processor, configured to execute a program, where the program executes the voltage adjustment method described in any one of the above embodiments.
In the embodiment of the invention, when the performance of the chip to be detected is detected, the programmable potentiometer is used for controlling the power management chip to output voltage to the chip to be detected, the current detection chip is used for detecting the voltage difference value flowing through the power resistor, and the microcontroller is used for controlling the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip. In the embodiment, the voltage difference value is detected through the current detection chip, so that the voltage adjustment value is determined, the voltage of the chip to be detected is in accordance with the standard, and the voltage output to the chip to be detected can be accurately adjusted through the microcontroller and the programmable potentiometer. The change value of the voltage can be accurately detected through the current detection chip and the power resistor, so that the technical problems of low accuracy of voltage adjustment and low detection efficiency in the prior art when the chip is detected are solved, and the effect of accurately adjusting the voltage output value of the chip to be detected is achieved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a schematic diagram of a system for voltage regulation according to the prior art;
FIG. 2 is a schematic diagram of a voltage regulation system according to an embodiment of the present invention;
FIG. 3 is a flow chart of a voltage regulation method according to the present invention;
FIG. 4 is a schematic diagram of an alternative voltage regulation system according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Some terms or nouns referred to in the embodiments of the present invention are explained below:
voltage drop: the change in potential (potential) with respect to the same reference point after the current flows through the load is called a voltage drop, and the voltage drop generated when the current passes through the resistor is the voltage drop across the resistor.
Fig. 2 is a schematic diagram of a voltage regulation system according to an embodiment of the present invention, as shown in fig. 2, the system including:
a chip to be tested 21;
the power management chip 22 is used for outputting voltage to the chip to be tested;
the programmable potentiometer 23 is connected with the power management chip and is used for controlling the voltage output by the power management chip to the chip to be tested;
one end of the power resistor 24 is connected with the power management chip, and the other end of the power resistor is connected with the chip to be tested;
the current detection chip 25 is configured to measure a voltage difference of the power resistor, where the voltage difference may be a voltage difference across the power resistor when the power management chip outputs the power resistor to the chip to be detected;
and the microcontroller 26 is connected with the programmable potentiometer through the first serial control interface and is used for setting the initial potential of the programmable potentiometer, and the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be tested.
In the above embodiment, when detecting the performance of the chip 21 to be tested, the programmable potentiometer 23 may control the power management chip 22 to output a voltage to the chip 21 to be tested, the current detection 25 may detect a voltage difference of the power resistor 24, and the microcontroller 26 may control the programmable potentiometer based on the voltage difference, so as to adjust the voltage output of the power management chip. In this embodiment, the voltage difference is detected by the current detection chip 25 to determine the voltage adjustment value, so that the voltage of the chip to be tested is in accordance with the standard, and the voltage output to the chip to be tested can be accurately adjusted by the microcontroller 26 and the programmable potentiometer 23. The current detection chip 25 and the power resistor 24 can accurately detect the voltage variation value, so that the technical problems of low accuracy of voltage adjustment and low detection efficiency in chip detection in the prior art are solved, and the effect of accurately adjusting the voltage output value of the chip to be detected is achieved.
The chip to be tested in the embodiment can be a new chip, and the performance of the chip needs to be detected before delivery, so that the qualification rate of the delivered chip is ensured. Before detecting the chip to be tested, a rated voltage of the chip to be tested may be output to the microcontroller, for example, the rated voltage is 20V, where the rated voltage may be the most suitable voltage of the chip to be tested, and when the chip to be tested operates at the rated voltage, the chip to be tested has higher and more accurate working efficiency. In this application, for such a situation, the above embodiment may be utilized to obtain a power consumption value of the voltage output by the power management chip to the chip to be tested and a voltage drop value of the output voltage, where the voltage output to the chip to be tested at the first time may be the above rated voltage, and the output voltage of the power management chip is adjusted by calculating the voltage drop value.
Optionally, for the voltage adjustment system, after the system is powered on, the microcontroller may send an initial potential setting to the programmable potentiometer through the interface, and the power management chip outputs an initial voltage (the initial voltage may be the above-mentioned rated voltage).
Optionally, the microcontroller may calculate an adjustment value of the output voltage according to the detected voltage drop value, and output the adjustment value to the programmable potentiometer through an interface (e.g., a serial interface), so that the programmable potentiometer writes an adjustment code that can be understood by the power management chip, and the power management chip outputs a corresponding voltage according to the adjustment code output by the programmable potentiometer.
The power resistor may be between the power management chip and the chip to be tested, and when the power management chip outputs a voltage to the chip to be tested, a change value of the voltage may be determined by detecting a change of the voltage of the power resistor, and two ends of the power resistor may be connected to the power management chip and the chip to be tested, respectively.
In another optional implementation manner, after the current detection chip detects the voltage values at the two ends of the power resistor, a voltage difference value can be obtained, a current value is calculated through the voltage difference value and the resistance value of the power resistor, and the current value is output to the microcontroller so that the microcontroller can adjust the voltage according to the current value. The resistance value of the power resistor can be changed, and different power resistors can be selected according to the rated voltage values of different chips to be tested, for example, a 3W power resistor can be selected.
Optionally, the voltage regulation system further includes: the conversion unit is used for converting the current value into an analog voltage signal; and one end of the analog-to-digital conversion chip is connected with the conversion unit, and the other end of the analog-to-digital conversion chip is connected with the microcontroller and is used for converting the analog voltage signal into a digital voltage signal and sending the digital voltage signal to the microcontroller.
Through the above embodiment, the current value detected by the current detection chip can be converted into the digital voltage signal which can be understood by the microcontroller by using the conversion unit, and the conversion unit can be an analog-to-digital conversion module which converts the analog voltage signal into the digital voltage signal. In this application, the voltage signal output by the current detection chip is an analog signal, and not a digital signal, and in this case, the voltage signal needs to be converted by a conversion unit for use by the microcontroller.
In another alternative embodiment, the microcontroller comprises: the first calculation unit is used for calculating according to the digital voltage signal and the resistance value of the power resistor to obtain a current value; the second calculation unit is used for calculating based on the current value and the resistance value of the power resistor to obtain a voltage drop value of the voltage output to the chip to be tested; and the control unit is used for controlling the programmable potentiometer based on the voltage drop value so as to adjust the voltage output of the power management chip to the chip to be tested.
Optionally, the voltage regulation system further includes: the acquisition unit is used for acquiring a voltage value of the input end of the chip to be detected after the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be detected; the third calculation unit is used for calculating the power consumption value of the chip to be detected based on the voltage value of the input end of the chip to be detected; and the output unit is used for outputting the power consumption value of the chip to be tested.
Through the above embodiment, the power consumption value of the chip to be tested can be calculated, the power consumption value can be the product of the voltage value of the input end of the chip to be tested and the current value of the voltage value, and after the power consumption value is calculated, the power consumption of the power management chip output to the chip to be tested can be determined.
Optionally, in this implementation, after the power consumption value is obtained, the power consumption value may be output to the terminal through an interface of the microcontroller, so that a user may check the power consumption value output by the power management chip to the chip to be detected, and accuracy of detecting the chip to be detected is improved.
Through the implementation mode, the voltage difference value at two ends of the power resistor can be detected by using the current detection chip, so that the voltage drop value output to the chip to be detected by the power management chip is determined, the voltage output value is adjusted according to the voltage drop value, and finally the voltage output to the chip to be detected is adjusted through the programmable potentiometer. Therefore, the output voltage of the chip to be tested can be flexibly adjusted, and the effect of effectively adjusting the output voltage of the chip to be tested is achieved.
In accordance with an embodiment of the present invention, there is provided a method embodiment of voltage regulation, it being noted that the steps illustrated in the flowchart of the figure may be performed in a computer system, such as a set of computer-executable instructions, and that while a logical order is illustrated in the flowchart, in some cases the steps illustrated or described may be performed in an order different than here.
Fig. 3 is a flow chart of a voltage regulation method according to the present invention, as shown in fig. 3, the method comprising:
step S301, obtaining voltage values at two ends of a power resistor, wherein one end of the power resistor is connected with a power management chip, and the other end of the power resistor is connected with a chip to be tested, and the power management chip is used for outputting voltage to the chip to be tested;
step S303, determining a voltage difference value flowing through two ends of the power resistor according to the voltage values at the two ends of the power resistor;
and step S305, controlling a programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be tested, wherein the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output of the power management chip to the chip to be tested.
Through the embodiment, the programmable potentiometer can be controlled by acquiring the voltage difference value at the two ends of the power resistor, so that the voltage output of the power management chip to the chip to be tested is adjusted. In this embodiment, the voltage drop value output from the power management chip to the chip to be detected is determined by detecting the voltage difference of the power resistor, so that the voltage output is accurately adjusted, the technical problems of low accuracy and low detection efficiency of voltage adjustment when the chip is detected in the prior art are solved, and the effect of accurately adjusting the voltage output value of the chip to be detected is achieved.
Optionally, the controlling the programmable potentiometer based on the voltage difference to adjust the voltage output of the power management chip to the chip to be tested further includes: determining a current value according to the voltage difference value and the resistance value of the power resistor; converting the current value into an analog voltage signal; converting the analog voltage signal into a digital voltage signal; and controlling the programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested.
By this embodiment, the current value may be converted into a digital voltage signal, which may be a voltage signal understood by the microcontroller, by which the voltage output to the chip under test may be adjusted. In addition, the voltage output of the power management chip can be adjusted by adjusting the programmable potentiometer through the embodiment.
Optionally, controlling the programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested includes: acquiring a digital voltage value represented by the digital voltage signal; determining a voltage drop value of the voltage output to the chip to be tested according to the digital voltage value and the resistance value of the power resistor; determining a voltage adjustment value output to the chip to be tested according to the voltage drop value and a preset output voltage value; and adjusting the voltage output of the power management chip to the chip to be detected according to the voltage adjustment value.
With the above embodiment, the current value may be calculated according to a ratio of the voltage difference detected by the current detection chip to the resistance value of the power resistor. And, when calculating the voltage drop value, it may be obtained by multiplying the calculated current value by the resistance value of the power resistor. In the above embodiment, when the voltage output of the power management chip is adjusted, the voltage drop value is calculated by the microcontroller, and the voltage drop value is sent to the programmable potentiometer, so that the programmable potentiometer writes a code of the voltage drop value, where the code may be a voltage value for controlling the power management chip to output to the chip to be tested.
In another optional embodiment, the method further comprises: acquiring a current value; calculating a power consumption value of the chip to be tested based on the current value and a preset voltage output value; and outputting the power consumption value of the chip to be tested.
Through the embodiment, the power consumption value can be calculated, and the power consumption value can be the product of the current value and the voltage value of the input end of the chip to be tested. Optionally, after the power consumption value is calculated, the power consumption value may be sent to the terminal for the user to view.
The following are specific implementations according to embodiments of the present invention.
Fig. 4 is a schematic diagram of an alternative voltage regulation system according to an embodiment of the present invention, as shown in fig. 4, the system includes: the device comprises a chip 41 to be tested, a power management chip 42, a programmable potentiometer 43, a power resistor 44, a current detection chip 45, an analog-to-digital conversion chip 46, a microcontroller 47 and an adaptive resistor 48.
The microcontroller 47 includes a serial control interface 1 and a serial control interface 2, and the microcontroller 47 acquires the digital voltage signal of the analog-to-digital conversion chip 46 through the serial control interface 2 and sends the calculated voltage drop value to the programmable potentiometer 43 through the serial control interface 1.
Optionally, the programmable potentiometer 43 may send a value of the voltage output to the power management chip 42, so as to control the voltage output of the power management chip 42, and the power management chip 42 may output a corresponding voltage to the chip 41 to be tested.
Optionally, in the embodiment shown in fig. 4, the operation mode may include the following steps:
s401, after the system (the voltage adjusting system) is powered on, the microcontroller 47 gives an initial potential setting to the programmable potentiometer through the serial control interface 1, and according to the potential setting, the power management chip outputs an initial voltage to the chip to be tested. The set voltage value of the initial potential can be the rated voltage of the chip to be tested.
S402, inputting the rated voltage value of the chip 41 to be tested by the microcontroller terminal 47. The rated voltage value may be a preset voltage value of the chip to be tested, for example, 20V.
And S403, the current detection chip 45 measures the voltage difference value flowing through the power resistor, obtains a current result according to the voltage difference value and the resistance value of the power resistor, converts the current result into a voltage signal and outputs the voltage signal to the analog-to-digital conversion chip.
S404, the analog-to-digital conversion chip converts the analog voltage signal into a digital voltage signal.
S405, the microcontroller 47 reads the digital voltage value obtained by the analog-to-digital conversion chip through the serial control interface 2, and calculates the current value flowing through the power resistor according to the digital voltage value and the resistance value of the power resistor.
And S406, the microcontroller 47 obtains the voltage drop on the power resistor according to the current value and the resistance value of the power resistor, so as to control the programmable potentiometer to adjust the voltage output of the power management chip, and ensure that the voltage at the input end of the chip to be tested is the rated voltage.
S407, after the microcontroller 47 obtains the current value of the chip 41 to be tested under the rated voltage, the voltage is multiplied by the current to obtain the result of power consumption, the result is output to the serial port terminal, and the tester directly records the result.
Different power resistance values, current detection chips and analog-to-digital conversion chips can be selected, so that different current measurement accuracies can be realized. The current detection chip and the analog-to-digital conversion chip may be of the types of the above embodiments.
Different programmable potentiometers can be selected, so that different voltage adjustment precisions can be realized.
Through the embodiment, the programmable potentiometer can be controlled by acquiring the voltage difference value at the two ends of the power resistor, so that the voltage output of the power management chip to the chip to be tested is adjusted. In the implementation mode, the voltage difference output from the power management chip to the chip to be detected can be determined by detecting the voltage difference at the two ends of the power resistor, so that the voltage output can be accurately adjusted, the technical problems of low accuracy and low detection efficiency of voltage adjustment when the chip is detected in the prior art are solved, and the voltage output value of the chip to be detected can be accurately adjusted.
Optionally, the chip 41 to be tested may include a plurality of models, such as ANX7625, and the power management chip 42 may also include a plurality of models, such as AP 3406; the programmable potentiometer 43 may be MCP41010, the power resistor 44 may be a resistor of 50m Ω/0.1W, and the current detection chip 45 described above may be MAX 472; for the analog-to-digital conversion chip 46, it may be ADS 1146; for microcontroller 47, it may be STM32F103RBT 6; for the above-mentioned adapting resistor 48, it may be a 2K Ω/0.01W resistor.
The power resistor may be between the power management chip 42 and the chip 41 to be tested, and when the power management chip outputs a voltage to the chip to be tested, a change value of the voltage may be determined by detecting a change of a current at two ends of the power resistor, where the two ends of the power resistor may be respectively connected to the power management chip 42 and the chip 41 to be tested.
According to another aspect of the embodiments of the present invention, there is also provided a storage medium including a stored program, wherein the program performs the voltage adjustment method of any one of the above embodiments.
The program may execute the following voltage adjustment method: acquiring voltage values at two ends of a power resistor, wherein one end of the power resistor is connected with a power management chip, and the other end of the power resistor is connected with a chip to be tested, and the power management chip is used for outputting voltage to the chip to be tested; determining a voltage difference value flowing through two ends of the power resistor according to the voltage values at the two ends of the power resistor; and controlling the programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be tested, wherein the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output of the power management chip to the chip to be tested.
Optionally, controlling the programmable potentiometer based on the voltage difference to adjust the voltage output of the power management chip to the chip to be tested further includes: determining a current value according to the voltage difference value and the resistance value of the power resistor; converting the current value into an analog voltage signal; converting the analog voltage signal into a digital voltage signal; and controlling the programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested.
For the above embodiment, controlling the programmable potentiometer based on the digital voltage signal and the resistance of the power resistor to adjust the voltage output of the power management chip to the chip to be tested includes: acquiring a digital voltage value represented by the digital voltage signal; determining a voltage drop value of the voltage output to the chip to be tested according to the digital voltage value and the resistance value of the power resistor; determining a voltage adjustment value output to the chip to be tested according to the voltage drop value and a preset output voltage value; and adjusting the voltage output of the power management chip to the chip to be detected according to the voltage adjustment value.
In another optional embodiment, the method further comprises: acquiring a current value; calculating a power consumption value of the chip to be tested based on the current value and a preset voltage output value; and outputting the power consumption value of the chip to be tested.
According to another aspect of the embodiments of the present invention, there is also provided a processor, where the processor is configured to execute a program, where the program executes the voltage adjustment method in any one of the above embodiments.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (7)
1. A voltage regulation system, comprising:
a chip to be tested;
the power management chip is used for outputting voltage to the chip to be tested;
the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output by the power management chip to the chip to be tested;
one end of the power resistor is connected with the power management chip, and the other end of the power resistor is connected with the chip to be tested;
the current detection chip is used for measuring a voltage difference value at two ends of the power resistor;
the microcontroller is connected with the programmable potentiometer through a first serial control interface and is used for carrying out initial potential setting on the programmable potentiometer, the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be tested,
the microcontroller comprises: the first calculating unit is used for calculating according to the digital voltage signal converted by the analog-to-digital conversion chip and the resistance value of the power resistor to obtain a current value; the second calculation unit is used for calculating based on the current value and the resistance value of the power resistor to obtain a voltage drop value on the power resistor; and the control unit is used for controlling the programmable potentiometer based on the voltage drop value so as to adjust the voltage output of the power management chip to the chip to be tested.
2. The voltage regulation system of claim 1, further comprising:
the conversion unit is used for converting the voltage difference value into an analog voltage signal;
and one end of the analog-to-digital conversion chip is connected with the conversion unit, and the other end of the analog-to-digital conversion chip is connected with the microcontroller and is used for converting the analog voltage signal into a digital voltage signal and sending the digital voltage signal to the microcontroller.
3. The voltage regulation system of claim 1, further comprising:
the acquisition unit is used for acquiring a voltage value of the input end of the chip to be detected after the microcontroller controls the programmable potentiometer based on the voltage difference value so as to adjust the voltage output of the power management chip to the chip to be detected;
the third calculation unit is used for calculating the power consumption value of the chip to be detected based on the voltage value of the input end of the chip to be detected;
and the output unit is used for outputting the power consumption value of the chip to be tested.
4. A method of voltage regulation, comprising:
acquiring voltage values at two ends of a power resistor, wherein one end of the power resistor is connected with a power management chip, and the other end of the power resistor is connected with a chip to be tested, and the power management chip is used for outputting voltage to the chip to be tested;
determining a voltage difference value flowing through two ends of the power resistor according to the voltage values of the two ends of the power resistor;
controlling a programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be tested, wherein the programmable potentiometer is connected with the power management chip and is used for controlling the voltage output of the power management chip to the chip to be tested,
controlling a programmable potentiometer based on the voltage difference value to adjust the voltage output of the power management chip to the chip to be tested further comprises: determining a current value according to the voltage difference value and the resistance value of the power resistor; converting the current value into an analog voltage signal; converting the analog voltage signal to a digital voltage signal; controlling a programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested;
controlling a programmable potentiometer based on the digital voltage signal and the resistance value of the power resistor to adjust the voltage output of the power management chip to the chip to be tested comprises: acquiring a digital voltage value represented by the digital voltage signal; determining a voltage drop value on the power resistor according to the digital voltage value and the resistance value of the power resistor; determining a voltage adjustment value output to the chip to be tested according to the voltage drop value and a preset output voltage value; and adjusting the voltage output of the power management chip to the chip to be tested according to the voltage adjustment value.
5. The voltage regulation method of claim 4, further comprising:
acquiring the current value;
calculating the power consumption value of the chip to be tested based on the current value and the voltage output value of the power management chip to the chip to be tested;
and outputting the power consumption value of the chip to be tested.
6. A storage medium characterized by comprising a stored program, wherein the program executes the voltage adjustment method according to any one of claims 4 to 5.
7. A processor, characterized in that the processor is configured to run a program, wherein the program is configured to execute the voltage adjustment method according to any one of claims 4 to 5 when running.
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| CN108646903A (en) * | 2018-05-18 | 2018-10-12 | 济南浪潮高新科技投资发展有限公司 | A kind of realization radar data processing board CPU core electro dynamic method of adjustment and system |
| CN110826291B (en) * | 2018-07-23 | 2022-06-07 | 迈普通信技术股份有限公司 | Method and device for configuring output voltage value of direct current-Direct Current (DC) -DC power supply |
| CN110187256A (en) * | 2019-04-26 | 2019-08-30 | 深圳市致宸信息科技有限公司 | A kind of apparatus for testing chip and method |
| CN111289873B (en) * | 2019-05-10 | 2022-10-25 | 展讯通信（上海）有限公司 | Chip testing method, chip parameter setting method and chip |
| CN111610816B (en) * | 2020-05-27 | 2022-03-25 | 上海联影医疗科技股份有限公司 | Power supply voltage calibration device and power supply voltage calibration method |
| CN111638441A (en) * | 2020-06-04 | 2020-09-08 | 硅谷数模(苏州)半导体有限公司 | Chip power consumption test circuit and method and chip |
| CN111610433A (en) * | 2020-06-17 | 2020-09-01 | 江西联智集成电路有限公司 | Chip power-on and power-off reset test method and device |
| CN114428204B (en) * | 2020-10-29 | 2023-09-01 | 长鑫存储技术有限公司 | Chip output characteristic adjusting method and device |
| US12002751B2 (en) | 2020-10-29 | 2024-06-04 | Changxin Memory Technologies, Inc. | Adjustment method and device for chip output characteristics |
| CN112882560B (en) * | 2021-02-04 | 2024-05-03 | Oppo广东移动通信有限公司 | Power management method, power device, electronic apparatus, and storage medium |
| CN113437990B (en) * | 2021-06-18 | 2022-07-01 | 珠海美佳音科技有限公司 | Chip detector |
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| CN101968668B (en) * | 2009-10-22 | 2013-03-27 | 中兴通讯股份有限公司 | Power supply chip and method for adjusting output voltage of same |
| CN102721916A (en) * | 2012-06-29 | 2012-10-10 | 福建星网锐捷网络有限公司 | Power supply voltage-regulating testing device |
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| CN105988493B (en) * | 2015-01-29 | 2017-09-22 | 中芯国际集成电路制造(上海)有限公司 | Voltage regulating device and voltage adjusting method |
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