CN107591309B - The concurrent working method of ion trap - Google Patents

The concurrent working method of ion trap Download PDF

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CN107591309B
CN107591309B CN201710765283.2A CN201710765283A CN107591309B CN 107591309 B CN107591309 B CN 107591309B CN 201710765283 A CN201710765283 A CN 201710765283A CN 107591309 B CN107591309 B CN 107591309B
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ion
ion trap
mode
daughter
trap
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CN107591309A (en
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余泉
李曼
倪凯
钱翔
王晓浩
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Shenzhen Graduate School Tsinghua University
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Shenzhen Graduate School Tsinghua University
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Abstract

A kind of concurrent working method of ion trap a, comprising: ion trap S1, is divided at least two independent daughter ion traps;S2, discriminatively to described at least two independent daughter ion traps apply voltages, so that at least two independent daughter ion trap concurrently works in different ion processing modes;Wherein, the ion processing mode includes ion incidence mode, ion refrigerating mode and ion analysis mode.By the way that an ion trap is divided, obtain at least two daughter ion traps that can work independently, and different voltage is applied to different daughter ion traps, make its work in different states, so that the incidence of ion, cooling, analytic process become to synchronize progress by sequentially carrying out.Shorten the ion trap duty cycle with this, improves ion analysis efficiency.

Description

The concurrent working method of ion trap
Technical field
The present invention relates to ion trap mass spectrometer fields, and in particular to a kind of concurrent working method of ion trap.
Background technique
Mass spectrography is a kind of and spectroscopic methodology spectrum method arranged side by side, and mass spectrograph is to divide according to mass-to-charge ratio size ion From and identification, analyze sample to be tested, determine the instrument of material composition.Ion strap mass analyzer is according to different modes by ion The sample ions generated in source the instrument separated by the size of mass-to-charge ratio m/z is mass spectrometric important composition component, is located at ion Between source and detector.Generally, motion process of the ion in ion trap is divided into four-stage: ion incidence, cooling, matter Amount analysis is removed, this four phase sequence carries out.For annular ion trap, high frequency voltage amplitude is loaded on two cylinder electrodes Fixed value (RF) loads resonance excitation voltage fixed amplitude (AC) on two annular electrodes, according to the size of RF voltage, ion trap The ion of a certain mass range can be captured, at this point, ion is circumferentially uniformly distributed in ion trap;Ion trap can store up Deposit ion, after ion accumulation to certain amount, scan AC and RF voltage value, ions by mass successively leave from high to low from Sub- trap, is detected by detector.
For the occasion quickly detected, the detection efficiency of sample is critically important.The analysis efficiency for improving ion trap is to improve matter The important means of spectrometer detection efficiency.Therefore how to improve the analysis efficiency of ion trap is this field technical problem to be solved.
Summary of the invention
In existing ion trap, incidence, cooling, analysis and the removing Four processes phase sequence of ion are carried out, in order to mention The analysis efficiency of macroion trap, the invention proposes a kind of concurrent working methods of ion trap, enable to incident, cooling, divide Analysis process subregion in annular ion trap carries out simultaneously, realizes and analyzes while cooling, and Bian Jinhang ion analysis side supplements sample Ion into ion trap, with this come achieve the purpose that improve ion trap analysis efficiency, to realize mass spectrometric efficient detection.
Provided technical solution is as follows for the above-mentioned purpose by the present invention:
A kind of concurrent working method of ion trap, comprising the following steps:
S1, an ion trap is divided at least two independent daughter ion traps;
S2, discriminatively to described at least two independent daughter ion traps apply voltages, so that described at least two is independent Daughter ion trap concurrently work in different ion processing modes;
Wherein, the ion processing mode includes ion incidence mode, ion refrigerating mode and ion analysis mode.
Ion trap is divided into multiple independent operation intervals, and each work first by above-mentioned control method provided by the invention Make the independent powered operation in section, different operation intervals may be at same or different working condition, so that originally can only An ion trap for carrying out one of operating mode simultaneously forms multiple independent daughter ion traps, and multiple-working mode is same in trap Shi Binglie is carried out, and than the ion trap of single mode sequential working, work efficiency is high, such as ion analysis can be carried out with side, and side supplements sample Product ion (ion incidence) into ion trap;Side carries out ion incidence, the cooling of Bian Jinhang ion etc..
Further, each daughter ion trap being partitioned into includes electrically independent first to fourth electrode of difference, Wherein, second electrode and third electrode are stacked with interval in the axial direction of the ion trap, and sandwiched radially Between first electrode and the 4th electrode;Described first and the 4th is equipped with ion entrance on electrode, and described second and third Ion outlet is equipped on electrode.
Further, alive mode is applied to a daughter ion trap and includes first to tertiary voltage applying mode, in which: First voltage applying mode is so that a daughter ion trap is operable with the mode of ion incidence mode;Second voltage applying mode is So that a daughter ion trap is operable with the mode of ion refrigerating mode;Tertiary voltage applying mode is so that a daughter ion trap can work Make in the mode of ion analysis mode.
Further, first voltage applying mode specifically includes: applying first amplitude respectively to second and third electrode Resonance excitation voltage, and, to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively;Second voltage application side Formula specifically includes: apply the resonance excitation voltage of third amplitude respectively to second and third electrode, and, it is electric to first and the 4th Pole applies the high frequency voltage of the 4th amplitude respectively;Tertiary voltage applying mode specifically includes: applying respectively to second and third electrode Add frequency and the scannable resonance excitation voltage of amplitude, and, to first and the 4th electrode apply frequency and amplitude respectively and can sweep The high frequency voltage retouched;Wherein, first amplitude is different with third amplitude, the second amplitude and the 4th amplitude difference;Also, each voltage is applied The voltage magnitude that add mode is applied is not 0.
Further, when the ion trap is divided into two independent daughter ion traps: the first daughter ion trap and second When daughter ion trap, step S2 is specifically included:
When the ion trap is started to work, voltage is applied to the first daughter ion trap with first voltage applying mode, simultaneously Apply voltage to the second daughter ion trap with second voltage applying mode, so that the ion trap can carry out ion incidence and cold simultaneously But;
When ion incidence for a period of time after: with tertiary voltage applying mode to the first daughter ion trap apply voltage;Alternatively, with Second voltage applying mode applies voltage to the first daughter ion trap, while being applied with tertiary voltage applying mode to the second daughter ion trap Making alive, so that the ion trap can carry out ion cooling and analysis simultaneously;Or with tertiary voltage applying mode to Two daughter ion traps apply voltage, so that the ion trap can carry out ion incidence and analysis simultaneously.
Further, when the ion trap is divided into three or more independent daughter ion traps, step S2 is specifically wrapped It includes:
When the ion trap is started to work, applied respectively to different daughter ion traps with first to tertiary voltage applying mode Making alive, so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.
Further, when the ion trap is divided into three or more independent daughter ion traps, step S2 is specifically wrapped It includes:
When the ion trap is started to work, applied respectively to different daughter ion traps with the first and second voltage applying modes Making alive, so that the ion trap can carry out ion incidence and cooling simultaneously;
When ion incidence for a period of time after: with tertiary voltage applying mode to working in ion incidence mode and/or work Apply voltage in at least partly daughter ion trap of ion refrigerating mode, so that the ion trap can carry out ion incidence, cold simultaneously But it and analyzes, or carries out ion cooling and analysis simultaneously.
Further, the method also includes: when ion analysis for a period of time and obtains meeting and expected analyzes result When, the voltage applied on whole daughter ion traps is uniformly set to 0, the ion trap is made to carry out the removing of residual ion.
Further, the divided ion trap is closed hoop ion trap.
Further, the ion entrance and the ion outlet are the slit on each electrode.
Detailed description of the invention
Fig. 1 is the ion trap schematic diagram that can carry out two kinds of operating modes side by side of one embodiment of the invention;
Fig. 2 is the top view of ion trap shown in Fig. 1;
Fig. 3 is the side view of ion trap shown in Fig. 1;
Fig. 4 is the sectional view of ion trap shown in Fig. 1;
Fig. 5 is the top view of Fig. 4;
Fig. 6 is the explosive view of ion trap shown in Fig. 1;
A kind of voltage that Fig. 7 is divided into the circular ring shape ion trap of two independent daughter ion traps applies exemplary diagram.
Specific embodiment
The invention will be further described with preferred embodiment with reference to the accompanying drawing.
Ion trap carries out the three phases that quality analysis has to undergo to sample ions: ion incidence, ion Cooling and ion analysis.Wherein, ion analysis refers to the scanning with excitation voltage and high frequency voltage, by the ion of different mass-to-charge ratioes Ion trap is scanned according to chronological order, realizes mass of ion analysis.In general, after completing ion analysis, need to from Sub- trap is purged, therefore further includes the stage that an ion is removed, refer to by ion trap fail to scan it is remaining from Son clears out, it is common practice that does not apply any voltage to ion trap, ion loses after constraint out of ion trap without fixation It projects to direction, this stage is primarily to avoid ion occur when different sample analysis next time mixing.
Traditional ion trap can only carry out a kind of operating mode in synchronization, specifically first carry out ion incidence, complete After to enter back into next stage ion cooling, complete it is cooling after just can enter next stage ion analysis.And the invention proposes one The novel ion trap of kind, it is that traditional ion trap is divided at least two independent daughter ion traps and is formed, and divides shape At each independent daughter ion trap between have gap 100, can refer to Fig. 1 to Fig. 3, which makes each daughter ion trap Between electrically isolate, different voltage can be applied respectively and execute different operating modes.Certainly, each independent daughter ion trap It may operate in identical mode, but at least two can be carried out simultaneously in the divided ion trap the invention aims to allow Kind operating mode (at least two in incident, cooling and analysis), the working efficiency of ion trap, therefore each independence are improved with this Daughter ion trap the case where all working in same mode herein without more describing.
Correspondingly, the present invention proposes a kind of concurrent working method of ion trap, this method comprises:
Step S1, an ion trap is divided at least two independent daughter ion traps;
Step S2, discriminatively apply voltage to described at least two independent daughter ion traps, so that described at least two Independent daughter ion trap concurrently works in different ion processing modes;Wherein, the ion processing mode includes that ion enters Emission mode, ion refrigerating mode and ion analysis mode.
In the particular embodiment, an ion trap can be divided into two, three, four etc. quantity it is unlimited (as long as Belong to protection scope of the present invention in two or more) daughter ion trap, also, even partition or uneven segmentation all may be used.Point Each daughter ion trap cut out includes the first, second, third and fourth electrode, and first to fourth electrode is electrically only respectively Vertical.Wherein, second electrode 20 and third electrode 30 are stacked with interval in the axial direction of the ion trap, and in diameter It is located between first electrode 10 and the 4th electrode 40 upwards, specifically refers to Fig. 1 and Fig. 4;In addition, in first electrode 10 and the 4th Be equipped with ion entrance on electrode 40, described second and third electrode on be equipped with ion outlet.For example, with reference to Fig. 6, when it In a sub- ion trap (being made of first electrode 10, second electrode 20, third electrode 30 and the 4th electrode 40) work in ion Channel of the ion entrance as ion incidence when incident mode, in first electrode 10 and the 4th electrode 40;And work as the son When ion trap works in ion analysis mode, first electrode 10 and ion entrance and the second electricity on the 4th electrode 40 The channel that ion outlet on pole and third electrode is projected as ion.And when the voltage of all daughter ion traps is all unloaded Afterwards, remaining ion is not bound in ion trap, can go out from the ion entrance and the ion outlet.Preferably, The ion entrance and the ion outlet are the slits in respective electrode.
For certain for allowing a daughter ion trap to work in Three models (incident, cooling, analysis), it is necessary to certain side Formula applies voltage to daughter ion trap, wherein defines three kinds of voltage applying modes --- and first to tertiary voltage applying mode, In: first voltage applying mode is so that a daughter ion trap is operable with the mode of ion incidence mode;Second voltage application side Formula is so that a daughter ion trap is operable with the mode of ion refrigerating mode;Tertiary voltage applying mode is so that a daughter ion trap It is operable with the mode of ion analysis mode.
In the particular embodiment, first voltage applying mode specifically includes: applying respectively to second and third electrode The resonance excitation voltage of one amplitude, and, to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively;Second voltage Applying mode specifically includes: apply the resonance excitation voltage of third amplitude respectively to second and third electrode, and, to the first He 4th electrode applies the high frequency voltage of the 4th amplitude respectively;Tertiary voltage applying mode specifically includes: to second and third electrode Apply frequency and the scannable resonance excitation voltage of amplitude respectively, and, to first and the 4th electrode apply frequency and width respectively It is worth scannable high frequency voltage.Wherein, first amplitude is different with third amplitude, the second amplitude and the 4th amplitude difference.Also, it is each The voltage magnitude that voltage applying mode is applied is not 0, and the size of amplitude is specifically and the size of ion trap and to be analyzed The mass charge ratio range of sample ions is related, is not limited thereto.
One exemplary embodiment 1 is provided, the ion trap is divided into two independent daughter ion traps, i.e. the first daughter ion Trap (being constituted by 10,20,30 and 40) and the second daughter ion trap (being constituted by 10 ', 20 ', 30 ' and 40 '), can refer to Fig. 1 to Fig. 6, But Fig. 1 does not constitute the limitation to the present embodiment to ion trap shape shown in fig. 6, and in such cases, step S2 is specifically included:
When the ion trap is started to work, voltage is applied to the first daughter ion trap with first voltage applying mode, simultaneously Apply voltage to the second daughter ion trap with second voltage applying mode, so that the ion trap can carry out ion incidence and cold simultaneously But.Specifically: applying the resonant excitation electricity of first amplitude respectively to the second electrode 20 and third electrode 30 of the first daughter ion trap It presses, while applying the high frequency voltage of the second amplitude respectively to the first electrode 10 of the first daughter ion trap and the 4th electrode 40, so that First daughter ion trap is operable with ion incidence mode;To second electrode 20 ' and third electrode 30 ' difference of the second daughter ion trap Apply the resonance excitation voltage of third amplitude, while being applied respectively to the first electrode 10 ' of the second daughter ion trap and the 4th electrode 40 ' Add the high frequency voltage of the 4th amplitude, so that the second daughter ion trap is operable with ion refrigerating mode.In this way, may make institute It states ion trap while carrying out the incidence and cooling of ion.
When ion incidence for a period of time after: with tertiary voltage applying mode to the first daughter ion trap apply voltage;Alternatively, with Second voltage applying mode applies voltage to the first daughter ion trap, while being applied with tertiary voltage applying mode to the second daughter ion trap Making alive, so that the ion trap can carry out ion cooling and analysis simultaneously;Or with tertiary voltage applying mode to Two daughter ion traps apply voltage, so that the ion trap can carry out ion incidence and analysis simultaneously.
One exemplary embodiment 2 is provided, the ion trap is divided into three or more independent daughter ion traps, this kind is implemented In example, step S2 is specifically included: when the ion trap is started to work, with first to tertiary voltage applying mode respectively to difference Daughter ion trap apply voltage so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.In such embodiment, Multiple daughter ion traps are divided into three parts, and the daughter ion trap of each section applies voltage in the same manner, so that three parts are sub Ion trap works in incident, cooling, analytical model respectively.For example, in total in 10 sub- ion traps, wherein 3 with first voltage Applying mode applies voltage, to work in ion incidence mode, two it is 7 outer in, 3 work in ion refrigerating mode, 4 work In ion analysis mode.
In above-described embodiment 2, working method that each daughter ion trap may also is that: when the ion trap is started to work When, apply voltage to different daughter ion traps respectively with the first and second voltage applying modes, so that the ion trap can be simultaneously Ion incidence and cooling are carried out, that is, multiple daughter ion traps are divided into two parts power supply, a part is with first voltage applying mode point Not Shi Jia voltage so that the daughter ion trap of this part all works in ion incidence mode;And another part is applied with second voltage Mode applies voltage respectively, so that the daughter ion trap of this another part all works in ion refrigerating mode.When one section of ion incidence After time: with tertiary voltage applying mode to working in ion incidence mode and/or work in at least portion of ion refrigerating mode Molecular ion trap applies voltage so that the ion trap can carry out ion incidence, cooling and analysis simultaneously, or carry out simultaneously from Son is cooling and analyzes.
Assuming that ion trap carries out cooling and during analyzing at the same time, discovery also requires supplementation with ion, then can be to The daughter ion trap that a portion is working applies voltage with first voltage applying mode again, that is, extraction a part is just The daughter ion trap of ion analysis and cooling procedure is worked in carry out the incidence of ion, to supplement ion.
When ion analysis has carried out a period of time and obtained meeting expected analysis result, analysis can be completed.At this time A step of ion is removed preferably can be also carried out, that is, unloads the voltage on whole daughter ion traps, so that also surplus in ion trap Remaining ion loses constraint, so that ion is cleared out of ion trap, ion at this time be no fixed-direction from ion trap It is interior to come out, be different under ion analysis mode, there is a certain voltage constraint, ion according to its mass-to-charge ratio size, in an orderly manner with certain Fixed-direction projects.
In a preferred embodiment of the invention, the whole shape of the ion trap of at least two operating modes can be carried out simultaneously Shape is closed hoop, such as circular ion trap exemplified by Fig. 1 to Fig. 6, also such as carries out letter to the circular ion trap of this kind The ion of the shapes such as oval ring-type, rectangular ring, triangle ring-type, square ring-type and the other polygonal ring shapes of monotropic shape Trap.In short, the concrete shape of the ion trap does not constitute limiting the scope of the invention.
The present invention is described in more details by taking a kind of ion trap of annular shape as an example below:
The concurrent working method for the ion trap that a kind of specific embodiment of the present invention provides, for wrapping in circular ion trap It includes and circular ion trap is radially divided at least two independent daughter ion traps, then, discriminatively to the institute being partitioned into It states at least two independent daughter ion traps and applies voltage, so that at least two independent daughter ion trap concurrently works in not Same ion processing mode.For example, when circular ion trap be divided into example as shown in Figures 1 to 6 two it is independent When daughter ion trap, different voltage can be applied respectively to the two daughter ion traps simultaneously, so that in the two daughter ion traps, one A when working in ion incidence mode, another works in ion refrigerating mode;Or one when working in ion refrigerating mode, Another works in ion analysis mode, without being limited thereto.
By taking circular ion trap is divided into two independent daughter ion traps as an example, as shown in Figures 1 to 6, preferably along annulus Radial direction be divided into independent first daughter ion trap and the second daughter ion trap, segmentation portion 100, the first daughter ion trap is by first Electrode 10, second electrode 20, third electrode 30 and the 4th electrode 40 are constituted, wherein second electrode 20 and third electrode 30 are in circle It is stacked but does not contact (electrically independent) in the axial direction of halo ion trap, first electrode 10 is located at the most interior of circular ion trap Circle, the 4th electrode 40 are located at the outmost turns of circular ion trap, and second electrode 20 and third electrode 30 are located in first electrode 10 And the 4th between electrode 40, but four electrodes are mutually not in contact with each other, i.e., it is respectively electrically independent.The second daughter ion trap is by the first electricity simultaneously Pole 10 ', second electrode 20 ', third electrode 30 ' and the 4th electrode 40 ' are constituted, each electrode position relationship and the first daughter ion trap phase Together, it repeats no more.As shown in figures 1 to 6, before segmentation, a cylindrical shape that first electrode 10 and 10 ' is originally connected together Electrode is provided with ion exit and incident slit on the electrode, for example, being equipped with for ion incidence and penetrating on the 4th electrode 40 ' Slit 41 ' out.Length, width and the quantity of slit do not restrict, such as shown in Fig. 1, and slit 40 ' is from the 4th electrode 40 ' one end extends to the other end, and the 4th electrode 40 ' is divided into two parts at this time, just needs to lead to phase simultaneously when being powered to electrode Same voltage;There can also be more than two slits on one of the electrodes.It, can be by preceding for the ion trap of this example The voltage applying mode mentioned is stated, works to control ion trap according to workflow below: in the first stage, making first Daughter ion trap and the second daughter ion trap work in ion incidence mode and ion refrigerating mode respectively;In second stage then, It can make that the first daughter ion trap works in ion analysis mode and the second daughter ion trap continues to operate in ion refrigerating mode, or So that the first daughter ion trap is worked in ion refrigerating mode while the second daughter ion trap being made to work in ion analysis mode;It can also connect Carry out the control of phase III, so that one of daughter ion trap is worked in ion incidence mode to supplement ion, and another son Ion trap works in refrigerating mode.That is, during from ion trap start-up operation to completion analysis, the first and second sons The operating mode of ion trap for example can be such circulation conversion: [incident+cooling] → [cooling+analysis] → [incident+point Analysis] → [incident+cooling] → [incidence+analysis] →..., but not limited to this, in synchronization, two independent daughter ion traps Operating mode can be the combination of any both of which in incident, cooling and analysis, to solve existing ion trap same Time can only carry out a mode, the lower problem of analysis efficiency caused by ion processing can only be executed successively stage by stage.
As shown in fig. 7, in a specific embodiment, applying alive side to the first daughter ion trap and the second daughter ion trap Formula for example may is that
The first stage P1 of beginning, to the first daughter ion trap first and the 4th electrode apply the fixed height of an amplitude respectively Frequency voltage RF, second and third electrode of the first daughter ion trap apply the fixed resonance excitation voltage AC of an amplitude respectively;Meanwhile To the second daughter ion trap first and the 4th electrode apply the fixed high frequency voltage RF of another amplitude respectively, the second daughter ion trap Second and third electrode apply the fixed resonance excitation voltage AC of another amplitude respectively.To, P1 in the first stage, the annular shape Ion incidence is carried out simultaneously in ion trap and ion is cooling;
In second stage the P2: the second daughter ion trap then still in ion refrigerating mode, and to the first daughter ion trap First and the 4th electrode apply a frequency and the scannable high frequency voltage RF of amplitude, second and third of the first daughter ion trap respectively Electrode applies a frequency and the scannable resonance excitation voltage AC of amplitude respectively;
Refrigerating mode is switched to by analytical model in the latter half the P3: the first daughter ion trap, and the second daughter ion trap is by cooling down Mode switchs to analytical model;
Assuming that obtaining ideal ion analysis after the P3 stage as a result, then ion trap can power cut-off.Into Four stage P4: whole daughter ion traps unload voltages, i.e. voltage is 0, and ion trap no longer has a constraint ability to ion, in trap Remaining ion can clear out.
Voltage applying mode shown in Fig. 7 is only a kind of citing, is not intended to restrict the invention.
Certainly, the corresponding circular ring shape ion trap of Fig. 1 can also be divided into multiple size phases centered on the center of circle, along radius Same or different fan-shaped region (being equivalent to multiple independent daughter ion traps).
Additionally need explanation, the present invention not to the size of ion trap, shape, material, processing method, segmentation daughter ion The number of trap and the size of each daughter ion trap are limited.
The present invention obtains two or more daughter ion traps that can work independently by dividing an ion trap, By applying different voltage to different daughter ion traps, makes its work in different states, efficiently utilize in ion trap Space so that the incidence of ion, cooling, analytic process become to synchronize progress by sequentially carrying out.With this come shorten from The sub- trap duty cycle improves ion analysis efficiency.The characteristics of such working method, is: at least two operating modes simultaneously into Row, than the ion trap of single mode sequential working, work efficiency is high, and ion analysis can be carried out with side, and side supplement sample ions arrive In ion trap.Also relatively simple in structure simultaneously, it is easily assembled, cost of manufacture is cheap.
The above content is a further detailed description of the present invention in conjunction with specific preferred embodiments, and it cannot be said that Specific implementation of the invention is only limited to these instructions.For those skilled in the art to which the present invention belongs, it is not taking off Under the premise of from present inventive concept, several equivalent substitute or obvious modifications can also be made, and performance or use is identical, all answered When being considered as belonging to protection scope of the present invention.

Claims (9)

1. a kind of concurrent working method of ion trap, it is characterised in that: the following steps are included:
S1, an ion trap is divided at least two independent daughter ion traps;Each daughter ion trap being partitioned into includes point Not not electrically independent first to fourth electrode, wherein the axial direction of second electrode (20) and third electrode (30) in the ion trap On be stacked with interval, and be located between first electrode (10) and the 4th electrode (40) radially;Described first Be equipped with ion entrance on the 4th electrode, described second and third electrode on be equipped with ion outlet;
S2, discriminatively to described at least two independent daughter ion traps apply voltages, so that at least two independent son Ion trap concurrently works in different ion processing modes;
Wherein, the ion processing mode includes ion incidence mode, ion refrigerating mode and ion analysis mode.
2. the concurrent working method of ion trap as described in claim 1, it is characterised in that: applied to a daughter ion trap alive Mode includes first to tertiary voltage applying mode, in which:
First voltage applying mode is so that a daughter ion trap works in the mode of ion incidence mode;
Second voltage applying mode is so that a daughter ion trap works in the mode of ion refrigerating mode;
Tertiary voltage applying mode is so that a daughter ion trap works in the mode of ion analysis mode.
3. the concurrent working method of ion trap as claimed in claim 2, it is characterised in that:
First voltage applying mode specifically includes: apply the resonance excitation voltage of first amplitude respectively to second and third electrode, And to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively;
Second voltage applying mode specifically includes: apply the resonance excitation voltage of third amplitude respectively to second and third electrode, And to first and the 4th electrode apply the high frequency voltage of the 4th amplitude respectively;
Tertiary voltage applying mode specifically includes: applying frequency respectively to second and third electrode and the scannable resonance of amplitude swashs Power generation pressure, and, to first and the 4th electrode apply frequency and the scannable high frequency voltage of amplitude respectively;
Wherein, first amplitude is different with third amplitude, the second amplitude and the 4th amplitude difference;Also, each voltage applying mode institute The voltage magnitude of application is not 0.
4. the concurrent working method of ion trap as claimed in claim 3, it is characterised in that: when the ion trap is divided into two A independent daughter ion trap: when the first daughter ion trap and the second daughter ion trap, step S2 is specifically included:
When the ion trap is started to work, voltage is applied to the first daughter ion trap with first voltage applying mode, while with the Two voltage applying modes apply voltage to the second daughter ion trap, so that the ion trap can carry out ion incidence and cooling simultaneously;
When ion incidence for a period of time after: with tertiary voltage applying mode to the first daughter ion trap apply voltage;Alternatively, with second Voltage applying mode applies voltage to the first daughter ion trap, while applying electricity to the second daughter ion trap with tertiary voltage applying mode Pressure, so that the ion trap can carry out ion cooling and analysis simultaneously;Or it is sub to second with tertiary voltage applying mode Ion trap applies voltage, so that the ion trap can carry out ion incidence and analysis simultaneously.
5. the concurrent working method of ion trap as claimed in claim 3, it is characterised in that: when the ion trap is divided into three When a above independent daughter ion trap, step S2 is specifically included:
When the ion trap is started to work, apply electricity to different daughter ion traps respectively with first to tertiary voltage applying mode Pressure, so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.
6. the concurrent working method of ion trap as claimed in claim 3, it is characterised in that: when the ion trap is divided into three When a above independent daughter ion trap, step S2 is specifically included:
When the ion trap is started to work, apply electricity to different daughter ion traps respectively with the first and second voltage applying modes Pressure, so that the ion trap can carry out ion incidence and cooling simultaneously;
When ion incidence for a period of time after: with tertiary voltage applying mode to work in ion incidence mode and/or work in from At least partly daughter ion trap of sub- refrigerating mode applies voltage so that the ion trap can carry out simultaneously ion incidence, cooling and Analysis, or ion cooling and analysis are carried out simultaneously.
7. such as the concurrent working method of the described in any item ion traps of claim 4 to 6, it is characterised in that: further include: work as ion When analyzing a period of time and obtaining meeting expected analysis result, the voltage applied on whole daughter ion traps is uniformly set to 0, is made The ion trap carries out the removing of residual ion.
8. the concurrent working method of ion trap as described in claim 1, it is characterised in that: the divided ion trap is to close Cyclization shape ion trap.
9. the concurrent working method of ion trap as claimed in claim 1 or 8, it is characterised in that: the ion entrance and institute Stating ion outlet is the slit on each electrode.
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