CN107591309A - The concurrent working method of ion trap - Google Patents
The concurrent working method of ion trap Download PDFInfo
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- CN107591309A CN107591309A CN201710765283.2A CN201710765283A CN107591309A CN 107591309 A CN107591309 A CN 107591309A CN 201710765283 A CN201710765283 A CN 201710765283A CN 107591309 A CN107591309 A CN 107591309A
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Abstract
A kind of concurrent working method of ion trap, including：S1, an ion trap is divided at least two independent daughter ion traps；S2, discriminatively apply voltage to described at least two independent daughter ion traps, so that described at least two independent daughter ion traps concurrently work in different ion processing patterns；Wherein, the ion processing pattern includes ion incidence pattern, ion refrigerating mode and ion analysis pattern.By the way that an ion trap is divided, obtain at least two daughter ion traps that can work independently, and apply different voltage to different daughter ion traps, it is operated in different states so that the incidence of ion, cooling, analysis process become synchronously to carry out by sequentially carrying out.The ion trap work period is shortened with this, improves ion analysis efficiency.
Description
Technical field
The present invention relates to ion trap mass spectrometer field, and in particular to a kind of concurrent working method of ion trap.
Background technology
Mass spectrography is a kind of and spectroscopic methodology spectrum method arranged side by side, and mass spectrograph is that ion is divided according to mass-to-charge ratio size
From and identification, analyze testing sample, determine the instrument of material composition.Ion strap mass analyzer is by ion according to different modes
Caused sample ions are mass spectrometric important composition parts, positioned at ion by the separated instrument of mass-to-charge ratio m/z size in source
Between source and detector.Generally, motion process of the ion in ion trap is divided into four-stage：Ion incidence, cooling, matter
Amount analysis, remove, this four phase sequence is carried out.For annular ion trap, high frequency voltage amplitude is loaded on two cylinder electrodes
Fixed value (RF), resonance excitation voltage fixed amplitude (AC) is loaded on two annular electrodes, according to the size of RF voltages, ion trap
Can catches the ion of a certain mass range, and now, ion is circumferentially uniformly distributed in ion trap；Ion trap can store up
Deposit ion, after ion accumulation to certain amount, scan AC and RF magnitude of voltage, ions by mass leave successively from high to low from
Sub- trap, is detected by detector.
For the occasion of quick detection, the detection efficiency of sample is critically important.The analysis efficiency for improving ion trap is to improve matter
The important means of spectrometer detection efficiency.Therefore how to improve the analysis efficiency of ion trap is this area technical problem to be solved.
The content of the invention
In existing ion trap, incidence, cooling, analysis and the removing Four processes phase sequence of ion are carried out, in order to carry
The analysis efficiency of macroion trap, the present invention propose a kind of concurrent working method of ion trap, enable to incident, cooling, divide
Analysis process subregion in annular ion trap is carried out simultaneously, is realized and is analyzed in cooling, sample is supplemented when carrying out ion analysis
Ion reaches the purpose of raising ion trap analysis efficiency with this, so as to realize mass spectrometric efficient detection into ion trap.
The technical scheme that the present invention is provided for the above-mentioned purpose is as follows：
A kind of concurrent working method of ion trap, comprises the following steps：
S1, an ion trap is divided at least two independent daughter ion traps；
S2, discriminatively apply voltage to described at least two independent daughter ion traps, so that described at least two is independent
Daughter ion trap concurrently work in different ion processing patterns；
Wherein, the ion processing pattern includes ion incidence pattern, ion refrigerating mode and ion analysis pattern.
Above-mentioned control method provided by the invention, ion trap is divided into multiple independent operation intervals, and each work first
Make the independent powered operation in section, different operation intervals may be at identical or different working condition so that originally can only
An ion trap for carrying out one of which mode of operation simultaneously forms multiple independent daughter ion traps, and multiple-working mode is same in trap
Shi Binglie is carried out, higher than the ion trap operating efficiency of monotype sequential working, such as ion analysis can be carried out with side, side supplement sample
Product ion (ion incidence) into ion trap；Side carries out ion incidence, and side carries out ion cooling etc..
Further, each daughter ion trap being partitioned into includes first to fourth electrically independent respectively electrode,
Wherein, second electrode and the 3rd electrode are stacked with interval in the axial direction of the ion trap, and diametrically sandwiched
Between first electrode and the 4th electrode；Described first and the 4th is equipped with ion gateway on electrode, and described second and the 3rd
Ion outlet is equipped with electrode.
Further, alive mode is applied to a daughter ion trap includes first to tertiary voltage applying mode, wherein：
First voltage applying mode is so that a daughter ion trap is operable with the mode of ion incidence pattern；Second voltage applying mode is
So that a daughter ion trap is operable with the mode of ion refrigerating mode；Tertiary voltage applying mode is so that a daughter ion trap can work
Make in the mode of ion analysis pattern.
Further, first voltage applying mode specifically includes：To second and the 3rd electrode apply first amplitude respectively
Resonance excitation voltage, and, to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively；Second voltage application side
Formula specifically includes：To second and the 3rd electrode apply the resonance excitation voltage of the 3rd amplitude respectively, and, to first and the 4th electricity
Pole applies the high frequency voltage of the 4th amplitude respectively；Tertiary voltage applying mode specifically includes：To second and the 3rd electrode apply respectively
The resonance excitation voltage for adding frequency and amplitude to scan, and, to first and the 4th electrode apply frequency and amplitude respectively and can sweep
The high frequency voltage retouched；Wherein, first amplitude is different with the 3rd amplitude, and the second amplitude is different with the 4th amplitude；Also, each voltage is applied
The voltage magnitude that add mode is applied is not 0.
Further, when the ion trap is divided into two independent daughter ion traps：First daughter ion trap and second
During daughter ion trap, step S2 is specifically included：
When the ion trap is started working, voltage is applied to the first daughter ion trap with first voltage applying mode, simultaneously
Voltage is applied to the second daughter ion trap with second voltage applying mode so that the ion trap can carry out ion incidence and cold simultaneously
But；
When ion incidence for a period of time after：Voltage is applied to the first daughter ion trap with tertiary voltage applying mode；Or with
Second voltage applying mode applies voltage to the first daughter ion trap, while is applied with tertiary voltage applying mode to the second daughter ion trap
Making alive, to cause the ion trap to carry out ion cooling and analysis simultaneously；Or with tertiary voltage applying mode to
Two daughter ion traps apply voltage so that the ion trap can carry out ion incidence and analysis simultaneously.
Further, when the ion trap is divided into more than three independent daughter ion traps, step S2 is specifically wrapped
Include：
When the ion trap is started working, applied respectively to different daughter ion traps with first to tertiary voltage applying mode
Making alive so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.
Further, when the ion trap is divided into more than three independent daughter ion traps, step S2 is specifically wrapped
Include：
When the ion trap is started working, applied respectively to different daughter ion traps with the first and second voltage applying modes
Making alive so that the ion trap can carry out ion incidence and cooling simultaneously；
When ion incidence for a period of time after：With tertiary voltage applying mode to working in ion incidence pattern and/or work
Apply voltage at least part daughter ion trap of ion refrigerating mode so that the ion trap can carry out ion incidence, cold simultaneously
But and analyze, or carry out ion cooling and analysis simultaneously.
Further, methods described also includes：When ion analysis for a period of time and obtains meeting expected analysis result
When, the voltage applied on whole daughter ion traps is uniformly set to 0, the ion trap is carried out the removing of residual ion.
Further, the divided ion trap is closed hoop ion trap.
Further, the ion gateway and the ion outlet are the slit on each electrode.
Brief description of the drawings
Fig. 1 is the ion trap schematic diagram that can carry out two kinds of mode of operations side by side of one embodiment of the invention；
Fig. 2 is the top view of ion trap shown in Fig. 1；
Fig. 3 is the side view of ion trap shown in Fig. 1；
Fig. 4 is the sectional view of ion trap shown in Fig. 1；
Fig. 5 is Fig. 4 top view；
Fig. 6 is the explosive view of ion trap shown in Fig. 1；
A kind of voltage that Fig. 7 is divided into the annular ion trap of two independent daughter ion traps applies exemplary plot.
Embodiment
The invention will be further described with preferred embodiment below in conjunction with the accompanying drawings.
Ion trap carries out the three phases that quality analysis has to undergo to sample ions：Ion incidence, ion
Cooling and ion analysis.Wherein, ion analysis refers to the scanning with excitation voltage and high frequency voltage, by the ion of different mass-to-charge ratioes
Go out ion trap according to time order and function sequential scan, realize that mass of ion is analyzed.Generally, after ion analysis is completed, it is necessary to from
Sub- trap is purged, therefore also includes the stage that ion is removed, refer to by ion trap fail to scan it is remaining from
Son clears out, it is common practice that does not apply any voltage to ion trap, ion is lost after constraint out of ion trap without fixation
Project to direction, this stage is primarily to avoid ion occur during different sample analysis next time mixing.
Traditional ion trap, a kind of mode of operation can only be carried out in synchronization, specifically first carries out ion incidence, completed
After enter back into next stage ion cooling, complete cooling after could enter next stage ion analysis.And the present invention proposes one
The new ion trap of kind, it is that traditional ion trap is divided into at least two independent daughter ion traps and formed, and splits shape
Into each independent daughter ion trap between there is gap 100, refer to Fig. 1 to Fig. 3, the gap 100 cause each daughter ion trap
Between electrically isolate, different voltage can be applied respectively and perform different mode of operations.Certainly, each independent daughter ion trap
It may operate in identical pattern, but at least two can be carried out simultaneously in the divided ion trap the invention aims to allow
Kind mode of operation (at least two in incident, cooling and analysis), the operating efficiency of ion trap, therefore each independence are improved with this
Daughter ion trap all work in the situation of same pattern herein without more descriptions.
Correspondingly, the present invention proposes a kind of concurrent working method of ion trap, and this method includes：
Step S1, an ion trap is divided at least two independent daughter ion traps；
Step S2, discriminatively voltage is applied to described at least two independent daughter ion traps, so that described at least two
Independent daughter ion trap concurrently works in different ion processing patterns；Wherein, the ion processing pattern enters including ion
Emission mode, ion refrigerating mode and ion analysis pattern.
In the particular embodiment, an ion trap can be divided into two, three, four etc. quantity it is unlimited (as long as
Belong to protection scope of the present invention in two or more) daughter ion trap, also, even partition or it is uneven segmentation all may be used.Point
Each daughter ion trap cut out includes first, second, third and fourth electrode, and first to fourth electrode is electrically only respectively
Vertical.Wherein, the electrode 30 of second electrode 20 and the 3rd is stacked with interval in the axial direction of the ion trap, and in footpath
It is located in upwards between the electrode 40 of first electrode 10 and the 4th, specifically refers to Fig. 1 and Fig. 4；In addition, in first electrode 10 and the 4th
It is equipped with ion gateway on electrode 40, described second and the 3rd is equipped with ion outlet on electrode.For example, with reference to figure 6, when it
In a sub- ion trap (being made up of first electrode 10, second electrode 20, the 3rd electrode 30 and the 4th electrode 40) work in ion
During incident mode, passage of the ion gateway as ion incidence on its electrode 40 of first electrode 10 and the 4th；And work as the son
When ion trap works in ion analysis pattern, the ion gateway on its electrode 40 of first electrode 10 and the 4th, and the second electricity
The passage that ion outlet on pole and the 3rd electrode projects as ion.And when the voltage of all daughter ion traps is all unloaded
Afterwards, remaining ion does not carry the baby in ion trap, can be gone out from the ion gateway and the ion outlet.Preferably,
The ion gateway and the ion outlet are the slits in respective electrode.
In order to allow a daughter ion trap to work in certain in Three models (incident, cooling, analysis), it is necessary to certain side
Formula applies voltage to daughter ion trap, wherein, define three kinds of voltage applying modes --- first to tertiary voltage applying mode, its
In：First voltage applying mode is so that a daughter ion trap is operable with the mode of ion incidence pattern；Second voltage application side
Formula is so that a daughter ion trap is operable with the mode of ion refrigerating mode；Tertiary voltage applying mode is so that a daughter ion trap
It is operable with the mode of ion analysis pattern.
In the particular embodiment, first voltage applying mode specifically includes：To second and the 3rd electrode apply respectively
The resonance excitation voltage of one amplitude, and, to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively；Second voltage
Applying mode specifically includes：To second and the 3rd electrode apply the resonance excitation voltage of the 3rd amplitude respectively, and, to the first He
4th electrode applies the high frequency voltage of the 4th amplitude respectively；Tertiary voltage applying mode specifically includes：To second and the 3rd electrode
Apply the resonance excitation voltage that frequency and amplitude can scan respectively, and, to first and the 4th electrode apply frequency and width respectively
The high frequency voltage that value can scan.Wherein, first amplitude is different with the 3rd amplitude, and the second amplitude is different with the 4th amplitude.It is also, each
The voltage magnitude that voltage applying mode is applied is not 0, and the size of amplitude is specifically and the size of ion trap and to be analyzed
The mass charge ratio range of sample ions is relevant, is not limited thereto.
One exemplary embodiment 1 is provided, the ion trap is divided into two independent daughter ion traps, i.e. the first daughter ion
Trap (being formed by 10,20,30 and 40) and the second daughter ion trap (being formed by 10 ', 20 ', 30 ' and 40 '), refer to Fig. 1 to Fig. 6,
But the ion trap shape shown in Fig. 1 to Fig. 6 does not form the limitation to the present embodiment, in such cases, step S2 is specifically included：
When the ion trap is started working, voltage is applied to the first daughter ion trap with first voltage applying mode, simultaneously
Voltage is applied to the second daughter ion trap with second voltage applying mode so that the ion trap can carry out ion incidence and cold simultaneously
But.Specifically：Apply the resonant excitation electricity of first amplitude respectively to the electrode 30 of second electrode 20 and the 3rd of the first daughter ion trap
Press, while apply the high frequency voltage of the second amplitude respectively to the electrode 40 of first electrode 10 and the 4th of the first daughter ion trap so that
First daughter ion trap is operable with ion incidence pattern；Second electrode 20 ' and the 3rd electrode 30 ' to the second daughter ion trap are respectively
Apply the resonance excitation voltage of the 3rd amplitude, while applied respectively to the first electrode 10 ' and the 4th electrode 40 ' of the second daughter ion trap
Add the high frequency voltage of the 4th amplitude so that the second daughter ion trap is operable with ion refrigerating mode.Thus, you can so that institute
State ion trap while carry out the incidence and cooling of ion.
When ion incidence for a period of time after：Voltage is applied to the first daughter ion trap with tertiary voltage applying mode；Or with
Second voltage applying mode applies voltage to the first daughter ion trap, while is applied with tertiary voltage applying mode to the second daughter ion trap
Making alive, to cause the ion trap to carry out ion cooling and analysis simultaneously；Or with tertiary voltage applying mode to
Two daughter ion traps apply voltage so that the ion trap can carry out ion incidence and analysis simultaneously.
One exemplary embodiment 2 is provided, the ion trap is divided into more than three independent daughter ion traps, this kind is implemented
In example, step S2 is specifically included：When the ion trap is started working, with first to tertiary voltage applying mode respectively to difference
Daughter ion trap apply voltage so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.In such a embodiment,
Multiple daughter ion traps are divided into three parts, and the daughter ion trap of each section applies voltage in the same manner so that three parts
Ion trap works in incident, cooling, analytical model respectively.For example, altogether in 10 sub- ion traps, wherein 3 with first voltage
Applying mode applies voltage, and to work in ion incidence pattern, during two is outer 7,3 work in ion refrigerating mode, 4 work
In ion analysis pattern.
In above-described embodiment 2, working method that each daughter ion trap may also is that：When the ion trap is started working
When, apply voltage to different daughter ion traps respectively with the first and second voltage applying modes so that the ion trap can be simultaneously
Ion incidence and cooling are carried out, that is, multiple daughter ion traps divide two parts to power, a part is with first voltage applying mode point
Voltage is not applied so that the daughter ion trap of this part all works in ion incidence pattern；And another part is applied with second voltage
Mode applies voltage respectively so that the daughter ion trap of this another part all works in ion refrigerating mode.When one section of ion incidence
After time：With tertiary voltage applying mode to working in ion incidence pattern and/or work at least portion of ion refrigerating mode
Molecular ion trap apply voltage so that the ion trap can carry out ion incidence, cooling and analysis simultaneously, or carry out simultaneously from
Son cooling and analysis.
Assuming that during ion trap is carried out cooling down at the same time and analyzed, discovery also needs to supplement ion, then can be to
The daughter ion trap that a portion is working applies voltage again with first voltage applying mode, that is, extracts a part out just
The daughter ion trap of ion analysis and cooling procedure is worked in carry out the incidence of ion, to supplement ion.
When ion analysis has carried out a period of time and obtains meeting expected analysis result, you can complete analysis.Now
A step of ion is removed preferably can be also carried out, that is, unloads the voltage on whole daughter ion traps so that be also surplus in ion trap
Remaining ion loses constraint, so as to which ion is cleared out of into ion trap, ion now be no fixed-direction from ion trap
It is interior out, different under ion analysis pattern, there is a certain voltage constraint, ion according to its mass-to-charge ratio size, in an orderly manner with certain
Fixed-direction projects.
In a preferred embodiment of the invention, the overall shape of the ion trap of at least two mode of operations can be carried out simultaneously
Shape is closed hoop, such as the circular ion trap exemplified by Fig. 1 to Fig. 6, also such as carries out letter to this kind of circular ion trap
The ion of the shapes such as oval ring-type, rectangular ring, triangle ring-type, square ring-type and the other polygonal ring shapes of monotropic shape
Trap.In a word, the concrete shape of the ion trap does not form limiting the scope of the invention.
The present invention is described in more details by taking a kind of circular ion trap as an example below：
The concurrent working method for the ion trap that a kind of specific embodiment of the present invention provides, in circular ion trap, wrapping
Include and circular ion trap is radially divided at least two independent daughter ion traps, then, discriminatively to the institute being partitioned into
State at least two independent daughter ion traps and apply voltage, so that described at least two independent daughter ion traps concurrently work in not
Same ion processing pattern.For example, when in the example that circular ion trap is divided into as shown in Figures 1 to 6 two it is independent
During daughter ion trap, different voltage can be applied respectively to the two daughter ion traps simultaneously so that in the two daughter ion traps, one
Individual when working in ion incidence pattern, another works in ion refrigerating mode；Or one when working in ion refrigerating mode,
Another works in ion analysis pattern, not limited to this.
So that circular ion trap is divided into two independent daughter ion traps as an example, as shown in Figures 1 to 6, preferably along annulus
Radial direction be divided into independent the first daughter ion trap and the second daughter ion trap, segmentation portion 100, the first daughter ion trap is by first
Electrode 10, second electrode 20, the 3rd electrode 30 and the 4th electrode 40 are formed, wherein, the electrode 30 of second electrode 20 and the 3rd is in circle
It is stacked but does not contact (electrically independent) in the axial direction of halo ion trap, first electrode 10 is located at the most interior of circular ion trap
Circle, the 4th electrode 40 are located at the outmost turns of circular ion trap, and the electrode 30 of second electrode 20 and the 3rd is located in first electrode 10
And the 4th between electrode 40, but four electrodes are mutually not in contact with each other, i.e., each electrically independent.The second daughter ion trap is by the first electricity simultaneously
Pole 10 ', second electrode 20 ', the 3rd electrode 30 ' and the 4th electrode 40 ' are formed, each electrode position relation and the first daughter ion trap phase
Together, repeat no more.As shown in figures 1 to 6, before segmentation, a cylindrical shape that first electrode 10 and 10 ' is originally connected together
Electrode, ion exit and incident slit are provided with electrode, such as, it is provided with for ion incidence and penetrates on the 4th electrode 40 '
The slit 41 ' gone out.Length, width and the quantity of slit do not restrict, such as shown in Fig. 1, and slit 40 ' is from the 4th electrode
40 ' one end extends to the other end, and now the 4th electrode 40 ' is divided into two parts, just needs to lead to phase simultaneously when being powered to electrode
Same voltage；There can also be more than two slits on one of the electrodes., can be by preceding for the ion trap of this example
The voltage applying mode mentioned is stated, to control ion trap to be operated according to following workflow：In the first stage, first is made
Daughter ion trap and the second daughter ion trap work in ion incidence pattern and ion refrigerating mode respectively；In second stage then,
It can make that the first daughter ion trap works in ion analysis pattern and the second daughter ion trap continues to operate in ion refrigerating mode, or
The first daughter ion trap is worked in ion refrigerating mode while the second daughter ion trap is worked in ion analysis pattern；It can also connect
The control for carrying out the phase III, one of daughter ion trap is worked in ion incidence pattern to supplement ion, and another son
Ion trap works in refrigerating mode.That is, during from ion trap start-up operation to completion analysis, the first and second sons
The mode of operation of ion trap for example can be such circulation conversion：[incidence+cooling] → [cooling+analysis] → [incident+point
Analysis] → [incidence+cooling] → [incidence+analysis] →..., but not limited to this, in synchronization, two independent daughter ion traps
Mode of operation can be the combination of any both of which in incident, cooling and analysis, so as to solve existing ion trap same
The problem of time can only carry out a pattern, and analysis efficiency is relatively low caused by ion processing can only be performed successively stage by stage.
As shown in fig. 7, in a specific embodiment, alive side is applied to the first daughter ion trap and the second daughter ion trap
Formula for example can be：
The first stage P1 of beginning, to the first daughter ion trap first and the 4th electrode apply respectively an amplitude fixation height
Frequency voltage RF, the first daughter ion trap second and the 3rd electrode apply respectively an amplitude fixation resonance excitation voltage AC；Meanwhile
To the second daughter ion trap first and the 4th electrode apply the high frequency voltage RF that another amplitude fixes respectively, the second daughter ion trap
Second and the 3rd electrode apply the resonance excitation voltage AC that another amplitude is fixed respectively.So as to, P1 in the first stage, the annular shape
Ion incidence and ion cooling are carried out in ion trap simultaneously；
In second stage P2 then：Second daughter ion trap gives the first daughter ion trap still in ion refrigerating mode
First and the 4th electrode apply the high frequency voltage RF that a frequency and amplitude can scan respectively, the second and the 3rd of the first daughter ion trap
Electrode applies the resonance excitation voltage AC that a frequency and amplitude can scan respectively；
In the latter half P3：First daughter ion trap switchs to refrigerating mode by analytical model, and the second daughter ion trap is by cooling down
Pattern switchs to analytical model；
Assuming that obtaining ideal ion analysis result after the P3 stages, then ion trap can power cut-off.Into
Four stage P4：Whole daughter ion traps unload voltages, i.e. voltage is 0, and ion trap no longer has a constraint ability to ion, in trap
Remaining ion can clear out.
Voltage applying mode shown in Fig. 7 is only a kind of citing, is not intended to limit the invention.
Certainly, annular ion trap corresponding to Fig. 1 can also be divided into multiple size phases centered on the center of circle, along radius
Same or different sector region (equivalent to multiple independent daughter ion traps).
Explanation is additionally needed, the present invention is not to the size of ion trap, shape, material, processing mode, the daughter ion split
The number of trap and the size of each daughter ion trap are limited.
The present invention obtains two or more daughter ion traps that can work independently by the way that an ion trap is divided,
By applying different voltage to different daughter ion traps, it is operated in different states, efficiently utilize in ion trap
Space so that the incidence of ion, cooling, analysis process become synchronously to carry out by sequentially carrying out.With this come shorten from
The sub- trap work period, improve ion analysis efficiency.The characteristics of such a method of work, is：At least two mode of operations are entered simultaneously
OK, it is higher than the ion trap operating efficiency of monotype sequential working, and ion analysis can be carried out with side, side supplement sample ions arrive
In ion trap.It is simultaneously also relatively simple in structure, it is easily assembled, cost of manufacture is cheap.
Above content is to combine specific preferred embodiment further description made for the present invention, it is impossible to is assert
The specific implementation of the present invention is confined to these explanations.For those skilled in the art, do not taking off
On the premise of from present inventive concept, some equivalent substitutes or obvious modification can also be made, and performance or purposes are identical, all should
When being considered as belonging to protection scope of the present invention.
Claims (10)
1. a kind of concurrent working method of ion trap, it is characterised in that：Comprise the following steps：
S1, an ion trap is divided at least two independent daughter ion traps；
S2, discriminatively apply voltage to described at least two independent daughter ion traps, so that described at least two independent sons
Ion trap concurrently works in different ion processing patterns；
Wherein, the ion processing pattern includes ion incidence pattern, ion refrigerating mode and ion analysis pattern.
2. the concurrent working method of ion trap as claimed in claim 1, it is characterised in that：Each daughter ion trap being partitioned into
Include first to fourth electrically independent respectively electrode, wherein, second electrode (20) and the 3rd electrode (30) are in the ion
It is stacked, and is diametrically located between first electrode (10) and the 4th electrode (40) with interval in the axial direction of trap；
Described first and the 4th is equipped with ion gateway on electrode, and described second and the 3rd is equipped with ion outlet on electrode.
3. the concurrent working method of ion trap as claimed in claim 2, it is characterised in that：One daughter ion trap is applied alive
Mode includes first to tertiary voltage applying mode, wherein：
First voltage applying mode is so that a daughter ion trap is operable with the mode of ion incidence pattern；
Second voltage applying mode is so that a daughter ion trap is operable with the mode of ion refrigerating mode；
Tertiary voltage applying mode is so that a daughter ion trap is operable with the mode of ion analysis pattern.
4. the concurrent working method of ion trap as claimed in claim 3, it is characterised in that：
First voltage applying mode specifically includes：To second and the 3rd electrode apply the resonance excitation voltage of first amplitude respectively,
And to first and the 4th electrode apply the high frequency voltage of the second amplitude respectively；
Second voltage applying mode specifically includes：To second and the 3rd electrode apply the resonance excitation voltage of the 3rd amplitude respectively,
And to first and the 4th electrode apply the high frequency voltage of the 4th amplitude respectively；
Tertiary voltage applying mode specifically includes：To second and the 3rd the electrode resonance that applies frequency and amplitude respectively and can scan swash
Generate electricity pressure, and, to first and the 4th electrode apply the high frequency voltage that frequency and amplitude can scan respectively；
Wherein, first amplitude is different with the 3rd amplitude, and the second amplitude is different with the 4th amplitude；Also, each voltage applying mode institute
The voltage magnitude of application is not 0.
5. the concurrent working method of ion trap as claimed in claim 4, it is characterised in that：When the ion trap is divided into two
Individual independent daughter ion trap：When the first daughter ion trap and the second daughter ion trap, step S2 is specifically included：
When the ion trap is started working, voltage is applied to the first daughter ion trap with first voltage applying mode, while with the
Two voltage applying modes apply voltage to the second daughter ion trap so that the ion trap can carry out ion incidence and cooling simultaneously；
When ion incidence for a period of time after：Voltage is applied to the first daughter ion trap with tertiary voltage applying mode；Or with second
Voltage applying mode applies voltage to the first daughter ion trap, while applies electricity to the second daughter ion trap with tertiary voltage applying mode
Pressure, to cause the ion trap to carry out ion cooling and analysis simultaneously；It is or sub to second with tertiary voltage applying mode
Ion trap applies voltage so that the ion trap can carry out ion incidence and analysis simultaneously.
6. the concurrent working method of ion trap as claimed in claim 4, it is characterised in that：When the ion trap is divided into three
More than individual during independent daughter ion trap, step S2 is specifically included：
When the ion trap is started working, apply electricity to different daughter ion traps respectively with first to tertiary voltage applying mode
Pressure so that the ion trap can carry out ion incidence, cooling and analysis simultaneously.
7. the concurrent working method of ion trap as claimed in claim 4, it is characterised in that：When the ion trap is divided into three
More than individual during independent daughter ion trap, step S2 is specifically included：
When the ion trap is started working, apply electricity to different daughter ion traps respectively with the first and second voltage applying modes
Pressure so that the ion trap can carry out ion incidence and cooling simultaneously；
When ion incidence for a period of time after：With tertiary voltage applying mode to work in ion incidence pattern and/or work in from
At least part daughter ion trap of sub- refrigerating mode applies voltage so that the ion trap can carry out simultaneously ion incidence, cooling and
Analysis, or ion cooling and analysis are carried out simultaneously.
8. the concurrent working method of the ion trap as described in any one of claim 5 to 7, it is characterised in that：Also include：Work as ion
When analyzing a period of time and obtaining meeting expected analysis result, the voltage applied on whole daughter ion traps is uniformly set to 0, made
The ion trap carries out the removing of residual ion.
9. the concurrent working method of ion trap as claimed in claim 2, it is characterised in that：The divided ion trap is to close
Cyclization shape ion trap.
10. the concurrent working method of the ion trap as described in claim 2 or 9, it is characterised in that：The ion gateway and institute
Ion outlet is stated as the slit on each electrode.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108807133A (en) * | 2018-05-29 | 2018-11-13 | 清华大学深圳研究生院 | The method that ionic reaction and analysis are carried out in rail type ion trap |
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| CN108807133A (en) * | 2018-05-29 | 2018-11-13 | 清华大学深圳研究生院 | The method that ionic reaction and analysis are carried out in rail type ion trap |
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| CN107591309B (en) | 2019-04-16 |
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