CN107561471A - A kind of semiconductor test machine calibrating installation - Google Patents
A kind of semiconductor test machine calibrating installation Download PDFInfo
- Publication number
- CN107561471A CN107561471A CN201710892721.1A CN201710892721A CN107561471A CN 107561471 A CN107561471 A CN 107561471A CN 201710892721 A CN201710892721 A CN 201710892721A CN 107561471 A CN107561471 A CN 107561471A
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- radio frequency
- fixed plate
- radio
- test machine
- frequency
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- 238000012360 testing method Methods 0.000 title claims abstract description 22
- 238000009434 installation Methods 0.000 title claims abstract description 19
- 239000004065 semiconductor Substances 0.000 title claims abstract description 16
- 239000000523 sample Substances 0.000 claims abstract description 23
- 241000931526 Acer campestre Species 0.000 claims description 15
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The present invention disclose a kind of semiconductor test machine calibrating installation, including power probe, the first paragraph radio frequency line on power probe, the second segment radio frequency line in tester channels and for support and the fixing device of fixed RF line；Described fixing device includes firm banking and rotation fixed plate, and a hinged seat is provided with described firm banking, and one end of described rotation fixed plate is arranged on hinged seat by steady pin, and rotation fixed plate can surround hinged seat rotation and fix.By power probe by linking up with the side wall of test machine in the present invention, radio frequency line is provided with two sections, centre sets a fixing device for being used for fixed RF line, radio frequency line is set to be completely in free vacant state, not by external force other foreign objects contact interference, make the calibration result of power probe more accurate, and the also more convenient dismounting of power probe and radio frequency line.
Description
Technical field
The invention belongs to semiconductor detection, and in particular to a kind of semiconductor test machine calibrating installation.
Background technology
Engineer has a calibration steps when debugging semiconductor test machine program, for measuring the damage of power in the line
Consumption, being then compensated for test to the loss measured by program can smoothly complete., will in the loss of test access
Power probe is connected by radio frequency line with the path end of this, (this is the situation for testing wherein one path) as shown in Figure 1
After now radio-frequency maser is connected with power probe, radio frequency line part will be in free state, when artificial imprudence apply external force or
Contact and may have an impact to test result with other foreign objects, we need to find a method being fixed for this；And
Again because radio frequency line is not harder pliable, free state is at, the installation of power probe is also a problem；Calibration step
It is rapid simply to be used in research and development and debugging, it will not be used in the production after the completion of debugging, therefore we need one calibrating
When use, and the calibration module of its space can be reduced as far as possible in process of production.
The content of the invention
The purpose of the present invention is in view of the deficienciess of the prior art, providing a kind of semiconductor test machine calibrating installation.
Technical scheme：It is of the present invention solve the problems, such as used by technical scheme be：A kind of semiconductor test machine calibrating installation, bag
Include power probe, the first paragraph radio frequency line on power probe, the second segment radio frequency line in tester channels with
And for supporting the fixing device with fixed RF line；Described fixing device includes firm banking and rotation fixed plate, described
Firm banking on a hinged seat is installed, one end of described rotation fixed plate is arranged on hinged seat by steady pin, rotation
Hinged seat rotation fixation can be surrounded by turning fixed plate；One end of described rotation fixed plate is also equipped with radio-frequency maser installing plate, described
Radio-frequency maser installing plate on radio-frequency joint is installed, the first described radio frequency line and the second radio frequency line are connected respectively radio frequency
On joint.
Preferably, the end set of described rotation fixed plate has radio frequency hole, the surrounding and radio-frequency maser in the radio frequency hole
It is provided with corresponding mounting hole on installing plate, described radio-frequency maser installing plate passes through the fixture of setting and the installation being engaged
Hole is arranged on the end of rotation fixed plate, and the radio-frequency joint of side is passed through radio frequency hole, to cause two radio-frequency joints point
The both sides of fixed plate Wei Yu not rotated.
Preferably, the radio frequency hole of the fixed front edge of board of described rotation is provided with two altogether, it is respectively mounted on two radio frequency holes
There is radio-frequency maser installing plate.
Preferably, being additionally provided with mounting hole on described firm banking, fixture is installed in mounting hole, passes through fixation
Part and mounting hole fix firm banking.
Preferably, the both sides of described hinged seat are provided with screwed hole, the direction of the screwed hole is laterally set, and is led to
The hinged end of fixed plate is rotated, the ripple pearl screw for fixed rotation fixed plate is installed in described screwed hole；Ripple pearl screw
Spring and nail pearl are inside provided with, rotation fixed plate can be fixed by tightening inward, and rotation can be consolidated outward by loosening
Fixed board recovers rotation.
Preferably, hook is additionally provided with described power probe.
Beneficial effect：The invention has the advantages that：
(1) power probe being arranged in the side wall of test machine by linking up with the present invention, radio frequency line is provided with two sections, in
Between set one be used for fixed RF line fixing device, radio frequency line is completely in free vacant state, not by external force
The contact interference of other foreign objects, makes the calibration result of power probe more accurate, and power probe and radio frequency line are also more square
Just dismantle；
(2) fixing device of radio frequency line using hinged seat and rotates fixed plate come fixed RF line in the present invention, during use
Rotate fixed plate placement or oblique placement, then pass through ripple pearl screw fixed position, the first radio frequency line and the second radio frequency line vertically
Be respectively connecting on the radio-frequency joint of both sides, without when two radio frequency lines are pulled down, rotation fixed plate is horizontal positioned,
Overall structure is quick detachable, and the installation and removal of radio frequency line are very convenient, and is not take up larger space.
Brief description of the drawings
Fig. 1 is that existing semiconductor test machine calibrating installation uses figure；
Fig. 2 is the use figure of the present invention；
Fig. 3 is fixture structure exploded view in the present invention；
Fig. 4 is fixing device assembling figure in the present invention.
Embodiment
Below in conjunction with the accompanying drawings and specific embodiment, the present invention is furture elucidated, and the present embodiment is with technical solution of the present invention
Premised under implemented, it should be understood that these embodiments are only illustrative of the invention and is not intended to limit the scope of the invention.
As shown in Figure 2, Figure 3 and Figure 4, a kind of semiconductor test machine calibrating installation, including power probe 1, installed in power
First paragraph radio frequency line 2 on probe 1, the second segment radio frequency line 3 in tester channels and penetrated for supporting and fixing
The fixing device of frequency line；Described fixing device includes firm banking 4 and rotation fixed plate 5, is installed on described firm banking 4
There is a hinged seat 6, one end of described rotation fixed plate 5 is arranged on hinged seat 6 by steady pin 7, and rotation fixed plate 5 can enclose
Rotate and fix around hinged seat 6；One end of described rotation fixed plate 5 is also equipped with radio-frequency maser installing plate 8, described radio-frequency maser peace
Radio-frequency joint 9 is installed, the first described radio frequency line 2 and the second radio frequency line 3 are connected respectively radio-frequency joint 9 in loading board 8
On.
The end set of described rotation fixed plate 5 has radio frequency hole 10, surrounding and the radio-frequency maser installation in the radio frequency hole 10
Mounting hole 11 corresponding to being provided with plate 8, described radio-frequency maser installing plate 8 pass through the fixture 12 of setting and the peace being engaged
Fill hole 11 and be arranged on the end of rotation fixed plate 5, and the radio-frequency joint 9 of side is passed through radio frequency hole 10, make it that two are penetrated
Frequency joint is respectively positioned at the both sides of rotation fixed plate 5.
The radio frequency hole 10 of the described front end of rotation fixed plate 5 is provided with two altogether, is mounted on penetrating on two radio frequency holes 10
Frequency head installing plate 8；Mounting hole 11 is additionally provided with described firm banking 4, fixture 12 is installed in mounting hole 11, by solid
Determine part 12 and mounting hole 11 fixes firm banking 4.
The both sides of described hinged seat 6 are provided with screwed hole 13, and the direction of the screwed hole 13 is laterally set, and leads to rotation
The hinged end of fixed plate 5, the ripple pearl screw 14 for fixed rotation fixed plate 5 is installed in described screwed hole 13；Ripple pearl spiral shell
Spring and nail pearl are provided with silk 14, rotation fixed plate 5 can be fixed by tightening inward, and rotation can be made outward by loosening
Turn fixed plate 5 and recover rotation；Hook 15 is additionally provided with described power probe 1.
By power probe by linking up with the side wall of test machine in the present invention, radio frequency line is provided with two sections, centre
Set one be used for fixed RF line fixing device, radio frequency line is completely in free vacant state, not by external force its
He disturbs in foreign object contact, makes the calibration result of power probe more accurate, and power probe and radio frequency line are also more convenient
Dismounting；
The fixing device of radio frequency line is rotated using hinged seat and rotation fixed plate come fixed RF line, during use in the present invention
Fixed plate is placed vertically or oblique placement, then passes through ripple pearl screw fixed position, the first radio frequency line and the second radio frequency line difference
Be connected on the radio-frequency joint of both sides, without when two radio frequency lines are pulled down, rotation fixed plate is horizontal positioned, overall
Structure is quick detachable, and the installation and removal of radio frequency line are very convenient, and is not take up larger space.
Described above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (6)
- A kind of 1. semiconductor test machine calibrating installation, it is characterised in that：Including power probe (1), on power probe (1) The first radio frequency line (2), the second radio frequency line (3) in tester channels and for supporting and fixed RF line is consolidated Determine device；Described fixing device includes firm banking (4) and rotation fixed plate (5), and described firm banking is provided with (4) One hinged seat (6), one end of described rotation fixed plate (5) are arranged on hinged seat (6) by steady pin (7), and rotation is fixed Plate (5) can surround hinged seat (6) rotation and fix；One end of described rotation fixed plate (5) is also equipped with radio-frequency maser installing plate (8), radio-frequency joint (9), described the first radio frequency line (2) and the second radio frequency line are installed on described radio-frequency maser installing plate (8) (3) it is connected respectively on radio-frequency joint (9).
- A kind of 2. semiconductor test machine calibrating installation according to claim 1, it is characterised in that：Described rotation fixed plate (5) end set has radio frequency hole (10), is provided with the surrounding and radio-frequency maser installing plate (8) in the radio frequency hole (10) corresponding Mounting hole (11), described radio-frequency maser installing plate (8) are pacified by the fixture (12) of setting and the mounting hole (11) being engaged Mounted in the end of rotation fixed plate (5).
- A kind of 3. semiconductor test machine calibrating installation according to claim 2, it is characterised in that：Described rotation fixed plate (5) the radio frequency hole (10) of front end is provided with two altogether, and radio-frequency maser installing plate (8) is mounted on two radio frequency holes (10).
- A kind of 4. semiconductor test machine calibrating installation according to claim 1, it is characterised in that：Described firm banking (4) mounting hole (11) is additionally provided with, fixture (12) is installed in mounting hole (11), passes through fixture (12) and mounting hole (11) it is firm banking (4) is fixed.
- A kind of 5. semiconductor test machine calibrating installation according to claim 1, it is characterised in that：Described hinged seat (6) Both sides be provided with screwed hole (13), the direction of the screwed hole (13) is laterally set, and leads to the be hinged of rotation fixed plate (5) End, the interior ripple pearl screw (14) being provided with for fixed rotation fixed plate (5) of described screwed hole (13).
- A kind of 6. semiconductor test machine calibrating installation according to claim 1, it is characterised in that：Described power probe (1) hook (15) is additionally provided with.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710892721.1A CN107561471A (en) | 2017-09-27 | 2017-09-27 | A kind of semiconductor test machine calibrating installation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710892721.1A CN107561471A (en) | 2017-09-27 | 2017-09-27 | A kind of semiconductor test machine calibrating installation |
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| Publication Number | Publication Date |
|---|---|
| CN107561471A true CN107561471A (en) | 2018-01-09 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710892721.1A Pending CN107561471A (en) | 2017-09-27 | 2017-09-27 | A kind of semiconductor test machine calibrating installation |
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| CN (1) | CN107561471A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781431A (en) * | 2020-07-13 | 2020-10-16 | 芝纶自动化科技(上海)有限公司 | Testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7088098B1 (en) * | 2005-02-24 | 2006-08-08 | General Electric Company | System, method and apparatus for tuning an RF volume coil |
| CN103982762A (en) * | 2014-05-29 | 2014-08-13 | 国家电网公司 | Monitoring device installation frame |
| CN203798974U (en) * | 2014-03-06 | 2014-08-27 | 深圳市沃特沃德科技有限公司 | Calibration device of PCBA jointed board |
| CN204789659U (en) * | 2015-04-03 | 2015-11-18 | 广东欧珀移动通信有限公司 | RF shielding testing arrangement |
| CN105301377A (en) * | 2014-06-19 | 2016-02-03 | 联想移动通信科技有限公司 | Method, apparatus and system for measuring RF line loss |
| US20160334442A1 (en) * | 2015-05-14 | 2016-11-17 | Rohde & Schwarz Gmbh & Co. Kg | Measuring system and measuring method with power calibration |
| CN206273514U (en) * | 2016-12-25 | 2017-06-23 | 惠州福盛创新电子技术有限公司 | A kind of smart mobile phone radio frequency line remover-and-replacer |
| CN207473074U (en) * | 2017-09-27 | 2018-06-08 | 上海旻艾半导体有限公司 | Semiconductor test machine calibrating installation |
-
2017
- 2017-09-27 CN CN201710892721.1A patent/CN107561471A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7088098B1 (en) * | 2005-02-24 | 2006-08-08 | General Electric Company | System, method and apparatus for tuning an RF volume coil |
| CN203798974U (en) * | 2014-03-06 | 2014-08-27 | 深圳市沃特沃德科技有限公司 | Calibration device of PCBA jointed board |
| CN103982762A (en) * | 2014-05-29 | 2014-08-13 | 国家电网公司 | Monitoring device installation frame |
| CN105301377A (en) * | 2014-06-19 | 2016-02-03 | 联想移动通信科技有限公司 | Method, apparatus and system for measuring RF line loss |
| CN204789659U (en) * | 2015-04-03 | 2015-11-18 | 广东欧珀移动通信有限公司 | RF shielding testing arrangement |
| US20160334442A1 (en) * | 2015-05-14 | 2016-11-17 | Rohde & Schwarz Gmbh & Co. Kg | Measuring system and measuring method with power calibration |
| CN206273514U (en) * | 2016-12-25 | 2017-06-23 | 惠州福盛创新电子技术有限公司 | A kind of smart mobile phone radio frequency line remover-and-replacer |
| CN207473074U (en) * | 2017-09-27 | 2018-06-08 | 上海旻艾半导体有限公司 | Semiconductor test machine calibrating installation |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781431A (en) * | 2020-07-13 | 2020-10-16 | 芝纶自动化科技(上海)有限公司 | Testing device |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 201306 Pudong New Area 6 new town, 66 Nanhui, Shanghai Applicant after: SHANGHAI MIN'AI SEMICONDUCTOR CO.,LTD. Address before: 200120 Shanghai Pudong New Area Pudong New Area Lingang New Town 66 Road 6 Applicant before: SHANGHAI MINAI INFORMATION TECHNOLOGY CO.,LTD. |
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180109 |