CN107543969A - The method of testing and device of a kind of dielectric constant - Google Patents
The method of testing and device of a kind of dielectric constant Download PDFInfo
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- CN107543969A CN107543969A CN201610508576.8A CN201610508576A CN107543969A CN 107543969 A CN107543969 A CN 107543969A CN 201610508576 A CN201610508576 A CN 201610508576A CN 107543969 A CN107543969 A CN 107543969A
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- 238000010998 test method Methods 0.000 title claims abstract description 7
- 239000000758 substrate Substances 0.000 claims abstract description 24
- 238000012360 testing method Methods 0.000 claims description 16
- 238000001514 detection method Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 8
- 238000005259 measurement Methods 0.000 abstract description 4
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000005540 biological transmission Effects 0.000 description 6
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- 238000005562 fading Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000003012 network analysis Methods 0.000 description 1
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Abstract
The present invention provides a kind of method of testing and device of dielectric constant, the device of the dielectric constant of the present invention, including according to the strip line calculated, two pieces of metallic plates, two pieces of dielectric substrates and two joints, wherein, two pieces of metallic plates are fixed with each other by fastening assembly and determine a cavity, two pieces of dielectric substrates are arranged on the inside of the cavity, and two pieces of dielectric substrates contact with the cavity wall of cavity, the strip line is arranged between two pieces of substrates, two joints are connected with the both ends of the strip line and positioned at the sides of cavity respectively, and form a two-port network, adjust the parameter of Network Analyzer, two joints connect two ports of Network Analyzer respectively.The method of the present invention is operated by the device of the present invention, and measurement accuracy is higher, and cost of manufacture is relatively low and simple to operate.
Description
Technical field
The present invention relates to the dielectric permittivity measuring method and device of the dielectric constant measurement method and apparatus of solid material, more particularly to a kind of planar materials.
Background technology
Chinese patent illustrates a kind of dielectric constant measuring apparatus（Patent No.：201310276389.8 authorize Publication No.：CN103308778A）Including slot line structure, the slot line structure is provided at both ends with signaling interface, for connecting test instrument and transmission test signal, hole is set in slot line structure, hole is located in the line of rabbet joint, and the container of measured material is contained for placing, and measured medium is put into container during measurement, equivalent to measured medium embedded in slot line structure, using influence of the measured medium to microwave transmission characteristic, the transmission characteristic being put into by analysis before and after measured medium, the dielectric constant of measured medium is obtained.In order that embedded measured medium can produce substantial effect to the transmission characteristic of slot line structure, improve the accuracy of analysis test, the size of hole should make the container of placement have sufficiently large volume, its measured material contained can fully influence the transmission characteristic of slot line structure, but this structure bore hole size can not be too big, so that destroying the microstrip transmission line characteristic of slot line structure, test result is influenceed.
Chinese patent discloses a kind of dielectric permittivity measuring method of Excavation Cluster Based on Network Analysis instrument（The patent No.：201510590507.1 application publication number is：CN105137199A）, its method is to utilize the Network Analyzer 250B test systems of S＆A companies of the U.S., including signal generator, frequency counter, attenuator, power divider, 30dB attenuators, extender/line balance device, phasometer and voltmeter；Pin network test circuit, detect the resistance of each resistance in π network impedance match circuits of the circuit parameter mainly including detection signal frequency and for reducing error.When the signal generator of the 250B test systems produces a signal, after attenuator is decayed, signal is divided into two path signal by power divider, is used as reference signal after 30dB attenuators all the way, another way signal enters pin network test circuit after extender/line balance device；The pin network test circuit is made up of symmetrical double π types loops, including input attenuator, output pad and detection probe；The input attenuator and output pad are used for impedance and the matches impedances of 250B test systems for causing pin network；The detection probe is popped one's head in for parallel two-hand, and the distance for upper two probe of popping one's head in immobilizes；Signal obtains test signal after pin network；With phasometer and the phase difference and amplitude fading of voltmeter difference measuring reference signals and test signal, the relation between fit phase difference and dielectric constant, opening relationships model calculates dielectric constant.The device that this measuring method is related to is more, also and remarkable, and the relation for needing substantial amounts of experiment to come between fit phase difference and dielectric constant.
The content of the invention
It is a primary object of the present invention to solve above-mentioned problem, there is provided the method for testing and device of a kind of dielectric constant, method of the invention are operated by the device of the present invention, and measurement accuracy is higher, and cost of manufacture is relatively low and simple to operate.
The technical solution adopted by the present invention is：A kind of device of dielectric constant of the present invention, including according to the strip line calculated, two pieces of metallic plates, two pieces of dielectric substrates and two joints, wherein, two pieces of metallic plates are fixed with each other by fastening assembly and determine a cavity, two pieces of dielectric substrates are arranged on the inside of the cavity, and two pieces of dielectric substrates contact with the cavity wall of cavity, the strip line is arranged between two pieces of substrates, two joints are connected with the both ends of the strip line and positioned at the sides of cavity respectively, and form a two-port network, adjust the parameter of Network Analyzer, two joints connect two ports of Network Analyzer respectively.
A kind of method of testing of dielectric constant, comprises the following steps：
Step 1, two ports of Two-port netwerk detection circuit are connected respectively to two ports of Network Analyzer；
Step 2, the frequency to be tested is set on Network Analyzer, adjusts circuit parameter；
Step 3, initial phase Φ 1 is recorded under test frequency, then tested medium block B is positioned in singly-terminal pair, record its phase Φ 2, the ΔΦ=∣ of ∣ Φ 2- Φ 1；
Step 4, the relational model of phase difference and dielectric constant is established according to the device created, calculate the dielectric constant of measured medium block.
Beneficial effects of the present invention are：The device of the dielectric constant of the present invention, including according to the strip line calculated, two pieces of metallic plates, two pieces of dielectric substrates and two joints, wherein, two pieces of metallic plates are fixed with each other by fastening assembly and determine a cavity, two pieces of dielectric substrates are arranged on the inside of the cavity, and two pieces of dielectric substrates contact with the cavity wall of cavity, the strip line is arranged between two pieces of substrates, two joints are connected with the both ends of the strip line and positioned at the sides of cavity respectively, and form a two-port network, adjust the parameter of Network Analyzer, two joints connect two ports of Network Analyzer respectively.The method of the present invention is operated by the device of the present invention, and measurement accuracy is higher, and cost of manufacture is relatively low and simple to operate.
Brief description of the drawings
Fig. 1 is the schematic perspective view of the device of the present invention.
Fig. 2 is that this Fig. 1 removes the schematic diagram after one piece of metallic plate.
Fig. 3 is the schematic diagram that the device of the present invention is put into after being tested tested medium block.
Embodiment
It is as shown in Figure 1 to Figure 3 a kind of preferable specific embodiment of the present invention, a kind of device of dielectric constant, including according to the strip line 10 calculated, two pieces of metallic plates 20, two pieces of dielectric substrates 30 and two joints 40, wherein, two pieces of metallic plates 20 are fixed with each other by fastening assembly 50 and determine a cavity A, two pieces of dielectric substrates 30 are arranged on the inside of the cavity 10, and cavity wall of two pieces of dielectric substrates 30 with cavity A contacts, the strip line 10 is arranged between two pieces of substrates 30, two joints are connected with the both ends of the strip line 10 and positioned at cavity A sides respectively, and form a two-port network, adjust the parameter of Network Analyzer, two port joints connect two ports of Network Analyzer respectively.
Further, the fastening assembly 50 includes the support column 51 being horizontally set between two pieces of metallic plates 20 and the fastening bolt 52 for metallic plate 20 and the support column 51 to be fixed.
Preferably, the first half of the strip line 10 is exposed is provided with breach in the top of two pieces of dielectric substrates 30, i.e. dielectric substrate top half, and the exposed two pieces of dielectric substrates in cavity of strip line top half are not covered with the strip line.
Preferably, support column is provided at both ends with internal thread, and the length of support column is 7mm.
Preferably, the strip line thickness is between 0.4-1.0 mm.
A kind of method of testing of dielectric constant, comprises the following steps：
Step 1, two ports of Two-port netwerk detection circuit are connected respectively to two ports of Network Analyzer；Tested medium block B；
Step 2, the frequency to be tested is set on Network Analyzer, adjusts circuit parameter；
Step 3, initial phase Φ 1 is recorded under test frequency, then tested medium block B is positioned in singly-terminal pair, record its phase Φ 2, the ΔΦ=∣ of ∣ Φ 2- Φ 1；
Step 4, the relational model of phase difference and dielectric constant is established according to the device created, calculate the dielectric constant of measured medium block.
Further, the math equation of the phase difference in step 4 and dielectric constant is：Dk=(1+0.00172ΔΦ)x(1+0.00172ΔΦ).
Embodiments of the invention and accompanying drawing are intended merely to the design concept of the displaying present invention, and protection scope of the present invention should not necessarily be limited to this embodiment.
It can be seen from the above description that the purpose of design of the present invention can effectively be implemented.The part of embodiment illustrates the purpose of the present invention and implements function and structure theme, and including other equivalent substitutions.
Therefore, the claims of the present invention include other equivalent implementations, and the specific scope of claims are incorporated herein by reference.
Claims (7)
- A kind of 1. device of dielectric constant, it is characterised in that：Including according to the strip line calculated, two pieces of metallic plates, two pieces of dielectric substrates and two joints, wherein, two pieces of metallic plates are fixed with each other by fastening assembly and determine a cavity, two pieces of dielectric substrates are arranged on the inside of the cavity, and two pieces of dielectric substrates contact with the cavity wall of cavity, the strip line is arranged between two pieces of substrates, two joints are connected with the both ends of the strip line and positioned at the sides of cavity respectively, and form a two-port network, adjust the parameter of Network Analyzer, two joints connect two ports of Network Analyzer respectively.
- 2. a kind of device of dielectric constant as claimed in claim 1, it is characterised in that the fastening assembly includes the support column being horizontally set between two pieces of metallic plates and the fastening bolt for metallic plate and the support column to be fixed.
- 3. a kind of device of dielectric constant as claimed in claim 1, it is characterised in that the first half of the strip line is exposed in the top of two pieces of dielectric substrates.
- 4. a kind of device of dielectric constant as claimed in claim 2, it is characterised in that the support column is provided at both ends with internal thread, and the length of the support column is 7mm.
- 5. a kind of device of dielectric constant as claimed in claim 1, it is characterised in that the strip line thickness is between 0.4-1.0 mm.
- 6. a kind of method of testing of dielectric constant, comprises the following steps：Step 1, two ports of Two-port netwerk detection circuit are connected respectively to two ports of Network Analyzer；Step 2, the frequency to be tested is set on Network Analyzer, adjusts circuit parameter；Step 3, initial phase Φ 1 is recorded under test frequency, then tested medium block B is positioned in singly-terminal pair, record its phase Φ 2, the ΔΦ=∣ of ∣ Φ 2- Φ 1；Step 4, the relational model of phase difference and dielectric constant is established according to the device created, calculate the dielectric constant of measured medium block.
- 7. a kind of method of testing of dielectric constant as claimed in claim 6, it is characterised in that further, the math equation of phase difference and dielectric constant in step 4 is：Dk=(1+0.00172ΔΦ)x(1+0.00172ΔΦ).
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| CN201610508576.8A CN107543969A (en) | 2016-06-29 | 2016-06-29 | The method of testing and device of a kind of dielectric constant |
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| CN201610508576.8A CN107543969A (en) | 2016-06-29 | 2016-06-29 | The method of testing and device of a kind of dielectric constant |
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2062457U (en) * | 1989-07-12 | 1990-09-19 | 电子科技大学 | Composite dielectric constant testing sensor of microwave dielectric substrate |
| EP0414266A1 (en) * | 1989-08-25 | 1991-02-27 | Hitachi Chemical Co., Ltd. | Stripline patch antenna with slot plate |
| CN1790040A (en) * | 2005-12-06 | 2006-06-21 | 电子科技大学 | Cylindrical high Q resonant cavity and microwave dielectric complex permittivity test device |
| CN1801526A (en) * | 2005-12-06 | 2006-07-12 | 电子科技大学 | Stripline resonator and microwave thin film material electromagnetic parameter testing device |
| CN101196545A (en) * | 2006-12-07 | 2008-06-11 | 中国科学院半导体研究所 | Device for measuring dielectric characteristics of dielectric material |
| CN102116804A (en) * | 2010-12-29 | 2011-07-06 | 电子科技大学 | Method for testing complex dielectric constant of microwave dielectric material |
| CN201918476U (en) * | 2010-04-02 | 2011-08-03 | 西安海天天线科技股份有限公司 | Phase shifter used for electrically-controlled antenna of base station |
| CN102749599A (en) * | 2012-07-27 | 2012-10-24 | 中国计量学院 | Magnetic resonance radio-frequency coil based on an alternate impedance micro-strip line |
| CN104569510A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | Clamp of strip-line resonator |
| CN105137199A (en) * | 2015-09-16 | 2015-12-09 | 北京工商大学 | Network analyzer-based dielectric constant measuring method |
-
2016
- 2016-06-29 CN CN201610508576.8A patent/CN107543969A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2062457U (en) * | 1989-07-12 | 1990-09-19 | 电子科技大学 | Composite dielectric constant testing sensor of microwave dielectric substrate |
| EP0414266A1 (en) * | 1989-08-25 | 1991-02-27 | Hitachi Chemical Co., Ltd. | Stripline patch antenna with slot plate |
| CN1790040A (en) * | 2005-12-06 | 2006-06-21 | 电子科技大学 | Cylindrical high Q resonant cavity and microwave dielectric complex permittivity test device |
| CN1801526A (en) * | 2005-12-06 | 2006-07-12 | 电子科技大学 | Stripline resonator and microwave thin film material electromagnetic parameter testing device |
| CN101196545A (en) * | 2006-12-07 | 2008-06-11 | 中国科学院半导体研究所 | Device for measuring dielectric characteristics of dielectric material |
| CN201918476U (en) * | 2010-04-02 | 2011-08-03 | 西安海天天线科技股份有限公司 | Phase shifter used for electrically-controlled antenna of base station |
| CN102116804A (en) * | 2010-12-29 | 2011-07-06 | 电子科技大学 | Method for testing complex dielectric constant of microwave dielectric material |
| CN102749599A (en) * | 2012-07-27 | 2012-10-24 | 中国计量学院 | Magnetic resonance radio-frequency coil based on an alternate impedance micro-strip line |
| CN104569510A (en) * | 2015-01-29 | 2015-04-29 | 无锡江南计算技术研究所 | Clamp of strip-line resonator |
| CN105137199A (en) * | 2015-09-16 | 2015-12-09 | 北京工商大学 | Network analyzer-based dielectric constant measuring method |
Non-Patent Citations (3)
| Title |
|---|
| MURRAY OLYPHANT等: "《Strip-Line Methods for Dielectric Measurements at Microwave Frequencies》", 《 IEEE TRANSACTIONS ON ELECTRICAL INSULATION》, 31 March 1970 (1970-03-31) * |
| W. BARRY: "《A Broad-Band, Automated, Stripline Technique for the Simultaneous Measurement of Complex Permittivity and Permeability》", 《IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES》, pages 80 * |
| 董成玲: "《微波介质基板复介电常数测量分析》", 《中国优秀硕士学位论文全文数据库基础科学辑》, pages 7 * |
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