CN107534249A

CN107534249A - A kind of adapter and tester for being used to demarcate test probe circuitry loss

Info

Publication number: CN107534249A
Application number: CN201680025216.0A
Authority: CN
Inventors: 熊忠恺; 胡义伟; 时永福
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2016-03-24
Filing date: 2016-03-24
Publication date: 2018-01-02
Also published as: WO2017161536A1

Abstract

One kind is used for the adapter (2) for demarcating test probe (1) line loss, test probe (1) includes syringe (11) and protrudes from the nook closing member (12) of syringe (11), the first end (21) of adapter (2) is provided with probe aperture (22), the outer wall (211) of the first end (21) of adapter (2) is arranged with sleeve (23), probe aperture (22) is used to coordinate the nook closing member (12) for accommodating test probe (1), and sleeve (23) is used to coordinate the syringe (11) for accommodating test probe (1).The adapter solves in the prior art that production cost is high, and contraposition is inaccurate, easily rocks, the problem of test result is with a low credibility.A kind of tester is also provided.

Description

A kind of adapter and tester being lost for demarcating test probe circuitry

Technical field

The present invention relates to the technical field of line loss calibration more particularly to a kind of adapters and tester being lost for demarcating test probe circuitry.

Background technique

For predetermined function is better achieved, RF switch is provided on radio frequency matching circuit to be compatible with production line test and transmit the radiofrequency signal in radio circuit.The circuit board must just match the RF switch in the radio frequency testing of factory; therefore technical staff would generally be on test loaded tool using matching the RF switch to radio frequency test probe; RF switch is opened by rf probe, with shunting signal, to obtain test result.To keep the result of radio frequency testing more reliable accurate, the line loss of test probe must be just demarcated before test, it needs to connect rf probe and Common radio frequency cable using adapter in calibration process, to realize the radio signal transmission at rf probe end Yu test equipment end, and then accurately obtain line loss.The mating adapter of usually used corresponding rf probe or the connection using dummy plate (imitative product circuit plate) Lai Shixian rf probe and Common radio frequency cable in the prior art.

Mating adapter is the current major way for realizing connection rf probe and RF cable, as shown in Figure 1, one end of mating adapter 01, which is provided with, is designed as standard coaxial connector female with the matched radio-frequency maser of rf probe interface standard, the other end.Technical staff is aligned by naked eyes when use, probe aperture 011 on mating adapter 01 is set on the needle core of rf probe, then it holds and positions and guarantee that it is vertical with datum level up to test terminates, entire calibration process needs one minute or so, technical staff is easy to appear contraposition inaccuracy and hand-held the problem of shaking in the process, leads to needle core bending when using the calibration of mating adapter 01, so as to cause error and the service life of probe is reduced, increases probe wear and tear expense.Meanwhile the contact area of mating adapter 01 and probe is very small, and lasting retentivity is needed in calibration process to ensure to align, but the retentivity that the mode that holds of technical staff is applied is extremely not Stablize, is fluctuated so as to cause calibration result, reduce the accuracy of calibration.

There are two types of the mode that rf probe and Common radio frequency cable are connected using dummy plate is current, one is profiling dummy plates, and one is general dummy plates.Profiling dummy plate is one piece of circuit board corresponding with circuit board under test of exploitation, and adapter is correspondingly arranged at the position of setting rf probe, the tail portion of adapter is connected with Common radio frequency cable, measures after contraposition, is a kind of professional component for a certain circuit board.But the development cycle of profiling dummy plate is long, and has to wait for just can be carried out exploitation after the completion of the design of slowdown monitoring circuit plate, extends the testing time, reduces testing efficiency, if circuit must redesign profiling dummy plate when changing, causes testing cost excessively high.Simultaneously, since circuit board needs to clamp by fixture during the test to ensure that its position is fixed, therefore profiling dummy plate must avoid fixture when developing design, and to avoid occurring that the problem of measuring can not be cooperated, this just considerably increases the design efforts would of profiling dummy plate.General dummy plate is one adapter matched with probe of setting on one piece of lesser circuit board of area, the tail portion of adapter connects Common radio frequency cable, and only the head of adapter need to be directed at rf probe in the side of circuit board setting position portion, use and be inserted into and can measure.But general dummy plate still needs to manual alignment when in use, and itself retentivity is insufficient, and manual engagement is needed to use, the problem that equally will appear damage probe causes test result with a low credibility occurs.

Summary of the invention

The embodiment of the present invention provides a kind of adapter being lost for demarcating test probe circuitry, and the production cost for being used to demarcate the adapter of test probe circuitry loss is not high, and contraposition is accurate, is not easy to shake, so that test result is more accurate.

In order to achieve the above objectives, the embodiment of the present invention adopts the following technical scheme that

In a first aspect, a kind of adapter being lost for demarcating test probe circuitry is disclosed,

The test probe for needing to demarcate line loss includes the needle core of syringe with the end for protruding from syringe.

Firstly, the first end of the adapter is equipped with probe aperture, the outer wall of the first end of the adapter is arranged with sleeve.

In the specific implementation, the probe aperture is for cooperating the needle core for accommodating the probe, the sleeve is for cooperating the syringe for accommodating the probe.

Compared to the prior art, provided by the present invention for the adapter of calibration test probe circuitry loss, since its structure is simple, therefore production cost is not high, and the adapter can be applied in the scheme of all probe correction contrapositions, it is versatile, exploitation design is carried out without taking a significant amount of time when test, and testing efficiency is high.In test, technical staff hold adapter, the sleeve on adapter are set on the syringe outer wall of test probe, and slide along sleeve lining, until in the probe aperture on the needle core insertion adapter of test probe.Since the syringe of sleeve and test probe is equipped with, after sleeve is set on the syringe of test probe, the probe aperture that testing the needle core of probe will be automatically aligned on adapter reduces the workload of technical staff without manually being aligned.Simultaneously; technical staff is when applying retentivity to adapter; the retentivity is applied on sleeve and is transmitted on the syringe of test probe; retentivity does not directly act on the needle core of test probe; there is the risk damaged in the needle core stress for reducing test probe, and protects the needle core of test probe to a certain extent.And biggish opposite shaking will not occur with test probe for adapter after applying retentivity, avoiding to shake leads to the needle core of damage measure probe, increases testing cost and cause test error, ensure that the levels of precision of test.

In the first mode in the cards, with reference to first aspect, for the accuracy for guaranteeing test result, avoid opposite shake occur between the needle core and the probe aperture of the test probe.It is in clearance fit between the probe aperture and the needle core of the probe, it is in clearance fit between the sleeve and the syringe of the probe, and the gap between the probe aperture and the needle core of the probe is more than or equal to the gap between the sleeve and the syringe of the probe.

When the gap between the probe aperture and the needle core of the test probe is greater than the gap between the sleeve and the syringe of the test probe, after technical staff applies retentivity, if having interference so that retentivity can not be vertical with the plane holding where the circuit board where the test probe, it just will appear subtle opposite shaking between the adapter and the test probe, occurring the opposite meeting shaken first at this time is between the sleeve and the syringe of the test probe, when the opposite shaking is gradually increased, the inner wall of needle core and the probe aperture that the test probe can just be made is in contact and generates opposing force, this is reduced to a certain extent The probability that the needle core of the test probe is damaged, largely protects the needle core of the test probe, and then has ensured the accuracy of test result.If the gap between the probe aperture and the needle core of the test probe is equal to the gap between the sleeve and the syringe of the test probe, when the retentivity that technical staff applies is not vertical with the plane where the circuit board where the test probe, the retentivity is shared jointly between the syringe of the sleeve and the test probe, the probe aperture and the needle core of the test probe, reduce the active force that the needle core of the test probe is subject at this moment, there is the probability damaged to reduce the needle core of the test probe, has ensured the accuracy of test result.

In second of mode in the cards, with reference to first aspect the first mode in the cards, the gap between the probe aperture and the needle core of the probe is zero, and the gap between the sleeve and the syringe of the probe is zero.

When gap between the probe aperture and the needle core of the test probe is zero, contact area between the probe aperture and the needle core of the test probe is maximum, this laser propagation effect for allowing for signal reaches best, simultaneously, in order to avoid causing to damage to the needle core of the test probe when retentivity is disturbed, and direction is caused deviation occur, gap between the sleeve and the syringe of the test probe is also configured as zero, ensures the stability of the needle core of the test probe and the accuracy of test to the full extent.

In the third mode in the cards, with reference to first aspect, the threaded hole for penetrating the barrel of the sleeve radially is offered on direction on the barrel of the sleeve, is provided with positioning screw in the threaded hole.

In the 4th kind of mode in the cards, with reference to first aspect, it is provided with internal screw thread on the inner wall of the sleeve, to match with the external screw thread on the outer wall for the first end that the adapter is arranged in.

In the 5th kind of mode in the cards, the 4th kind of mode in the cards with reference to first aspect, the screw thread pair that the external screw thread on the outer wall of the internal screw thread being arranged on the sleeve lining and the first end that the adapter is arranged in is constituted is self-locking thread pair.

Second aspect discloses one kind and is used for tester, including host, connect for demarcating the adapter of test probe circuitry loss with the host described in above-mentioned technical proposal.

When being demarcated using line loss of the tester to test probe, described it will turn Connector is set on test probe, then applying certain retentivity can be tested, test result is with a high credibility, and will not damage measure probe needle core, the tester has preferable universal performance simultaneously, can be suitable for the line loss calibration test of radio frequency test probe, bluetooth test probe and Baseband Testing probe etc..

Detailed description of the invention

In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, the drawings to be used in the description of the embodiments or prior art will be briefly described below, apparently, drawings in the following description are only some embodiments of the invention, for those of ordinary skill in the art, without creative efforts, it is also possible to obtain other drawings based on these drawings.

Fig. 1 is the schematic front view of mating adapter in the prior art；

Fig. 2 is provided in an embodiment of the present invention a kind of for demarcating the schematic front view of the adapter of test probe circuitry loss；

Fig. 3 is the schematic cross-sectional view of the needle core of insertion test probe in a kind of probe aperture for demarcating the adapter of test probe circuitry loss provided in an embodiment of the present invention；

Fig. 4 is provided in an embodiment of the present invention a kind of for demarcating the schematic cross-sectional view of the adapter of test probe circuitry loss.

Specific embodiment

Following will be combined with the drawings in the embodiments of the present invention, and technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, every other embodiment obtained by those of ordinary skill in the art without making creative efforts, shall fall within the protection scope of the present invention.

In the description of the present invention, it will be appreciated that, the orientation or positional relationship of the instructions such as term " center ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside" is to be based on the orientation or positional relationship shown in the drawings, it is merely for convenience of description of the present invention and simplification of the description, rather than the dress of indication or suggestion meaning It sets or element must have a particular orientation, be constructed and operated in a specific orientation, therefore be not considered as limiting the invention.

Term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance or implicitly indicate the quantity of indicated technical characteristic." first " is defined as a result, the feature of " second " can explicitly or implicitly include one or more of the features.

In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation ", " connected ", " connection " shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It can be mechanical connection；It can be directly connected, the connection inside two elements can also be can be indirectly connected through an intermediary.For the ordinary skill in the art, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.

In scientific measurement, calibration, which is one, cannot be neglected important step.The main function of calibration is to eliminate systematic error, improves the correctness of instrument or system, to keep the test result of system more accurate.

In the test of circuit, according to the requirement of circuit predetermined function, corresponding test probe 1 is provided on test loaded tool, to test the performance of the circuit.Tester tests the host of probe 1 and tester by the connection of adapter 2, to test circuit performance.But need to demarcate the line loss of the test probe 1, before test, to ensure the accuracy of the test result of circuit performance.

As shown in Figures 2 and 3, a kind of adapter being lost for demarcating test probe circuitry, test probe 1 includes the needle core 12 of syringe 11 with the end 111 for protruding from syringe 11, the first end 21 of adapter 2 is equipped with probe aperture 22, the outer wall 211 of the first end 21 of adapter 2 is arranged with sleeve 23, probe aperture 22 is used to cooperate the needle core 12 for accommodating test probe 1, and sleeve 23 is used to cooperate the syringe 11 for accommodating test probe 1.

Provided by the present invention for the adapter of calibration test probe circuitry loss, since its structure is simple, production cost is not high.In test, technical staff hold adapter 2, the sleeve 23 on adapter 2 are set on the outer wall 211 of the syringe 11 of test probe 1, and slide along the inner wall of sleeve 23, until the needle core 12 of test probe 1 is inserted into adapter 2 On probe aperture 22 in.Since the syringe 22 of sleeve 23 and test probe 1 is equipped with, therefore, after sleeve 23 being set on the syringe 11 of test probe 1, the needle core 12 of test probe 1 will be automatically aligned to the probe aperture 22 on adapter 2, without manually being aligned, the workload of technical staff is reduced.Simultaneously; technical staff is when applying retentivity to adapter 2; the retentivity is applied on sleeve 23 and is transmitted on the syringe 11 of test probe 1; retentivity does not directly act on the needle core 12 of test probe 1; there is the risk damaged in 12 stress of needle core for reducing test probe 1, and protects the needle core 12 of test probe 1 to a certain extent.And biggish opposite shaking will not occur with test probe 1 for adapter 2 after applying retentivity, avoiding to shake leads to the needle core 12 of damage measure probe 1, increases testing cost and cause test error, ensure that the levels of precision of test.

In test process, the tiny shaking tested between the needle core 12 and probe aperture 22 of probe 1 also can cause certain error to test.Therefore, for the accuracy for guaranteeing test result, as shown in Figure 3, it is in clearance fit between probe aperture 22 and the needle core 12 for testing probe 1, it is in clearance fit between sleeve 23 and the syringe 11 for testing probe 1, and the gap between probe aperture 22 and the needle core 12 for testing probe 1 is greater than or equal to the gap between sleeve 23 and the syringe 11 for testing probe 1.When the gap between probe aperture 22 and the needle core 12 of test probe 1 is greater than the gap between sleeve 23 and the syringe 11 for testing probe 1, after technical staff applies retentivity, if having interference so that retentivity can not be vertical with the plane holding where the circuit board where test probe 1, it just will appear subtle opposite shaking between adapter 2 and test probe 1, occurring the opposite meeting shaken first at this time is sleeve 23 and tests between the syringe 11 of probe 1, when the opposite shaking is gradually increased, the inner wall of the needle core 12 for testing probe 1 and probe aperture 22 can be just set to be in contact and generate opposing force, this reduces the probability that needle core 12 is damaged to a certain extent, largely protect the needle core 12 of test probe 1, and then the accuracy of test result is ensured.If the gap between probe aperture 22 and the needle core 12 for testing probe 1 is equal to the gap between sleeve 23 and the syringe 11 for testing probe 1, when the retentivity that technical staff applies is not vertical with the plane where circuit board, the retentivity is shared jointly between the syringe 11 of sleeve 23 and test probe 1, probe aperture 22 and the needle core 12 for testing probe 1, reduce the active force that needle core 12 is subject at this moment, there is the probability damaged to reduce needle core 12, has ensured the accuracy of test result.

It tests probe 1 when test to pass out signal by needle core 12, therefore, the gap between probe aperture 22 and the needle core 12 for testing probe 1 is smaller, and signal received by the instrument of test is also stronger, and test result is also just more accurate.As shown in figure 3, the gap between probe aperture 22 and the needle core 12 for testing probe 1 is zero, the gap between sleeve 23 and the syringe 11 for testing probe 1 is zero.When gap between probe aperture 22 and the needle core 12 for testing probe 1 is zero, contact area between probe aperture 22 and the needle core 12 for testing probe 1 is maximum, this laser propagation effect for allowing for signal reaches best, simultaneously, in order to avoid causing to damage to needle core 12 when retentivity is disturbed, and direction is caused deviation occur, gap between sleeve 23 and the syringe 11 of test probe 1 is also configured as zero, ensures the stability of needle core 12 and the accuracy of test to the full extent.

Sleeve 23 is arranged on the outer wall 211 of the first end 21 of adapter 2, to cooperate the syringe 11 for accommodating test probe 1, if the length of sleeve 23 is too long, then will lead to test probe 1 syringe 11 by sleeve 23 it is fully wrapped around after, the needle core 12 of test probe 1 still can not be inserted into probe aperture 12, therefore, by the movable connection of outer wall 211 of sleeve 23 and the first end 21 of adapter 2, so that sleeve 23 can be on the outer wall 211 of the first end 21 of adapter 2 axially movable.As shown in figure 3, radially offering the threaded hole 231 for penetrating the barrel of the sleeve on direction on the barrel of sleeve 23, positioning screw 232 is provided in threaded hole 231.Technical staff adjusts the length that sleeve 23 stretches out the first end 21 of adapter 2 in test according to the length of the syringe 11 of test probe 1, then positioning screw 232 is screwed, it is resisted against positioning screw 232 on the outer wall 211 of the first end 21 of adapter 2, to which the adjusting and positioning of the length of the first end 21 of adapter 2 are stretched out in realization to sleeve 23, guarantee going on smoothly for test.

It can also be by way of being screwed when adjusting the length for the first end 21 that sleeve 23 stretches out adapter 2.As shown in figure 4, internal screw thread is provided on the inner wall of sleeve 23, to match with the external screw thread on the outer wall 211 for the first end 21 that adapter 2 is arranged in.Demand when according to actual test, selection screw the direction of sleeve 23, and the length for making sleeve 23 stretch out the first end 21 of adapter 2 increases or reduces, and then guarantee going on smoothly for test.

Further, after sleeve 23 being screwed to suitable position, sleeve 23 may produce between external force factors, and the outer wall 211 of the first end 21 of adapter 2 because of self weight or shaking etc. Raw relative motion, and then test process is influenced, therefore, as shown in figure 4, the screw thread pair that the external screw thread on the internal screw thread being arranged on 23 inner wall of sleeve and the outer wall 211 for the first end 21 that adapter 2 is arranged in is constituted is self-locking thread pair.Self-locking thread pair makes sleeve 23 after being swirled to suitable position, the interference for the external force factors such as can not be self-possessed and be shaken, and keeps in the position, having ensured going on smoothly for test.

A kind of tester (not shown), including host are connect for demarcating the adapter 2 of test probe circuitry loss with host described in above scheme.So that the tester is when demarcating the line loss of probe, consumed cost is not high, and the needle core 12 of test probe 1 will not be caused to damage, there are damage bring increased costs so as to avoid probe and the problems such as error increases, test result accuracy and with a high credibility.The tester has preferable universal performance simultaneously, can be suitable for the line loss calibration test of radio frequency test probe, bluetooth test probe and Baseband Testing probe etc..

The adapter 2 provided in the adapter 2 as used in the tester in the present embodiment and each embodiment of above-mentioned adapter is identical, and the two is able to solve identical technical problem, and reaches identical desired effect.

Other compositions of tester about the embodiment of the present invention etc. have been well known to those skilled in the art, and are no longer described in detail herein.

It is described above; only a specific embodiment of the invention, but scope of protection of the present invention is not limited thereto, and anyone skilled in the art is in the technical scope disclosed by the present invention; it can easily think of the change or the replacement, should be covered by the protection scope of the present invention.Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

A kind of adapter being lost for demarcating test probe circuitry, test probe includes the needle core of syringe with the end for protruding from syringe, it is characterized in that, the first end of the adapter is equipped with probe aperture, the outer wall of the first end of the adapter is arranged with sleeve, the probe aperture is for cooperating the needle core for accommodating the probe, and the sleeve is for cooperating the syringe for accommodating the probe.
The adapter according to claim 1 being lost for demarcating test probe circuitry, it is characterized in that, it is in clearance fit between the probe aperture and the needle core of the probe, it is in clearance fit between the sleeve and the syringe of the probe, and the gap between the probe aperture and the needle core of the probe is greater than or equal to the gap between the sleeve and the syringe of the probe.
The adapter according to claim 2 being lost for demarcating test probe circuitry, which is characterized in that the gap between the probe aperture and the needle core of the probe is zero, and the gap between the sleeve and the syringe of the probe is zero.
The adapter according to claim 1 being lost for demarcate test probe circuitry, which is characterized in that radially offer the threaded hole for penetrating the barrel of the sleeve on direction on the barrel of the sleeve, be provided with positioning screw in the threaded hole.
The adapter according to claim 1 being lost for demarcating test probe circuitry, which is characterized in that internal screw thread is provided on the inner wall of the sleeve, to match with the external screw thread on the outer wall for the first end that the adapter is arranged in.
The adapter according to claim 5 being lost for demarcating test probe circuitry, which is characterized in that the screw thread pair that the external screw thread on the internal screw thread being arranged on the sleeve lining and the outer wall for the first end that the adapter is arranged in is constituted is self-locking thread pair.
A kind of tester, which is characterized in that including host, the adapter according to any one of claims 1 to 6 for demarcating test probe circuitry loss is connect with the host.