CN107528563B - Debugging device for matching and debugging radio frequency circuit - Google Patents
Debugging device for matching and debugging radio frequency circuit Download PDFInfo
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- CN107528563B CN107528563B CN201710535731.XA CN201710535731A CN107528563B CN 107528563 B CN107528563 B CN 107528563B CN 201710535731 A CN201710535731 A CN 201710535731A CN 107528563 B CN107528563 B CN 107528563B
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H7/00—Multiple-port networks comprising only passive electrical elements as network components
- H03H7/38—Impedance-matching networks
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
Abstract
The invention discloses a debugging device for matching and debugging a radio frequency circuit, which comprises a substrate and an adjusting module, wherein the substrate is provided with a plurality of first electrodes; the adjusting module is electrically connected with a transmission line of the radio frequency circuit to be debugged; the adjusting module comprises a conductor strip arranged on the substrate; a sliding contact portion electrically connected to the conductor strip, configured to: when it slides along the length of the conductor strip, a portion of the conductor strip is short-circuited and the remainder of the conductor strip is switched into the radio frequency circuit. In the debugging process, the sliding contact part is adjusted to slide, so that the effective part of the microstrip transmission line accessed to the radio frequency circuit is continuously changed, the matching is optimal, and the debugging purpose is achieved. When the debugging device is adopted to carry out matching debugging on the radio frequency circuit, elements do not need to be replaced and welded again, and a debugging circuit board does not need to be manufactured again, so that the invalid iteration process in the debugging process is reduced, and the whole debugging efficiency is improved.
Description
Technical Field
The invention belongs to the technical field of radio frequency circuit debugging, and particularly relates to a debugging device for radio frequency circuit matching debugging.
Background
The development of wireless communication technology is changing day by day, wherein, the design of radio frequency circuit is the core component of wireless communication equipment development. In the radio frequency circuit design and research process, the matching and debugging of the radio frequency circuit are very important links.
When matching and debugging are performed, the existing debugging methods generally have two types: one is to construct the matching network using separate components, such as inductors or capacitors. During the debugging process, elements with different nominal values need to be replaced for many times or the positions of the elements need to be changed, so that the aim of debugging is fulfilled, and the matching is optimal. In the method, the component needs to be welded again every time the component is replaced or the position of the component is replaced, so that the debugging efficiency is low.
Another debugging method is to leave some microstrip branches on the debugged circuit PCB, and these microstrip branches are used as matching networks. And in the later debugging process, the size of the micro-strip branches is changed to achieve the aim of debugging, so that the matching is optimal. The method can not meet the requirement of high integration of the current circuit design, and the microstrip branch knot also needs to be manufactured repeatedly in the debugging process, thereby still influencing the debugging efficiency.
Therefore, how to improve the debugging efficiency in the radio frequency circuit matching and debugging process becomes a technical problem to be solved urgently.
Disclosure of Invention
In order to solve the above technical problem, an embodiment of the present invention first provides a debugging apparatus for matching and debugging a radio frequency circuit, including a substrate and a regulating module; the adjusting module is electrically connected with a transmission line of the radio frequency circuit to be debugged; the adjusting module comprises a plurality of adjusting modules and a plurality of adjusting modules,
a conductor strip disposed on the substrate;
a sliding contact electrically connected to the conductor strip, configured to: when it slides along the length of the conductor strip, a portion of the conductor strip is short circuited and the remainder of the conductor strip is switched into the radio frequency circuit.
Preferably, the conductor strip comprises a central strip and ground strips arranged along both sides of the central strip; one end of the central belt is electrically connected with the transmission line of the radio frequency circuit.
Preferably, the sliding contact portion includes a contact bar made of a conductor, the contact bar being in sliding contact with the center strap and the ground strap, respectively;
the contact bar is configured to: when the central band slides along the length direction of the central band, the contact position of the contact rod and the central band is used as a short-circuit limit, and the part between one end of the central band, which is electrically connected with the transmission line of the radio frequency circuit, and the short-circuit limit is connected into the radio frequency circuit.
Preferably, the conductor strip is a floating wire, and one end of the floating wire is electrically connected with the transmission line of the radio frequency circuit.
Preferably, the sliding contact portion includes a shield and a contact probe;
one end of the contact probe is in sliding contact with the floating lead; the shielding piece comprises a fixed end and a telescopic end, and the fixed end is fixedly connected to the other end of the floating lead; the telescopic end slides along with the contact probe;
the contact probe is configured to: when the contact probe slides along the length direction of the floating lead, the contact position of the contact probe and the floating lead is used as a short-circuit limit, and the part between one end of the floating lead and the short-circuit limit is connected into the radio frequency circuit.
Preferably, the characteristic impedance of the shield is less than the characteristic impedance of the floating conductor.
Preferably, the characteristic impedance Z of the shield satisfies:
wherein, represents the relative dielectric constant of the substrate, h represents the thickness of the substrate, W represents the width of the shield, and T represents the thickness of the shield.
Preferably, the shield is made of metal.
The conductor strip and the sliding contact part are arranged in the debugging device, and the sliding contact part slides along the length direction of the conductor strip, so that one part of the conductor strip is short-circuited, and the rest part of the conductor strip is connected to a radio frequency circuit. In the sliding process, the effective part of the microstrip transmission line connected to the radio frequency circuit is continuously changed, so that the matching is optimal, and the purpose of debugging is achieved. Compared with the prior art, when the debugging device provided by the embodiment of the invention is adopted for debugging, elements do not need to be replaced and welded again, and a debugging circuit board does not need to be manufactured again, so that the invalid iteration process in the debugging process is reduced, and the debugging efficiency is improved.
Drawings
The accompanying drawings are included to provide a further understanding of the technology or prior art of the present application and are incorporated in and constitute a part of this specification. The drawings expressing the embodiments of the present application are used for explaining the technical solutions of the present application, and should not be construed as limiting the technical solutions of the present application.
FIG. 1 is a schematic diagram of a debugging apparatus according to an embodiment of the present invention;
FIG. 2 is an equivalent schematic diagram of the debugging apparatus shown in FIG. 1;
FIG. 3 is a schematic diagram of the configuration of a debugging apparatus according to another embodiment of the present invention;
fig. 4 is an equivalent schematic diagram of the debugging apparatus shown in fig. 3.
Detailed Description
The following detailed description of the embodiments of the present invention will be provided with reference to the accompanying drawings and examples, so that how to apply the technical means to solve the technical problems and achieve the corresponding technical effects can be fully understood and implemented. The embodiments and the features of the embodiments can be combined without conflict, and the technical solutions formed are all within the scope of the present invention.
In the design of a radio frequency system, it is very important to ensure impedance matching, which is related to the transmission efficiency, power capacity and operation stability of the radio frequency system.
In the embodiment of the invention, impedance matching is realized by adopting stub matching. The implementation principle can be summarized as that one or more microstrip transmission lines are connected in series or in parallel to the transmission line of the radio frequency circuit, the microstrip transmission line connected into the transmission line can generate additional reflection, and the original reflection in the transmission line is counteracted through the additional reflection, so that the purpose of impedance matching is achieved.
Based on the above principle, the embodiment of the invention provides a debugging device for matching and debugging a radio frequency circuit. The debugging device is provided with a base and an adjusting module, wherein the base is a medium substrate, can be a PCB substrate, for example, an epoxy resin substrate of which the electrical performance meets the debugging requirement.
The adjusting module is electrically connected with a transmission line of the radio frequency circuit to be debugged. The adjusting module is further provided with a conductor strip and a sliding contact part.
The conductor strip is directly arranged on the substrate, and the sliding contact part is electrically connected with the conductor strip. The sliding contact part is used as an adjusting structure and can slide along the length direction of the conductor strip, so that one part of the conductor strip is connected with a radio frequency circuit to be debugged. The conductor strip and the substrate together form a microstrip transmission line, and a part of the conductor strip which is connected into the radio frequency circuit with continuous movement of the sliding contact part has a continuously variable length. That is, in embodiments of the present invention, the active portion of the microstrip transmission line that the commissioning device accesses the radio frequency circuit is continuously adjustable.
Additional reflections may be generated by microstrip transmission lines that are coupled into the rf circuit. Continuous adjustment of the effective length of the conductor strip will cause the additional reflections produced to vary. Matching is considered to be achieved when the additional reflection changes to cancel or cancel the original reflection to meet design requirements.
When the debugging device in the embodiment of the invention is applied to match and debug the radio frequency circuit, the effective length of the conductor strip can be continuously adjusted, and the additional reflection of the microstrip transmission line in the radio frequency circuit can be finely adjusted. During the process of matching and debugging, the defect that the debugging purpose cannot be quickly achieved due to the fact that a matching network with discontinuous parameters is used can be avoided.
For example, the resistors with the nominal values of 2 ohm and 5 ohm are respectively used for building the matching network, the matching network which can be matched actually is built for the resistor with the nominal value of 3.5 ohm, and multiple iterative debugging is needed for achieving the debugging purpose. In the embodiment of the invention, the effective length of the conductor strip can be continuously adjusted, additional reflection generated by fine adjustment can be avoided, and the aim of matching and debugging can be quickly achieved.
The invention is further illustrated by the following two specific examples.
Fig. 1 is a schematic structural diagram of a preferred embodiment of a debugging apparatus according to an embodiment of the present invention. In the present embodiment, the microstrip transmission line structure formed by the substrate and the conductor strip in the adjusting module is in the form of a coplanar waveguide.
The coplanar waveguide is a microstrip transmission line with excellent performance and convenient processing, and is widely applied to monolithic microwave integrated circuit MMIC circuits. In this embodiment the structure of the conductor strip comprises a central strip 2 and ground strips 3 arranged along both sides of the central strip 2. The central strip 2 and the ground strip 3 are both located on the substrate 1.
In this embodiment, the sliding contact portion is a contact rod 4. The contact rod 4 is placed on the central band 2 and the grounding band 3 in a transverse manner while being in contact with the central band 2 and the grounding band 3, and the contact rod 4 can slide in the direction of the length of the central band 2 and the grounding band 3.
The contact rod 4 is made of a conductor. In the present embodiment, one end of the central strip 2 is electrically connected to the transmission line of the rf circuit, and the central strip 2 is electrically connected to the grounding strip 3 through the contact rod 4, i.e. the central strip 2 is grounded at the sliding contact.
Fig. 2 is an equivalent schematic diagram of the debugging apparatus of the present embodiment for accessing the rf circuit to perform matching debugging. In fig. 2, the horizontal lines between P1, a0 and P2 represent the transmission line of the rf circuit, P1 represents the signal source, P2 represents the load, and a0 represents the characteristic impedance of the transmission line itself. A1 represents the characteristic impedance of the microstrip transmission line that is connected into the transmission line, here the characteristic impedance of a portion of the coplanar waveguide that is formed. The vertical line at the upper end of A1 intersects with the horizontal connecting line, which shows that the microstrip transmission line is electrically connected with the transmission line to be debugged, and the position of intersection point x is the connection position. The connection between the grounding strap 3 and the contact bar 4 is equivalent to grounding the lower end of a1 (see fig. 1).
As shown in fig. 1, the left end of the central strip 2 is electrically connected to the transmission line of the rf circuit to be debugged, and the portion between the left end of the central strip 2 and the contact point between the contact rod 4 and the central strip 2 is connected to the rf circuit. That is, if the contact point of the contact rod 4 and the central strip 2 is named as a short-circuit limit, the part between the left end of the central strip 2 and the short-circuit limit is an effective part of the formed coplanar waveguide in debugging, and is equivalent to a1 in fig. 2. The part to the right of the short-circuit limit is equivalent to being short-circuited, and does not play a role in matching and debugging.
Therefore, when the contact rod 4 slides along the length direction of the central strip 2, the effective part of the coplanar waveguide is continuously changed (namely, the characteristic impedance represented by A1 is continuously changed), and the additional reflection generated by A1 in the radio frequency circuit is changed, so that the matching debugging of the radio frequency circuit is realized. It should be noted that the change in characteristic impedance of a1 is only an important factor in changing the additional reflection.
Fig. 3 is a schematic structural diagram of another preferred embodiment of the debugging apparatus according to the embodiment of the present invention. In this embodiment, the microstrip transmission line structure formed by the substrate and the conductor strip in the adjusting module is in the form of a microstrip line.
Microstrip lines are microstrip transmission lines composed of a single conductor strip arranged on a dielectric substrate, have high reliability and low manufacturing cost, and are widely applied to microwave integrated circuits. Microstrip lines are typically fabricated using thin film processes. The dielectric substrate is made of a material with high dielectric constant and low microwave loss. In this embodiment, the structure of the conductor strip mainly includes a floating conductive line 5, the floating conductive line 5 is located on the substrate 1, and both ends of the floating conductive line 5 are open-circuited floating ends.
In the present embodiment, the sliding contact portion further includes a contact probe 6 and a shield 7. One end of the contact probe 6 is in sliding contact with the floating conductive line 5. The shield 7 is for shielding part of the floating conductor 5, and has a fixed end and a telescopic end.
As shown in fig. 3, the shield 7 in this embodiment has a fixed end fixedly connected to the right end of the floating conductor, and a telescopic end which moves synchronously with the contact probe 6 and can be extended or retracted, and acts like a spring roller shutter. When the shielding piece 7 extends out, the telescopic end slides leftwards (similar to the pulling out of a roller shutter), the shielding piece 7 contacts and covers part of the floating conductor, and the part of the floating conductor covered is gradually enlarged; when the shield 7 is retracted, its telescopic end slides to the right (similar to a roller shutter retraction), and the portion of the floating conductor covered by the shield 7 gradually decreases. The characteristic impedance of the shield 7 is smaller than that of the floating conductor, and further, the impedance of the part of the floating conductor covered by the shield 7 becomes smaller, which can be considered as not functioning in debugging, equivalent to being short-circuited, without access to the radio frequency circuit.
Fig. 4 is an equivalent schematic diagram of the present embodiment. In fig. 4, the horizontal lines between P1, a0 and P2 represent the transmission line of the rf circuit, P1 represents the signal source, P2 represents the load, and a0 represents the characteristic impedance of the transmission line itself. A2 denotes the characteristic impedance of the microstrip transmission line into which the transmission line is inserted, and here the characteristic impedance of a portion of the microstrip line that is constructed. A2 upper end vertical line intersects with horizontal connecting line, which shows the microstrip transmission line is electrically connected with the transmission line to be debugged, and the intersection point x is the connection position. The shield 7 covers a portion of the floating conductor 5 equivalent to an open lower end of a2 (see fig. 3).
As shown in fig. 3, if the left end of the floating conductor 5 is connected to the transmission line of the radio frequency circuit, and the contact point of the contact probe 6 and the floating conductor 5 is the short-circuit limit, the short-circuit limit uses the microstrip line formed by the left floating conductor 5 as the effective part connected to the radio frequency circuit, which is equivalent to a2 in fig. 4.
When the contact probe 6 drives the telescopic end of the shielding piece 7 to slide along the length direction of the floating lead 5, the effective part of the microstrip line connected to the debugging circuit is changed continuously (namely the characteristic impedance of A2 is changed continuously), and the additional reflection generated by A2 in the radio frequency circuit is changed, so that the matching debugging of the radio frequency circuit is realized. Similarly, the change in A2 is only an important factor in changing the additional reflection.
Further, in the above embodiment, the shield 7 is made of metal. Such as copper metal, for the shield.
Further, the characteristic impedance Z of the shield 7 satisfies:
wherein, represents the relative dielectric constant of the substrate, h represents the thickness of the substrate, W represents the width of the shield, and T represents the thickness of the shield.
A specific method of using the debugging apparatus according to the present invention will be described below.
Firstly, a debugging system is set up, comprising:
the signal source and the corresponding analytical instrument are connected to the radio frequency circuit to be debugged, and the analytical instrument can be a vector network analyzer, a frequency spectrograph, a power meter and other analytical instruments.
And connecting the adjusting module into the radio frequency circuit to connect the debugging device with the radio frequency circuit to be debugged. Such as electrically connecting one end of the center strap to the rf circuit transmission line or electrically connecting one end of the floating conductor to the rf circuit transmission line. It will of course be appreciated that in this step, it is also included to connect the commissioning apparatus in common with the radio frequency circuit to be commissioned.
Then, debugging is carried out by utilizing the built debugging system, which specifically comprises the following steps:
and adjusting the debugging device to enable the sliding contact part to continuously move, for example, enabling the contact rod or the contact probe to slide along the length direction of the central band or the floating lead, and enabling the effective part of the microstrip transmission line connected into the radio frequency circuit to be continuously changed. Simultaneously observing the output of the analyzer, such as the S parameter (scattering parameter) output by the observation vector network analyzer; by continuously adjusting the debugging device, the output of the analysis instrument meets the design requirement, namely, the matching is realized.
It is easy to think that in the process, when the effective length adjustment cannot obtain the expected output, the access position of the debugging device on the radio frequency circuit transmission line (namely the position of x in fig. 2 or fig. 4) can be changed, and then the debugging is carried out through the length adjustment.
The debugging process can be iterated, and finally the output meets the design requirement to realize matching. And recording the access position information and the access length information of the debugging device in the radio frequency circuit at the moment, namely obtaining a matching debugging result. The access position information and the length information provide effective reference for the final shaping and volume production of the radio frequency circuit in the whole system.
Compared with the prior art, the debugging device provided by the invention is adopted in the matching debugging of the radio frequency circuit, the process of frequently replacing and re-welding elements or re-manufacturing the debugging circuit board is not needed, and the time waste caused by the process is avoided; the length adjustment in the adjusting device is continuously changed, and invalid iteration processes in the debugging process are reduced, for example, invalid debugging caused by unreasonable parameter selection of passive elements is reduced; in conclusion, the debugging device can accelerate the matching and debugging process of the radio frequency circuit and improve the debugging efficiency.
The above description is only a preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any changes or substitutions that can be easily conceived by those skilled in the art within the technical scope of the present invention are included in the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (7)
1. A debugging device for matching and debugging a radio frequency circuit comprises a substrate and an adjusting module; the adjusting module is electrically connected with a transmission line of the radio frequency circuit to be debugged; the adjusting module comprises a plurality of adjusting modules and a plurality of adjusting modules,
a conductor strip disposed on the substrate, the conductor strip including a central strip and ground strips disposed along both sides of the central strip; one end of the central belt is electrically connected with the transmission line of the radio frequency circuit;
a sliding contact electrically connected to the conductor strip, configured to: when it slides along the length of the conductor strip, a portion of the conductor strip is short circuited and the remainder of the conductor strip is switched into the radio frequency circuit.
2. The debugging device according to claim 1 wherein said sliding contact portion comprises a contact bar made of a conductor, said contact bar being in sliding contact with said center strap and said ground strap, respectively;
the contact bar is configured to: when the central band slides along the length direction of the central band, the contact position of the contact rod and the central band is used as a short-circuit limit, and the part between one end of the central band, which is electrically connected with the transmission line of the radio frequency circuit, and the short-circuit limit is connected into the radio frequency circuit.
3. The debugging device according to claim 1, wherein the conductor strip is a floating wire having one end electrically connected to a transmission line of the radio frequency circuit.
4. The commissioning apparatus of claim 3, wherein the sliding contact comprises a shield and a contact probe;
one end of the contact probe is in sliding contact with the floating lead; the shielding piece comprises a fixed end and a telescopic end, and the fixed end is fixedly connected to the other end of the floating lead; the telescopic end slides along with the contact probe;
the contact probe is configured to: when the contact probe slides along the length direction of the floating lead, the contact position of the contact probe and the floating lead is used as a short-circuit limit, and the part between one end of the floating lead and the short-circuit limit is connected into the radio frequency circuit.
5. The debugging device of claim 4 wherein the characteristic impedance of the shield is less than the characteristic impedance of the floating conductor.
6. The commissioning apparatus of claim 5, wherein the characteristic impedance Z of the shield satisfies:
wherein, represents the relative dielectric constant of the substrate, h represents the thickness of the substrate, W represents the width of the shield, and T represents the thickness of the shield.
7. The commissioning apparatus of claim 4, wherein the shield is made of metal.
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| CN201710535731.XA CN107528563B (en) | 2017-07-04 | 2017-07-04 | Debugging device for matching and debugging radio frequency circuit |
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| CN201710535731.XA CN107528563B (en) | 2017-07-04 | 2017-07-04 | Debugging device for matching and debugging radio frequency circuit |
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| CN107528563B true CN107528563B (en) | 2020-12-25 |
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| CN114019206B (en) * | 2021-11-01 | 2024-04-12 | 北京北方华创微电子装备有限公司 | Cable length adjusting device |
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| CN105516857A (en) * | 2016-02-03 | 2016-04-20 | 上海航空电器有限公司 | Audio signal single-ended output circuit for achieving electromagnetic compatibility |
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| CN102045119A (en) * | 2010-10-23 | 2011-05-04 | 中国电子科技集团公司第四十一研究所 | Admittance slide block for impedance adapter |
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| CN1681155A (en) * | 2004-04-09 | 2005-10-12 | 启碁科技股份有限公司 | Wireless radio wave receiver |
| CN101483419A (en) * | 2008-01-08 | 2009-07-15 | 上海晨兴电子科技有限公司 | Apparatus for debugging radio frequency matching circuit and using method |
| US9252738B1 (en) * | 2013-01-07 | 2016-02-02 | Christos Tsironis | Wideband tuning probes for impedance tuners and method |
| US9257963B1 (en) * | 2013-06-27 | 2016-02-09 | Christos Tsironis | Impedance tuners with rotating probes |
| CN104577327A (en) * | 2014-12-29 | 2015-04-29 | 陕西烽火电子股份有限公司 | Integrated vehicle-mounted antenna feed system |
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