CN107507549A - The method of testing and test system of display panel - Google Patents
The method of testing and test system of display panel Download PDFInfo
- Publication number
- CN107507549A CN107507549A CN201710882347.7A CN201710882347A CN107507549A CN 107507549 A CN107507549 A CN 107507549A CN 201710882347 A CN201710882347 A CN 201710882347A CN 107507549 A CN107507549 A CN 107507549A
- Authority
- CN
- China
- Prior art keywords
- current value
- cabling
- discharge current
- measurement jig
- display panel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The embodiment of the invention discloses a kind of method of testing of display panel, the display panel is provided with cabling, and one end of the cabling is provided with the binding terminal being connected electrically, one end connection electric capacity of the every cabling away from binding terminal;The method of testing includes:Measurement jig and the binding terminal are electrically connected;Test electric current is sent to charge to the electric capacity via binding terminal, cabling;Receive the discharge current of the electric capacity electric discharge;The discharge current value of the discharge current is calculated and is compared with standard current value;If the discharge current value matches with the standard current value, the intact signal of cabling corresponding with discharge current value is exported;If the discharge current value mismatches with the standard current value, the signal of cabling open circuit corresponding with discharge current value is exported.The embodiment of the invention also discloses a kind of test system of display panel.Using the present invention, there is the advantages of width that can reduce frame occupancy.
Description
Technical field
The present invention relates to display technology field, more particularly to the method for testing and test system of a kind of display panel.
Background technology
COF (Chip On FPC, often claim chip on film) technology, as its name suggests, refers to IC chip being produced on FPC
A kind of technology on (Flexible Printed Circuit).COF technologies are widely used in large size panel, such as television panels
On.COG (Chip On Glass) technology refers to IC chip being directly produced in glass panel, is to save the advantages of COG technologies
About FPC material costs, therefore COG technologies are widely adopted in small size liquid crystal panel.
But become increasingly conspicuous as consumer is to the demand of mobile phone narrow frame, the shortcomings that COG technologies, COG technologies must be in face
Plate periphery reserves sufficient space to dispose IC chip, and it is wider so to may result in the frame of panel, can not realize that ultra-narrow frame is set
Meter.To solve the problem of ultra-narrow frame, small size panel business starts to be considered as COF technologies.
Before to carrying out pressing COF into the glass (Cell) after box, can typically circuit be selected to line vias out of circuit test
Without exception carries out pressing COF into the glass after box, to prevent circuit problematic into the glass after box by the upper COF of pressing, wave
Take COF materials.In order to being tested into the circuit of the glass after box, refer to Fig. 1, traditional approach is (aobvious in display panel
Show that panel includes viewing area 110 and non-display area 120) the special survey for testing Cell circuit on-offs road of binding terminal 150 end setting
Circuit 130 and special test signal input terminal 140 are tried, and using the side that probe is pricked on test signal input terminal 140
Formula is to the input signal of test circuit 130.For convenience of bundle probe, 140 often bigger (single terminal of test signal input terminal
400um*400um, share 10~20), it can take up space very much.So can signal-under-test using the saved space of COF technologies
Input terminal 140 occupies a part, causes the effect of actual reduction border width to be had a greatly reduced quality.
The content of the invention
Technical problem to be solved of the embodiment of the present invention is, there is provided a kind of method of testing of display panel and test system
System.The width of frame occupancy can be reduced.
In order to solve the above-mentioned technical problem, first aspect present invention embodiment provides a kind of test side of display panel
Method, the display panel are provided with cabling, and one end of the cabling is provided with the binding terminal being connected electrically, every cabling
One end connection electric capacity away from binding terminal;The method of testing includes:
Measurement jig and the binding terminal are electrically connected;
Test electric current is sent to charge to the electric capacity via binding terminal, cabling;
Receive the discharge current of the electric capacity electric discharge;
The discharge current value of the discharge current is calculated and is compared with standard current value;
If the discharge current value matches with the standard current value, it is complete to export cabling corresponding with discharge current value
Good signal;If the discharge current value and the standard current value mismatch, output it is corresponding with discharge current value walk
The signal of line open circuit.
In the embodiment of first aspect present invention one, also wrapped before the step of receiving the test electric current of the electric capacity electric discharge
Include:
The measurement jig stops sending test electric current.
In the embodiment of first aspect present invention one, the discharge current value matches with the standard current value to be referred to discharge
Current value and the ratio range of the standard current value are 0.7-1.3.
In the embodiment of first aspect present invention one, measurement jig is bound what terminal was electrically connected with described described
Step specifically includes:
Measurement jig and chip on film are electrically connected;
By one end virtual pressure of the chip on film away from the measurement jig on the binding terminal.
In the embodiment of first aspect present invention one, described by the one end of the chip on film away from the measurement jig
Virtual pressure also includes before the step on the binding terminal:
The one end of the chip on film away from the measurement jig and the binding terminal are aligned.
Second aspect of the present invention embodiment provides a kind of test system of display panel, including:
Display panel, which is provided with cabling, and one end of the cabling is provided with the binding terminal being connected electrically, the cabling
Every circuit away from binding terminal side connection electric capacity
Measurement jig, it includes:
Connection unit, it is used to measurement jig and the binding terminal being electrically connected
Electric current transmitting element is tested, it is used for transmission test electric current and charged via binding terminal, cabling to the electric capacity;
Receiving unit, it is used for the discharge current for receiving the electric capacity electric discharge;
Calculate comparing unit, its discharge current value for being used to the discharge current be calculated and with standard current value ratio
It is right;
Processing unit, matched if it is used for the discharge current value with the standard current value, output and electric discharge electricity
The intact signal of cabling corresponding to flow valuve;If the discharge current value mismatches with the standard current value, export and put
The signal of cabling open circuit corresponding to electric current value.
In the embodiment of second aspect of the present invention one, the measurement jig also includes:
Stop element, it is used to make the measurement jig stop sending test electric current.
In the embodiment of second aspect of the present invention one, the test current value matches with the standard current value to be referred to discharge
Current value and the ratio range of the standard current value are 0.7-1.3.
In the embodiment of second aspect of the present invention one, the test system also includes chip on film, the measurement jig with
The chip on film electrical connection, one end virtual pressure of the chip on film away from the measurement jig is on the binding terminal.
In the embodiment of second aspect of the present invention one, the chip on film and/or the display panel include bit cell,
It is used to be aligned the one end of the chip on film away from the measurement jig with the binding terminal.
Implement the embodiment of the present invention, have the advantages that:
Because the method for testing includes:Measurement jig and the binding terminal are electrically connected;Send test electric current
Charged via binding terminal, cabling to the electric capacity;Receive the discharge current of the electric capacity electric discharge;The electric discharge electricity is calculated
The discharge current value of stream simultaneously compares with standard current value;If the discharge current value matches with the standard current value, defeated
Go out the intact signal of cabling corresponding with discharge current value;If the discharge current value mismatches with the standard current value,
Then export the signal of cabling open circuit corresponding with discharge current value.So as to which the display panel need not set specially thereon
Measurement circuit and calibrating terminal, it is only necessary to whether using terminal can is bound, to test the cabling breaking, so as to reach contracting
Subtract the effect of border width.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, drawings in the following description are only this
Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with
Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is the schematic diagram of prior art display panel;
Fig. 2 is the schematic diagram of one embodiment of the invention display panel;
Fig. 3 is the schematic diagram that one embodiment of the invention part display panel is connected with measurement jig;
Fig. 4 is the flow chart of the method for testing of one embodiment of the invention display panel;
Fig. 5 is the cell schematics of one embodiment of the invention measurement jig;
Shown by reference numeral:
110th, 210- viewing areas;120th, 220- non-display areas;130- test circuits;140- test signal input terminals;
150th, 250- binds terminal;230- cablings;260- pressure heads;270- chip on film (COF);271- driving chips;280- tests are controlled
Tool;281- connection units;282- tests electric current transmitting element;283- stop elements;284- receiving units;285-, which is calculated, compares list
Member;286- processing units.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of protection of the invention.
The term " comprising " and " having " occurred in present specification, claims and accompanying drawing and their any changes
Shape, it is intended that cover non-exclusive include.Such as contain the process of series of steps or unit, method, system, product or
The step of equipment is not limited to list or unit, but alternatively also include the step of not listing or unit, or it is optional
Ground is also included for the intrinsic other steps of these processes, method, product or equipment or unit.In addition, term " first ", " the
Two " and " the 3rd " etc. are for distinguishing different objects, and are not intended to describe specific order.
The embodiment of the present invention provides a kind of method of testing of display panel, refers to Fig. 2 and Fig. 3, on the display panel
Provided with cabling 230, the part of cabling 230 is located at the non-display area 220 of display panel, partly positioned at the viewing area of display panel
210, in the present embodiment, the cabling 230 can be data wire and its extended line or scan line and its extended line;
One end of the cabling 230 is provided with the binding terminal 250 (pin) being connected electrically, and the binding terminal 250 is used to (cover with COF
Brilliant film) it is electrically connected, the chip on film 270 is provided with driving chip 271, sends so as to realizing driving chip 271
Signal is transported on cabling 230 via binding terminal 250;One end connection electricity of the every cabling 230 away from binding terminal 250
Hold, the electric capacity can be liquid crystal capacitance, storage capacitance, coupled capacitor etc., and the quantity of the electric capacity can be multiple, specific number
Amount is set according to the actual requirements.Fig. 2-Fig. 4 is referred to, the method for testing includes:
S110:Measurement jig and the binding terminal are electrically connected;
In the present embodiment, the measurement jig 280 is electrically connected by COF and the binding terminal 250, certainly,
In other embodiments of the invention, the measurement jig directly can also be electrically connected with the binding terminal.Specifically
Come, in the present embodiment, the measurement jig 280 electrically connects with the one end of the COF away from the binding terminal 250, described
COF with it is described binding terminal 250 be electrically connected, so as to realize by the test signal on measurement jig 280 export to it is described walk
Line 230.
S120:Test electric current is sent to charge to the electric capacity via binding terminal, cabling;
In the present embodiment, the measurement jig 280 is tested the cabling 230 one by one, namely a cabling 230
Another cabling 230 is tested again after having tested.Certainly, in other embodiments of the invention, tested to increase
Speed, the measurement jig can also carry out batch testing to the cabling, namely can once test a plurality of cabling, certainly,
If measurement jig ability is feasible, completion can be once tested to all cablings.In the present embodiment, the measurement jig
280 send test electric current charges via binding 250, cablings 230 of terminal to the corresponding electric capacity, in the present embodiment
In, the electric capacity can be fully charged and then discharges electricity again.Certainly, not limited to this of the embodiment of the present invention, in other implementations of the present invention
In example, the electric capacity can also only fill the electric charge of half, or 3/4 electric charge etc..
S130:Receive the discharge current of the electric capacity electric discharge;
In the present embodiment, after the measurement jig 280 stops sending test electric current, due to connecting with the cabling 230
The electric capacity connect is charged in S120 steps, so as to which the electric capacity can discharge electric charge, and the discharge current of electric capacity can be via right
The cabling 230 answered, binding terminal 250, chip on film 270 are received by the measurement jig 280, so as to the measurement jig
280 can test the size of the discharge current.
S140:The discharge current value of the discharge current is calculated and is compared with standard current value;
In the present embodiment, if the cabling 230 has open circuit, so as to the electric capacity quantity electrically connected with the cabling 230
Can be fewer than the electric capacity quantity electrically connected with no breaking cabling 230, so as to the electric discharge electricity that breaking cabling 230 flows through above
Stream can be smaller, is relatively free of the discharge current that the cabling 230 of open circuit flows through above, so as to which the measurement jig 280 needs first
The discharge current value of the discharge current is calculated, is then compared the discharge current value and the standard current value
Right, in the present embodiment, the standard current value is pre-designed, and the standard current value is that cabling 230 measures when intact
Current value when electric capacity discharges.
S150:If the discharge current value matches with the standard current value, output is corresponding with discharge current value
The intact signal of cabling;If the discharge current value mismatches with the standard current value, output and discharge current value pair
The signal for the cabling open circuit answered.
In the present embodiment, the measurement jig 280 is judged if the discharge current value and the standard current value
Match somebody with somebody, then export the intact signal of corresponding with discharge current value cabling 230, the signal can for indicator lamp signal, voice signal,
Picture signal etc.;If the measurement jig 280 judges that the discharge current value mismatches with the standard current value, export
The signal of the open circuit of cabling 230 corresponding with discharge current value, the signal can be indicator lamp signal, voice signal, picture signal
Deng.
In the present embodiment, the discharge current value matches with the standard current value refers to the discharge current value and institute
The ratio range for stating standard current value is 0.7-1.3, for example, 0.7,0.8,0.9,1.0,1.1,1.2,1.3 etc..Put when described
The ratio of electric current value and the standard current value falls when in the range of 0.7-1.3, and it is intact to represent the cabling 230, works as institute
State discharge current value and the ratio of the standard current value falls when outside 0.7-1.3 scope, represent the open circuit of cabling 230
.
In the present embodiment, because the method for testing includes:Measurement jig 280 and the binding terminal 250 are carried out
Electrical connection;Test electric current is sent to charge to the electric capacity via binding terminal 250, cabling 230;Receive putting for the electric capacity electric discharge
Electric current;The discharge current value of the discharge current is calculated and is compared with standard current value;If the discharge current value
Matched with the standard current value, then export the intact signal of cabling 230 corresponding with discharge current value;If the electric discharge electricity
Flow valuve mismatches with the standard current value, then exports the signal of the open circuit of cabling 230 corresponding with discharge current value.So as to institute
Special measurement circuit and calibrating terminal need not be set thereon by stating display panel, it is only necessary to can using terminal 250 is bound
It is whether breaking to test the cabling 230, so as to reach the effect of reduction border width.
In order to prevent it is described test electric current interfered with each other with the discharge current, in the present embodiment, step S130 it
It is preceding also to include:
S160:The measurement jig stops sending test electric current.
In the present embodiment, after the electric capacity charges to a certain extent, such as full of after, the measurement jig 280 stops
Test electric current is only sent, because measurement jig 280 is stopped power supply, so as to which the electric charge previously filled can be discharged shape by the electric capacity
Into discharge current.
The measurement jig 280 and the binding terminal 250 are electrically connected in order to realize, in the present embodiment, institute
Step S110 is stated to specifically include:
Measurement jig and chip on film are electrically connected;
Due to the binding terminal 250 be for being electrically connected with chip on film 270 (COF), in the present embodiment, can be with
The chip on film 270 is made full use of, by one end electricity of measurement jig 280 and chip on film 270 away from the binding terminal 250
Connection, so as to realize the electrical connection of measurement jig 280 and chip on film 270.
By one end virtual pressure of the chip on film away from the measurement jig on the binding terminal.
In the present embodiment, by one end virtual pressure of the chip on film 270 away from the measurement jig 280 in affiliated binding
On terminal 250, so as to realize that chip on film 270 electrically connects with binding terminal 250.Due to chip on film 270 and binding terminal 250
It is virtual pressure, after being completed, chip on film 270 can be facilitated to depart from from binding terminal 250, if cabling 230 has
Damage, the chip on film 270 can reuse, and will not waste COF materials;Moreover, after being completed, if cabling is
Intact, the chip on film 270 departs from binding terminal 250, and the binding terminal 250 is used for the chip on film with display panel
Electrical connection.In the present embodiment, chip on film 270 and the binding terminal 250 are realized by virtual pressure by pressure head 260, so as to only
Need to pull down pressure head 260, it is possible to remove chip on film 270 from binding terminal 250.But the invention is not restricted to this,
In the other embodiment of the present invention, the chip on film can also be realized and binding end by conductive bond glue or other modes
Son realizes virtual pressure.
In addition, in the present embodiment, measurement jig and chip on film are electrically connected the flip with step by step
Order not limited to this of one end virtual pressure of the film away from the measurement jig on the binding terminal, can also be adjusted, or
Person is carried out simultaneously.
In order to prevent the chip on film 270 from electrically connecting mistake with the binding terminal 250, step is by measurement jig with covering
Brilliant film also includes before being electrically connected:
The one end of the chip on film away from the measurement jig and the binding terminal are aligned.
In the present embodiment, due to that can enter before chip on film 270 carries out false pressure with the binding terminal 250 to both
Row positioning, so as to prevent chip on film 270 and the binding connection error of terminal 250, walked so as to avoid testing out
The problem of line 230 and actual cabling 230 be not to going up.
The embodiment of the present invention also provides a kind of test system of display panel, incorporated by reference to referring to Fig. 2, Fig. 3 and Fig. 5, including:
Display panel, which is provided with cabling 230, and one end of the cabling 230 is provided with the binding terminal being connected electrically
250, side connection electric capacity of the every circuit away from binding terminal 250 of the cabling 230;
Measurement jig 280, it includes:
Connection unit 281, it is used to measurement jig 280 and the binding terminal 250 being electrically connected;
Electric current transmitting element 282 is tested, it is used to send test electric current via binding terminal 250, cabling 230 to the electricity
Capacity charge;
Receiving unit 284, it is used for the discharge current for receiving the electric capacity electric discharge;
Comparing unit 285 is calculated, its discharge current value for being used to the discharge current be calculated and and standard current value
Compare;
Processing unit 286, matched if it is used for the discharge current value with the standard current value, output and electric discharge
The intact signal of cabling 230 corresponding to current value;If the discharge current value mismatches with the standard current value, export
The signal of the open circuit of cabling 230 corresponding with discharge current value.In the present embodiment, the test current value and the normalized current
Value matching refers to that discharge current value and the ratio range of the standard current value are 0.7-1.3.
In the present embodiment, the measurement jig 280 also includes:Stop element 283, it is used to make the measurement jig
280 stop sending test electric current.
In the present embodiment, the test system also includes chip on film 270, the measurement jig 280 and the flip
Film 270 electrically connects, and one end virtual pressure of the chip on film 270 away from the measurement jig 280 is in the binding terminal 250
On.The chip on film 270 and/or the display panel include bit cell, and it is used for the chip on film 270 away from institute
The one end and the binding terminal 250 for stating measurement jig 280 are aligned.
It should be noted that each embodiment in this specification is described by the way of progressive, each embodiment weight
Point explanation is all difference with other embodiments, between each embodiment identical similar part mutually referring to.
For device embodiment, because it is substantially similar to embodiment of the method, so description is fairly simple, related part referring to
The part explanation of embodiment of the method.
By the description of above-described embodiment, the present invention has advantages below:
Because the method for testing includes:Measurement jig and the binding terminal are electrically connected;Send test electric current
Charged via binding terminal, cabling to the electric capacity;Receive the discharge current of the electric capacity electric discharge;The electric discharge electricity is calculated
The discharge current value of stream simultaneously compares with standard current value;If the discharge current value matches with the standard current value, defeated
Go out the intact signal of cabling corresponding with discharge current value;If the discharge current value mismatches with the standard current value,
Then export the signal of cabling open circuit corresponding with discharge current value.So as to which the display panel need not set specially thereon
Measurement circuit and calibrating terminal, it is only necessary to whether using terminal can is bound, to test the cabling breaking, so as to reach contracting
Subtract the effect of border width.
Above disclosure is only preferred embodiment of present invention, can not limit the right model of the present invention with this certainly
Enclose, therefore the equivalent variations made according to the claims in the present invention, still belong to the scope that the present invention is covered.
Claims (10)
1. a kind of method of testing of display panel, it is characterised in that the display panel is provided with cabling, one end of the cabling
Provided with the binding terminal being connected electrically, one end connection electric capacity of the every cabling away from binding terminal;The method of testing
Including:
Measurement jig and the binding terminal are electrically connected;
Test electric current is sent to charge to the electric capacity via binding terminal, cabling;
Receive the discharge current of the electric capacity electric discharge;
The discharge current value of the discharge current is calculated and is compared with standard current value;
If the discharge current value matches with the standard current value, it is intact to export cabling corresponding with discharge current value
Signal;If the discharge current value mismatches with the standard current value, export cabling corresponding with discharge current value and break
The signal on road.
2. the method for testing of display panel as claimed in claim 1, it is characterised in that receiving the test of the electric capacity electric discharge
Also include before the step of electric current:
The measurement jig stops sending test electric current.
3. the method for testing of display panel as claimed in claim 1, it is characterised in that the discharge current value and the standard
Current values match refers to that discharge current value and the ratio range of the standard current value are 0.7-1.3.
4. the method for testing of display panel as claimed in claim 1, it is characterised in that tie up measurement jig with described described
The step of fixed end is electrically connected specifically includes:
Measurement jig and chip on film are electrically connected;
By one end virtual pressure of the chip on film away from the measurement jig on the binding terminal.
5. the method for testing of display panel as claimed in claim 4, it is characterised in that described that the chip on film is remote
One end virtual pressure of the measurement jig also includes before the step on the binding terminal:
The one end of the chip on film away from the measurement jig and the binding terminal are aligned.
A kind of 6. test system of display panel, it is characterised in that including:
Display panel, which is provided with cabling, and one end of the cabling is provided with the binding terminal being connected electrically, the cabling it is every
Side connection electric capacity of the bar circuit away from binding terminal;
Measurement jig, it includes:
Connection unit, it is used to measurement jig and the binding terminal being electrically connected;
Electric current transmitting element is tested, it is used for transmission test electric current and charged via binding terminal, cabling to the electric capacity;
Receiving unit, it is used for the discharge current for receiving the electric capacity electric discharge;
Comparing unit is calculated, its discharge current value for being used to the discharge current be calculated simultaneously compares with standard current value;
Processing unit, matched if it is used for the discharge current value with the standard current value, output and discharge current value
The intact signal of corresponding cabling;If the discharge current value mismatches with the standard current value, output and electric discharge electricity
The signal of cabling open circuit corresponding to flow valuve.
7. the test system of display panel as claimed in claim 6, it is characterised in that the measurement jig also includes:
Stop element, it is used to make the measurement jig stop sending test electric current.
8. the test system of display panel as claimed in claim 6, it is characterised in that the test current value and the standard
Current values match refers to that discharge current value and the ratio range of the standard current value are 0.7-1.3.
9. the test system of display panel as claimed in claim 6, it is characterised in that it is thin that the test system also includes flip
Film, the measurement jig electrically connect with the chip on film, and one end virtual pressure of the chip on film away from the measurement jig exists
On the binding terminal.
10. the test system of display panel as claimed in claim 9, it is characterised in that the chip on film and/or described aobvious
Show that panel includes bit cell, it is used to enter the one end of the chip on film away from the measurement jig with the binding terminal
Row contraposition.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710882347.7A CN107507549B (en) | 2017-09-26 | 2017-09-26 | Test method and test system for display panel |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710882347.7A CN107507549B (en) | 2017-09-26 | 2017-09-26 | Test method and test system for display panel |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107507549A true CN107507549A (en) | 2017-12-22 |
CN107507549B CN107507549B (en) | 2020-05-05 |
Family
ID=60699723
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710882347.7A Active CN107507549B (en) | 2017-09-26 | 2017-09-26 | Test method and test system for display panel |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107507549B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110296936A (en) * | 2019-07-17 | 2019-10-01 | 武汉华星光电技术有限公司 | A kind of lighting test jig and its test method |
CN113702803A (en) * | 2021-07-26 | 2021-11-26 | 信利(惠州)智能显示有限公司 | Detection device and detection method applied to various touch products |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6275061B1 (en) * | 1998-09-25 | 2001-08-14 | Kabushiki Kaisha Toshiba | Testing method for a substrate of active matrix display panel |
JP2006171303A (en) * | 2004-12-15 | 2006-06-29 | Internatl Business Mach Corp <Ibm> | Method of inspecting array substrate and inspection device thereof |
CN103544911A (en) * | 2012-07-17 | 2014-01-29 | 东莞万士达液晶显示器有限公司 | Electronic device |
CN104678236A (en) * | 2013-11-27 | 2015-06-03 | 浙江金徕镀膜有限公司 | Panel testing device |
CN106652859A (en) * | 2016-11-23 | 2017-05-10 | 上海中航光电子有限公司 | Display panel and manufacturing method thereof, display apparatus, and display test method |
CN206210350U (en) * | 2016-12-02 | 2017-05-31 | 信利半导体有限公司 | A kind of tft array substrate defect rapid detection system |
-
2017
- 2017-09-26 CN CN201710882347.7A patent/CN107507549B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6275061B1 (en) * | 1998-09-25 | 2001-08-14 | Kabushiki Kaisha Toshiba | Testing method for a substrate of active matrix display panel |
JP2006171303A (en) * | 2004-12-15 | 2006-06-29 | Internatl Business Mach Corp <Ibm> | Method of inspecting array substrate and inspection device thereof |
CN103544911A (en) * | 2012-07-17 | 2014-01-29 | 东莞万士达液晶显示器有限公司 | Electronic device |
CN104678236A (en) * | 2013-11-27 | 2015-06-03 | 浙江金徕镀膜有限公司 | Panel testing device |
CN106652859A (en) * | 2016-11-23 | 2017-05-10 | 上海中航光电子有限公司 | Display panel and manufacturing method thereof, display apparatus, and display test method |
CN206210350U (en) * | 2016-12-02 | 2017-05-31 | 信利半导体有限公司 | A kind of tft array substrate defect rapid detection system |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110296936A (en) * | 2019-07-17 | 2019-10-01 | 武汉华星光电技术有限公司 | A kind of lighting test jig and its test method |
CN113702803A (en) * | 2021-07-26 | 2021-11-26 | 信利(惠州)智能显示有限公司 | Detection device and detection method applied to various touch products |
Also Published As
Publication number | Publication date |
---|---|
CN107507549B (en) | 2020-05-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7560949B2 (en) | Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test | |
CN103325327A (en) | Display panel and detecting line and detecting method for display panel | |
CN107507549A (en) | The method of testing and test system of display panel | |
CN101175368A (en) | Circuit board and display device having the same | |
CN101191928B (en) | Liquid crystal display device | |
CN106790811B (en) | Display screen drive system and mobile terminal | |
CN101690426B (en) | Connector, manufacture method for connector and anisotropic conductive film to be used therein | |
CN101907666B (en) | Automatic test system for energy consumption of electrical product and automatic test method thereof | |
US9000797B2 (en) | TFT-LCD array substrate having a connecting device for testing twice and test method for the same | |
CN101965606A (en) | Active matrix substrate, display device, method for inspecting active matrix substrate and method for inspecting display device | |
CN101813841A (en) | Test fixture and test method of display panel | |
CN112614427B (en) | Display panel and cutting panel | |
CN1983584A (en) | Semiconductor device and inspection method thereof | |
CN101515596A (en) | Organic light emitting display device | |
CN108615493A (en) | The test method and display device of a kind of display panel, display panel | |
CN108107336A (en) | A kind of display detection device and display process units | |
CN201629463U (en) | RJ45 connector and Ethernet power supply system | |
CN105790787B (en) | The design method and mobile terminal of impedance matching circuit | |
CN104407456A (en) | Array substrate and display device | |
CN110047888A (en) | The preparation method of backboard, display device and display device | |
US20120268152A1 (en) | Connection device for quality testing of charge-coupled device modules | |
CN101290439B (en) | Liquid-crystal display device and signal transfer unit and method | |
CN109188804A (en) | Liquid crystal display panel and liquid crystal display | |
CN101738806B (en) | Array backboard, probe used for testing array backboard and liquid crystal display panel | |
CN103927956A (en) | Drive circuit of display panel, display panel and display device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |