CN107505933A - Subordinate inverter controller test system - Google Patents
Subordinate inverter controller test system Download PDFInfo
- Publication number
- CN107505933A CN107505933A CN201710792572.1A CN201710792572A CN107505933A CN 107505933 A CN107505933 A CN 107505933A CN 201710792572 A CN201710792572 A CN 201710792572A CN 107505933 A CN107505933 A CN 107505933A
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- China
- Prior art keywords
- fpga
- chip microcomputer
- test system
- inverter controller
- subordinate inverter
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Microcomputers (AREA)
Abstract
The invention provides a kind of subordinate inverter controller test system, including:Single-chip microcomputer:By internal analog to digital conversion circuit to detect external sensor signal, and data interaction is carried out by communication interface and tested controller;FPGA:Slave pattern is configured to, is interacted with the single-chip data, the single-chip microcomputer carries out IGBT drivings by the FPGA, IGBT feedback signals detect and communication, realizes chain control.The present invention is using single-chip microcomputer to FPGA traveling software merit ratings, in upper electricity debugging, it is only necessary to carry out download program to single-chip microcomputer, you can be automatically performed coupled FPGA software merit rating, after configuration, software and hardware configuration and debugging are carried out in the case where being not brought up the DLL of other chips.
Description
Technical field
The present invention relates to railcar hardware testing technical field, in particular it relates to which a kind of subordinate inverter controller is surveyed
Test system.
Background technology
Controller is the main body for realizing control function, it is applied as most important part in current industrial control module
Throughout most automation control areas.Once device outlet problem on the circuit or plate of controller, will cause entirely to control
The afunction of molding block, or even cause irreversible damage.Therefore, it is necessary to be surveyed offline to the basic function of controller
Examination.
Railcar is mainly worked by subordinate inverter to export three-phase alternating current for stand-by motor, while again through over commutation
Direct current is exported to use for train battery and emergency cell charging.With the variation of electrical equipment in railcar, to auxiliary
Help the requirement of circuit control device also increasingly harsher.
It is in the test process of subordinate inverter controller, it is necessary to corresponding according to the circuit structure design of tested controller
Testing scheme, detect the design requirement whether its input meets product with output signal.Meanwhile when circuit goes wrong, survey
Test system will build corresponding feedback mechanism, correctly reflect faulty loop, to allow maintenance personal to carry out failure
Diagnosis and maintenance.
Current debugging circuit board, mainly carries out on-line debugging by serial ports to tested controller, may be programmed when there is other
The interface for needing for this to be tested controller in the presence of logic controller is drawn, then is debugged with corresponding development environment.Work as quilt
Controller is surveyed not needed for extraction during interface, or even needs carry out extra welding job to tested controller and could tested
Work.
The content of the invention
For in the prior art the defects of, it is an object of the invention to provide a kind of subordinate inverter controller test system.
According to a kind of subordinate inverter controller test system provided by the invention, including:
Single-chip microcomputer:External sensor signal is detected by internal analog to digital conversion circuit, and by communication interface with being tested
Controller carries out data interaction;
FPGA:Slave pattern is configured to, is interacted with the single-chip data, the single-chip microcomputer carries out IGBT by the FPGA
Driving, the detection of IGBT feedback signals and communication, realize chain control.
Preferably, the slave pattern includes:The CCLK pins of the FPGA are as output end, as retaking of a year or grade clock;DONE
Pin represents the completion of configuration process as output end;Pin forces FPGA as the effective input of low level
Its configuration memory is removed, is passed throughPin initializes a configuration cycle.
Preferably, it is describedThe external pull-up resistor of pin.
Preferably, the FPGA is loaded into configuration file, and the instruction of the single-chip microcomputer is performed according to the logic of configuration file.
Preferably, in addition to host computer, the host computer interrupt debugging using serial ports, tested controller are sent different
Instruction, according to the corresponding functional module of instruction testing, final result is shown in the serial ports software of host computer.
Preferably, in addition to analog peripheral, the analog to digital conversion circuit of the single-chip microcomputer is inputted by amplifying circuit.
Preferably, IGBT drive signals are exported by the PWM pins of the single-chip microcomputer.
Compared with prior art, the present invention has following beneficial effect:
The present invention utilizes single-chip microcomputer to FPGA traveling software merit ratings, in upper electricity debugging, it is only necessary to enter stroke to single-chip microcomputer
Sequence is downloaded, you can is automatically performed coupled FPGA software merit rating, after configuration, is being not brought up the volume of other chips
Software and hardware configuration and debugging are carried out in the case of journey interface.
Brief description of the drawings
The detailed description made by reading with reference to the following drawings to non-limiting example, further feature of the invention,
Objects and advantages will become more apparent upon:
Fig. 1 is single-chip microcomputer configuration schematic diagram;
Fig. 2 is auxiliary circuit control device test schematic diagram;
Fig. 3 is the structural framing figure of the system.
Embodiment
With reference to specific embodiment, the present invention is described in detail.Following examples will be helpful to the technology of this area
Personnel further understand the present invention, but the invention is not limited in any way.It should be pointed out that the ordinary skill to this area
For personnel, without departing from the inventive concept of the premise, some changes and improvements can also be made.These belong to the present invention
Protection domain.
A kind of subordinate inverter controller test system provided by the invention, including:SCM&FPGA, in the present embodiment
In, single-chip microcomputer uses ST10R167, FPGA to use XC4003E.
Single-chip microcomputer, to detect external sensor signal, and is connect by internal analog to digital conversion circuit by RS232 and CAN communication
Mouth carries out data interaction with tested controller;FPGA:Single-chip microcomputer to FPGA by carrying out serial slave mode configuration, with single-chip microcomputer number
According to interaction, single-chip microcomputer carries out IGBT drivings by FPGA, IGBT feedback signals detect and communication, realizes chain control.
Single-chip microcomputer to FPGA by carrying out serial slave mode configuration, pin needed for configuration:FPGA CCLK pins are from mould
Output end is used as under formula, after configuring, CCLK has a weak pull-up resistor, as retaking of a year or grade clock;DONE pins are in the slave mode
As output end, the completion of configuration process is represented;Pin forces FPGA to remove as the effective input of low level
Its configuration memory, passes throughPin initializes a configuration cycle,One should be connected outside pin and draws electricity
Resistance.
Bit configuration files are converted to by the software independently write by hex configuration files.FPGA is being loaded into the process of data
In, the crc value being embedded in configuration file is compared with the crc value calculated in FPGA.When crc value is consistent, represent to be successfully loaded
Configuration file, FPGA can perform the instruction of single-chip microcomputer according to the logic of configuration file.When crc value is inconsistent, by that can pass through
Serial ports sends configuration failure and terminates configuration, as shown in Figure 1.
Debugged as shown in Fig. 2 debugging routine is interrupted by serial ports, it is main that different fingers is sent to controller using host computer
Order, according to the corresponding functional module of instruction testing, final result is shown in host computer serial ports software.
The signal of detection power module is fed back in FPGA by controller circuitry, and single-chip microcomputer receives the number that FPGA is collected
According to, and judge whether supply voltage is normal according to data.03 instruction is sent by serial ports software and carries out power module detection, and is connect
Feedback data is received, whether normal directly displays output voltage.
Analog peripheral is inputted, and single-chip microcomputer digital-to-analogue conversion interface is input to after amplifier circuit.ST10R167 is carried
Supply on the analog/digital converter and a holding circuit chip of 10 bit resolutions.Digital-to-analogue is selected by configuring ADCON
After translation function, ADBSY registers are set to 1, start analog conversion function, thus can show that digital-to-analogue conversion is each led to one by one
The data in road.02 instruction is sent in serial ports software, shows the data of digital-to-analogue conversion.
IGBT drive signals are exported by the PWM of single-chip microcomputer, and ST10R167 pulse-modulator module has the PWM of 4 tunnel independences
Signal forms.00 instruction is sent in serial ports software, shows IGBT output states.IGBT feedback signals connect by FPGA interface
Receive, monolithic section collection feedback signal, judge whether IGBT feedbacks are normal, and feedback information is shown in serial ports software.It is soft in serial ports
01 instruction is sent in part, shows feedback states.
As shown in figure 3, the present invention utilizes single-chip microcomputer to FPGA traveling software merit ratings, in upper electricity debugging, it is only necessary to list
Piece machine carries out download program, you can is automatically performed coupled FPGA software merit rating, after configuration, is being not brought up it
In the case of the DLL of his chip by FPGA enter line sensor input detection, supply voltage detection and IGBT output/
Feedback detection, host computer interact with single-chip data, the operation of real-time supervisory control device test system.
The specific embodiment of the present invention is described above.It is to be appreciated that the invention is not limited in above-mentioned
Particular implementation, those skilled in the art can make a variety of changes or change within the scope of the claims, this not shadow
Ring the substantive content of the present invention.In the case where not conflicting, the feature in embodiments herein and embodiment can any phase
Mutually combination.
Claims (7)
- A kind of 1. subordinate inverter controller test system, it is characterised in that including:Single-chip microcomputer:External sensor signal is detected by internal analog to digital conversion circuit, and passes through communication interface and tested control Device carries out data interaction;FPGA:Slave pattern is configured to, is interacted with the single-chip data, the single-chip microcomputer carries out IGBT drives by the FPGA Dynamic, IGBT feedback signals detection and communication, realize chain control.
- 2. subordinate inverter controller test system according to claim 1, it is characterised in that the slave pattern includes: The CCLK pins of the FPGA are as output end, as retaking of a year or grade clock;DONE pins represent the complete of configuration process as output end Into;Pin forces FPGA to remove its configuration memory, passed through as the effective input of low level Pin initializes a configuration cycle.
- 3. subordinate inverter controller test system according to claim 2, it is characterised in that describedPin External pull-up resistor.
- 4. subordinate inverter controller test system according to claim 1, it is characterised in that the FPGA is loaded into configuration File, the instruction of the single-chip microcomputer is performed according to the logic of configuration file.
- 5. subordinate inverter controller test system according to claim 1, it is characterised in that also including host computer, institute State host computer and debugging is interrupted using serial ports, different instructions is sent to being tested controller, according to the corresponding function mould of instruction testing Block, final result are shown in the serial ports software of host computer.
- 6. subordinate inverter controller test system according to claim 1, it is characterised in that also including analog peripherals electricity Road, the analog to digital conversion circuit of the single-chip microcomputer is inputted by amplifying circuit.
- 7. subordinate inverter controller test system according to claim 1, it is characterised in that IGBT drive signals are by institute State the PWM pins output of single-chip microcomputer.
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CN201710792572.1A CN107505933A (en) | 2017-09-05 | 2017-09-05 | Subordinate inverter controller test system |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113419516A (en) * | 2021-06-23 | 2021-09-21 | 上海地铁电子科技有限公司 | Off-line detection system and method for subway train traction control unit |
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