CN107490599A - A kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method - Google Patents
A kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method Download PDFInfo
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Abstract
The invention discloses a kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method, row energization is entered to test specimen by recurrent pulse, obtain the thermal image sequence that the surface temperature that test specimen contains defect information changes over time, Fourier expansion is carried out to thermal image sequence again, become the superposition of multiple sinusoidal signals, the thermal response of each corresponding sinusoidal signal can be obtained according to heat wave principle, so as to obtain the thermal response of recurrent pulse, maximum temperaturerise is controlled while just can so reaching increase energy, improve detection depth, add signal resolution, improve the detectable rate of deep zone defect and shallow-layer microdefect.
Description
Technical field
The invention belongs to technical field of nondestructive testing, more specifically, is related to a kind of leaded steel multilayer material debonding defect
Recurrent pulse thermal imaging testing method.
Background technology
Non-destructive testing technology is to ensure Important Project equipment manufacturing quality and key technology safe for operation.Leaded steel multilayer is glued
Material is connect because its special structure and performance have obtained extensive reference in nuclear industry field.Due to by production technology and environment
Easily there is the defects of poor attachment, stomata, local unsticking, destroy structural intergrity in the influence of factor, leaded steel multilayer material
While, huge potential safety hazard of also having hidden.Multilayer material is due to its complicated structure, the thickness generally having, material category
Most of non-destructive testing technologies are proposed challenge by the diversity of property and the limitation of actually detected environment.By to a variety of nothings
The comparison and analysis of detection technique is damaged, it is found that thermal imaging lossless detection method has application in the detection of multilayer material debonding defect
Potentiality, there is contactless, quick, large area detection.But traditional pulse thermal imaging detection technique is more in leaded steel
Detect that depth is small on layer material and lateral heat diffusion has a great influence, it is difficult to collect two layers and following debonding defect information.
In order to increase the detectability of deep zone defect, increase pulsed energy, can be because TRANSIENT HIGH TEMPERATURE causes leaded steel multilayer material
Damage.
Therefore, it is necessary to improve pulse excitation pattern, pulse is modulated, so as to be that test specimen obtains the same of more energy
Shi Buhui damages because of TRANSIENT HIGH TEMPERATURE.Existing modulating mode has lock mutually to modulate, but it is complicated to lock phase modulating system, hardware into
This height, in order to reach limit, detection time is longer.And same position needs the different retest of depth.
The content of the invention
It is an object of the invention to overcome the deficiencies of the prior art and provide a kind of leaded steel multilayer material debonding defect cycle arteries and veins
Thermal imaging testing method is rushed, realizes the inspection of deep layer debonding defect and the miniature debonding defect of shallow-layer to multiple material by recurrent pulse
Survey.
For achieving the above object, a kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging detection side of the present invention
Method, it is characterised in that comprise the following steps：
(1) recurrent pulse, is obtained
(1.1), the maximum modulating frequency ω of calculating cycle pulse：
Wherein, α is the thermal diffusion coefficient of test specimen, and μ is depth capacity the defects of needing detection；
(1.2), the minimum period T of calculating cycle pulse：
(1.3), recurrent pulse of the cycle not less than T is produced using driving source；
(2), enter row energization to test specimen using recurrent pulse, obtain the surface temperature that test specimen contains defect information
The thermal image sequence changed over time；
(2.1) row energization, is entered to test specimen using recurrent pulse, produces test specimen surface periodically variable
Temperature sequence；
(2.2), using temperature sequence caused by FLIR thermal infrared imagers collection test specimen surface, thermal image sequence is obtained
Row, then thermal image sequence is imported into computer；
(3), thermal image sequence is handled using computer, obtains the recognition result of test specimen defect；
(3.1), the first two field picture of thermal image sequence is removed, obtains the thermal image sequence after denoising；
(3.2) discrete fourier, is carried out to the discrete temperature sequence of each frame thermal image in the thermal image sequence after denoising
Conversion, obtains spectrogram F (f)；
Wherein, Δ t is sampling interval duration, and n is the n-th frame thermal image of the thermal image sequence after denoising, after N represents denoising
Thermal image sequence totalframes, f represent sample frequency, T represent recurrent pulse minimum period, T [n Δs t] represent n-th frame thermal map
The discrete temperature sequence of picture, R (f) and I (f) represent F (f) real and imaginary parts respectively；
(3.3) phase spectrogram, is calculated according to spectrogram F (f)With amplitude spectrum A (f)；
(3.4) the characteristics of, according to the phase information at fault location and non-defective place with amplitude information difference, phase information is selected
A two field picture extremely prominent with amplitude information, and it is labeled as optimal frames；
(3.5), analyzing defect detection sensitivity, the recognition result of defect information is judged；
Using the amplitude in optimal two field picture or phase as signal, the signal to noise ratio snr of optimal two field picture is calculated：
Wherein, SmDAnd SmNThe signal magnitude of defect area and the signal magnitude in non-defective region, σ (S are represented respectivelymN) table
Show the standard deviation of the signal magnitude in non-defective region；
The sensitivity that signal to noise ratio snr is detected as analyzing defect, judge the recognition result of defect information；
If SNR>0, then the signal of defect area and the signal in non-defective region can distinguish, i.e., defect can be known
Not, and SNR is bigger, and defect recognition ability is stronger, and recognition accuracy is higher；Otherwise defect can not be identified.
What the goal of the invention of the present invention was realized in：
A kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method of the present invention, by recurrent pulse to quilt
Test block enters row energization, obtains the thermal image sequence that the surface temperature that test specimen contains defect information changes over time, then right
Thermal image sequence carries out Fourier expansion, becomes the superposition of multiple sinusoidal signals, can be obtained according to heat wave principle each corresponding
The thermal response of sinusoidal signal, so as to obtain the thermal response of recurrent pulse, controlled most while just can so reaching increase energy
High temperature rise, detection depth is improved, adds signal resolution, improve the detectable rate of deep zone defect and shallow-layer microdefect.
A kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method of the present invention also has with following simultaneously
Beneficial effect：
1st, maximum temperaturerise is reduced.Recurrent pulse thermal imaging is adding the same of Implantation Energy due to taking multiple pulses
When ensure that maximum temperaturerise will not be too high, and due to not being transient pulse, reduce the risk for destroying test specimen.According to calculating,
In flash lamp thermal imaging system, using 3 recurrent pulses, maximum temperaturerise can be made to reduce by 11% or so, in vortex thermal imaging
In system, using 3 recurrent pulses, then maximum temperaturerise can be made to reduce by 17% or so.
2nd, signal resolution is improved.Because recurrent pulse is modulated to phase spectrogram and amplitude spectrum so that letter
Number resolution ratio increases, while reduces the interference of noise.Also, the phase spectrogram of recurrent pulse thermal imaging has multiple responses,
Add information characteristics amount.
3rd, it is deep to detect depth, Implantation Energy foot.As a result of multiple pulses, therefore enough energy can be injected to test specimen
Amount, and by regulating cycle, detection depth capacity can be adjusted.
4th, the interference of surface temperature inequality and thermal diffusion is reduced.As a result of phase diagram, have and suppress surface emitting
The effect of the uneven influence with lateral heat diffusion of rate.
5th, equipment is simple, and hardware cost is relatively low.
Brief description of the drawings
Fig. 1 is recurrent pulse thermal imaging system block diagram；
Fig. 2 is a kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method flow chart of the present invention；
Fig. 3 is the amplitude spectrum and phase spectrogram of different cycles；
Fig. 4 is the empirical curve and matched curve that surface temperature changes over time；
Fig. 5 is correlation analysis and the error analysis of theoretical validation；
Fig. 6 is micro-defects experimental result picture；
Fig. 7 is deep zone defect experimental result picture.
Embodiment
The embodiment of the present invention is described below in conjunction with the accompanying drawings, so as to those skilled in the art preferably
Understand the present invention.Requiring particular attention is that in the following description, when known function and the detailed description of design perhaps
When can desalinate the main contents of the present invention, these descriptions will be ignored herein.
Embodiment
Fig. 1 is recurrent pulse thermal imaging system block diagram.
In the present embodiment, as shown in figure 1, service life pulse enters row energization to test specimen, according to heat wave conduction principle, table
Face can produce periodically variable temperature sequence.Surface temperature, which changes with time, can be expressed as two-part superposition：Stable state
Part and transient portion thereof.Surface temperature Transient distribution T (0, t) is solved according to heat wave conduction principle respectivelyTWith steady-state distribution T (0,
t)S, it is as follows：
T(0,t)T=Tam+ΔT(1-e-t/τ)
Due to meeting linear superposition theorem, therefore to change over time curve as follows for surface temperature：
T (0, t)=T (0, t)T+T(0,t)S (5)
Wherein, T (0, t) is then that surface temperature changes with time.A is the amplitude of transient component, q0It is injection length
Gross energy, ω are frequencies, and T is the cycle of recurrent pulse excitation, TamIt is environment temperature, τ is time constant.
The theory deduction of this explanation is to be based on surface heated premise, if for being vortexed in thermal imaging, need to ensure to be vortexed
Skin depth it is shallower, heat is gathered in surface, and influence of the defect to vortex is very little.In the present embodiment, use
The principle of light stimulus infrared thermal imaging.
We are carried out detailed to a kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method of the present invention below
Describe in detail it is bright, as shown in Fig. 2 specifically including following steps：
S1, obtain recurrent pulse
Recurrent pulse excitation can carry out Fourier expansion such as formula 1：
Wherein,
According to heat wave conduction principle, surface can produce periodically variable temperature sequence after recurrent pulse enters row energization to test specimen
Row, and surface temperature changes with time the superposition of the steady-state portion and transient portion thereof that can be expressed as foregoing description, therefore
Before experiment, depth of defect and material coefficient are first determined, only could be by recurrent pulse in the defects of heat wave diffusion depth scope
Thermal imaging method detects.
In the present embodiment, the defects of test specimen that we select is leaded steel multilayer material, and it is present is debonding defect；
In addition the present invention can be used for multiclass material, such as metal, 45# steel etc..
So maximum modulating frequency ω and minimum period T of our can calculating cycle pulses：
Wherein, α is the thermal diffusion coefficient of leaded steel multilayer material, and μ is depth capacity the defects of needing detection；
Finally, we produce recurrent pulse of the cycle not less than T using driving source.
S2, enter row energization to leaded steel multilayer material using recurrent pulse, obtain leaded steel multilayer material and contain defect information
The thermal image sequence that surface temperature changes over time；
Row energization is entered to leaded steel multilayer material using recurrent pulse, leaded steel multilayer material surface is produced cyclically-varying
Temperature sequence；Temperature sequence caused by recycling FLIR thermal infrared imagers collection leaded steel multilayer material surface, obtains thermal image
Sequence, then thermal image sequence is imported into computer；
S3, using computer thermal image sequence is pre-processed：First two field picture of thermal image sequence is removed, obtained
Thermal image sequence after denoising.
S4, discrete Fourier transform obtain phase spectrogram and amplitude spectrum；
Discrete Fourier transform is carried out to the discrete temperature sequence of each frame thermal image in the thermal image sequence after denoising, obtained
To spectrogram F (f)；
Wherein, Δ t is sampling interval duration, and n is the n-th frame thermal image of the thermal image sequence after denoising, after N represents denoising
Thermal image sequence totalframes, f represent sample frequency, T represent recurrent pulse minimum period, T [n Δs t] represent n-th frame thermal map
The discrete temperature sequence of picture, R (f) and I (f) represent F (f) real and imaginary parts respectively；
Phase spectrogram is calculated according to spectrogram F (f)With amplitude spectrum A (f)；
As shown in figure 3, modulation effect is relevant with the recurrent pulse cycle.Fig. 3 (a) and (b) are that individual pulse encourages for 6 seconds respectively
The amplitude spectrum and phase spectrogram obtained afterwards, it can be seen that each frame has signal, and the first frame amplitude of removing is larger outer, remaining letter
It is number all very faint, it is difficult to come out respectively.Fig. 3 (c) and (d) be respectively the amplitude spectrum that the recurrent pulse that the cycle is 3 seconds encourages and
Phase spectrogram, it can be seen that amplitude and cycle are modulated, and the signal of response is only the half of single pulse excitation.Similarly, Fig. 3
(e) and (f) is the amplitude spectrum and phase spectrogram for the recurrent pulse excitation that the cycle is 2 seconds respectively, and its response signal is pulse
/ 3rd of excitation.It can thus be seen that service life pulse, corresponding amplitude figure and phase diagram are modulated, and are had more
High signal resolution, and amplitude figure and phase diagram only just have frequency response in corresponding frequencies omega, 3 ω, 5 ω ..., change
ω, namely reduce cycle T, modulation dynamics is bigger.
S5, defect recognition
The characteristics of according to the phase information at fault location and non-defective place with amplitude information difference, select phase information and amplitude
The two field picture that Information abnormity protrudes, and it is labeled as optimal frames；
Using the amplitude in optimal two field picture or phase as signal, the signal to noise ratio snr of optimal two field picture is calculated：
Wherein, SmDAnd SmNThe signal magnitude of defect area and the signal magnitude in non-defective region, σ (S are represented respectivelymN) table
Show the standard deviation of the signal magnitude in non-defective region；
The sensitivity that signal to noise ratio snr is detected as analyzing defect, judge the recognition result of defect information；
If SNR>0, then the signal of defect area and the signal in non-defective region can distinguish, i.e., defect can be known
Not, and SNR is bigger, and defect recognition ability is stronger, and recognition accuracy is higher；Otherwise defect can not be identified.
Case Simulation
For the correctness of proving period pulse method derivation result, comparative analysis experimental result and result of calculation.Fig. 4
Middle bold portion is the temperature-time figure obtained by digital simulation, and dotted line is by testing obtained temperature-time figure.It is based on
Model's Caro method, enough samples are chosen, carry out many experiments, carried out correlation and error analysis, obtained correlation
Distribution map and error map are respectively as Fig. 5 (a) and (b) are shown.It can be seen that correlation, more than 0.95, error is less than 0.2, says
The goodness of fit is higher between bright matched curve and actual curve, illustrates the correctness of the theory deduction.
We detect to the defects of different dimensional depths：
The detection of shallow-layer micro-defects：
Defect is located at the second layer (first layer is lead) of leaded steel multilayer material, steel layer upper surface, depth 1.2mm, size
For 7mm, 6mm, 5mm, 4mm.Pulse can not detect 7mm, 6mm defects, therefore use the recurrent pulse excitation side of this explanation
Method, testing result are as shown in Figure 6.Detection sensitivity SNR is calculated, the sensitivity for obtaining four defects is 15 or so, i.e., four
Defect is identified.Thus illustrate, recurrent pulse is not readily susceptible to the influence of lateral heat diffusion, can detect that shallow-layer is miniature and lack
Fall into.
The detection of deep zone defect：
Defect is located at the second layer of leaded steel multilayer material, steel layer lower surface, depth 5.2mm, size 15mm.Detection knot
Fruit is 30, i.e. defect is identified as shown in fig. 7, calculating detection sensitivity SNR.Illustrate that recurrent pulse thermal imaging can detect
To the deep zone defect and sensitivity it is very high.
It should be noted that experiment has carried out spray painting processing to surface of test piece above, adjustment slin emissivity is 1, is subtracted
Small influence of the slin emissivity to experimental result.
Although the illustrative embodiment of the present invention is described above, in order to the technology of the art
Personnel understand the present invention, it should be apparent that the invention is not restricted to the scope of embodiment, to the common skill of the art
For art personnel, if various change in the spirit and scope of the present invention that appended claim limits and determines, these
Change is it will be apparent that all utilize the innovation and creation of present inventive concept in the row of protection.
Claims (1)
1. a kind of leaded steel multilayer material debonding defect recurrent pulse thermal imaging testing method, it is characterised in that comprise the following steps：
(1) recurrent pulse, is obtained
(1.1), the maximum modulating frequency ω of calculating cycle pulse：
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<mi>&alpha;</mi>
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<msup>
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<mn>2</mn>
</msup>
</mfrac>
</mrow>
Wherein, α is the thermal diffusion coefficient of test specimen, and μ is depth capacity the defects of needing detection；
(1.2), the minimum period T of calculating cycle pulse：
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(1.3), recurrent pulse of the cycle not less than T is produced using driving source；
(2), enter row energization to test specimen using recurrent pulse, obtain test specimen and contain the surface temperature of defect information at any time
Between the thermal image sequence that changes；
(2.1) row energization, is entered to test specimen using recurrent pulse, test specimen surface is produced periodically variable temperature
Sequence；
(2.2), using temperature sequence caused by FLIR thermal infrared imagers collection test specimen surface, thermal image sequence is obtained, then
Thermal image sequence is imported into computer；
(3), thermal image sequence is handled using computer, obtains the recognition result of test specimen defect；
(3.1), the first two field picture of thermal image sequence is removed, obtains the thermal image sequence after denoising；
(3.2) discrete Fourier transform, is carried out to the discrete temperature sequence of each frame thermal image in the thermal image sequence after denoising,
Obtain spectrogram F (f)；
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Wherein, Δ t is the sampling time, and n is the n-th frame thermal image of the thermal image sequence after denoising, and N represents the thermal image after denoising
Sequence totalframes, f represent sample frequency, T represent recurrent pulse minimum period, T [n Δs t] represent n-th frame thermal image from
Temperature sequence is dissipated, R (f) and I (f) represent F (f) real and imaginary parts respectively；
(3.3) phase spectrogram, is calculated according to spectrogram F (f)With amplitude spectrum A (f)；
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(3.4) the characteristics of, according to the phase information at fault location and non-defective place with amplitude information difference, phase information and width are selected
The extremely prominent two field picture of value information, and it is labeled as optimal frames；
(3.5), analyzing defect detection sensitivity, the recognition result of defect information is judged；
Using the amplitude in optimal two field picture or phase as signal, the signal to noise ratio snr of optimal two field picture is calculated：
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<mi>S</mi>
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Wherein, SmDAnd SmNThe signal magnitude of defect area and the signal magnitude in non-defective region, σ (S are represented respectivelymN) represent non-
The standard deviation of the signal magnitude of defect area；
The sensitivity that signal to noise ratio snr is detected as analyzing defect, judge the recognition result of defect information；
If SNR>0, then the signal of defect area and the signal in non-defective region can distinguish, i.e., defect can be identified, and
SNR is bigger, and defect recognition ability is stronger, and recognition accuracy is higher；Otherwise defect can not be identified.
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