CN107450004A - Fault detection method and circuit - Google Patents
Fault detection method and circuit Download PDFInfo
- Publication number
- CN107450004A CN107450004A CN201710645384.6A CN201710645384A CN107450004A CN 107450004 A CN107450004 A CN 107450004A CN 201710645384 A CN201710645384 A CN 201710645384A CN 107450004 A CN107450004 A CN 107450004A
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- Prior art keywords
- fault
- detect object
- circuit
- fault detect
- electric current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
The invention discloses a kind of fault detection method and circuit.Wherein, this method includes：The electric current of testing element is flowed through in detection, and the testing element is connected in series with fault detect object；If being detected in preset time period, the electric current is all higher than the first preset value, and control disconnects with the switch element that the fault detect object is connected in series.The present invention solves the technical problem that can not be continuing with due to product caused by power semiconductor damage.
Description
Technical field
The present invention relates to fault detection field, in particular to a kind of fault detection method and circuit.
Background technology
PFC (Power Factor Correction, PFC) circuit is improved power factor and lifting bus
The effect of voltage, for its structure as shown in figure 1, AC-L, N represent the live wire and zero line of single-phase alternating current respectively, D1 to D4 is rectification
Diode, C1 are bus capacitor, and L is PFC inductance.The general principle of pfc circuit is by controlling power semiconductor Q1
Make-and-break time ratio to carry out discharge and recharge to inductance L, so as to realize the lifting to busbar voltage.
However, power semiconductor Q1 is fragile, can cause to produce after power semiconductor Q1 damages (such as short circuit)
Product can not be continuing with, and need to change new module.
For it is above-mentioned the problem of, not yet propose effective solution at present.
The content of the invention
The embodiments of the invention provide a kind of fault detection method and circuit, at least to solve due to power semiconductor
The technical problem that product caused by damage can not be continuing with.
One side according to embodiments of the present invention, there is provided a kind of fault detection method, including：Test member is flowed through in detection
The electric current of part, above-mentioned testing element are connected in series with fault detect object；If being detected in preset time period, above-mentioned electric current is equal
More than the first preset value, control disconnects with the switch element that above-mentioned fault detect object is connected in series.
Alternatively, the above method is applied to pfc circuit.
Alternatively, after control disconnects with the switch element that above-mentioned fault detect object is connected in series, the above method also wraps
Include：Fisrt fault information is exported, above-mentioned Fisrt fault information is used to indicate above-mentioned fault detect object short circuit.
Alternatively, above-mentioned fault detection method also includes：If being detected in the preset time period, the electric current is
Second preset value, adjustment busbar voltage protection value are less than predeterminated voltage protection value.
Alternatively, above-mentioned fault detection method also includes：If being detected in above-mentioned preset time period, above-mentioned electric current is
Second preset value, exports the second fault message, and above-mentioned second fault message is used to indicate above-mentioned fault detect object open circuit.It is optional
Ground, in the case of the short circuit of above-mentioned fault detect object or open circuit, the above method also includes：Do not send and shut down to drive circuit
Instruction.
Alternatively, above-mentioned switch element includes at least one of：Relay normally closed contact, fusible link.
Alternatively, above-mentioned testing element includes at least one of：Resistance, ammeter；Above-mentioned fault detect object includes
Power semiconductor.
Another aspect according to embodiments of the present invention, a kind of failure detector circuit, including fault detect object are additionally provided,
The testing element and switch element being connected in series with above-mentioned fault detect object, the master chip being connected with above-mentioned testing element；Its
In, flowed through in preset time period above-mentioned testing element electric current be all higher than the first preset value in the case of, above-mentioned master chip control
Above-mentioned switch element is made to disconnect.
Alternatively, above-mentioned failure detector circuit is pfc circuit.
Alternatively, the electric current for above-mentioned testing element being flowed through in above-mentioned preset time period is the situation of the second preset value
Under, above-mentioned master chip adjustment busbar voltage protection value is less than predeterminated voltage protection value.
Alternatively, the electric current that above-mentioned testing element is flowed through in above-mentioned preset time period is all higher than above-mentioned first preset value
In the case of, above-mentioned master chip exports Fisrt fault information, and above-mentioned Fisrt fault information is used to indicate that above-mentioned fault detect object is short
Road；In the case that the electric current that above-mentioned testing element is flowed through in above-mentioned preset time period is the second preset value, above-mentioned master chip
The second fault message is exported, above-mentioned second fault message is used to indicate above-mentioned fault detect object open circuit.
Alternatively, in the case of the short circuit of above-mentioned fault detect object or open circuit, above-mentioned master chip adjusts busbar voltage
Protection value is less than predeterminated voltage protection value.
Alternatively, above-mentioned switch element includes at least one of：Relay normally closed contact, fusible link.
Alternatively, above-mentioned fault detect object includes power semiconductor, above-mentioned testing element include it is following at least it
One：Resistance, ammeter.
In embodiments of the present invention, the electric current of testing element, testing element and fault detect object string are flowed through using detection
Connection connection；If being detected in preset time period, electric current is all higher than the first preset value, and control is connected in series with fault detect object
The mode that disconnects of switch element, the electric current of testing element is flowed through by detection, determines whether fault detect object short circuit occurs
Failure, and in the case where there is short trouble, disconnect switch element so that product work in the state of fault-free detection object
Make, even if having reached fault detect object damage product can continue to application target, it is achieved thereby that enhance product performance
Technique effect, and then solve the technical problem that can not be continuing with due to product caused by power semiconductor damage.
Brief description of the drawings
Accompanying drawing described herein is used for providing a further understanding of the present invention, forms the part of the application, this hair
Bright schematic description and description is used to explain the present invention, does not form inappropriate limitation of the present invention.In the accompanying drawings：
Fig. 1 is the structural representation according to a kind of pfc circuit of prior art；
Fig. 2 is a kind of schematic flow sheet of optional fault detection method according to embodiments of the present invention；
Fig. 3 is the schematic flow sheet of the optional fault detection method of another kind according to embodiments of the present invention；
Fig. 4 is a kind of structural representation of optional failure detector circuit according to embodiments of the present invention；
Fig. 5 is the structural representation of the optional failure detector circuit of another kind according to embodiments of the present invention.
Embodiment
In order that those skilled in the art more fully understand the present invention program, below in conjunction with the embodiment of the present invention
Accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only
The embodiment of a part of the invention, rather than whole embodiments.Based on the embodiment in the present invention, ordinary skill people
The every other embodiment that member is obtained under the premise of creative work is not made, it should all belong to the model that the present invention protects
Enclose.
It should be noted that term " first " in description and claims of this specification and above-mentioned accompanying drawing, "
Two " etc. be for distinguishing similar object, without for describing specific order or precedence.It should be appreciated that so use
Data can exchange in the appropriate case, so as to embodiments of the invention described herein can with except illustrating herein or
Order beyond those of description is implemented.In addition, term " comprising " and " having " and their any deformation, it is intended that cover
Cover it is non-exclusive include, be not necessarily limited to for example, containing the process of series of steps or unit, method, system, product or equipment
Those steps or unit clearly listed, but may include not list clearly or for these processes, method, product
Or the intrinsic other steps of equipment or unit.
Embodiment 1
According to embodiments of the present invention, there is provided a kind of embodiment of the method for fault detection method is, it is necessary to illustrate, attached
The step of flow of figure illustrates can perform in the computer system of such as one group computer executable instructions, though also,
So logical order is shown in flow charts, but in some cases, can be with different from shown by order execution herein
Or the step of description.
Fig. 2 is fault detection method according to embodiments of the present invention, as shown in Fig. 2 this method comprises the following steps：
The electric current of testing element is flowed through in step S102, detection.
In the present embodiment above-mentioned steps S102, testing element is connected in series with fault detect object, flows through survey by detection
Whether the size of current failure judgement detection object of examination element damages (such as short circuit or open circuit), occurs to flow through test during short trouble
The electric current of element can be very big, and the electric current for occurring to flow through testing element during open circuit fault is zero.
Alternatively, testing element can include at least one of：Resistance, ammeter；Fault detect object can include
Power semiconductor.
It should be noted that the fault detection method of the present embodiment can apply to pfc circuit.
Step S104, if being detected in preset time period, electric current is all higher than the first preset value, control and fault detect pair
As the switch element being connected in series disconnects.
In the present embodiment above-mentioned steps S104, when detecting that the current value for flowing through testing element is very big in preset time period
, can be by controlling switch unit when (being more than the first preset value) so that fault detect object is separated from circuit,
Wherein, switch element is connected in series with fault detect object.
In the present embodiment, switch element includes at least one of：Relay normally closed contact, fusible link.
As a kind of alternatively implementation, in the case where switch element is relay normally closed contact, control and failure
The switch element that detection object is connected in series, which disconnects, to be included：Control relay coil obtain it is electric so that relay normally closed contact disconnect,
(such as continuous several PFC cycles) detects that the current value for flowing through testing element is very big and (is more than the even in preset time period
One preset value) when, the level of related I/O (input/output, input/output) port will be changed, make relay coil powered,
Relay normally closed contact disconnects.
By above-mentioned steps, the electric current of testing element can be flowed through by detection, determines whether fault detect object occurs
Short trouble, and in the case where there is short trouble, disconnect switch element so that state of the product in fault-free detection object
Lower work, even if having reached fault detect object damage product can continue to application target, it is achieved thereby that improving product
The technique effect of energy, and then solve because the technology that product caused by power semiconductor damage can not be continuing with is asked
Topic.
As a kind of alternatively implementation, after control disconnects with the switch element that fault detect object is connected in series,
Also include output Fisrt fault information.Wherein, Fisrt fault information is used to indicate the short circuit of fault detect object.When in preset time
When (such as continuous several PFC cycles) detect that the electric current for flowing through testing element is all higher than the first preset value in section, illustrate failure
Short trouble occurs for detection object, exports Fisrt fault information, and Fisrt fault information is used to indicate the short circuit of fault detect object.Together
When, can be shown on interior machine display board corresponding to failure code, remind subscriber's line circuit be likely to occur failure, should be in time to after sale
Personnel feed back, and change module in time, but not send out halt instruction, and product can work on.
Alternatively, if being detected in the preset time period, the electric current is the second preset value, adjusts busbar voltage
Protection value is less than predeterminated voltage protection value.
Alternatively, if being detected in preset time period, electric current is the second preset value, the second fault message of output, and second
Fault message is used to indicate the open circuit of fault detect object.
When (such as continuous several PFC cycles) detect that the electric current of testing element is the second preset value in preset time period
When (such as zero), illustrate that open fault occurs for fault detect object, export the second fault message.Meanwhile it can be shown in interior machine
Failure code corresponding to display, reminds subscriber's line circuit to be likely to occur failure on plate, should feed back to personnel after sale, change in time in time
Module, but not halt instruction is sent out, product works on.
As a kind of alternatively implementation, in the case of the short circuit of fault detect object or open circuit, the present embodiment
Method also includes：Adjustment busbar voltage protection value is less than predeterminated voltage protection value.
Because pfc circuit has the function that boosting, when pfc circuit is normal, busbar voltage is maintained under certain voltage not
Become.Once pfc circuit breaks down, DC bus-bar voltage is just uncontrolled, and its size is by the peak value phase only with input ac voltage
Close, such busbar voltage will certainly decline, can not if at this moment still may result in product using original predeterminated voltage protection value
Work, therefore busbar voltage protection value can be modified, especially low-voltage variation value, ensure voltage ripple of power network occurring
When remain to normal work.During without pfc circuit, d-c bus voltage value is the peak value of alternating voltage, and busbar voltage protection value should be done
Go out corresponding change, can adjust busbar voltage protection value less than predeterminated voltage protection value (such as adjustment busbar voltage protection value
It is worth small 30V to 50V than predeterminated voltage protection), ensure that product product when power network fluctuates remains to normal use.
As a kind of alternatively implementation, in the case of the short circuit of fault detect object or open circuit, method also includes：
Halt instruction is not sent to drive circuit.
In order to which user preferably experiences, in the case where detecting that short circuit or open circuit occur for fault detect object, Ke Yitong
Cross communicating circuit to be sent on interior machine display board corresponding failure code, the failure code is only to remind subscriber's line circuit to occur
Failure, module should be changed to application after sale in time, halt instruction can't be sent to drive circuit, ensure that product still is able to make
With.
As shown in figure 3, using fault detect object as power semiconductor, testing element is the event of the present embodiment exemplified by resistance
Barrier detection method includes：
Step a, starting.
Step b, judges whether power semiconductor damages.
In the present embodiment above-mentioned steps b, the resistance being connected in series with power semiconductor and relay are set up in circuit
Device normally-closed contact.The electric current of resistance is flowed through by detection, judges whether power semiconductor damages (i.e. short circuit or open circuit).If
Judge that power semiconductor damages, perform step c；If it is not, perform step e.
Step c, control relay normally-closed contact are opened, and export Fisrt fault information.
In the present embodiment above-mentioned steps c, if it is pre- to detect that the electric current for flowing through resistance is all higher than first in preset time period
If value, control disconnects with relay normally closed contact, exports Fisrt fault information, and Fisrt fault information is used for indicated horsepower semiconductor
Shorted devices；If being detected in preset time period, the electric current for flowing through resistance is zero, exports the second fault message, the second failure
Information is used for the open circuit of indicated horsepower semiconductor devices.
Step d, busbar voltage protection value is changed, shows failure code on the display panel.
In the present embodiment above-mentioned steps d, adjustment busbar voltage protection value is less than predeterminated voltage protection value.Due to pfc circuit
There is boosting, when pfc circuit is normal, busbar voltage is maintained at constant under certain voltage.Once event occurs for pfc circuit
Barrier, DC bus-bar voltage is just uncontrolled, and its size is related by the peak value only to input ac voltage, and such busbar voltage will certainly
Decline, if at this moment still may result in product using original predeterminated voltage protection value can not work, therefore can be to bus electricity
Pressure protection value is modified, especially low-voltage variation value, ensures to remain to normal work when there is voltage ripple of power network.Without PFC
During circuit, d-c bus voltage value is the peak value of alternating voltage, and busbar voltage protection value should make corresponding change, can adjust
Busbar voltage protection value is less than predeterminated voltage protection value, and (such as adjustment busbar voltage protection value is worth small 30V than predeterminated voltage protection
To 50V), ensure that product product when power network fluctuates remains to normal use.
Step e, terminate.
In the present embodiment, add a relay normally closed contact and connected with power semiconductor, when detecting power
During semiconductor devices fail, disconnect relay normally closed contact immediately, so as to which power semiconductor be disconnected, by power
The short trouble of semiconductor devices is converted to open circuit, and changes busbar voltage protection value so that product works under non-PFC states,
User is allowd to remain to normal use product before maintenance personal arrives.
Embodiment 2
According to embodiments of the present invention, there is provided a kind of embodiment of failure detector circuit, Fig. 4 are according to embodiments of the present invention
Failure detector circuit, as shown in figure 4, the failure detector circuit includes fault detect object 20, gone here and there with fault detect object 20
Join the testing element 22 and switch element 24 of connection, the master chip 26 being connected with testing element 22；Wherein, in preset time period
Flow through testing element 22 electric current be all higher than the first preset value in the case of, the controlling switch unit 24 of master chip 26 disconnects.
The failure detector circuit of the present embodiment, the testing element being connected in series with fault detect object 20 is set in circuit
22 and switch element 24, the electric current for flowing through testing element 22 is detected by master chip 26, determines whether fault detect object 20 occurs
Short trouble, and in the case where there is short trouble, disconnect switch element 24 so that product is in fault-free detection object 20
Worked under state, application target is can continue to even if having reached fault detect object 20 and having damaged product, it is achieved thereby that improving
The technique effect of properties of product, and then solve the skill that can not be continuing with due to product caused by power semiconductor damage
Art problem.
Alternatively, the failure detector circuit of the present embodiment is pfc circuit.
Alternatively, in the case that the electric current that testing element 22 is flowed through in preset time period is the second preset value, main core
Piece 26 adjusts busbar voltage protection value and is less than predeterminated voltage protection value.
Alternatively, flowed through in preset time period testing element 22 electric current be all higher than the first preset value in the case of, it is main
Chip 26 exports Fisrt fault information, and Fisrt fault information is used to indicate the short circuit of fault detect object 20；In preset time period
In the case that the electric current for flowing through testing element 22 is the second preset value, master chip 26 exports the second fault message, the second failure
Information is used to indicate the open circuit of fault detect object 20.
Testing element 22 is connected in series with fault detect object 20, and the electric current that testing element 22 is flowed through in the detection of master chip 26 is big
Whether small failure judgement detection object 20 damages (such as short circuit or open circuit), occurs to flow through the electric current of testing element 22 during short trouble
Can be very big, the electric current for occurring to flow through testing element 22 during open circuit fault is zero.
When (such as continuous several PFC cycles) detects that the electric current for flowing through testing element is all higher than the in preset time period
During one preset value, illustrate that short trouble occurs for fault detect object, export Fisrt fault information, Fisrt fault information is used to indicate
The short circuit of fault detect object.Meanwhile failure code corresponding to being shown on interior machine display board, remind subscriber's line circuit to go out
It existing failure, should be fed back in time to personnel after sale, change module in time, but not send out halt instruction, product can work on.
When (such as continuous several PFC cycles) detect that the electric current of testing element is the second preset value in preset time period
When (such as zero), illustrate that open fault occurs for fault detect object, export the second fault message.Meanwhile it can be shown in interior machine
Failure code corresponding to display, reminds subscriber's line circuit to be likely to occur failure on plate, should feed back to personnel after sale, change in time in time
Module, but not halt instruction is sent out, product works on.
Alternatively, switch element 24 includes at least one of：Relay normally closed contact, fusible link.
Alternatively, in the case where switch element 24 includes relay normally closed contact, master chip 26 is normally closed tactile with relay
Point connection, master chip 26 obtained for control relay coil it is electric so that relay normally closed contact disconnection.
Switch element 24 be relay normally closed contact in the case of, the control relay coil of master chip 26 obtain it is electric so that
Relay normally closed contact disconnects, and (such as continuous several PFC cycles) detects and flow through testing element even in preset time period
22 current value very big (being more than the first preset value) when, master chip 26 will change related I/O, and (input/output is inputted/defeated
Go out) level of port, make relay coil powered, relay normally closed contact disconnects.
Alternatively, in the case where switch element 24 includes fusible link, when short trouble occurs for fault detect object 20
Flowing through the electric current of fusible link can increased dramatically, and when reaching the current value of fusible link fusing, fusible link meeting quick fuse, fuse speed
Generally within 10ms.
Alternatively, in the case of the short circuit of fault detect object or open circuit, master chip adjustment busbar voltage protection value is less than
Predeterminated voltage protection value, and do not export halt instruction.
Alternatively, as shown in figure 5, fault detect object includes power semiconductor Q1, testing element includes resistance R1.
In Fig. 5, so that switch element is relay normally closed contact K1 as an example, AC-L, N represent the live wire of single-phase alternating current respectively
With zero line, D1 to D4 is commutation diode, and C1 is bus capacitor, and L is PFC inductance, relay normally closed contact K1, resistance R1 and work(
Rate semiconductor devices Q1 connects.
When continuous several PFC cycle detections are to the current value very big (being more than the first preset value) for flowing through resistance R1, explanation
Short trouble occurs for power semiconductor Q1, is disconnected relay normally closed contact K1 by control relay so that power half
Conductor device Q1 separates from circuit, then exports Fisrt fault information.In order to which user preferably experiences, by communicating electricity
Road is sent to corresponding failure code on interior machine display board.This code is only to remind user pfc circuit to break down, should and
When to application after sale change PFC module, halt instruction can't be sent out to drive circuit, product still be able to use.
When continuous several PFC cycle detections are arrived to flow through resistance R1 electric current be zero when, illustrate power semiconductor Q1 hairs
Raw open circuit fault, exports the second fault message.Corresponding failure code is shown on interior machine display board, reminds user's pfc circuit
Failure is likely to occur, should be fed back in time to personnel after sale, changes PFC module in time, but not halt instruction is sent out to drive circuit,
Product works on.
Because pfc circuit has the function that boosting, when pfc circuit is normal, busbar voltage is maintained under certain voltage not
Become.Once pfc circuit breaks down, DC bus-bar voltage is just uncontrolled, and its size is by the peak value phase only with input ac voltage
To close, such busbar voltage will certainly decline, if at this moment still may result in product using original protection value can not work, because
This, can modify, especially low-voltage variation value to busbar voltage protection value, ensure to remain to when there is voltage ripple of power network
Normal work.During without pfc circuit, d-c bus voltage value is the peak value of alternating voltage, and busbar voltage protection value should be made accordingly
Change (adjustment busbar voltage protection value be less than predeterminated voltage protection value), guarantee product remains to normally when power network fluctuates
Use.
Alternatively, master chip includes driving chip and the main control chip being connected with driving chip；Wherein, driving chip will be short
To main control chip, short trouble mark is converted into Fisrt fault by main control chip to be believed for road failure identification or open circuit fault identification transmission
Breath, or short trouble mark is converted into the second fault message.
Alternatively, the failure detector circuit of the present embodiment also includes：Interior machine display board, is connected with driving chip, for showing
Show Fisrt fault information or the second fault message.
Alternatively, the failure detector circuit of the present embodiment also includes：Communicating circuit, it is arranged at driving chip and is shown with interior machine
Between plate, for transmitting Fisrt fault information or the second fault message.
Alternatively, the input of switch element is connected with bus, the output head grounding of testing element.
The embodiments of the present invention are for illustration only, do not represent the quality of embodiment.
In the above embodiment of the present invention, the description to each embodiment all emphasizes particularly on different fields, and does not have in some embodiment
The part of detailed description, it may refer to the associated description of other embodiment.
In several embodiments provided herein, it should be understood that disclosed technology contents, others can be passed through
Mode is realized.Wherein, device embodiment described above is only schematical, such as the division of the unit, Ke Yiwei
A kind of division of logic function, can there is an other dividing mode when actually realizing, for example, multiple units or component can combine or
Person is desirably integrated into another system, or some features can be ignored, or does not perform.Another, shown or discussed is mutual
Between coupling or direct-coupling or communication connection can be INDIRECT COUPLING or communication link by some interfaces, unit or module
Connect, can be electrical or other forms.
The unit illustrated as separating component can be or may not be physically separate, show as unit
The part shown can be or may not be physical location, you can with positioned at a place, or can also be distributed to multiple
On unit.Some or all of unit therein can be selected to realize the purpose of this embodiment scheme according to the actual needs.
In addition, each functional unit in each embodiment of the present invention can be integrated in a processing unit, can also
That unit is individually physically present, can also two or more units it is integrated in a unit.Above-mentioned integrated list
Member can both be realized in the form of hardware, can also be realized in the form of SFU software functional unit.
If the integrated unit is realized in the form of SFU software functional unit and is used as independent production marketing or use
When, it can be stored in a computer read/write memory medium.Based on such understanding, technical scheme is substantially
The part to be contributed in other words to prior art or all or part of the technical scheme can be in the form of software products
Embody, the computer software product is stored in a storage medium, including some instructions are causing a computer
Equipment (can be personal computer, server or network equipment etc.) perform each embodiment methods described of the present invention whole or
Part steps.And foregoing storage medium includes：USB flash disk, read-only storage (ROM, Read-Only Memory), arbitrary access are deposited
Reservoir (RAM, Random Access Memory), mobile hard disk, magnetic disc or CD etc. are various can be with store program codes
Medium.
Described above is only the preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, under the premise without departing from the principles of the invention, some improvements and modifications can also be made, these improvements and modifications also should
It is considered as protection scope of the present invention.
Claims (14)
- A kind of 1. fault detection method, it is characterised in that including：The electric current of testing element is flowed through in detection, and the testing element is connected in series with fault detect object；If being detected in preset time period, the electric current is all higher than the first preset value, and control is connected with the fault detect object The switch element of connection disconnects.
- 2. according to the method for claim 1, it is characterised in that methods described is applied to PFC pfc circuit.
- 3. according to the method for claim 1, it is characterised in that the switch that control is connected in series with the fault detect object After unit disconnects, methods described also includes：Fisrt fault information is exported, the Fisrt fault information is used to indicate the fault detect object short circuit.
- 4. according to the method for claim 1, it is characterised in that also include：If it is the second preset value that the electric current is detected in the preset time period, adjustment busbar voltage protection value is less than pre- If voltage protection value.
- 5. according to the method for claim 1, it is characterised in that also include：If it is the second preset value that the electric current is detected in the preset time period, the second fault message is exported, described the Two fault messages are used to indicate the fault detect object open circuit.
- 6. according to the method for claim 1, it is characterised in that in the situation of fault detect object short circuit or open circuit Under, methods described also includes：Halt instruction is not sent to drive circuit.
- 7. method according to any one of claim 1 to 6, it is characterised in that the switch element include it is following at least One of：Relay normally closed contact, fusible link.
- 8. method according to any one of claim 1 to 6, it is characterised in that the testing element include it is following at least One of：Resistance, ammeter；The fault detect object includes power semiconductor.
- 9. a kind of failure detector circuit, it is characterised in that including fault detect object, be connected in series with the fault detect object Testing element and switch element, the master chip being connected with the testing element；Wherein,Flowed through in preset time period the testing element electric current be all higher than the first preset value in the case of, the master chip control The switch element is made to disconnect.
- 10. failure detector circuit according to claim 9, it is characterised in that the failure detector circuit is pfc circuit.
- 11. the failure detector circuit according to any one of claim 9, it is characterised in that in the preset time period In the case that the electric current for flowing through the testing element is the second preset value, the master chip adjustment busbar voltage protection value is less than Predeterminated voltage protection value.
- 12. failure detector circuit according to claim 9, it is characterised in that flowed through in the preset time period described In the case that the electric current of testing element is all higher than first preset value, the master chip exports Fisrt fault information, and described the One fault message is used to indicate the fault detect object short circuit；The electricity of the testing element is flowed through in the preset time period In the case that stream is the second preset value, the master chip exports the second fault message, and second fault message is used to indicate The fault detect object open circuit.
- 13. the failure detector circuit according to any one of claim 9 to 12, it is characterised in that the switch element bag Include at least one of：Relay normally closed contact, fusible link.
- 14. the failure detector circuit according to any one of claim 9 to 12, it is characterised in that the fault detect pair As including at least one of including power semiconductor, the testing element：Resistance, ammeter.
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