CN107422247A - A kind of signal amplifier automatic test circuit - Google Patents
A kind of signal amplifier automatic test circuit Download PDFInfo
- Publication number
- CN107422247A CN107422247A CN201710654543.9A CN201710654543A CN107422247A CN 107422247 A CN107422247 A CN 107422247A CN 201710654543 A CN201710654543 A CN 201710654543A CN 107422247 A CN107422247 A CN 107422247A
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- China
- Prior art keywords
- resistance
- circuit
- signal amplifier
- test
- relay
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
Abstract
The invention discloses a kind of signal amplifier automatic test circuit, including signal amplifier, the signal amplifier is connected with phase shift regulation circuit, zeroing circuit, measuring circuit, half-wave trimming circuit and input signal regulation circuit lead respectively;It, which is tested, includes measured signal amplifier being connected with automatic test circuit;Signal amplifier waveform output end is connected with oscillograph;Computer is connected with oscillograph and STS8105A hybrid circuit test systems;Enter the test of the direct current output zero potential of line amplifier;Enter the test of the linearity error of line amplifier;Enter the test of the phase shift range of line amplifier;Carry out the test of three dB bandwidth.The present invention has the characteristics that method is simple, versatile, simple to operate, not only reduces the cost of signal amplifier test, and improves testing efficiency, reduces test error.
Description
Technical field
The invention belongs to signal amplifier automatization testing technique field, more particularly to a kind of automation of signal amplifier to survey
Try circuit.
Background technology
Signal amplifier is mostly hybrid circuit, and the test to signal amplifier mainly tests its total null voltage, the linearity
The test of error, phase shift range and -3dB broadband parameters, but different types of signal amplifier internal circuit configuration is different,
Its method of testing is that factory designs according to itself products characteristics and application request, general certainly there is presently no formation
Dynamicization method of testing.Factory is by measuring instrumentss manual test signal amplifier, and not only efficiency is low for the method, and measuring accuracy is not
Height, also easily damage signal amplifier.
The content of the invention
Goal of the invention:The invention aims to solve deficiency of the prior art, there is provided a kind of signal amplifier is certainly
Dynamicization test circuit, there is no general automatic test means to solve the various signal amplifiers of conventionally test, only pass through measurement
Instrument manual test signal amplifier, caused testing efficiency is low, and measuring accuracy is low, also easily damages signal amplifier etc. and asks
Topic.
Technical scheme:A kind of signal amplifier automatic test circuit of the present invention, including including signal amplifier,
The signal amplifier is adjusted with phase shift regulation circuit, zeroing circuit, measuring circuit, half-wave trimming circuit and input signal respectively
Circuit lead connects;Described phase shift regulation circuit includes digital regulation resistance, the resistance centre tap end of digital regulation resistance with it is low
Resistance terminal is connected, and high resistance end is connected with the contact of single-pole single-throw(SPST relay, and resistance increase control terminal and resistance reduce control terminal
Be connected with the control unit CBIT of hybrid circuit test platform, the knife point of single-pole single-throw(SPST relay and signal amplifier it is external
Phase shift potentiometer end is connected.
Further, zeroing circuit includes turn knob potentiometer and double-pole single-throw (D.P.S.T.) relay, turn knob potentiometer both ends and double-pole
Singly throw two contacts of relay be connected, centre tap end be connected with the negative supply input of signal amplifier, double-pole single-throw (D.P.S.T.) relay
Two knife points of device are connected with two zeroing ends of signal amplifier.
Further, half-wave trimming circuit is opened including half-wave fine setting digital regulation resistance, the first key switch and the second button
Close, half-wave fine setting digital regulation resistance resistance increase control terminal and resistance reduce control terminal respectively with the first key switch and second
One end of key switch is connected, and low resistance end and resistance centre tap end ground connection, the half-wave of high resistance end and signal amplifier are micro-
End is adjusted to be connected, the other end ground connection of the first key switch and the second key switch.
Further, input signal regulation circuit includes high frequency transformer, the 3rd dpdt relay, the second numeral electricity
Position device, primary and the number of secondary turns ratio of high frequency transformer are 3:1, the primary coil of high frequency transformer connects hybrid circuit test and put down
The alternating message source ACS of platform output end, secondary coil interconnection on four contacts of the 3rd dpdt relay,
The knife point ground connection of 3rd dpdt relay, another knife point are connected with the low resistance end of the second digital regulation resistance, and second
The resistance increase control terminal and resistance of digital regulation resistance reduce control terminal and the user control unit of hybrid circuit test platform
CBIT is connected, and resistance centre tap end is connected with low resistance end, high resistance end and measured signal amplifier AC signal input
It is connected.
Beneficial effect:Signal amplifier automatic test circuit disclosed by the invention, applies digital regulation resistance and relay
Device, under the control of STS8105A hybrid circuits test system, the switching of test circuit is automatically performed, reduces manual intervention, is carried
High test speed, signal amplifier automated testing method disclosed by the invention can be completed to signal amplifier major parameter
Test, using STS8105A hybrid circuits test system as test platform, reduce test equipment quantity, it is multiple so as to avoid
Miscellaneous connection.Compared with prior art, the present invention has the characteristics that method is simple, versatile, simple to operate, not only reduces
The cost of signal amplifier test, improves testing efficiency, reduces test error, solves signal amplifier automation and surveys
Try problem.
Brief description of the drawings
Fig. 1 is automatic test circuit of the present invention and measured signal amplifier composition frame chart;
Fig. 2 is automatic test circuit of the present invention and measured signal amplifier connection schematic diagram;
Fig. 3 is that signal amplifier of the present invention tests device theory of constitution block diagram.
Embodiment
Technical scheme is described in further detail with reference to specific embodiment.
A kind of signal amplifier automatic test circuit as shown in Fig. 1 to Fig. 3, it includes signal amplifier 2, the letter
Number amplifier 2 is believed with phase shift regulation circuit 4, zeroing circuit 5, measuring circuit 6, half-wave trimming circuit 8 and input respectively
Number regulation circuit 9 wire connection.
Described phase shift regulation circuit 4 includes digital regulation resistance 41, the resistance centre tap end of digital regulation resistance 41 with it is low
Resistance terminal is connected, and high resistance end is connected with the contact of single-pole single-throw(SPST relay 42, and resistance increase control terminal and resistance reduce control
End processed is connected with the control unit CBIT of hybrid circuit test platform 1, the knife point and signal of single-pole single-throw(SPST relay 42
The external phase shift potentiometer end end pin number 19 of amplifier 2 is connected.
Zeroing circuit 5 includes turn knob potentiometer 51 and double-pole single-throw (D.P.S.T.) relay 52, the both ends of turn knob potentiometer 51 with it is double
52 two contacts of single-pole single-throw relay are connected, centre tap end is connected with the negative supply input of signal amplifier 2, double-pole single-throw (D.P.S.T.)
Two knife points of relay 52 are connected with two zeroing end end pin number 11 and 12 of signal amplifier 2.
Half-wave trimming circuit 8 includes half-wave fine setting digital regulation resistance 81, the first key switch 82 and the second button and opened
Close 83, half-wave fine setting digital regulation resistance 81 resistance increase control terminal and resistance reduce control terminal respectively with the first key switch
82 and second key switch 83, low resistance end and resistance centre tap end ground connection, high resistance end and the half of signal amplifier 2
Ripple fine setting end is connected.
Input signal regulation circuit 9 includes high frequency transformer 91, the 3rd dpdt relay the 92, second numeral electricity
Position device 93, primary and the number of secondary turns ratio of high frequency transformer 91 are 3:1, the primary coil of high frequency transformer 91 connects friendship
Signal source ACS output end is flowed, secondary coil interconnection is on four contacts of the 3rd dpdt relay 92, and the
One knife point of three dpdt relays 92 is grounded the low resistance end phase of another knife point and the second digital regulation resistance 93
Even, the resistance increase control terminal of the second digital regulation resistance 93 and resistance reduce control terminal and user control unit CBIT phases
Even, resistance centre tap end is connected with low resistance end, high resistance end and the AC signal input phase of measured signal amplifier 2
Even.
Measuring circuit 6 is by the second single-pole single-throw(SPST relay 62, the first dpdt relay 61, the second DPDT
Relay 63, the high-precision power QVI of STS8105A hybrid circuit test systems, A.C. voltmeter ACM, D.C. voltmeter
PVM and time measuring unit QTMU compositions, described relay are used for the switching of external test circuitry.Digital regulation resistance selects
Use DS1809.
The above described is only a preferred embodiment of the present invention, any formal limitation not is made to the present invention, though
So the present invention is disclosed above with preferred embodiment, but is not limited to the present invention, any to be familiar with this professional technology people
Member, without departing from the scope of the present invention, when the technology contents using the disclosure above make a little change or modification
For the equivalent embodiment of equivalent variations, as long as being the content without departing from technical solution of the present invention, the technical spirit according to the present invention
Any simple modification, equivalent change and modification made to above example, in the range of still falling within technical solution of the present invention.
Claims (4)
- A kind of 1. signal amplifier automatic test circuit, it is characterised in that:Including including signal amplifier(2), the signal Amplifier(2)Respectively circuit is adjusted with phase shift(4), zeroing circuit(5), measuring circuit(6), half-wave trimming circuit(8)And input Circuit for signal conditioning(9)Wire connects;Described phase shift regulation circuit(4)Including digital regulation resistance(41), digital regulation resistance (41)Resistance centre tap end be connected with low resistance end, high resistance end and single-pole single-throw(SPST relay(42)Contact be connected, electricity Resistance increase control terminal and resistance reduce control terminal and hybrid circuit test platform(1)Control unit CBIT be connected, hilted broadsword list Throw relay(42)Knife point and signal amplifier(2)External phase shift potentiometer end be connected.
- A kind of 2. signal amplifier automatic test circuit according to claim 1, it is characterised in that:Zeroing circuit(5) Including turn knob potentiometer(51)With double-pole single-throw (D.P.S.T.) relay(52), turn knob potentiometer(51)Both ends and double-pole single-throw (D.P.S.T.) relay(52) Two contacts are connected, centre tap end and signal amplifier(2)Negative supply input be connected, double-pole single-throw (D.P.S.T.) relay(52)'s Two knife points and signal amplifier(2)Two zeroing ends be connected.
- A kind of 3. signal amplifier automatic test circuit according to claim 1, it is characterised in that:Half-wave is finely tuned Circuit(8)Digital regulation resistance is finely tuned including half-wave(81), the first key switch(82)With the second key switch(83), half-wave is micro- Adjust digital regulation resistance(81)Resistance increase control terminal and resistance reduce control terminal respectively with the first key switch(82)With second Key switch(83)One end be connected, low resistance end and resistance centre tap end ground connection, high resistance end and signal amplifier(2)'s Half-wave fine setting end is connected, the first key switch(82)With the second key switch(83)The other end ground connection.
- A kind of 4. signal amplifier automatic test circuit according to claim 1, it is characterised in that:Input signal is adjusted Economize on electricity road(9)Including high frequency transformer(91), the 3rd dpdt relay(92), the second digital regulation resistance(93), high frequency change Depressor(91)Primary with number of secondary turns ratio be 3:1, high frequency transformer(91)Primary coil connect hybrid circuit test platform (1)Alternating message source ACS output end, secondary coil interconnection is in the 3rd dpdt relay(92)Four touch On point, the 3rd dpdt relay(92)A knife point ground connection, another knife point and the second digital regulation resistance(93)Low electricity Resistance end is connected, the second digital regulation resistance(93)Resistance increase control terminal and resistance reduce control terminal and hybrid circuit test platform (1)User control unit CBIT be connected, resistance centre tap end is connected with low resistance end, and high resistance end is put with measured signal Big device(2)AC signal input is connected.
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CN201710654543.9A CN107422247A (en) | 2017-08-03 | 2017-08-03 | A kind of signal amplifier automatic test circuit |
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CN201710654543.9A CN107422247A (en) | 2017-08-03 | 2017-08-03 | A kind of signal amplifier automatic test circuit |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107422246A (en) * | 2017-08-03 | 2017-12-01 | 过成康 | A kind of signal amplifier automated testing method |
CN110311832A (en) * | 2019-06-25 | 2019-10-08 | 深圳市吉祥腾达科技有限公司 | Wireless signal amplifier operation system for testing stability |
CN111589728A (en) * | 2020-06-24 | 2020-08-28 | 金动力智能科技(深圳)有限公司 | Intelligent test assembly of 5G network subassembly |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103487745A (en) * | 2013-09-30 | 2014-01-01 | 贵州航天计量测试技术研究所 | Automatic testing circuit of transforming amplifier and testing method |
CN106324473A (en) * | 2015-06-19 | 2017-01-11 | 神讯电脑(昆山)有限公司 | Signal amplifier power supply device |
CN107422246A (en) * | 2017-08-03 | 2017-12-01 | 过成康 | A kind of signal amplifier automated testing method |
-
2017
- 2017-08-03 CN CN201710654543.9A patent/CN107422247A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103487745A (en) * | 2013-09-30 | 2014-01-01 | 贵州航天计量测试技术研究所 | Automatic testing circuit of transforming amplifier and testing method |
CN106324473A (en) * | 2015-06-19 | 2017-01-11 | 神讯电脑(昆山)有限公司 | Signal amplifier power supply device |
CN107422246A (en) * | 2017-08-03 | 2017-12-01 | 过成康 | A kind of signal amplifier automated testing method |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107422246A (en) * | 2017-08-03 | 2017-12-01 | 过成康 | A kind of signal amplifier automated testing method |
CN110311832A (en) * | 2019-06-25 | 2019-10-08 | 深圳市吉祥腾达科技有限公司 | Wireless signal amplifier operation system for testing stability |
CN111589728A (en) * | 2020-06-24 | 2020-08-28 | 金动力智能科技(深圳)有限公司 | Intelligent test assembly of 5G network subassembly |
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