CN107389995B - Circuit for adjusting quality factor of series resonance power supply and testing method thereof - Google Patents

Circuit for adjusting quality factor of series resonance power supply and testing method thereof Download PDF

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CN107389995B
CN107389995B CN201710694511.1A CN201710694511A CN107389995B CN 107389995 B CN107389995 B CN 107389995B CN 201710694511 A CN201710694511 A CN 201710694511A CN 107389995 B CN107389995 B CN 107389995B
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distribution
quality factor
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voltage transformer
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CN107389995A (en
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陈玥名
张延鹏
刘国栋
李楠
魏俊红
张海鹰
王大勇
张天祥
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Huadian Electric Power Research Institute Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B70/00—Technologies for an efficient end-user side electric power management and consumption
    • Y02B70/10—Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The invention relates to a circuit for adjusting the quality factor of a series resonance power supply and a testing method thereof, wherein the circuit comprises an experimental power supply, a voltage regulator, a booster, a loop equivalent resistor, a reactor, a matching capacitor, a tested loop equivalent capacitor, a tested voltage transformer and a standard voltage transformer; the equivalent capacitance of the tested loop is connected in parallel with the two ends of the matching capacitor. The invention adopts a three-point method of adding equal capacitance value intervals to the basic capacitance to successively approximate the resonance points, respectively measures the quality factors, judges the relation between the three points and the resonance points of the series circuit according to three groups of data, then selects the next capacitance value, and successively approximates the resonance points of the series circuit until the quality factors are larger than the minimum value of the quality factors.

Description

Circuit for adjusting quality factor of series resonance power supply and testing method thereof
Technical Field
The invention relates to a circuit for adjusting the quality factor of a series resonance power supply and a testing method thereof, in particular to a circuit for adjusting the quality factor of the series resonance power supply and a testing method thereof, which are used for field verification of a voltage transformer.
Background
The voltage transformer is a working metering device for the national requirement forced verification, the field verification work of the voltage transformer is an important link of the voltage magnitude transmission work, and the voltage transformer metering device is an important means for ensuring the accuracy of the field used voltage transformer metering. In-situ verification tests of voltage transformers require measuring errors of the voltage transformers at different voltage measurement points under the condition of equipment power failure, and therefore, voltage-adjustable test power supply equipment is required. A series resonant power supply is generally used as a test power supply for field detection of a voltage transformer. Compared with the traditional test transformer, the series resonance power supply greatly reduces the weight and the volume of equipment under the condition of providing the same voltage, and has lower capacity requirement on a field test power supply box. The characteristics enable the series resonance equipment to be widely applied to power tests.
Because the range of the capacitance value change of the tested voltage transformer loop in different sites is larger, capacitors and reactors with certain values are required to be matched when the voltage transformers in different sites are tested, so that the circuit reaches an approximate resonance state. When the series resonant circuit resonates, the ratio of the voltage of the capacitor (or the reactor) to the input power supply voltage is referred to as the quality factor of the series resonant circuit. The higher the quality factor, the higher the output voltage can be obtained on the capacitor (or reactor) with the same input voltage. In order to obtain a higher output voltage, the quality factor of the series resonant circuit is generally adjusted by adjusting the capacitance value of a capacitor (or adjusting the reactance value of a reactor) when the voltage transformer is verified in the field. Typically, the quality factor is adjusted heuristically until the quality factor meets the requirements, the adjustment process is chapter-free, the adjustment process is complex, and a higher quality factor is not readily available.
Disclosure of Invention
The invention aims to overcome the defects in the prior art and provide a circuit for adjusting the quality factor of a series resonance power supply and a testing method thereof. The invention uses a group of capacitors, reactors and tested voltage transformer loops which are capacitive to form a series resonance circuit, and adjusts the quality factor of the resonance circuit by adjusting the capacitance value of the capacitors so that the quality factor of the series resonance equipment meets the requirements of the voltage transformer field verification test.
The invention solves the problems by adopting the following technical scheme: a circuit for adjusting the quality factor of a series resonance power supply is characterized in that: the device comprises an experimental power supply, a voltage regulator, a booster, a loop equivalent resistor, a reactor, a matching capacitor, a tested loop equivalent capacitor, a tested voltage transformer and a standard voltage transformer, wherein the experimental power supply is connected with the input end of the voltage regulator; the equivalent capacitance of the tested loop is connected in parallel with the two ends of the matching capacitor; the tested voltage transformer is connected in parallel with two ends of the matching capacitor, and the tested voltage transformer is connected in parallel with two ends of the equivalent capacitor of the tested loop; the standard voltage transformer is connected in parallel at two ends of the matching capacitor, the standard voltage transformer is connected in parallel at two ends of the tested voltage transformer, and the standard voltage transformer is connected in parallel at two ends of the equivalent capacitor of the tested loop.
The high-voltage end of the matching capacitor, the high-voltage end of the equivalent capacitor of the tested loop, the high-voltage end of the tested voltage transformer and the high-voltage end of the standard voltage transformer are all connected with the reactor.
The low-voltage end of the matching capacitor, the low-voltage end of the equivalent capacitor of the tested loop, the low-voltage end of the tested voltage transformer and the low-voltage end of the standard voltage transformer are all connected with the primary low end of the booster.
A test method for adjusting a quality factor circuit of a series resonance power supply is characterized by comprising the following steps of:
r is the resistance value of the equivalent resistance of the loop, L is the reactance value of the reactor, C X Is the capacitance value of the matching capacitor，C 0 Is the capacitance value of the equivalent capacitance of the tested loop,for the effective value of the voltage across the equivalent capacitance of the loop under test, < >>The voltage between the primary low end of the booster and the high-voltage output end of the booster is omega, the angular frequency of the experimental power supply is omega, and j is an imaginary unit;
and->The ratio is the quality factor Q:>then->When C X When=0,>the figure of merit is constant at this time; when C x = + infinity is provided in the time-course of which the first and second contact surfaces, q=0; when 1-omega 2 L(C 0 +C x ) When=0,>the quality factor is at maximum, the circuit resonates, and the resonance curve Q-C is reached X Is a resonance point of (2);
Q min is the minimum value of the quality factor as long as the quality factor is greater than Q min The requirements of the field verification test of the voltage transformer can be met; in C 0 Selecting three capacitance values C as basic capacitance values at equal capacitance value intervals 1 ＝C 0 、C 2 ＝C 0 +C、C 3 ＝C 0 +2C, measure C respectively 1 、C 2 And C 3 Corresponding quality factor Q 1 、Q 2 And Q 3 Then (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points on resonance curve Q-C X The above distribution can be divided into two types of distribution: the first type of distribution is (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are distributed on both sides of the resonance point, the second type of distribution being (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three points are all distributed on the same side of the resonance point.
The capacitance value meeting the quality factor requirement of the field verification voltage transformer can be quickly found by adopting a three-point method of adding basic capacitance values and equal capacitance value intervals to successively approximate resonance points, so that the quality factor of the circuit is larger than the minimum value of the quality factor, and the verification circuit of the voltage transformer is enabled to resonate (or approximately resonate).
In the first type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three-point distribution on both sides of the resonance point includes two cases:
first case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) One of the three points is at resonance curve Q-C X Two other points of the three points are in the falling stage of the curve;
second case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Two of the three points are on the resonance curve Q-C X The other of the three points is at the resonance curve Q-C X A descent phase of (2);
the first type of distribution processing method is as follows:
at this time, take (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The average value of the capacitance values of the matching capacitors corresponding to two points with larger quality factors among the three points is used as the capacitance value of the matching capacitor of the new group,and measuring the corresponding quality factors, reserving three points with the maximum quality factors in the four points, and repeating the step until the quality factors meet the requirements if the first two conditions still appear.
In the second type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all distributed on one side of the resonance point and comprise two cases:
first case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X A rising stage of (2);
second case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X A descent phase of (2);
when the first condition exists in the second type of distribution, continuously increasing the capacitance value of the matching capacitor at equal intervals, measuring the quality factor corresponding to the capacitance value of the increased matching capacitor, and simultaneously reserving three points with the maximum quality factor, if the first type of distribution exists, finding the capacitance value of the matching capacitor with the quality factor meeting the requirement according to the processing method of the first type of distribution; if the second type of distribution occurs, continuing to increase the capacitance value at equal intervals until the first type of distribution occurs, and then according to the processing method of the first type of distribution, until a quality factor meeting the requirement is found;
when the second condition exists in the second type of distribution, continuously reducing the capacitance value of the matching capacitor at equal intervals, measuring the quality factor corresponding to the capacitance value of the reduced matching capacitor, and simultaneously reserving three points with the maximum quality factor, if the first type of distribution exists, finding the capacitance value of the matching capacitor with the quality factor meeting the requirement according to the processing method of the first type of distribution; if the second type of distribution occurs, continuing to reduce the capacitance value at equal intervals until the first type of distribution occurs, and then according to the processing method of the first type of distribution until the quality factor meeting the requirement is found.
Compared with the prior art, the invention greatly improves the quality factor adjusting efficiency of the series resonance power supply, and is particularly suitable for the transformer station sites with unknown primary loop to ground capacitance of the tested voltage transformer, such as the electromagnetic voltage transformer used in a GIS transformer station and the field verification of the electronic voltage transformer used in a AIS, GIS, PASS transformer station. The quality factor of the series resonance power supply meets the requirement that the voltage transformer is subjected to field verification, and often the quality factor adjustment process occupies most of the time of the field verification test of the voltage transformer. The test method designed by the invention can quickly adjust the quality factor to be larger than the minimum value of the quality factor, so that the circuit reaches a resonance state (or approximate resonance state), thereby greatly improving the working efficiency of the field verification test of the voltage transformer.
Drawings
Fig. 1 is a schematic diagram of a circuit for adjusting the quality factor of a series resonant power supply according to an embodiment of the present invention.
FIG. 2 is a resonance curve Q-C of an embodiment of the present invention X A drawing.
Fig. 3 is a flowchart of a test method for adjusting a quality factor circuit of a series resonant power supply according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail by way of examples with reference to the accompanying drawings, which are illustrative of the present invention and not limited to the following examples.
Examples
See fig. 1-3.
The embodiment provides a circuit for adjusting the quality factor of a series resonance power supply, which comprises the following installation methods: the experimental power supply 1 is connected into the input end of the voltage regulator 2, the output end of the voltage regulator 2 is connected with the low-voltage input end of the booster 3, the primary low-voltage end of the booster 3 is grounded, the high-voltage output end of the booster 3 is connected with the reactor 5 in series, the reactor 5 is connected with the matching capacitor 6 in parallel with the standard voltage transformer 9 and the tested voltage transformer 7, namely, the low-voltage end of the matching capacitor 6, the low-voltage end of the standard voltage transformer 9 and the low-voltage end of the tested voltage transformer 7 are grounded, and the high-voltage end of the matching capacitor 6, the high-voltage end of the standard voltage transformer 9 and the high-voltage end of the tested voltage transformer 7 are connected together.
The circuit for adjusting the quality factor of the series resonance power supply, which is obtained through the installation, comprises an experimental power supply 1, a voltage regulator 2, a booster 3, a loop equivalent resistor 4, a reactor 5, a matching capacitor 6, a tested loop equivalent capacitor 8, a tested voltage transformer 7 and a standard voltage transformer 9.
The loop equivalent resistance 4 is the total equivalent resistance corresponding to the reactor 5, the matching capacitor 6, the tested voltage transformer 7 and the standard voltage transformer 9 in the quality factor circuit of the adjusting series resonance power supply. The equivalent capacitance 8 of the tested loop is the equivalent capacitance of the loop where the tested voltage transformer 7 is located.
The experimental power supply 1 is connected with the input end of the voltage regulator 2, the output end of the voltage regulator 2 is connected with the low-voltage input end of the booster 3, the high-voltage output end of the booster 3 is connected with the loop equivalent resistor 4, the loop equivalent resistor 4 is connected with the reactor 5 in series, the reactor 5 is connected with the matching capacitor 6 in series, the matching capacitor 6 is connected with the primary low end of the booster 3, and the primary low end of the booster 3 is grounded.
The equivalent capacitance 8 of the tested loop is connected in parallel with the two ends of the matching capacitor 6.
The tested voltage transformer 7 is connected in parallel with two ends of the matching capacitor 6, and the tested voltage transformer 7 is connected in parallel with two ends of the tested loop equivalent capacitor 8.
The standard voltage transformer 9 is connected in parallel with two ends of the matching capacitor 6, the standard voltage transformer 9 is connected in parallel with two ends of the tested voltage transformer 7, and the standard voltage transformer 9 is connected in parallel with two ends of the equivalent capacitor 8 of the tested loop.
Preferably, the high voltage end of the matching capacitor 6 is connected with the reactor 5, the high voltage end of the equivalent capacitor 8 of the tested loop is connected with the reactor 5, the high voltage end of the tested voltage transformer 7 is connected with the reactor 5, and the high voltage end of the standard voltage transformer 9 is connected with the reactor 5. The high voltage end of the matching capacitor 6, the high voltage end of the tested loop equivalent capacitor 8, the high voltage end of the tested voltage transformer 7 and the high voltage end of the standard voltage transformer 9 are connected with each other first and then connected with the reactor 5 in series.
Preferably, the low voltage end of the matching capacitor 6 is connected with the primary low end of the booster 3, the low voltage end of the equivalent capacitor 8 of the tested loop is connected with the primary low end of the booster 3, the low voltage end of the tested voltage transformer 7 is connected with the primary low end of the booster 3, and the low voltage end of the standard voltage transformer 9 is connected with the primary low end of the booster 3. The low-voltage end of the matching capacitor 6, the low-voltage end of the tested loop equivalent capacitor 8, the low-voltage end of the tested voltage transformer 7 and the low-voltage end of the standard voltage transformer 9 are connected firstly and then connected with the primary low-voltage end of the booster 3.
The embodiment also provides a test method for adjusting the quality factor circuit of the series resonance power supply.
R is the resistance value of the loop equivalent resistor 4, L is the reactance value of the reactor 5, C X Is the capacitance value of the matching capacitor 6, C 0 Is the capacitance value of the equivalent capacitance 8 of the tested loop,for the effective value of the voltage across the equivalent capacitance 8 of the loop under test, +.>ω is the angular frequency of the experimental power supply 1 and j is the imaginary unit, which is the voltage between the primary low side of the booster 3 and the high voltage output side of the booster 3.
And->The ratio is the quality factor Q:>
combining the two formulas
When C X When the value of the sum is =0,the figure of merit is constant at this time; when C x = + infinity is provided in the time-course of which the first and second contact surfaces, q=0; when 1-omega 2 L(C 0 +C x ) When=0,>the quality factor is at maximum, the circuit resonates, and the resonance curve Q-C is reached X Is a resonance point of (c).
Q min Is the minimum value of the quality factor as long as the quality factor Q is greater than Q min The requirements of the field verification test of the voltage transformer can be met.
In C 0 Selecting three capacitance values C at equal capacitance value C intervals as the basic capacitance value 1 ＝C 0 、C 2 ＝C 0 +C and C 3 ＝C 0 +2c. Measurement C 1 Corresponding quality factor Q 1 、C 2 Corresponding quality factor Q 2 ，C 3 Corresponding quality factor Q 3 . Obtain (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three-point coordinates.
Then (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points on resonance curve Q-C X The above distribution can be divided into two types of distribution: the first type of distribution is (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are distributed on both sides of the resonance point, the second type of distribution being (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three points are all distributed on the same side of the resonance point.
In the first type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three-point distribution on both sides of the resonance point includes two cases:
first case of the first type of distribution: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) One of the three points is at resonance curve Q-C X Two other points of the three points are in the falling stage of the curve;
second case of the first type of distribution: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Two of the three points are on the resonance curve Q-C X The other of the three points is at the resonance curve Q-C X Is a falling stage of (2).
The first type of distribution processing method is as follows:
at this time, take (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The average value of the capacitance values of the matching capacitors 6 corresponding to two points with a larger quality factor among the three points is used as the capacitance value C of the matching capacitor 6 of the new group 4 For example, if Q 1 ＜Q 2 ＜Q 3 C is then 4 ＝(C 2 +C 3 )/2。
Measuring C thereof 4 Corresponding quality factor Q 4 Obtain (C) 4 ，Q 4 ) And reserve (C) 1 ，Q 1 )、(C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) Three points with the largest quality factor among the four points. For example, if Q 1 ＜Q 2 ＜Q 3 ＜Q 4 Then reserve (C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) Three points.
If two cases of the first type still occur, e.g. (C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) The three points are still distributed on both sides of the resonance point, and (C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) The average value of the capacitance values of the matching capacitors 6 corresponding to two points with a larger quality factor among the three points is used as the capacitance value C of the matching capacitor 6 of the new group 5 . For example, if Q 2 ＜Q 3 ＜Q 4 C is then 5 ＝(C 3 +C 4 )/2. Repeating the steps until the quality factor meets the requirement.
In the second type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The distribution of the three points on the side of the resonance point includes two cases.
First case of second-class distribution: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X Is a rising stage of (a).
In the first case of the second type of distribution, the capacitance of the matching capacitor 6 is continuously increased at equal intervals to obtain C 4 ，C 4 ＝C 0 +3C, C is measured 4 Corresponding quality factor Q 4 Obtaining a dot (C) 4 ，Q 4 ). Reservation (C) 1 ，Q 1 )、(C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) Three points of maximum quality factor. For example, if Q 1 ＜Q 2 ＜Q 3 ＜Q 4 Then reserve (C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 )。
If (C) 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) For the first type of distribution, the capacitance value of the matching capacitor 6 with the quality factor meeting the requirement is found according to the processing method of the first type of distribution. If the second type of distribution occurs, the capacitance value is continuously increased at equal intervals until the first type of distribution occurs, and then the processing method of the first type of distribution is used until the quality factor meeting the requirement is found.
Second case of second-class distribution: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X Is a falling stage of (2).
In the second case of the second type of distribution, the capacitance of the matching capacitor 6 is continuously reduced at equal intervals to obtain C 4 ，C 4 ＝C 0 -C, measured C 4 Corresponding quality factor Q 4 Obtaining a dot (C) 4 ，Q 4 ). Reservation (C) 1 ，Q 1 )、(C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) Three points of maximum quality factor. For example, if Q 1 ＜Q 2 ＜Q 3 ＜Q 4 Then reserve (C 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 )。
If (C) 2 ，Q 2 )、(C 3 ，Q 3 ) And (C) 4 ，Q 4 ) For the first type of distribution, the capacitance value of the matching capacitor 6 with the quality factor meeting the requirement is found according to the processing method of the first type of distribution. If the second type of distribution occurs, continuing to reduce the capacitance value at equal intervals until the first type of distribution occurs, and then according to the processing method of the first type of distribution until the quality factor meeting the requirement is found.
The test method for adjusting the quality factor circuit of the series resonant power supply of the embodiment adopts a three-point method of adding a basic capacitor and an equal capacitance value interval to successively approximate a resonance point, so that the quality factor is larger than the minimum value of the quality factor, and the series circuit is made to resonate (or approximately resonate). And sequentially approximating the resonance points by a three-point method of adding equal capacitance value intervals to the basic capacitance, respectively measuring the quality factors, judging the relation between the three points and the resonance points of the series circuit according to three groups of data, and then selecting the next capacitance value, and gradually approximating the resonance points of the series circuit until the quality factors are larger than the minimum value of the quality factors. At this time, the voltage transformer verification circuit resonates (or approximately resonates), and then the field verification test of the voltage transformer can be performed.
In addition, it should be noted that the specific embodiments described in the present specification may vary from part to part, from name to name, etc., and the above description in the present specification is merely illustrative of the structure of the present invention. All equivalent or simple changes of the structure, characteristics and principle according to the inventive concept are included in the protection scope of the present patent. Those skilled in the art may make various modifications or additions to the described embodiments or substitutions in a similar manner without departing from the scope of the invention as defined in the accompanying claims.

Claims (1)

1. The test method is applied to the series resonance power supply quality factor adjusting circuit, and comprises an experimental power supply, a voltage regulator, a booster, a loop equivalent resistor, a reactor, a matching capacitor, a tested loop equivalent capacitor, a tested voltage transformer and a standard voltage transformer, wherein the experimental power supply is connected with the input end of the voltage regulator, the output end of the voltage regulator is connected with the low-voltage input end of the booster, the high-voltage output end of the booster is connected with the loop equivalent resistor, the loop equivalent resistor is connected with the reactor in series, the reactor is connected with the matching capacitor in series, the matching capacitor is connected with the primary low end of the booster, and the primary low end of the booster is grounded; the equivalent capacitance of the tested loop is connected in parallel with the two ends of the matching capacitor; the tested voltage transformer is connected in parallel with two ends of the matching capacitor, and the tested voltage transformer is connected in parallel with two ends of the equivalent capacitor of the tested loop; the standard voltage transformer is connected in parallel at two ends of the matching capacitor, the standard voltage transformer is connected in parallel at two ends of the tested voltage transformer, the standard voltage transformer is connected in parallel at two ends of the equivalent capacitor of the tested loop, and the standard voltage transformer is characterized in that:
r is the resistance value of the equivalent resistance of the loop, L is the reactance value of the reactor, C X Is the capacitance value of the matching capacitor, C 0 Is the capacitance value of the equivalent capacitance of the tested loop,for the effective value of the voltage across the equivalent capacitance of the loop under test, < >>The voltage between the primary low end of the booster and the high-voltage output end of the booster is omega, the angular frequency of the experimental power supply is omega, and j is an imaginary unit;
and->The ratio is the quality factor Q:>then->When C X When the value of the sum is =0,the figure of merit is constant at this time; when C x = + infinity is provided in the time-course of which the first and second contact surfaces, q=0; when 1-omega 2 L(C 0 +C x ) When=0,>the quality factor is at maximum, the circuit resonates, and the resonance curve Q-C is reached X Is a resonance point of (2);
Q min is the minimum value of the quality factor as long as the quality factor is greater than Q min The requirements of the field verification test of the voltage transformer can be met;
in C 0 Selecting three capacitance values C as basic capacitance values at equal capacitance value intervals 1 ＝C 0 、C 2 ＝C 0 +C、C 3 ＝C 0 +2C, measure C respectively 1 、C 2 And C 3 Corresponding quality factor Q 1 、Q 2 And Q 3 Then (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points on resonance curve Q-C X Distribution conditions onConditions can be divided into two types of distribution: the first type of distribution is (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are distributed on both sides of the resonance point, the second type of distribution being (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three points are all distributed on the same side of the resonance point;
in the first type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) The three-point distribution on both sides of the resonance point includes two cases:
first case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) One of the three points is at resonance curve Q-C X Two other points of the three points are in the falling stage of the curve;
second case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Two of the three points are on the resonance curve Q-C X The other of the three points is at the resonance curve Q-C X A descent phase of (2);
the first type of distribution processing method is as follows:
at this time, take (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Taking the average value of capacitance values of the matched capacitors corresponding to two points with larger quality factors of the three points as the capacitance value of a new group of matched capacitors, measuring the corresponding quality factors, reserving the three points with the largest quality factors of the four points, and repeating the step until the quality factors meet the requirements if the two conditions of the first class still exist;
in the second type of distribution, (C 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all distributed on one side of the resonance point and comprise two cases:
first case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X Rise phase of (2)The method comprises the steps of carrying out a first treatment on the surface of the Second case: (C) 1 ，Q 1 )、(C 2 ，Q 2 ) And (C) 3 ，Q 3 ) Three points are all in the resonance curve Q-C X A descent phase of (2);
when the first condition exists in the second type of distribution, continuously increasing the capacitance value of the matching capacitor at equal intervals, measuring the quality factor corresponding to the capacitance value of the increased matching capacitor, and simultaneously reserving three points with the maximum quality factor, if the first type of distribution exists, finding the capacitance value of the matching capacitor with the quality factor meeting the requirement according to the processing method of the first type of distribution; if the second type of distribution occurs, continuing to increase the capacitance value at equal intervals until the first type of distribution occurs, and then according to the processing method of the first type of distribution, until a quality factor meeting the requirement is found;
when the second condition exists in the second type of distribution, continuously reducing the capacitance value of the matching capacitor at equal intervals, measuring the quality factor corresponding to the capacitance value of the reduced matching capacitor, and simultaneously reserving three points with the maximum quality factor, if the first type of distribution exists, finding the capacitance value of the matching capacitor with the quality factor meeting the requirement according to the processing method of the first type of distribution; if the second type of distribution occurs, continuing to reduce the capacitance value at equal intervals until the first type of distribution occurs, and then according to the processing method of the first type of distribution until the quality factor meeting the requirement is found.
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