CN107328865B

CN107328865B - Retaining screw probe

Info

Publication number: CN107328865B
Application number: CN201710748618.XA
Authority: CN
Inventors: 周南岐
Original assignee: Changzhou Changchao Electronic Research Institute Co ltd
Current assignee: Changzhou Changchao Electronic Research Institute Co ltd
Priority date: 2017-08-28
Filing date: 2017-08-28
Publication date: 2023-03-31
Anticipated expiration: 2037-08-28
Also published as: CN107328865A

Abstract

The invention relates to the technical field of ultrasonic probes, in particular to a backstop screw probe.

Description

Retaining screw probe

Technical Field

Background

At present, ultrasonic flaw detection is often used as a means for detecting the inherent quality of steel plates for nondestructive testing at home and abroad. The ultrasonic transducer is a device for realizing mutual conversion of electric energy and sound energy, and is also a key component for realizing ultrasonic detection. As shown in fig. 1, the retaining screw 1 is made of steel, and the end of the retaining screw 1 has a concave arc surface a, so that the bottom surface of the ultrasonic probe in the prior art cannot be matched with the concave arc surface a, and the end cannot be subjected to flaw detection.

Disclosure of Invention

The technical problem to be solved by the invention is as follows: in order to solve the defects in the prior art, the invention provides a backstop screw probe.

The technical scheme adopted by the invention for solving the technical problems is as follows: the utility model provides a stopping screw probe, the top of stopping screw has the blind hole, and the bottom in the blind hole is the partial sphere of indent, and the inner wall of blind hole is regular hexagon, and the periphery of blind hole upwards extends has annular retaining ring, has seted up first recess and second recess on the annular retaining ring, and first recess and second recess are 180 central symmetry, and stopping screw still includes the connecting rod, and the connecting rod erects in first recess and second recess, first recess is worn out to the one end of connecting rod, and the second recess is worn out to the other end of connecting rod, the probe includes the probe body, the bottom of probe body is partial sphere, and bottom and the bottom in the blind hole of probe body cooperate, and the periphery of probe body is circular, circular inner tangent circle that is the inner wall of blind hole is regular hexagon, and the bottom of probe body is seted up flutedly, and the width of connecting rod cooperatees, and the degree of depth of recess more than or equal to the maximum distance of connecting rod up end to the bottom in the blind hole, and the middle part to the lower part of the both sides of the recess of probe body are first voussoir and second voussoir, and the upper surface that the upper surface of first voussoir and second recess are inclined plane from the probe body, and the upper surface of the wafer that the recess was provided with the piezoelectric wafer that the piezoelectric wedge piece was provided with the upper surface gradually, and the piezoelectric wafer of the probe body that the probe body was provided with the upper surface of the piezoelectric wedge. According to the retaining screw probe, the shape of the bottom of the probe body is matched with the shape of the top of the retaining screw, the probe body can be carried on the connecting rod, the bottom of the probe body is just attached to the bottom in the blind hole, the detection data is accurate, and the operation is convenient and rapid.

The angle alpha between the first piezoelectric wafer and the second piezoelectric wafer is 120 degrees, and the included angle beta formed by any two 180-degree symmetrical tangent lines on the part of the spherical surface where the bottom of the probe body is located is 120 degrees.

The first piezoelectric wafer and the second piezoelectric wafer are made of 1-3 type piezoelectric composite materials. The 1-3 type piezoelectric composite material has high sensitivity and strong defect finding capability.

The first wedge block and the second wedge block are made of organic glass.

The anti-back screw probe has the advantages that the bottom of the probe body is matched with the top of the anti-back screw in shape, the probe body can be carried on the connecting rod, the bottom of the probe body is just attached to the bottom in the blind hole, detection data are accurate, and operation is convenient and rapid.

Drawings

The invention is further illustrated by the following examples in conjunction with the drawings.

FIG. 1 is a schematic view of the anti-backup screw with the connecting rod removed.

Fig. 2 is a schematic structural view of the backstop screw.

FIG. 3 is a top plan view of the backstop screw.

Fig. 4 isbase:Sub>A sectional viewbase:Sub>A-base:Sub>A of fig. 3.

FIG. 5 is a schematic view of the internal structure of the backstop screw probe of the present invention.

FIG. 6 is a bottom view of the backstop screw probe of the present invention.

FIG. 7 is a schematic diagram of the detection signals of the anti-backup screw probe of the present invention.

In the figure: 1. the probe comprises a retaining screw 11, a blind hole 12, a first groove 13, a second groove 2, a connecting rod 3, a probe body 31, a groove 32, a first wedge 33, a second wedge 4, a first piezoelectric wafer 5 and a second piezoelectric wafer.

Detailed Description

The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams each illustrating the basic structure of the present invention only in a schematic manner, and thus show only the constitution related to the present invention.

As shown in fig. 1-6, which is a preferred embodiment of the present invention, a backstop screw probe is provided, wherein a blind hole 11 is formed at the top end of a backstop screw 1, the bottom inside the blind hole 11 is an inward concave partial spherical surface, the inner wall of the blind hole 11 is a regular hexagon, an annular retaining ring extends upwards from the periphery of the blind hole 11, a first groove 12 and a second groove 13 are formed in the annular retaining ring, the first groove 12 and the second groove 13 are in 180 ° central symmetry, the backstop screw 1 further comprises a connecting rod 2, the connecting rod 2 is erected inside the first groove 12 and the second groove 13, one end of the connecting rod 2 penetrates through the first groove 12, the other end of the connecting rod 2 penetrates through the second groove 13, the probe comprises a probe body 3, the bottom of the probe body 3 is a partial spherical surface, the bottom of the probe body 3 is matched with the bottom inside the blind hole 11, the periphery of the probe body 3 is circular, the circular shape is an inward tangent circle of the inner wall of the blind hole 11 is a regular hexagon, make probe body 3 can be at blind hole 11 internal rotation like this, can detect comprehensively, recess 31 has been seted up to probe body 3's bottom, the width of recess 31 and the width cooperation of connecting rod 2, the degree of depth more than or equal to connecting rod 2 upper end face to the maximum distance of the bottom in the blind hole 11 of recess 31, the middle part to the lower part of the both sides of probe body 3's recess 31 is first voussoir 32 and second voussoir 33, the upper surface of first voussoir 32 and second voussoir 33 is the inclined plane, the inclined plane is from being close to recess 31 to keeping away from recess 31 gradually tilt up, the upper surface of first voussoir 32 is provided with first piezoelectric wafer 4, the upper surface of second voussoir 33 is provided with second piezoelectric wafer 5, the upper portion of the both sides of recess 31 of probe body 3 and the bottom of recess 31 of probe body 3 to the upper end of probe body 3 are sound absorbing material.

The angle alpha between the first piezoelectric wafer 4 and the second piezoelectric wafer 5 is 120 degrees, and the included angle beta formed by any two 180-degree symmetrical tangent lines on the part of the spherical surface where the bottom of the probe body 3 is located is 120 degrees.

The first piezoelectric wafer 4 and the second piezoelectric wafer 5 adopt 1-3 type piezoelectric composite materials.

Organic glass is used for the first wedge 32 and the second wedge 33.

Fig. 7 is a schematic diagram of detection signals of the anti-back screw probe of the present invention, when the first piezoelectric chip 4 and the second piezoelectric chip 5 adopt the structure of the present invention, the detection signals are diverged towards two sides, but due to the partial spherical design of the bottom of the probe, the detection signals of the first piezoelectric chip 4 and the second piezoelectric chip 5 can be refracted and then converged towards the middle. In addition, because the probe itself is small in size, the distance between the first piezoelectric wafer 4 and the second piezoelectric wafer 5 to the bottom of the probe is only a few millimeters (no more than 5mm, generally 4 mm), because the distance is small, the distance between the first piezoelectric wafer 4 and the second piezoelectric wafer 5 cannot be set too low, but if the distance is high, detection signals are scattered to two sides, and the incidence to the arc surface (part of spherical surface) at the bottom of the probe is very little, or almost no, so that the processing difficulty is very high. The backstop screw is usually used in water environment, the probe needs to be operated under water, therefore, stainless steel material is basically adopted, the material has influence on the propagation of detection signals, and therefore, the height and the angle of the first piezoelectric wafer 4 and the second piezoelectric wafer 5 need to be researched to obtain a proper value.

The bottom shape of probe body 3 is identical with the shape at stopping screw top, and probe body 3 can carry on connecting rod 2, and just in time the bottom of probe body 3 laminates with the bottom in the blind hole 11 mutually, and it is accurate to survey data, and convenient operation is swift.

In light of the foregoing description of the preferred embodiment of the present invention, many modifications and variations will be apparent to those skilled in the art without departing from the spirit and scope of the invention. The technical scope of the present invention is not limited to the content of the specification, and must be determined according to the scope of the claims.

Claims

1. A backstop screw probe which is characterized in that: the top of stopping screw (1) has blind hole (11), the bottom in blind hole (11) is the partial sphere of indent, the inner wall of blind hole (11) is regular hexagon, the periphery of blind hole (11) upwards extends and has annular retaining ring, first recess (12) and second recess (13) have been seted up on the annular retaining ring, first recess (12) and second recess (13) are 180 central symmetry, stopping screw (1) still includes connecting rod (2), connecting rod (2) erect in first recess (12) and second recess (13), first recess (12) are worn out to the one end of connecting rod (2), second recess (13) are worn out to the other end of connecting rod (2), the probe includes probe body (3), the bottom of probe body (3) is partial sphere, the bottom in probe body (3) and the bottom in blind hole (11) cooperate, the periphery of probe body (3) is circular, circular is the inner wall of blind hole (11) and is the inscribed circle of regular hexagon probe body, the bottom of probe body (3) is seted up and the bottom of blind hole (3) and the maximum recess (31) and the width of connecting rod (31) and the maximum recess (31) are equal to the width of connecting rod (31) and the maximum recess (31) and the connecting rod (31) and the maximum recess (31) of the depth of the connecting rod (31) are equal to the wedge block (31) and the maximum recess (31) of the wedge block (31) The upper surfaces of the first wedge block (32) and the second wedge block (33) are inclined surfaces, the inclined surfaces gradually incline upwards from the position close to the groove (31) to the position far away from the groove (31), a first piezoelectric wafer (4) is arranged on the upper surface of the first wedge block (32), a second piezoelectric wafer (5) is arranged on the upper surface of the second wedge block (33), and sound absorption materials are respectively arranged on the upper parts of the two sides of the groove (31) of the probe body (3) and the bottom of the groove (31) of the probe body (3) to the upper end of the probe body (3); the angle alpha between the first piezoelectric wafer (4) and the second piezoelectric wafer (5) is 120 degrees, the included angle beta formed by any two 180-degree symmetrical tangent lines on the partial spherical surface where the bottom of the probe body (3) is located is 120 degrees, and the distance between the first piezoelectric wafer (4) and the second piezoelectric wafer (5) and the bottom of the probe body (3) is not more than 5mm.

2. The backstop screw probe of claim 1 wherein: the first piezoelectric wafer (4) and the second piezoelectric wafer (5) are made of 1-3 type piezoelectric composite materials.

3. The backstop screw probe of claim 1 wherein: the first wedge block (32) and the second wedge block (33) are made of organic glass.