CN107294654B - Frame header detection method based on LTE comprehensive tester and LTE comprehensive tester - Google Patents
Frame header detection method based on LTE comprehensive tester and LTE comprehensive tester Download PDFInfo
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- CN107294654B CN107294654B CN201610229192.2A CN201610229192A CN107294654B CN 107294654 B CN107294654 B CN 107294654B CN 201610229192 A CN201610229192 A CN 201610229192A CN 107294654 B CN107294654 B CN 107294654B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/004—Arrangements for detecting or preventing errors in the information received by using forward error control
- H04L1/0056—Systems characterized by the type of code used
- H04L1/0057—Block codes
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/004—Arrangements for detecting or preventing errors in the information received by using forward error control
- H04L1/0045—Arrangements at the receiver end
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L27/00—Modulated-carrier systems
- H04L27/26—Systems using multi-frequency codes
- H04L27/2601—Multicarrier modulation systems
- H04L27/2647—Arrangements specific to the receiver only
- H04L27/2655—Synchronisation arrangements
- H04L27/2668—Details of algorithms
- H04L27/2669—Details of algorithms characterised by the domain of operation
- H04L27/2671—Time domain
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L27/00—Modulated-carrier systems
- H04L27/32—Carrier systems characterised by combinations of two or more of the types covered by groups H04L27/02, H04L27/10, H04L27/18 or H04L27/26
- H04L27/34—Amplitude- and phase-modulated carrier systems, e.g. quadrature-amplitude modulated carrier systems
- H04L27/38—Demodulator circuits; Receiver circuits
- H04L27/3845—Demodulator circuits; Receiver circuits using non - coherent demodulation, i.e. not using a phase synchronous carrier
- H04L27/3854—Demodulator circuits; Receiver circuits using non - coherent demodulation, i.e. not using a phase synchronous carrier using a non - coherent carrier, including systems with baseband correction for phase or frequency offset
Abstract
The embodiment of the invention provides a frame header detection method based on an LTE integrated tester and the LTE integrated tester, wherein the method comprises the following steps: the LTE comprehensive tester receives LTE uplink data sent by a terminal, wherein the LTE uplink data comprises a plurality of time domain signals, and the time domain signals comprise a plurality of sampling points; acquiring sampling points with a preset threshold quantity, and calculating a characteristic value of each sampling point; and determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum characteristic value. The embodiment of the invention can not be influenced by data frequency offset, and can obtain more accurate frame header position compared with a mode of detecting the frame header position by a power threshold.
Description
Technical Field
The invention relates to the technical field of terminal testing, in particular to a frame header detection method based on an LTE comprehensive tester and the LTE comprehensive tester.
Background
With the rapid development of mobile communication systems, terminals supporting multiple systems have also been rapidly developed, and currently, terminal manufacturers have developed related products supporting multiple systems, such as GSM, WCDMA, TD-SCDMA, LTE, and the like. Before the terminal products are networked, consistency tests need to be carried out on the terminal products, wherein radio frequency consistency tests are the most basic tests, and a large number of test cases exist.
The radio frequency conformance tests for the terminals of different standards are generally integrated test equipment, which is called an integrated tester. At present, the integrated tester product needs a frame of complete data to obtain a correct measurement result under the LTE rapid frequency offset calibration and rapid non-signaling measurement items, and the terminal is in a state of continuously sending data at the moment. Therefore, it is necessary to find the starting position of a frame of data, i.e. the frame header, and the frame header position is determined before obtaining the complete data, so as to obtain the correct measurement result. However, in the non-signaling mode, it becomes very important how to accurately determine the frame header position because there is no uplink synchronization process.
The existing schemes for detecting the data frame header can be two as follows:
(1) the method comprises the steps that the position of a data frame head is judged through a power threshold, the scheme is simple to realize, a receiving end firstly obtains a known power threshold value, then real-time power calculation is carried out on received data, and when the power values of continuous N points exceed the preset threshold, the first point exceeding the power threshold is considered as the position of the frame head of the data.
(2) The position of the frame head is judged through the time domain correlation peak position, the scheme is further optimized for the scheme 1, on the basis of the scheme 1, the pilot frequency sequence of the received data and a group of local pilot frequency sequences are used for carrying out correlation calculation in a frequency domain, then the correlation calculation is converted into a time domain through inverse Fourier transform, the peak position is found, and the data of the scheme 1 is adjusted by taking the peak position as reference.
The two schemes can well find the frame header position of data when processing standard signals, but signals sent by a terminal in the actual production process are not regular signals, and large errors can be introduced by adopting the schemes under the situation, so that inaccurate or completely wrong measurement results are caused. The specific analysis is as follows:
(1) determining data frame header position by power threshold
This method is simple and fast to implement, but the solution has its own limitation in use, that is, the process of requiring the data power sent by the terminal to reach its predetermined power value is completed in a very short time, and from the viewpoint of power spectrum, there should be a very steep rising edge. If the power of the terminal slowly climbs from nothing, the receiving end judges that the part of valid data before the power threshold is exceeded is discarded. The position of the frame header thus obtained is inaccurate, and subsequent processing will cause the effect of the front window (the front window means that the data received by the receiving end of the integrated measuring instrument is incomplete, and a part of valid data is lost by the front end of the data. for example, the ideal received signal is 12345678910, and the actual received signal is 3456789101112, in which case the actual received signal loses the first 1 and 2, and the excessive 11 and 12, which is called the front window), and the final measurement result is affected.
(2) Frame header position judgment through time domain correlation peak position
When the scheme is used, the peak position of the default time domain correlation peak is the initial position of the pilot frequency sequence, the deviation between the real initial position and the existing initial position can be known through the position index of the correlation peak, and the accurate frame header position can be obtained by adjusting the existing initial position according to the difference. However, this method is not suitable for the case where the data transmitted from the terminal has a large frequency offset. From the nature of fourier transform, it can be known that when data carries a frequency offset, the frequency offset itself causes a shift of the relative peak position of the time domain signal, in which case the peak position is no longer the starting position of the pilot sequence, and then the data is adjusted by the peak position, which may cause errors.
The method needs to know the subframe number of the currently received data to carry out correlation calculation, and because the data is not sent strongly and received strongly in the synchronization process, the receiving end does not determine the subframe number of the data, a frame number blind detection process is required before the correlation calculation, and a large amount of time is consumed.
Disclosure of Invention
In view of the above problems, embodiments of the present invention are proposed to provide a frame header detection method based on an LTE integrated tester and a corresponding LTE integrated tester, which overcome or at least partially solve the above problems.
In order to solve the above problems, the embodiment of the present invention discloses a frame header detection method based on an LTE integrated tester, including:
the LTE comprehensive tester receives LTE uplink data sent by a terminal, wherein the LTE uplink data comprises a plurality of time domain signals, and the time domain signals comprise a plurality of sampling points;
acquiring sampling points with a preset threshold quantity, and calculating a characteristic value of each sampling point;
and determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum characteristic value.
Preferably, the characteristic value is a variance;
the step of calculating the characteristic value of each sampling point comprises the following steps:
substep S11, setting S (t) as the data signal of the sampling point t corresponding to the current time, and setting the initial value of t as 0;
and a substep S12, calculating a ratio D1(k) between the data signal corresponding to the sampling point t at the current time shifted by k sampling points and the data signal corresponding to the sampling point shifted by N + k sampling points according to the following formula:
k represents the number of sampling points which are offset by taking the current sampling point t as a reference, and N is the length of effective data in a time domain signal;
substep S13, calculating an average D2 of the D1 (k);
a substep S14, calculating the variance of the sampling point t corresponding to the current time according to D1(k) and D2; (ii) a
And a substep S15 of setting t to t +1, and continuing to execute the substeps S12-S14 until t is a preset threshold value.
Preferably, the step of determining the frame header position of the LTE uplink data according to the sampling point with the minimum feature value includes:
acquiring the initial position of the LTE uplink data;
taking the position of the sampling point with the minimum characteristic value as an offset value between the frame header position of the LTE uplink data and the starting position;
and calculating the frame header position of the LTE uplink data according to the deviation value and the initial position.
Preferably, the method further comprises:
acquiring a frame of complete LTE uplink data according to the frame header position;
and measuring the complete LTE uplink data to obtain a measurement result.
Preferably, the method is applied to the measurement of the terminal by the comprehensive tester in the non-signaling mode.
The embodiment of the invention also discloses an LTE comprehensive tester, which at least comprises:
the uplink data receiving module is used for receiving LTE uplink data sent by a terminal, wherein the LTE uplink data comprise a plurality of time domain signals, and the time domain signals comprise a plurality of sampling points;
the characteristic value calculation module is used for acquiring sampling points with the preset threshold quantity and calculating the characteristic value of each sampling point;
and the frame header determining module is used for determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum characteristic value.
Preferably, the characteristic value is a variance; the feature value calculation module includes:
the initialization submodule is used for setting s (t) as a data signal of a sampling point t corresponding to the current moment, and the initial value of t is a numerical value 0;
the ratio calculation submodule is used for calculating the ratio D1(k) of the data signal corresponding to the sampling point t at the current moment after being shifted by k sampling points and the data signal corresponding to the sampling point t after being shifted by N + k sampling points according to the following formula:
k represents the number of sampling points which are offset by taking the current sampling point t as a reference, and N is the length of effective data in a time domain signal;
a mean calculation submodule for calculating a mean D2 of the D1 (k);
the variance calculation submodule is used for calculating the variance of the sampling point t corresponding to the current moment according to the D1(k) and the D2;
and the circulation submodule is used for continuing to call the ratio calculation submodule, the average calculation submodule and the variance calculation submodule until t is equal to a preset threshold value when t is equal to t + 1.
Preferably, the frame header determining module includes:
an initial position obtaining submodule, configured to obtain an initial position of the LTE uplink data;
an offset value determining submodule, configured to use a position of the sampling point with the minimum characteristic value as an offset value between a frame header position of the LTE uplink data and the starting position;
and the frame header position calculating submodule is used for calculating the frame header position of the LTE uplink data according to the deviation value and the starting position.
Preferably, the LTE integrated tester further includes:
a complete frame determining module, configured to obtain a frame of complete LTE uplink data according to the frame header position;
and the data measurement module is used for measuring the complete LTE uplink data to obtain a measurement result.
Preferably, the integrated tester is used for measuring the terminal in a non-signaling mode.
The embodiment of the invention has the following advantages:
in the embodiment of the invention, starting with an LTE time domain signal sent by a terminal, the characteristic value of each sampling point in the preset threshold value sampling points is calculated by utilizing the characteristics of the time domain signal, and the frame head position of LTE uplink data is detected according to the sampling point with the minimum characteristic value.
Drawings
Fig. 1 is a flowchart of a first embodiment of a frame header detection method based on an LTE integrated tester according to the present invention;
fig. 2 is a flowchart of a second step of a frame header detection method based on an LTE integrated tester according to an embodiment of the present invention;
fig. 3 is a schematic time domain signal diagram in a second embodiment of a frame header detection method based on an LTE integrated tester according to the present invention;
fig. 4 is a block diagram of an LTE integrated tester according to an embodiment of the present invention.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in further detail below.
One of the core concepts of the embodiments of the present invention is that, starting with the LTE time domain signal itself sent from the terminal, the N of the data header (i.e. cyclic prefix) of the time domain signal is utilizedCP,lN per data and data tail (i.e. guard interval)CP,lAnd calculating the variance of each sampling point in the sampling points with the preset threshold value according to the characteristics of equal data, and detecting the frame header position of the LTE uplink data according to the sampling point with the minimum variance, thereby obtaining a more accurate frame header position.
Referring to fig. 1, a flowchart illustrating a first step of a frame header detection method based on an LTE integrated tester according to a first embodiment of the present invention may include the following steps:
102, acquiring sampling points with a preset threshold quantity, and calculating a characteristic value of each sampling point;
and 103, determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum characteristic value.
In the embodiment of the invention, starting with an LTE time domain signal sent by a terminal, the characteristic value of each sampling point in the preset threshold value sampling points is calculated by utilizing the characteristics of the time domain signal, and the frame head position of LTE uplink data is detected according to the position of the sampling point with the minimum characteristic value.
Referring to fig. 2, a flowchart of a second step of the embodiment of a frame header detection method based on an LTE integrated tester is shown.
In a specific implementation, an LTE integrated tester (hereinafter referred to as an integrated tester) needs a frame of complete data to obtain a correct measurement result under both LTE fast frequency offset calibration and fast non-signaling measurement items, and the terminal is in a state of continuously sending data at this time. Therefore, it is necessary to find the starting position of a frame of data, i.e. the frame header, and the frame header position is determined before obtaining a complete frame of data, so as to obtain a correct measurement result.
The embodiment of the invention can be applied to the measurement of the terminal by the comprehensive tester in a non-signaling mode, wherein the non-signaling mode corresponds to a signaling mode (signaling test mode), the signaling mode is to simulate the base station by the comprehensive tester and establish a link with the terminal, the comprehensive tester sends various signaling, and the terminal is connected with a network, and not only needs to send signals, but also needs to receive various signaling from the comprehensive tester. The non-signaling mode is that the integrated tester is only used for measuring the radio frequency index of the terminal at the moment, and does not send out a signaling to control the terminal, the terminal is only in a transmitting state at the moment, and a receiving channel is generally closed. In summary, for a terminal, the terminal needs to transmit and receive signals in the signaling mode. The terminal is only in a transmitting state in the non-signaling mode. However, in a Non-Signaling mode (Non Signaling test mode), the integrated tester does not have an uplink synchronization process, and how the integrated tester accurately determines the frame header position becomes very important.
The embodiment of the invention can start from the LTE time domain signal sent by the terminal and judge the position of the data frame header by utilizing the characteristics of the time domain signal. The method specifically comprises the following steps:
on the terminal side, LTE uplink data may be continuously sent to the integrated tester, and the LTE uplink data may include a plurality of time domain signals. In a specific implementation, a time-domain signal may be understood as an expression of an OFDM (Orthogonal frequency division Multiplexing) symbol in a time domain, that is, a time duration occupied by one OFDM symbol is, for example, 7 OFDM symbols within 0.5ms, and then the time duration of one OFDM symbol is 0.5ms/7 — 1/14 ms.
In a specific implementation, at the transmitting terminal, a bit stream is firstly QAM (Quadrature amplitude modulation) or QPSK (Quadrature Phase Shift keying) modulated, then is sequentially subjected to serial-to-parallel conversion and IFFT (Inverse Fast Fourier Transform), and then parallel data is converted into serial data, and a guard interval is added to form an OFDM symbol.
Specifically, due to the influence of multipath effect, when an OFDM Symbol reaches a receiving side through multipath transmission, collision may exist, that is, delay spread of an impulse signal is caused, ISI (Inter-Symbol Interference) is generated, and transmission quality of a digital signal is seriously affected. To eliminate the inter-symbol interference to the maximum, a Guard Interval (GI) may be inserted between each OFDM symbol, and the time length Tg of the guard interval is generally greater than the maximum delay spread of the radio channel, so that the multipath component of one symbol will not cause interference to the next symbol.
However, after the guard interval is added, Inter-Channel Interference (ICI) may be generated due to the influence of multipath propagation, that is, orthogonality between subcarriers is destroyed, and Interference between different subcarriers is generated. In order to avoid the orthogonality damage between subcarriers caused by multipath propagation in the idle guard interval, the OFDM symbol needs to be filled with a Cyclic Prefix (CP) signal in its guard interval, that is, a part of sampling points at the tail of each OFDM symbol is copied to the front of the OFDM symbol.
For example, as shown in the OFDM symbol length diagram of fig. 3, one OFDM symbol includes an effective data portion and a CP portion, the effective data has a length of N (i.e. N sampling points), and the CP content is obtained by truncating N from the tail of the current effective dataCP,lCopying a sample point to the front of an OFDM symbol, i.e. one CP has a length of NCP,lThe length of one OFDM symbol after CP addition is N + NCP,lComprising N + NCP,lAnd (4) sampling points.
The LTE integrated tester is used as a receiving end to receive the OFDM symbols sent by the terminal.
the method and the device can detect the frame header position by traversing the variance of each sampling point in the preset threshold sampling points.
In a preferred embodiment of the present invention, step 202 may comprise the following sub-steps:
substep S11, setting S (t) as the data signal of the sampling point t corresponding to the current time, and setting the initial value of t as 0;
and a substep S12, calculating a ratio D1(k) between the data signal corresponding to the sampling point t at the current time shifted by k sampling points and the data signal corresponding to the sampling point shifted by N + k sampling points according to the following formula:
wherein k represents the number of sampling points offset by taking the current sampling point t as a reference, and N is the length of effective data in a time domain signal.
From the above k value range, each sampling point t has a group (N)CP,lN) D1 (k).
In a specific implementation, the length N of the CP signal in one OFDM symbol is usedCP,lAnd the OFDM tail NCP,lThe number of the points is the same, and the length of the valid data is N, it can be determined that each sampling point in the CP signal has a corresponding sampling point at the end of the OFDM (for convenience of description, the point is referred to as a corresponding sampling point hereinafter), and each sampling point in the CP signal is separated from the corresponding sampling point by N sampling points.
As can be seen from the above value range of k, the value range of k does not exceed the length of one CP, and therefore, in the above formula (1), S (t + k) may represent a CP signal obtained by shifting the sampling point t corresponding to the current time by k sampling points, and S (t + N + k) may represent a data signal obtained by shifting the sampling point t corresponding to the current time by k sampling points.
Note that D1(k) may be expressed by equivalent conjugate multiplication calculation, for example, D1(k) ═ S (t + k) · S (t + N + k), in addition to the ratio between the CP signal at the sampling point t corresponding to the current time shifted by k sampling points and the data signal at the corresponding sampling point in equation (1), which is not limited in the embodiment of the present invention.
Substep S13, calculating an average D2 of the D1 (k);
in a specific implementation, N is calculated separatelyCP,lAfter D1(k), the N can be further calculated using equation (2)CP,lAverage D2 of individual D1 (k).
A substep S14, calculating the variance of the sampling point t corresponding to the current time according to D1(k) and D2;
in a specific implementation, N is obtainedCP,lAfter the average value D2 of the D1(k), the variance D3(t) of the sampling point t at the current time can be further calculated according to D1(k) and D2 by using formula (3).
And a substep S15 of setting t to t +1, and continuing to execute the substeps S12-S14 until t is a preset threshold value.
After the variance calculation of the sampling point t corresponding to the current time is completed, the sampling point t can be shifted backwards by one bit to obtain a sampling point t +1 at the next time, the substep S12-substep S14 are continuously executed, the above cycle process is finished when t is equal to a preset threshold value, and the variance of each sampling point is obtained from the sampling point t corresponding to the current time, wherein the variance of each sampling point is preset threshold value sampling points.
In practice, since the offset of a header of a data frame does not exceed the length of the valid data of an OFDM signal, the value of t does not exceed the length of the valid data of an OFDM signal, that is, the loop process may be ended when t equals to N.
As a preferred example, N may take the value 2048.
And 203, determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum variance.
After the variance of each sampling point in the preset threshold value sampling points is obtained, the sampling point with the minimum variance can be further obtained, the position t _ min of the sampling point is determined, and the frame header position of LTE uplink data is determined according to the t _ min.
In a preferred embodiment of the present invention, step 203 may comprise the following sub-steps:
substep S21, obtaining an initial position of the LTE uplink data;
in practice, the position of the first received data may be used as the starting position of the LTE uplink data.
A substep S22, taking the position of the sampling point with the minimum variance as an offset value between the frame header position of the LTE uplink data and the starting position;
specifically, t _ min may be used as an offset value between the actual frame header position of the data and the start position of the LTE uplink data.
And a substep S23, calculating a frame header position of the LTE uplink data according to the offset value and the start position.
In a specific implementation, the frame header position is the start position of the LTE uplink data + the offset, and after the start position and the offset of the LTE uplink data are obtained, the frame header position of the LTE uplink data can be obtained, for example, if the start position of the LTE uplink data is t 0, the frame header position of the LTE uplink data is the data signal S (t _ min) corresponding to t _ min.
In the embodiment of the present invention, if the time domain signal is the frame header of the uplink data, D1(k) should be a set of constant values, and the fluctuation thereof should be minimal, i.e. the variance should be minimal. Therefore, in the embodiment of the present invention, the position corresponding to the sampling point with the minimum variance is used to represent the actual data frame header position.
The embodiment of the invention adopts the variance of the sampling points to detect the frame head position of the LTE uplink data, the detection process is not influenced by the data frequency offset, and the frame head position is more accurate than that obtained by a simple method of detecting the frame head by a power threshold. After the frame header position is obtained, a frame of complete LTE uplink data can be obtained according to the frame header position, and when the complete LTE uplink data is measured, a more accurate measurement result can be obtained.
It should be noted that, for simplicity of description, the method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present invention is not limited by the illustrated order of acts, as some steps may occur in other orders or concurrently in accordance with the embodiments of the present invention. Further, those skilled in the art will appreciate that the embodiments described in the specification are presently preferred and that no particular act is required to implement the invention.
Referring to fig. 4, a block diagram of an LTE integrated tester according to an embodiment of the present invention is shown, where the LTE integrated tester at least includes the following modules:
an uplink data receiving module 401, configured to receive LTE uplink data sent by a terminal, where the LTE uplink data includes multiple time domain signals, and the time domain signals include multiple sampling points;
a feature value calculation module 402, configured to obtain sampling points of a preset threshold number, and calculate a feature value of each sampling point;
a frame header determining module 403, configured to determine a frame header position of the LTE uplink data according to a position of the sampling point with the minimum feature value.
In a preferred embodiment of the present invention, the characteristic value is a variance; the feature value calculation module 402 may include the following sub-modules:
the initialization submodule is used for setting s (t) as a data signal of a sampling point t corresponding to the current moment, and the initial value of t is a numerical value 0;
the ratio calculation submodule is used for calculating the ratio D1(k) of the data signal corresponding to the sampling point t at the current moment after being shifted by k sampling points and the data signal corresponding to the sampling point t after being shifted by N + k sampling points according to the following formula:
k represents the number of sampling points which are offset by taking the current sampling point t as a reference, and N is the length of effective data in a time domain signal;
a mean calculation submodule for calculating a mean D2 of the D1 (k);
the variance calculation submodule is used for calculating the variance of the sampling point t corresponding to the current moment according to the D1(k) and the D2;
and the circulation submodule is used for continuing to call the ratio calculation submodule, the average calculation submodule and the variance calculation submodule until t is equal to a preset threshold value when t is equal to t + 1.
In a preferred embodiment of the present invention, the frame header determining module 403 may include the following sub-modules:
an initial position obtaining submodule, configured to obtain an initial position of the LTE uplink data;
an offset value determining submodule, configured to use a position of the sampling point with the minimum characteristic value as an offset value between a frame header position of the LTE uplink data and the starting position;
and the frame header position calculating submodule is used for calculating the frame header position of the LTE uplink data according to the deviation value and the starting position.
In a preferred embodiment of the present invention, the LTE comprehensive tester may further include the following modules:
a complete frame determining module, configured to obtain a frame of complete LTE uplink data according to the frame header position;
and the data measurement module is used for measuring the complete LTE uplink data to obtain a measurement result.
In a preferred embodiment of the present invention, the integrated tester is applied to the measurement of the terminal in the non-signaling mode.
For the LTE integrated tester embodiment, since it is basically similar to the method embodiment, the description is simple, and for relevant points, refer to the partial description of the method embodiment.
The embodiments in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
As will be appreciated by one skilled in the art, embodiments of the present invention may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
Embodiments of the present invention are described with reference to flowchart illustrations and/or block diagrams of methods, terminal devices (systems), and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing terminal to cause a series of operational steps to be performed on the computer or other programmable terminal to produce a computer implemented process such that the instructions which execute on the computer or other programmable terminal provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
While preferred embodiments of the present invention have been described, additional variations and modifications of these embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including preferred embodiments and all such alterations and modifications as fall within the scope of the embodiments of the invention.
Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or terminal that comprises the element.
The frame header detection method based on the LTE integrated tester and the LTE integrated tester provided by the present invention are introduced in detail, and a specific example is served herein to explain the principle and the implementation manner of the present invention, and the description of the above embodiment is only used to help understand the method and the core idea of the present invention; meanwhile, for a person skilled in the art, according to the idea of the present invention, there may be variations in the specific embodiments and the service scope, and in summary, the content of the present specification should not be construed as a limitation to the present invention.
Claims (6)
1. A frame header detection method based on an LTE integrated tester is characterized by comprising the following steps:
the LTE comprehensive tester receives LTE uplink data sent by a terminal, wherein the LTE uplink data comprises a plurality of time domain signals, and the time domain signals comprise a plurality of sampling points;
acquiring a preset number of sampling points, and calculating a characteristic value of each sampling point; the preset number is the sum of a preset threshold value and one; the eigenvalue is a variance;
determining the frame header position of the LTE uplink data according to the position of the sampling point with the minimum characteristic value;
acquiring a frame of complete LTE uplink data according to the frame header position;
measuring the complete LTE uplink data to obtain a measurement result;
the step of determining the frame header position of the LTE uplink data according to the sampling point with the minimum characteristic value comprises the following steps:
acquiring the initial position of the LTE uplink data;
taking the position of the sampling point with the minimum characteristic value as an offset value between the frame header position of the LTE uplink data and the starting position;
and calculating the frame header position of the LTE uplink data according to the deviation value and the initial position.
2. The method of claim 1,
the step of calculating the characteristic value of each sampling point comprises the following steps:
substep S11, setting S (t) as the data signal of the sampling point t corresponding to the current time, and setting the initial value of t as 0;
and a substep S12, calculating a ratio D1(k) between the data signal corresponding to the sampling point t at the current time shifted by k sampling points and the data signal corresponding to the sampling point shifted by N + k sampling points according to the following formula:
wherein k represents the number of sampling points offset by taking the current sampling point t as a reference, N is the length of effective data in a time domain signal, and N is the length of effective data in a time domain signalCP,1Is the length of one CP;
substep S13, calculating an average D2 of the D1 (k);
a substep S14, calculating the variance of the sampling point t corresponding to the current time according to D1(k) and D2;
and a substep S15 of setting t to t +1, and continuing to execute the substeps S12-S14 until t is a preset threshold value.
3. The method according to any of claims 1-2, wherein the method is applied to the measurement of the terminal by the comprehensive tester in the non-signaling mode.
4. The utility model provides a LTE synthesizes tester which characterized in that, LTE synthesizes tester and includes at least:
the uplink data receiving module is used for receiving LTE uplink data sent by a terminal, wherein the LTE uplink data comprise a plurality of time domain signals, and the time domain signals comprise a plurality of sampling points;
the characteristic value calculation module is used for acquiring a preset number of sampling points and calculating the characteristic value of each sampling point; the preset number is the sum of a preset threshold value and one; the eigenvalue is a variance;
a frame header determining module, configured to determine a frame header position of the LTE uplink data according to a position of a sampling point with a minimum feature value;
a complete frame determining module, configured to obtain a frame of complete LTE uplink data according to the frame header position;
the data measurement module is used for measuring the complete LTE uplink data to obtain a measurement result;
the frame header determining module comprises:
an initial position obtaining submodule, configured to obtain an initial position of the LTE uplink data;
an offset value determining submodule, configured to use a position of the sampling point with the minimum characteristic value as an offset value between a frame header position of the LTE uplink data and the starting position;
and the frame header position calculating submodule is used for calculating the frame header position of the LTE uplink data according to the deviation value and the starting position.
5. The LTE integrated instrument of claim 4, wherein the eigenvalue calculation module comprises:
the initialization submodule is used for setting s (t) as a data signal of a sampling point t corresponding to the current moment, and the initial value of t is a numerical value 0;
the ratio calculation submodule is used for calculating the ratio D1(k) of the data signal corresponding to the sampling point t at the current moment after being shifted by k sampling points and the data signal corresponding to the sampling point t after being shifted by N + k sampling points according to the following formula:
wherein k represents the number of sampling points offset by taking the current sampling point t as a reference, N is the length of effective data in a time domain signal, and N is the length of effective data in a time domain signalCP,1Is the length of one CP;
a mean calculation submodule for calculating a mean D2 of the D1 (k);
the variance calculation submodule is used for calculating the variance of the sampling point t corresponding to the current moment according to the D1(k) and the D2;
and the circulation submodule is used for continuing to call the ratio calculation submodule, the average calculation submodule and the variance calculation submodule until t is equal to a preset threshold value when t is equal to t + 1.
6. The LTE synthesizer according to any of claims 4-5, wherein the synthesizer applies measurements for terminals in a non-signaling mode.
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