CN107255936A - Interactive Real Time Drive software systems and method applied to CMOS Resistor Array Projectors - Google Patents
Interactive Real Time Drive software systems and method applied to CMOS Resistor Array Projectors Download PDFInfo
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- 238000012360 testing method Methods 0.000 claims abstract description 51
- 230000005540 biological transmission Effects 0.000 claims description 52
- 238000005070 sampling Methods 0.000 claims description 33
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- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B17/00—Systems involving the use of models or simulators of said systems
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Abstract
The invention discloses the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors, including real-time simulation sub system, off-line test subsystem and single machine test subsystem；The input of above-mentioned real-time simulation sub system is used to be connected with main replicating machine, and its output end is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image devices；Want to order parameter, the first simulation control command and the first emulation data for receiving the first confrontation situation that main replicating machine is sent, and send simulation status information to above-mentioned main replicating machine, the first IR Scene view data of generation is sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.This is applied to interactive Real Time Drive software system module of CMOS Resistor Array Projectors, systematization and real-time is good.
Description
Technical field
The invention belongs to computer simulation technique field, and in particular to the interactive Real Time Drive applied to CMOS Resistor Array Projectors
Software systems and method.
Background technology
With infrared guidance technology widely using in armament systems, the problem of it is solved required in application process
Also become increasingly conspicuous, how laboratory high fidelity reproduction outfield operational environment, test, evaluate infrared guidance system work
Performance of fighting and ability, are increasingly becoming the developing direction that current infrared guidance emulation is badly in need of solving.CMOS Resistor Array Projector IR Scene moulds
It is a kind of dynamic simulator of the natural environment of approaching to reality the most Infrared Physics characteristic to intend device, abroad the test and appraisal such as America and Europe center
Largely used in infrared guidance system emulation, the data-driven high dynamic that can be generated according to computer produces infrared radiation field in real time
Scape, accesses the HWIL simulation loop of infrared guidance armament systems, completes real-time simulation.
For infrared guidance HWIL simulation, CMOS Resistor Array Projectors provide the device and environment of Infrared scene simulation with image,
Software-driven determines the confidence level and fidelity of emulation, therefore, and the country such as America and Europe puts into a large amount of people on the basis of device development
Power, material resources, financial resources carry out the design and development of CMOS Resistor Array Projector driving software systems, U.S.'s PRISM, TTIM, JRM system, north
NIRATAM about, the OSSIM systems in South Africa, French SESIM systems have all been applied successfully in resistance array 1 system, to typical empty
The typical scenes such as middle target, ground marine background, celestial environment realize the simulation reconstruction of high fidelity, dynamic characteristic and in real time
Characteristic is good, possesses energy radiation plane characteristic and multispectral radiation characteristic.
Domestic CMOS Resistor Array Projectors structure definition can reach 256 × 256 ranks, in present multiple infrared guidance models
It is applied, but the software systems also imperfection of driving Resistor Array Projector, lack Framework design, software system structure is unreasonable,
Interactivity is poor, integrated level is not high, real-time can not ensure
In a word, it is domestic relatively simple in terms of the design of CMOS Resistor Array Projectors driving software system and research, compared to system of foreign countries
There is more defect in systemization, architecture, the software systems of modular research, lack independent development and possess real-time, can hand over
The driving software system of mutual CMOS Resistor Array Projectors.
The content of the invention
The technical problems to be solved by the invention are that there is provided a kind of systematization, mould for above-mentioned the deficiencies in the prior art
Block and the good interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors of real-time.
In order to solve the above technical problems, the technical solution adopted by the present invention is, the interactive mode applied to CMOS Resistor Array Projectors is real
When driving software system, including real-time simulation sub system, off-line test subsystem and single machine test subsystem.
The input of above-mentioned real-time simulation sub system is used to be connected with main replicating machine, and its output end is used for and CMOS resistance
Battle array Infrared scene simulation with image device is connected；The first confrontation situation that above-mentioned real-time simulation sub system is used to receive main replicating machine transmission is thought
Parameter, the first simulation control command and the first emulation data are ordered, and simulation status information is sent to above-mentioned main replicating machine, by life
Into the first IR Scene view data be sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.
The input of above-mentioned off-line test subsystem is used to be connected with main replicating machine, is additionally operable to and parameter input device phase
Connection, the output end of above-mentioned off-line test subsystem is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image devices；It is above-mentioned offline
The second confrontation situation that test subsystems are used to receive parameter input device input is wanted to order parameter, is additionally operable to receive main replicating machine hair
The second simulation control command sent and the second emulation data, and simulation status information is sent to the main replicating machine, it will generate
The second IR Scene view data be sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.
The input of above-mentioned single machine test subsystem is used to be connected with parameter input device, and its output end is used for and CMOS
Resistor Array Projector Infrared scene simulation with image device is connected；Above-mentioned single machine test subsystem is used for the confrontation state for receiving parameter input device input
Gesture is wanted to order parameter, the 3rd simulation control command and the 3rd emulation data, and simulation status information is sent to main replicating machine, by life
Into the 3rd IR Scene view data be sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.
Further, in addition to device detection subsystem, remote measurement drives subsystem, image acquisition subsystem and system hardware
Detect subsystem；Also include the amendment of Resistor Array Projector heterogeneity and transmission drive module, above-mentioned device detection subsystem, remote measurement driving
Subsystem, image acquisition subsystem and system hardware detection subsystem with the amendment of Resistor Array Projector heterogeneity and transmission drive module
Input be connected, the output end of above-mentioned Resistor Array Projector heterogeneity amendment and transmission drive module is used for red with CMOS Resistor Array Projectors
Outer scene simulator is connected；Above-mentioned real-time simulation sub system, off-line test subsystem and single machine test subsystem and CMOS electricity
It is connected between resistance battle array Infrared scene simulation with image device by the amendment of Resistor Array Projector heterogeneity and transmission drive module；
The first data parameters that above-mentioned device detection subsystem is used in called data storehouse, and the first data parameters are transmitted
To the amendment of Resistor Array Projector heterogeneity and transmission drive module, the first data parameters of amendment are transmitted to the infrared field of CMOS Resistor Array Projectors
Scape simulator；
The second data parameters that above-mentioned remote measurement drives subsystem is used in called data storehouse, and the second data parameters are transmitted
To the amendment of Resistor Array Projector heterogeneity and transmission drive module, the second data parameters of amendment are transmitted to the infrared field of CMOS Resistor Array Projectors
Scape simulator；
Above-mentioned image acquisition subsystem is repaiied for gathering view data, and view data being transmitted to Resistor Array Projector heterogeneity
Just and transmission drive module, the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices；
Above-mentioned hardware testing subsystem is used for reception system parameter values, and systematic parameter data transfer is non-to Resistor Array Projector
Uniformity amendment and transmission drive module, the parameter values of amendment are transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices.
Further, the real-time simulation sub system include being sequentially connected the first confrontation situation connect want to order module, it is first red
Outer object module load-on module, the first Simulation Control and data acquisition module, the first three-dimensional scenic real-time rendering module, first pass
Sensor sampling module, first sensor image quantization module；Above-mentioned first confrontation situation want to order module and the first Simulation Control and
Data acquisition module is also connected with main replicating machine；First sensor image quantization module is used to repair with Resistor Array Projector heterogeneity
Just and transmission drive module is connected；
Above-mentioned first confrontation situation wants that order module wants to order data for receiving the first confrontation situation that main replicating machine is sent, and
The first infrared target model load-on module is transferred to, above-mentioned first infrared target model load-on module is thought according to the first confrontation situation
Order data loaded targets model；
Above-mentioned first Simulation Control and data acquisition module read the target mould in the first infrared target model load-on module
Type, receives simulation control command and emulation data that above-mentioned main replicating machine is sent, by object module and transmitting emulation data to the
One three-dimensional scenic real-time rendering module, through real-time rendering, scene data is transmitted to first sensor sampling module, above-mentioned
Scene data is carried out photoelectric signal transformation by first sensor sampling module, by electric signal transmission to first sensor image
Quantization modules, convert electrical signals to view data, transmit to the amendment of Resistor Array Projector heterogeneity and transmission drive module, according to
The heterogeneity data correction view data of CMOS Resistor Array Projectors, the view data of amendment is transmitted to CMOS Resistor Array Projector IR Scenes
Simulator.
Further, the off-line test subsystem include being sequentially connected connect the second confrontation situation want to order module, it is second infrared
Object module load-on module, the second Simulation Control and data acquisition module, the second three-dimensional scenic real-time rendering module, the second sensing
Device sampling module, second sensor image quantization module；Above-mentioned second confrontation situation wants that the input for ordering module is used for and parameter
Input unit is connected, and above-mentioned second sensor image quantization module is used for and the amendment of Resistor Array Projector heterogeneity and transmission driving mould
Block is connected；Second Simulation Control and data acquisition module are connected with main replicating machine；
Above-mentioned second confrontation situation want to order module be used for receive second resisted situation by what parameter input device was inputted and want to order
Data, and the second infrared target model load-on module is transferred to, above-mentioned second infrared target model load-on module is according to second pair
Anti- situation is wanted to order data loaded targets model；
Above-mentioned second Simulation Control and data acquisition module read the target mould in the second infrared target model load-on module
Type, is received after the simulation control command and emulation data that above-mentioned main replicating machine sends, by object module and transmitting emulation data extremely
Second three-dimensional scenic real-time rendering module, through real-time rendering, scene data is transmitted to second sensor sampling module, on
State second sensor sampling module and scene data is subjected to photoelectric signal transformation, by electric signal transmission to second sensor figure
As quantization modules, view data is converted electrical signals to, is transmitted to the amendment of Resistor Array Projector heterogeneity and transmission drive module, according to
The heterogeneity data correction view data of CMOS Resistor Array Projectors, the view data of amendment is transmitted to CMOS Resistor Array Projector IR Scenes
Simulator.
Further, the single machine test subsystem include being sequentially connected the 3rd confrontation situation connect want to order module, it is the 3rd red
Outer object module load-on module, the 3rd Simulation Control and data acquisition module, the 3rd three-dimensional scenic real-time rendering module, the 3rd pass
Sensor sampling module, storage image block；Above-mentioned 3rd confrontation situation wants that ordering module and the 3rd Simulation Control and data obtains
Modulus block is used to be connected with parameter input device, and above-mentioned storage image block is used for and Resistor Array Projector heterogeneity amendment
And transmission drive module is connected；
Above-mentioned 3rd confrontation situation want to order module be used for receive the 3rd resisted situation by what parameter was inputted and want to order data, and pass
The 3rd infrared target model load-on module is defeated by, above-mentioned 3rd infrared target model load-on module is wanted to order according to the 3rd confrontation situation
Data loaded targets model；
Above-mentioned 3rd Simulation Control and data acquisition module read the target mould in the 3rd infrared target model load-on module
After type, the simulation control command and emulation data that receive parameter input device input, by object module and transmitting emulation data extremely
3rd three-dimensional scenic real-time rendering module, through real-time rendering, scene data is transmitted to 3rd sensor sampling module, on
State 3rd sensor sampling module and scene data is subjected to photoelectric signal transformation, image sequence is transmitted and stored to storage
Image sequence module, calls image sequence, and transmit to the amendment of Resistor Array Projector heterogeneity and transmission driving mould under user control
Block, according to the heterogeneity data correction view data of CMOS Resistor Array Projectors, the view data of amendment is transmitted to CMOS Resistor Array Projectors
Infrared scene simulation with image device.
The invention also discloses the method for work of the above-mentioned interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors,
This method is as follows：
The first confrontation situation that above-mentioned real-time simulation sub system receives main replicating machine transmission is wanted to order parameter, the first Simulation Control
Order and the first emulation data, and simulation status information is sent to above-mentioned main replicating machine, by the first IR Scene figure of generation
As data are sent to CMOS Resistor Array Projector Infrared scene simulation with image devices；
Above-mentioned off-line test subsystem is used to be connected with parameter input device, receives the second of parameter input device input
Confrontation situation is wanted to order parameter, is additionally operable to receive the second simulation control command and the second emulation data that main replicating machine is sent；
Above-mentioned single machine test subsystem is used to be connected with parameter input device, receives the confrontation of parameter input device input
Situation is wanted to order parameter, the 3rd simulation control command and the 3rd emulation data, and simulation status information is sent to main replicating machine, will
3rd IR Scene view data of generation is sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.
The invention has the advantages that：1. system realizes preferable human-computer interaction function, software systems use modularization
Design, system Rational structure is simply easy to extension.2. Resistor Array Projector drives clear process, high frame frequency scene generation, 16bit are realized
Data bit image is obtained, and solves real time problems, improves view data position, is completed data and is carried and repair frame by frame in real time
Just, realize that the IR Scene of resistance array 1 system renders generation and in real time amendment driving.3. half material object that can be with infrared guidance weapon
Analogue system is seamlessly connected, and supports the test and emulation of infrared guidance armament systems.
Brief description of the drawings
Fig. 1 is the structural representation that real-time simulation sub system is connected with other systems in the present invention；
Fig. 2 is the wiring schematic diagram that off-line test subsystem is connected with other systems in the present invention；
Fig. 3 is the wiring schematic diagram that single machine test subsystem is connected with other systems in the present invention；
Wherein：1. real-time simulation sub system；The confrontation of 1-1. first situation is wanted to order module；1-2. the first infrared target models add
Carry module；The Simulation Controls of 1-3. first and data acquisition module；1-4. the first three-dimensional scenic real-time rendering modules；1-5. first is passed
Sensor sampling module；1-6. first sensor image quantization modules；2. off-line test subsystem；The confrontation of 2-1. second situation is wanted to order
Module；2-2. the second infrared target model load-on modules；The Simulation Controls of 2-3. second and data acquisition module；2-4. second is three-dimensional
Scene real-time rendering module；2-5. second sensor sampling modules；2-6. second sensor image quantization modules；3. single machine test
Subsystem；The confrontation of 3-1 the 3rd situation is wanted to order module；The infrared target model load-on modules of 3-2. the 3rd；The Simulation Controls of 3-3. the 3rd
And data acquisition module；The three-dimensional scenic real-time rendering modules of 3-4. the 3rd；3-5. 3rd sensor sampling modules；3-6. storage figures
As block；4. device detection subsystem；5. remote measurement drives subsystem；6. image acquisition subsystem；7. system hardware is detected
Subsystem；8. the amendment of Resistor Array Projector heterogeneity and transmission drive module；9. main replicating machine；10.CMOS Resistor Array Projector IR Scene moulds
Intend device.
Embodiment
The present invention is applied to the interactive Real Time Drive software systems of CMOS Resistor Array Projectors, includes as shown in Figure 1, Figure 2 and Figure 3
Real-time simulation sub system 1, off-line test subsystem 2 and single machine test subsystem 3；The input of real-time simulation sub system 1 is used for
It is connected with main replicating machine 9, its output end is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image device 10；Real-time simulation subsystem
The first confrontation situation that system 1 is used to receive the main transmission of replicating machine 9 is wanted to order parameter, the first simulation control command and the first emulation number
According to, and simulation status information is sent to the main replicating machine 9, the first IR Scene view data of generation is sent to CMOS
Resistor Array Projector Infrared scene simulation with image device 10.
The input of above-mentioned off-line test subsystem 2 is used to be connected with main replicating machine 9, is additionally operable to and parameter input device
It is connected, the output end of off-line test subsystem 2 is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image device 10；It is above-mentioned offline
The second confrontation situation that test subsystems 2 are used to receive parameter input device input is wanted to order parameter, is additionally operable to receive main replicating machine 9
The second simulation control command sent and the second emulation data, and simulation status information is sent to the main replicating machine 9, by life
Into the second IR Scene view data be sent to CMOS Resistor Array Projector Infrared scene simulation with image device 10.Above-mentioned single machine test subsystem 3
Input be used for be connected with parameter input device, its output end be used for be connected with CMOS Resistor Array Projector Infrared scene simulation with image device 10
Connect；The confrontation situation that above-mentioned single machine test subsystem 3 is used to receive parameter input device input is wanted to order parameter, the 3rd Simulation Control
Order and the 3rd emulation data, and simulation status information is sent to main replicating machine 9, by the 3rd IR Scene picture number of generation
According to being sent to CMOS Resistor Array Projector Infrared scene simulation with image devices.
Interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors also include device detection subsystem 4, remote measurement and driven
Subsystem 5, image acquisition subsystem 6 and system hardware detection subsystem 7；Also include the amendment of Resistor Array Projector heterogeneity and transmission
Drive module 8, device detection subsystem 4, remote measurement drives subsystem 5, image acquisition subsystem 6 and system hardware detection subsystem
7 input with the amendment of Resistor Array Projector heterogeneity and transmission drive module 8 is connected, the Resistor Array Projector heterogeneity amendment and
The output end of transmission drive module 8 is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image device 10；The real-time simulation subsystem
Pass through resistance between system 1, off-line test subsystem 2 and single machine test subsystem 3 and CMOS Resistor Array Projector Infrared scene simulation with image device 10
Battle array heterogeneity amendment and transmission drive module 8 are connected.
The first data parameters that above-mentioned device detection subsystem 4 is used in called data storehouse, and the first data parameters are passed
The amendment of Resistor Array Projector heterogeneity and transmission drive module 8 are transported to, the first data parameters of amendment are transmitted red to CMOS Resistor Array Projectors
Outer scene simulator 10；The second data parameters that the remote measurement drives subsystem 5 is used in called data storehouse, and by the second data
Parameter is transmitted to the amendment of Resistor Array Projector heterogeneity and transmission drive module 8, and the second data parameters of amendment are transmitted to CMOS electricity
Hinder battle array Infrared scene simulation with image device 10；Described image acquisition subsystem 6 is used to gather view data, and view data is transmitted to electricity
The amendment of battle array heterogeneity and transmission drive module 8 are hindered, the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image
Device 10.Above-mentioned hardware testing subsystem 7 is used for reception system parameter values, and systematic parameter data transfer is non-to Resistor Array Projector
Even property amendment and transmission drive module 8, the parameter values of amendment are transmitted to CMOS Resistor Array Projector Infrared scene simulation with image device 10.
As shown in figure 1, the first confrontation situation that real-time simulation sub system 1 connects including being sequentially connected is wanted to order module 1-1, first
Infrared target model load-on module 1-2, the first Simulation Control and data acquisition module 1-3, the first three-dimensional scenic real-time rendering mould
Block 1-4, first sensor sampling module 1-5, first sensor image quantization module 1-6；The first confrontation situation is wanted to order mould
Block 1-1 and the first Simulation Control and data acquisition module 1-3 are also connected with main replicating machine 9；First sensor image quantization
Module 1-5 is used to be connected with the amendment of Resistor Array Projector heterogeneity and transmission drive module 8.
Above-mentioned first confrontation situation wants that order module 1-1 wants to order number for receiving the first confrontation situation that main replicating machine 9 is sent
According to, and the first infrared target model load-on module 1-2, the first infrared target model load-on module 1-2 is transferred to according to
One confrontation situation is wanted to order data loaded targets model.It is infrared that first Simulation Control and data acquisition module 1-3 read first
Object module in object module load-on module 1-2, receives simulation control command and emulation number that the main replicating machine 9 is sent
According to by object module and transmitting emulation data to the first three-dimensional scenic real-time rendering module 1-4, through real-time rendering, by three dimensional field
Scape data transfer is carried out scene data to first sensor sampling module 1-5, the first sensor sampling module 1-5
Photoelectric signal transformation, by electric signal transmission to first sensor image quantization module 1-6, converts electrical signals to view data,
Transmit to the amendment of Resistor Array Projector heterogeneity and transmission drive module 8, according to the heterogeneity data correction image of CMOS Resistor Array Projectors
Data, the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image device 10.
This is applied to the interactive Real Time Drive software systems of CMOS Resistor Array Projectors, as shown in Fig. 2 off-line test subsystem 2
Connect the second confrontation situation including being sequentially connected and want to order module 2-1, the second infrared target model load-on module 2-2, the second emulation control
System and data acquisition module 2-3, the second three-dimensional scenic real-time rendering module 2-4, second sensor sampling module 2-5 and second pass
Sensor image quantization module 2-6；The second confrontation situation wants that the input for ordering module 2-1 is used to be connected with parameter input device
Connect, the second sensor image quantization module 2-6 is used to be connected with the amendment of Resistor Array Projector heterogeneity and transmission drive module 8
Connect.Second Simulation Control and data acquisition module (2-3) are connected with main replicating machine (9).
Above-mentioned second confrontation situation want to order module 2-1 be used for receive second resisted situation by what parameter input device was inputted and thought
Data are ordered, and are transferred to the second infrared target model load-on module 2-2, the second infrared target model load-on module 2-2 roots
Want to order data loaded targets model according to the second confrontation situation.Above-mentioned second Simulation Control and data acquisition module 2-3 read second
Object module in infrared target model load-on module 2-2, receives simulation control command and emulation that the main replicating machine 9 is sent
After data, by object module and transmitting emulation data to the second three-dimensional scenic real-time rendering module 2-4, through real-time rendering, by three
Dimension contextual data is transmitted to second sensor sampling module 2-5, and the second sensor sampling module 2-5 is by scene data
Photoelectric signal transformation is carried out, by electric signal transmission to second sensor image quantization module 2-6, picture number is converted electrical signals to
According to transmitting to the amendment of Resistor Array Projector heterogeneity and transmission drive module 8, according to the heterogeneity data correction figure of CMOS Resistor Array Projectors
As data, the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image device 10.
This is applied to the interactive Real Time Drive software systems of CMOS Resistor Array Projectors, as shown in figure 3, single machine test subsystem 3
The 3rd confrontation situation connect including being sequentially connected is wanted to order module 3-1, the 3rd infrared target model load-on module 3-2, the 3rd emulation
Control and data acquisition module 3-3, the 3rd three-dimensional scenic real-time rendering module 3-4,3rd sensor sampling module 3-5 and storage
Image sequence module 3-6；The 3rd confrontation situation wants to order module 3-1 and the 3rd Simulation Control and data acquisition module 3-3 is equal
For being connected with parameter input device, the storage image block 3-6 is used for and the amendment of Resistor Array Projector heterogeneity and biography
Defeated drive module 8 is connected.
Above-mentioned 3rd confrontation situation want to order module 3-1 be used for receive the 3rd resisted situation by what parameter was inputted and want to order data,
And the 3rd infrared target model load-on module 3-2 is transferred to, the 3rd infrared target model load-on module 3-2 is according to the 3rd pair
Anti- situation is wanted to order data loaded targets model.Above-mentioned 3rd Simulation Control and data acquisition module 3-3 read the 3rd infrared target
, will after object module in model load-on module 3-2, the simulation control command and emulation data that receive parameter input device input
Object module and transmitting emulation data are to the 3rd three-dimensional scenic real-time rendering module 3-4, through real-time rendering, by scene data
Transmit to 3rd sensor sampling module 3-5, the 3rd sensor sampling module 3-5 and scene data is subjected to optical telecommunications
Number conversion, image sequence is transmitted and stored to storage image block 3-6, image sequence is called under user control, and
Transmit to the amendment of Resistor Array Projector heterogeneity and transmission drive module 8, according to the heterogeneity data correction image of CMOS Resistor Array Projectors
Data, the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image device 10.Above-mentioned first sensor sampling module
Sensor sensors are used in 1-5, second sensor sampling module 2-5 and 3rd sensor sampling module 3-5.
The invention also discloses the method for work of the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors, the work
Make method as follows：
The first confrontation situation that above-mentioned real-time simulation sub system 1 receives the main transmission of replicating machine 9 is wanted to order parameter, the first emulation control
System order and the first emulation data, and simulation status information is sent to the main replicating machine 9, by the first IR Scene of generation
View data is sent to CMOS Resistor Array Projector Infrared scene simulation with image device 10.Above-mentioned off-line test subsystem 2, which is used to input with parameter, to be filled
Put and be connected, the second confrontation situation for receiving parameter input device input is wanted to order parameter, is additionally operable to receive what main replicating machine 9 was sent
Second simulation control command and the second emulation data, and simulation status information are sent to the main replicating machine 9, by the of generation
Two IR Scene view data are sent to CMOS Resistor Array Projector Infrared scene simulation with image device 10.Above-mentioned single machine test subsystem 3 be used for
Parameter input device is connected, receive parameter input device input confrontation situation want to order parameter, the 3rd simulation control command and
3rd emulation data, and simulation status information is sent to main replicating machine 9, the 3rd IR Scene view data of generation is sent
To CMOS Resistor Array Projector Infrared scene simulation with image device 10.
Claims (6)
1. the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors, it is characterised in that including real-time simulation sub system
(1), off-line test subsystem (2) and single machine test subsystem (3)；
The input of the real-time simulation sub system (1) is used to be connected with main replicating machine (9), and its output end is used for and CMOS electricity
Resistance battle array Infrared scene simulation with image device (10) is connected；The real-time simulation sub system (1) is used to receive the of main replicating machine (9) transmission
One confrontation situation is wanted to order parameter, the first simulation control command and the first emulation data, and simulation status information is sent to described
Main replicating machine (9), CMOS Resistor Array Projector Infrared scene simulation with image devices (10) are sent to by the first IR Scene view data of generation；
The input of the off-line test subsystem (2) is used to be connected with main replicating machine (9), is additionally operable to and parameter input device
It is connected, the output end of the off-line test subsystem (2) is used to be connected with CMOS Resistor Array Projector Infrared scene simulation with image devices (10)；
The second confrontation situation that the off-line test subsystem (2) is used to receive parameter input device input is wanted to order parameter, is additionally operable to connect
The second simulation control command and the second emulation data of main replicating machine (9) transmission are received, and simulation status information is sent to described
Main replicating machine (9), CMOS Resistor Array Projector Infrared scene simulation with image devices (10) are sent to by the second IR Scene view data of generation；
The input of the single machine test subsystem (3) is used to be connected with parameter input device, and its output end is used for and CMOS
Resistor Array Projector Infrared scene simulation with image device (10) is connected；The single machine test subsystem (3) is used to receive parameter input device input
Confrontation situation want to order parameter, the 3rd simulation control command and the 3rd emulation data, and simulation status information is sent to main imitative
Prototype (9), CMOS Resistor Array Projector Infrared scene simulation with image devices are sent to by the 3rd IR Scene view data of generation.
2. according to the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors described in claim 1, it is characterised in that
Also include device detection subsystem (4), remote measurement drives subsystem (5), image acquisition subsystem (6) and system hardware detection subsystem
Unite (7)；Also include the amendment of Resistor Array Projector heterogeneity and transmission drive module (8), the device detection subsystem (4), remote measurement are driven
Subsystem (5), image acquisition subsystem (6) and system hardware detection subsystem (7) with the amendment of Resistor Array Projector heterogeneity and
The input of transmission drive module (8) is connected, the output end of the Resistor Array Projector heterogeneity amendment and transmission drive module (8)
For being connected with CMOS Resistor Array Projector Infrared scene simulation with image devices (10)；The real-time simulation sub system (1), off-line test subsystem
(2) and between single machine test subsystem (3) and CMOS Resistor Array Projector Infrared scene simulation with image devices (10) repaiied by Resistor Array Projector heterogeneity
Just and transmission drive module (8) is connected；
The first data parameters that the device detection subsystem (4) is used in called data storehouse, and the first data parameters are transmitted
To the amendment of Resistor Array Projector heterogeneity and transmission drive module (8), the first data parameters of amendment are transmitted red to CMOS Resistor Array Projectors
Outer scene simulator (10)；
The second data parameters that the remote measurement drives subsystem (5) is used in called data storehouse, and the second data parameters are transmitted
To the amendment of Resistor Array Projector heterogeneity and transmission drive module (8), the second data parameters of amendment are transmitted red to CMOS Resistor Array Projectors
Outer scene simulator (10)；
Described image acquisition subsystem (6) is repaiied for gathering view data, and view data being transmitted to Resistor Array Projector heterogeneity
Just and transmission drive module (8), the view data of amendment is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices (10)；
The hardware testing subsystem (7) is used for reception system parameter values, and systematic parameter data transfer is non-to Resistor Array Projector
Uniformity amendment and transmission drive module (8), the parameter values of amendment are transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices
(10)。
3. according to the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors described in claim 2, it is characterised in that
The first confrontation situation that the real-time simulation sub system (1) connects including being sequentially connected is wanted to order module (1-1), the first infrared target mould
Type load-on module (1-2), the first Simulation Control and data acquisition module (1-3), the first three-dimensional scenic real-time rendering module (1-
4), first sensor sampling module (1-5), first sensor image quantization module (1-6)；The first confrontation situation is wanted to order mould
Block (1-1) and the first Simulation Control and data acquisition module (1-3) are also connected with main replicating machine (9)；First sensor figure
As quantization modules (1-6) are used to be connected with the amendment of Resistor Array Projector heterogeneity and transmission drive module (8)；
The first confrontation situation wants that order module (1-1) wants to order number for receiving the first confrontation situation of main replicating machine (9) transmission
According to, and it is transferred to the first infrared target model load-on module (1-2), the first infrared target model load-on module (1-2) root
Want to order data loaded targets model according to the first confrontation situation；
First Simulation Control and data acquisition module (1-3) are read in the first infrared target model load-on module (1-2)
Object module, receives simulation control command and emulation data that the main replicating machine (9) sends, by object module and emulation data
Transmit to the first three-dimensional scenic real-time rendering module (1-4), through real-time rendering, scene data is transmitted to first sensor
Scene data is carried out photoelectric signal transformation by sampling module (1-5), the first sensor sampling module (1-5), by electricity
Signal is transmitted to first sensor image quantization module (1-6), converts electrical signals to view data, is transmitted non-to Resistor Array Projector
Even property amendment and transmission drive module (8), according to the heterogeneity data correction view data of CMOS Resistor Array Projectors, by the figure of amendment
As data transfer to CMOS Resistor Array Projector Infrared scene simulation with image devices (10).
4. according to the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors described in claim 3, it is characterised in that
The off-line test subsystem (2) includes being sequentially connected connecing the second confrontation situation and wanting to order module (2-1), the second infrared target model
Load-on module (2-2), the second Simulation Control and data acquisition module (2-3), the second three-dimensional scenic real-time rendering module (2-4),
Second sensor sampling module (2-5) and second sensor image quantization module (2-6)；The second confrontation situation is wanted to order module
The input of (2-1) is used to be connected with parameter input device, and the second sensor image quantization module (2-6) is used for and electricity
Resistance battle array heterogeneity amendment and transmission drive module (8) are connected；Second Simulation Control and data acquisition module (2-3) with
Main replicating machine (9) is connected；
The second confrontation situation want to order module (2-1) be used for receive second resisted situation by what parameter input device was inputted and want to order
Data, and it is transferred to the second infrared target model load-on module (2-2), the second infrared target model load-on module (2-2)
Want to order data loaded targets model according to the second confrontation situation；
Second Simulation Control and data acquisition module (2-3) are read in the second infrared target model load-on module (2-2)
After object module, the simulation control command and emulation data that receive main replicating machine (9) transmission, by object module and emulation number
According to transmitting to the second three-dimensional scenic real-time rendering module (2-4), through real-time rendering, scene data is transmitted to the second sensing
Scene data is carried out photoelectric signal transformation by device sampling module (2-5), the second sensor sampling module (2-5), will
Electric signal transmission converts electrical signals to view data to second sensor image quantization module (2-6), transmits non-to Resistor Array Projector
Uniformity amendment and transmission drive module (8), according to the heterogeneity data correction view data of CMOS Resistor Array Projectors, by amendment
View data is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices (10).
5. according to the interactive Real Time Drive software systems applied to CMOS Resistor Array Projectors described in claim 4, it is characterised in that
The 3rd confrontation situation that the single machine test subsystem (3) connects including being sequentially connected is wanted to order module (3-1), the 3rd infrared target mould
Type load-on module (3-2), the 3rd Simulation Control and data acquisition module (3-3), the 3rd three-dimensional scenic real-time rendering module (3-
4), 3rd sensor sampling module (3-5) and storage image block (3-6)；The 3rd confrontation situation is wanted to order module (3-
And the 3rd Simulation Control and data acquisition module (3-3) are used to be connected with parameter input device, the storage image sequence 1)
Row module (3-6) is used to be connected with the amendment of Resistor Array Projector heterogeneity and transmission drive module (8)；
The 3rd confrontation situation want to order module (3-1) be used for receive the 3rd resisted situation by what parameter was inputted and want to order data, and
The 3rd infrared target model load-on module (3-2) is transferred to, the 3rd infrared target model load-on module (3-2) is according to the 3rd
Confrontation situation is wanted to order data loaded targets model；
3rd Simulation Control and data acquisition module (3-3) are read in the 3rd infrared target model load-on module (3-2)
After object module, the simulation control command and emulation data that receive parameter input device input, by object module and emulation data
Transmit to the 3rd three-dimensional scenic real-time rendering module (3-4), through real-time rendering, scene data is transmitted to 3rd sensor
Scene data is carried out photoelectric signal transformation by sampling module (3-5), the 3rd sensor sampling module (3-5), will be schemed
As sequence is transmitted and is stored to storage image block (3-6), image sequence is called under user control, and transmit to resistance
Battle array heterogeneity amendment and transmission drive module (8), according to the heterogeneity data correction view data of CMOS Resistor Array Projectors, will be repaiied
Positive view data is transmitted to CMOS Resistor Array Projector Infrared scene simulation with image devices (10).
6. according to the interactive Real Time Drive software systems according to any one of claims 1 to 5 applied to CMOS Resistor Array Projectors
Method of work, it is characterised in that this method is as follows：
The first confrontation situation that the real-time simulation sub system (1) receives main replicating machine (9) transmission is wanted to order parameter, the first emulation control
System order and the first emulation data, and simulation status information is sent to the main replicating machine (9), by the first of generation the infrared field
Scape view data is sent to CMOS Resistor Array Projector Infrared scene simulation with image devices (10)；
The off-line test subsystem (2) is used to be connected with parameter input device, receives the second of parameter input device input
Resist situation to want to order parameter, be additionally operable to receive the second simulation control command and the second emulation data of main replicating machine (9) transmission, and
Simulation status information is sent to the main replicating machine (9), the second IR Scene view data of generation is sent to CMOS electricity
Hinder battle array Infrared scene simulation with image device (10)；
The single machine test subsystem (3) is used to be connected with parameter input device, receives the confrontation of parameter input device input
Situation is wanted to order parameter, the 3rd simulation control command and the 3rd emulation data, and simulation status information is sent to main replicating machine
(9) the 3rd IR Scene view data of generation, is sent to CMOS Resistor Array Projector Infrared scene simulation with image devices (10).
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