CN107167087A - A kind of deformation of body measuring method based on experience wavelet transformation - Google Patents
A kind of deformation of body measuring method based on experience wavelet transformation Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
- G01B11/162—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means by speckle- or shearing interferometry
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
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Abstract
The invention discloses a kind of deformation of body measuring method based on experience wavelet transformation, the deformation of body measuring method comprises the following steps：Carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation, obtain a series of mode function component, i.e. FMAM composition；The association relationship between FMAM composition and former speckle pattern is calculated, the principal component for including deformation information is extracted according to association relationship；Wrapped phase is calculated according to principal component, Hilbert converter techniques, and progress Phase- un- wrapping is oriented to according to quality；The carrier frequency eliminated using Zernike fitting of a polynomials in Phase- un- wrapping obtains true phase；True phase before and after deformation is carried out to subtract each other acquisition deformation of body information.The present invention avoids modal overlap phenomenon present in EMD decomposable processes under the premise of single width speckle pattern, and single width speckle pattern is handled using EWT, reduces phase error, obtains accurate deformation information.
Description
Technical field
The present invention relates to image analysis processing field, more particularly to a kind of deformation of body measurement based on experience wavelet transformation
Method, can apply to body surface quality testing and control field.
Background technology
With Aeronautics and Astronautics, nuclear industry and the contour science and technology of army's industry, the development of sophisticated technology, a series of new materials, new knot
Structure and new technology are also with growing up as emerging rapidly in large numbersBamboo shoots after a spring rain, in face of continuing to bring out for these material new technologies, scope to detection,
The raising of the requirements such as precision, promotes people constantly to study new detection method to adapt to actual demand.Digital speckle interference technology
It is a kind of whole audience optical measurement techniques, it has the features such as noncontact, in real time measurement, high accuracy and high sensitivity, therefore in nothing
Damage the fields such as detection, biomedical detection, precision optical machinery manufacture, vibration measurement and deformation measurement and obtain extensive use.Numeral dissipates
Spot interference technique mainly measures the deformation on rough object surface by measuring the phase place change of speckle interference signal, and it is measured
Sensitivity depends on the measurement sensitivity of phase, and therefore, phase extraction is the difficult point of digital speckle interference technology, is also that emphasis is ground
The content studied carefully.
Speckle phase extraction technology is broadly divided into two classes both at home and abroad at present：One class is the phase extraction based on single width speckle pattern
Technology, i.e. spatial carrier method, a class are the phase extraction technologies based on several speckle patterns by representative of phase shift method.It is many with using
The phase shift method of width speckle pattern is compared, and spatial carrier technology is at a time only to gather piece image, is influenceed by environmental perturbation
It is smaller, it is more suitable for dynamic measurement.
Speckle picture is handled using suitable signal processing method, the survey to improving spatial carrier phase extraction method
Accuracy of measurement is significant.Traditional Fourier transform and wavelet transformation do not have adaptivity, it is impossible to effective to obtain accurate
True phase information；Due to being based entirely on signal self character during empirical mode decomposition, basic function is selected without artificial, therefore
Extensive use is obtained, but this method is there is also some shortcomings, for example：Modal overlap, shortage theory support etc., it is impossible to effectively carry
Take phase information.
The content of the invention
The invention provides a kind of deformation of body measuring method based on experience wavelet transformation, the present invention is in single width speckle pattern
Under the premise of avoid modal overlap phenomenon present in EMD (empirical modal) decomposable process, using EWT (experience wavelet transformation) to list
Width speckle pattern is handled, and reduces phase error, obtains accurate deformation information, described below：
A kind of deformation of body measuring method based on experience wavelet transformation, the deformation of body measuring method includes following step
Suddenly：
Carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation, obtain a series of mode function component,
That is FMAM composition；
The association relationship between FMAM composition and former speckle pattern is calculated, is extracted according to association relationship and includes deformation information
Principal component, remove noise component(s)；
Wrapped phase is calculated according to principal component, Hilbert converter techniques, and progress Phase- un- wrapping is oriented to according to quality；
The carrier frequency eliminated using Zernike fitting of a polynomials in Phase- un- wrapping obtains true phase；Before and after deformation
True phase carries out subtracting each other acquisition deformation of body information.
Wherein, the interference speckle pattern before and after described pair of deformation carries out experience wavelet decomposition respectively, obtains a series of mode
The step of function component is specially：
First with Meyer Construction of Wavelets experience scaling functions and experience wavelet function；To experience scaling function and experience
Wavelet function carries out the radio-frequency component and low-frequency component that convolution obtains picture；
FMAM component after being decomposed according to radio-frequency component and low-frequency component.
Wherein, the association relationship calculated between FMAM composition and former speckle pattern, extracts according to association relationship and wraps
Principal component containing deformation information, remove noise component the step of be specially：
Mutual information after calculating original picture and decomposing between FMAM component；By mutual information, the frequency modulation of picture is defined
The sensitive factor of amplitude modulation component；
All FMAM components are resequenced according to the order of sensitive factor from small to large；
The difference of two neighboring FMAM component sensitive factor is obtained, principal component is obtained by minimal difference, noise is removed
Component.
Wherein, it is described by minimal difference obtain principal component, remove noise component the step of be specially：
The sensitive factor after sequence is found out using minimal difference, the former sequence of the corresponding retrieval of the sensitive factor after sorting
Arrange fk(t), from fk+1(t) it is all noise component(s) that component, which starts later component, and preceding n component divides for main deformation information
Amount.
Wherein, it is described to calculate wrapped phase according to principal component, Hilbert converter techniques, and be oriented to according to quality into line phase
The step of unpacking is specially：
Principal component comprising deformation information is subjected to Hilbert transform, and wrapped phase is obtained by arc tangent；Calculate
The Quality Map of wrapped phase figure, and the mass value of all pixels point is ranked up；
The mass value for obtaining by the mass value of Quality Map, pixel 4 consecutive points for depositing starting point adjoins
Queue；By adjoin queue, pixel mass value to adjoining queue reordering.
Wherein, the mass value by Quality Map, pixel obtains the quality of 4 consecutive points for depositing starting point
Value the step of adjoining queue is specially：
Mass value highest point is taken out from Quality Map as the starting point of phase unwrapping, starting point is labeled as to have deployed
Point, 4 consecutive points of starting point carry out phase unwrapping by reference point of starting point respectively, and 4 consecutive points of mark are breaking up point；
4 consecutive points are stored in into one by the height sequence of mass value to adjoin in queue.
Wherein, it is described by adjoin queue, pixel mass value to adjoining queue reordering the step of be specially：
Mass value highest point in queue is adjoined in taking-up, using one of the mass value peak consecutive points deployed as reference
Line phase expansion is clicked through, the point is marked for processed point, not processed point, which is put into, in 4 consecutive points processed point adjoins team
In row, and by mass value height to adjoining queue reordering.
Further, methods described also includes：
Build the interference speckle pattern before and after digital speckle interference measuring system, the tested composition deformation of collection.
Further, the digital speckle interference measuring system is specially：
The laser of laser emitting is after spectroscope, and a branch of light irradiation measured object surface, another light beam is saturating through overcoupling
Mirror is used as object light along optical fiber transmission；
Diffusing for measured object sequentially passes through light billows, imaging len, with object light formation speckle interference, passes through CCD
Camera gathers speckle interference figure.
The beneficial effect for the technical scheme that the present invention is provided is：
1st, the present invention uses EWT algorithms, and it is that signal is handled in wavelet frame, both can effectively be avoided
Modal overlap problem in EMD decomposable processes, while also remaining the advantage that EMD handles non-stationary signal, extracts natural mode of vibration
Component；
2nd, for including noise component(s) in the speckle pattern of collection, the present invention proposes the mutual information adaptive method based on EWT, can
To reject the noise component(s) in image, the fundamental component for including deformation information is obtained；
3rd, the present invention using quality lead phase unwrapping algorithm (algorithm is known to those skilled in the art, the present invention
Embodiment is not repeated this) and Zernike fitting of a polynomial algorithms phase is handled, obtain accurate phase letter
Breath, reduces phase error, improves deformation measurement precision.
Brief description of the drawings
Fig. 1 is the flow chart of the deformation of body measuring method based on experience wavelet transformation；
Fig. 2 is the structural representation of digital speckle interference measuring system；
Fig. 3 is the schematic diagram of tested disk；
Fig. 4 (a) is the schematic diagram of the speckle pattern gathered before deformation；
Fig. 4 (b) is the schematic diagram of the speckle pattern gathered after deformation；
Fig. 5 is the schematic diagram of phase masses figure；
Fig. 6 is the schematic diagram resequenced according to mass value height to queue Q；
Fig. 7 is deformation phase diagram；
Fig. 8 is the phase schematic diagram after deformation demodulation；
Fig. 9 is deformation graphics.
Embodiment
To make the object, technical solutions and advantages of the present invention clearer, further is made to embodiment of the present invention below
It is described in detail on ground.
Embodiment 1
A kind of deformation of body measuring method based on experience wavelet transformation, referring to Fig. 1, the deformation of body measuring method includes
Following steps：
101：Carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation, obtain a series of mode function point
Amount, i.e. FMAM composition；
102：The association relationship between FMAM composition and former speckle pattern is calculated, is extracted according to association relationship comprising deformation
The principal component of information, removes noise component(s)；
103：Wrapped phase is calculated according to principal component, Hilbert converter techniques, and progress phase unwrapping is oriented to according to quality
Wrap up in；
104：The carrier frequency eliminated using Zernike fitting of a polynomials in Phase- un- wrapping obtains true phase；Before deformation
True phase afterwards carries out subtracting each other acquisition deformation of body information.
Wherein, carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation in step 101, obtain a series of
Mode function component the step of be specially：
First with Meyer Construction of Wavelets experience scaling functions and experience wavelet function；To experience scaling function and experience
Wavelet function carries out the radio-frequency component and low-frequency component that convolution obtains picture；
FMAM component after being decomposed according to radio-frequency component and low-frequency component.
Wherein, the association relationship calculated between FMAM composition and former speckle pattern in step 102, according to association relationship
Extract comprising deformation information principal component the step of be specially：
Mutual information after calculating original picture and decomposing between FMAM component；By mutual information, the frequency modulation of picture is defined
The sensitive factor of amplitude modulation component；
All FMAM components are resequenced according to the order of sensitive factor from small to large；
The difference of two neighboring FMAM component sensitive factor is obtained, principal component is obtained by minimal difference, noise is removed
Component.
Wherein, in step 103 according to principal component, Hilbert converter techniques calculate wrapped phase, and according to quality be oriented into
The step of line phase unpacking is specially：
Principal component comprising deformation information is subjected to Hilbert transform, and wrapped phase is obtained by arc tangent；Calculate
The Quality Map of wrapped phase figure, and the mass value of all pixels point is ranked up；
The mass value for obtaining by the mass value of Quality Map, pixel 4 consecutive points for depositing starting point adjoins
Queue；By adjoin queue, pixel mass value to adjoining queue reordering.
Before step 101, this method also includes：
Build the interference speckle pattern before and after digital speckle interference measuring system, the tested composition deformation of collection.
Further, digital speckle interference measuring system is specially：
The laser of laser emitting is after spectroscope, and a branch of light irradiation measured object surface, another light beam is saturating through overcoupling
Mirror is used as object light along optical fiber transmission；
Diffusing for measured object sequentially passes through light billows, imaging len, with object light formation speckle interference, passes through CCD camera
Gather speckle interference figure.
In summary, the embodiment of the present invention is realized under the premise of single width speckle pattern by above-mentioned steps 101- steps 104
Modal overlap phenomenon present in EMD decomposable processes is avoided, single width speckle pattern is handled using EWT, phase error is reduced,
Obtain accurate deformation information.
Embodiment 2
The scheme in embodiment 1 is further introduced with reference to specific calculation formula, example, Fig. 2-Fig. 9,
It is described below：
201：Digital speckle interference measuring system is built with reference to Fig. 2, gathering tested disk using the CCD camera in system becomes
Speckle pattern before and after shape；
The detailed operation of the step is：
1) digital speckle interference measuring system is built, the measuring system is made up of CCD camera, imaging len, laser etc.；
Wherein, the light path of the measuring system is as shown in Fig. 2 the laser of laser emitting is divided into two-beam by spectroscope,
A branch of light irradiation measured object surface, another light beam is used as object light, the diffusing reflection of measured object by coupled lens along optical fiber transmission
Light sequentially passes through light billows, imaging len, and with object light formation speckle interference, speckle interference figure is gathered by CCD camera.
When implementing, CCD camera is using the STC-CL152A of SENTECH companies of Japan production, the target surface of the CCD camera
Size is 1.27cm (1/2 inch), and imaging region h × v=6.4mm × 4.8mm, imaging lens use Jiao of Teng Long companies of Japan
It is that can be achieved measurement away from the camera lens (camera lens specification is 2/3 inch) that f is 8mm, light source uses a wavelength for 532nm single longitudinal mode
Green (light) laser, the material for being tested disc face plate is copper sheet.
Wherein, the embodiment of the present invention is not limited to the size of copper sheet, is set according to the need in practical application.
2) the interference speckle pattern before tested disk (i.e. copper sheet, referring to Fig. 3) is deformed is gathered first with CCD camera, then
Accurate deformation force is applied to copper sheet, deformation is brought it about, light source is opened, the interference after copper sheet deformation is gathered using CCD camera
Speckle pattern.Before and after the deformation of collection shown in speckle pattern such as Fig. 4 (a) and Fig. 4 (b).
Wherein, the embodiment of the present invention is not limited to the model of light source, CCD camera etc., as long as above-mentioned functions can be completed
Device.
When implementing, the size of deformation force of the embodiment of the present invention to being applied on copper sheet is not limited, according to reality
Set the need in.
202：Experience wavelet decomposition is carried out respectively to interference speckle pattern before and after deformation, a series of mode function point is obtained
Measure, i.e. FMAM composition, the detailed operation of the step is：
EWT methods are that, by the frequency spectrum adaptivenon-uniform sampling to speckle picture in wavelet frame, obtaining has compact schemes Fu
In leaf frequency spectrum FMAM composition.
1) (it is a kind of wavelet basis, known to those skilled in the art, the embodiment of the present invention first with Meyer small echos
This is not repeated) construction experience scaling functionWith experience wavelet function
In formula：ω is frequency；γ is constant；ωnFor the average of adjacent maximum point；β (x) be auxiliary function (i.e.For x)；N is extreme point number.
β (x)=x4(35-84x+70x2-20x3)
Wherein, x is [0,1].
2) convolution is carried out to picture by experience scaling function and experience wavelet function, obtains the radio-frequency component of pictureAnd low-frequency component
Wherein, f (t) is picture；ψn(t) it is experience wavelet function；F (ω) is the Fourier transform of picture；For warp
Test scaling function；F-1For inverse fourier transform.
3) the FMAM component f after being decomposed according to radio-frequency component and low-frequency componentk(t)。
Wherein, f0(t) it is first FMAM component；For radio-frequency component；ψk(t) it is experience scaling function；k
For the component number after decomposition.
203：The association relationship between FMAM component and former speckle pattern is calculated, according to the extraction of association relationship adaptively
Principal component comprising deformation information, removes noise component(s)；
1) FMAM component (i.e. f after calculating original picture f (t) and decomposingk(t), k=1,2,3...N) between mutual trust
Cease μk(t)；
μ=<μk>, k=1,2,3...N
Wherein, the calculating process of the step is known to those skilled in the art, and the embodiment of the present invention is not repeated this.
2) the sensitive factor Z of picture f (t) FMAM component is definedk；
3) all FMAM components are resequenced according to the order of sensitive factor from small to large, obtains new sequence
Row<F'k>, k=1,2,3...N, Z1'≥Z'2≥...Z'N-1≥Z'N, Z'kFor the sensitive factor after sequence.
4) difference of two neighboring FMAM component sensitive factor is obtained, minimal difference is found out afterwards.
dk=Z'k-Z'k+1
Utilize minimal difference dkFind out Z'k, by Z'kCorresponding sequence k finds out its corresponding former sequence fk(t), then decompose
Afterwards from fk+1(t) it is all background or noise component(s) that component, which starts later component, and preceding n component is to include primary deformable information
Component.
204：Wrapped phase is calculated using Hilbert converter techniques, and progress Phase- un- wrapping is oriented to according to quality；
1) the principal component C (x, y) comprising deformation information is subjected to Hilbert transform first, and wrapped by arc tangent
Wrap up in phase；
Wherein, Re { } and Im { } represents real and imaginary parts respectively；foFor frequency；ψ (x, y) is phase.
2) Quality Map of wrapped phase figure is calculated, and the mass value of all pixels point is ranked up, wrapped phase is ψ,
So its Quality Map is q, its mathematic(al) representation：
Wherein, qm,nFor Quality Map；M and n is pixel；WithFor phase local derviation；ψi,jFor phase；I and j is phase
The value put on figure.
3) mass value highest point is taken out from Quality Map as the starting point of phase unwrapping, while starting point is labeled as
4 consecutive points of starting point, are carried out mark 4 after phase unwrapping, phase unwrapping by breaking up point by reference point of starting point respectively
Individual consecutive points are breaking up point.4 consecutive points one is stored in by the height sequence of its mass value simultaneously to adjoin in queue Q；
Referring to Fig. 5, for example：A points are mass value highest point, using A points as phase unwrapping starting point, while by A points
Labeled as breaking up point, 4 consecutive points of A points are respectively B, C, D and E.B, C, D and E are subjected to phase with A points position reference point respectively
Position expansion (process specifically deployed is known to those skilled in the art, and the embodiment of the present invention is not repeated this), phase exhibition
After opening, by B, C, D and E point labeled as breaking up point.B, C, D and E are ranked up according to the height of mass value respectively simultaneously, will
Ranking results are stored in one and adjoined in queue Q.
Wherein, Q value is relevant according to the quantity of mass value, and the embodiment of the present invention is without limitation.
4) take out adjoin mass value highest point in queue Q, using one of the mass value peak consecutive points deployed as
Reference point carries out phase unwrapping, and it is processed point to mark the point, and point not processed in its 4 consecutive points is put into and adjoins queue
In Q, and queue Q is resequenced by mass value height.
Referring to Fig. 6, for example：A points are mass value highest point, and the consecutive points B points deployed of A points is as a reference point,
Carry out phase unwrapping again to B points, mark B points are processed point, by 4 consecutive points of B points (for example：For F, G, H and I) in not by
The point of processing is (for example：For G, H and I) it is put into and adjoins in queue Q, while will be resequenced according to the height of mass value to queue Q.
5) it steps be repeated alternatively until that it is sky to adjoin queue Q.
205：The carrier frequency eliminated using Zernike fitting of a polynomials in Phase Unwrapping Algorithm obtains true phase, goes after carrier frequency
Phase diagram it is as shown in Figure 7.The detailed operation of the step is：
1) carrier frequency is eliminated using Zernike fitting of a polynomials, the continuous phase after expansion is expressed as n polynomial group
Close.First in plane of reference region the polynomial coefficients of Zernike are calculated using datum；
ψ (x', y')=a0uo(x',y')+a1u1(x',y')+...+agug(x',y')+...+an-1un-1(x',y')
Wherein, ψ (x', y') and ui(x', y') etc. is given data, and a can be calculated using these given datas0…agDeng；
a0…agFor polynomial coefficient.
2) it is designated asBeing write as the polynomial linear combinations of Zernike is：
206：To the true phase before and after deformationSubtracted each other, and deformation of body letter is obtained using phase changing capacity
Breath, obtains deformation demodulation phase as shown in figure 8, deformation of body graphics is as shown in Figure 9.
Wherein, as can be seen from Figure 8 this method can effectively remove bias light or noise, obtain high-quality phase
Figure；As can be seen from Figure 7 this method can be measured to deformation of body, obtain the deformation information of different directions.
In summary, the embodiment of the present invention is realized under the premise of single width speckle pattern by above-mentioned steps 201- steps 206
Modal overlap phenomenon present in EMD decomposable processes is avoided, single width speckle pattern is handled using EWT, phase error is reduced,
Obtain accurate deformation information.
The embodiment of the present invention is to the model of each device in addition to specified otherwise is done, and the model of other devices is not limited,
As long as the device of above-mentioned functions can be completed.
It will be appreciated by those skilled in the art that accompanying drawing is the schematic diagram of a preferred embodiment, the embodiments of the present invention
Sequence number is for illustration only, and the quality of embodiment is not represented.
The foregoing is only presently preferred embodiments of the present invention, be not intended to limit the invention, it is all the present invention spirit and
Within principle, any modification, equivalent substitution and improvements made etc. should be included in the scope of the protection.
Claims (9)
1. a kind of deformation of body measuring method based on experience wavelet transformation, it is characterised in that the deformation of body measuring method
Comprise the following steps：
Carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation, obtain a series of mode function component, that is, adjust
Frequency amplitude modulated component；
The association relationship between FMAM composition and former speckle pattern is calculated, the master for including deformation information is extracted according to association relationship
Component, removes noise component(s)；
Wrapped phase is calculated according to principal component, Hilbert converter techniques, and progress Phase- un- wrapping is oriented to according to quality；
The carrier frequency eliminated using Zernike fitting of a polynomials in Phase- un- wrapping obtains true phase；To true before and after deformation
Phase carries out subtracting each other acquisition deformation of body information.
2. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 1, it is characterised in that institute
State and carry out experience wavelet decomposition respectively to the interference speckle pattern before and after deformation, the step of obtaining a series of mode function component has
Body is：
First with Meyer Construction of Wavelets experience scaling functions and experience wavelet function；To experience scaling function and experience small echo
Function carries out the radio-frequency component and low-frequency component that convolution obtains picture；
FMAM component after being decomposed according to radio-frequency component and low-frequency component.
3. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 1, it is characterised in that institute
The association relationship between calculating FMAM composition and former speckle pattern is stated, the master comprising deformation information point is extracted according to association relationship
Amount, remove noise component the step of be specially：
Mutual information after calculating original picture and decomposing between FMAM component；By mutual information, the FMAM of picture is defined
The sensitive factor of component；
All FMAM components are resequenced according to the order of sensitive factor from small to large；
The difference of two neighboring FMAM component sensitive factor is obtained, principal component is obtained by minimal difference, point of noise is removed
Amount.
4. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 3, it is characterised in that institute
Stating the step of obtaining principal component, the component of removal noise by minimal difference is specially：
The sensitive factor after sequence is found out using minimal difference, the former sequence f of the corresponding retrieval of the sensitive factor after sortingk
(t), from fk+1(t) it is all background or noise component(s) that component, which starts later component, and preceding n component is main deformation information
Component.
5. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 1, it is characterised in that institute
State and wrapped phase is calculated according to principal component, Hilbert converter techniques, and it is specific according to the step of quality guiding progress Phase- un- wrapping
For：
Principal component comprising deformation information is subjected to Hilbert transform, and wrapped phase is obtained by arc tangent；Calculate parcel
The Quality Map of phase diagram, and the mass value of all pixels point is ranked up；
The mass value for obtaining by the mass value of Quality Map, pixel 4 consecutive points for depositing starting point adjoins queue；
By adjoin queue, pixel mass value to adjoining queue reordering.
6. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 5, it is characterised in that institute
State the mass value that 4 consecutive points for depositing starting point are obtained by the mass value of Quality Map, pixel and adjoin queue
Step is specially：
Mass value highest point is taken out from Quality Map as the starting point of phase unwrapping, by starting point labeled as breaking up point,
4 consecutive points of starting point carry out phase unwrapping by reference point of starting point respectively, and 4 consecutive points of mark are breaking up point；By 4
Individual consecutive points are stored in one by the height sequence of mass value and adjoined in queue.
7. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 5, it is characterised in that institute
State by adjoin queue, pixel mass value to adjoining queue reordering the step of be specially：
Mass value highest point in queue is adjoined in taking-up, using one of the mass value peak consecutive points deployed as with reference to click-through
Line phase deploys, and marks the point for processed point, and not processed point, which is put into, in 4 consecutive points processed point adjoins queue
In, and by mass value height to adjoining queue reordering.
8. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 1, it is characterised in that institute
Stating method also includes：
Build the interference speckle pattern before and after digital speckle interference measuring system, the tested composition deformation of collection.
9. a kind of deformation of body measuring method based on experience wavelet transformation according to claim 8, it is characterised in that institute
Stating digital speckle interference measuring system is specially：
The laser of laser emitting is after spectroscope, a branch of light irradiation measured object surface, and another light beam passes through coupled lens edge
Optical fiber transmission is used as object light；
Diffusing for measured object sequentially passes through light billows, imaging len, with object light formation speckle interference, passes through CCD camera
Gather speckle interference figure.
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