CN107144782A - 基于连分数存储的集成电路测试数据压缩方法 - Google Patents
基于连分数存储的集成电路测试数据压缩方法 Download PDFInfo
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- CN107144782A CN107144782A CN201710267075.XA CN201710267075A CN107144782A CN 107144782 A CN107144782 A CN 107144782A CN 201710267075 A CN201710267075 A CN 201710267075A CN 107144782 A CN107144782 A CN 107144782A
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- 238000012360 testing method Methods 0.000 title claims abstract description 103
- 238000000034 method Methods 0.000 title claims abstract description 32
- 238000013144 data compression Methods 0.000 title claims abstract description 10
- 239000013598 vector Substances 0.000 claims description 26
- GNFTZDOKVXKIBK-UHFFFAOYSA-N 3-(2-methoxyethoxy)benzohydrazide Chemical compound COCCOC1=CC=CC(C(=O)NN)=C1 GNFTZDOKVXKIBK-UHFFFAOYSA-N 0.000 claims description 3
- 238000007906 compression Methods 0.000 abstract description 16
- 230000006835 compression Effects 0.000 abstract description 16
- 230000009182 swimming Effects 0.000 abstract 4
- 230000006837 decompression Effects 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 3
- FGUUSXIOTUKUDN-IBGZPJMESA-N C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 Chemical compound C1(=CC=CC=C1)N1C2=C(NC([C@H](C1)NC=1OC(=NN=1)C1=CC=CC=C1)=O)C=CC=C2 FGUUSXIOTUKUDN-IBGZPJMESA-N 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 230000001755 vocal effect Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318335—Test pattern compression or decompression
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Compression, Expansion, Code Conversion, And Decoders (AREA)
Abstract
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CN201710267075.XA CN107144782B (zh) | 2017-04-21 | 2017-04-21 | 基于连分数存储的集成电路测试数据压缩方法 |
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CN201710267075.XA CN107144782B (zh) | 2017-04-21 | 2017-04-21 | 基于连分数存储的集成电路测试数据压缩方法 |
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CN107144782A true CN107144782A (zh) | 2017-09-08 |
CN107144782B CN107144782B (zh) | 2019-05-14 |
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CN201710267075.XA Active CN107144782B (zh) | 2017-04-21 | 2017-04-21 | 基于连分数存储的集成电路测试数据压缩方法 |
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Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050163314A1 (en) * | 2004-01-23 | 2005-07-28 | Daniel Bleichenbacher | Method and apparatus for compressing rabin signatures |
CN101604974A (zh) * | 2009-04-21 | 2009-12-16 | 陈向前 | 一种具有相同游程长度的测试数据压缩编码、解码方法及专用解码单元 |
CN101968528A (zh) * | 2010-08-19 | 2011-02-09 | 詹文法 | 集成电路测试中的测试数据压缩方法 |
CN102043126A (zh) * | 2010-11-11 | 2011-05-04 | 浙江大学 | 一种基于测试向量相容的三游程编码压缩方法及其解压缩方法 |
CN104753541A (zh) * | 2015-04-27 | 2015-07-01 | 安庆师范学院 | 无理数存储测试向量的测试数据压缩方法 |
-
2017
- 2017-04-21 CN CN201710267075.XA patent/CN107144782B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20050163314A1 (en) * | 2004-01-23 | 2005-07-28 | Daniel Bleichenbacher | Method and apparatus for compressing rabin signatures |
CN101604974A (zh) * | 2009-04-21 | 2009-12-16 | 陈向前 | 一种具有相同游程长度的测试数据压缩编码、解码方法及专用解码单元 |
CN101968528A (zh) * | 2010-08-19 | 2011-02-09 | 詹文法 | 集成电路测试中的测试数据压缩方法 |
CN102043126A (zh) * | 2010-11-11 | 2011-05-04 | 浙江大学 | 一种基于测试向量相容的三游程编码压缩方法及其解压缩方法 |
CN104753541A (zh) * | 2015-04-27 | 2015-07-01 | 安庆师范学院 | 无理数存储测试向量的测试数据压缩方法 |
Non-Patent Citations (1)
Title |
---|
詹文法等: "利用整数存储无理数的测试数据编码压缩方法", 《计算机辅助设计与图形学学报》 * |
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Effective date of registration: 20200619 Address after: 246000 Anhui province Anqing City Linghu Road No. 128 Patentee after: ANQING NORMAL University Address before: 246011 Anhui city of Anqing province Jixian Yixiu District Road No. 1318 Patentee before: Wu Haifeng |
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Effective date of registration: 20221206 Address after: 518000 909, Building 49, No. 3, Queshan Yunfeng Road, Taoyuan Community, Dalang Street, Longhua District, Shenzhen, Guangdong Patentee after: Shenzhen Morning Intellectual Property Operations Co.,Ltd. Address before: No. 128, Linghu Road, Anqing, Anhui, Anhui Patentee before: ANQING NORMAL University Effective date of registration: 20221206 Address after: 200082 2nd floor, No.25 Yixian Road, Yangpu District, Shanghai (centralized registration place) Patentee after: SHANGHAI WOSHI ELECTRONIC Co.,Ltd. Address before: 518000 909, Building 49, No. 3, Queshan Yunfeng Road, Taoyuan Community, Dalang Street, Longhua District, Shenzhen, Guangdong Patentee before: Shenzhen Morning Intellectual Property Operations Co.,Ltd. |
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