CN107144217B - 用于光学元件加工质量在线检测的光纤干涉共焦系统 - Google Patents
用于光学元件加工质量在线检测的光纤干涉共焦系统 Download PDFInfo
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- CN107144217B CN107144217B CN201710278345.7A CN201710278345A CN107144217B CN 107144217 B CN107144217 B CN 107144217B CN 201710278345 A CN201710278345 A CN 201710278345A CN 107144217 B CN107144217 B CN 107144217B
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02041—Interferometers characterised by particular imaging or detection techniques
- G01B9/02042—Confocal imaging
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Microscoopes, Condenser (AREA)
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CN201710278345.7A CN107144217B (zh) | 2017-04-25 | 2017-04-25 | 用于光学元件加工质量在线检测的光纤干涉共焦系统 |
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CN201710278345.7A CN107144217B (zh) | 2017-04-25 | 2017-04-25 | 用于光学元件加工质量在线检测的光纤干涉共焦系统 |
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CN107144217A CN107144217A (zh) | 2017-09-08 |
CN107144217B true CN107144217B (zh) | 2019-05-24 |
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Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107860776A (zh) * | 2017-11-22 | 2018-03-30 | 佛山科学技术学院 | 一种镜片缺陷检测装置及方法 |
CN108562241B (zh) * | 2018-03-08 | 2020-07-24 | 复旦大学 | 基于光纤束的数字全息柔性测量的装置与方法 |
CN110596818A (zh) * | 2019-10-17 | 2019-12-20 | 中天宽带技术有限公司 | 一种薄膜滤波片型波分复用器贴片工装及工艺 |
US11835472B2 (en) | 2021-08-05 | 2023-12-05 | Zhejiang University | Device and method for detecting subsurface defect of optical component |
CN113607750B (zh) * | 2021-08-05 | 2022-06-14 | 浙江大学 | 一种用于光学元件亚表面缺陷检测的装置及方法 |
CN114160967A (zh) * | 2021-12-29 | 2022-03-11 | 南京萃智激光应用技术研究院有限公司 | 一种随动式激光加工装置及其控制方法 |
CN114353671B (zh) * | 2022-01-14 | 2022-11-01 | 西安交通大学 | 实现位移和角度同步测量的双波长衍射干涉系统及方法 |
CN114754705B (zh) * | 2022-04-11 | 2023-05-05 | 华侨大学 | 垂直扫描白光干涉谱辅助穆勒矩阵椭偏测量系统及方法 |
CN115815792B (zh) * | 2023-02-17 | 2023-06-06 | 山东省科学院激光研究所 | 一种可视化的激光加工系统及方法 |
CN117006971A (zh) * | 2023-09-25 | 2023-11-07 | 板石智能科技(深圳)有限公司 | 一种三维形貌测量系统 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1293361A (zh) * | 2000-11-30 | 2001-05-02 | 中国科学院上海光学精密机械研究所 | 实时测量厚度与折射率的半导体激光干涉测量装置 |
CN101109618A (zh) * | 2007-08-23 | 2008-01-23 | 北京交通大学 | 利用合成波干涉全场纳米表面三维在线测量方法和系统 |
JP5975522B2 (ja) * | 2012-12-07 | 2016-08-23 | 日本電信電話株式会社 | 動的焦点移動型光干渉断層顕微鏡 |
Family Cites Families (1)
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GB0907277D0 (en) * | 2009-04-29 | 2009-06-10 | Univ Kent Kanterbury | Method for depth resolved wavefront sensing, depth resolved wavefront sensors and method and apparatus for optical imaging |
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2017
- 2017-04-25 CN CN201710278345.7A patent/CN107144217B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1293361A (zh) * | 2000-11-30 | 2001-05-02 | 中国科学院上海光学精密机械研究所 | 实时测量厚度与折射率的半导体激光干涉测量装置 |
CN101109618A (zh) * | 2007-08-23 | 2008-01-23 | 北京交通大学 | 利用合成波干涉全场纳米表面三维在线测量方法和系统 |
JP5975522B2 (ja) * | 2012-12-07 | 2016-08-23 | 日本電信電話株式会社 | 動的焦点移動型光干渉断層顕微鏡 |
Non-Patent Citations (2)
Title |
---|
光学镜面间距测量技术研究进展;师中华等;《激光与光电子学进展》;20150410(第4期);第040004-1至040004-6页 |
基于白光LED的光谱共焦位移传感器;王津楠等;《中国测试》;20170131;第43卷(第1期);第69-73页 |
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Effective date of registration: 20210817 Address after: 215000 floor 2, building 1, zone B, Weiting industrial Plaza, No. 9, zhanye Road, Suzhou Industrial Park, Jiangsu Province Patentee after: Suzhou field Precision Manufacturing Co.,Ltd. Address before: Beilin District Xianning West Road 710049, Shaanxi city of Xi'an province No. 28 Patentee before: XI'AN JIAOTONG University |
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Address after: Room 102, Building 22, No. 60 Weixin Road, Industrial Park, Suzhou City, Jiangsu Province, 215000 Patentee after: Suzhou Field Technology Group Co.,Ltd. Address before: 215000 floor 2, building 1, zone B, Weiting industrial Plaza, No. 9, zhanye Road, Suzhou Industrial Park, Jiangsu Province Patentee before: Suzhou field Precision Manufacturing Co.,Ltd. |