CN107132429A - Noise measuring system and method - Google Patents

Abstract

A noise testing method, applied to a test control device, the test control device is connected to a test box, a mechanical arm and a device to be tested are fixed in the test box, and a photographing device and a probe/probe are fixed on the mechanical arm , the test control method includes: controlling the movement of the mechanical arm to drive the probe to scan the device under test to obtain noise data; determining the noise source area according to the noise data; controlling the movement of the mechanical arm to drive the probe to carry out the determined noise source area scanning to obtain radiation data; and performing electromagnetic simulation according to the noise data and radiation data to determine the cause of the noise, generate a reference solution and optimize the circuit. The noise testing system and method of the present invention can automatically control the mechanical arm to drive the probe/probe to perform a scanning test, and can perform electromagnetic simulation according to the scanning test results of the probe/probe to find the cause of the noise and Generate a reference solution.

Description

Noise test system and method

technical field

The invention relates to a noise testing system, in particular to a noise testing system and method using a probe to test noise.

Background technique

General electromagnetic interference (Electro-Magnetic Interference, EMI) engineers usually spend a lot of time when debugging. They use near-field testing tools to find out the noise source. The object is scanned to find the area with large radiation, and then further use the near-field probe (measurement E: electric field) to measure each signal in this area on the circuit board to find out the line where the noise source is located. At the same time, it is necessary to analyze how it radiates out, whether it radiates through other components, such as cables or heat sinks, etc., and then find out the real cause of the noise, and then the engineer begins to add some countermeasures. Test and verify repeatedly, and finally find a countermeasure.

Contents of the invention

In view of this, it is necessary to provide a noise testing system and method to solve the above problems.

A noise testing system includes a test box and a test control device. A mechanical arm and a device to be tested are fixed in the test box. A photographing device and a probe/probe are fixed on the mechanical arm. The test control device includes a memory and a processing The memory stores a plurality of authentication scenarios and a plurality of instruction sets; the processor is used to execute the instruction set so that the test control device executes: controlling the movement of the mechanical arm to drive the probe to scan the device under test to obtain noise data; determine the noise source area according to the noise data; control the movement of the mechanical arm to drive the probe to scan the determined noise source area to obtain radiation data; perform electromagnetic simulation based on the noise data and radiation data to determine the cause of the noise and generate a reference Solve and optimize the circuit.

A noise testing method, applied to a test control device, the test control device is connected to a test box, a mechanical arm and a device to be tested are fixed in the test box, and a photographing device and a probe/probe are fixed on the mechanical arm , the test control method includes: controlling the movement of the mechanical arm to drive the probe to scan the device under test to obtain noise data; determining the noise source area according to the noise data; controlling the movement of the mechanical arm to drive the probe to carry out the determined noise source area scanning to obtain radiation data; and performing electromagnetic simulation according to the noise data and radiation data to determine the cause of the noise, generate a reference solution and optimize the circuit.

The noise testing system and method of the present invention can automatically control the mechanical arm to drive the probe/probe to perform a scanning test, and can perform electromagnetic simulation according to the scanning test results of the probe/probe to find the cause of the noise and Generate a reference solution.

Description of drawings

Fig. 1 is a schematic diagram of a noise testing system in a preferred embodiment of the present invention.

Fig. 2 is an internal structure diagram of a test box according to a preferred embodiment of the present invention.

Fig. 3 is the structure of the revolving door of the test box in Fig. 2 .

Fig. 4 is a structural diagram of the mechanical arm in Fig. 2 .

FIG. 5 is a perspective view of the test module in FIG. 2 .

FIG. 6 is a perspective view of the test fixture in FIG. 2 .

FIG. 7 is a block diagram of a test control device in a preferred embodiment of the present invention.

FIG. 8 is a flow chart of the method of the test control system in a preferred embodiment of the present invention.

Fig. 9 is a flow chart of data import in a preferred embodiment of the present invention.

Fig. 10 is a calibration flowchart of a preferred embodiment of the present invention.

Fig. 11 is a flow chart of 3D scanning in a preferred embodiment of the present invention.

FIG. 12 is a flow chart of scanning a robot arm in a preferred embodiment of the present invention.

Fig. 13 is a flow chart of electromagnetic simulation in a preferred embodiment of the present invention.

Description of main component symbols

Noise Test System 1000 test box 1 test control device 2 Signal Analysis Instrument 3 cabinet 10 revolving door 12 Revolving door body 120 Support bearing 122 Support shaft 124 revolving door drive 126 Mechanical arm 14 X-axis mechanical arm 140 Y-axis mechanical arm 142 Z-axis mechanical arm 144 Robotic arm transmission 146 test module 16 Detection module 160 first drive module 161 Second drive module 162 Connecting rod 167 Fixing seat 163 through hole 164 Probe/probe 165 Connector 166 filming device 17 Test Fixture 18 fixed part 180 Flip drive 182 Connection 184 DUT 110 test control system 20 Reset Calibration Module 202 data import module 204 3D scanning module 206 Robot Arm Detection Module 208 Electromagnetic Simulation Module 210 memory twenty two processor twenty four monitor 26

The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings.

detailed description

Please refer to Fig. 1, the present invention provides a noise test system 1000, the test system 1000 can control the probe probe to automatically test, and perform electromagnetic simulation according to the probe probe test scanning data to determine the real cause of the noise And provide possible optimization schemes.

The noise test system 1000 includes a test box 1 and a test control device 2 . The test box 1 is used to perform a scan test on a device under test (Equipment Under Test, EUT) using a probe probe to obtain noise scan data. The test control device 2 is used to control the test box 1 to perform a test and analyze and process the noise scanning data of the test box 1 to determine the cause of the noise and obtain a possible solution. In other implementation manners, the noise test system 1000 may further include a signal analysis instrument 3 (such as an oscilloscope) 3, the signal analysis instrument 3 is used to connect with the test box 1 and the test control device 2, For receiving the detected signal from the test box 1 and outputting it through the oscilloscope 2, the test control device 2 can obtain the waveform output by the oscilloscope 2 for further analysis and processing.

Referring to FIG. 2 , it is an internal structure diagram of a test box 1 according to a preferred embodiment of the present invention. The test box includes a box body 10 , a revolving door 12 , a robot arm 14 , a test module 16 , a photographing device 17 and a test fixture 18 . The box body 10 has a roughly square structure, and the material of the box body contains a wave-absorbing material, so as to isolate radiation interference from the outside to the box body. The revolving door 12 is rotatably disposed on one side of the box body 10 , and can rotate relative to the box body 10 between an open position and a closed position to open or close the box body 10 . The revolving door 12 can be made of the same or similar material as the box body. When the revolving door 12 is in the closed position, it can isolate external noise interference, that is, it can avoid the test of the EUT110 in the external environment. cause disturbance. The photographing device 17 is used for 3D scanning the device under test 110 . The photographing device 17 may include one or more cameras. For ease of description, in the following embodiments, the photographing device 17 includes one camera.

Further referring to FIG. 3 , one side of the box body 10 is provided with a support shaft 124 , a support bearing 122 and a revolving door driving device 126 , and the revolving door body 120 is rotatably fixed on the support shaft 124 . The revolving door driving device 126 can drive the supporting shaft 124 to rotate so as to drive the revolving door body 120 fixed on the supporting shaft 124 to rotate relative to the box body 10 . In this embodiment, the revolving door driving device 126 can be an air cylinder. In other implementations, the revolving door driving device 126 can also be any other suitable driving device, such as a motor.

Further referring to FIG. 4 , the robotic arm 14 includes an X-axis arm 140 , a Y-axis arm 142 and a Z-axis arm 144 . The X-axis arm 140, the Y-axis arm 142, and the Z-axis arm 144 can move along the X-axis, Y-axis, and Z-axis respectively, thereby driving the test module 16 fixed on the mechanical arm 14 to move up, down, left, and right in all directions. carry out testing. Each mechanical arm 140, 142, 144 is connected to a mechanical arm transmission device 146, and the mechanical arm transmission device 146 drives the mechanical arm 14 to perform corresponding movements under the drive of the mechanical arm driving device (not shown in the figure). .

Please refer to FIG. 5 , the testing module 16 includes a detection module 160 , a connecting rod 167 , a first driving module 161 and a second driving module 162 . The detection module 160 includes a fixing seat 163 and a probe/probing rod 165 . The fixing seat 163 is provided with a plurality of through holes 164 , and each through hole 164 is used for accommodating a probe/probing rod therein. The connecting rod 167 is used to connect the fixing base 163 and the first driving module 161, and a connector 166 is provided at one end of the probe/probe 165 connected to the connecting rod 167, and the connector 166 Used to connect with the connecting rod 167 , driven by the first driving module, the probe/probe 165 can extend out of the fixing base 163 for testing.

The second driving device 162 is used to drive the fixed seat to rotate, so that different probes/probes accommodated in different through holes 164 can be connected to the probe connecting rod 167, thereby realizing automatic replacement of probes/probes. The purpose of the probe. The first driving module 161 and the second driving module 162 may be devices with driving functions such as cylinders and motors. In this embodiment, the first driving module 161 is a pen-shaped cylinder, and the second driving module 162 is.

Please refer to FIG. 6 , which is a structural diagram of a test fixture 18 according to a preferred embodiment of the present invention. The test fixture 18 is used to fix the device under test 110 under the probe/probe 165 so that the probe/probe 165 can perform a test scan. The test fixture 18 includes two symmetrical fixing parts 180 , an overturning driving part 182 and two connecting parts 184 . The fixing part 180 is fixed inside the box body 10 , and the two connecting parts 184 respectively connect opposite ends of the device under test 110 to the corresponding fixing parts 180 . The overturn driving part 180 can drive the connecting part 184 to overturn along the direction of the arrow shown in the figure, so as to drive the device under test 110 to overturn accordingly. The device under test 110 can be turned over at any angle between 0 and 180 degrees, so that the testing module 16 can test the back of the device under test 110 and multiple different angles.

Please refer to FIG. 7 , which is a block diagram of a test control device 2 in a preferred embodiment of the present invention. In this embodiment, the test control device 2 may include, but not limited to, a memory 22 , a processor 22 and a display 26 . The memory 22 can be an internal storage unit of the test control device 2, such as a hard disk or a memory, and can also be a plug-in storage device, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), Secure Digital (Secure Digital, SD) card, flash memory card (Flash Card). The memory 22 may also include both an internal storage unit and a plug-in storage device. Described processor 24 can be a central processing unit (Central Processing Unit, CPU), microprocessor or other data processing chips.

The test control system 20 is installed and operated in the test control device 2 . In this embodiment, the test control system 20 includes, but not limited to, a reset correction module 202 , a data import module 204 , a 3D scanning module 206 , a robotic arm detection module 208 , and an electromagnetic simulation module 210 . The function module referred to in the present invention refers to a series of program instruction segments that can be executed by the processor 24 of the test control device 2 and can complete fixed functions, which are stored in the memory 22 of the test control device 2 .

The reset correction module 202 is used to control the angle of the camera of the photographing device 17 and the position correction of the mechanical arm 14 before taking measurements, so that the pictures scanned by the photographing device 17 are more accurate. The arm 14 can be moved to the target position more accurately.

The data import module 204 is used to import reference data, which includes, but is not limited to, data files such as noise frequency, 3D diagram of the device under test, circuit diagram, and circuit board file.

The 3D scanning module 206 is used to control the photographing device 17 to perform 3D scanning on the device under test 110 to obtain a three-dimensional coordinate grid map of the device under test.

The manipulator detection module 208 is used to control the movement of the manipulator 14 so that the probe/probe 165 fixed on the test module 16 on the manipulator 14 performs a detection scan on the device under test 110 to Noise data of different parts of the device under test 110 are obtained.

The electromagnetic simulation module 210 is used to perform electromagnetic simulation according to the imported data and the noise data obtained by scanning, so as to determine the source and cause of the noise, and provide possible optimization solutions.

Please refer to FIG. 8 , which is a flowchart of a test control method 400 in a preferred embodiment of the present invention. The test control method can be executed by the test control device 2 in FIG. 7 . The process starts at step 402. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

Step 402, the data import module 204 imports reference data based on the user's selection, and the reference data includes, but is not limited to, data files such as noise frequency, 3D diagram of the device under test, circuit diagram, and circuit board file. It can be understood that the reference data may also be pre-stored in the memory 22 of the test control device 2, and in this case, the data importing step may be omitted.

Step 404 , the reset calibration module 202 controls the photographing device 17 and the robotic arm to perform calibration, and the detailed flowchart of the calibration is shown in FIG. 10 . It can be understood that the order of step 402 and step 404 can be exchanged.

Step 406 , the 3D scanning module 206 controls the photographing device 17 to perform 3D scanning on the device under test 110 , and combines the scanned 3D coordinate grid map with reference data for positioning. Specifically, the scanned 3D coordinate grid diagram is aligned and matched with the circuit diagram or circuit board diagram in the reference data, so as to obtain the three-dimensional coordinate position data of components or lines in the circuit diagram or circuit board diagram. Specifically, reference may be made to what is shown in FIG. 11 .

Step 408 , the robot arm detection module 208 controls the robot arm 14 to perform a near-field detection scan on the device under test 110 to obtain noise scan data of the device under test 110 . For details, refer to FIG. 12 .

Step 410 , the robotic arm detection module 208 reads the scanned noise data from the test box 1 , and determines a region with strong noise on the device under test 110 according to the noise data. In other implementation manners, the noise data can also be output to the signal analysis instrument 3 to display the scanned noise data more intuitively.

In step 412, the robot arm detection module 208 is further configured to determine possible problematic lines and detection points in the area with strong noise according to the reference data such as the circuit diagram of the area.

Step 414 , the robotic arm detection module 208 controls the probe to further scan and measure the potentially problematic lines and detection points according to the determined possible problematic lines and detection points to obtain radiation data. Similar to the noise data, the radiation data can also be output to the signal analysis instrument 3 to display the obtained radiation data more intuitively.

Step 416, the robot arm detection module 208 determines the radiation source line according to the radiation data.

Step 418 , the electromagnetic simulation module 210 locks the noise source area and performs electromagnetic simulation according to the noise data obtained by the near-field scanning, so as to assist in determining the noise source area.

Step 420, the electromagnetic simulation module 210 sets electromagnetic simulation parameters based on user operations or predetermined rules. The electromagnetic simulation parameters may include, but are not limited to, PCB stackup, physical parameters, component characteristics, material properties, input voltage source, current source and other parameters.

Step 422 , the electromagnetic simulation module 210 performs further PCB circuit and system simulation according to the set electromagnetic simulation parameters, the simulation result of step 418 and the radiation source circuit.

Step 424, the electromagnetic simulation module 210 finds possible coupling paths according to the simulation data and signal integrity.

Step 426 , the robotic arm detection module 208 controls the robotic arm 14 to hold a probe to measure the determined coupling path to obtain further radiation data.

Step 428, the electromagnetic simulation module 210 determines the real noise source and reason.

Step 430, the electromagnetic simulation module 210 generates a reference solution and optimizes the circuit. Specifically, the electromagnetic simulation module 210 can change the circuit settings and related parameters, and perform simulation to determine possible noise data, determine that the circuit corresponding to the smaller noise is the reference solution, and select one of the reference solutions to optimize the circuit according to requirements .

Please refer to FIG. 9 , which is a flowchart of a data import method 500 in a preferred embodiment of the present invention. The data importing method can be executed by the test control device 2 in FIG. 7 and can be applied to steps requiring data importing in the process shown in FIG. 8 . The process starts at step 502. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

In step 502, the data import module 204 determines a data import path according to user selection or input. The data path may be a local storage path of the test control device 2, or a network storage path, such as an FTP or Internet cloud storage path.

Step 504, the data import module 504 determines the type of data to be imported, specifically, it can be judged according to the suffix name of the data file.

Step 506, the data import module 506 judges whether the data to be imported conforms to the read rule. The read rule is a predetermined rule, for example, it may be file attribute values such as file size, file type, and file name.

Step 508 , the data import module 508 generates a corresponding graph according to the imported data, and displays it on the display 26 of the test control device 2 . In some embodiments, when the displayed graph is not the desired graph, steps 502 to 506 can be repeated to re-import.

Step 510, the data import module 508 prompts that the import is complete. Specifically, the prompt information may be output by means of popping up a text message, an indicator light, or a loudspeaker.

Step 512, if the file to be imported does not comply with the reading rule, the data import module 204 prompts an import error. The prompt information may be in a manner similar to prompting that the import is completed.

Please refer to FIG. 10 , which is a flowchart of a reset calibration method 600 according to a preferred embodiment of the present invention. The reset calibration method 600 can be executed by the test control device 2 shown in FIG. 7 and can be applied to steps requiring reset calibration in the process shown in FIG. 8 . The process starts at step 602. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

In step 602, the reset correction module 202 controls the photographing device 17 to adjust the camera angle. In other embodiments, the camera angle can be adjusted according to a user-defined angle value. In other embodiments, the reset correction module 202 may also set shooting parameters of the camera, such as brightness, delay, mode, shutter speed, etc., according to user operations.

Step 604, the reset correction module 204 controls the center point of the camera to align with the designated center point. In some embodiments, the specified center point may be the geometric center point of the device under test.

Step 606, the reset correction module 204 compares the picture taken by the camera with the preset picture. The preset picture may be pre-stored in the memory 22 of the test control device 2 , or imported through the data import module 204 .

Step 608 , the reset correction module 202 determines whether the overlapping rate of the picture taken by the shooting device 17 and the preset picture exceeds a predetermined ratio, for example, 75%. The predetermined ratio can be set to any appropriate value according to user requirements, such as 80%, 82%, 78% and so on. If the overlapping ratio exceeds the predetermined ratio, the process goes to step 610 , otherwise, the process returns to step 602 .

Step 610, the reset calibration module 202 judges that the camera calibration is completed, and sends a prompt message to remind the user that the camera calibration is completed.

Step 612, the reset correction module 202 generates a coordinate grid map according to the captured 3D picture.

Step 614, the reset correction module 202 sets the initial position of the probe according to the user operation. The set position may be a three-dimensional coordinate value on the three-dimensional grid map.

Step 616, the reset correction module 202 controls the probe to move to a predetermined initial position.

Step 618, the reset correction module 202 records and saves the coordinate value of the initial position.

Step 620, the reset calibration module 202 sets the initial position of the probe, and moves the probe to the initial position.

Step 622, the reset correction module 202 saves and records the coordinate value of the initial position.

In step 624, the reset calibration module 202 prompts the body hand calibration to be completed.

Please refer to FIG. 11 , which is a flowchart of a scanning method 700 in a preferred embodiment of the present invention. The scanning method 700 can be executed by the test control device 2 in FIG. 7 and can be applied to steps requiring 3D scanning in the process shown in FIG. 8 . The process starts at step 702. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

Step 702, the 3D scanning module 206 sets scanning parameters of the camera according to user operations. The scan parameters include, but are not limited to, shutter speed, brightness, mode, and the like.

Step 704 , the 3D scanning module 704 controls the photographing device 17 to perform 3D scanning according to the set scanning parameters to generate a coordinate map with a grid.

Step 706, the 3D scanning module 704 sets and marks the obtained coordinate map with grids, and aligns it with the imported map. The imported diagram includes a circuit diagram, a circuit board diagram, and the like of the device under test 110 . In other embodiments, the imported map may also be a map pre-stored in the memory of the test control device 2 .

Step 708 , the 3D scanning module 704 overlaps the coordinate map with the grid with the imported map to generate a composite map. According to the composite diagram, the coordinates of the circuit board and its circuit of the device under test 110 on the coordinate diagram can be obtained.

Please refer to FIG. 12 , which is a flowchart of a probe/probe scanning method 800 according to a preferred embodiment of the present invention. The probe/probe scanning method 800 can be executed by the test control device 2 in FIG. 7 and can be applied to the steps requiring probe/probe scanning in the process shown in FIG. 8 . The process starts at step 802. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

Step 802 , the robotic arm detection module 208 judges whether it is a probe scan or a probe scan according to a user operation. If it is a probe scan, the flow goes to step 804 , otherwise, the flow goes to step 810 .

In step 804, the robotic arm detection module 208 sets scanning parameters of the robotic arm according to user operations. The scanning parameters include, but are not limited to, scanning frequency, scanning density and scanning range.

Step 806, the robotic arm detection module 208 performs a detection scan according to the set scanning parameters.

Step 808 , the robotic arm detection module 208 reads the noise data obtained from the detection scan from the test box 1 , and generates a field strength map according to the detection scan data, and displays it on the display 26 .

Step 810, the robotic arm detection module 208 sets scanning parameters according to user operations, and the set probe scanning parameters include scanning frequency, density and range.

Step 812, selecting detection points according to the set scanning range.

Step 814 , the robotic arm detection module 208 scans the selected detection points according to the set probe scanning parameters to generate and record radiation data.

Please refer to FIG. 13 , which is a flowchart of an electromagnetic simulation method 900 in a preferred embodiment of the present invention. The electromagnetic simulation method 900 can be executed by the test control device 2 in FIG. 7 and can be applied to steps requiring electromagnetic simulation in the process shown in FIG. 8 . The process starts at step 902. According to different requirements, the order of the steps in the flow chart can be changed, and some steps can be omitted or combined.

Step 902 , the electromagnetic simulation module 210 reads the composite diagram and related files generated by the 3D scanning module 206 , and the related files include but not limited to circuit diagrams, circuit board files, noise data obtained by scanning, and the like.

904. The electromagnetic simulation module 210 sets electromagnetic simulation parameters according to user operations, and the electromagnetic simulation parameters include, but are not limited to, circuit board stacking, physical parameters, component characteristics, material properties, input voltage source, current source and other parameters .

Step 906 , the electromagnetic simulation module 210 extracts key network parameters from the simulation model, and the key network parameters include Signal Integrity (SI) and Power Supply Integrity (PI). Among them, PI includes the Z parameter, that is, the impedance parameter. If it is an SI parameter, go to step 910, and if it is a PI parameter, go to step 914.

Step 910, the electromagnetic simulation module 210 performs circuit simulation according to the set electromagnetic simulation parameters and the noise data obtained by scanning, so as to judge whether the circuit design is reasonable.

Step 912, the electromagnetic simulation module 210 converts the analysis signal generated during the simulation analysis process into a frequency domain signal.

Step 914, the electromagnetic simulation module 210 performs simultaneous switching noise (Simultaneous Switch Noise, SSN) simulation according to the set electromagnetic simulation parameters and the noise data obtained by scanning. The SSN simulation is a kind of power integrity simulation, which is used to judge whether the design of the power distribution system meets the requirements in the time domain.

Step 914, judge whether the current circuit design meets the design requirements according to the simulation results, if yes, the process ends, if not, return to step 904 to reset the simulation parameters until the simulation results show that the design requirements are met, so as to obtain a reference solution and optimize the circuit design plan.

Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention without limitation. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be Modifications or equivalent replacements can be made without departing from the spirit and scope of the technical solutions of the present invention.

Claims (10)

1. A noise test system, characterized in that, the noise test system comprises a test box and a test control device, a mechanical arm and a device to be tested are fixed in the test box, and a photographing device and a probe are fixed on the mechanical arm. As a probe, the test control device includes a memory and a processor, the memory stores multiple authentication scenarios and multiple instruction sets; the processor is used to execute the instruction set so that the test control device performs: Control the movement of the mechanical arm to drive the probe to scan the device under test to obtain noise data; Determine the noise source area based on the noise data; Control the movement of the mechanical arm to drive the probe to scan the determined noise source area to obtain radiation data; Electromagnetic simulation is performed according to the noise data and radiation data to determine the cause of the noise, generate a reference solution and optimize the circuit. 2. The noise testing system according to claim 1, wherein the processor is also used to execute an instruction set so that the test control device performs: controlling the photographing device to photograph to obtain a coordinate map with a grid; Import the circuit diagram of the device under test; aligning the coordinate map with the circuit map, and performing layer compositing to generate a composite map, wherein the electromagnetic simulation is based on the composite map and the noise data and the radiation data. 3. The noise testing system according to claim 2, wherein the processor is further configured to execute an instruction set so that the test control device executes: before controlling the shooting device to take pictures, it also includes The camera is calibrated. 4. The noise testing system according to claim 1, wherein the processor is further configured to execute an instruction set so that the test control device executes: before controlling the movement of the mechanical arm to drive the probe to scan Calibration of the robotic arm is also included. 5. The noise testing system according to claim 1, wherein the electromagnetic simulation includes signal integrity simulation and power supply integrity simulation. 6. A noise testing method applied to a test control device, characterized in that the test control device is connected with a test box, a mechanical arm and a device to be tested are fixed in the test box, and a photographing device is fixed on the mechanical arm and probes/probes, said test control method comprising: Control the movement of the mechanical arm to drive the probe to scan the device under test to obtain noise data; Determine the noise source area based on the noise data; controlling the movement of the mechanical arm to drive the probe to scan the determined noise source area to obtain radiation data; and Electromagnetic simulation is performed according to the noise data and radiation data to determine the cause of the noise, generate a reference solution and optimize the circuit. 7. noise testing method as claimed in claim 6, is characterized in that, described method also comprises: controlling the photographing device to photograph to obtain a coordinate map with a grid; Import the circuit diagram of the device under test; aligning the coordinate map with the circuit map, and performing layer compositing to generate a composite map, wherein the electromagnetic simulation is based on the composite map and the noise data and the radiation data. 8. The noise testing method according to claim 7, further comprising: calibrating the camera before controlling the photographing device to photograph. 9. The noise testing method according to claim 6, further comprising: before controlling the movement of the mechanical arm to drive the probe to scan, further comprising calibrating the mechanical arm. 10. The noise testing method according to claim 6, wherein the electromagnetic simulation includes signal integrity simulation and power supply integrity simulation.