CN107132429A - Noise measuring system and method - Google Patents
Noise measuring system and method Download PDFInfo
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- CN107132429A CN107132429A CN201610110762.6A CN201610110762A CN107132429A CN 107132429 A CN107132429 A CN 107132429A CN 201610110762 A CN201610110762 A CN 201610110762A CN 107132429 A CN107132429 A CN 107132429A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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Abstract
A kind of noise testing method, applied to test control device, the test control device is connected with a test box, and mechanical arm and test system are fixed with the test box, filming apparatus and probe/probe are fixed with mechanical arm, the test control method includes：The movement of control machinery arm is to drive probe to be scanned to test system to obtain noise data；Noise source region is determined according to noise data；The movement of control machinery arm is to drive probe to be scanned to obtain radiation data identified noise source region；And carry out Electromagnetic Simulation to determine noise reason and generation with reference to solution and optimization circuit according to the noise data and radiation data.The noise measuring system and method for the present invention, can automatically control the mechanical arm and drive the probe/probe to be scanned test, and can carry out Electromagnetic Simulation according to the probe/probe scanning test result, to find noise reason and generation with reference to solution.
Description
Technical field
The present invention relates to a kind of noise measuring system, the noise measuring system and method for more particularly to a kind of use probe probe test noise.
Background technology
General electromagnetic interference（Electro-Magnetic Interference, EMI）Engineer will generally be taken a significant amount of time except staggering the time, and noise source is found out using near-field test instrument, and engineer goes smoothly first is held close for a probe (measurement H:Magnetic field) slowly do the action that scans in determinand, find out width and penetrate larger region, then further using near field probe (measurement E:Electric field) remove each signal in the region in measuring circuit plate, go to find out circuit where noise source, it is that width is shot out in which way that it, which must also be analyzed, simultaneously, whether have and shot out through other component width, such as cable or fin etc., then find out real noise reason, and then engineer starts plus some countermeasures, test checking, finally finds out countermeasure repeatedly.
The content of the invention
In view of this, it is necessary to provide a kind of noise measuring system and method, to solve the above problems.
A kind of noise measuring system includes test box and test control device, mechanical arm and test system are fixed with the test box, filming apparatus and probe/probe are fixed with mechanical arm, the test control device includes memory and processor, and the memory storage has multiple certification scenes and multiple instruction collection；The processor is used to execute instruction collection the test control device is performed：The movement of control machinery arm is to drive probe to be scanned to test system to obtain noise data；Noise source region is determined according to noise data；The movement of control machinery arm is to drive probe to be scanned to obtain radiation data identified noise source region；Electromagnetic Simulation is carried out according to the noise data and radiation data to determine noise reason and generation with reference to solution and optimization circuit.
A kind of noise testing method, applied to test control device, the test control device is connected with a test box, and mechanical arm and test system are fixed with the test box, filming apparatus and probe/probe are fixed with mechanical arm, the test control method includes：The movement of control machinery arm is to drive probe to be scanned to test system to obtain noise data；Noise source region is determined according to noise data；The movement of control machinery arm is to drive probe to be scanned to obtain radiation data identified noise source region；And carry out Electromagnetic Simulation to determine noise reason and generation with reference to solution and optimization circuit according to the noise data and radiation data.
The noise measuring system and method for the present invention, can automatically control the mechanical arm and drive the probe/probe to be scanned test, and can carry out Electromagnetic Simulation according to the probe/probe scanning test result, to find noise reason and generation with reference to solution.
Brief description of the drawings
Fig. 1 is the noise measuring system schematic diagram of a better embodiment of the invention.
Fig. 2 is the cut-away view of the test box of a better embodiment of the invention.
Fig. 3 is the structure of the revolving door of test casing in Fig. 2.
Fig. 4 is the structure chart of mechanical arm in Fig. 2.
Fig. 5 is the stereogram of the test module in Fig. 2.
Fig. 6 is the stereogram of the test fixture in Fig. 2.
Fig. 7 is the module map of the test control device of a better embodiment of the invention.
Fig. 8 is the method flow diagram of the test control system of a better embodiment of the invention.
Fig. 9 is the data guiding flow figure of a better embodiment of the invention.
Figure 10 is the correcting process figure of a better embodiment of the invention.
Figure 11 is the 3D scanning process figures of a better embodiment of the invention.
Figure 12 is the mechanical arm scanning process figure of a better embodiment of the invention.
Figure 13 is the Electromagnetic Simulation flow chart of a better embodiment of the invention.
Main element symbol description
| Noise measuring system | 1000 |
| Test box | 1 |
| Test control device | 2 |
| Signal analysis instrument | 3 |
| Casing | 10 |
| Revolving door | 12 |
| Revolving door body | 120 |
| Spring bearing | 122 |
| Support shaft | 124 |
| Revolving-door drive | 126 |
| Mechanical arm | 14 |
| X-axis mechanical arm | 140 |
| Y-axis mechanical arm | 142 |
| Z axis mechanical arm | 144 |
| Mechanical arm transmission device | 146 |
| Test module | 16 |
| Detecting module | 160 |
| First drive module | 161 |
| Second drive module | 162 |
| Connecting rod | 167 |
| Fixed seat | 163 |
| Through hole | 164 |
| Probe/probe | 165 |
| Connector | 166 |
| Filming apparatus | 17 |
| Test fixture | 18 |
| Fixed part | 180 |
| Overturn drive division | 182 |
| Connecting portion | 184 |
| Test system | 110 |
| Test control system | 20 |
| Reset correction module | 202 |
| Data import modul | 204 |
| 3D scan modules | 206 |
| Mechanical arm detecting module | 208 |
| Electromagnetic Simulation module | 210 |
| Memory | 22 |
| Processor | 24 |
| Display | 26 |
Following embodiment will further illustrate the present invention with reference to above-mentioned accompanying drawing.
Embodiment
Refer to shown in Fig. 1, the present invention provides a kind of noise measuring system 1000, the test system 1000 can control probe probe and be tested automatically, and test scan data progress Electromagnetic Simulation to determine real noise reason and provide possible prioritization scheme according to probe probe.
The noise measuring system 1000 includes test box 1 and test control device 2.The test box 1 is used for using probe probe to test system（Equipment Under Test, EUT) it is scanned test acquisition Noise scan data.The test control device 2 is used to control the test box 1 to be tested and analyzed and processed according to the Noise scan data of the test box 1 to determine noise reason and obtain possible solution.In other embodiments, the noise measuring system 1000 may also include a signal analysis instrument 3（A such as oscillograph）3, the signal analysis instrument 3 is used to be connected with the test box 1 and the test control device 2, obtained signal is detected from the test box 1 and exported by the oscillograph 2 for receiving, the test control device 2 can obtain the waveform that the oscillograph 2 exports and be further analyzed processing.
As shown in fig.2, a kind of cut-away view of test box 1 for better embodiment of the present invention.The test box includes casing 10, revolving door 12, mechanical arm 14, test module 16, filming apparatus 17 and test fixture 18.The casing 10 is generally rectangular shaped structure, and the material of the casing contains absorbing material, so as to completely cut off the radiation interference in outer bound pair casing.The revolving door 12 can be rotatably set in the side of the casing 10, and can be rotated relative to the casing 10 between an open position and a closed position, to be turned on and off the casing 10.The revolving door 12 can completely cut off the noise jamming in the external world, can also avoid test of the external environment to test system EUT110 from interfering using being made with the same or similar material of the casing, when the revolving door 12 is in the closed position.The filming apparatus 17 is used to carry out 3D scannings to the test system 110.The filming apparatus 17 may include one or more cameras, and for ease of description, in the following example, the filming apparatus 17 includes a camera.
Further combined with shown in Fig. 3, the side of the casing 10 is provided with support shaft 124, spring bearing 122 and revolving-door drive 126, and the revolving door body 120 is rotatably fixed in the support shaft 124.The revolving-door drive 126 can drive the rotation of support shaft 124 to drive the revolving door body 120 being fixed in the support shaft 124 to be rotated relative to the casing 10.In the present embodiment, the revolving-door drive 126 can be a cylinder, and in other embodiments, the revolving-door drive 126 can also be other any suitable drive devices, such as motor.
Further combined with shown in Fig. 4, the mechanical arm 14 includes X-axis arm 140, Y-axis arm 142 and Z axis arm 144.The X-axis arm 140, Y-axis arm 142 and Z axis arm 144 can be moved along X-axis, Y-axis, Z axis respectively, thus drive the test module 16 being fixed on the mechanical arm 14 carry out up and down all-around mobile to be tested.Each mechanical arm 140,142,144 is connected with a mechanical arm transmission device 146, and the mechanical arm transmission device 146 is in mechanical arm drive device（It is not shown）Driving under drive the mechanical arm 14 to do corresponding motion.
Refer to shown in Fig. 5, the test module 16 includes detecting module 160, connecting rod 167, the first drive module 161 and the second drive module 162.The detecting module 160 includes fixed seat 163 and probe/probe 165.The fixed seat 163 is provided with multiple through holes 164, and each through hole 164 is used to accommodate one probe/probe in the inner.The connecting rod 167 is used to connect the fixed seat 163 and first drive module 161, one end that the connecting rod 167 is connected on the probe/probe 165 is provided with connector 166, the connector 166 is used to be connected with the connecting rod 167, under the driving of first drive module, the extended fixed seat 163 of probe/probe 165 is to be tested.
Second drive device 162 is used to drive the fixed seat to rotate, so as to may be such that the different probe/probe being contained in different through holes 164 is connected with the probe connecting rod 167, so as to realize the automatic purpose for changing probe/probe.First drive module 161 and second drive module 162 can have the equipment of driving function for cylinder, motor etc..In the present embodiment, the first drive module 161 is a pen type cylinder, second drive module 162.
Refer to shown in Fig. 6, be the structure chart of the test fixture 18 of a better embodiment of the invention.The test fixture 18 is used to fix test system 110 in the lower section of probe/probe 165, so that the probe/probe 165 carries out test scanning.The test fixture 18 includes symmetrically arranged two fixed part 180, overturns the connecting portion 184 of drive division 182 and two.The fixed part 180 is fixed on inside the casing 10, and the relative two ends of the test system 110 are connected to corresponding fixed part 180 by two connecting portion 184 respectively.The upset drive division 180 can drive the connecting portion 184 to overturn to drive the test system 110 to overturn therewith along the direction of arrow shown in figure.The test system 110 can be 0 to being overturn between 180 degree with any angle, so that the test module 16 can be tested the back side of the test system 110 and multiple different angles.
Refer to shown in Fig. 7, be a kind of module map of test control device 2 of better embodiment of the present invention.In this embodiment, the test control device 2 may include, but be not limited to, memory 22, processor 22 and display 26.Memory 22 can be the internal storage unit of the test control device 2, for example, hard disk or internal memory, or plug-in type storage device, for example：Plug-in type hard disk, intelligent memory card（Smart Media
Card, SMC）, secure digital（Secure Digital, SD）Card, flash card（Flash Card）.The memory 22 also can both include internal storage unit or including plug-in type storage device.The processor 24 can be a central processing unit（Central
Processing Unit, CPU）, microprocessor or other data processing chips.
Test control system 20 is installed and run in the test control device 2.In the present embodiment, described test control system 20 is include but not limited to, and resets correction module 202, data import modul 204,3D scan modules 206, mechanical arm detecting module 208, Electromagnetic Simulation module 210.Functional module alleged by the present invention refers to that a kind of processor 24 that can be tested control device 2 is performed and can complete the sequence of program instructions of fixing function section, and it is stored in the memory 22 of the test control device 2.
The replacement correction module 202 is used to control the camera angle and the mechanical arm 14 of the filming apparatus 17 to carry out positioning correcting before measurements, more accurate with the picture obtained by causing the filming apparatus 17 to scan, the mechanical arm 14 can be moved to destination locations more like clockwork.
The data import modul 204 is used to import reference data, and the reference data includes, but not limited to the data files such as noise frequency, 3D figures, circuit diagram, the circuit board file of test system.
The 3D scan modules 206 are used to control the filming apparatus 17 to carry out 3D scannings to test system 110 to obtain the three-dimensional coordinate grid chart of the test system.
The test system 110 of 165 pairs of probe/probe in test module 16 that the mechanical arm detecting module 208 is fixed on the mechanical arm 14 for controlling the mechanical arm 14 to be moved such that carries out detection scanning to obtain the noise data of the different parts of test system 110.
The Electromagnetic Simulation module 210 is used to carry out Electromagnetic Simulation according to the noise data that the data and scanning of importing are obtained, and to judge noise source and reason, and provides possible prioritization scheme.
Refer to shown in Fig. 8, be a kind of flow chart of test control method 400 of better embodiment of the present invention.The test control method can be performed by the test control device 2 in Fig. 7.Flow originates in step 402, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 402, selection of the data import modul 204 based on user imports reference data, and the reference data includes, but not limited to the data files such as noise frequency, 3D figures, circuit diagram, the circuit board file of test system.It is understood that the reference data can also be stored in advance in the memory 22 of the test control device 2, now, the data steps for importing can be omitted.
Step 404, the replacement correction module 202 controls the filming apparatus 17 and the mechanical arm to be corrected, and the detail flowchart of correction is joined shown in Figure 10.It is appreciated that the step 402 and step 404 interchangeable order.
Step 406, the 3D scan modules 206 control 17 pairs of the filming apparatus test system 110 to carry out 3D scannings, and the three-dimensional coordinate grid chart combination reference data obtained by scanning is positioned.Specifically, scan obtained 3D coordinate nets trrellis diagram and carry out matching of aliging with the circuit diagram in the reference data or circuit board figure, so as to obtain circuit diagram or component or the three-dimensional coordinate position data of circuit in circuit board figure.Specifically, refer to shown in Figure 11.
Step 408, the mechanical arm detecting module 208 controls 14 pairs of the mechanical arm test system 110 to carry out near field detection scanning to obtain the Noise scan data of the test system 110.Specifically refer to shown in Figure 12.
Step 410, the mechanical arm detecting module 208 reads the noise data for scanning and obtaining from the test box 1, and determines the stronger region of noise in the test system 110 according to the noise data.In other embodiments, the noise data also may be output to the signal analysis instrument 3, with more intuitively show the obtained noise data of scanning.
Step 412, the mechanical arm detecting module 208 is additionally operable to determine possible problematic circuit and sensing point in the stronger region of the noise according to reference datas such as the circuit diagrams in the region.
Step 414, the mechanical arm detecting module 208 controls probe to carry out further scanning survey to the problematic circuit of the possibility and sensing point and obtains radiation data further according to identified possible problematic circuit and sensing point.Similar to the noise data, the radiation data also may be output to the signal analysis instrument 3 more intuitively to show resulting radiation data.
Step 416, the mechanical arm detecting module 208 determines radiation source circuit according to the radiation data.
Step 418, noise data of the Electromagnetic Simulation module 210 according to obtained by the near-field scan, locking noise source region carries out Electromagnetic Simulation, to aid in determining noise source region.
Step 420, the Electromagnetic Simulation module 210 is based on user's operation or pre-defined rule sets Electromagnetic Simulation parameter.The Electromagnetic Simulation parameter may include, but be not limited to, and PCB changes structure, physical parameter, part characteristic, material properties, the parameter such as input voltage source, current source.
Step 422, the result and radiation source circuit that the Electromagnetic Simulation module 210 is emulated according to Electromagnetic Simulation parameter, the step 418 of setting carry out further PCB circuits and system emulation.
Step 424, the Electromagnetic Simulation module 210 finds out possible coupling path according to emulation data and signal integrity.
Step 426, the mechanical arm detecting module 208 controls the mechanical arm 14 to hold probe identified coupling path is carried out to measure and obtain further radiation data.
Step 428, the Electromagnetic Simulation module 210 determines real noise source and reason.
Step 430, the generation of Electromagnetic Simulation module 210 is with reference to solution and optimizes circuit.Specifically, the Electromagnetic Simulation module 210 changes circuit and set and relevant parameter, and carries out the possible noise data of emulation determination, it is determined that the corresponding circuit of smaller noise is with reference to solution, selects one of them to optimize circuit in reference to solution according to demand.
Refer to shown in Fig. 9, be a kind of flow chart of data lead-in method 500 of better embodiment of the present invention.The data lead-in method can be performed by the test control device 2 in Fig. 7 and can be applied in the flow shown in Fig. 8 need the step of data are imported.Flow originates in step 502, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 502, the data import modul 204 selects or inputted to determine data lead-in path according to user.The data path can be that path is locally stored in the test control device 2, can also be network storage path, such as the cloud storage path of FTP or internet.
Step 504, the data import modul 504 determines the type of data to be imported, specifically, can be judged according to the suffix name of data file.
Step 506, the data import modul 506 judges whether data to be imported meet reading rule.The rule that reads is predetermined rule, for example, can be the file attribute values such as file size, file type, file designation.
Step 508, the data import modul 508 generates corresponding figure according to the data of importing, and is shown by the display 26 of the test control device 2.In certain embodiments, when the figure of display is not required figure, repeatable step 502 is imported again to step 506.
Step 510, the prompting of data import modul 508, which is imported, completes.Specifically, the prompt message can be exported by the mode such as popup text information or indicator lamp or loudspeaker.
Step 512, if the file to be imported does not meet the reading rule, the prompting of data import modul 204 imports mistake.The prompt message can be by the way of similar prompting imports completion.
Refer to shown in Figure 10, be a kind of flow chart of replacement bearing calibration 600 of better embodiment of the present invention.The replacement bearing calibration 600 can be performed by the test control device 2 in Fig. 7 and can be applied to need to reset the step of correcting in the flow shown in Fig. 8.Flow originates in step 602, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 602, the replacement correction module 202 controls the regulation of filming apparatus 17 camera angle, and in other embodiments, the camera angle can be adjusted according to user-defined angle value.In other embodiments, the correction module 202 that resets can also be according to the acquisition parameters of user's operation setting camera, for example, brightness, delay, pattern, shutter speed etc..
Step 604, it is described to reset the central point that correction module 204 controls the camera central point alignment to specify.In certain embodiments, the central point specified can be the geometric center point of test system.
Step 606, the picture captured by the camera is compared the replacement correction module 204 with default picture.The default picture can be stored in advance in the memory 22 of the test control device 2 or be imported by the data import modul 204.
Step 608, the correction module 202 that resets judges whether the coincidence factor of picture and the default picture captured by the filming apparatus 17 has exceeded estimated rate, such as 75%.The predetermined ratio can be set as the value of any suitable, such as 80%, 82%, 78% etc. according to user's request.If the coincidence factor has exceeded estimated rate, flow enters step 610, otherwise, flow return to step 602.
Step 610, the replacement correction module 202 judges that the camera correction is completed, and sends prompt message to point out the correction completion of user's camera.
Step 612, the correction module 202 that resets generates coordinate net trrellis diagram according to captured 3D pictures.
Step 614, the replacement correction module 202 is according to user's operation setting probe initial position.Set position can be the D coordinates value in three dimensional network trrellis diagram.
Step 616, the replacement correction module 202 controls the probe to be moved to predetermined initial position.
Step 618, the replacement correction module 202 records and preserves the initial position co-ordinates value.
Step 620, the replacement correction module 202 sets the probe initial position, and the mobile probe is moved to the initial position.
Step 622, the coordinate value for resetting initial position described in the keeping records of correction module 202.
Step 624, the replacement correction module 202 points out the body to take correction completion by the hand.
Refer to shown in Figure 11, be a kind of flow chart of scan method 700 of better embodiment of the present invention.The scan method 700 can be performed by the test control device 2 in Fig. 7 and can be applied in the flow shown in Fig. 8 need the step of 3D is scanned.Flow originates in step 702, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 702, the 3D scan modules 206 filming apparatus sweep parameter according to user's operation setting.The sweep parameter includes, but not limited to shutter speed, brightness, pattern etc..
Step 704, the 3D scan modules 704 control the filming apparatus 17 to carry out coordinate diagram of the 3D scanning generations with grid according to set sweep parameter.
Step 706, the resulting coordinate diagram with grid is configured, marked by the 3D scan modules 704, and is carried out with the figure of importing to it.The figure of the importing includes the circuit diagram of the test system 110, circuit board figure etc..In other embodiments, the figure of the importing can also be the figure being pre-stored in the memory of the test control device 2.
Step 708, the coordinate diagram with grid and the figure of the importing are carried out figure layer overlapping by the 3D scan modules 704, generate composite diagram.According to the composite diagram, the coordinate of the circuit board and its circuit of the test system 110 in coordinate diagram can be obtained.
Refer to shown in Figure 12, be a kind of flow chart of probe/probe scanning method 800 of better embodiment of the present invention.The probe/probe scanning method 800 can be performed by the test control device 2 in Fig. 7 and the step of can be applied to need probe/probe scanning in the flow shown in Fig. 8.Flow originates in step 802, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 802, the mechanical arm detecting module 208 is probe scanning or probe scanning according to user's operation judges.If probe is scanned, then flow enters step 804, otherwise, and flow enters step 810.
Step 804, the mechanical arm detecting module 208 is according to the sweep parameter of user's operation setting mechanical arm.The sweep parameter includes, but not limited to scan frequency, scanning density and scanning range.
Step 806, the mechanical arm detecting module 208 carries out detection scanning according to set sweep parameter.
Step 808, the noise data obtained by the mechanical arm detecting module 208 from the test box 1 reading detection scanning, and generate field strength pattern according to the data of detection scanning, shows on the display 26.
Step 810, the mechanical arm detecting module 208 is according to user's operation setting sweep parameter, and set probe scanning parameter includes, scan frequency, density and scope.
Step 812, sensing point is selected according to set scanning range.
Step 814, the sensing point of 208 pairs of selections of mechanical arm detecting module is scanned to generate radiation data and record according to the probe scanning parameter of setting.
Refer to shown in Figure 13, be a kind of flow chart of Electromagnetic Simulation method 900 of better embodiment of the present invention.The Electromagnetic Simulation method 900 can be performed by the test control device 2 in Fig. 7 and the step of can be applied to need Electromagnetic Simulation in the flow shown in Fig. 8.Flow originates in step 902, according to different demands, and the order of step can change in the flow chart, and some steps can be omitted or merged.
Step 902, the Electromagnetic Simulation module 210 reads the composite diagram and associated documents that the 3D scan modules 206 are generated, and the associated documents include but is not limited to, noise data that circuit diagram, circuit board file, scanning are obtained etc..
904, the Electromagnetic Simulation module 210 is according to user's operation setting Electromagnetic Simulation parameter, and the Electromagnetic Simulation parameter includes, but not limited to circuit board and changed the parameters such as structure, physical parameter, part characteristic, material properties, input voltage source, current source.
Step 906, the Electromagnetic Simulation module 210 extracts key network parameter from simulation model, and the key network parameter includes signal integrity degree（Signal Integrity, SI）And power supply integrity degree（Power Supply Integrity, PI）.Wherein PI includes Z parameter, i.e. impedance parameter.If SI parameters, then into step 910, if PI parameters, then into step 914.
Step 910, whether the noise data that the Electromagnetic Simulation module 210 is obtained according to the Electromagnetic Simulation parameter and scanning of setting carries out circuit simulation, reasonable with decision circuitry designed lines.
Step 912, the signal Analysis produced in simulation analysis process is switched to frequency-region signal by the Electromagnetic Simulation module 210.
Step 914, the noise data that the Electromagnetic Simulation module 210 is obtained according to the Electromagnetic Simulation parameter and scanning of setting synchronizes switching noise（Simultaneous Switch Noise, SSN) emulation.The SSN emulation is a kind of emulation of power completeness simulation, for judging whether the design of power distribution system meets requirement in the time domain.
Step 914, judge whether current circuit design meets design requirement according to simulation result, such as meet, then flow terminates, do not meet such as, then return to step 904, which resets simulation parameter and knows that simulation result is shown, meets design requirement, so as to obtain with reference to solution and Optimization Design of Electronic Circuits scheme.
Finally it should be noted that, the above embodiments are merely illustrative of the technical solutions of the present invention and it is unrestricted, although the present invention is described in detail with reference to preferred embodiment, it will be understood by those within the art that, technical scheme can be modified or equivalent substitution, without departing from the spirit and scope of technical solution of the present invention.
Claims (10)
1. a kind of noise measuring system, it is characterized in that, the noise measuring system includes test box and test control device, mechanical arm and test system are fixed with the test box, filming apparatus and probe/probe are fixed with mechanical arm, the test control device includes memory and processor, and the memory storage has multiple certification scenes and multiple instruction collection；The processor is used to execute instruction collection the test control device is performed：
The movement of control machinery arm is to drive probe to be scanned to test system to obtain noise data；
Noise source region is determined according to noise data；
The movement of control machinery arm is to drive probe to be scanned to obtain radiation data identified noise source region；
Electromagnetic Simulation is carried out according to the noise data and radiation data to determine noise reason and generation with reference to solution and optimization circuit.
2. noise measuring system as claimed in claim 1, it is characterised in that the processor is additionally operable to execute instruction collection the test control device is performed：
Control the filming apparatus to be shot to obtain the coordinate diagram with grid；
Import the circuit diagram of the test system；
Align the coordinate diagram and circuit diagram, and it is compound to generate composite diagram to carry out figure layer, wherein the Electromagnetic Simulation is based on the composite diagram and the noise data and the radiation data.
3. noise measuring system as claimed in claim 2, it is characterised in that the processor is additionally operable to execute instruction collection the test control device is performed：Also include being corrected the camera before controlling the filming apparatus to be shot.
4. noise measuring system as claimed in claim 1, it is characterised in that the processor is additionally operable to execute instruction collection the test control device is performed：Controlling the mechanical arm movement also to include being corrected mechanical arm before driving probe to be scanned.
5. noise measuring system as claimed in claim 1, it is characterised in that the Electromagnetic Simulation includes signal integrity degree and emulated and power completeness simulation.
6. a kind of noise testing method, applied to test control device, it is characterised in that, the test control device is connected with a test box, it is fixed with the test box on mechanical arm and test system, mechanical arm and is fixed with filming apparatus and probe/probe, the test control method includes：
The movement of control machinery arm is to drive probe to be scanned to test system to obtain noise data；
Noise source region is determined according to noise data；
The movement of control machinery arm is to drive probe to be scanned to obtain radiation data identified noise source region；And
Electromagnetic Simulation is carried out according to the noise data and radiation data to determine noise reason and generation with reference to solution and optimization circuit.
7. noise testing method as claimed in claim 6, it is characterised in that methods described also includes：
Control the filming apparatus to be shot to obtain the coordinate diagram with grid；
Import the circuit diagram of the test system；
Align the coordinate diagram and circuit diagram, and it is compound to generate composite diagram to carry out figure layer, wherein the Electromagnetic Simulation is based on the composite diagram and the noise data and the radiation data.
8. noise testing method as claimed in claim 7, it is characterised in that methods described also includes：Also include being corrected the camera before controlling the filming apparatus to be shot.
9. noise testing method as claimed in claim 6, it is characterised in that methods described also includes：Controlling the mechanical arm movement also to include being corrected mechanical arm before driving probe to be scanned.
10. noise testing method as claimed in claim 6, it is characterised in that the Electromagnetic Simulation includes signal integrity degree and emulated and power completeness simulation.
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| CN201610110762.6A CN107132429A (en) | 2016-02-29 | 2016-02-29 | Noise measuring system and method |
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| CN201610110762.6A CN107132429A (en) | 2016-02-29 | 2016-02-29 | Noise measuring system and method |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108843554A (en) * | 2018-06-26 | 2018-11-20 | 南京理工大学 | A kind of noise-measuring system based on two degrees of freedom mechanical arm |
| CN113492406A (en) * | 2021-07-19 | 2021-10-12 | 中国人民解放军92578部队 | Cabin noise sound pressure automatic detection method |
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2016
- 2016-02-29 CN CN201610110762.6A patent/CN107132429A/en active Pending
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108843554A (en) * | 2018-06-26 | 2018-11-20 | 南京理工大学 | A kind of noise-measuring system based on two degrees of freedom mechanical arm |
| CN108843554B (en) * | 2018-06-26 | 2020-12-25 | 南京理工大学 | Noise measuring device based on two-degree-of-freedom mechanical arm |
| CN113492406A (en) * | 2021-07-19 | 2021-10-12 | 中国人民解放军92578部队 | Cabin noise sound pressure automatic detection method |
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