CN107121441A - A kind of SOP chip pin defect detecting devices based on embedded vision - Google Patents
A kind of SOP chip pin defect detecting devices based on embedded vision Download PDFInfo
- Publication number
- CN107121441A CN107121441A CN201710365911.8A CN201710365911A CN107121441A CN 107121441 A CN107121441 A CN 107121441A CN 201710365911 A CN201710365911 A CN 201710365911A CN 107121441 A CN107121441 A CN 107121441A
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- CN
- China
- Prior art keywords
- sop
- chip
- card
- detecting devices
- chip microcomputer
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
Abstract
The invention discloses a kind of SOP chip pin defect detecting devices based on embedded vision, belong to field of non destructive testing, it includes camera, light source, image pick-up card, PC, single-chip microcomputer, operating desk, motion control card and image procossing VC source codes, camera and image pick-up card obtain SOP chip images, PC is connected with single-chip microcomputer simultaneously, single-chip microcomputer controls motion control card, and then the motion of control operation platform, and the VC programs of PC complete pretreatment, template matches and the defect analysis of image；SOP chip pin defect detecting devices of the invention based on embedded vision, can effectively realize the intellectuality and automation of detection method, improve micro-level fabrication evaluation precision and efficiency, and stability is good, reduction testing cost.
Description
Technical field
The invention belongs to field of non destructive testing, and in particular to a kind of SOP chip pin defects based on embedded vision
Detection means.
Background technology
In SOP chip device production processes, the appearance quality detection of chip is the essential link of one of which, mesh
The SOP chips appearance quality detection of preceding integrated circuit mainly uses Manual Visual Inspection method, and working strength is big, easily causes flase drop,
And detection speed and precision are relatively low so that detection efficiency is low, can not meet the requirement of enterprise's not large-scale production, and above-mentioned factor exists
Largely constrain the development of China IC integrated chip production industries.
At present, some intrinsic defects also limit the accuracy of SOP chips detection to a certain extent, such as detection dress
Put.
The content of the invention
Goal of the invention：In view of the above-mentioned problems, drawing it is an object of the invention to provide a kind of SOP chips based on embedded vision
Pin defect detecting device, the device can carry out the defects detection of SOP chip pins based on embedded vision, can effectively realize
The intellectuality and automation of detection method, improve micro-level fabrication evaluation precision and efficiency, stability is good, reduction is detected into
This.
Technical scheme：To achieve the above object, the present invention is adopted the following technical scheme that：
A kind of SOP chip pin defect detecting devices based on embedded vision, it includes camera, light source, IMAQ
Card, PC, single-chip microcomputer, operating desk, motion control card and image procossing VC source codes, it is characterised in that：
Described camera and described image pick-up card obtain SOP chip images, while described PC and described list
Piece machine is connected, the described motion control card of described single-chip microcomputer control, and then the motion of control operation platform, and image transmitting is to described
PC, the VC programs of described PC complete pretreatment, template matches and the defect analysis of image, perform complete detection and move
Make.
Described light source is strip source.
Described single-chip microcomputer uses 51 single-chip microcomputers, and programming is simple, powerful.
Beneficial effect：There is provided a kind of SOP chip pins defects detection dress based on embedded vision compared with prior art
Put, the device can carry out the defects detection of SOP chip pins based on embedded vision, can effectively realize the intelligence of detection method
It can change and automate, improve micro-level fabrication evaluation precision and efficiency, stability is good, reduction testing cost.
Brief description of the drawings
Fig. 1 is the SOP chip pin defect detecting device schematic diagrames based on embedded vision；
Embodiment
Below in conjunction with the accompanying drawings and specific embodiment, the present invention is furture elucidated.
As shown in figure 1, a kind of SOP chip pin defect detecting devices based on embedded vision, it includes camera, light
Source, image pick-up card, PC, single-chip microcomputer, operating desk, motion control card and image procossing VC source codes, it is characterised in that：
Camera and image pick-up card obtain SOP chip images, while PC is connected with single-chip microcomputer, single-chip microcomputer control motion control
Fabrication, and then the motion of control operation platform, image transmitting complete the pretreatment of image, template to PC, the VC programs of PC
Match somebody with somebody and defect analysis, perform complete detection operation.
Light source be strip source there is provided illumination evenly, be also avoided that the reflective of object.
Single-chip microcomputer uses 51 single-chip microcomputers, and programming is simple, powerful..
Claims (3)
1. a kind of SOP chip pin defect detecting devices based on embedded vision, it include camera, light source, image pick-up card,
PC, single-chip microcomputer, operating desk, motion control card and image procossing VC source codes, it is characterised in that：
Described camera and described image pick-up card obtain SOP chip images, while described PC and described single-chip microcomputer
Connection, the described motion control card of described single-chip microcomputer control, and then the motion of control operation platform, image transmitting give described PC
Machine, the VC programs of described PC complete pretreatment, template matches and the defect analysis of image, perform complete detection operation.
2. the SOP chip pin defect detecting devices according to claim 1 based on embedded vision, it is characterised in that：
Described light source is strip source.
3. the SOP chip pin defect detecting devices according to claim 1 based on embedded vision, it is characterised in that：
Described single-chip microcomputer uses 51 single-chip microcomputers.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710365911.8A CN107121441A (en) | 2017-05-23 | 2017-05-23 | A kind of SOP chip pin defect detecting devices based on embedded vision |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710365911.8A CN107121441A (en) | 2017-05-23 | 2017-05-23 | A kind of SOP chip pin defect detecting devices based on embedded vision |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107121441A true CN107121441A (en) | 2017-09-01 |
Family
ID=59728684
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710365911.8A Pending CN107121441A (en) | 2017-05-23 | 2017-05-23 | A kind of SOP chip pin defect detecting devices based on embedded vision |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107121441A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112334762A (en) * | 2018-07-13 | 2021-02-05 | 株式会社富士 | Foreign matter detection method and electronic component mounting apparatus |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103134803A (en) * | 2011-11-25 | 2013-06-05 | 西安中科麦特电子技术设备有限公司 | PCB optical detection system control circuit |
| CN106248686A (en) * | 2016-07-01 | 2016-12-21 | 广东技术师范学院 | Glass surface defects based on machine vision detection device and method |
-
2017
- 2017-05-23 CN CN201710365911.8A patent/CN107121441A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103134803A (en) * | 2011-11-25 | 2013-06-05 | 西安中科麦特电子技术设备有限公司 | PCB optical detection system control circuit |
| CN106248686A (en) * | 2016-07-01 | 2016-12-21 | 广东技术师范学院 | Glass surface defects based on machine vision detection device and method |
Non-Patent Citations (2)
| Title |
|---|
| 唐继贤等: "《MSPP430超低功耗16位单片机开发实例》", 30 April 2014, 北京航空航天大学出版社 * |
| 熊田忠: "《运动控制实践教程》", 31 May 2016, 西安电子科技大学出版社 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112334762A (en) * | 2018-07-13 | 2021-02-05 | 株式会社富士 | Foreign matter detection method and electronic component mounting apparatus |
| CN112334762B (en) * | 2018-07-13 | 2024-01-12 | 株式会社富士 | Foreign matter detection method and electronic component mounting device |
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Application publication date: 20170901 |